WO2014020693A1 - Method for producing solar cell - Google Patents

Method for producing solar cell Download PDF

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Publication number
WO2014020693A1
WO2014020693A1 PCT/JP2012/069436 JP2012069436W WO2014020693A1 WO 2014020693 A1 WO2014020693 A1 WO 2014020693A1 JP 2012069436 W JP2012069436 W JP 2012069436W WO 2014020693 A1 WO2014020693 A1 WO 2014020693A1
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Prior art keywords
substrate
substrates
solar cell
manufacturing
bubbles
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PCT/JP2012/069436
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French (fr)
Japanese (ja)
Inventor
島 正樹
小林 伸二
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三洋電機株式会社
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Priority to JP2014527865A priority Critical patent/JP6032623B2/en
Priority to PCT/JP2012/069436 priority patent/WO2014020693A1/en
Publication of WO2014020693A1 publication Critical patent/WO2014020693A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1876Particular processes or apparatus for batch treatment of the devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67075Apparatus for fluid treatment for etching for wet etching
    • H01L21/67086Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • a solar cell includes, for example, a substrate made of a semiconductor material, a first semiconductor layer having one conductivity type disposed on one principal surface of the substrate, and another disposed on the other principal surface of the substrate. You may provide the 2nd semiconductor layer which has a conductivity type, the 1st electrode distribute
  • the substrate 11 may be a substrate made of a semiconductor material, or may be a substrate made of a semiconductor material in which a semiconductor layer or the like is disposed on the surface.
  • the cassette 10 is not particularly limited as long as it has a shape capable of holding a plurality of substrates 11 spaced apart from each other along one direction.
  • a plurality of recesses 10 a are provided on both side surfaces of the cassette 10.
  • the concave portion 10a provided on one side surface of the cassette 10 and the concave portion 10a provided on the other side surface face each other in the y-axis direction.
  • the substrate 11 is inserted into the pair of recesses 10a facing each other in the y-axis direction. As a result, the plurality of substrates 11 are held in a state of being spaced apart from each other along the x-axis direction.
  • the distance L between the substrates 11 adjacent in the x-axis direction is preferably 3 mm or more, and more preferably 4 mm or more.
  • the distance L between the substrates 11 adjacent to each other in the x-axis direction is preferably 1/42 or more of the length of one side of the substrate 11, and more preferably 1/32 or more of the length of one side of the substrate 11. .
  • a plurality of pipes 15a to 15d are arranged below the plurality of substrates 11.
  • Each of the plurality of pipes 15 a to 15 d has a bubble generation port 16, and generates bubbles 14 from the bubble generation port 16 toward the plurality of substrates 11.
  • the state and the second state in which the amount of bubbles 14 supplied to one side of the substrate 11 in the x-axis direction is smaller than the amount of bubbles 14 supplied to the other side of the substrate 11 in the x-axis direction are alternately Arise. For this reason, the substrate 11 vibrates or swings along the x-axis direction by the bubbles 14 supplied in the first state and the bubbles supplied in the second state. Therefore, for example, it is difficult for a portion of the substrate 11 to be in contact with another substrate 11 or the cassette 10, and the entire substrate 11 is likely to be in contact with the chemical solution 13 uniformly. Therefore, the plurality of substrates 11 can be processed more suitably.
  • the bubbles 14 are supplied to one side of the substrate 11 in the x-axis direction, while the bubbles 14 are supplied to the other side of the substrate 11 in the x-axis direction.
  • the supply position of the bubbles 14 on one side of the substrate 11 in the x-axis direction and the supply position of the bubbles 14 on the other side of the substrate 11 in the x-axis direction are mutually in the y-axis direction, which is the direction in which the substrate 11 extends. Preferably they are different.
  • the recesses 10a are provided so that the interval becomes wider toward the inside, vibration and swinging of the substrate 11 are further promoted.
  • the substrate 11 when the thickness of the substrate 11 is as thin as 200 ⁇ m or less, the substrate 11 is easily bent. Therefore, the adjacent substrates 11 may come into contact with each other, and it may be difficult to suitably supply the chemical solution to the contact portion of the substrate 11.
  • the distance between adjacent substrates 11 is 1/20 or less of the length of one side when the planar shape of the substrate 11 is approximated to a rectangle, and further 1/30 or less, The board
  • two pipes 15a and 15d for supplying bubbles 14 to one side of the substrate 11 and two pipes 15b and 15c for supplying bubbles 14 to the other side of the substrate 11 are provided.
  • the present invention is not limited to this configuration.
  • one pipe 15 a for supplying bubbles 14 to one side of the substrate 11 and one pipe 15 c for supplying bubbles 14 to the other side of the substrate 11 may be provided.
