WO2013141376A1 - Protectant, method for producing compound protected by protectant, resin protected by protectant, photosensitive resin composition containing resin protected by protectant, pattern-forming material, photosensitive film, cured relief pattern, method for producing same, and semiconductor device - Google Patents

Protectant, method for producing compound protected by protectant, resin protected by protectant, photosensitive resin composition containing resin protected by protectant, pattern-forming material, photosensitive film, cured relief pattern, method for producing same, and semiconductor device Download PDF

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Publication number
WO2013141376A1
WO2013141376A1 PCT/JP2013/058366 JP2013058366W WO2013141376A1 WO 2013141376 A1 WO2013141376 A1 WO 2013141376A1 JP 2013058366 W JP2013058366 W JP 2013058366W WO 2013141376 A1 WO2013141376 A1 WO 2013141376A1
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group
general formula
acid
aryl
alkyl
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PCT/JP2013/058366
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French (fr)
Japanese (ja)
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恭平 荒山
雨宮 拓馬
稲崎 毅
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富士フイルム株式会社
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Priority to JP2014506302A priority Critical patent/JP5696254B2/en
Publication of WO2013141376A1 publication Critical patent/WO2013141376A1/en

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    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07BGENERAL METHODS OF ORGANIC CHEMISTRY; APPARATUS THEREFOR
    • C07B51/00Introduction of protecting groups or activating groups, not provided for in the preceding groups
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C41/00Preparation of ethers; Preparation of compounds having groups, groups or groups
    • C07C41/01Preparation of ethers
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C41/00Preparation of ethers; Preparation of compounds having groups, groups or groups
    • C07C41/48Preparation of compounds having groups
    • C07C41/50Preparation of compounds having groups by reactions producing groups
    • C07C41/52Preparation of compounds having groups by reactions producing groups by substitution of halogen only
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C51/00Preparation of carboxylic acids or their salts, halides or anhydrides
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F12/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring
    • C08F12/02Monomers containing only one unsaturated aliphatic radical
    • C08F12/04Monomers containing only one unsaturated aliphatic radical containing one ring
    • C08F12/14Monomers containing only one unsaturated aliphatic radical containing one ring substituted by hetero atoms or groups containing heteroatoms
    • C08F12/22Oxygen
    • C08F12/24Phenols or alcohols
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G69/00Macromolecular compounds obtained by reactions forming a carboxylic amide link in the main chain of the macromolecule
    • C08G69/48Polymers modified by chemical after-treatment
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1003Preparatory processes
    • C08G73/1007Preparatory processes from tetracarboxylic acids or derivatives and diamines
    • C08G73/101Preparatory processes from tetracarboxylic acids or derivatives and diamines containing chain terminating or branching agents
    • C08G73/1014Preparatory processes from tetracarboxylic acids or derivatives and diamines containing chain terminating or branching agents in the form of (mono)anhydrid
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1042Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1075Partially aromatic polyimides
    • C08G73/1082Partially aromatic polyimides wholly aromatic in the tetracarboxylic moiety
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G8/00Condensation polymers of aldehydes or ketones with phenols only
    • C08G8/28Chemically modified polycondensates
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C2601/00Systems containing only non-condensed rings
    • C07C2601/12Systems containing only non-condensed rings with a six-membered ring
    • C07C2601/14The ring being saturated
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers

Definitions

  • the present invention relates to a protective agent for a carboxyl group or a hydroxyl group, a resin in which the carboxyl group or the hydroxyl group is protected by the protective agent, which is useful for use in the production of a chemically amplified resist composition, a pharmaceutical intermediate, and a paint.
  • a photosensitive resin composition containing the resin, a pattern forming material using the photosensitive resin composition, a photosensitive film, a cured film, and a method for producing a cured relief pattern using the photosensitive resin composition,
  • the present invention relates to a cured relief pattern obtained thereby and a semiconductor device provided with the cured relief pattern.
  • the hemiacetal ester compound or acetal compound is a chemically amplified resist composition as a compound or resin in which a carboxyl group or a hydroxyl group is protected because a group derived from an alkyl vinyl ether is easily eliminated by heat, an acid catalyst or the like. It is useful for the production of pharmaceutical intermediates and paints.
  • a hemiacetal ester compound or an acetal compound is usually produced by reacting with alkyl vinyl ether or alkyl vinyl ether added with hydrogen halide as a protective agent and reacting with a compound having a carboxyl group or hydroxyl group. Is done.
  • alkyl vinyl ethers and halogenated alkyl ethers are extremely unstable and easily polymerized.
  • 1-chloroethyl ethyl ether produced by the reaction of ethyl vinyl ether and hydrogen halide is reacted with a polymer having a carboxyl group or a hydroxyl group
  • a polymer derived from 1-chloroethyl ethyl ether is a subsidiary. There was a problem of being born.
  • R a , R b and R c are the same or different and each represents substituted or unsubstituted alkyl, substituted or unsubstituted aryl or substituted or unsubstituted aralkyl, or R a and R b are Together with adjacent carbon atoms form a cycloalkyl, X represents a halogen atom.
  • the object of the present invention is to protect the carboxyl group or hydroxyl group having excellent storage stability, the carboxyl group or hydroxyl group being protected by the protective agent, the resin having excellent storage stability, and the above-described protected product having excellent resolution and sensitivity.
  • Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, Another object of the present invention is to provide a cured relief pattern obtained by the above and a semiconductor device having the cured relief pattern.
  • a protective agent for a hydroxyl group or a carboxyl group which is a compound represented by the following general formula (I).
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group, or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • X represents a group capable of leaving by the action of the hydroxyl group or carboxyl group.
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group.
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing —OH from the hydroxyl group or carboxyl group of the resin.
  • All or part of the hydroxyl groups of the polyhydroxystyrene resin having a repeating unit represented by the following general formula (V) and having a weight average molecular weight of 1,000 to 100,000 are groups represented by the following general formula (III) Polyhydroxystyrene resin substituted with
  • R 4 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, and k represents an integer of 0 to 4)
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (V).
  • All or part of the hydroxyl groups of the novolak resin having a repeating unit represented by the following general formula (VI) and having a weight average molecular weight of 1,000 to 100,000 is substituted with a group represented by the following general formula (III) Novolac resin.
  • R 5 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group
  • m represents an integer of 0 to 3
  • R 6 and R 7 each independently represents Represents a hydrogen atom, an alkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (VI). ) [7] All or part of the carboxyl groups of the polymer having a repeating unit represented by the following general formula (VII) and having a weight average molecular weight of 1,000 to 100,000 are substituted with a group represented by the following general formula (IV) Polyacrylic acid resin or polymethacrylic acid resin.
  • R 8 represents a hydrogen atom or an alkyl group.
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing the carboxyl group from the repeating unit represented by the general formula (VII).
  • R 9 represents a tetravalent organic group
  • R 10 represents a divalent organic group
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing a carboxyl group from the repeating unit represented by the general formula (VIII).
  • R 11 represents a tetravalent organic group
  • R 12 represents a divalent organic group
  • R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (IX).
  • [12] The pattern formation material which is the photosensitive resin composition as described in [10] or [11].
  • [13] [10] A photosensitive film formed by the photosensitive resin composition according to [11].
  • [14] A cured film obtained by heat-treating the photosensitive resin composition according to [10] or [11].
  • [15] (A) forming the photosensitive film according to [13] on a substrate; (A) a step of exposing the photosensitive film with actinic rays or radiation; (C) A process for developing the photosensitive film so as to remove the exposed portion with an aqueous alkaline developer, and (d) a method for producing a cured relief pattern comprising a step of heat-treating the obtained relief pattern.
  • [16] A cured relief pattern obtained by the production method according to [15].
  • [17] [16] A semiconductor device comprising the cured relief pattern according to [16].
  • a carboxyl group or hydroxyl group protecting agent having excellent storage stability having excellent storage stability
  • the carboxyl group or hydroxyl group being protected by the protecting agent
  • a resin having excellent storage stability and the above-described protected product having excellent resolution and sensitivity.
  • Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, The cured relief pattern obtained by the above and a semiconductor device comprising the cured relief pattern can be provided.
  • the notation which does not describe substitution and non-substitution includes the thing which has a substituent with the thing which does not have a substituent.
  • the “alkyl group” includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group).
  • “active light” or “radiation” means, for example, the emission line spectrum of a mercury lamp, far ultraviolet rays represented by excimer laser, extreme ultraviolet rays (EUV light), X-rays, electron beams (EB), etc. To do. In the present invention, light means actinic rays or radiation.
  • exposure in the present specification is not limited to exposure to far ultraviolet rays, extreme ultraviolet rays, X-rays, EUV light and the like represented by mercury lamps and excimer lasers, but also electron beams, ion beams, and the like, unless otherwise specified.
  • the exposure with the particle beam is also included in the exposure.
  • hydroxyl group or carboxyl group which is a compound represented by formula (I)>
  • the hydroxyl group or carboxyl group protecting agent of the present invention (hereinafter also simply referred to as “protecting agent of the present invention”) is a compound represented by the following general formula (I).
  • R 1 and R 2 are each independently an alkyl group, cycloalkyl group, aryl group, aralkyl group, alkoxy group, aryloxy group, acyl group (alkanoyl group), alkoxycarbonyl group, aryloxycarbonyl Represents a group, a cyano group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an alkanoyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
  • R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
  • R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
  • X represents a group capable of leaving by the action of the hydroxyl group or carboxyl group.
  • the compound represented by the general formula (I) reacts with a hydroxyl group of a compound having a hydroxyl group or a carboxyl group of a compound having a carboxyl group without requiring a complicated operation, and is represented by the following general formula (III). A compound having a group can be produced.
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group, alkoxy A group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
  • * Represents a binding site with a residue obtained by removing —OH from the above group of a compound having a hydroxyl group or a carboxyl group.
  • the partial structure derived from the compound represented by the general formula (I) can be eliminated from the compound having the group represented by the general formula (III) without requiring a complicated operation, and a hydroxyl group or a carboxyl group. The group can be regenerated. Therefore, the compound represented by the general formula (I) functions as a hydroxyl group or carboxyl group protective agent.
  • the aryl group, alkoxy group, aryloxy group, alkanoyl group, alkoxycarbonyl group, aryloxycarbonyl group, cyano group or halogen atom for R 1 and R 2 is an electron withdrawing group.
  • At least one of 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an alkanoyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom, and is represented by the general formula (I)
  • the decomposition reaction of the compound can be suppressed, and the storage stability of the compound represented by the general formula (I) can be improved.
  • R 1 and R 2 are an aryl group, alkoxy group, aryloxy group, alkanoyl group, alkoxycarbonyl group, aryloxycarbonyl group, cyano group or halogen atom.
  • the compound having the group represented by the general formula (III) that is, a resin or compound in which a carboxyl group or a hydroxyl group is protected by the protective agent (hereinafter sometimes simply referred to as “protector”). Decomposition reaction can be suppressed and storage stability can be improved.
  • the alkyl group for R 1 , R 2 and R 3 may have a substituent and is preferably a linear or branched alkyl group having 1 to 20 carbon atoms, and an oxygen atom in the alkyl chain, You may have a sulfur atom and a nitrogen atom.
  • the cycloalkyl group for R 1 , R 2 and R 3 may have a substituent, preferably a cycloalkyl group having 3 to 20 carbon atoms, may be polycyclic, and has an oxygen atom in the ring. You may have. Specific examples include a cyclopropyl group, a cyclopentyl group, a cyclohexyl group, a norbornyl group, and an adamantyl group.
  • the aryl group for R 1 , R 2 and R 3 may have a substituent and is preferably an aryl group having 6 to 14 carbon atoms, such as a phenyl group, a naphthyl group and an anthryl group. Can be mentioned.
  • the aralkyl group for R 1 , R 2 and R 3 may have a substituent, preferably an aralkyl group having 7 to 20 carbon atoms, such as a benzyl group, a phenethyl group, a naphthylmethyl group. And naphthylethyl group.
  • the alkoxy group for R 1 and R 2 may have a substituent and is preferably an alkoxy group having 1 to 20 carbon atoms, such as a methoxy group, an ethoxy group, a propoxy group, an n-butoxy group. , Pentyloxy group, hexyloxy group, heptyloxy group and the like.
  • the aryloxy group for R 1 and R 2 may have a substituent and is preferably an aryloxy group having 6 to 14 carbon atoms, such as a phenoxy group, a naphthoxy group, an anthryloxy group, etc. Is mentioned.
  • the acyl group (alkanoyl group) for R 1 and R 2 may have a substituent, and is preferably a linear or branched alkanoyl group having 2 to 7 carbon atoms, such as an acetyl group or propionyl group.
  • the aryloxycarbonyl group for R 1 and R 2 may have a substituent, and examples of the aryloxy moiety include those similar to those exemplified for the aryloxy group.
  • Examples of the halogen atom for R 1 and R 2 include fluorine, chlorine, bromine and iodine, preferably a chlorine atom.
  • the ring formed by combining R 1 and R 2 with each other may have a substituent, preferably has 3 to 8 carbon atoms, and may be saturated or unsaturated.
  • a cyclopropane ring examples include a cyclopropane ring, a cyclobutane ring, a cyclopentane ring, a cyclohexane ring, a cycloheptane ring, a cyclooctane ring, a cyclopentene ring, a 1,3-cyclopentadiene ring, a cyclohexene ring, and a cyclohexadiene ring.
  • the ring formed by combining R 1 or R 2 with R 3 may have a substituent, preferably has 5 to 8 carbon atoms, and specifically includes an oxolane ring, an oxane ring, an oxepane.
  • each of the above groups may have include a cyano group, a halogen atom, a hydroxyl group, an alkoxy group, an aryloxy group, an alkanoyl group, a carboxyl group, an alkoxycarbonyl group, and an aryloxycarbonyl group.
  • the group capable of leaving by the action of the hydroxyl group or carboxyl group as X is, for example, a halogen atom such as chlorine atom, bromine atom, iodine atom, tosylate group, mesylate group, fluorosulfonate group, trifluoromethanesulfonate group, Examples thereof include a sulfonate group such as a nonafluorobutane sulfonate group, preferably a halogen atom, and more preferably a chlorine atom.
  • a halogen atom such as chlorine atom, bromine atom, iodine atom
  • tosylate group mesylate group, fluorosulfonate group, trifluoromethanesulfonate group
  • a sulfonate group such as a nonafluorobutane sulfonate group, preferably a halogen atom, and more preferably a chlorine atom.
  • R 1 and R 2 is an aryl group, and more preferably at least one of R 1 and R 2 is a phenyl group .
  • R 3 is preferably a group represented by the following general formula (X).
  • L 1 represents an alkylene group or a cycloalkylene group
  • L 2 represents a single bond or a divalent linking group
  • R 13 represents an alkyl group, an alicyclic group which may contain a hetero atom, or a hetero atom.
  • the alkylene group for L 1 is preferably an alkylene group having 1 to 8 carbon atoms, and examples thereof include a methylene group, an ethylene group, a propylene group, a butylene group, a hexylene group, and an octylene group.
  • the cycloalkylene group for L 1 is preferably a cycloalkylene group having 3 to 15 carbon atoms, and examples thereof include a cyclopentylene group and a cyclohexylene group.
  • the divalent linking group as L 2 is, for example, an alkylene group (preferably an alkylene group having 1 to 8 carbon atoms such as a methylene group, an ethylene group, a propylene group, a butylene group, a hexylene group or an octylene group), a cycloalkylene A group (preferably a cycloalkylene group having 3 to 15 carbon atoms, such as a cyclopentylene group or a cyclohexylene group), —S—, —O—, —CO—, —CS—, —SO 2 —, —N ( R 0 ) —, or a combination of two or more thereof, and those having a total carbon number of 20 or less are preferred
  • R 0 is a hydrogen atom or an alkyl group (eg, an alkyl group having 1 to 8 carbon atoms, specifically, a methyl group, an ethyl group, a propyl group, an n-butyl group, a sec-butyl group, Hexyl group and octyl group).
  • L 2 is preferably a single bond, an alkylene group, or a divalent linking group comprising a combination of an alkylene group and at least one of —O—, —CO—, —CS— and —N (R 0 ) —.
  • a divalent linking group comprising a bond, an alkylene group, or a combination of an alkylene group and —O— is more preferable.
  • R 0 has the same meaning as R 0 described above.
  • the alkyl group as R 13 is the same as the alkyl group described above, for example.
  • Examples of the alicyclic group and aromatic ring group as R 13 include the cycloalkyl group and aryl group described above.
  • the number of carbon atoms is preferably 3-18.
  • a group in which a plurality of aromatic rings are linked via a single bond is also included in the aromatic group as R 13 .
  • Examples of the alicyclic group containing a hetero atom and the aromatic ring group containing a hetero atom include, for example, thiirane, cyclothiolane, thiophene, furan, pyrrole, benzothiophene, benzofuran, benzopyrrole, triazine, imidazole, benzimidazole, triazole, thiadiazole, thiazole. And pyrrolidone.
  • the alicyclic group and aromatic ring group as R 13 may have a substituent, for example, an alkyl group, a cycloalkyl group, a cyano group, a halogen atom, a hydroxyl group, an alkoxy group, an aryloxy group, an alkanoyl group, Examples thereof include a carboxyl group, an alkoxycarbonyl group, and an aryloxycarbonyl group.
  • the compound represented by the general formula (I) can be obtained by a known method [for example, “New Experimental Chemistry Course (Vol. 14) Synthesis and Reaction of Organic Compounds (I)” edited by The Chemical Society of Japan, pages 590-591, Maruzen Co., Ltd. Company (January 20, 1985) etc.] can be synthesized and obtained. Thereby, the compound represented by the general formula (I), which is difficult to produce by the production methods described in Patent Documents 1 and 2 described above, can be produced.
  • Examples of the alcohol include methanol, ethanol, propanol, isopropyl alcohol, n-butanol, isobutanol, sec-butyl alcohol, pentanol, hexanol, heptanol, octanol, nonanol, decanol, benzyl alcohol and other monoalcohols, ethylene glycol, 1,3-propylene glycol, 1,2-propylene glycol, 1,4-butanediol, 1,3-butanediol, 1,5-pentanediol, 3-methyl-1,5-pentanediol, 1,6- Hexanediol, 1,8-octanediol, 2,4-diethyl-1,5-pentanediol, 2-butyl-2-ethyl-1,3-propanediol, 2,2-diethyl-1,3-propanediol , Do
  • Phenols include phenol, resorcinol, hydroquinone, pyrocatechol, bisphenol A, dihydroxydiphenylmethane (bisphenol F), bisphenol S, tetrabromobisphenol A, 1,3-bis (4-hydroxyphenyl) cyclohexane, 4,4'- Dihydroxy-3,3′-dimethyldiphenylmethane, 4,4′-dihydroxybenzophenone, tris (4-hydroxyphenyl) methane, bis (4-hydroxyphenyl) ether, novolac phenol, novolac cresol, bis (3,5-dimethyl- 4-hydroxyphenyl) sulfone, bis (4-hydroxyphenyl) sulfone, low molecular phenol compounds such as hydroxystyrene, novolac resin, polyhydroxystyrene resin, hydroxy It has a hydroxyl group such as a copolymer obtained by copolymerizing styrene with another monomer copolyme
  • Examples thereof include resins and polymers.
  • the proportion of hydroxystyrene in the copolymer obtained by copolymerizing hydroxystyrene with another monomer copolymerizable therewith is not particularly limited, but is preferably 0.2 to 90 mol%, more preferably 0.8. 2 to 60 mol%.
  • Examples of the other monomer copolymerizable with hydroxystyrene include a polymerizable unsaturated monomer having a carboxyl group or another monomer copolymerizable therewith.
  • Examples of the polymerizable unsaturated monomer having a carboxyl group include unsaturated carboxylic acids such as (meth) acrylic acid, 2-hydroxymethyl-2-propenoic acid, maleic acid, itaconic acid, maleic anhydride, and itaconic anhydride. An acid or its acid anhydride is mentioned.
  • Examples of other monomers copolymerizable with a polymerizable unsaturated monomer having a carboxyl group include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, Raw material is C1-C18 alcohol such as isobutyl (meth) acrylate, tert-butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, lauryl (meth) acrylate, stearyl (meth) acrylate, and (meth) acrylic acid Alkyl (meth) acrylates, cyclohexyl (meth) acrylate, benzyl (meth) acrylate, isobornyl (meth) acrylate, adamantyl (meth) acrylate and other (meth) acrylates, 2-hydroxyethyl (meth) acrylate , Hydroxyal
  • the polyhydroxystyrene resin or a copolymer obtained by copolymerizing hydroxystyrene with another monomer copolymerizable therewith may have a repeating unit represented by the following general formula (XI). preferable.
  • R 14 represents a hydrogen atom or a methyl group
  • Ar represents an arylene group.
  • R 14 is more preferably a hydrogen atom.
  • the arylene group represented by Ar may have a substituent.
  • These arylene groups are preferably an arylene group having 6 to 18 carbon atoms which may have a substituent, more preferably a phenylene group or a naphthylene group which may have a substituent.
  • phenylene groups which may have Moreover, as a substituent which these may have, an alkyl group, a halogen atom, a hydroxyl group, an alkoxy group, a carboxyl group, and an alkoxycarbonyl group are mentioned, for example.
  • the polyhydroxystyrene resin is preferably a polyhydroxystyrene resin having a repeating unit represented by the following general formula (V) and having a weight average molecular weight of 1,000 to 100,000.
  • the polyhydroxystyrene resin in which is protected is preferably a polyhydroxystyrene resin in which all or part of the hydroxyl groups of the polyhydroxystyrene resin are substituted with groups represented by the following general formula (III): .
  • R 4 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, and k represents an integer of 0 to 4)
  • Specific examples and preferred examples of the halogen atom for R 4 include those similar to the specific examples and preferred examples described above as the halogen atoms for R 1 and R 2 in formula (I).
  • an alkoxy group, an alkyl group, an aryl group, and an aralkyl group for R 4 include an alkoxy group, an alkyl group, an aryl group for R 1 , R 2, and R 3 in the general formula (I), Examples of the aralkyl group are the same as the specific examples and preferred examples described above.
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group.
  • novolak resins are available as commercial products.
  • an acidic catalyst for example, an inorganic acid such as hydrochloric acid, sulfuric acid, nitric acid,
  • the above phenols and aldehydes can be used alone or in combination of two or more.
  • the novolak resin is preferably a novolak resin having a repeating unit represented by the following general formula (VI) and having a weight average molecular weight of 1,000 to 100,000, and the hydroxyl group is protected by the protective agent of the present invention.
  • the novolak resin is preferably a polyhydroxystyrene resin in which all or part of the hydroxyl groups of the novolak resin is substituted with a group represented by the following general formula (III).
  • R 5 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group
  • m represents an integer of 0 to 3
  • R 6 and R 7 each independently represents hydrogen Represents an atom, an alkyl group, an aryl group or an aralkyl group.
  • Specific examples and preferred examples of the halogen atom for R 5 include those similar to the specific examples and preferred examples described above as the halogen atoms for R 1 and R 2 in formula (I).
  • Specific examples and preferred examples of the alkoxy group for R 5 include those similar to the specific examples and preferred examples described above as the alkoxy groups for R 1 , R 2 and R 3 in the general formula (I).
  • alkyl group, aryl group and aralkyl group for R 5 , R 6 and R 7 include an alkoxy group, an alkyl group for R 1 , R 2 and R 3 in the general formula (I), Examples of the aryl group and aralkyl group are the same as the specific examples and preferred examples described above.
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group.
  • Polyhydroxyamide functions and can be used as a polybenzoxazole precursor.
  • the polyhydroxyamide is preferably a polyhydroxyamide having a repeating unit represented by the following general formula (IX).
  • Examples of the polyhydroxyamide whose hydroxyl group is protected by the protecting agent of the present invention include all or part of the hydroxyl groups of the polyhydroxyamide having a repeating unit represented by the following general formula (IX).
  • R 11 represents a tetravalent organic group
  • R 12 represents a divalent organic group
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group.
  • R 11 is preferably a tetravalent organic group containing an aromatic ring, and the two amino groups and the two hydroxyl groups are bonded directly to the aromatic ring, respectively. Is more preferably a phenolic hydroxyl group, specifically, a residue obtained by removing two hydroxyl groups and two amino groups of hydroxydiamine. Furthermore, in order to provide heat resistance, R 11 is preferably formed from bisaminophenol having one or more aromatic rings as a raw material.
  • bisaminophenol examples include 3,3′-diamino-4,4′-dihydroxybiphenyl, 3,3′-diamino-4,4′-dihydroxybiphenyl, 4,4′-diamino-3,3′- Dihydroxybiphenyl, bis (3-amino-4-hydroxyphenyl) propane, 2,2-bis (4-amino-3-hydroxyphenyl) propane, 2,2-bis (3-amino-4-hydroxyphenyl) sulfone, Bis (4-amino-3-hydroxyphenyl) sulfone, 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane, 2,2-bis (4-amino-3-hydroxyphenyl) hexafluoropropane 4,6-diaminoresorcinol, 4,5-diaminoresorcinol, etc., which may be used alone or It can be used in combination of more than seeds.
  • R 11 is particularly preferably a t
  • X 1 represents —O—, —S—, —C (CF 3 ) 2 —, —CH 2 —, —SO 2 —, —NHCO—.
  • * Represents a bonding position with —NH— or —OH bonded to R 11 in the general formula (IX).
  • R 12 is not particularly limited as long as it is a divalent organic group, but preferably contains one or more aromatic ring groups in order to impart heat resistance to polyoxazole.
  • the two bonding sites of R 12 are directly present on the aromatic ring.
  • the two bonding sites may be present on the same aromatic ring, but may be present on different aromatic rings when having a plurality of aromatic rings.
  • R 12 is a group containing a plurality of aromatic rings
  • the plurality of aromatic rings are a single bond, ether bond, methylene bond, ethylene bond, 2,2-propylene bond, 2,2-hexafluoropropylene.
  • the resin having the structural unit represented by the general formula (IX) is, for example, as shown in Polymer Science Society, New Polymer Experiments 3 Polymer Synthesis and Reaction (2) P177-P183 (1996).
  • it can be obtained by reacting dicarboxylic acid dihalide obtained by halogenating dicarboxylic acid and dihydroxydiamine.
  • dicarboxylic acid examples include isophthalic acid, terephthalic acid, 2,2-bis (4-carboxyphenyl) hexapropane, 4,4′-biphenyldicarboxylic acid, 4,4′-dicarboxyphenyl ether, bis (4- Carboxyphenyl) sulfone, 2,2-bis (4-carboxyphenyl) propane, 5-tert-butylisophthalic acid, 5-fluoroisophthalic acid, aromatic dicarboxylic acid such as 2,6-naphthalenedicarboxylic acid, 1,2 -Aliphatic dicarboxylic acids such as cyclobutanedicarboxylic acid, 1,4-cyclobutanedicarboxylic acid, 1,3-cyclopentanedicarboxylic acid, oxalic acid, malonic acid, succinic acid, etc., and these may be used alone or in combination of two or more Can be used in combination.