  • the bubble generating ports 16 of the pipes 15 a to 15 d may be positioned in all the gaps 17.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Photovoltaic Devices (AREA)

Abstract

Provided is a method that can produce a solar cell at an improved yield. In a treatment step, a plurality of substrates (11) are treated by immersing, in a chemical (13) retained in a chemical tank (12), the plurality of substrates (11) disposed along a first direction, and supplying gas bubbles (14) towards the plurality of substrates (11) in the chemical (13) from a plurality of gas bubble generating openings (16) of gas bubble generating units (15a-15d) disposed below the plurality of substrates (11) in the chemical tank (12). In a plan view, the treatment step is performed in the state of the plurality of substrates (11) being disposed in a manner so that gas bubble generating openings (16) are positioned between adjacent substrates (11) in the first direction.

Description

太陽電池の製造方法Manufacturing method of solar cell
 本発明は、太陽電池の製造方法に関する。 The present invention relates to a method for manufacturing a solar cell.
 近年、環境負荷の低いエネルギー源として、太陽電池に対する注目が高まってきている。なかでも、結晶シリコン基板などの半導体材料からなる基板を有する太陽電池に対する注目が高まってきている。 In recent years, solar cells have been attracting attention as an energy source with a low environmental load. In particular, attention has been focused on solar cells having a substrate made of a semiconductor material such as a crystalline silicon substrate.
 このような半導体材料からなる基板を備える太陽電池の製造に際しては、例えば半導体材料からなる基板の表面にテクスチャ構造と呼ばれる凹凸構造を形成する工程などといった基板をウェットエッチングする工程を行う必要がある(例えば特許文献1を参照)。 When manufacturing a solar cell including a substrate made of such a semiconductor material, it is necessary to perform a step of wet etching the substrate, for example, a step of forming an uneven structure called a texture structure on the surface of the substrate made of a semiconductor material ( For example, see Patent Document 1).
特開平10-303443号公報JP-A-10-303443
 基板をエッチングする工程などを行った後には、基板を液体で洗浄する工程が必要となる。この洗浄工程や上述のエッチング工程などにおいては、基板の全体が均一に薬液と接触するようにする必要がある。基板に洗浄が不十分な部分やエッチングが不十分な部分が生じると、所望の太陽電池の特性が得られない場合があり、良品率が低下する場合があるためである。 After performing the process of etching the substrate, a process of cleaning the substrate with a liquid is required. In this cleaning process, the above-described etching process, etc., it is necessary to make the entire substrate uniformly contact with the chemical solution. This is because if a portion where the substrate is not sufficiently cleaned or a portion where etching is insufficient is generated on the substrate, desired solar cell characteristics may not be obtained, and the yield rate may be reduced.
 本発明の主な目的は、改善された良品率で太陽電池を製造し得る方法を提供することにある。 The main object of the present invention is to provide a method capable of producing solar cells with an improved yield rate.
 本発明に係る太陽電池の製造方法は、半導体材料からなる基板を有する太陽電池の製造方法に関する。本発明に係る太陽電池の製造方法は、処理工程を備える。処理工程では、一の方向に沿って配した複数の基板を、薬液槽に溜められた薬液に浸漬すると共に、薬液槽において複数の基板の下方に配された気泡発生部の複数の気泡発生口から薬液中の複数の基板に向けて気泡を供給して複数の基板を処理する。平面視において、気泡発生口が一の方向において隣り合う基板の間に位置するように複数の基板を配した状態で処理工程を行う。 The method for manufacturing a solar cell according to the present invention relates to a method for manufacturing a solar cell having a substrate made of a semiconductor material. The method for manufacturing a solar cell according to the present invention includes a processing step. In the processing step, the plurality of substrates arranged along one direction are immersed in the chemical solution stored in the chemical solution tank, and the plurality of bubble generation ports of the bubble generation unit arranged below the plurality of substrates in the chemical solution tank Then, bubbles are supplied toward the plurality of substrates in the chemical solution to process the plurality of substrates. In a plan view, the processing step is performed in a state where a plurality of substrates are arranged so that the bubble generating port is positioned between adjacent substrates in one direction.
 本発明によれば、改善された良品率で太陽電池を製造し得る方法を提供することができる。 According to the present invention, it is possible to provide a method capable of manufacturing solar cells with an improved yield rate.
図1は、第1の実施形態におけるカセットの略図的斜視図である。FIG. 1 is a schematic perspective view of a cassette according to the first embodiment. 図2は、第1の実施形態におけるカセットの略図的平面図である。FIG. 2 is a schematic plan view of the cassette according to the first embodiment. 図3は、第1の実施形態における処理工程を説明するための模式的正面図である。なお、図3においては、気泡及び気泡発生口と基板との関係が模式的に描画されており、実際とは異なる。FIG. 3 is a schematic front view for explaining the processing steps in the first embodiment. In FIG. 3, the relationship between the bubble and the bubble generation port and the substrate is schematically drawn, which is different from the actual case. 図4は、第1の実施形態における気泡供給口と基板との関係を表す模式的平面図である。FIG. 4 is a schematic plan view showing the relationship between the bubble supply port and the substrate in the first embodiment. 図5は、第1の実施形態におけるパイプ15a~15dから気泡を発生させるタイミングを説明するためのタイムチャートである。FIG. 5 is a time chart for explaining the timing of generating bubbles from the pipes 15a to 15d in the first embodiment. 図6は、第2の実施形態における気泡供給口と基板との関係を表す模式的平面図である。FIG. 6 is a schematic plan view showing the relationship between the bubble supply port and the substrate in the second embodiment. 図7は、第3の実施形態における気泡供給口と基板との関係を表す模式的平面図である。FIG. 7 is a schematic plan view showing the relationship between the bubble supply port and the substrate in the third embodiment.