  • the poly (meth) acrylate having a phenolic hydroxyl group preferably has a repeating unit represented by the following general formula (XII).
  • R 15 represents a hydrogen atom or a methyl group
  • L 2 represents a single bond or an alkylene group
  • Ar represents an arylene group.
  • R 15 is more preferably a methyl group.
  • the arylene group represented by Ar may have a substituent.
  • These arylene groups are preferably an arylene group having 6 to 18 carbon atoms which may have a substituent, more preferably a phenylene group or a naphthylene group which may have a substituent.
  • phenylene groups which may have Moreover, as a substituent which these may have, an alkyl group, a halogen atom, a hydroxyl group, an alkoxy group, a carboxyl group, and an alkoxycarbonyl group are mentioned, for example.
  • substituents which may have, an alkyl group, a halogen atom, a hydroxyl group, an alkoxy group, a carboxyl group, and an alkoxycarbonyl group are mentioned, for example.
  • Specific examples of the repeating unit represented by the general formula (XII) are shown below, but the present invention is not limited thereto.
  • a commercially available resin can also be used as the hydroxyl group-containing resin or polymer.
  • the weight average molecular weight of the polymer having a hydroxyl group is preferably 1,000 to 200,000, more preferably 1,000 to 100,000, and 1,000 to 50,000. Further preferred.
  • the resin or polymer having a hydroxyl group can be purified and used as a solid. Moreover, when a solvent is used in the production, it can be used as a solution.
  • Compound having a carboxyl group that can be protected by reacting with the protective agent of the present invention, and a compound (resin) in which the carboxyl group is protected by the protective agent of the present invention examples include formic acid, acetic acid, propionic acid, propiolic acid, butyric acid, isobutyric acid, hexanoic acid, heptanoic acid, octylic acid, nonanoic acid, and isononanoic acid.
  • Monocarboxylic acids such as decanoic acid, dodecanoic acid, stearic acid, benzoic acid, cinnamic acid, 2-naphthoic acid, nicotinic acid, isonicotinic acid, amin oil fatty acid, tall oil fatty acid, soybean oil fatty acid, dehydrated castor oil fatty acid, Succinic acid, glutaric acid, adipic acid, azelaic acid, sebacic acid, dodecanediic acid, compound having decamethylene dicarboxyl group, phthalic acid, maleic acid, trimellitic acid, pyromellitic acid, tetrahydrophthalic acid, hexahydrophthalic acid, Polyvalent carboxylic acids such as methyl hexahydrophthalic acid, lactic acid, citric acid, hydroxy ⁇ , ⁇ -unsaturated monomers having a carboxyl group such as pivalic acid, hydroxycarboxylic acid such as 12-hydroxystea
  • Polymers polyesters having carboxyl groups, alkyd resins, urethane resins, epoxy resins, carboxyl group-modified epoxy resins, polymers containing carboxyl groups such as polyamic acids of polyimide precursors, etc., among others, containing carboxyl groups Polymerizable unsaturated monomer homopolymer, polymerizable unsaturated monomer containing carboxyl group, and Copolymers of copolymerizable other monomer, or polyamic acid used as a polyimide precursor preferable.
  • Examples of the polymerizable unsaturated monomer containing a carboxyl group and other monomers copolymerizable therewith include, for example, ⁇ a compound having a hydroxyl group that can be protected by reacting with the protective agent of the present invention, and the present invention. And the same as those described above in the section of compound (resin) in which the hydroxyl group is protected by the protecting agent. These monomers may be used alone or in combination of two or more. Polymerization of a polymerizable unsaturated monomer containing a carboxyl group and copolymerization of a polymerizable unsaturated monomer containing a carboxyl group and another monomer copolymerizable therewith are carried out by known methods. be able to.
  • a polyacrylic acid resin or polymethacrylic acid resin having a repeating unit represented by the following general formula (VII) is preferable.
  • the polyacrylic acid resin or polymethacrylic acid resin in which the carboxyl group is protected by the protective agent of the present invention has a repeating unit represented by the following general formula (VII) and has a weight average molecular weight of 1,000 to 100,000. It is preferable that all or part of the carboxyl group of the coalescence is a polyacrylic acid resin or a polymethacrylic acid resin substituted with a group represented by the following general formula (IV).
  • R 8 represents a hydrogen atom or an alkyl group.
  • R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group.
  • the alkyl group for R 8 may have a substituent and is preferably an alkyl group having 1 to 4 carbon atoms, and examples thereof include a methyl group and an ethyl group. Examples of the substituent that can be included include a hydroxyl group, a halogen atom (such as a fluorine atom and a chlorine atom), a cyano group, and the like, and a hydroxyl group
  • Polyamic acid can function and be used as a polyimide precursor. By using polyamic acid, it is possible to obtain a highly reliable cured relief pattern having excellent heat resistance and less outgassing after heat curing.
  • the polyamic acid containing the repeating unit represented by the following general formula (VIII) is preferable.
  • the polyamic acid in which the carboxyl group is protected by the protective agent of the present invention all or part of the carboxyl group of the polyamic acid having a repeating unit represented by the following general formula (VIII) is represented by the following general formula (IV).
  • a polyamic acid substituted with the group represented is preferable.
  • R 9 represents a tetravalent organic group
  • R 10 represents a divalent organic group
  • R 1, R 2 and R 3 are respectively synonymous with R 1, R 2 and R 3 in Formula (I)
  • at least one of R 1 and R 2 an aryl group, an alkoxy A group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom
  • * represents a residue obtained by removing the carboxyl group from the repeating unit represented by the general formula (VIII).
  • the repeating unit represented by the general formula (VIII) includes a compound having four carboxyl groups with R 9 as a nucleus, a carboxylic acid anhydride thereof, or at least one of the four carboxyl groups represented by the general formula It composed of an acid component derived from a compound comprising substituted with a group represented by (IV), a diamine component derived from the R 10 in the compound having two amino groups as nucleus.
  • the tetravalent organic group R 9 preferably has 4 to 30 carbon atoms, and more preferably a tetravalent linking group having a monocyclic or condensed polycyclic aliphatic group or aromatic group. .
  • a plurality of R 9 present in the resin may be the same or different.
  • Examples of the monocyclic aromatic group in the tetravalent organic group R 9 include a benzene ring group and a pyridine ring group.
  • Examples of the condensed polycyclic aromatic group in the tetravalent organic group R 9 include a naphthalene ring group and a perylene ring group.
  • Examples of the monocyclic aliphatic group in the tetravalent organic group R 9 include a cyclobutane ring group, a cyclopentane ring group, and a cyclohexane ring group.
  • Examples of the condensed polycyclic aliphatic group in the tetravalent organic group R 9 include a bicyclo [2.2.1] heptane ring group, a bicyclo [2.2.2] octane ring group, and a bicyclo [2.2. 2] Oct-7-ene ring group and the like.
  • the tetravalent linking group having a monocyclic or condensed polycyclic aliphatic group or aromatic group for the tetravalent organic group R 9 the above-mentioned monocyclic or condensed polycyclic aliphatic group or The aromatic group itself may be used, but a plurality of monocyclic or condensed polycyclic aliphatic groups or aromatic groups are linked via a single bond or a divalent linking group, and 4 as R 9 A valent linking group may be formed.
  • the divalent linking group is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, such as a methylene group, an ethylene group, or a propylene group), an oxygen atom, a sulfur atom, a divalent sulfone group, or an ester bond. , Ketone group, amide group and the like.
  • the acid component having a group derived from at least four carboxyl groups with R 9 as a nucleus include pyromellitic acid anhydride, 3,3 ′, 4,4′-biphenyltetracarboxylic acid anhydride, 2, 3,3 ′, 4′-biphenyltetracarboxylic anhydride, 2,2 ′, 3,3′-biphenyltetracarboxylic anhydride, 3,3 ′, 4,4′-benzophenonetetracarboxylic anhydride, 2 , 2 ′, 3,3′-benzophenonetetracarboxylic acid anhydride, 4,4 ′-(hexafluoroisopropylidene) diphthalic acid anhydride, 1,2,5,6-naphthalenetetracarboxylic acid anhydride, 2, 3,6,7-naphthalenetetracarboxylic anhydride, 2,3,5,6-pyridinetetracarboxylic anhydride, 3,
  • Cyclobutanetetracarboxylic acid anhydride cyclopentanetetracarboxylic acid anhydride, cyclohexanetetracarboxylic acid anhydride, 1,2,4,5-cyclohexanetetracarboxylic acid, bicyclo [2.2.1] heptane-2,3, 5,6-tetracarboxylic acid, bicyclo [2.2.2] octane-2,3,5,6-tetracarboxylic acid, or bicyclo [2.2.2] oct-7-ene-2,3,5 , 6-tetracarboxylic acid, bicyclo [2.2.2] octane-2,3,5,6-tetracarboxylic dianhydride, (1S, 2S, 4R, 5R) -cyclohexanetetracarboxylic dianhydride, Examples include components derived from aliphatic tetracarboxylic anhydrides such as (1R, 2S, 4S, 5R) -
  • a component derived from pyromellitic acid anhydride a component derived from 3,3 ′, 4,4′-biphenyltetracarboxylic acid anhydride, 2,3,3 ′, 4′-biphenyltetracarboxylic acid anhydride
  • a component derived from pyromellitic anhydride a component derived from 3,3 ′, 4,4′-biphenyltetracarboxylic anhydride, 4,4 ′-(hexafluoroisopropylidene) diphthalic anhydride
  • the content of the acid component derived from the compound having four carboxyl groups with R 9 as the nucleus in the resin is preferably 20 to 70 mol% with respect to all repeating units constituting the resin. More preferably, it is ⁇ 60 mol%.
  • the divalent organic group R 10 include a divalent group having an alicyclic group, a divalent group having an aromatic group, and a divalent group containing a silicon atom.
  • a plurality of R 10 present in the resin may be the same as or different from each other.
  • the alicyclic group that R 10 may have is preferably a divalent alicyclic group having 3 to 20 carbon atoms, such as a monocyclic cycloalkylene group such as a cyclopentylene group or a cyclohexylene group, or bicyclo [2.2. 1] Polycyclic cycloalkylene groups such as a heptylene group, norbornylene group, tetracyclodecanylene group, tetracyclododecanylene group, adamantylene group, and the like can be given.
  • the divalent group having an alicyclic group for R 10 may be the alicyclic group itself, but a plurality of alicyclic groups is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, for example, Methylene group, ethylene group, propylene group, etc.) may be linked to form a divalent group having an alicyclic group as R 2 , and the amino group and alicyclic group in the diamine component are alkylene groups. You may connect with.
  • the alicyclic group and alkylene group that can form a divalent group having an alicyclic group may have a substituent, and an alkyl group (preferably an alkyl group having 1 to 4 carbon atoms) as such a substituent. ), Halogen atoms and the like.
  • Particularly preferred diamine components having an alicyclic group structure having R 10 as a nucleus include a 5-amino-1,3,3-trimethylcyclohexanemethylamine component, a cis-1,4-cyclohexanediamine component, and trans-1,4- Cyclohexanediamine component, 1,4-cyclohexanediamine component (cis, trans mixture), 4,4′-methylenebis (cyclohexylamine) component and its 3,3′-dimethyl-substituted product, bis (aminomethyl) bicyclo [2.2 .1] heptane component, 1,3-diaminoadamantane component, 3,3′-diamino-1,1′-biadamantyl component, 4,4′-hexafluoroisopropylidenebis (cyclohexylamine) component, Of which 3,3'-diamino-1,1'-biadamantyl component, trans-1,4-cycl From the viewpoint of he
  • the content of the alicyclic diamine component having two amino groups with R 10 as a nucleus in the resin is preferably 20 to 70 mol%, and preferably 30 to 60 mol based on all repeating units constituting the resin. % Is more preferable.
  • the aromatic group in the divalent group having an aromatic group for R 10 is preferably an aromatic group having 5 to 16 carbon atoms, and examples thereof include a phenylene group and a naphthylene group. Further, the aromatic group may contain a hetero atom such as a nitrogen atom or an oxygen atom, and examples thereof include a divalent benzoxazole group.
  • the divalent group having an aromatic group for R 10 may be the aromatic group itself, but a plurality of aromatic groups may be linked via a single bond or a divalent linking group to form R 2.
  • the divalent group which has an aromatic group as may be formed, and the amino group in the diamine component and the aromatic group may be linked via a divalent linking group.
  • the divalent linking group is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, such as a methylene group, an ethylene group, or a propylene group), an oxygen atom, a sulfur atom, a divalent sulfone group, or an ester bond. , Ketone group, amide group and the like.
  • the aromatic group and alkylene group that can form a divalent group having an aromatic group may have a substituent, and an alkyl group (preferably an alkyl group having 1 to 4 carbon atoms) as such a substituent. ), An alkoxy group such as a halogen atom and a methoxy group, and an aryl group such as a cyano group and a phenyl group.
  • aromatic diamine component having R 10 as a core examples include, for example, an m-phenylenediamine component, a p-phenylenediamine component, a 2,4-tolylenediamine component, a 3,3′-diaminodiphenyl ether component, 3, 4'-diaminodiphenyl ether component, 4,4'-diaminodiphenyl ether component, 3,3'-diaminodiphenyl sulfone component, 4,4'-diaminodiphenyl sulfone component, 3,4'-diaminodiphenyl sulfone component, 3,3 ' -Diaminodiphenylmethane component, 4,4'-diaminodiphenylmethane component, 3,4'-diaminodiphenylmethane component, 4,4'-diaminodiphenyl sulfide component, 3,3'-diaminodip
  • aromatic diamine components include p-phenylenediamine component, 4,4′-diaminodiphenyl ether component, 3,3′-diaminodiphenylsulfone component, 4,4′-diaminodiphenylsulfone component, and 2,2′-bis.
  • (4-aminophenyl) hexafluoropropane component 1,4-bis (4-aminophenoxy) benzene component, imino-di-p-phenylenediamine component, 4,4'-diaminobiphenyl component, 4,4'-diamino Benzophenone component, 3,3′-dimethoxy-4,4′-diaminobiphenyl component, 3,3′-dimethyl-4,4′-diaminobiphenyl component, 2,2′-dimethyl 4,4′-diaminobiphenyl component, 2,2′-bis (trifluoromethyl) benzidine component, o-toluidine sulfone component, 2,2-bis (4-amino Nophenoxyphenyl) propane component, 9,9-bis (4-aminophenyl) fluorene component, 4,4′-di- (3-aminophenoxy) diphenylsulfone component, 4,4′-diaminobenz
  • the diamine component may be substituted with a hydroxyl group.
  • bisaminophenol components include 3,3′-dihydroxybenzidine component, 3,3′-diamino-4,4′-dihydroxybiphenyl component, and 4,4′-diamino-3,3′-dihydroxy.
  • Biphenyl component 3,3′-diamino-4,4′-dihydroxydiphenylsulfone component, 4,4′-diamino-3,3′-dihydroxydiphenylsulfone component, bis- (3-amino-4-hydroxyphenyl) methane Component, 2,2-bis- (3-amino-4-hydroxyphenyl) propane component, 2,2-bis- (3-amino-4-hydroxyphenyl) hexafluoropropane component, 2,2-bis- (4 -Amino-3-hydroxyphenyl) hexafluoropropane component, bis- (4-amino-3-hydroxyphenyl) methane component, 2 2-bis- (4-amino-3-hydroxyphenyl) propane component, 4,4′-diamino-3,3′-dihydroxybenzophenone component, 3,3′-diamino-4,4′-dihydroxybenzophenone component, 4 , 4'-diamino-3,3'
  • a particularly preferred embodiment includes a case where R 10 in the general formula (VIII) is a divalent group having an aromatic group selected from the following.
  • X 1 represents —O—, —S—, —C (CF 3 ) 2 —, —CH 2 —, —SO 2 —, —NHCO—.
  • * Represents a bonding position with —NH— or —OH bonded to R 2 in the general formula (1).
  • —NH— and —OH bonded to R 2 are bonded to each other in the ortho position (adjacent position).
  • the content of the aromatic diamine component having two amino groups with R 10 as a nucleus in the resin is preferably 5 to 40 mol% with respect to all repeating units constituting the resin, and preferably 10 to 30 mol. % Is more preferable.
  • the R 10 to enhance the adhesion to the substrate can be a silicon diamine component as the diamine component to the nucleus.
  • examples include bis (4-aminophenyl) dimethylsilane component, bis (4-aminophenyl) tetramethylsiloxane component, bis (4-aminophenyl) tetramethyldisiloxane component, bis ( ⁇ -aminopropyl) tetramethyl.
  • Examples thereof include a disiloxane component, a 1,4-bis ( ⁇ -aminopropyldimethylsilyl) benzene component, a bis (4-aminobutyl) tetramethyldisiloxane component, and a bis ( ⁇ -aminopropyl) tetraphenyldisiloxane component.
  • a disiloxane component a 1,4-bis ( ⁇ -aminopropyldimethylsilyl) benzene component, a bis (4-aminobutyl) tetramethyldisiloxane component, and a bis ( ⁇ -aminopropyl) tetraphenyldisiloxane component.
  • a disiloxane component examples thereof include a disiloxane component, a 1,4-bis ( ⁇ -aminopropyldimethylsilyl) benzene component, a bis (4-aminobutyl) tetramethyld
  • R 16 represents a divalent organic group
  • R 17 represents a monovalent organic group.
  • a plurality of R 16 may be the being the same or different.
  • the plurality of R 17 may be the same as or different from each other.
  • Examples of the divalent organic group represented by R 16 include an optionally substituted linear or branched alkylene group having 1 to 20 carbon atoms, a phenylene group having 6 to 20 carbon atoms, and 3 to 3 carbon atoms.
  • 20 represents a divalent alicyclic group or a group formed by combining these.
  • the monovalent organic group represented by R 17 represents a linear or branched alkyl group having 1 to 20 carbon atoms or an aryl group having 6 to 20 carbon atoms which may have a substituent. More specifically, the following can be mentioned.
  • the content of the silicon diamine component having at least two amino groups with R 10 as a nucleus in the resin is preferably 5 to 40 mol% with respect to all repeating units constituting the resin, and preferably 10 to 30 mol. % Is more preferable.
  • the polyamic acid containing the repeating unit represented by the general formula (VIII) is, for example, as shown in Polymer Science Society edited by New Polymer Experiments 3 Polymer Synthesis and Reaction (2) P155-P171 (1996). It can be obtained by reacting an acid component and a diamine in an organic solvent.
  • organic solvents examples include amide solvents such as N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidinone, 1,3-dimethyl-2-imidazolidinone, benzene, anisole, diphenyl ether, Aromatic solvents such as nitrobenzene, benzonitrile, pyridine, halogenated solvents such as chloroform, dichloromethane, 1,2-dichloroethane, 1,1,2,2-tetrachloroethane, ethers such as tetrahydrofuran, dioxane, diglyme Examples thereof include system solvents and dimethyl sulfoxide. Of these, amide solvents are preferred, and high molecular weight polyamic acid can be obtained.
  • amide solvents are preferred, and high molecular weight polyamic acid can be obtained.
  • terminal blocker react with the terminal of the polyamic acid containing the repeating unit represented by general formula (VIII).
  • the terminal capping agent monoamine, acid anhydride, monocarboxylic acid, monoacid chloride compound, monoactive ester compound and the like can be used.
  • terminal blocker react it is preferable at the point which can control the repeating number of a structural unit, ie, molecular weight, in a preferable range.
  • acid deactivation due to neutralization of the terminal amine and the generated acid can be suppressed by the terminal blocking agent.
  • various organic groups such as a crosslinking reactive group having a carbon-carbon unsaturated bond can be introduced as a terminal group.
  • Monoamines used for end-capping agents are 5-amino-8-hydroxyquinoline, 4-amino-8-hydroxyquinoline, 1-hydroxy-8-aminonaphthalene, 1-hydroxy-7-aminonaphthalene, 1-hydroxy- 6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 1-hydroxy-3-aminonaphthalene, 1-hydroxy-2-aminonaphthalene, 1-amino-7-hydroxynaphthalene, 2-hydroxy-7-aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 2-hydroxy-4-aminonaphthalene, 2-hydroxy-3-aminonaphthalene, 1-amino-2 -Hydroxynaphthalene, 1-carboxy-8-amino Phthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5-
  • 5-amino-8-hydroxyquinoline 1-hydroxy-7-aminonaphthalene, 1-hydroxy-6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 2 -Hydroxy-7-aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5 Aminonaphthalene, 2-carboxy-7-aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-aminobenzoic acid, 3-aminobenzoic acid, 4-aminobenzoic acid, 4- Aminosalicylic acid, 5-aminosalicylic acid, 6-aminosalicylic acid 2-aminobenzenesulfonic acid, 3-aminobenzoic acid
  • Acid anhydrides, monocarboxylic acids, monoacid chloride compounds and active ester compounds used as end-capping agents are phthalic anhydride, maleic anhydride, nadic anhydride, cyclohexanedicarboxylic anhydride, 3-hydroxyphthalic anhydride Acid anhydrides such as 2-carboxyphenol, 3-carboxyphenol, 4-carboxyphenol, 2-carboxythiophenol, 3-carboxythiophenol, 4-carboxythiophenol, 1-hydroxy-8-carboxynaphthalene, 1- Hydroxy-7-carboxynaphthalene, 1-hydroxy-6-carboxynaphthalene, 1-hydroxy-5-carboxynaphthalene, 1-hydroxy-4-carboxynaphthalene, 1-hydroxy-3-carboxynaphthalene, 1-hydroxy-2-carboxyl Naphthalene, 1-mercapto-8-carboxynaphthalene, 1-mercapto-7-carboxynaphthalene, 1-mercapto-6-carboxy
  • phthalic anhydride maleic anhydride, nadic anhydride, cyclohexanedicarboxylic anhydride, acid anhydrides such as 3-hydroxyphthalic anhydride, 3-carboxyphenol, 4-carboxyphenol, 3-carboxythiophenol 4-carboxythiophenol, 1-hydroxy-7-carboxynaphthalene, 1-hydroxy-6-carboxynaphthalene, 1-hydroxy-5-carboxynaphthalene, 1-mercapto-7-carboxynaphthalene, 1-mercapto-6-carboxy Naphthalene, 1-mercapto-5-carboxynaphthalene, 3-carboxybenzenesulfonic acid, 4-carboxybenzenesulfonic acid, 3-ethynylbenzoic acid, 4-ethynylbenzoic acid, 3,4-diethynylbenzoic acid, 3,5-diethynyl benzoic acid Monocarboxylic acids, and monoacid chloride compounds
  • the introduction ratio of the monoamine used for the end-capping agent is preferably in the range of 0.1 to 60 mol%, particularly preferably 5 to 50 mol%, based on the total amine component.
  • the introduction ratio of the compound selected from the acid anhydride, monocarboxylic acid, monoacid chloride compound and monoactive ester compound used as the end-capping agent is in the range of 0.1 to 100 mol% with respect to the diamine component.
  • the amount is particularly preferably 5 to 90 mol%.
  • a plurality of different end groups may be introduced by reacting a plurality of end capping agents.
  • the end-capping agent introduced into the polymer can be easily detected by the following method.
  • a polymer having an end-capping agent introduced therein is dissolved in an acidic solution and decomposed into an amine component and an acid anhydride component that are constituent units of the polymer.
  • the end-capping agent can be easily detected by gas chromatography (GC) or NMR measurement.
  • GC gas chromatography
  • NMR nuclear magnetic resonance
  • PLC pyrolysis gas chromatography
  • infrared spectrum 13 CNMR spectrum.
  • a commercially available resin can also be used as the resin or polymer containing a carboxyl group.
  • the ratio of the carboxyl group in the resin or polymer containing a carboxyl group is not particularly limited, but the acid value is preferably 20 to 200, more preferably 40 to 160.
  • the acid value is the number of mg of potassium hydroxide necessary to neutralize the carboxyl group contained in 1 g of the polymer.
  • the weight average molecular weight of the resin or polymer containing a carboxyl group is preferably 1,000 to 200,000, more preferably 3,000 to 10,000, and still more preferably 3,000 to 50,000. 000.
  • the polymer containing a carboxyl group can be purified and used as a solid. Moreover, when a solvent is used in the production, it can be used as a solution.
  • a method for protecting a hydroxyl group or a carboxyl group of a compound having a hydroxyl group or a carboxyl group using the compound represented by the general formula (I) is a method for producing a compound having a group represented by the general formula (III). It is also a method. By reacting the compound represented by the general formula (I) with a compound having a hydroxyl group or a carboxyl group, the hydroxyl group or the carboxyl group can be protected and represented by the general formula (III). A compound having a group can be produced.
  • the use amount (molar ratio) of the compound represented by the general formula (I) with respect to the compound having a hydroxyl group or a carboxyl group is not particularly limited, but hydroxyl to be protected in a compound having a hydroxyl group or a carboxyl group
  • the amount is preferably 0.1 to 10 mol, more preferably 0.2 to 5 mol, and still more preferably 0.3 to 3 mol with respect to 1 mol of the group or carboxyl group.
  • the reaction temperature is preferably 0 to 100 ° C, more preferably 0 to 50 ° C, still more preferably 0 to 20 ° C.
  • the base is not particularly limited, and examples thereof include inorganic bases such as sodium hydroxide and potassium hydroxide, and organic bases such as ethylamine, diethylamine, triethylamine, and diisopropylethylamine. Among them, triethylamine or diisopropylethylamine is preferable. .
  • the content of the base is not particularly limited, but is preferably 1 to 10 mol, and more preferably 1 to 3 mol, per 1 mol of the compound represented by the general formula (I). Moreover, you may use an organic solvent as needed.
  • organic solvent examples include hydrocarbon solvents such as hexane, toluene and xylene, ether solvents such as dioxane and tetrahydrofuran, ketone solvents such as acetone, methyl ethyl ketone and methyl isobutyl ketone, N, N-dimethylacetamide, N , N-dimethylformamide, aprotic polar solvents such as dimethyl sulfoxide and the like, and one or more of them are used.
  • hydrocarbon solvents such as hexane, toluene and xylene
  • ether solvents such as dioxane and tetrahydrofuran
  • ketone solvents such as acetone, methyl ethyl ketone and methyl isobutyl ketone
  • N, N-dimethylacetamide, N , N-dimethylformamide aprotic polar solvents such as dimethyl sulfoxide and
  • the compound having a group represented by the general formula (III) is a compound having a polymerizable unsaturated double bond, if necessary, it may be used alone or in other polymerizable unsaturated units by a known method. It may be polymerized with a monomer.