 以下、本発明を実施した好ましい形態の一例について説明する。但し、下記の実施形態は、単なる例示である。本発明は、下記の実施形態に何ら限定されない。 Hereinafter, an example of a preferable embodiment in which the present invention is implemented will be described. However, the following embodiment is merely an example. The present invention is not limited to the following embodiments.
 また、実施形態等において参照する各図面において、実質的に同一の機能を有する部材は同一の符号で参照することとする。また、実施形態等において参照する図面は、模式的に記載されたものであり、図面に描画された物体の寸法の比率などは、現実の物体の寸法の比率などとは異なる場合がある。図面相互間においても、物体の寸法比率等が異なる場合がある。具体的な物体の寸法比率等は、以下の説明を参酌して判断されるべきである。 In each drawing referred to in the embodiment and the like, members having substantially the same function are referred to by the same reference numerals. The drawings referred to in the embodiments and the like are schematically described, and the ratio of the dimensions of the objects drawn in the drawings may be different from the ratio of the dimensions of the actual objects. The dimensional ratio of the object may be different between the drawings. The specific dimensional ratio of the object should be determined in consideration of the following description.
 (第1の実施形態)
 本実施形態では、半導体材料からなる基板を有する太陽電池の製造方法について説明する。半導体材料からなる基板は、結晶シリコン基板であってもよい。即ち、本発明に係る太陽電池の製造方法は、結晶シリコン太陽電池の製造方法であってもよい。
(First embodiment)
In the present embodiment, a method for manufacturing a solar cell having a substrate made of a semiconductor material will be described. The substrate made of a semiconductor material may be a crystalline silicon substrate. That is, the method for manufacturing a solar cell according to the present invention may be a method for manufacturing a crystalline silicon solar cell.
 太陽電池は、例えば、半導体材料からなる基板と、基板の一主面の上に配された一の導電型を有する第1の半導体層と、基板の他主面の上に配された他の導電型を有する第2の半導体層と、第1の半導体層の上に配された第1の電極と、第2の半導体層の上に配された第2の電極とを備えていてもよい。 A solar cell includes, for example, a substrate made of a semiconductor material, a first semiconductor layer having one conductivity type disposed on one principal surface of the substrate, and another disposed on the other principal surface of the substrate. You may provide the 2nd semiconductor layer which has a conductivity type, the 1st electrode distribute | arranged on the 1st semiconductor layer, and the 2nd electrode distribute | arranged on the 2nd semiconductor layer .
 また、太陽電池は、例えば、半導体材料からなる基板と、基板の一主面の上に配された第1及び第2の半導体層と、第1の半導体層の上に配された第1の電極と、第2の半導体層の上に配された第2の電極とを備える裏面接合型の太陽電池であってもよい。 Moreover, the solar cell includes, for example, a substrate made of a semiconductor material, first and second semiconductor layers disposed on one main surface of the substrate, and a first disposed on the first semiconductor layer. It may be a back junction solar cell including an electrode and a second electrode disposed on the second semiconductor layer.
 半導体材料からなる基板の少なくとも一方の主面には、基板への光の入射効率を高めるためのテクスチャ構造と呼ばれる凹凸構造が設けられていてもよい。テクスチャ構造は、例えば、結晶シリコン基板の表面を異方性エッチングすることにより形成することができる。 An uneven structure called a texture structure may be provided on at least one main surface of the substrate made of a semiconductor material in order to increase the light incident efficiency on the substrate. The texture structure can be formed, for example, by anisotropically etching the surface of the crystalline silicon substrate.
 本実施形態の太陽電池の製造方法は、半導体材料からなる基板を薬液に浸漬することにより処理する処理工程を含む。処理工程の具体例としては、基板を洗浄液に浸漬することにより基板を洗浄する洗浄工程や、基板をエッチング液に浸漬することにより基板をエッチングするエッチング工程などが挙げられる。処理工程として、洗浄工程とエッチング工程との少なくとも一方を行うことが好ましい。 The manufacturing method of the solar cell according to the present embodiment includes a processing step of processing by immersing a substrate made of a semiconductor material in a chemical solution. Specific examples of the processing step include a cleaning step of cleaning the substrate by immersing the substrate in a cleaning solution, and an etching step of etching the substrate by immersing the substrate in an etching solution. As a treatment process, it is preferable to perform at least one of a cleaning process and an etching process.
 例えば、エッチング工程を行った後に、洗浄工程を行う場合などのように、太陽電池を製造するに際して、複数の処理工程を行う場合が考えられる。このような場合においては、複数の処理工程のうちの少なくともひとつの処理工程を本実施形態において説明する処理工程とすればよく、すべての処理工程を本実施形態において説明する処理工程と同様に行う必要は必ずしもない。 For example, there may be a case where a plurality of processing steps are performed when manufacturing a solar cell, such as a case where a cleaning step is performed after an etching step. In such a case, at least one of the plurality of processing steps may be the processing step described in the present embodiment, and all the processing steps are performed in the same manner as the processing step described in the present embodiment. There is no necessity.