  • Examples of the method for removing the protecting group include a method of treating a compound having a group represented by the general formula (III) with heat or an acid. When processing with heat, it is preferably performed at 150 to 250 ° C.
  • examples of the acid to be used include sulfuric acid, hydrochloric acid, p-toluenesulfonic acid, camphorsulfonic acid and the like, and among them, p-toluenesulfonic acid is preferable.
  • the amount of the acid used is preferably 0.01 to 50 mol with respect to 1 mol of the structure derived from the compound represented by the general formula (I) to be eliminated.
  • the temperature during the treatment with an acid is preferably 20 to 150 ° C.
  • water may be added.
  • the amount of water used is preferably 0.1 to 100% by mass relative to the compound having a group represented by the general formula (III).
  • the temperature during the treatment with an acid is preferably 20 to 80 ° C.
  • an organic solvent may be used. Examples of the organic solvent include those described above, and the amount used is preferably 10 to 300% by mass, and 20 to 100% by mass with respect to the compound represented by the general formula (I). Is more preferable.
  • a compound having a group represented by the general formula (III) and a photoacid generator are allowed to coexist, and the photoacid generator is irradiated with radiation or the like to generate an acid, thereby deprotecting the hydroxyl group.
  • the carboxyl group can be regenerated.
  • the compound represented by the general formula (I) can be used for protecting and deprotecting a carboxyl group of a compound having a hydroxyl group or a compound having a carboxyl group. Therefore, the compound having a group represented by the general formula (III) can be used as a constituent component of a chemically amplified resist composition or the like.
  • the photosensitive resin composition of the present invention contains (a) a resin having a group represented by the general formula (III) or (IV), and (b) a compound that generates an acid upon irradiation with actinic rays or radiation. To do.
  • the resin having a group represented by the general formula (III) or (IV) (hereinafter sometimes simply referred to as “base polymer”) preferably has a repeating unit represented by the general formula (V).
  • the weight average molecular weight of the base polymer is preferably 1,000 to 200,000, more preferably 1,000 to 150,000, and still more preferably 1,000 to 100,000.
  • the resin (a) having a group represented by the general formula (III) or (IV) may be used alone or in combination of two or more. Moreover, you may contain resin other than resin (a) which has group represented by the said general formula (III) or (IV).
  • composition of the present invention is a compound that generates acid upon irradiation with actinic ray or radiation (also referred to as “photoacid generator” or “(b) component”). Containing. These may be used in combination of two or more. Moreover, a sensitizer etc. can also be used together for sensitivity adjustment.
  • the photoacid generator is used as a photoinitiator for photocationic polymerization, a photoinitiator for radical photopolymerization, a photodecolorant for dyes, a photochromic agent, or a microresist.
  • Known compounds that generate an acid upon irradiation with active light or radiation and mixtures thereof can be appropriately selected and used.
  • Examples include diazonium salts, phosphonium salts, sulfonium salts, iodonium salts, imide sulfonates, oxime sulfonates, diazodisulfones, disulfones, and o-nitrobenzyl sulfonates.
  • a group that generates an acid upon irradiation with actinic rays or radiation or a compound in which a compound is introduced into the main chain or side chain of the polymer, such as US Pat. No. 3,849,137, German Patent No. 3914407, JP 63-26653, JP 55-164824, JP 62-69263, JP 63-146038, JP 63-163452, JP 62-153853, JP The compounds described in 63-146029 and the like can be used.
  • R 201 , R 202 and R 203 each independently represents an organic group.
  • X ⁇ represents a non-nucleophilic anion, preferably sulfonate anion, carboxylate anion, bis (alkylsulfonyl) amide anion, tris (alkylsulfonyl) methide anion, BF 4 ⁇ , PF 6 ⁇ , SbF 6 — An organic anion having a carbon atom is preferable.
  • R 204 to R 207 each independently represents an aryl group, an alkyl group, or a cycloalkyl group.
  • X ⁇ represents a non-nucleophilic anion.
  • Preferred organic anions include organic anions represented by the following general formula.
  • Rc 1 represents an organic group.
  • the organic group in Rc 1 include those having 1 to 30 carbon atoms, and preferably an alkyl group, a cycloalkyl group, an aryl group, or a plurality of these which may be substituted is a single bond, —O—, — And groups linked by a linking group such as CO 2 —, —S—, —SO 3 —, —SO 2 N (Rd 1 ) —.
  • Rd 1 represents a hydrogen atom or an alkyl group.
  • Rc 3 , Rc 4 and Rc 5 each independently represents an organic group.
  • Examples of the organic group for Rc 3 , Rc 4 and Rc 5 include the same organic groups as those for Rc 1 , preferably a perfluoroalkyl group having 1 to 4 carbon atoms. Rc 3 and Rc 4 may be bonded to form a ring. Examples of the group formed by combining Rc 3 and Rc 4 include an alkylene group, a cycloalkylene group, and an arylene group. A perfluoroalkylene group having 2 to 4 carbon atoms is preferred.
  • the organic group of Rc 1 and Rc 3 to Rc 5 is preferably an alkyl group substituted at the 1-position with a fluorine atom or a fluoroalkyl group, or a phenyl group substituted with a fluorine atom or a fluoroalkyl group.
  • a fluorine atom or a fluoroalkyl group By having a fluorine atom or a fluoroalkyl group, the acidity of the acid generated by light irradiation is increased and the sensitivity is improved.
  • Rc 3 and Rc 4 are combined to form a ring, so that the acidity of the acid generated by light irradiation is increased, and the sensitivity is improved, which is preferable.
  • the organic group as R 201 , R 202 and R 203 generally has 1 to 30 carbon atoms, preferably 1 to 20 carbon atoms.
  • Examples of the organic group for R 201 to R 203 include an aryl group, an alkyl group, and a cycloalkyl group.
  • Two of R 201 to R 203 may be bonded to form a ring structure, and the ring may contain an oxygen atom, a sulfur atom, an ester bond, an amide bond, or a carbonyl group.
  • Examples of the group formed by combining two of R 201 to R 203 include an alkylene group (eg, butylene group, pentylene group).
  • the aryl group of R 204 to R 207 is preferably a phenyl group or a naphthyl group, and more preferably a phenyl group.
  • the aryl group of R 204 to R 207 may be an aryl group having a heterocyclic structure having an oxygen atom, a nitrogen atom, a sulfur atom, or the like. Examples of the skeleton of the aryl group having a heterocyclic structure include pyrrole, furan, thiophene, indole, benzofuran, benzothiophene, and the like.
  • the alkyl group and cycloalkyl group in R 204 to R 207 are preferably a linear or branched alkyl group having 1 to 10 carbon atoms (for example, methyl group, ethyl group, propyl group, butyl group, pentyl group), carbon Examples thereof include cycloalkyl groups having a number of 3 to 10 (cyclopentyl group, cyclohexyl group, norbornyl group).
  • the aryl group, alkyl group, and cycloalkyl group of R 204 to R 207 may have a substituent.
  • Examples of the substituent that the aryl group, alkyl group, and cycloalkyl group represented by R 204 to R 207 may have include an alkyl group (eg, having 1 to 15 carbon atoms) and a cycloalkyl group (eg, having 3 to 15 carbon atoms). ), Aryl groups (for example, having 6 to 15 carbon atoms), alkoxy groups (for example, having 1 to 15 carbon atoms), halogen atoms, hydroxyl groups, phenylthio groups, and the like.
  • Triarylsulfonium salts are particularly preferable in terms of thermal stability and sensitivity, and it is preferable to use a sensitizer in combination. Two or more kinds of such compounds can be used in combination as required.
  • the triarylsulfonium salt it is preferable that at least one aryl group has an electron withdrawing group as a substituent, and the total Hammett value of the substituents bonded to the aryl skeleton is preferably larger than 0.18. .
  • the electron withdrawing group means a substituent having a Hammett value (Hammet substituent constant ⁇ ) larger than 0.
  • the sum total of the Hammett value is 0.18 or more substituents bonded to aryl skeletons in a particular photoacid generator, and more is greater than 0.46
  • it is more preferably larger than 0.60.
  • the Hammett value represents the degree of electron withdrawing property of a cation having a triarylsulfonium salt structure, and there is no particular upper limit from the viewpoint of increasing sensitivity, but from the viewpoint of reactivity and stability. Is preferably more than 0.46 and less than 4.0, more preferably more than 0.50 and less than 3.5, and particularly preferably more than 0.60 and less than 3.0.
  • the Hammett value in the present invention uses the numerical values described in Naoki Inamoto, Chemistry Seminar 10 Hammett's Law-Structure and Reactivity (published by Maruzen Co., Ltd. in 1983).
  • Examples of the electron withdrawing group introduced into the aryl skeleton include a trifluoromethyl group, a halogen atom, an ester group, a sulfoxide group, a cyano group, an amide group, a carboxyl group, and a carbonyl group.
  • the Hammett values of these substituents are shown below.
  • a trifluoromethyl group (—CF 3 , m: 0.43, p: 0.54), a halogen atom [eg, —F (m: 0.34, p: 0.06), —Cl (m: 0. 37, p: 0.23), -Br (m: 0.39, p: 0.23), -I (m: 0.35, p: 0.18)], an ester group (for example, -COCH 3 , O: 0.37, p: 0.45), sulfoxide group (for example, —SOCH 3 , m: 0.52, p: 0.45), cyano group (—CN, m: 0.56, p: 0.66), an amide group (for example, —NHCOCH 3 , m: 0.21, p: 0.00), a carboxy group (—COOH, m: 0.37, p: 0.45), a carbonyl group (— CHO, m: 0.36, p: (043)) and the
  • nonionic substituents such as a halogen atom and a halogenated alkyl group are preferable from the viewpoint of hydrophobicity.
  • —Cl is preferable from the viewpoint of reactivity, and imparts hydrophobicity.
  • —F, —CF 3 , —Cl, and —Br are preferable.
  • substituents may be introduced into any one of the three aryl skeletons of the triarylsulfonium salt structure, or may be introduced into two or more aryl skeletons. Moreover, the substituent introduced into each of the three aryl skeletons may be one or plural. In the present invention, the sum of Hammett values of substituents introduced into these aryl skeletons is preferably more than 0.18, more preferably more than 0.46.
  • the number of substituents to be introduced is arbitrary. For example, only one substituent having a particularly large Hammett value (for example, a Hammett value exceeding 0.46 alone) may be introduced into one position of an aryl skeleton having a triarylsulfonium salt structure. Moreover, for example, a plurality of substituents introduced and the sum of the Hammett values exceeding 0.46 may be introduced.
  • the Hammett value of the substituent varies depending on the position where it is introduced, the sum of Hammett values in the specific photoacid generator according to the present invention is determined by the type of substituent, the position of introduction, and the number of introductions. become.
  • the Hammett's rule is usually expressed in the m-position and p-position, but in the present invention, the substituent effect at the o-position is calculated as the same value as the p-position as an index of electron withdrawing property.
  • Preferred substitution positions are preferably m-position and p-position, and most preferably p-position from the viewpoint of synthesis.
  • Preferred in the present invention is a sulfonium salt that is tri- or more substituted with a halogen atom, and most preferred is a sulfonium salt that is tri-substituted with a chloro group, specifically, each of the three aryl skeletons. And preferably have a triarylsulfonium salt structure in which —Cl is introduced, and more preferably —Cl is substituted at the p-position.
  • Examples of the sulfonate anion possessed by the triarylsulfonium salt contained in the composition of the present invention include an aryl sulfonate anion, an alkane sulfonate anion, and the like, which are substituted with a fluorine atom or an organic group having a fluorine atom.
  • An anion is preferred.
  • Examples of the compound having a triarylsulfonium salt structure are J.P. Am. Chem. Soc. 112 (16), 1990; 6004-6015, J.A. Org. Chem. 1988; It can be easily synthesized by the methods described in 5571-5573, WO02 / 081439A1, European Patent (EP) 1113005, and the like.
  • triphenylsulfonium trifluoromethanesulfonate triphenylsulfonium trifluoroacetate, 4-methoxyphenyldiphenylsulfonium trifluoromethanesulfonate, 4-methoxyphenyldiphenylsulfonium trifluoroacetate, 4-phenylthiophenyldiphenylsulfonium trifluoromethanesulfonate or 4-phenylthiophenyl diphenylsulfonium trifluoroacetate and the like.
  • diaryliodonium salts include diphenyliodonium trifluoroacetate, diphenyliodonium trifluoromethanesulfonate, 4-methoxyphenylphenyliodonium trifluoromethanesulfonate, 4-methoxyphenylphenyliodonium trifluoroacetate, phenyl, 4- (2'-hydroxy- 1'-tetradecaoxy) phenyliodonium trifluoromethanesulfonate, 4- (2'-hydroxy-1'-tetradecoxy) phenyliodonium hexafluoroantimonate, phenyl, 4- (2'-hydroxy-1'-tetra Decaoxy) phenyliodonium-p-toluenesulfonate, etc .; diazomethane derivatives such as bis (cyclohexylsulfonyl) diazomethane, bis (t-butyl) Sulfony
  • oxime compounds more preferably oxime sulfonate compounds, are the most preferable examples from the viewpoint of sensitivity, resolution, dielectric constant, dimensional stability, and the like. Can be mentioned.
  • Preferred examples of the oxime sulfonate compound that is, the compound having an oxime sulfonate residue include compounds containing an oxime sulfonate residue represented by the formula (b1).
  • R 5 represents an alkyl group or an aryl group. Any group may be substituted, and the alkyl group in R 5 may be linear, branched or cyclic. Acceptable substituents are described below.
  • the alkyl group for R 5 is preferably a linear or branched alkyl group having 1 to 10 carbon atoms.
  • the alkyl group represented by R 5 is an aryl group having 6 to 11 carbon atoms, an alkoxy group having 1 to 10 carbon atoms, or a cycloalkyl group (7,7-dimethyl-2-oxonorbornyl group or the like). It may be substituted with a cyclic group, preferably a bicycloalkyl group or the like.
  • the aryl group for R 5 is preferably an aryl group having 6 to 11 carbon atoms, more preferably a phenyl group or a naphthyl group.
  • the aryl group for R 5 may be substituted with a lower alkyl group, an alkoxy group or a halogen atom.
  • the compound containing the oxime sulfonate residue represented by the formula (b1) is an oxime sulfonate compound represented by the formula (OS-3), the formula (OS-4) or the formula (OS-5). Is particularly preferred.
  • R 1 represents an alkyl group, an aryl group or a heteroaryl group
  • each R 2 independently represents a hydrogen atom, an alkyl group, an aryl group or a halogen atom
  • R 6 represents each independently a halogen atom, an alkyl group, an alkyloxy group, a sulfonic acid group, an aminosulfonyl group or an alkoxysulfonyl group
  • X represents O or S
  • n represents 1 or 2
  • m represents an integer of 0 to 6.
  • the alkyl group, aryl group or heteroaryl group in R 1 may have a substituent.
  • the alkyl group in R 1 is preferably a alkyl group having 1 atoms in total may be carbon 30 have a substituent.
  • the substituent that the alkyl group in R 1 may have include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group.
  • alkyl group in R 1 examples include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -Octyl group, n-decyl group, n-dodecyl group, trifluoromethyl group, perfluoropropyl group, perfluorohexyl group, benzyl group.
  • the aryl group for R 1 is preferably an aryl group having 6 to 30 carbon atoms which may have a substituent.
  • substituents that the aryl group in R 1 may have include a halogen atom, an alkyl group, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group.
  • the aryl group in R 1, a phenyl group, p- methylphenyl group, p- chlorophenyl group, pentachlorophenyl group, pentafluorophenyl group, o- methoxyphenyl groups include p- phenoxyphenyl group.
  • the heteroaryl group for R 1 is preferably a heteroaryl group having 4 to 30 carbon atoms which may have a substituent.
  • substituents that the heteroaryl group in R 1 may have include a halogen atom, an alkyl group, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl.
  • At least one of the heteroaryl groups in R 1 may be a heteroaromatic ring.
  • a heteroaromatic ring and a benzene ring are condensed. May be.
  • the heteroaryl group for R 1 is selected from the group consisting of optionally substituted thiophene ring, pyrrole ring, thiazole ring, imidazole ring, furan ring, benzothiophene ring, benzothiazole ring and benzimidazole ring. And a group obtained by removing one hydrogen atom from the ring.
  • R 2 is preferably a hydrogen atom, an alkyl group or an aryl group, and more preferably a hydrogen atom or an alkyl group.
  • one or two of R 2 present in the compound is an alkyl group, an aryl group or a halogen atom, and one is an alkyl group. More preferably an aryl group or a halogen atom, and particularly preferably one is an alkyl group and the rest is a hydrogen atom.
  • the alkyl group or aryl group in R 2 may have a substituent. Examples of the substituent that the alkyl group or aryl group in R 2 may have include the same groups as the substituent that the alkyl group or aryl group in R 1 may have.
  • the alkyl group for R 2 is preferably an alkyl group having 1 to 12 carbon atoms which may have a substituent, and is an alkyl group having 1 to 6 carbon atoms which may have a substituent. It is more preferable.
  • Examples of the alkyl group in R 2 include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, i-butyl group, s-butyl group, n-hexyl group, allyl group, and chloromethyl group.
  • a bromomethyl group, a methoxymethyl group, and a benzyl group are preferable, and a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an i-butyl group, an s-butyl group, and an n-hexyl group are preferable.
  • a methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-hexyl group are more preferable, and a methyl group is preferable.
  • the aryl group for R 2 is preferably an aryl group having 6 to 30 carbon atoms which may have a substituent.
  • the aryl group in R 2 is preferably a phenyl group, a p-methylphenyl group, an o-chlorophenyl group, a p-chlorophenyl group, an o-methoxyphenyl group, or a p-phenoxyphenyl group.
  • the halogen atom for R 2 include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom. Among these, a chlorine atom and a bromine atom are preferable.
  • X represents O or S, and is preferably O.
  • the ring containing X as a ring member is a 5-membered ring or a 6-membered ring.
  • n represents 1 or 2, and when X is O, n is preferably 1, and when X is S, n is 2 is preferable.
  • the alkyl group and alkyloxy group in R 6 may have a substituent.
  • the alkyl group for R 6 is preferably an alkyl group having 1 to 30 carbon atoms which may have a substituent.
  • the substituent that the alkyl group in R 6 may have include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group. .
  • alkyl group for R 6 examples include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -Octyl, n-decyl, n-dodecyl, trifluoromethyl, perfluoropropyl, perfluorohexyl and benzyl are preferred.
  • the alkyl group in R 6, is preferably an alkyl group having a total carbon number of 1 to 30 which may have a substituent.
  • substituents that the alkyl group optionally has at R 6, include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, an amino group It is done.
  • alkyloxy group in R 6 a methyloxy group, an ethyloxy group, a butyloxy group, a hexyloxy group, a phenoxyethyloxy group, a trichloromethyloxy group, or an ethoxyethyloxy group is preferable.
  • examples of the aminosulfonyl group for R 6 include a methylaminosulfonyl group, a dimethylaminosulfonyl group, a phenylaminosulfonyl group, a methylphenylaminosulfonyl group, and an aminosulfonyl group. It is done.
  • examples of the alkoxysulfonyl group for R 6 include a methoxysulfonyl group, an ethoxysulfonyl group, a propyloxysulfonyl group, and a butyloxysulfonyl group.
  • m represents an integer of 0 to 6, preferably an integer of 0 to 2, more preferably 0 or 1, and 0. It is particularly preferred.
  • the compound containing an oxime sulfonate residue represented by the formula (b1) is particularly preferably an oxime sulfonate compound represented by any one of the following formulas (OS-6) to (OS-11). .
  • R 1 represents an alkyl group, an aryl group, or a heteroaryl group
  • R 7 represents a hydrogen atom or a bromine atom
  • R 8 represents a hydrogen atom
  • R 9 represents a hydrogen atom, a halogen atom, a methyl group or a methoxy group
  • 10 represents a hydrogen atom or a methyl group.
  • R 1 in the formulas (OS-6) to (OS-11) has the same meaning as R 1 in the formulas (OS-3) to (OS-5), and preferred embodiments thereof are also the same.
  • R 7 in formula (OS-6) represents a hydrogen atom or a bromine atom, and is preferably a hydrogen atom.
  • R 8 in the formulas (OS-6) to (OS-11) is a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, a halogen atom, a chloromethyl group, a bromomethyl group, a bromoethyl group, a methoxymethyl group, a phenyl group or a chlorophenyl
  • R 9 in formula (OS-8) and formula (OS-9) represents a hydrogen atom, a halogen atom, a methyl group or a methoxy group, and is preferably a hydrogen atom.
  • R 10 in the formulas (OS-8) to (OS-11) represents a hydrogen atom or a methyl group, and is preferably a hydrogen atom.
  • the oxime steric structure (E, Z) may be either one or a mixture.
  • oxime sulfonate compounds represented by the above formulas (OS-3) to (OS-5) include the following exemplified compounds, but the present invention is not limited thereto.
  • the compound containing an oxime sulfonate residue represented by the formula (b1) is also preferably a compound represented by the formula (OS-1).
  • R 1 represents a hydrogen atom, an alkyl group, an alkenyl group, an alkoxy group, an alkoxycarbonyl group, an acyl group, a carbamoyl group, a sulfamoyl group, a sulfo group, a cyano group, an aryl group, or a heteroaryl. Represents a group.
  • R 2 represents an alkyl group or an aryl group.
  • R 21 to R 24 are each independently a hydrogen atom, halogen atom, alkyl group, alkenyl group, alkoxy group, amino group, alkoxycarbonyl group, alkylcarbonyl group, arylcarbonyl group, amide group, sulfo group, cyano group or Represents an aryl group. Two of R 21 to R 24 may be bonded to each other to form a ring.
  • R 21 to R 24 a hydrogen atom, a halogen atom and an alkyl group are preferable, and an embodiment in which at least two of R 21 to R 24 are bonded to each other to form an aryl group is also preferable. Among these, an embodiment in which R 21 to R 24 are all hydrogen atoms is preferable from the viewpoint of sensitivity. Any of the aforementioned functional groups may further have a substituent.
  • the compound represented by the formula (OS-1) is more preferably a compound represented by the following formula (OS-2).
  • R 1 , R 2 and R 21 to R 24 have the same meanings as in the formula (OS-1), and preferred examples thereof are also the same.
  • an embodiment in which R 1 in the formula (OS-1) and the formula (OS-2) is a cyano group or an aryl group is more preferable, represented by the formula (OS-2), in which R 1 is a cyano group, phenyl
  • the embodiment which is a group or a naphthyl group is most preferred.
  • the steric structure (E, Z, etc.) of the oxime or benzothiazole ring may be either one or a mixture.
  • b-9, b-16, b-31, and b-33 are preferable from the viewpoint of achieving both sensitivity and stability.
  • the above compound containing an oxime sulfonate residue represented by the formula (b1) may be an oxime sulfonate compound represented by the following formula (b2).
  • R 5 represents an alkyl group or an aryl group
  • X represents an alkyl group, an alkoxy group, or a halogen atom
  • m represents an integer of 0 to 3
  • m is 2 or 3. In some cases, multiple Xs may be the same or different.
  • the alkyl group as X is preferably a linear or branched alkyl group having 1 to 4 carbon atoms.
  • the alkoxy group as X is preferably a linear or branched alkoxy group having 1 to 4 carbon atoms.
  • the halogen atom as X is preferably a chlorine atom or a fluorine atom.
  • m is preferably 0 or 1. In the formula (b2), m is 1, X is a methyl group, the substitution position of X is the ortho position, R 5 is a linear alkyl group having 1 to 10 carbon atoms, 7,7-dimethyl- A compound that is a 2-oxonorbornylmethyl group or a p-toluyl group is particularly preferred.
  • the compound containing an oxime sulfonate residue represented by the formula (b1) may be an oxime sulfonate compound represented by the formula (b3).
  • R 5 has the same meaning as R 5 in the formula (b1), X 'is a halogen atom, a hydroxyl group, an alkyl group having 1 to 4 carbon atoms, alkoxy group having 1 to 4 carbon atoms, cyano Represents a group or a nitro group, and L represents an integer of 0 to 5.
  • R 5 in the formula (b3) is methyl, ethyl, n-propyl, n-butyl, n-octyl, trifluoromethyl, pentafluoroethyl, perfluoro-n-propyl, perfluoro
  • a fluoro-n-butyl group, p-tolyl group, 4-chlorophenyl group or pentafluorophenyl group is preferred, and an n-octyl group is particularly preferred.
  • X ′ is preferably an alkoxy group having 1 to 5 carbon atoms, and more preferably a methoxy group.
  • L is preferably from 0 to 2, particularly preferably from 0 to 1.
  • Specific examples of the compound represented by the formula (b3) include ⁇ - (methylsulfonyloxyimino) benzyl cyanide, ⁇ - (ethylsulfonyloxyimino) benzyl cyanide, ⁇ - (n-propylsulfonyloxyimino) benzyl.
  • preferable oxime sulfonate compounds include the following compounds (i) to (viii), and the like can be used singly or in combination of two or more.
  • Compounds (i) to (viii) can be obtained as commercial products. It can also be used in combination with other types of (C) radiation-sensitive acid generators.
  • the content of the photoacid generator is preferably 1 to 30% by mass, more preferably 3 to 20% by mass based on the total solid content of the photosensitive resin composition.
  • the acid generator can be used alone or in combination of two or more. When two or more types are used in combination, it is preferable to combine two types of compounds that generate two types of organic acids that differ in the total number of atoms excluding hydrogen atoms by two or more.
  • sensitizer may be added to the composition of the present invention in order to absorb actinic rays or radiation and promote the decomposition of the sulfonium salt.
  • the sensitizer absorbs actinic rays or radiation and enters an electronically excited state.
  • the sensitizer in an electronically excited state comes into contact with sulfonium, and effects such as electron transfer, energy transfer, and heat generation occur.
  • the polymerization initiator undergoes a chemical change and decomposes to generate radicals, acids or bases.
  • preferred sensitizers include compounds belonging to the following compounds and having an absorption wavelength in the 350 nm to 450 nm region.
  • Polynuclear aromatics eg, pyrene, perylene, triphenylene, anthracene
  • xanthenes eg, fluorescein, eosin, erythrosine, rhodamine B, rose bengal
  • cyanines eg, thiacarbocyanine, oxacarbocyanine
  • merocyanine Eg, merocyanine, carbomerocyanine
  • thiazines eg, thionine, methylene blue, toluidine blue
  • acridines eg, acridine orange, chloroflavin, acriflavine
  • anthraquinones eg, anthraquinone
  • squalium eg, , Squalium
  • coumarins eg, 7-diethylamino-4-methylcoumarin.