 処理工程に供される基板は、半導体材料からなる基板のみにより構成されていてもよいし、表面上に半導体層や保護層などの層や、電極などの部材が設けられた半導体材料からなる基板であってもよい。 The substrate used for the processing step may be composed only of a substrate made of a semiconductor material, or a substrate made of a semiconductor material in which a layer such as a semiconductor layer or a protective layer, or a member such as an electrode is provided on the surface. It may be.
 以下、本実施形態における処理工程の詳細について、図1~図5を参照しながら詳細に説明する。 Hereinafter, details of the processing steps in the present embodiment will be described in detail with reference to FIGS.
 (カセット10への基板11のセット)
 まず、例えば、図1及び図2に示すようなカセット10に複数の基板11をセットする。ここで、基板11は、半導体材料からなる基板であってもよいし、半導体層などが表面上に配された半導体材料からなる基板であってもよい。
(Set the substrate 11 to the cassette 10)
First, for example, a plurality of substrates 11 are set in a cassette 10 as shown in FIGS. Here, the substrate 11 may be a substrate made of a semiconductor material, or may be a substrate made of a semiconductor material in which a semiconductor layer or the like is disposed on the surface.
 カセット10は、一方向に沿って相互に間隔をおいて複数の基板11を保持可能な形状を有するものである限りにおいて特に限定されない。本実施形態では、カセット10の両側面には、複数の凹部10aが設けられている。カセット10の一方側の側面に設けられた凹部10aと、他方側の側面に設けられた凹部10aとはy軸方向に対向している。このy軸方向において対向する凹部10aの対に基板11が挿入される。これにより、複数の基板11がx軸方向に沿って相互に間隔をおいた状態で保持される。 The cassette 10 is not particularly limited as long as it has a shape capable of holding a plurality of substrates 11 spaced apart from each other along one direction. In the present embodiment, a plurality of recesses 10 a are provided on both side surfaces of the cassette 10. The concave portion 10a provided on one side surface of the cassette 10 and the concave portion 10a provided on the other side surface face each other in the y-axis direction. The substrate 11 is inserted into the pair of recesses 10a facing each other in the y-axis direction. As a result, the plurality of substrates 11 are held in a state of being spaced apart from each other along the x-axis direction.
 凹部10aは、鉛直方向であるz軸方向に沿って延びている、凹部10aを構成している2つの側壁部間の間隔は、基板11側に向かって広くなっている。すなわち、凹部10aを構成している2つの側壁部間の間隔は、y軸方向における中央側に向かって広くなっている。このため、基板11がカセット10と広い面積で接触することを抑制している。 The recess 10a extends along the z-axis direction which is the vertical direction, and the interval between the two side walls constituting the recess 10a is widened toward the substrate 11 side. That is, the interval between the two side walls constituting the recess 10a is widened toward the center side in the y-axis direction. For this reason, it is suppressed that the board | substrate 11 contacts the cassette 10 in a wide area.
 カセット10のx方向の両側に位置する側壁部には、薬液が通過するための切欠10bや開口が設けられている。また、カセット10の底部には壁面が設けられていない。従って、カセット10の下方からカセット10内に薬液や泡等が浸入可能である。 The side wall portions located on both sides in the x direction of the cassette 10 are provided with cutouts 10b and openings for allowing the chemical solution to pass therethrough. Further, no wall surface is provided at the bottom of the cassette 10. Therefore, chemicals, bubbles, etc. can enter the cassette 10 from below the cassette 10.
 基板11の形状は、特に限定されない。基板11は、例えば、矩形状、正方形状、多角形状、円形状等であってもよい。また、基板11は、例えば、角部が直線または曲線で切り取られた形状である略矩形状、略正方形状等であってもよい。以下、基板11が、略矩形状である例について説明する。 The shape of the substrate 11 is not particularly limited. For example, the substrate 11 may have a rectangular shape, a square shape, a polygonal shape, a circular shape, or the like. Further, the substrate 11 may have, for example, a substantially rectangular shape, a substantially square shape, or the like in which a corner portion is cut out by a straight line or a curve. Hereinafter, an example in which the substrate 11 has a substantially rectangular shape will be described.
 基板11の一辺の長さは、例えば、100mm~200mm程度とすることができる。基板11の厚さは、200μm程度以下であることが好ましく、50μm~200μm程度であることがより好ましい。基板11の厚みに対する基板11の一辺の長さの比((基板11の一辺の長さ)/(基板11の厚み))は、400~40000であることが好ましい。 The length of one side of the substrate 11 can be about 100 mm to 200 mm, for example. The thickness of the substrate 11 is preferably about 200 μm or less, and more preferably about 50 μm to 200 μm. The ratio of the length of one side of the substrate 11 to the thickness of the substrate 11 ((length of one side of the substrate 11) / (thickness of the substrate 11)) is preferably 400 to 40000.
 なお、ひとつのカセット10に保持される基板11の数は、特に限定されないが、例えば、25枚~100枚程度とすることができる。ひとつのカセット10にセット可能な基板11の枚数を多くする観点からは、x軸方向に隣接する基板11間の距離Lは、6mm以下であることが好ましく、5mm以下であることが好ましい。x軸方向に隣接する基板11間の距離Lは、基板11の一辺の長さの1/20以下であることが好ましく、1/30以下であることがより好ましい。但し、x軸方向に隣接する基板11間の距離Lが小さすぎると、基板11のセットが困難になったり、隣接する基板11同士がウェットエッチング時に張り付く等の弊害が生じる場合がある。従って、x軸方向に隣接する基板11間の距離Lは、3mm以上であることが好ましく、4mm以上であることがより好ましい。x軸方向に隣接する基板11間の距離Lは、基板11の一辺の長さの1/42以上であることが好ましく、基板11の一辺の長さの1/32以上であることがより好ましい。 Note that the number of substrates 11 held in one cassette 10 is not particularly limited, but may be, for example, about 25 to 100. From the viewpoint of increasing the number of substrates 11 that can be set in one cassette 10, the distance L between the substrates 11 adjacent in the x-axis direction is preferably 6 mm or less, and preferably 5 mm or less. The distance L between the substrates 11 adjacent to each other in the x-axis direction is preferably 1/20 or less of the length of one side of the substrate 11, and more preferably 1/30 or less. However, if the distance L between the substrates 11 adjacent to each other in the x-axis direction is too small, there are cases where it becomes difficult to set the substrates 11 or the adjacent substrates 11 stick to each other during wet etching. Therefore, the distance L between the substrates 11 adjacent in the x-axis direction is preferably 3 mm or more, and more preferably 4 mm or more. The distance L between the substrates 11 adjacent to each other in the x-axis direction is preferably 1/42 or more of the length of one side of the substrate 11, and more preferably 1/32 or more of the length of one side of the substrate 11. .
 (基板11の処理工程)
 次に、図3に示されるように、カセット10にセットされ、x軸方向に沿って相互に間隔をおいて配された複数の基板11を、カセット10ごと、薬液槽12に溜められた薬液13に浸漬することにより複数の基板11を処理する処理工程を行う。この処理工程は、基板11のエッチング工程や洗浄工程等である。例えばエッチング工程を行う場合は、薬液13をエッチング液とすることができる。例えば洗浄工程を行う場合は、薬液13を洗浄液とすることができる。
(Processing of substrate 11)
Next, as shown in FIG. 3, a plurality of substrates 11 set in the cassette 10 and spaced apart from each other along the x-axis direction are combined with the chemical solution stored in the chemical solution tank 12 together with the cassette 10. A processing step of processing the plurality of substrates 11 is performed by dipping in the substrate 13. This processing process is an etching process or a cleaning process of the substrate 11. For example, when performing an etching process, the chemical | medical solution 13 can be used as an etching liquid. For example, when performing the cleaning process, the chemical liquid 13 can be used as the cleaning liquid.
 この処理工程においては、複数の基板11を薬液13に浸漬すると共に、薬液槽12において複数の基板11の下方に配されており、気泡発生部を構成しているパイプ15a~15dの複数の気泡発生口16から薬液13中の複数の基板11に向けて気泡14(典型的には空気や窒素ガスなどの不活性ガス等の気泡)を供給して複数の基板11を処理する。 In this processing step, the plurality of substrates 11 are immersed in the chemical solution 13 and are disposed below the plurality of substrates 11 in the chemical solution tank 12, and a plurality of bubbles in the pipes 15a to 15d constituting the bubble generating unit. Bubbles 14 (typically bubbles of inert gas such as air or nitrogen gas) are supplied from the generation ports 16 toward the plurality of substrates 11 in the chemical solution 13 to process the plurality of substrates 11.
 詳細には、本実施形態では、平面視において、複数の気泡発生口16がx軸方向において隣り合う基板11の間のギャップ17に位置するように、複数の基板11を配した状態で処理工程を行う。このため、気泡発生口16からの気泡14によって、凹部10aに部分的に接触していた基板11が効率的に剥離される。よって、基板11の全体が均一に薬液13と接触しやすい。従って、複数の基板11を好適に処理することができる。複数の基板11の表面に洗浄不足の部分が生じたり、エッチング不足の部分が生じたりしにくい。また、処理工程が異方性エッチングを行うことにより、所謂テクスチャ構造と呼ばれる凹凸構造を形成するエッチング工程においては、形成される凹凸構造に形状むらや寸法むらが生じにくい。従って、改善された良品率で太陽電池を製造することが可能となる。 Specifically, in the present embodiment, the processing step is performed in a state where the plurality of substrates 11 are arranged so that the plurality of bubble generating ports 16 are located in the gaps 17 between the substrates 11 adjacent in the x-axis direction in plan view. I do. For this reason, the board | substrate 11 which was partially in contact with the recessed part 10a by the bubble 14 from the bubble generation opening | mouth 16 is peeled efficiently. Therefore, the whole substrate 11 is easily in contact with the chemical solution 13 uniformly. Therefore, the plurality of substrates 11 can be processed appropriately. It is difficult for portions that are insufficiently cleaned or portions that are insufficiently etched to occur on the surfaces of the plurality of substrates 11. In addition, in the etching process for forming a concavo-convex structure called a so-called texture structure by performing anisotropic etching in the processing step, unevenness in shape and dimensional unevenness hardly occur in the formed concavo-convex structure. Accordingly, it is possible to manufacture solar cells with an improved yield rate.