  • sensitizer include compounds represented by the following formulas (IX) to (XIV).
  • a 1 represents a sulfur atom or NR 50
  • R 50 represents an alkyl group or an aryl group
  • L 2 forms a basic nucleus of the dye together with adjacent A 1 and an adjacent carbon atom.
  • R 51 and R 52 each independently represent a hydrogen atom or a monovalent nonmetallic atomic group, and R 51 and R 52 may be bonded to each other to form an acidic nucleus of the dye.
  • W represents an oxygen atom or a sulfur atom.
  • Ar 1 and Ar 2 each independently represent an aryl group and are linked via a bond with —L 3 —.
  • L 3 represents —O— or —S—.
  • W is synonymous with that shown in Formula (IX).
  • a 2 represents a sulfur atom or NR 59
  • L 4 represents a nonmetallic atomic group that forms a basic nucleus of the dye in combination with adjacent A 2 and a carbon atom
  • R 53 , R 54 , R 55 , R 56 , R 57 and R 58 each independently represent a monovalent nonmetallic atomic group
  • R 59 represents an alkyl group or an aryl group.
  • a 3 and A 4 each independently represent —S—, —NR 62 — or —NR 63 —, and R 62 and R 63 each independently represent a substituted or unsubstituted alkyl group, substituted or Represents an unsubstituted aryl group, and L 5 and L 6 each independently represent a nonmetallic atomic group that forms a basic nucleus of a dye in cooperation with adjacent A 3 , A 4, and adjacent carbon atoms, and R 60 , R 61 each independently represents a hydrogen atom or a monovalent nonmetallic atomic group, or may be bonded to each other to form an aliphatic or aromatic ring.
  • R 66 represents an aromatic ring or a hetero ring which may have a substituent
  • a 5 represents an oxygen atom, a sulfur atom or ⁇ NR 67
  • R 64 , R 65 and R 67 each independently represent a hydrogen atom or a monovalent non-metallic atomic group
  • R 67 and R 64 , and R 65 and R 67 each represent an aliphatic or aromatic ring. Can be combined to form.
  • R 68 and R 69 each independently represent a hydrogen atom or a monovalent nonmetallic atomic group.
  • R 70 and R 71 each independently represent a monovalent nonmetallic atomic group, and n represents an integer of 0 to 4. When n is 2 or more, R 70 and R 71 can be bonded to each other to form an aliphatic or aromatic ring.
  • an anthracene derivative is particularly preferable.
  • the sensitizer as described above may be a commercially available one or may be synthesized by a known synthesis method.
  • the content of the sensitizer is preferably 1 to 30% by mass, more preferably 3 to 20% by mass based on the total solid content of the photosensitive resin composition.
  • composition according to the present invention preferably contains a basic compound in order to reduce a change in performance over time from exposure to heating.
  • Preferred examples of the basic compound include compounds having a structure represented by the following formulas (A) to (E).
  • R 200 , R 201 and R 202 may be the same or different and are a hydrogen atom, an alkyl group (preferably having a carbon number of 1 to 20), a cycloalkyl group (preferably having a carbon number of 3 to 20) or an aryl group (having a carbon number). 6-20), wherein R 201 and R 202 may combine with each other to form a ring.
  • R 203 , R 204 , R 205 and R 206 may be the same or different and each represents an alkyl group having 1 to 20 carbon atoms.
  • the alkyl group having a substituent is preferably an aminoalkyl group having 1 to 20 carbon atoms, a hydroxyalkyl group having 1 to 20 carbon atoms, or a cyanoalkyl group having 1 to 20 carbon atoms.
  • the alkyl groups in the general formulas (A) and (E) are more preferably unsubstituted.
  • Preferred compounds include guanidine, aminopyrrolidine, pyrazole, pyrazoline, piperazine, aminomorpholine, aminoalkylmorpholine, piperidine and the like, and more preferred compounds include imidazole structure, diazabicyclo structure, onium hydroxide structure, onium carboxylate Examples thereof include a compound having a structure, a trialkylamine structure, an aniline structure or a pyridine structure, an alkylamine derivative having a hydroxyl group and / or an ether bond, and an aniline derivative having a hydroxyl group and / or an ether bond.
  • Examples of the compound having an imidazole structure include imidazole, 2,4,5-triphenylimidazole, benzimidazole, 2-phenylbenzimidazole and the like.
  • Examples of the compound having a diazabicyclo structure 1,4-diazabicyclo [2,2,2] octane, 1,5-diazabicyclo [4,3,0] non-5-ene, 1,8-diazabicyclo [5,4,0 ] Undecar 7-ene and the like.
  • Examples of the compound having an onium hydroxide structure include tetrabutylammonium hydroxide, triarylsulfonium hydroxide, phenacylsulfonium hydroxide, sulfonium hydroxide having a 2-oxoalkyl group, specifically, triphenylsulfonium hydroxide, tris ( t-butylphenyl) sulfonium hydroxide, bis (t-butylphenyl) iodonium hydroxide, phenacylthiophenium hydroxide, 2-oxopropylthiophenium hydroxide, and the like.
  • the compound having an onium carboxylate structure is a compound having an onium hydroxide structure in which the anion moiety is converted to a carboxylate, and examples thereof include acetate, adamantane-1-carboxylate, and perfluoroalkylcarboxylate.
  • Examples of the compound having a trialkylamine structure include tri (n-butyl) amine and tri (n-octyl) amine.
  • aniline compounds include 2,6-diisopropylaniline, N, N-dimethylaniline, N, N-dibutylaniline, N, N-dihexylaniline and the like.
  • alkylamine derivative having a hydroxyl group and / or an ether bond examples include ethanolamine, diethanolamine, triethanolamine, N-phenyldiethanolamine, and tris (methoxyethoxyethyl) amine.
  • aniline derivatives having a hydroxyl group and / or an ether bond examples include N, N-bis (hydroxyethyl) aniline.
  • Preferred examples of the basic compound further include an amine compound having a phenoxy group, an ammonium salt compound having a phenoxy group, an amine compound having a sulfonic acid ester group, and an ammonium salt compound having a sulfonic acid ester group.
  • amine compound a primary, secondary or tertiary amine compound can be used, and an amine compound in which at least one alkyl group is bonded to a nitrogen atom is preferable.
  • the amine compound is more preferably a tertiary amine compound.
  • the amine compound has an cycloalkyl group (preferably having 3 to 20 carbon atoms) or an aryl group (preferably having 3 to 20 carbon atoms).
  • 6 to 12 carbon atoms may be bonded to the nitrogen atom.
  • the amine compound preferably has an oxygen atom in the alkyl chain and an oxyalkylene group is formed.
  • the number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6.
  • an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
  • ammonium salt compound a primary, secondary, tertiary, or quaternary ammonium salt compound can be used, and an ammonium salt compound in which at least one alkyl group is bonded to a nitrogen atom is preferable.
  • the ammonium salt compound may be a cycloalkyl group (preferably having 3 to 20 carbon atoms) or an aryl group, provided that at least one alkyl group (preferably having 1 to 20 carbon atoms) is bonded to the nitrogen atom. (Preferably having 6 to 12 carbon atoms) may be bonded to a nitrogen atom.
  • the ammonium salt compound preferably has an oxygen atom in the alkyl chain and an oxyalkylene group is formed.
  • the number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6.
  • an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
  • Examples of the anion of the ammonium salt compound include halogen atoms, sulfonates, borates, and phosphates. Among them, halogen atoms and sulfonates are preferable.
  • the halogen atom is particularly preferably chloride, bromide or iodide
  • the sulfonate is particularly preferably an organic sulfonate having 1 to 20 carbon atoms.
  • Examples of the organic sulfonate include alkyl sulfonates having 1 to 20 carbon atoms and aryl sulfonates.
  • the alkyl group of the alkyl sulfonate may have a substituent, and examples of the substituent include fluorine, chlorine, bromine, alkoxy groups, acyl groups, and aryl groups.
  • substituent include fluorine, chlorine, bromine, alkoxy groups, acyl groups, and aryl groups.
  • Specific examples of the alkyl sulfonate include methane sulfonate, ethane sulfonate, butane sulfonate, hexane sulfonate, octane sulfonate, benzyl sulfonate, trifluoromethane sulfonate, pentafluoroethane sulfonate, and nonafluorobutane sulfonate.
  • Examples of the aryl group of the aryl sulfonate include a benzene ring, a naphthalene ring and an anthracene ring.
  • the benzene ring, naphthalene ring and anthracene ring may have a substituent, and the substituent is preferably a linear or branched alkyl group having 1 to 6 carbon atoms or a cycloalkyl group having 3 to 6 carbon atoms.
  • linear or branched alkyl group and cycloalkyl group include methyl, ethyl, n-propyl, isopropyl, n-butyl, i-butyl, t-butyl, n-hexyl, cyclohexyl and the like.
  • substituents include an alkoxy group having 1 to 6 carbon atoms, a halogen atom, cyano, nitro, an acyl group, and an acyloxy group.
  • An amine compound having a phenoxy group and an ammonium salt compound having a phenoxy group are those having a phenoxy group at the terminal opposite to the nitrogen atom of the alkyl group of the amine compound or ammonium salt compound.
  • the phenoxy group may have a substituent.
  • the substituent of the phenoxy group include an alkyl group, an alkoxy group, a halogen atom, a cyano group, a nitro group, a carboxyl group, a carboxylic acid ester group, a sulfonic acid ester group, an aryl group, an aralkyl group, an acyloxy group, and an aryloxy group.
  • the substitution position of the substituent may be any of the 2-6 positions.
  • the number of substituents may be any in the range of 1 to 5.
  • oxyalkylene group between the phenoxy group and the nitrogen atom.
  • the number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6.
  • an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
  • the sulfonic acid ester group may be any of alkyl sulfonic acid ester, cycloalkyl group sulfonic acid ester, and aryl sulfonic acid ester.
  • the alkyl group has 1 to 20 carbon atoms
  • the cycloalkyl group has 3 to 20 carbon atoms
  • the aryl group has 6 carbon atoms.
  • Alkyl sulfonic acid ester, cycloalkyl sulfonic acid ester, and aryl sulfonic acid ester may have a substituent.
  • substituents include a halogen atom, a cyano group, a nitro group, a carboxyl group, a carboxylic acid ester group, and a sulfonic acid.
  • An ester group is preferred.
  • oxyalkylene group between the sulfonate group and the nitrogen atom.
  • the number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6.
  • an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
  • the following compounds are also preferable as the basic compound.
  • the composition according to the present invention may or may not contain a basic compound. However, when it is contained, the content of the basic compound is usually 0.001 to on the basis of the total solid content of the composition. It is 10% by mass, preferably 0.01-5% by mass.
  • the acid generator / basic compound (molar ratio) is more preferably from 5.0 to 200, still more preferably from 7.0 to 150.
  • the present invention may contain a thermal acid generator.
  • the thermal acid generator is a compound that generates an acid by heat, and is usually a compound having a thermal decomposition point in the range of 130 ° C. to 250 ° C., preferably 150 ° C. to 220 ° C., for example, sulfonic acid, It is a compound that generates a low nucleophilic acid such as carboxylic acid or disulfonylimide.
  • sulfonic acid, alkyl substituted with an electron withdrawing group or arylcarboxylic acid having a strong pKa of 2 or less, disulfonylimide substituted with an electron withdrawing group, and the like are preferable.
  • the electron withdrawing group examples include a halogen atom such as an F atom, a haloalkyl group such as a trifluoromethyl group, a nitro group, and a cyano group.
  • the thermal acid generator is required not to be decomposed during storage time or in a pre-baking process after applying the composition, but to be quickly decomposed in a heat-curing process after patterning. Therefore, the thermal decomposition point is preferably 100 ° C to 300 ° C. More preferably, it is 120 ° C to 250 ° C, and further preferably 150 ° C to 200 ° C.
  • a photoacid generator that generates an acid by the above-described exposure can be applied.
  • Examples thereof include onium salts such as sulfonium salts and iodonium salts, N-hydroxyimide sulfonate compounds, oxime sulfonates, o-nitrobenzyl sulfonates and the like.
  • Preferred examples of the sulfonium salt include compounds represented by the following general formulas (TA-1) to (TA-3).
  • R T1 to R T5 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an alkoxy group or a halogen atom.
  • R T6 and R T7 each independently represent a hydrogen atom, an alkyl group or a cycloalkyl group.
  • R T8 and R T9 each independently represents an alkyl group, a cycloalkyl group, an allyl group or a vinyl group.
  • R T1 to R T5 , R T6 and R T7, and R T8 and R T9 may be bonded to each other to form a ring structure, and this ring structure includes an oxygen atom, a sulfur atom, a ketone A bond, an ester bond, or an amide bond may be included.
  • Examples of the group formed by combining any two or more of R T1 to R T5 , R T6 and R T7, and R T8 and R T9 include a butylene group and a pentylene group.
  • X ⁇ represents a non-nucleophilic anion, and has a strong pKa of 2 or less as described above, a sulfonic acid or an alkyl or aryl carboxylic acid substituted with an electron withdrawing group, or a disulfonylimide substituted with an electron withdrawing group.
  • Etc. are preferable.
  • the electron withdrawing group include a halogen atom such as an F atom, a haloalkyl group such as a trifluoromethyl group, a nitro group, and a cyano group.
  • R T10 and R T11 each independently represent an alkyl group, a cycloalkyl group, an allyl group, or a vinyl group.
  • R T10 and R T11 may be bonded to each other to form a ring structure, and this ring structure may contain an oxygen atom, a sulfur atom, a ketone bond, an ester bond, or an amide bond.
  • Examples of the group formed by combining R T10 and R T11 include a butylene group and a pentylene group.
  • R T12 to R T16 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an alkoxy group, a thioalkoxy group, or a hydroxyl group, and two or more of them are bonded to each other to form a naphthalene ring, an anthracene ring, etc.
  • a polycyclic aromatic ring may be formed.
  • X ⁇ represents a non-nucleophilic anion.
  • R T17 represents an alkyl group (straight chain or branched) or a cycloalkyl group, preferably a straight chain and branched alkyl group having 1 to 20 carbon atoms, more preferably 1 to 12 carbon atoms (for example, a methyl group, Ethyl group, linear or branched propyl group, linear or branched butyl group, linear or branched pentyl group).
  • cycloalkyl group examples include not only a monocyclic cyclic alkyl group such as a cyclopentyl group and a cyclohexyl group, but also a cyclic alkyl group having a bridging site such as a norbornyl group, a tricyclodecanyl group, and an adamantyl group. it can.
  • R T18 and R T19 each independently represent a hydrogen atom, an alkyl group or a cycloalkyl group.
  • R T20 and R T21 each independently represents an alkyl group, a cycloalkyl group, an allyl group or a vinyl group.
  • R T18 and R T19 and R T20 and R T21 may be bonded to each other to form a ring structure, and this ring structure may contain an oxygen atom, a sulfur atom, a ketone bond, an ester bond, or an amide bond. Good.
  • Examples of the group formed by combining R T18 and R T19 and R T20 and R T21 include a butylene group and a pentylene group.
  • X ⁇ represents a non-nucleophilic anion.
  • the alkyl group as R T1 to R T17 may be linear or branched.
  • a linear or branched alkyl group having 1 to 20 carbon atoms, preferably 1 to 12 carbon atoms for example, Methyl group, ethyl group, linear or branched propyl group, linear or branched butyl group, linear or branched pentyl group).
  • the cycloalkyl group as R T1 to R T17 is meant to include a monocyclic alkyl group as well as a polycyclic and cyclic alkyl group having a bridging site, and the cycloalkyl group as R T12 to R T16 is preferably Is a cycloalkyl group having 3 to 8 carbon atoms (eg, cyclopentyl group, cyclohexyl group).
  • the cycloalkyl group as R T17 has a cycloalkyl group having 3 to 8 carbon atoms (eg, cyclopentyl group, cyclohexyl group) and a cyclic group having a bridging site such as a norbornyl group, a tricyclodecanyl group, or an adamantyl group. Also preferred are alkyl groups.
  • the alkoxy group as R T1 to R T5 and R T12 to R T16 may be linear, branched or cyclic, for example, an alkoxy group having 1 to 10 carbon atoms, preferably 1 to 1 carbon atoms. 5 linear and branched alkoxy groups (for example, methoxy group, ethoxy group, linear or branched propoxy group, linear or branched butoxy group, linear or branched pentoxy group), cyclic alkoxy groups having 3 to 8 carbon atoms (for example, , Cyclopentyloxy group, cyclohexyloxy group).
  • the thioalkoxy group as R T12 to R T16 may be linear, branched or cyclic, for example, a thioalkoxy group having 1 to 10 carbon atoms, preferably a linear or branched group having 1 to 5 carbon atoms.
  • a thioalkoxy group for example, a thiomethoxy group, a thioethoxy group, a linear or branched thiopropoxy group, a linear or branched thiobutoxy group, a linear or branched thiopentoxy group
  • a cyclic thioalkoxy group having 3 to 8 carbon atoms for example, thiocyclopentyl) Oxy group, thiocyclohexyloxy group).
  • the non-nucleophilic anion as X ⁇ is preferably an organic anion, and particularly preferably an organic anion represented by the following general formula.
  • Rc 1 represents an organic group.
  • the organic group for Rc 1 include those having 1 to 30 carbon atoms, and preferably an alkyl group, a cycloalkyl group, an aryl group, or a plurality of these optionally having a substituent is a single bond, —O. -, - CO 2 -, - S -, - SO 3 -, - SO 2 N (Rd 1) - can be exemplified linked group a linking group such as.
  • Rd 1 represents a hydrogen atom or an alkyl group.
  • Rc 2 represents 1-position an alkyl group substituted with a fluorine atom or a fluoroalkyl group.
  • Rc 3 and Rc 4 each independently represents an alkyl group substituted at the 1-position with a fluorine atom or a fluoroalkyl group. Preferably, it is a perfluoroalkyl group having 1 to 4 carbon atoms. Rc 3 and Rc 4 may be bonded to each other to form a ring. Examples of the group formed by combining Rc 3 and Rc 4 include an alkylene group, a cycloalkylene group, and an arylene group. A perfluoroalkylene group having 2 to 4 carbon atoms is preferred.
  • Preferred examples of the iodonium salt include compounds represented by the following general formula (TA-4).
  • R 41 and R 42 each have a hydrogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, or a substituent.
  • An alkoxy group which may have a substituent, an alkoxycarbonyl group which may have a substituent, an acyl group which may have a substituent, an acyloxy group which may have a substituent, a nitro group, a halogen atom, a hydroxyl group Represents a carboxyl group.
  • a represents 1 to 5
  • b represents 1 to 5.
  • R 41 and R 42 has an alkyl group having 5 or more carbon atoms, which may have a substituent, a cycloalkyl group which may have a substituent, or a substituent.
  • X represents R—SO 3
  • R represents an aliphatic hydrocarbon group which may have a substituent and an aromatic hydrocarbon group which may have a substituent.
  • alkyl group for R 41 and R 42 an optionally substituted methyl group, ethyl group, propyl group, n-butyl group, isobutyl group, sec-butyl group, t-butyl group, pentyl group, Examples thereof include those having 1 to 25 carbon atoms such as hexyl group, heptyl group, octyl group, t-amyl group, decanyl group, dodecanyl group and hexadecanyl group.
  • the cycloalkyl group has 3 to 25 carbon atoms which may have a substituent, such as cyclopropyl group, cyclopentyl group, cyclohexyl group, cyclooctyl group, cyclododecanyl group, cyclohexadecanyl group and the like. Things.
  • the alkoxy group may have a substituent, such as a methoxy group, an ethoxy group, a propoxy group, an isopropoxy group, an n-butoxy group, an isobutoxy group, a sec-butoxy group or a t-butoxy group, a pentyloxy group, t Examples thereof include those having 1 to 25 carbon atoms such as -amyloxy group, n-hexyloxy group, n-octyloxy group, n-dodecanoxy group and the like.
  • alkoxycarbonyl group a methoxycarbonyl group, ethoxycarbonyl group, propoxycarbonyl group, isopropoxycarbonyl group, n-butoxycarbonyl group, isobutoxycarbonyl group, sec-butoxycarbonyl group or t which may have a substituent may be used.
  • Those having 2 to 25 carbon atoms such as -butoxycarbonyl group, pentyloxycarbonyl group, t-amyloxycarbonyl group, n-hexyloxycarbonyl group, n-octyloxycarbonyl group, n-dodecanoxycarbonyl group, etc. Can be mentioned.
  • the acyl group may have a substituent and has 1 carbon atom such as formyl group, acetyl group, butyryl group, valeryl group, hexanoyl group, octanoyl group, t-butylcarbonyl group, t-amylcarbonyl group and the like. Up to 25 can be mentioned.
  • acyloxy group an acetoxy group, propionyloxy group, butyryloxy group, t-butyryloxy group, t-amylyloxy group, n-hexanecarbonyloxy group, n-octanecarbonyloxy group, which may have a substituent
  • substituent examples thereof include those having 2 to 25 carbon atoms such as n-dodecane carbonyloxy group, n-hexadecane carbonyloxy group, and the like.
  • halogen atom there can be mentioned a fluorine atom, a chlorine atom, a bromine atom or an iodine atom.
  • an alkoxy group having 1 to 4 carbon atoms a halogen atom (a fluorine atom, a chlorine atom, a bromine atom, an iodine atom), an acyl group, an acyloxy group, a cyano group, a hydroxyl group, a carboxy group, An alkoxycarbonyl group, a nitro group, etc. can be mentioned.
  • R 1 and R 2 has 5 or more carbon atoms and may have a substituent, a cycloalkyl group that may have a substituent, An alkoxy group which may have a substituent, an alkoxycarbonyl group which may have a substituent, an acyl group which may have a substituent, an acyloxy group which may have a substituent .
  • substituent having 5 or more carbon atoms include those having 5 to 25 carbon atoms in the above specific examples.
  • examples of the alkyl group include a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, a t-butyl group, and n-pentyl.
  • Group, t-amyl group, n-hexyl group, n-octyl group and decanyl group are preferable, and the cycloalkyl group is preferably a cyclohexyl group, cyclooctyl group or cyclododecanyl group which may have a substituent.
  • alkoxy group which may have a substituent
  • a methoxy group, an ethoxy group, an isopropoxy group, an n-butoxy group, a sec-butoxy group, a t-butoxy group, a pentyloxy group, a t-amyloxy group, n -Hexyloxy group, n-octyloxy group and n-dodecanoxy group are preferable
  • the alkoxycarbonyl group may be a methoxy group which may have a substituent.
  • Carbonyl group, ethoxycarbonyl group, isopropoxycarbonyl group, n-butoxycarbonyl group, sec-butoxycarbonyl group, t-butoxycarbonyl group, pentyloxycarbonyl group, t-amyloxycarbonyl group, n-hexyloxycarbonyl group, n -Octyloxycarbonyl group and n-dodecanoxycarbonyl group are preferred, and the acyl group may have a substituent, formyl group, acetyl group, butyryl group, valeryl group, hexanoyl group, octanoyl group, t-butyl A carbonyl group and a t-amylcarbonyl group are preferable, and the acyloxy group may have an acetoxy group, a propionyloxy group, a butyryloxy group, a t-butyryloxy group, a t-amylyloxy group
  • the alkyl group having 5 or more carbon atoms and optionally having a substituent is preferably an n-pentyl group, a t-amyl group, an n-hexyl group, an n-octyl group or a decanyl group.
  • the cycloalkyl group having 5 or more carbon atoms and optionally having a substituent is preferably a cyclohexyl group, a cyclooctyl group or a cyclododecanyl group.
  • the alkoxy group having 5 or more carbon atoms and optionally having a substituent is preferably a pentyloxy group, a t-amyloxy group, a hexyloxy group, an n-octyloxy group, or a dodecanoxy group.
  • Examples of the alkoxycarbonyl group having 5 or more carbon atoms which may have a substituent include a pentyloxycarbonyl group, a t-amyloxycarbonyl group, a hexyloxycarbonyl group, an n-octyloxycarbonyl group, and dodecaneoxycarbonyl. Groups are preferred.
  • the acyl group having 5 or more carbon atoms and optionally having a substituent is preferably a valeryl group, a hexanoyl group, an octanoyl group or a t-amylcarbonyl group.
  • Substituents for these groups include methoxy group, ethoxy group, t-butoxy group, chlorine atom, bromine atom, cyano group, hydroxyl group, methoxycarbonyl group, ethoxycarbonyl group, t-butoxycarbonyl group, t-amyloxycarbonyl group Groups are preferred.
  • the iodonium compound represented by formula (TA-4) used in the present invention uses sulfonic acid having a specific structure as described above as its counter anion, X ⁇ .
  • X ⁇ its counter anion
  • examples of the aliphatic hydrocarbon group which may have an R substituent in the counter anion include a linear or branched alkyl group having 1 to 20 carbon atoms, or a cyclic alkyl group.
  • R can mention the aromatic group which may have a substituent.
  • alkyl group for R examples include a methyl group, an ethyl group, a propyl group, an n-butyl group, an n-pentyl group, an n-hexyl group, an n-octyl group, and 2-ethylhexyl, which may have a substituent. And those having 1 to 20 carbon atoms such as a group, a decyl group and a dodecyl group.
  • Examples of the cyclic alkyl group include an optionally substituted cyclopentyl group, cyclohexyl group, cyclooctyl group, cyclododecyl group, adamantyl group, norbornyl group, camphor group, tricyclodecanyl group, menthyl group and the like. Can do.
  • Examples of the aromatic group include a phenyl group and a naphthyl group, which may have a substituent.
  • alkyl group which may have a substituent of R, a methyl group, a trifluoromethyl group, an ethyl group, a pentafluoroethyl group, a 2,2,2-trifluoroethyl group, n- Propyl group, n-butyl group, nonafluorobutyl group, n-pentyl group, n-hexyl group, n-octyl group, heptadecafluorooctyl group, 2-ethylhexyl group, decyl group, dodecyl group, cyclic alkyl group A cyclopentyl group, a cyclohexyl group, and a camphor group can be mentioned.
  • substituents include a methoxyphenyl group, dodecylphenyl group, mesityl group, triisopropylphenyl group, 4-hydroxy-1-naphthyl group, and 6-hydroxy-2-naphthyl group.