 凹部10aに部分的に接触していた基板11の剥離がより効率的に生じるようにする観点からは、気泡発生口16の直径が、x軸方向において隣り合う基板11の間のギャップ17の距離Lより小さいことが好ましく、距離Lの0.8倍以下であることがさらに好ましい。 From the viewpoint of more efficiently peeling the substrate 11 partially contacting the recess 10a, the diameter of the bubble generating port 16 is the distance of the gap 17 between the adjacent substrates 11 in the x-axis direction. It is preferably smaller than L, and more preferably 0.8 times or less of the distance L.
 また、本実施形態では、処理工程において、第1の状態と第2の状態とが交互に生じるように薬液13中に気泡14を供給する。ここで、第1の状態とは、基板11のx軸方向の一方側に供給される気泡14の量が、基板11のx軸方向の他方側に供給される気泡14の量よりも多い状態である。第2の状態とは、基板11のx軸方向の一方側に供給される気泡14の量が、基板11のx軸方向の他方側に供給される気泡14の量よりも少ない状態である。 In the present embodiment, the bubbles 14 are supplied into the chemical solution 13 so that the first state and the second state are alternately generated in the processing step. Here, the first state is a state in which the amount of bubbles 14 supplied to one side of the substrate 11 in the x-axis direction is larger than the amount of bubbles 14 supplied to the other side of the substrate 11 in the x-axis direction. It is. The second state is a state in which the amount of bubbles 14 supplied to one side of the substrate 11 in the x-axis direction is smaller than the amount of bubbles 14 supplied to the other side of the substrate 11 in the x-axis direction.
 具体的には、図4に示されるように、複数の基板11の下方に、複数のパイプ15a~15dが配されている。複数のパイプ15a~15dは、それぞれ、気泡発生口16を有しており、気泡発生口16から複数の基板11に向けて気泡14を発生させる。 Specifically, as shown in FIG. 4, a plurality of pipes 15a to 15d are arranged below the plurality of substrates 11. Each of the plurality of pipes 15 a to 15 d has a bubble generation port 16, and generates bubbles 14 from the bubble generation port 16 toward the plurality of substrates 11.
 パイプ15a~15dは、それぞれ、基板11の配列方向であるx軸方向に沿って延びている。複数のパイプ15a~15dは、基板11の延びる方向と平行なy軸方向に沿って相互に間隔をおいて配されている。パイプ15aとパイプ15bとは、基板11のy軸方向における中央よりもy1側に配されている。パイプ15aは、パイプ15bよりも外側に配されている。パイプ15cとパイプ15dとは、基板11のy軸方向における中央よりもy2側に配されている。パイプ15dは、パイプ15cよりも外側に配されている。 The pipes 15a to 15d each extend along the x-axis direction, which is the arrangement direction of the substrates 11. The plurality of pipes 15a to 15d are spaced apart from each other along the y-axis direction parallel to the direction in which the substrate 11 extends. The pipe 15a and the pipe 15b are arranged on the y1 side from the center of the substrate 11 in the y-axis direction. The pipe 15a is arranged outside the pipe 15b. The pipe 15c and the pipe 15d are arranged on the y2 side from the center of the substrate 11 in the y-axis direction. The pipe 15d is arranged outside the pipe 15c.
 パイプ15a~15dには、基板11間のギャップ17に位置するように、複数の気泡発生口16が設けられている。各パイプ15a~15dにおいて、複数の気泡発生口16は、ひとつおきのギャップ17に設けられている。すなわち、各パイプ15a~15dにおいて、気泡発生口16が位置するギャップ17と、気泡発生口16が位置していないギャップ17とが、x軸方向に沿って交互に生じるように、複数の気泡発生口16が設けられている。 The pipes 15a to 15d are provided with a plurality of bubble generating ports 16 so as to be positioned in the gap 17 between the substrates 11. In each of the pipes 15a to 15d, a plurality of bubble generating ports 16 are provided in every other gap 17. That is, in each of the pipes 15a to 15d, a plurality of bubbles are generated so that the gap 17 where the bubble generating port 16 is located and the gap 17 where the bubble generating port 16 is not positioned alternately occur along the x-axis direction. A mouth 16 is provided.