  • R 41 and R 42 are methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, t-butyl group, n-pentyl group, t- Amyl group, n-hexyl group, n-octyl group, cyclohexyl group, methoxy group, ethoxy group, isopropoxy group, n-butoxy group, t-butoxy group, pentyloxy group, t-amyloxy group, hexyloxy group, n -Octyloxy group, methoxycarbonyl group, ethoxycarbonyl group, n-butoxycarbonyl group, t-butoxycarbonyl group, t-amyloxycarbonyl group, hexyloxycarbonyl group, n-octyloxycarbonyl group, formyl group, acetyl group,
  • more preferable groups having 5 or more carbon atoms include n-pentyl group, t-amyl group, n-hexyl group, n-octyl group, decanyl group, cyclohexyl group, pentyloxy group, t-amyloxy group, Hexyloxy group, n-octyloxy group, dodecaneoxy group, pentyloxycarbonyl group, t-amyloxycarbonyl group, hexyloxycarbonyl group, n-octyloxycarbonyl group, dodecanoxyoxycarbonyl group, valeryl group, hexanoyl group, octanoyl group A t-amylcarbonyl group, a t-amylyloxy group, an n-hexanecarbonyloxy group, and an n-octenecarbonyloxy group.
  • the more preferable sulfonic acid substituent R include methyl group, trifluoromethyl group, ethyl group, pentafluoroethyl group, 2,2,2-trifluoroethyl group, n-butyl group, nonafluorobutyl group, n-hexyl group, n-octyl group, heptadecafluorooctyl group, 2-ethylhexyl group, camphor group, phenyl group, naphthyl group, pentafluorophenyl group, p-toluyl group, p-fluorophenyl group, p-chlorophenyl group P-methoxyphenyl group, dodecylphenyl group, mesityl group, triisopropylphenyl group, 4-hydroxy-1-naphthyl group, 6-hydroxy-2-naphthyl group.
  • the total number of carbon atoms of the acid generated is preferably 1-30. More preferably, the number is 1 to 28, and still more preferably 1 to 25. If the total number of carbon atoms is less than 1, troubles such as poor resolution due to volatilization may occur, and if it exceeds 30, the development residue may be generated.
  • Specific examples of the compound represented by formula (TA-4) are shown below, but are not limited thereto. These compounds are used alone or in combination of two or more.
  • Examples of the imide sulfonate compound preferable as the thermal acid generator include compounds of the following general formula.
  • C 1 (carbon atom) and C 2 (carbon atom) are bonded by a single bond or a double bond
  • R 51 or R 52 may be the same or different
  • the following (1) to (4) (1) each independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, or (2) a monocyclic or polycyclic ring that may contain one or more heteroatoms together with C 1 and C 2
  • (3) represents a residue containing N-sulfonyloxyimide that forms a condensed aromatic ring containing C 1 and C 2 .
  • R 53 represents an alkyl group, a halogenated alkyl group, a cyclic alkyl group, an alkenyl group, an aryl group which may have a substituent, an aralkyl group which may have a substituent, or a camphor group.
  • the alkyl group includes a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, a sec-butyl group, Examples thereof include an alkyl group having 1 to 4 carbon atoms such as a tert-butyl group.
  • the cycloalkyl group include those having 3 to 8 carbon atoms such as cyclopropyl group, cyclopentyl group, cyclohexyl group, cyclooctyl group and the like.
  • aryl group examples include those having 6 to 14 carbon atoms such as phenyl group, tolyl group, xylyl group, mesityl group, and naphthyl group.
  • R 51 and R 52 correspond to the case (2), for example, the following partial structure can be given.
  • R 51 and R 52 correspond to the case of (3), for example, the following partial structure can be given.
  • R 55 and R 56 each represents a hydrogen atom or a methyl group.
  • M represents an integer of 1 to 4.
  • Examples of the alkyl group for R 53 include linear or branched alkyl groups having 1 to 20 carbon atoms. Preferred is a linear or branched alkyl group having 1 to 16 carbon atoms, and more preferred is one having 1 to 12 carbon atoms. In the case of an alkyl group having 21 or more carbon atoms, sensitivity and resolving power decrease, which is not preferable.
  • Examples of the halogenated alkyl group include those in which one or two or more hydrogen atoms of the alkyl group are halogenated. Examples of the halogen atom to be substituted include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
  • a fluorine atom a chlorine atom and a bromine atom
  • particularly preferred is a fluorine atom
  • the halogen atom to be substituted may be plural types per molecule.
  • the cyclic alkyl group include cycloalkyl groups having 3 to 12 carbon atoms such as cyclopropyl group, cyclopentyl group, cyclohexyl group, and cyclooctyl group, and polycyclic substituents such as norbornyl group, adamantyl group, and tricyclodecanyl group. I can give you.
  • the alkenyl group include linear or branched alkenyl groups having 2 to 20 carbon atoms.
  • a straight-chain or branched alkenyl group having 2 to 16 carbon atoms is preferable, and one having 2 to 12 carbon atoms is more preferable. In the case of an alkenyl group having 21 or more carbon atoms, sensitivity and resolving power decrease, which is not preferable.
  • Examples of the aryl group of R 53 include a phenyl group and a naphthyl group, and examples of the aralkyl group include a benzyl group.
  • Examples of the substituent of the aryl group and the aralkyl group include a lower alkyl group such as a methyl group, an ethyl group, a propyl group, an isopropyl group, and a tert-butyl group, a cycloalkyl group such as a cyclopentyl group and a cyclohexyl group, a phenyl group, a toluyl group, Aryl groups such as xylyl and mesityl groups, methoxy groups, ethoxy groups, propoxy groups, isopropoxy groups, sec-butoxy groups, tert-butoxy groups and other lower alkoxy groups, vinyl groups, allyl groups, propenyl groups, butenyl groups, etc.
  • an acyl group such as alkenyl group, formyl group and acetyl group, and halogen atoms such as hydroxy group, carboxy group, cyano group, nitro group, fluorine atom, chlorine atom, bromine atom and iodine atom.
  • a lower alkyl group such as a methyl group, ethyl group, propyl group, isopropyl group, tert-butyl group, cyclohexyl group, phenyl group, toluyl group, methoxy group, ethoxy group, propoxy group, isopropoxy group, sec-butoxy Group, lower alkoxy group such as tert-butoxy group, halogen atom such as cyano group, nitro group, fluorine atom, chlorine atom, bromine atom and iodine atom.
  • substituents on the aryl group and the aralkyl group may be used. Specific examples of these compounds are shown below, but are not limited thereto.
  • Preferred oxime sulfonate compounds as thermal acid generators include compounds of the following general formula.
  • R 61 and R 62 are an alkyl group, alkenyl group, alkynyl group, cycloalkyl group, cycloalkenyl group, substituted group which may have a substituent having 1 to 16 carbon atoms.
  • R 61 and R 62 are an alkylene chain, alkenylene chain, alkynylline chain, which may have a substituent having 2 to 8 carbon atoms, or phenylene, freelen, thienylene, which may have a substituent, It may be bonded to R 61 or R 62 of the compound represented by another general formula (TA-6) through a linking chain containing —O—, —S—, —N—, and —CO—. . That is, the compound represented by the general formula (TA-6) includes those having two or three oxime sulfonate structures via a linking chain.
  • R 63 represents an alkyl group, a cycloalkyl group, or an aryl group which may have a substituent, which may have a substituent having 1 to 16 carbon atoms.
  • alkyl group having 1 to 16 carbon atoms in R 61 to R 63 examples include a methyl group, an ethyl group, a propyl group, an i-propyl group, a butyl group, an i-butyl group, a t-butyl group, a t-amyl group, alkyl groups such as n-hexyl group, n-octyl group, i-octyl group, n-decyl group, undecyl group, dodecyl group, hexadecyl group, trifluoromethyl group, perfluoropropyl group, perfluorobutyl group, perfluoro-t- Examples thereof include a butyl group, a perfluorooctyl group, a perfluoroundecyl group, and a 1,1-bistrifluoromethylethyl group.
  • alkenyl group for R 61 and R 62 examples include allyl group, methallyl group, vinyl group, methylallyl group, 1-butenyl group, 3-butenyl group, 2-butenyl group, 1,3-pentadienyl group, 5-hexenyl group, Examples include 2-oxo-3-pentenyl group, decapentaenyl group, 7-octenyl group and the like.
  • alkynyl group in R 61 and R 62 examples include ethynyl group, propargyl group, 2-butynyl group, 4-hexynyl group, 2-octynyl group, phenylethynyl group, cyclohexylethynyl group and the like.
  • Examples of the cycloalkyl group in R 61 to R 63 include those having 3 to 8 carbon atoms, such as a cyclopropyl group, a cyclopentyl group, and a cyclohexyl group, which may have a substituent.
  • Examples of the cycloalkenyl group for R 61 and R 62 include a cyclobutenyl group, a cyclohexenyl group, a cyclopentadienyl group, a bicyclo [4.2.4] dodeca-3,7-dien-5-yl group, and the like.
  • Examples of the aryl group in R 61 to R 63 include those having 6 to 14 carbon atoms, such as phenyl group, tolyl group, methoxyphenyl group, and naphthyl group, which may have a substituent.
  • the above substituents include alkyl groups, cycloalkyl groups, alkoxy groups, halogen atoms (fluorine atoms, chlorine atoms, iodine atoms), cyano groups, hydroxy groups, carboxy groups, nitro groups, aryloxy groups, alkylthio groups, aralkyls. And groups represented by the following general formula (1A).
  • the alkyl group and the cycloalkyl group have the same meanings as described above.
  • the alkoxy group include those having 1 to 4 carbon atoms such as methoxy group, ethoxy group, hydroxyethoxy group, propoxy group, n-butoxy group, isobutoxy group, sec-butoxy group and t-butoxy group.
  • the aralkyl group include a benzyl group, a naphthylmethyl group, a furyl group, and a thienyl group.
  • R 61 and R 62 have the same meanings as R 61 and R 62 in formula (TA-6).
  • Preferred examples of the oxime sulfonate-based acid generator as the thermal acid generator include compounds having at least one group represented by the following general formula (TA-7).
  • R 70a and R 70b each independently represents an organic group.
  • the organic group of R 70a and R 70b is a group containing a carbon atom, and an atom other than a carbon atom (for example, a hydrogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a halogen atom (a fluorine atom, a chlorine atom, etc.)) You may have.
  • As the organic group for R 70a a linear, branched, or cyclic alkyl group or aryl group is preferable. These alkyl groups and aryl groups may have a substituent.
  • the substituent is not particularly limited, and examples thereof include a fluorine atom and a linear, branched or cyclic alkyl group having 1 to 6 carbon atoms.
  • “having a substituent” means that part or all of the hydrogen atoms of the alkyl group or aryl group are substituted with a substituent.
  • the alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 10 carbon atoms, still more preferably 1 to 8 carbon atoms, particularly preferably 1 to 6 carbon atoms, and most preferably 1 to 4 carbon atoms.
  • a partially or completely halogenated alkyl group (hereinafter sometimes referred to as a halogenated alkyl group) is particularly preferable.
  • the partially halogenated alkyl group means an alkyl group in which a part of hydrogen atoms is substituted with a halogen atom, and the fully halogenated alkyl group means that all of the hydrogen atoms are halogen atoms.
  • the aryl group preferably has 4 to 20 carbon atoms, more preferably 4 to 10 carbon atoms, and most preferably 6 to 10 carbon atoms.
  • a partially or completely halogenated aryl group is particularly preferable.
  • the partially halogenated aryl group means an aryl group in which a part of hydrogen atoms is substituted with a halogen atom, and the fully halogenated aryl group means that all of the hydrogen atoms are halogen atoms.
  • R 70a is particularly preferably an alkyl group having 1 to 4 carbon atoms having no substituent or a fluorinated alkyl group having 1 to 4 carbon atoms.
  • R 70b a linear, branched, or cyclic alkyl group, aryl group, or cyano group is preferable.
  • the alkyl group and aryl group for R 70b the same alkyl groups and aryl groups as those described above for R 70a can be used.
  • R 70b is particularly preferably a cyano group, an alkyl group having 1 to 8 carbon atoms having no substituent, or a fluorinated alkyl group having 1 to 8 carbon atoms.
  • a compound represented by the following general formula (TA-7a) or (TA-7b) is preferably used because of its high acid generation efficiency against electron beam irradiation.
  • m ′ is 0 or 1;
  • X is 1 or 2;
  • R 71 is a phenyl group, a heteroaryl group, or an alkyl group having 1 to 12 carbon atoms, or When m ′ is 0, an alkoxycarbonyl group having 2 to 6 carbon atoms, a phenoxycarbonyl group, CN (cyano group);
  • R 72 is synonymous with R 71 ;
  • R 73 ′ is 1 to 1 carbon atoms when X is 1;
  • R 74 and R 75 are independently a hydrogen atom, a halogen atom, an alkyl group having 1 to 6 carbon atoms;
  • A is —S— , -O-, -N (R 76 )-.
  • R76 represents an alkyl group, an aryl group or an aral
  • R 71 ′ is an alkylene group having 2 to 12 carbon atoms; R 72 , R 74 , R 75 and A are as defined above; R 73 is an alkyl group having 1 to 18 carbon atoms. . ]
  • the following thiolene-containing oxime sulfonate is particularly preferable.
  • Preferred examples of the general formula of nitrobenzyl sulfonate include compounds represented by the general formula (TA-9).
  • (Z in this formula is alkyl group, aryl group, alkylaryl group, halogen-substituted alkyl group, halogen-substituted aryl group, halogen-substituted alkylaryl group, nitro-substituted aryl group, nitro-substituted
  • Q m (NO ) is selected 2 from the groups having, R represents a hydrogen atom or a methyl group, R 'are selected from hydrogen atoms and methyl groups, and nitro substituted aryl groups, each Q is a hydrocarbon radical, Hidorokarubono Independently selected from a xyl group, NO 2 , a halogen atom and an organo
  • sulfonic acid esters can be used.
  • a sulfonic acid ester represented by the following general formula (TA-1) can be given.
  • R ′ and R ′′ are each independently a linear or branched alkyl group having 1 to 10 carbon atoms which may have a substituent or an optionally substituted carbon group having 6 carbon atoms.
  • Preferable specific examples of the sulfonic acid ester include the following.
  • TA-2 a compound represented by the following general formula (TA-2) is more preferable from the viewpoint of heat resistance.
  • the molecular weight of the sulfonate ester is generally 230 to 1000, preferably 230 to 800.
  • A represents an h-valent linking group.
  • R 0 represents an alkyl group, an aryl group, an aralkyl group, or a cyclic alkyl group.
  • R 0 ′ represents a hydrogen atom, an alkyl group, or an aralkyl group.
  • h represents an integer of 2 to 8.
  • the h-valent linking group as A includes, for example, an alkylene group (eg, methylene, ethylene, propylene, etc.), a cycloalkylene group (eg, cyclohexylene, cyclopentylene, etc.), an arylene group (1,2-phenylene, 1,3). -Phenylene, 1,4-phenylene, naphthylene, etc.), an ether group, a carbonyl group, an ester group, an amide group, and a group obtained by removing h-2 arbitrary hydrogen atoms from a divalent group combining these groups. Can be mentioned.
  • the carbon number of the h-valent linking group as A is generally 1 to 15, preferably 1 to 10, and more preferably 1 to 6.
  • the alkyl group for R 0 and R 0 ′ is generally an alkyl group having 1 to 20 carbon atoms, preferably an alkyl group having 1 to 15 carbon atoms, more preferably an alkyl group having 1 to 8 carbon atoms. is there. Specific examples include methyl, ethyl, propyl, butyl, hexyl, octyl and the like.
  • the aralkyl group for R 0 and R 0 ′ is generally an aralkyl group having 7 to 25 carbon atoms, preferably an aralkyl group having 7 to 20 carbon atoms, more preferably an aralkyl group having 7 to 15 carbon atoms. is there.
  • the cyclic alkyl group for R 0 is generally a cyclic alkyl group having 3 to 20 carbon atoms, preferably a cyclic alkyl group having 4 to 20 carbon atoms, more preferably a cyclic alkyl group having 5 to 15 carbon atoms. is there. Specific examples include cyclopentyl, cyclohexyl, norbornyl, camphor group and the like.
  • the linking group as A may further have a substituent.
  • the substituent is an alkyl group (an alkyl group having 1 to 10 carbon atoms, specifically, methyl, ethyl, propyl, butyl, hexyl). Octyl, etc.), aralkyl groups (aralkyl groups having 7 to 15 carbon atoms, specifically benzyl, toluylmethyl, mesitylmethyl, phenethyl, etc.), aryl groups (aryl groups having 6 to 10 carbon atoms, specifically Are phenyl, toluyl, xylyl, mesityl, naphthyl, etc.), an alkoxy group (the alkoxy group may be linear, branched or cyclic, and has 1 to 10 carbon atoms, specifically, Methoxy, ethoxy, linear or branched propoxy, linear or branched butoxy, linear or branched pentoxy, cyclopentyloxy, cyclohexy
  • R 0 is preferably an alkyl group or an aryl group.
  • R 0 ′ is preferably a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, more preferably a hydrogen atom, a methyl group or an ethyl group, and most preferably a hydrogen atom.
  • Examples of the sulfonic acid ester in the present invention include the following specific compounds, but are not limited thereto.
  • sulfonic acid ester in the present invention a commercially available one may be used, or one synthesized by a known method may be used.
  • the sulfonic acid ester of the present invention can be synthesized, for example, by reacting sulfonyl chloride or sulfonic acid anhydride with a corresponding polyhydric alcohol under basic conditions.
  • the content of the thermal acid generator is preferably 1 to 20% by mass, more preferably 3 to 10% by mass based on the total solid content of the photosensitive resin composition.
  • composition of the present invention may contain a compound containing at least one of alkoxymethyl group and acyloxymethyl group. Even in the low-temperature curing process, it is possible to prevent melting and thermal shrinkage of the pattern during curing.
  • an alkoxymethyl group or an acyloxymethyl group a compound in which an alkoxymethyl group or an acyloxymethyl group is substituted directly on an aromatic group or a nitrogen atom of the following urea structure on a triazine
  • the alkoxymethyl group or acyloxymethyl group of the compound preferably has 2 to 5 carbon atoms, preferably 2 or 3 carbon atoms, and particularly preferably 2 carbon atoms.
  • the total number of alkoxymethyl groups and acyloxymethyl groups possessed by the compound is preferably 1 to 10, more preferably 2 to 8, and particularly preferably 3 to 6.
  • the molecular weight of the compound is preferably 1500 or less, and preferably 180 to 1200.
  • R 100 represents an alkyl group or an acyl group.
  • R 101 and R 102 independently represent a monovalent organic group, and may be bonded to each other to form a ring.
  • Examples of the compound in which an alkoxymethyl group or an acyloxymethyl group is directly substituted with an aromatic group include compounds having the following general formula.
  • X represents a single bond or a divalent organic group
  • each R 104 independently represents an alkyl group or an acyl group
  • R 103 represents a hydrogen atom, an alkyl group, an alkenyl group, an aryl group, an aralkyl group, Or a group that decomposes by the action of an acid to generate an alkali-soluble group (for example, a group that is eliminated by the action of an acid, a group represented by —C (R 4 ) 2 COOR 5 (R 4 is a hydrogen atom or a carbon number) Represents an alkyl group of 1 to 4, and R 5 represents a group capable of leaving by the action of an acid))).
  • R 105 each independently represents an alkyl group or an alkenyl group
  • a, b and c are each independently 1 to 3
  • d is 0 to 4
  • e is independently 0 to 3.
  • the group that decomposes by the action of an acid to generate an alkali-soluble group refers to a group that decomposes by the action of an acid to generate an alkali-soluble group such as a hydroxyl group or a carboxyl group (hereinafter also referred to as an acid-decomposable group).
  • a preferable group as the acid-decomposable group is a group obtained by substituting the hydrogen atom of these alkali-soluble groups with a group capable of leaving with an acid.
  • R 36 to R 39 each independently represents an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group.
  • R 36 and R 37 may be bonded to each other to form a ring.
  • R 01 and R 02 each independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group.
  • Examples of the compound having an alkoxymethyl group include the following structures.
  • Examples of the compound having an acyloxymethyl group include compounds in which the alkoxymethyl group of the following compound is changed to an acyloxymethyl group.
  • Examples of the compound having an alkoxymethyl group or acyloxymethyl in the molecule include, but are not limited to, the following compounds.
  • the compound containing at least one of an alkoxymethyl group and an acyloxymethyl group a commercially available product or a compound synthesized by a known method may be used. From the viewpoint of heat resistance, a compound in which an alkoxymethyl group or an acyloxymethyl group is directly substituted on an aromatic ring or a triazine ring is preferable.
  • the addition amount of these compounds is preferably 1 to 20 parts by mass, and more preferably 3 to 15 parts by mass with respect to 100 parts by mass of the total amount of the resin of the present invention.
  • composition of the present invention may contain a compound containing methacryloyl group or acryloyl group.
  • the compound containing a methacryloyl group or an acryloyl group is a compound selected from the group consisting of acrylic acid esters and methacrylic acid esters. Since these compounds are insoluble in an alkaline developer, they have a function of suppressing the alkali solubility of the composition, and are useful for good image formation in order to suppress film loss in unexposed areas.
  • the molecular weight of components constituting the composition partially increases due to the reaction of the acrylic group or methacrylic group with the compound in the composition at the stage of the cure reaction. As a result, film properties are improved. Therefore, it is preferable to use a compound having two or more acryloyl groups and methacryloyl groups in one molecule, more preferably four or more functional groups, because this compound can exhibit a function as a crosslinking compound.
  • EO ethylene oxide
  • PO propylene oxide
  • NK-10 series made by Shin-Nakamura Chemical Co., Ltd., monofunctional AMP-10G, AMP-20GY, AM30G, AM90G, AM230G, ACB-3, A-BH, A-IB, A-SA, A -OC-18E, 720A, S-1800A, ISA, AM-130G, LA, M-20G, M-90G, M230G, PHE-1G, SA, CB-1, CB-3, CB-23, TOPOLENE-M , S-1800M, IB, OC-18E, S, bifunctional A-200, A-400, A-600, A-1000, ABE-300, A-BPE-4, A-BPE-10, A- BPE-20, A-BPE-30, A-BPP-3, A-DOD, A-DCP, A-IBD-2E, A-NPG, 701A, A-B1206PE, A-HD-N A-NOD-N, APG-100, APG-200
  • the addition amount of the compound containing a methacryloyl group or an acryloyl group in the molecule of the present invention is 0.5 parts by mass or more and 30 parts by mass or less with respect to 100 parts by mass of the resin having a repeating unit represented by the general formula (1). Is preferred. More preferably, they are 1 mass part or more and 20 mass parts or less, Most preferably, they are 2 mass parts or more and 15 mass parts or less.
  • an adhesion promoter such as an organosilicon compound, a silane coupling agent, and a leveling agent for imparting adhesion may be added as necessary.
  • an adhesion promoter such as an organosilicon compound, a silane coupling agent, and a leveling agent for imparting adhesion may be added as necessary. Examples of these are, for example, ⁇ -aminopropyltrimethoxysilane, ⁇ -aminopropyltriethoxysilane, vinyltriethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-acryloxypropyltrimethoxysilane, p-styryl.
  • an adhesion promoter it is preferably 0.1 to 20 parts by mass, more preferably 0.5 to 10 parts by mass with respect to 100 parts by mass of the resin of the present invention.
  • (G) Solvent The solvent is not particularly limited as long as it can dissolve the composition of the present invention. However, in order to prevent the solvent from evaporating more than necessary at the time of coating and precipitating the solid content of the composition at the time of coating, Solvents with the above boiling points are preferred. For example, alkylene glycol monoalkyl ether carboxylate, alkylene glycol monoalkyl ether, alkyl lactate ester, alkyl alkoxypropionate, cyclic lactone (preferably having 4 to 10 carbon atoms), monoketone compound (preferably carbon And organic solvents such as alkylene carbonate, alkyl alkoxyacetate, alkyl pyruvate, and amide solvents.
  • alkylene glycol monoalkyl ether carboxylate examples include propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate, propylene glycol monomethyl ether propionate, propylene glycol monoethyl Preferred examples include ether propionate, ethylene glycol monomethyl ether acetate, and ethylene glycol monoethyl ether acetate.
  • alkylene glycol monoalkyl ether examples include propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether.
  • alkyl lactate examples include methyl lactate, ethyl lactate, propyl lactate and butyl lactate.
  • alkyl alkoxypropionate examples include ethyl 3-ethoxypropionate, methyl 3-methoxypropionate, methyl 3-ethoxypropionate, and ethyl 3-methoxypropionate.
  • cyclic lactone examples include ⁇ -propiolactone, ⁇ -butyrolactone, ⁇ -butyrolactone, ⁇ -methyl- ⁇ -butyrolactone, ⁇ -methyl- ⁇ -butyrolactone, ⁇ -valerolactone, ⁇ -caprolactone, and ⁇ -octano.
  • Examples of the monoketone compound which may contain a ring include 2-butanone, 3-methylbutanone, pinacolone, 2-pentanone, 3-pentanone, 3-methyl-2-pentanone, 4-methyl-2-pentanone, 2 -Methyl-3-pentanone, 4,4-dimethyl-2-pentanone, 2,4-dimethyl-3-pentanone, 2,2,4,4-tetramethyl-3-pentanone, 2-hexanone, 3-hexanone, 5-methyl-3-hexanone, 2-heptanone, 3-heptanone, 4-heptanone, 2-methyl-3-heptanone, 5-methyl-3-heptanone, 2,6-dimethyl-4-heptanone, 2-octanone, 3-octanone, 2-nonanone, 3-nonanone, 5-nonanone, 2-decanone, 3-decanone, 4-decanone, 5-hexen-2-one 3-penten-2-one, cyclopentanone
  • alkylene carbonate examples include propylene carbonate, vinylene carbonate, ethylene carbonate, and butylene carbonate.
  • alkyl alkoxyacetate examples include 2-methoxyethyl acetate, 2-ethoxyethyl acetate, 2- (2-ethoxyethoxy) ethyl acetate, 3-methoxy-3-methylbutyl acetate, and 1-methoxy-acetate. 2-propyl is preferred.
  • Preferred examples of the alkyl pyruvate include methyl pyruvate, ethyl pyruvate, and propyl pyruvate.
  • amide solvent examples include N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidinone and 1,3-dimethyl-2-imidazolidinone.
  • dimethyl sulfoxide and sulfolane are preferable.
  • N-methylpyrrolidone (NMP), ⁇ -butyrolactone (GBL), N, N-dimethylacetamide (DMAc), 1,3-dimethyl-2-imidazolidinone (DMI) are more preferable solvents.
  • N, N-dimethylformamide (DMF) cyclopentanone, cyclohexanone, cycloheptanone and the like.
  • the total solid concentration in the photosensitive resin composition of the present invention is generally 10 to 40% by mass, more preferably 10 to 30% by mass, and still more preferably 15 to 30% by mass.
  • the photosensitive resin composition of the present invention the base polymer, a photoacid generator, and if necessary, photosensitizers, organic solvent, basic compound, surfactant, dissolution modifiers, ultraviolet absorbers, storage stability It can be prepared as a solution by mixing additives such as an agent and an antifoaming agent. The order and method of mixing are not particularly limited.
  • the photosensitive resin composition of the present invention may be a dry film.
  • the dry film can be prepared, for example, by applying the above solution onto a support such as metal or polyethylene terephthalate, drying, and then peeling off the support.
  • the support is a film of polyethylene terephthalate or the like, it can be used as it is as the photosensitive resin composition of the present invention.
  • a method for applying the photosensitive resin composition of the present invention on a support for example, spin coating, roll coating, flow coating, dip coating, spray coating, and a known method such as doctor coating.
  • the thickness of the applied film can be set according to the use, but is preferably 0.05 to 200 ⁇ m, more preferably 0.1 to 100 ⁇ m.
  • the film used as the support include polyethylene terephthalate, polypropylene, polyethylene, polyester, and polyvinyl alcohol.
  • the photosensitive resin composition of the present invention is a dry film
  • the photosensitive resin composition is coated with a protective film for the purpose of protecting the photosensitive resin composition from scratches, dust, chemicals, and the like. May be.
  • a protective film a polyethylene film, a polypropylene film, etc. are mentioned, for example, and the adhesive force with the photosensitive resin composition of this invention is smaller than a support body.
  • the dry film may be wound up into a roll.
  • the photosensitive resin composition of the present invention is a pattern forming material.
  • substrate For example, metal plates, such as aluminum, zinc, gold
  • the photosensitive resin composition of the present invention As a method for coating the photosensitive resin composition of the present invention on a substrate, when the photosensitive resin composition of the present invention is a solution, for example, spin coating, roll coating, flow coating, dip coating, spray coating, doctor coating Known methods such as The thickness of the applied photosensitive film can be set according to the use, but is preferably 0.05 to 200 ⁇ m, more preferably 0.1 to 100 ⁇ m.
  • the photosensitive resin composition of the present invention is a dry film and there is a protective film, after the protective film is peeled off, the photosensitive resin composition layer is applied so as to directly touch the substrate, for example, a method of laminating Etc. By setting the temperature to 80 to 160 ° C.
  • the heat treatment in the next step can be omitted.
  • the substrate After applying the photosensitive resin composition of the present invention to a substrate, the substrate may be heated.
  • the heating method include known methods such as heating with a hot plate or an oven. By heating, it is possible to evaporate the organic solvent.
  • the heating temperature is preferably 80 ⁇ 160 ° C..
  • the photosensitive resin composition of the present invention is a dry film, this step can be omitted if heating is performed during lamination.
  • the photosensitive film can be irradiated with actinic rays or radiation using a photomask, a reduction projection exposure machine, a direct drawing machine or the like.
  • actinic rays or radiation examples include far-infrared rays, visible rays, g-rays, h-rays, i-rays and other near ultraviolet rays, KrF excimer lasers, ArF excimer lasers, DUV (far-ultraviolet rays), EUV (extreme ultraviolet rays), and electron beams. And X-rays. In a portion irradiated with radiation or the like, the photoacid generator is decomposed to generate an acid.
  • the substrate It is preferable to heat the substrate after irradiation.
  • the heating method include those used for heating after coating. By heating, the structure derived from the compound represented by the general formula (I) is eliminated from the compound having the group represented by the general formula (III), and the hydroxyl group or the carboxyl group is regenerated. The heating temperature is preferably 80 to 160 ° C. After heating, when the dry film is used, the support is removed, and when the dry film is not used, the development is performed with an alkaline developer to obtain a positive resist pattern. Examples of the developing method include known methods such as an immersion method, a paddle method, and a spray method.
  • alkaline developer examples include sodium hydroxide, potassium hydroxide, sodium carbonate, sodium oxalate, sodium metasuccinate, ammonia, ethylamine, n-propylamine, diethylamine, di-n-propylamine, triethylamine, methyldiethylamine, Dimethylethanolamine, triethanolamine, tetramethylammonium hydroxide, tetraethylammonium hydroxide, choline, pyrrole, piperidine, 1,8-diazabicyclo [5.4.0] -7-undecene, 1,5-diazabicyclo [4.
  • a basic substance individually or in mixture of 2 or more types.
  • a suitable amount of a water-soluble organic solvent for example, an alcohol such as methanol or ethanol, or a surfactant can be added to the developer.
  • the substrate may be washed with water or heat-dried as necessary.
  • the pattern formed on the substrate may be a known pattern such as dry etching of the substrate with a chlorine-based gas, a fluorine-based gas (CF 4 / CH 2 F 2 mixed gas, etc.), an oxygen-based gas or the like using the pattern as a mask. It can be subjected to a process. Furthermore, this invention relates to the cured film obtained by heat-processing the said photosensitive resin composition.
  • a resin having a group represented by formula (III), all or part of the carboxyl groups of the polyimide precursor containing a repeating unit represented by the general formula (VIII) is formula (IV) All or part of the hydroxyl group of the polyimide precursor substituted with the group represented by the formula (II) or the polybenzoxazole precursor containing the repeating unit represented by the formula (IX) is represented by the formula (III)
  • a polyimide film or a polybenzoxazole film having excellent film characteristics can be formed by heat-treating the obtained pattern to form an imidized or oxazolated film.
  • the heating temperature is preferably 250 to 400 ° C.
  • the photosensitive resin composition of this invention is excellent in the stability in the heating process of the photosensitive film
  • the present invention also relates to a cured relief pattern and a method for producing the same.
  • the cured relief pattern of the present invention is (A) forming the photosensitive film on a substrate; (A) a step of exposing the photosensitive film with actinic rays or radiation; (C) It can be produced by a production method comprising a step of developing so as to remove an exposed portion of the photosensitive film with an aqueous alkaline developer, and (d) a step of heat-treating the obtained relief pattern. .
  • the photosensitive resin composition of the present invention is applied on a semiconductor element so that the thickness after heat curing becomes a predetermined thickness (for example, 0.1 to 30 ⁇ m), prebaked, exposed, developed, and heat cured.
  • a predetermined thickness for example, 0.1 to 30 ⁇ m
  • Synthesis Example 5 Synthesis of 2-acetyl-1-chloro-1-methoxypropane The same reaction as in Synthesis Example 1 except that 2-acetylpropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. And 2-acetyl-1-chloro-1-methoxypropane (a-5) was obtained as a transparent liquid.
  • Synthesis Example 6 Synthesis of 1-chloro-2- (ethoxycarbonyl) -1-methoxypropane Synthesis Example 1 except that 2- (ethoxycarbonyl) propionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1.
  • Synthesis Example 8 Synthesis of 1-chloro-2-cyano-1-methoxypropane The same reaction as in Synthesis Example 1 except that 2-cyanopropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1-Chloro-2-cyano-1-methoxypropane (a-8) was obtained as a transparent liquid.
  • Synthesis Example 9 Synthesis of 1,2-dichloro-1-methoxypropane A reaction was conducted in the same manner as in Synthesis Example 1 except that 2-chloropropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1,2-Dichloro-1-methoxypropane (a-9) was obtained as a transparent liquid.
  • Synthesis Example 10 Synthesis of 1-chloro-1- (cyclohexyloxy) -2-phenylpropane The same reaction as in Synthesis Example 2 was conducted except that cyclohexanol was used in place of 2-methoxyethanol in Synthesis Example 2. 1-chloro-1- (cyclohexyloxy) -2-phenylpropane (a-10) was obtained as a transparent liquid. (Synthesis Example 11) Synthesis of 1-chloro-1-phenoxy-2-phenylpropane A reaction was conducted in the same manner as in Synthesis Example 2 except that phenol was used instead of 2-methoxyethanol in Synthesis Example 2. -1-Phenoxy-2-phenylpropane (a-11) was obtained as a transparent liquid.
  • Example 1 to 13 and Comparative Examples 1 and 2 Storage Stability Test of Protective Agents 5 g of the protective agents obtained in Synthesis Examples 1 to 13 and Comparative Synthesis Examples 1 and 2 were each filled into a 10 ml glass vial, After sealing, it was aged for 15 days in a constant temperature layer at 50 ° C. The remaining amount of the protective agent was quantified from 1 H-NMR measurement (deuterated chloroform, internal standard: trimethoxybenzene) after the lapse of time, and the residual rate after aging was calculated based on the amount of the protective agent before the lapse of time. The results are shown in Table 1.
  • Comparative Examples 1 and 2 using a protective agent that does not satisfy the general formula (I) have a small residual rate after aging.
  • Examples 1 to 13 using the protective agent represented by the general formula (I) have a high residual ratio after aging and are extremely excellent in storage stability.
  • Example 17 Protection of hydroxyl group of m-cresol by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane (a-2) 10.0 g of m-cresol was dissolved in 30 ml of tetrahydrofuran, After cooling to 0 ° C., 22.2 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane was added, and 11.2 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours.
  • a mixed solution of AIBN / propylene glycol monomethyl acetate 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction.
  • the obtained resin solution was purified by reprecipitation with hexane to obtain 79 g of a white solid (d-1).
  • the weight average molecular weight of the solid was 7,500.
  • a mixed solution of AIBN / propylene glycol monomethyl acetate 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction.
  • the obtained resin solution was purified by reprecipitation with hexane to obtain 83 g of a white solid (d-2).
  • the weight average molecular weight of the solid was 8,200.
  • Example 20 1-chloro-1-methoxy-2-phenylpropane according polyhydroxystyrene polyhydroxystyrene protected weight average molecular weight of 20,000 of the hydroxyl groups (manufactured by Aldrich) 2.7 g of N, N-dimethyl Dissolve in 17.5 ml of acetamide, add 2.04 g of 1-chloro-1-methoxy-2-phenylpropane to this solution, stir to dissolve completely, then add 2.23 g of triethylamine to about 30 with stirring. Added dropwise over a period of minutes. After completion of dropping, the mixture was stirred for about 3 hours.
  • Example 21 Protection of hydroxyl group of polyhydroxystyrene by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane 2.7 g of polyhydroxystyrene (Aldrich) having a weight average molecular weight of 20,000 was used. After dissolving in 17.5 ml of N, N-dimethylacetamide and adding 2.52 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane to this solution and stirring to dissolve completely, While stirring, 2.23 g of triethylamine was added dropwise over about 30 minutes. After completion of dropping, the mixture was stirred for about 3 hours.
  • Example 22 Protection of carboxyl group of polyamic acid by 1-chloro-1-methoxy-2-phenylpropane
  • 250.0 g of the polyamic acid solution obtained in Synthesis Example 16 was equipped with a thermometer, a stirrer, and a nitrogen introduction tube. Then, 124.0 g of NMP was added and cooled, and 28.51 g of N, N-diisopropylethylamine was added at 0 ° C. or lower, followed by 37.60 g of 1-chloro-1-methoxy-2-phenylpropane.
  • the reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 29.96 g of a white solid (g-2).
  • the solid was dissolved in deuterated DMSO, and the 1 H-NMR spectrum was measured. From the peak integration ratio of the carboxylic acid ester to the carboxylic acid, 96% of the carboxyl groups were converted to 1- (2-methoxyethoxy) -2-phenylpropoxy groups. It was found that it was replaced.
  • the weight average molecular weight of the obtained resin was 24,400.
  • reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 22.95 g of a white solid (g-14).
  • the solid was dissolved in deuterated DMSO and 1 H-NMR spectrum was measured. From the peak integration ratio of the carboxylic acid ester and carboxylic acid, it was found that 77% of the carboxyl groups were substituted with 1-ethoxyethyl groups. The weight average molecular weight of the obtained resin was 20,900.
  • reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 23.77 g of a white solid (g-15).
  • the solid was dissolved in heavy DMSO and 1 H-NMR spectrum was measured. From the peak integral ratio of carboxylic acid ester and carboxylic acid, 89% of the carboxyl groups were substituted with 1-methoxy-2-methylpropyl groups. I understood.
  • the weight average molecular weight of the obtained resin was 21,300.
  • the resulting polyhydroxyamide had a weight average molecular weight of 18,000.
  • Example 24 Protection of hydroxyl group of polyhydroxyamide by 1-chloro-1-methoxy-2-phenylpropane
  • 20 g of polyhydroxyamide obtained above and 200 g of ethyl acetate After stirring and dissolving, 99.4 g of 1-chloro-1-methoxy-2-phenylpropane was added, and then 20.5 g of triethylamine was stirred at room temperature for 1 hour. Thereafter, the reaction solution was transferred to a separating funnel and separated into an organic phase and an aqueous phase.
  • the precipitate is collected, washed with n-hexane and pure water, dried under reduced pressure, and 21.5 g of a white solid (h-14). Got. From the 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl groups were substituted with 1-ethoxyethyl groups. The weight average molecular weight of the target product was 19,300.
  • the precipitate is recovered, washed with n-hexane and pure water, dried under reduced pressure, and 22.0 g of a white solid (h-15). Got. From the 1 H-NMR spectrum, it was found that 38 mol% of the hydroxyl groups were substituted with 1-methoxy-2-methylpropyl groups. The weight average molecular weight of the target product was 19,800.
  • the protective agent described in Table 2 below and a compound (or resin) that can be protected by reacting therewith, the protective body described in Table 2 below was produced by the same synthesis method as described above.
  • the protection ratio (mol%) in the table is a value measured by 1 H-NMR spectrum.
  • PAI-101 ⁇ - (p-Tolylsulfonyloxyimino) -4-methoxyphenylacetonitrile (Midori Chemical Co., Ltd.)
  • NAI-105 N- (trifluoromethylsulfonyloxy) naphthyl dicarboxylimide (manufactured by Midori Chemical Co., Ltd.)
  • TESPEC triethoxysilylpropyl ethyl carbamate
  • EOA amine of the following structure
  • PF6320 (made by OMNOVA, fluorine type)
  • PGMEA Propylene glycol monomethyl ether acetate
  • DMAc N, N-dimethylacetamide
  • a pattern was formed by the following method, and the pattern shape was evaluated.
  • ⁇ Pattern formation method> The prepared photosensitive resin composition was spin-coated on a 4 inch silicon wafer, subjected to pre-drying of 120 ° C. 3 minutes on a hot plate to give a film thickness of 5.0 ⁇ m film (photosensitive film).
  • pattern exposure was performed using an i-line stepper exposure apparatus FPA-3000i5 + (manufactured by Canon, Inc.) using a 1-30 ⁇ m via hole repeating pattern mask.
  • ⁇ Sensitivity> The obtained pattern film was observed with a length measurement SEM (Hitachi, Ltd. S-8840), and the exposure amount obtained by resolving the via hole having the smallest dimension was defined as sensitivity.
  • a less than 100 mJ / cm 2 was A, 100 mJ / cm 2 or more.
  • 500 mJ / cm 2 less than the B, and 500 mJ / cm 2 or more was C.
  • a and B were set to pass.
  • Comparative Examples 29 to 38 are all inferior in resolution, and Comparative Examples 35 to 38 with respect to the cured relief pattern are also inferior in sensitivity.
  • the patterns obtained from the photosensitive resin compositions obtained in Examples 110 to 145 are excellent in both resolution and sensitivity.
  • Examples 146 to 169 of the cured relief pattern are both excellent in resolution and sensitivity.
  • a carboxyl group or hydroxyl group protecting agent having excellent storage stability having excellent storage stability
  • the carboxyl group or hydroxyl group being protected by the protecting agent
  • a resin having excellent storage stability and the above-described protected product having excellent resolution and sensitivity.
  • Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, The cured relief pattern obtained by the above and a semiconductor device comprising the cured relief pattern can be provided.

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Abstract

Provided are: a protectant of carboxyl groups or hydroxyl groups having excellent storage stability; a resin in which carboxyl groups or hydroxyl groups are protected by the protectant, the resin having excellent storage stability; a photosensitive resin composition containing the protected resin, the photosensitive resin composition having excellent resolution and sensitivity; a pattern-forming material, photosensitive film, and cured film in which the photosensitive resin composition is used; and a method for producing a cured relief pattern, the cured relief pattern obtained thereby, and a semiconductor device equipped with the cured relief pattern, in which the photosensitive resin composition is used. A protectant of hydroxl groups or carboxyl groups, which protectant is a compound represented by general formula (I). (In the general formula, R1 and R2 each independently represent an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom, R1 and/or R2 being an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom. R3 represents an alkyl group, a cycloalkyl group, an aryl group, or an aralkyl group. R1 and R2 may bond together to form a ring, or R1 or R2 may bond to R3 to form a ring. X represents a group that can be desorbed by the action of the hydroxyl groups or carboxyl groups.)

Description

保護剤、該保護剤により保護された化合物の製造方法、該保護剤により保護された樹脂、該保護剤により保護された樹脂を含有する感光性樹脂組成物、パターン形成材料、感光性膜、硬化レリーフパターン、その製造方法、及び半導体装置Protective agent, method for producing compound protected by the protective agent, resin protected by the protective agent, photosensitive resin composition containing the resin protected by the protective agent, pattern forming material, photosensitive film, curing Relief pattern, manufacturing method thereof, and semiconductor device
 本発明は、化学増幅型レジスト組成物、医薬品の合成中間体、塗料などの製造の用途に有用な、カルボキシル基又はヒドロキシル基の保護剤、該保護剤によりカルボキシル基又はヒドロキシル基が保護された樹脂、該樹脂を含有する感光性樹脂組成物、該感光性樹脂組成物を用いたパターン形成材料、感光性膜、及び硬化膜、並びに該感光性樹脂組成物を用いた硬化レリーフパターンの製造方法、それにより得られた硬化レリーフパターン及び該硬化レリーフパターンを具備する半導体装置に関する。 The present invention relates to a protective agent for a carboxyl group or a hydroxyl group, a resin in which the carboxyl group or the hydroxyl group is protected by the protective agent, which is useful for use in the production of a chemically amplified resist composition, a pharmaceutical intermediate, and a paint. , A photosensitive resin composition containing the resin, a pattern forming material using the photosensitive resin composition, a photosensitive film, a cured film, and a method for producing a cured relief pattern using the photosensitive resin composition, The present invention relates to a cured relief pattern obtained thereby and a semiconductor device provided with the cured relief pattern.
 ヘミアセタールエステル化合物ないしはアセタール化合物は、熱、酸触媒等により、アルキルビニルエーテルに由来する基が容易に脱離するため、カルボキシル基又はヒドロキシル基が保護された化合物ないしは樹脂として、化学増幅型レジスト組成物、医薬品の合成中間体、塗料などの製造用途に有用である。
 ヘミアセタールエステル化合物ないしはアセタール化合物は、通常、アルキルビニルエーテル又はアルキルビニルエーテルにハロゲン化水素を付加させたハロゲン化アルキルエーテルを保護剤として使用し、カルボキシル基又はヒドロキシル基を有する化合物等と反応させることにより製造される。
The hemiacetal ester compound or acetal compound is a chemically amplified resist composition as a compound or resin in which a carboxyl group or a hydroxyl group is protected because a group derived from an alkyl vinyl ether is easily eliminated by heat, an acid catalyst or the like. It is useful for the production of pharmaceutical intermediates and paints.
A hemiacetal ester compound or an acetal compound is usually produced by reacting with alkyl vinyl ether or alkyl vinyl ether added with hydrogen halide as a protective agent and reacting with a compound having a carboxyl group or hydroxyl group. Is done.
 しかしながら、アルキルビニルエーテルやハロゲン化アルキルエーテルは極めて不安定で重合しやすい。例えば、エチルビニルエーテルとハロゲン化水素が反応して生成した1-クロロエチルエチルエーテルを、カルボキシル基又はヒドロキシル基を有する重合体等と反応させた場合、1-クロロエチルエチルエーテル由来の重合体が副生するという問題等があった。 However, alkyl vinyl ethers and halogenated alkyl ethers are extremely unstable and easily polymerized. For example, when 1-chloroethyl ethyl ether produced by the reaction of ethyl vinyl ether and hydrogen halide is reacted with a polymer having a carboxyl group or a hydroxyl group, a polymer derived from 1-chloroethyl ethyl ether is a subsidiary. There was a problem of being born.
 これらの問題を解決するため、アルキルビニルエーテルに代わり下記一般式で表されるアルケニルエーテル又はハロゲン化アルキルエーテルをカルボキシル基やヒドロキシル基の保護剤として用いる方法が知られている(例えば、特許文献1、2参照)。 In order to solve these problems, a method using an alkenyl ether represented by the following general formula or a halogenated alkyl ether as a protective agent for a carboxyl group or a hydroxyl group instead of the alkyl vinyl ether is known (for example, Patent Document 1, 2).
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000014
(式中、R、R及びRは、同一又は異なって、置換もしくは非置換のアルキル、置換もしくは非置換のアリール又は置換もしくは非置換のアラルキルを表すか、RとRが、隣接する炭素原子と一緒になってシクロアルキルを形成し、Xは、ハロゲン原子を表す。) (Wherein R a , R b and R c are the same or different and each represents substituted or unsubstituted alkyl, substituted or unsubstituted aryl or substituted or unsubstituted aralkyl, or R a and R b are Together with adjacent carbon atoms form a cycloalkyl, X represents a halogen atom.)
 しかしながら、上記記載の保護剤の保存安定性は不十分であり、特許文献1、2に記載の製造方法ではR、Rがともにアルキル基である保護剤しか合成できない等の問題がある。
 また、上記保護剤によってカルボキシル基又はヒドロキシル基が保護された化合物ないしは樹脂の保存安定性も不十分であり、該カルボキシル基又はヒドロキシル基が保護された化合物ないしは樹脂を含有する感光性樹脂組成物は感度、プロファイルなどのリソグラフィー性能に種々の問題が存在し、実用上満足されるものではない。
However, the storage stability of the protective agent described above is insufficient, and the production methods described in Patent Documents 1 and 2 have problems that only a protective agent in which both R a and R b are alkyl groups can be synthesized.
Further, the storage stability of the compound or resin in which the carboxyl group or hydroxyl group is protected by the protective agent is insufficient, and the photosensitive resin composition containing the compound or resin in which the carboxyl group or hydroxyl group is protected is There are various problems in lithography performance such as sensitivity and profile, which are not satisfied in practice.
国際公開第2007/126050号公報International Publication No. 2007/126050 日本国特開2008-26673号公報Japanese Laid-Open Patent Publication No. 2008-26673
 本発明の目的は、保存安定性に優れるカルボキシル基又はヒドロキシル基の保護剤、該保護剤によりカルボキシル基又はヒドロキシル基が保護され、保存安定性に優れる樹脂、解像性及び感度に優れる前記保護された樹脂を含有する感光性樹脂組成物、該感光性樹脂組成物を用いたパターン形成材料、感光性膜、及び硬化膜、並びに該感光性樹脂組成物を用いた硬化レリーフパターンの製造方法、それにより得られた硬化レリーフパターン及び該硬化レリーフパターンを具備する半導体装置を提供することにある。 The object of the present invention is to protect the carboxyl group or hydroxyl group having excellent storage stability, the carboxyl group or hydroxyl group being protected by the protective agent, the resin having excellent storage stability, and the above-described protected product having excellent resolution and sensitivity. Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, Another object of the present invention is to provide a cured relief pattern obtained by the above and a semiconductor device having the cured relief pattern.
 本発明は、下記の構成であり、これにより本発明の上記課題が解決される。
〔1〕
 下記一般式(I)で表される化合物であるヒドロキシル基又はカルボキシル基の保護剤。
The present invention has the following configuration, which solves the above-described problems of the present invention.
[1]
A protective agent for a hydroxyl group or a carboxyl group, which is a compound represented by the following general formula (I).
Figure JPOXMLDOC01-appb-C000015
Figure JPOXMLDOC01-appb-C000015
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基、又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。Xは前記ヒドロキシル基又はカルボキシル基の作用により脱離し得る基を表す。)
〔2〕
 前記一般式(I)で表される化合物中のR及びRの少なくとも1つがアリール基である〔1〕に記載のヒドロキシル基又はカルボキシル基の保護剤。
〔3〕
 〔1〕又は〔2〕に記載の保護剤と、ヒドロキシル基又はカルボキシル基を有する化合物とを反応させることにより、下記一般式(III)で表される基を有する化合物を製造する方法。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group, or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring. X represents a group capable of leaving by the action of the hydroxyl group or carboxyl group. )
[2]
The hydroxyl group or carboxyl group protecting agent according to [1], wherein at least one of R 1 and R 2 in the compound represented by the general formula (I) is an aryl group.
[3]
A method for producing a compound having a group represented by the following general formula (III) by reacting the protective agent according to [1] or [2] with a compound having a hydroxyl group or a carboxyl group.
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000016
(上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 *は前記ヒドロキシル基又はカルボキシル基を有する化合物の前記基から-OHを除いた残基との結合部位を表す。)
〔4〕
 ポリヒドロキシスチレン樹脂、ノボラック樹脂、ポリアクリル酸樹脂、ポリメタクリル酸樹脂、ポリイミド前駆体としてのポリアミック酸及びポリベンゾオキサゾール前駆体としてのポリヒドロキシアミドからなる群より選ばれる樹脂であって、前記樹脂中のヒドロキシル基又はカルボキシル基の全て又は一部が、下記一般式(III)で表される基で置換された樹脂。
(In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
* Represents a binding site with a residue obtained by removing -OH from the group of the compound having a hydroxyl group or a carboxyl group. )
[4]
A resin selected from the group consisting of a polyhydroxystyrene resin, a novolac resin, a polyacrylic acid resin, a polymethacrylic acid resin, a polyamic acid as a polyimide precursor, and a polyhydroxyamide as a polybenzoxazole precursor, A resin in which all or a part of the hydroxyl group or carboxyl group is substituted with a group represented by the following general formula (III).
Figure JPOXMLDOC01-appb-C000017
Figure JPOXMLDOC01-appb-C000017
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は上記樹脂のヒドロキシル基又はカルボキシル基から-OHを除いた残基との結合部位を表す。)
〔5〕
 下記一般式(V)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるポリヒドロキシスチレン樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシスチレン樹脂。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing —OH from the hydroxyl group or carboxyl group of the resin. )
[5]
All or part of the hydroxyl groups of the polyhydroxystyrene resin having a repeating unit represented by the following general formula (V) and having a weight average molecular weight of 1,000 to 100,000 are groups represented by the following general formula (III) Polyhydroxystyrene resin substituted with
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000018
(上記一般式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、kは0~4の整数を表す。) (In the above general formula, R 4 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, and k represents an integer of 0 to 4)
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000019
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は前記一般式(V)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
〔6〕
 下記一般式(VI)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるノボラック樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたノボラック樹脂。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (V). )
[6]
All or part of the hydroxyl groups of the novolak resin having a repeating unit represented by the following general formula (VI) and having a weight average molecular weight of 1,000 to 100,000 is substituted with a group represented by the following general formula (III) Novolac resin.