 外側に位置するパイプ15a、15dの気泡発生口16と、内側に位置するパイプ15b、15cの気泡発生口16とは、異なるギャップ17に位置している。このため、外側に配されたパイプ15a、15dの気泡発生口16が位置しているギャップ17と、内側に配されたパイプ15b、15cの気泡発生口16が位置しているギャップ17とがx軸方向において交互に設けられている。 The bubble generating ports 16 of the pipes 15a and 15d located on the outer side and the bubble generating ports 16 of the pipes 15b and 15c positioned on the inner side are located in different gaps 17. For this reason, the gap 17 where the bubble generating ports 16 of the pipes 15a and 15d arranged on the outside are located and the gap 17 where the bubble generating ports 16 of the pipes 15b and 15c arranged on the inside are located are x. They are provided alternately in the axial direction.
 図5に示されるように、第1の状態においては、パイプ15a、15dの気泡発生口16から発生する気泡14の量が、パイプ15b、15cの気泡発生口16から発生する気泡14の量よりも多くなる一方、第2の状態においては、パイプ15a、15dの気泡発生口16から発生する気泡14の量が、パイプ15b、15cの気泡発生口16から発生する気泡14の量よりも少なくなるように制御される。このように制御することによって、基板11のx軸方向の一方側に供給される気泡14の量が、基板11のx軸方向の他方側に供給される気泡14の量よりも多い第1の状態と、基板11のx軸方向の一方側に供給される気泡14の量が、基板11のx軸方向の他方側に供給される気泡14の量よりも少ない第2の状態とが交互に生じる。このため、第1の状態において供給される気泡14と、第2の状態において供給される気泡とによって基板11がx軸方向に沿って振動したり揺動したりする。よって、例えば基板11のある部分が、他の基板11やカセット10と接触した状態が継続しにくく、基板11の全体が均一に薬液13と接触しやすい。従って、複数の基板11をより好適に処理することができる。 As shown in FIG. 5, in the first state, the amount of bubbles 14 generated from the bubble generating ports 16 of the pipes 15a and 15d is larger than the amount of bubbles 14 generated from the bubble generating ports 16 of the pipes 15b and 15c. On the other hand, in the second state, the amount of bubbles 14 generated from the bubble generating ports 16 of the pipes 15a and 15d is smaller than the amount of bubbles 14 generated from the bubble generating ports 16 of the pipes 15b and 15c. To be controlled. By controlling in this way, the amount of bubbles 14 supplied to one side of the substrate 11 in the x-axis direction is larger than the amount of bubbles 14 supplied to the other side of the substrate 11 in the x-axis direction. The state and the second state in which the amount of bubbles 14 supplied to one side of the substrate 11 in the x-axis direction is smaller than the amount of bubbles 14 supplied to the other side of the substrate 11 in the x-axis direction are alternately Arise. For this reason, the substrate 11 vibrates or swings along the x-axis direction by the bubbles 14 supplied in the first state and the bubbles supplied in the second state. Therefore, for example, it is difficult for a portion of the substrate 11 to be in contact with another substrate 11 or the cassette 10, and the entire substrate 11 is likely to be in contact with the chemical solution 13 uniformly. Therefore, the plurality of substrates 11 can be processed more suitably.
 基板11の振動や揺動をより促進する観点からは、第1の状態において、基板11のx軸方向の一方側に気泡14を供給する一方、基板11のx軸方向の他方側に気泡14を供給せず、第2の状態において、基板11のx軸方向の一方側に気泡14を供給しない一方、基板11のx軸方向の他方側に気泡14を供給するようにすることが好ましい。また、基板11のx軸方向の一方側における気泡14の供給位置と、基板11のx軸方向の他方側における気泡14の供給位置とが、基板11の延びる方向であるy軸方向において相互に異なることが好ましい。また、凹部10aが内側に向かって間隔が広くなるように設けられているため、基板11の振動や揺動がより促進されている。 From the viewpoint of further promoting the vibration and swinging of the substrate 11, in the first state, the bubbles 14 are supplied to one side of the substrate 11 in the x-axis direction, while the bubbles 14 are supplied to the other side of the substrate 11 in the x-axis direction. In the second state, it is preferable not to supply the bubbles 14 to one side of the substrate 11 in the x-axis direction while supplying the bubbles 14 to the other side of the substrate 11 in the x-axis direction. Further, the supply position of the bubbles 14 on one side of the substrate 11 in the x-axis direction and the supply position of the bubbles 14 on the other side of the substrate 11 in the x-axis direction are mutually in the y-axis direction, which is the direction in which the substrate 11 extends. Preferably they are different. In addition, since the recesses 10a are provided so that the interval becomes wider toward the inside, vibration and swinging of the substrate 11 are further promoted.
 例えば、基板11の厚みが200μm以下と薄い場合は、基板11が撓みやすい。よって、隣り合う基板11同士が接触し、基板11の接触部に薬液が好適に供給されにくくなる場合がある。同様に、隣り合う基板11間の間隔が、基板11の平面形状を矩形に近似したときの一辺の長さの1/20以下である場合、さらには1/30以下である場合には、隣り合う基板11同士が接触し、基板11の接触部に薬液が好適に供給されにくくなる場合がある。よって、本実施形態の技術が特に有用である。 For example, when the thickness of the substrate 11 is as thin as 200 μm or less, the substrate 11 is easily bent. Therefore, the adjacent substrates 11 may come into contact with each other, and it may be difficult to suitably supply the chemical solution to the contact portion of the substrate 11. Similarly, when the distance between adjacent substrates 11 is 1/20 or less of the length of one side when the planar shape of the substrate 11 is approximated to a rectangle, and further 1/30 or less, The board | substrates 11 which come in contact may contact, and it may become difficult to supply a chemical | medical solution to the contact part of the board | substrate 11 suitably. Therefore, the technique of this embodiment is particularly useful.