Figure JPOXMLDOC01-appb-C000020
Figure JPOXMLDOC01-appb-C000020
(上記一般式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、mは0~3の整数を表し、R及びRは、各々独立に、水素原子、アルキル基、アリール基又はアラルキル基を表す。) (In the above general formula, R 5 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, m represents an integer of 0 to 3, and R 6 and R 7 each independently represents Represents a hydrogen atom, an alkyl group, an aryl group or an aralkyl group.)
Figure JPOXMLDOC01-appb-C000021
Figure JPOXMLDOC01-appb-C000021
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は前記一般式(VI)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
〔7〕
 下記一般式(VII)で表される繰り返し単位を有し、重量平均分子量が1000~100000である重合体のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアクリル酸樹脂ないしはポリメタクリル酸樹脂。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (VI). )
[7]
All or part of the carboxyl groups of the polymer having a repeating unit represented by the following general formula (VII) and having a weight average molecular weight of 1,000 to 100,000 are substituted with a group represented by the following general formula (IV) Polyacrylic acid resin or polymethacrylic acid resin.
Figure JPOXMLDOC01-appb-C000022
Figure JPOXMLDOC01-appb-C000022
(上記一般式中、Rは、水素原子又はアルキル基を表す。) (In the above general formula, R 8 represents a hydrogen atom or an alkyl group.)
Figure JPOXMLDOC01-appb-C000023
Figure JPOXMLDOC01-appb-C000023
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は一般式(VII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
〔8〕
 下記一般式(VIII)で表される繰り返し単位を有するポリアミック酸のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアミック酸。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing the carboxyl group from the repeating unit represented by the general formula (VII). )
[8]
The polyamic acid by which all or one part of the carboxyl group of the polyamic acid which has a repeating unit represented by the following general formula (VIII) was substituted by the group represented by the following general formula (IV).
Figure JPOXMLDOC01-appb-C000024
Figure JPOXMLDOC01-appb-C000024
(式中、Rは4価の有機基を表し、R10は2価の有機基を表す。) (In the formula, R 9 represents a tetravalent organic group, and R 10 represents a divalent organic group.)
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000025
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は前記一般式(VIII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
〔9〕
 下記一般式(IX)で表される繰り返し単位を有するポリヒドロキシアミドのヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシアミド。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing a carboxyl group from the repeating unit represented by the general formula (VIII). )
[9]
A polyhydroxyamide in which all or part of hydroxyl groups of a polyhydroxyamide having a repeating unit represented by the following general formula (IX) is substituted with a group represented by the following general formula (III).
Figure JPOXMLDOC01-appb-C000026
Figure JPOXMLDOC01-appb-C000026
(式中、R11は4価の有機基を表し、R12は2価の有機基を表す。) (In the formula, R 11 represents a tetravalent organic group, and R 12 represents a divalent organic group.)
Figure JPOXMLDOC01-appb-C000027
Figure JPOXMLDOC01-appb-C000027
(上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
 *は前記一般式(IX)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
〔10〕
(a)〔4〕~〔9〕のいずれか1項に記載の樹脂、及び(b)活性光線又は放射線の照射により酸を発生する化合物を含有する感光性樹脂組成物。
〔11〕
 ポジ型現像用である、〔10〕に記載の感光性樹脂組成物。
〔12〕
 〔10〕又は〔11〕に記載の感光性樹脂組成物であるパターン形成材料。
〔13〕
 〔10〕又は〔11〕に記載の感光性樹脂組成物により形成される感光性膜。
〔14〕
 〔10〕又は〔11〕に記載の感光性樹脂組成物を加熱処理して得られる硬化膜。
〔15〕
 (ア)〔13〕に記載の感光性膜を基板上に形成する工程、
 (イ)該感光性膜を活性光線又は放射線で露光する工程、
 (ウ)該感光性膜の露光された部分を水性アルカリ現像液で除去するように現像する工程、及び
 (エ)得られたレリーフパターンを加熱処理する工程を有する硬化レリーフパターンの製造方法。
〔16〕
 〔15〕に記載の製造方法により得られた硬化レリーフパターン。
〔17〕
 〔16〕に記載の硬化レリーフパターンを具備する半導体装置。
(In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
* Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (IX). )
[10]
(A) A photosensitive resin composition comprising the resin according to any one of [4] to [9], and (b) a compound that generates an acid upon irradiation with actinic rays or radiation.
[11]
The photosensitive resin composition according to [10], which is for positive development.
[12]
The pattern formation material which is the photosensitive resin composition as described in [10] or [11].
[13]
[10] A photosensitive film formed by the photosensitive resin composition according to [11].
[14]
A cured film obtained by heat-treating the photosensitive resin composition according to [10] or [11].
[15]
(A) forming the photosensitive film according to [13] on a substrate;
(A) a step of exposing the photosensitive film with actinic rays or radiation;
(C) A process for developing the photosensitive film so as to remove the exposed portion with an aqueous alkaline developer, and (d) a method for producing a cured relief pattern comprising a step of heat-treating the obtained relief pattern.
[16]
A cured relief pattern obtained by the production method according to [15].
[17]
[16] A semiconductor device comprising the cured relief pattern according to [16].
 本発明によれば、保存安定性に優れるカルボキシル基又はヒドロキシル基の保護剤、該保護剤によりカルボキシル基又はヒドロキシル基が保護され、保存安定性に優れる樹脂、解像性及び感度に優れる前記保護された樹脂を含有する感光性樹脂組成物、該感光性樹脂組成物を用いたパターン形成材料、感光性膜、及び硬化膜、並びに該感光性樹脂組成物を用いた硬化レリーフパターンの製造方法、それにより得られた硬化レリーフパターン及び該硬化レリーフパターンを具備する半導体装置を提供することができる。 According to the present invention, a carboxyl group or hydroxyl group protecting agent having excellent storage stability, the carboxyl group or hydroxyl group being protected by the protecting agent, a resin having excellent storage stability, and the above-described protected product having excellent resolution and sensitivity. Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, The cured relief pattern obtained by the above and a semiconductor device comprising the cured relief pattern can be provided.
 本明細書に於ける基(原子団)の表記に於いて、置換及び無置換を記していない表記は、置換基を有さないものと共に置換基を有するものをも包含するものである。例えば、「アルキル基」とは、置換基を有さないアルキル基(無置換アルキル基)のみならず、置換基を有するアルキル基(置換アルキル基)をも包含するものである。
 本明細書中における「活性光線」又は「放射線」とは、例えば、水銀灯の輝線スペクトル、エキシマレーザーに代表される遠紫外線、極紫外線(EUV光)、X線、電子線(EB)等を意味する。また、本発明において光とは、活性光線又は放射線を意味する。
 また、本明細書中における「露光」とは、特に断らない限り、水銀灯、エキシマレーザーに代表される遠紫外線、極紫外線、X線、EUV光などによる露光のみならず、電子線、イオンビーム等の粒子線による描画も露光に含める。
In the description of the group (atomic group) in this specification, the notation which does not describe substitution and non-substitution includes the thing which has a substituent with the thing which does not have a substituent. For example, the “alkyl group” includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group).
In the present specification, “active light” or “radiation” means, for example, the emission line spectrum of a mercury lamp, far ultraviolet rays represented by excimer laser, extreme ultraviolet rays (EUV light), X-rays, electron beams (EB), etc. To do. In the present invention, light means actinic rays or radiation.
In addition, “exposure” in the present specification is not limited to exposure to far ultraviolet rays, extreme ultraviolet rays, X-rays, EUV light and the like represented by mercury lamps and excimer lasers, but also electron beams, ion beams, and the like, unless otherwise specified. The exposure with the particle beam is also included in the exposure.
<一般式(I)で表される化合物であるヒドロキシル基又はカルボキシル基の保護剤>
 本発明のヒドロキシル基又はカルボキシル基の保護剤(以下、単に「本発明の保護剤」ともいう)は、下記一般式(I)で表される化合物である。
<Protecting agent for hydroxyl group or carboxyl group, which is a compound represented by formula (I)>
The hydroxyl group or carboxyl group protecting agent of the present invention (hereinafter also simply referred to as “protecting agent of the present invention”) is a compound represented by the following general formula (I).
Figure JPOXMLDOC01-appb-C000028
Figure JPOXMLDOC01-appb-C000028
 上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基(アルカノイル基)、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アルカノイル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
 R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。Xは前記ヒドロキシル基又はカルボキシル基の作用により脱離し得る基を表す。
 前記一般式(I)で表される化合物は、煩雑な操作を要することなく、ヒドロキシル基を有する化合物のヒドロキシル基又はカルボキシル基を有する化合物のカルボキシル基と反応し、下記一般式(III)で表される基を有する化合物を生成することができる。
In the above general formula, R 1 and R 2 are each independently an alkyl group, cycloalkyl group, aryl group, aralkyl group, alkoxy group, aryloxy group, acyl group (alkanoyl group), alkoxycarbonyl group, aryloxycarbonyl Represents a group, a cyano group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an alkanoyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom. .
R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring. X represents a group capable of leaving by the action of the hydroxyl group or carboxyl group.
The compound represented by the general formula (I) reacts with a hydroxyl group of a compound having a hydroxyl group or a carboxyl group of a compound having a carboxyl group without requiring a complicated operation, and is represented by the following general formula (III). A compound having a group can be produced.
Figure JPOXMLDOC01-appb-C000029
Figure JPOXMLDOC01-appb-C000029
(式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 *はヒドロキシル基又はカルボキシル基を有する化合物の前記基から-OHを除いた残基との結合部位を表す。)
 また、前記一般式(I)で表される化合物に由来する部分構造は、煩雑な操作を要することなく、前記一般式(III)で表される基を有する化合物から脱離し、ヒドロキシル基又はカルボキシル基を再生することができる。
 したがって、前記一般式(I)で表される化合物はヒドロキシル基又はカルボキシル基の保護剤として機能する。
(In the formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group, alkoxy A group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
* Represents a binding site with a residue obtained by removing —OH from the above group of a compound having a hydroxyl group or a carboxyl group. )
In addition, the partial structure derived from the compound represented by the general formula (I) can be eliminated from the compound having the group represented by the general formula (III) without requiring a complicated operation, and a hydroxyl group or a carboxyl group. The group can be regenerated.
Therefore, the compound represented by the general formula (I) functions as a hydroxyl group or carboxyl group protective agent.
 本発明において、R及びRについてのアリール基、アルコキシ基、アリールオキシ基、アルカノイル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子は電子求引性基であることから、R及びRの少なくとも1つが、アリール基、アルコキシ基、アリールオキシ基、アルカノイル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子であることにより前記一般式(I)で表される化合物の分解反応を抑制し、前記一般式(I)で表される化合物の保存安定性を向上させることができる。
 同様に、前記一般式(III)において、R及びRの少なくとも1つが、アリール基、アルコキシ基、アリールオキシ基、アルカノイル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子であることにより、前記一般式(III)で表される基を有する化合物、すなわち、前記保護剤によりカルボキシル基又はヒドロキシル基が保護された樹脂ないしは化合物(以下、単に「保護体」ということもある)の分解反応を抑制し、保存安定性を向上させることができる。
In the present invention, the aryl group, alkoxy group, aryloxy group, alkanoyl group, alkoxycarbonyl group, aryloxycarbonyl group, cyano group or halogen atom for R 1 and R 2 is an electron withdrawing group. At least one of 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an alkanoyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom, and is represented by the general formula (I) The decomposition reaction of the compound can be suppressed, and the storage stability of the compound represented by the general formula (I) can be improved.
Similarly, in the general formula (III), at least one of R 1 and R 2 is an aryl group, alkoxy group, aryloxy group, alkanoyl group, alkoxycarbonyl group, aryloxycarbonyl group, cyano group or halogen atom. Thus, the compound having the group represented by the general formula (III), that is, a resin or compound in which a carboxyl group or a hydroxyl group is protected by the protective agent (hereinafter sometimes simply referred to as “protector”). Decomposition reaction can be suppressed and storage stability can be improved.
 以下、前記一般式(I)又は(III)における各基について説明する。
 R、R及びRについてのアルキル基としては、置換基を有していてもよく、好ましくは炭素数1~20の直鎖、又は分岐アルキル基であり、アルキル鎖中に酸素原子、硫黄原子、窒素原子を有していてもよい。具体的には、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ペンチル基、n-ヘキシル基、n-オクチル基、n-ドデシル基、n-テトラデシル基、n-オクタデシル基などの直鎖アルキル基、イソプロピル基、イソブチル基、t-ブチル基、ネオペンチル基、2-エチルヘキシル基などの分岐アルキル基を挙げることができる。
 R、R及びRについてのシクロアルキル基としては、置換基を有していてもよく、好ましくは炭素数3~20のシクロアルキル基であり、多環でもよく、環内に酸素原子を有していてもよい。具体的には、シクロプロピル基、シクロペンチル基、シクロヘキシル基、ノルボルニル基、アダマンチル基などが挙げられる。
 R、R及びRについてのアリール基としては、置換基を有していてもよく、好ましくは炭素数6~14のアリール基であり、例えば、フェニル基、ナフチル基、アントリル基などが挙げられる。
 R、R及びRについてのアラルキル基としては、置換基を有していてもよく、好ましくは炭素数7~20のアラルキル基が挙げられ、例えば、ベンジル基、フェネチル基、ナフチルメチル基、ナフチルエチル基が挙げられる。
 R及びRについてのアルコキシ基としては、置換基を有していてもよく、好ましくは炭素数1~20のアルコキシ基であり、例えば、メトキシ基、エトキシ基、プロポキシ基、n-ブトキシ基、ペンチルオキシ基、ヘキシルオキシ基、ヘプチルオキシ基などが挙げられる。
 R及びRについてのアリールオキシ基としては、置換基を有していてもよく、好ましくは炭素数6~14のアリールオキシ基であり、例えば、フェノキシ基、ナフトキシ基、アントリルオキシ基などが挙げられる。
 R及びRについてのアシル基(アルカノイル基)としては、置換基を有していてもよく、好ましくは炭素数2~7の直鎖、又は分岐アルカノイル基であり、例えば、アセチル基、プロピオニル基、ブチリル基、イソブチリル基、バレリル基、イソバレリル基、ピバロイル基、ヘキサノイル基、ヘプタノイル基などが挙げられる。
 R及びRについてのアルコキシカルボニル基としては、置換基を有していてもよく、例えば、アルコキシ部分として、前記アルコキシ基で例示したものと同様のものが挙げられる。
 R及びRについてのアリールオキシカルボニル基としては、置換基を有していてもよく、例えば、アリールオキシ部分として、前記アリールオキシ基で例示したものと同様のものが挙げられる。
 R及びRについてのハロゲン原子としては、フッ素、塩素、臭素、ヨウ素が挙げられ、好ましくは塩素原子である。
 R、Rが互いに結合して形成する環としては、置換基を有していてもよく、好ましくは炭素数3~8であり、飽和又は不飽和のものであってもよい。具体的には、シクロプロパン環、シクロブタン環、シクロペンタン環、シクロヘキサン環、シクロヘプタン環、シクロオクタン環、シクロペンテン環、1,3-シクロペンタジエン環、シクロヘキセン環、シクロヘキサジエン環などが挙げられる。
 R又はRがRと結合して形成する環としては、置換基を有していてもよく、好ましくは炭素数5~8であり、具体的には、オキソラン環、オキサン環、オキセパン環、オキソカン環などが挙げられる。
 上記の各基が有し得る置換基としては、例えば、シアノ基、ハロゲン原子、水酸基、アルコキシ基、アリールオキシ基、アルカノイル基、カルボキシル基、アルコキシカルボニル基、アリールオキシカルボニル基などが挙げられる。
 Xとしての前記ヒドロキシル基又はカルボキシル基の作用により脱離し得る基は、例えば、塩素原子、臭素原子、ヨウ素原子などのハロゲン原子、トシラート基、メシラート基、フルオロスルホナート基、トリフルオロメタンスルホナート基、ノナフルオロブタンスルホナート基などのスルホナート基などが挙げられ、ハロゲン原子であることが好ましく、なかでも塩素原子であることがより好ましい。
 パターン形成時の解像性及び感度の向上の観点から、R及びRの少なくとも1つはアリール基であることが好ましく、R及びRの少なくとも1つがフェニル基であることがより好ましい。
 Rは下記一般式(X)で表される基であることが好ましい。
Hereinafter, each group in the general formula (I) or (III) will be described.
The alkyl group for R 1 , R 2 and R 3 may have a substituent and is preferably a linear or branched alkyl group having 1 to 20 carbon atoms, and an oxygen atom in the alkyl chain, You may have a sulfur atom and a nitrogen atom. Specifically, methyl group, ethyl group, n-propyl group, n-butyl group, n-pentyl group, n-hexyl group, n-octyl group, n-dodecyl group, n-tetradecyl group, n-octadecyl group And a branched alkyl group such as a linear alkyl group such as isopropyl group, isobutyl group, t-butyl group, neopentyl group, and 2-ethylhexyl group.
The cycloalkyl group for R 1 , R 2 and R 3 may have a substituent, preferably a cycloalkyl group having 3 to 20 carbon atoms, may be polycyclic, and has an oxygen atom in the ring. You may have. Specific examples include a cyclopropyl group, a cyclopentyl group, a cyclohexyl group, a norbornyl group, and an adamantyl group.
The aryl group for R 1 , R 2 and R 3 may have a substituent and is preferably an aryl group having 6 to 14 carbon atoms, such as a phenyl group, a naphthyl group and an anthryl group. Can be mentioned.
The aralkyl group for R 1 , R 2 and R 3 may have a substituent, preferably an aralkyl group having 7 to 20 carbon atoms, such as a benzyl group, a phenethyl group, a naphthylmethyl group. And naphthylethyl group.
The alkoxy group for R 1 and R 2 may have a substituent and is preferably an alkoxy group having 1 to 20 carbon atoms, such as a methoxy group, an ethoxy group, a propoxy group, an n-butoxy group. , Pentyloxy group, hexyloxy group, heptyloxy group and the like.
The aryloxy group for R 1 and R 2 may have a substituent and is preferably an aryloxy group having 6 to 14 carbon atoms, such as a phenoxy group, a naphthoxy group, an anthryloxy group, etc. Is mentioned.
The acyl group (alkanoyl group) for R 1 and R 2 may have a substituent, and is preferably a linear or branched alkanoyl group having 2 to 7 carbon atoms, such as an acetyl group or propionyl group. Group, butyryl group, isobutyryl group, valeryl group, isovaleryl group, pivaloyl group, hexanoyl group, heptanoyl group and the like.
As an alkoxycarbonyl group about R < 1 > and R < 2 >, you may have a substituent, For example, the thing similar to what was illustrated by the said alkoxy group as an alkoxy part is mentioned.
The aryloxycarbonyl group for R 1 and R 2 may have a substituent, and examples of the aryloxy moiety include those similar to those exemplified for the aryloxy group.
Examples of the halogen atom for R 1 and R 2 include fluorine, chlorine, bromine and iodine, preferably a chlorine atom.
The ring formed by combining R 1 and R 2 with each other may have a substituent, preferably has 3 to 8 carbon atoms, and may be saturated or unsaturated. Specific examples include a cyclopropane ring, a cyclobutane ring, a cyclopentane ring, a cyclohexane ring, a cycloheptane ring, a cyclooctane ring, a cyclopentene ring, a 1,3-cyclopentadiene ring, a cyclohexene ring, and a cyclohexadiene ring.
The ring formed by combining R 1 or R 2 with R 3 may have a substituent, preferably has 5 to 8 carbon atoms, and specifically includes an oxolane ring, an oxane ring, an oxepane. Ring, oxocan ring and the like.
Examples of the substituent that each of the above groups may have include a cyano group, a halogen atom, a hydroxyl group, an alkoxy group, an aryloxy group, an alkanoyl group, a carboxyl group, an alkoxycarbonyl group, and an aryloxycarbonyl group.
The group capable of leaving by the action of the hydroxyl group or carboxyl group as X is, for example, a halogen atom such as chlorine atom, bromine atom, iodine atom, tosylate group, mesylate group, fluorosulfonate group, trifluoromethanesulfonate group, Examples thereof include a sulfonate group such as a nonafluorobutane sulfonate group, preferably a halogen atom, and more preferably a chlorine atom.
From the viewpoint of improvement in the resolution and sensitivity during pattern formation, it is preferable that at least one of R 1 and R 2 is an aryl group, and more preferably at least one of R 1 and R 2 is a phenyl group .
R 3 is preferably a group represented by the following general formula (X).
Figure JPOXMLDOC01-appb-C000030
Figure JPOXMLDOC01-appb-C000030
 Lは、アルキレン基又はシクロアルキレン基を表し、Lは、単結合又は2価の連結基を表し、R13は、アルキル基、ヘテロ原子を含んでいてもよい脂環基、又はヘテロ原子を含んでいてもよい芳香環基を表す。
 Lについてのアルキレン基としては、炭素数1~8のアルキレン基が好ましく、メチレン基、エチレン基、プロピレン基、ブチレン基、ヘキシレン基、オクチレン基などが挙げられる。Lについてのシクロアルキレン基としては、炭素数3~15のシクロアルキレン基が好ましく、シクロペンチレン基、シクロヘキシレン基などが挙げられる。
 Lとしての2価の連結基は、例えば、アルキレン基(好ましくは炭素数1~8のアルキレン基、例えば、メチレン基、エチレン基、プロピレン基、ブチレン基、ヘキシレン基又はオクチレン基)、シクロアルキレン基(好ましくは炭素数3~15のシクロアルキレン基、例えば、シクロペンチレン基又はシクロヘキシレン基)、-S-、-O-、-CO-、-CS-、-SO-、-N(R)-、又はこれらの2種以上の組み合わせであり、総炭素数が20以下のものが好ましい。ここで、Rは、水素原子又はアルキル基(例えば炭素数1~8のアルキル基であって、具体的には、メチル基、エチル基、プロピル基、n-ブチル基、sec-ブチル基、ヘキシル基及びオクチル基等)である。
 Lは、単結合、アルキレン基、又はアルキレン基と-O-、-CO-、-CS-及び-N(R)-の少なくとも一つとの組み合わせからなる2価の連結基が好ましく、単結合、アルキレン基、又はアルキレン基と-O-との組み合わせからなる2価の連結基がより好ましい。ここで、Rは上述のRと同義である。
 R13としてのアルキル基は、例えば、上述したアルキル基と同様である。
 R13としての脂環基及び芳香環基としては、例えば、上述したシクロアルキル基及びアリール基が挙げられる。その炭素数は、好ましくは、3~18である。なお、本発明においては、複数の芳香環が単結合を介して連結されてなる基(例えば、ビフェニル基、ターフェニル基)もR13としての芳香族基に含まれる。
 ヘテロ原子を含む脂環基及びヘテロ原子を含む芳香環基としては、例えば、チイラン、シクロチオラン、チオフェン、フラン、ピロール、ベンゾチオフェン、ベンゾフラン、ベンゾピロール、トリアジン、イミダゾール、ベンゾイミダゾール、トリアゾール、チアジアゾール、チアゾール及びピロリドンが挙げられる。
 R13としての脂環基及び芳香環基は、置換基を有していてもよく、例えば、アルキル基、シクロアルキル基、シアノ基、ハロゲン原子、水酸基、アルコキシ基、アリールオキシ基、アルカノイル基、カルボキシル基、アルコキシカルボニル、アリールオキシカルボニル基が挙げられる。
L 1 represents an alkylene group or a cycloalkylene group, L 2 represents a single bond or a divalent linking group, and R 13 represents an alkyl group, an alicyclic group which may contain a hetero atom, or a hetero atom. Represents an aromatic ring group which may contain
The alkylene group for L 1 is preferably an alkylene group having 1 to 8 carbon atoms, and examples thereof include a methylene group, an ethylene group, a propylene group, a butylene group, a hexylene group, and an octylene group. The cycloalkylene group for L 1 is preferably a cycloalkylene group having 3 to 15 carbon atoms, and examples thereof include a cyclopentylene group and a cyclohexylene group.
The divalent linking group as L 2 is, for example, an alkylene group (preferably an alkylene group having 1 to 8 carbon atoms such as a methylene group, an ethylene group, a propylene group, a butylene group, a hexylene group or an octylene group), a cycloalkylene A group (preferably a cycloalkylene group having 3 to 15 carbon atoms, such as a cyclopentylene group or a cyclohexylene group), —S—, —O—, —CO—, —CS—, —SO 2 —, —N ( R 0 ) —, or a combination of two or more thereof, and those having a total carbon number of 20 or less are preferred. Here, R 0 is a hydrogen atom or an alkyl group (eg, an alkyl group having 1 to 8 carbon atoms, specifically, a methyl group, an ethyl group, a propyl group, an n-butyl group, a sec-butyl group, Hexyl group and octyl group).
L 2 is preferably a single bond, an alkylene group, or a divalent linking group comprising a combination of an alkylene group and at least one of —O—, —CO—, —CS— and —N (R 0 ) —. A divalent linking group comprising a bond, an alkylene group, or a combination of an alkylene group and —O— is more preferable. Here, R 0 has the same meaning as R 0 described above.
The alkyl group as R 13 is the same as the alkyl group described above, for example.
Examples of the alicyclic group and aromatic ring group as R 13 include the cycloalkyl group and aryl group described above. The number of carbon atoms is preferably 3-18. In the present invention, a group in which a plurality of aromatic rings are linked via a single bond (for example, a biphenyl group or a terphenyl group) is also included in the aromatic group as R 13 .
Examples of the alicyclic group containing a hetero atom and the aromatic ring group containing a hetero atom include, for example, thiirane, cyclothiolane, thiophene, furan, pyrrole, benzothiophene, benzofuran, benzopyrrole, triazine, imidazole, benzimidazole, triazole, thiadiazole, thiazole. And pyrrolidone.
The alicyclic group and aromatic ring group as R 13 may have a substituent, for example, an alkyl group, a cycloalkyl group, a cyano group, a halogen atom, a hydroxyl group, an alkoxy group, an aryloxy group, an alkanoyl group, Examples thereof include a carboxyl group, an alkoxycarbonyl group, and an aryloxycarbonyl group.
 以下に、前記一般式(I)で表される化合物の具体例を示すが、本発明はこれらに限定されるものではない。 Specific examples of the compound represented by the general formula (I) are shown below, but the present invention is not limited thereto.