 なお、第1の実施形態では、基板11の一方側に気泡14を供給するパイプ15a、15dと、基板11の他方側に気泡14を供給するパイプ15b、15cとを、それぞれ2つずつ設ける例について説明した。但し、本発明は、この構成に限定されない。例えば、図6に示されるように、基板11の一方側に気泡14を供給するパイプ15aと、基板11の他方側に気泡14を供給するパイプ15cとを、それぞれひとつずつ設けてもよい。 In the first embodiment, two pipes 15a and 15d for supplying bubbles 14 to one side of the substrate 11 and two pipes 15b and 15c for supplying bubbles 14 to the other side of the substrate 11 are provided. Explained. However, the present invention is not limited to this configuration. For example, as shown in FIG. 6, one pipe 15 a for supplying bubbles 14 to one side of the substrate 11 and one pipe 15 c for supplying bubbles 14 to the other side of the substrate 11 may be provided.
 また、図7に示されるように、各パイプ15a~15dの気泡発生口16がすべてのギャップ17に位置するようにしてもよい。 Further, as shown in FIG. 7, the bubble generating ports 16 of the pipes 15 a to 15 d may be positioned in all the gaps 17.
10…カセット
10a…凹部
11…基板
12…薬液槽
13…薬液
14…気泡
15a~15d…パイプ(気泡発生部)
16…気泡発生口
17…ギャップ
DESCRIPTION OF SYMBOLS 10 ... Cassette 10a ... Recess 11 ... Board | substrate 12 ... Chemical solution tank 13 ... Chemical solution 14 ... Bubble 15a-15d ... Pipe (bubble generation part)
16 ... Bubble generating port 17 ... Gap

Claims (5)

  1.  半導体材料からなる基板を有する太陽電池の製造方法であって、
     一の方向に沿って配した複数の前記基板を、薬液槽に溜められた薬液に浸漬すると共に、前記薬液槽において前記複数の基板の下方に配された気泡発生部の複数の気泡発生口から前記薬液中の前記複数の基板に向けて気泡を供給して前記複数の基板を処理する処理工程を備え、
     平面視において、前記気泡発生口が前記一の方向において隣り合う前記基板の間に位置するように前記複数の基板を配した状態で前記処理工程を行う、太陽電池の製造方法。
    A method of manufacturing a solar cell having a substrate made of a semiconductor material,
    A plurality of the substrates arranged along one direction are immersed in a chemical solution stored in a chemical solution tank, and from a plurality of bubble generation ports of a bubble generation unit arranged below the plurality of substrates in the chemical solution tank. A treatment step of processing the plurality of substrates by supplying bubbles toward the plurality of substrates in the chemical solution;
    A method of manufacturing a solar cell, wherein the processing step is performed in a state in which the plurality of substrates are arranged so that the bubble generating port is positioned between the substrates adjacent in the one direction in plan view.
  2.  前記気泡発生口の直径が前記一の方向において隣り合う前記基板の間のギャップの距離よりも小さい、請求項1に記載の太陽電池の製造方法。 The method for manufacturing a solar cell according to claim 1, wherein a diameter of the bubble generating port is smaller than a gap distance between the substrates adjacent in the one direction.
  3.  前記隣り合う基板間の間隔が、前記基板の平面形状を矩形に近似したときの一辺の長さの1/20以下となるように前記複数の基板を配する、請求項1または2に記載の太陽電池の製造方法。 The plurality of substrates are arranged so that an interval between the adjacent substrates is 1/20 or less of a length of one side when the planar shape of the substrate is approximated to a rectangle. A method for manufacturing a solar cell.
  4.  前記基板の厚さが200μm以下である、請求項1~3のいずれか一項に記載の太陽電池の製造方法。 4. The method for manufacturing a solar cell according to claim 1, wherein the thickness of the substrate is 200 μm or less.
  5.  前記処理工程として、
     前記基板を洗浄液に浸漬することにより洗浄する洗浄工程と、
     前記基板をエッチング液に浸漬することによりエッチングするエッチング工程と、
    のうちの少なくとも一方を行う、請求項1~4のいずれか一項に記載の太陽電池の製造方法。
    As the processing step,
    A cleaning step of cleaning the substrate by immersing it in a cleaning solution;
    An etching step of etching by immersing the substrate in an etchant;
    The method for manufacturing a solar cell according to any one of claims 1 to 4, wherein at least one of the steps is performed.
PCT/JP2012/069436 2012-07-31 2012-07-31 Method for producing solar cell WO2014020693A1 (en)

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