Figure JPOXMLDOC01-appb-C000031
Figure JPOXMLDOC01-appb-C000031
 一般式(I)で表される化合物は、公知の方法[例えば、日本化学会編「新実験化学講座(第14巻)有機化合物の合成と反応(I)」、590-591頁、丸善株式会社(昭和60年1月20日)等]により合成し、入手することができる。これにより、前述の特許文献1及び2に記載の製造方法では製造が困難な一般式(I)で表される化合物を製造することができる。 The compound represented by the general formula (I) can be obtained by a known method [for example, “New Experimental Chemistry Course (Vol. 14) Synthesis and Reaction of Organic Compounds (I)” edited by The Chemical Society of Japan, pages 590-591, Maruzen Co., Ltd. Company (January 20, 1985) etc.] can be synthesized and obtained. Thereby, the compound represented by the general formula (I), which is difficult to produce by the production methods described in Patent Documents 1 and 2 described above, can be produced.
 <本発明の保護剤と反応し保護され得るヒドロキシル基を有する化合物、及び本発明の保護剤によりヒドロキシル基が保護された化合物(樹脂)>
 本発明の保護剤と反応し保護され得るヒドロキシル基を有する化合物としては、例えば、アルコール、フェノール類等が挙げられる。
 アルコールとしては、例えば、メタノール、エタノール、プロパノール、イソプロピルアルコール、n-ブタノール、イソブタノール、sec-ブチルアルコール、ペンタノール、ヘキサノール、ヘプタノール、オクタノール、ノナノール、デカノール、ベンジルアルコール等のモノアルコール、エチレングリコール、1,3-プロピレングリコール、1,2-プロピレングリコール、1,4-ブタンジオール、1,3-ブタンジオール、1,5-ペンタンジオール、3-メチル-1,5-ペンタンジオール、1,6-ヘキサンジオール、1,8-オクタンジオール、2,4-ジエチル-1,5-ペンタンジオール、2-ブチル-2-エチル-1,3-プロパンジオール、2,2-ジエチル-1,3-プロパンジオール、ドデカンジオール、ネオペンチルグリコール、トリメチロールプロパン、ペンタエリスリトール、ジペンタエリスリトール、グリセリン等の多価アルコールが挙げられる。
 フェノール類としては、フェノール、レゾルシノール、ハイドロキノン、ピロカテコール、ビスフェノールA、ジヒドロキシジフェニルメタン(ビスフェノールF)、ビスフェノールS、テトラブロモビスフェノールA、1,3-ビス(4-ヒドロキシフェニル)シクロヘキサン、4,4’-ジヒドロキシ-3,3’-ジメチルジフェニルメタン、4,4’-ジヒドロキシベンゾフェノン、トリス(4-ヒドロキシフェニル)メタン、ビス(4-ヒドロキシフェニル)エーテル、ノボラックフェノール、ノボラッククレゾール、ビス(3,5-ジメチル-4-ヒドロキシフェニル)スルホン、ビス(4-ヒドロキシフェニル)スルホン、ヒドロキシスチレン等の低分子フェノール化合物、ノボラック樹脂、ポリヒドロキシスチレン樹脂、ヒドロキシスチレンをこれと共重合可能な他の単量体と共重合させた共重合体、ポリベンゾオキサゾール前駆体として用いられるポリヒドロキシアミド、フェノール性水酸基を有するポリ(メタ)アクリレート等のヒドロキシル基を有する樹脂ないしは重合体等が挙げられる。
 ヒドロキシスチレンをこれと共重合可能な他の単量体と共重合させた共重合体におけるヒドロキシスチレンの割合は、特に限定されないが、好ましくは、0.2~90モル%、より好ましくは0.2~60モル%である。
 ヒドロキシスチレンと共重合可能な他の単量体としては、例えば、カルボキシル基を有する重合性不飽和単量体又はこれと共重合可能な他の単量体等が挙げられる。カルボキシル基を有する重合性不飽和単量体としては、例えば、(メタ)アクリル酸、2-ヒドロキシメチル-2-プロペン酸、マレイン酸、イタコン酸、無水マレイン酸、無水イタコン酸等の不飽和カルボン酸又はその酸無水物が挙げられる。
 カルボキシル基を有する重合性不飽和単量体と共重合可能な他の単量体としては、例えば、メチル(メタ)アクリレート、エチル(メタ)アクリレート、プロピル(メタ)アクリレート、ブチル(メタ)アクリレート、イソブチル(メタ)アクリレート、tert-ブチル(メタ)アクリレート、2-エチルヘキシル(メタ)アクリレート、ラウリル(メタ)アクリレート、ステアリル(メタ)アクリレート等の炭素数1-18のアルコールと(メタ)アクリル酸を原料として得られるアルキル(メタ)アクリレート類、シクロヘキシル(メタ)アクリレート、ベンジル(メタ)アクリレート、イソボルニル(メタ)アクリレート、アダマンチル(メタ)アクリレート等の(メタ)アクリレート類、2-ヒドロキシエチル(メタ)アクリレート、2-ヒドロキシプロピル(メタ)アクリレート、モノグリセロール(メタ)アクリレート等のヒドロキシアルキル(メタ)アクリレート類、エチレングリコールジ(メタ)アクリレート、ブタンジオールジ(メタ)アクリレート等のグリコールジ(メタ)アクリレート類、(メタ)アクリルアミド、(メタ)アクリロニトリル、ジアセトン(メタ)アクリルアミド、ジメチルアミノエチル(メタ)アクリレート等の窒素含有単量体、トリフルオロエチル(メタ)アクリレート、ペンタフルオロプロピル(メタ)アクリレート、パーフルオロシクロヘキシル(メタ)アクリレート等のフッ素含有ビニル系単量体、アリルグリシジルエーテル、(メタ)アクリル酸グリシジル等のエポキシ基を有する単量体、スチレン、α-メチルスチレン、p-メチルスチレン、ジメチルスチレン、ジビニルベンゼン等のスチレン系単量体、ビニルメチルエーテル、ビニルエチルエーテル、ビニルイソブチルエーテル等のビニルエーテル類、フマル酸、マレイン酸、無水マレイン酸等の多塩基性不飽和カルボン酸又はそれらの一価もしくは多価アルコールのエステル、アリルアルコール、アリルアルコールエステル、塩化ビニル、塩化ビニリデン、トリメチロールプロパントリ(メタ)アクリレート、酢酸ビニル、プロピオン酸ビニル等が挙げられる。これらの単量体は、それぞれ単独で用いてもよく、2種以上組み合わせて使用することもできる。
 ポリヒドロキシスチレン樹脂、又はヒドロキシスチレンをこれと共重合可能な他の単量体と共重合させた共重合体としては、下記一般式(XI)で表される繰り返し単位を有していることが好ましい。
<Compound having a hydroxyl group that can be protected by reacting with the protective agent of the present invention, and a compound (resin) in which the hydroxyl group is protected by the protective agent of the present invention>
Examples of the compound having a hydroxyl group that can be protected by reacting with the protective agent of the present invention include alcohols and phenols.
Examples of the alcohol include methanol, ethanol, propanol, isopropyl alcohol, n-butanol, isobutanol, sec-butyl alcohol, pentanol, hexanol, heptanol, octanol, nonanol, decanol, benzyl alcohol and other monoalcohols, ethylene glycol, 1,3-propylene glycol, 1,2-propylene glycol, 1,4-butanediol, 1,3-butanediol, 1,5-pentanediol, 3-methyl-1,5-pentanediol, 1,6- Hexanediol, 1,8-octanediol, 2,4-diethyl-1,5-pentanediol, 2-butyl-2-ethyl-1,3-propanediol, 2,2-diethyl-1,3-propanediol , Dodecanediol, O neopentyl glycol, trimethylol propane, pentaerythritol, dipentaerythritol, and a polyhydric alcohol such as glycerin.
Phenols include phenol, resorcinol, hydroquinone, pyrocatechol, bisphenol A, dihydroxydiphenylmethane (bisphenol F), bisphenol S, tetrabromobisphenol A, 1,3-bis (4-hydroxyphenyl) cyclohexane, 4,4'- Dihydroxy-3,3′-dimethyldiphenylmethane, 4,4′-dihydroxybenzophenone, tris (4-hydroxyphenyl) methane, bis (4-hydroxyphenyl) ether, novolac phenol, novolac cresol, bis (3,5-dimethyl- 4-hydroxyphenyl) sulfone, bis (4-hydroxyphenyl) sulfone, low molecular phenol compounds such as hydroxystyrene, novolac resin, polyhydroxystyrene resin, hydroxy It has a hydroxyl group such as a copolymer obtained by copolymerizing styrene with another monomer copolymerizable with styrene, a polyhydroxyamide used as a polybenzoxazole precursor, or a poly (meth) acrylate having a phenolic hydroxyl group. Examples thereof include resins and polymers.
The proportion of hydroxystyrene in the copolymer obtained by copolymerizing hydroxystyrene with another monomer copolymerizable therewith is not particularly limited, but is preferably 0.2 to 90 mol%, more preferably 0.8. 2 to 60 mol%.
Examples of the other monomer copolymerizable with hydroxystyrene include a polymerizable unsaturated monomer having a carboxyl group or another monomer copolymerizable therewith. Examples of the polymerizable unsaturated monomer having a carboxyl group include unsaturated carboxylic acids such as (meth) acrylic acid, 2-hydroxymethyl-2-propenoic acid, maleic acid, itaconic acid, maleic anhydride, and itaconic anhydride. An acid or its acid anhydride is mentioned.
Examples of other monomers copolymerizable with a polymerizable unsaturated monomer having a carboxyl group include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, Raw material is C1-C18 alcohol such as isobutyl (meth) acrylate, tert-butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, lauryl (meth) acrylate, stearyl (meth) acrylate, and (meth) acrylic acid Alkyl (meth) acrylates, cyclohexyl (meth) acrylate, benzyl (meth) acrylate, isobornyl (meth) acrylate, adamantyl (meth) acrylate and other (meth) acrylates, 2-hydroxyethyl (meth) acrylate , Hydroxyalkyl (meth) acrylates such as 2-hydroxypropyl (meth) acrylate and monoglycerol (meth) acrylate, glycol di (meth) acrylates such as ethylene glycol di (meth) acrylate and butanediol di (meth) acrylate , (Meth) acrylamide, (meth) acrylonitrile, diacetone (meth) acrylamide, nitrogen-containing monomers such as dimethylaminoethyl (meth) acrylate, trifluoroethyl (meth) acrylate, pentafluoropropyl (meth) acrylate, perfluoro Fluorine-containing vinyl monomers such as cyclohexyl (meth) acrylate, allyl glycidyl ether, monomers having an epoxy group such as glycidyl (meth) acrylate, styrene, α-methylstyrene, p -Styrene monomers such as methylstyrene, dimethylstyrene and divinylbenzene, vinyl ethers such as vinyl methyl ether, vinyl ethyl ether and vinyl isobutyl ether, polybasic unsaturated carboxylic acids such as fumaric acid, maleic acid and maleic anhydride Examples include acids or esters of mono- or polyhydric alcohols thereof, allyl alcohol, allyl alcohol esters, vinyl chloride, vinylidene chloride, trimethylolpropane tri (meth) acrylate, vinyl acetate, vinyl propionate, and the like. These monomers may be used alone or in combination of two or more.
The polyhydroxystyrene resin or a copolymer obtained by copolymerizing hydroxystyrene with another monomer copolymerizable therewith may have a repeating unit represented by the following general formula (XI). preferable.
Figure JPOXMLDOC01-appb-C000032
Figure JPOXMLDOC01-appb-C000032
 上記一般式(XI)において、R14は水素原子又はメチル基を表し、Arはアリーレン基を表す。
 R14は水素原子であることがより好ましい。
 Arにより表されるアリーレン基は、置換基を有していてもよい。これらのアリーレン基は、炭素数6~18の、置換基を有していてもよいアリーレン基であることが好ましく、置換基を有していてもよいフェニレン基又はナフチレン基がより好ましく、置換基を有していてもよいフェニレン基が最も好ましい。またこれらが有していてもよい置換基としては、例えば、アルキル基、ハロゲン原子、水酸基、アルコキシ基、カルボキシル基、アルコキシカルボニル基が挙げられる。
 一般式(XI)で表される繰り返し単位の具体例を示すが、本発明はこれに限定されるものではない。
In the above general formula (XI), R 14 represents a hydrogen atom or a methyl group, and Ar represents an arylene group.
R 14 is more preferably a hydrogen atom.
The arylene group represented by Ar may have a substituent. These arylene groups are preferably an arylene group having 6 to 18 carbon atoms which may have a substituent, more preferably a phenylene group or a naphthylene group which may have a substituent. Most preferred are phenylene groups which may have Moreover, as a substituent which these may have, an alkyl group, a halogen atom, a hydroxyl group, an alkoxy group, a carboxyl group, and an alkoxycarbonyl group are mentioned, for example.
Although the specific example of the repeating unit represented by general formula (XI) is shown, this invention is not limited to this.
Figure JPOXMLDOC01-appb-C000033
Figure JPOXMLDOC01-appb-C000033
 ポリヒドロキシスチレン樹脂としては、下記一般式(V)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるポリヒドロキシスチレン樹脂であることが好ましく、本発明の保護剤によりヒドロキシル基が保護されたポリヒドロキシスチレン樹脂としては、前記ポリヒドロキシスチレン樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシスチレン樹脂であることが好ましい。 The polyhydroxystyrene resin is preferably a polyhydroxystyrene resin having a repeating unit represented by the following general formula (V) and having a weight average molecular weight of 1,000 to 100,000. The polyhydroxystyrene resin in which is protected is preferably a polyhydroxystyrene resin in which all or part of the hydroxyl groups of the polyhydroxystyrene resin are substituted with groups represented by the following general formula (III): .
Figure JPOXMLDOC01-appb-C000034
Figure JPOXMLDOC01-appb-C000034
(式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、kは0~4の整数を表す。)
 Rについてのハロゲン原子の具体例、好ましい例としては、前記一般式(I)におけるR及びRについてのハロゲン原子として前述した具体例、好ましい例と同様のものが挙げられる。
 Rについてのアルコキシ基、アルキル基、アリール基、アラルキル基の具体例、好ましい例としても、前記一般式(I)におけるR、R及びRについてのアルコキシ基、アルキル基、アリール基、アラルキル基として前述した具体例、好ましい例と同様のものが挙げられる。
(Wherein R 4 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, and k represents an integer of 0 to 4)
Specific examples and preferred examples of the halogen atom for R 4 include those similar to the specific examples and preferred examples described above as the halogen atoms for R 1 and R 2 in formula (I).
Specific examples and preferred examples of an alkoxy group, an alkyl group, an aryl group, and an aralkyl group for R 4 include an alkoxy group, an alkyl group, an aryl group for R 1 , R 2, and R 3 in the general formula (I), Examples of the aralkyl group are the same as the specific examples and preferred examples described above.
Figure JPOXMLDOC01-appb-C000035
Figure JPOXMLDOC01-appb-C000035
(上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。*は前記一般式(V)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。) (In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom, wherein * is a residue obtained by removing a hydroxyl group from the repeating unit represented by the general formula (V) Represents the binding site.
 ノボラック樹脂は、その多くは市販品として入手可能であるが、例えば、m-クレゾール、p-クレゾール、2,3-キシレノール、2,4-キシレノール、2,5-キシレノール、2,6-キシレノール、3,4-キシレノール、3,5-キシレノール、2,3,4-トリメチルフェノール、2,3,5-トリメチルフェノール、3,4,5-トリメチルフェノール等のフェノール類と、例えば、ホルムアルデヒド、ベンズアルデヒド、フルフラル、アセトアルデヒド等のアルデヒド類とを酸性触媒(例えば、塩酸、硫酸、硝酸、リン酸等の無機酸、p-トルエンスルホン酸等の有機酸等)の存在下、重縮合して製造してもよい。前記のフェノール類及びアルデヒド類はそれぞれ単独で又は2種以上組み合わせて用いることができる。
 ノボラック樹脂としては、下記一般式(VI)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるノボラック樹脂であることが好ましく、本発明の保護剤によりヒドロキシル基が保護されたノボラック樹脂としては、前記ノボラック樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシスチレン樹脂であることが好ましい。
Many of the novolak resins are available as commercial products. For example, m-cresol, p-cresol, 2,3-xylenol, 2,4-xylenol, 2,5-xylenol, 2,6-xylenol, Phenols such as 3,4-xylenol, 3,5-xylenol, 2,3,4-trimethylphenol, 2,3,5-trimethylphenol, 3,4,5-trimethylphenol and the like, for example, formaldehyde, benzaldehyde, It can also be produced by polycondensation with aldehydes such as furfural and acetaldehyde in the presence of an acidic catalyst (for example, an inorganic acid such as hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, an organic acid such as p-toluenesulfonic acid). Good. The above phenols and aldehydes can be used alone or in combination of two or more.
The novolak resin is preferably a novolak resin having a repeating unit represented by the following general formula (VI) and having a weight average molecular weight of 1,000 to 100,000, and the hydroxyl group is protected by the protective agent of the present invention. The novolak resin is preferably a polyhydroxystyrene resin in which all or part of the hydroxyl groups of the novolak resin is substituted with a group represented by the following general formula (III).
Figure JPOXMLDOC01-appb-C000036
Figure JPOXMLDOC01-appb-C000036
(式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、mは0~3の整数を表し、R及びRは、各々独立に、水素原子、アルキル基、アリール基又はアラルキル基を表す。)
 Rについてのハロゲン原子の具体例、好ましい例としては、前記一般式(I)におけるR及びRについてのハロゲン原子として前述した具体例、好ましい例と同様のものが挙げられる。
 Rについてのアルコキシ基の具体例、好ましい例としては、前記一般式(I)におけるR、R及びRについてのアルコキシ基として前述した具体例、好ましい例と同様のものが挙げられる。
 R、R及びRについてのアルキル基、アリール基、アラルキル基の具体例、好ましい例としても、前記一般式(I)におけるR、R及びRについてのアルコキシ基、アルキル基、アリール基、アラルキル基として前述した具体例、好ましい例と同様のものが挙げられる。
(Wherein R 5 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, m represents an integer of 0 to 3, and R 6 and R 7 each independently represents hydrogen Represents an atom, an alkyl group, an aryl group or an aralkyl group.)
Specific examples and preferred examples of the halogen atom for R 5 include those similar to the specific examples and preferred examples described above as the halogen atoms for R 1 and R 2 in formula (I).
Specific examples and preferred examples of the alkoxy group for R 5 include those similar to the specific examples and preferred examples described above as the alkoxy groups for R 1 , R 2 and R 3 in the general formula (I).
Specific examples and preferred examples of the alkyl group, aryl group and aralkyl group for R 5 , R 6 and R 7 include an alkoxy group, an alkyl group for R 1 , R 2 and R 3 in the general formula (I), Examples of the aryl group and aralkyl group are the same as the specific examples and preferred examples described above.
Figure JPOXMLDOC01-appb-C000037
Figure JPOXMLDOC01-appb-C000037
(上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
 *は前記一般式(VI)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
(In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
* Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (VI). )
 ポリヒドロキシアミドはポリベンゾオキサゾール前駆体として機能し用いることができる。前記ポリヒドロキシアミドとしては、下記一般式(IX)で表される繰り返し単位を有するポリヒドロキシアミドであることが好ましい。本発明の保護剤によりヒドロキシル基が保護されたポリヒドロキシアミドとしては、下記一般式(IX)で表される繰り返し単位を有するポリヒドロキシアミドのヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシアミドであることが好ましい。 Polyhydroxyamide functions and can be used as a polybenzoxazole precursor. The polyhydroxyamide is preferably a polyhydroxyamide having a repeating unit represented by the following general formula (IX). Examples of the polyhydroxyamide whose hydroxyl group is protected by the protecting agent of the present invention include all or part of the hydroxyl groups of the polyhydroxyamide having a repeating unit represented by the following general formula (IX). The polyhydroxyamide substituted with a group represented by
Figure JPOXMLDOC01-appb-C000038
Figure JPOXMLDOC01-appb-C000038
(上記一般式中、R11は4価の有機基を表し、R12は2価の有機基を表す。) (In the above general formula, R 11 represents a tetravalent organic group, and R 12 represents a divalent organic group.)
Figure JPOXMLDOC01-appb-C000039
Figure JPOXMLDOC01-appb-C000039
(上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。*は前記一般式(IX)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
 前記一般式(IX)中、R11は芳香環を含む4価の有機基であることが好ましく、2つのアミノ基及び2つの水酸基は、それぞれ、直接、芳香環に結合されて、2つの水酸基がフェノール性水酸基となっていることがより好ましく、具体的には、ヒドロキシジアミンの2つの水酸基及び2つのアミノ基を除いた残基であることが好ましい。さらに、耐熱性を持たせるために、R11は、1以上の芳香環を有するビスアミノフェノールを原料として形成されることが好ましい。
 ビスアミノフェノールとしては、例えば、3,3´-ジアミノ-4,4´-ジヒドロキシビフェニル、3,3´-ジアミノ-4,4´-ジヒドロキシビフェニル、4,4´-ジアミノ-3,3´-ジヒドロキシビフェニル、ビス(3-アミノ-4-ヒドロキシフェニル)プロパン、2,2-ビス(4-アミノ-3-ヒドロキシフェニル)プロパン、2,2-ビス(3-アミノ-4-ヒドロキシフェニル)スルホン、ビス(4-アミノ-3-ヒドロキシフェニル)スルホン、2,2-ビス(3-アミノ-4-ヒドロキシフェニル)ヘキサフルオロプロパン、2,2-ビス(4-アミノ―3-ヒドロキシフェニル)ヘキサフルオロプロパン、4,6-ジアミノレゾルシノール、4,5-ジアミノレゾルシノールなどが挙げられ、これらは、単独で又は2種以上を組み合わせて用いることができる。
 R11として特に好ましくは、下記から選ばれる4価の基が挙げられる。
(In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom, wherein * is a residue obtained by removing a hydroxyl group from the repeating unit represented by the general formula (IX) Represents the binding site.
In the general formula (IX), R 11 is preferably a tetravalent organic group containing an aromatic ring, and the two amino groups and the two hydroxyl groups are bonded directly to the aromatic ring, respectively. Is more preferably a phenolic hydroxyl group, specifically, a residue obtained by removing two hydroxyl groups and two amino groups of hydroxydiamine. Furthermore, in order to provide heat resistance, R 11 is preferably formed from bisaminophenol having one or more aromatic rings as a raw material.
Examples of the bisaminophenol include 3,3′-diamino-4,4′-dihydroxybiphenyl, 3,3′-diamino-4,4′-dihydroxybiphenyl, 4,4′-diamino-3,3′- Dihydroxybiphenyl, bis (3-amino-4-hydroxyphenyl) propane, 2,2-bis (4-amino-3-hydroxyphenyl) propane, 2,2-bis (3-amino-4-hydroxyphenyl) sulfone, Bis (4-amino-3-hydroxyphenyl) sulfone, 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane, 2,2-bis (4-amino-3-hydroxyphenyl) hexafluoropropane 4,6-diaminoresorcinol, 4,5-diaminoresorcinol, etc., which may be used alone or It can be used in combination of more than seeds.
R 11 is particularly preferably a tetravalent group selected from the following.
Figure JPOXMLDOC01-appb-C000040
Figure JPOXMLDOC01-appb-C000040
 上記式中、Xは-O-、-S-、-C(CF-、-CH-、-SO-、-NHCO-を表す。*は前記一般式(IX)中のR11に結合する-NH-、又は-OHとの結合位置を表す。また、上記構造において、R11に結合する-NH-と-OHとは互いにオルト位(隣接位)に結合する。
 前記一般式(IX)中、R12は2価の有機基であれば特に限定されないが、ポリオキサゾールに耐熱性を持たせるために、1つ以上の芳香環基を含むことが好ましい。具体的には、ベンゼン環、ナフタレン環などの芳香環を1つ以上含むものが挙げられる。さらには、ポリオキサゾールに剛直性を持たせるために、R12の2個の結合部位は、芳香環上に直接存在することが好ましい。この場合、2個の結合部位は、同一の芳香環上に存在していてもよいが、複数の芳香環を有する場合には異なる芳香環上に存在していてもよい。また、R12が複数の芳香環を含む基である場合、これらの複数の芳香環は、単結合、エーテル結合、メチレン結合、エチレン結合、2,2-プロピレン結合、2,2-ヘキサフルオロプロピレン結合、スルホン結合、スルホキシド結合、チオエーテル結合及びカルボニル結合から選択される1又は2の結合を介して互いに結合することが、加熱処理後に形成されるポリオキサゾール樹脂の耐熱性及び機械特性の向上の点から好ましい。
 前記一般式(IX)で表される構造単位を有する樹脂は、例えば、高分子学会編 新高分子実験学3 高分子の合成・反応(2) P177-P183(1996)に示されているように、例えば、ジカルボン酸をハロゲン化したジカルボン酸ジハライドとジヒドロキシジアミンとを反応させて得ることができる。
 ジカルボン酸としては、例えば、イソフタル酸、テレフタル酸、2,2-ビス(4-カルボキシフェニル)ヘキサプロパン、4,4´-ビフェニルジカルボン酸、4,4´-ジカルボキシフェニルエーテル、ビス(4-カルボキシフェニル)スルホン、2,2-ビス(4-カルボキシフェニル)プロパン、5-tert-ブチルイソフタル酸、5-フルオロイソフタル酸、2,6-ナフタレンジカルボン酸などの芳香族系ジカルボン酸、1,2-シクロブタンジカルボン酸、1,4-シクロブタンジカルボン酸、1,3-シクロペンタンジカルボン酸、シュウ酸、マロン酸、コハク酸などの脂肪族系ジカルボン酸などが挙げられ、これらは、単独又は2種以上を組み合わせて用いることができる。
In the above formula, X 1 represents —O—, —S—, —C (CF 3 ) 2 —, —CH 2 —, —SO 2 —, —NHCO—. * Represents a bonding position with —NH— or —OH bonded to R 11 in the general formula (IX). In the above structure, —NH— and —OH bonded to R 11 are bonded to each other in the ortho position (adjacent position).
In the general formula (IX), R 12 is not particularly limited as long as it is a divalent organic group, but preferably contains one or more aromatic ring groups in order to impart heat resistance to polyoxazole. Specific examples include those containing one or more aromatic rings such as a benzene ring and a naphthalene ring. Furthermore, in order to give the polyoxazole rigid, it is preferable that the two bonding sites of R 12 are directly present on the aromatic ring. In this case, the two bonding sites may be present on the same aromatic ring, but may be present on different aromatic rings when having a plurality of aromatic rings. When R 12 is a group containing a plurality of aromatic rings, the plurality of aromatic rings are a single bond, ether bond, methylene bond, ethylene bond, 2,2-propylene bond, 2,2-hexafluoropropylene. Bonding to each other through one or two bonds selected from a bond, a sulfone bond, a sulfoxide bond, a thioether bond and a carbonyl bond improves the heat resistance and mechanical properties of the polyoxazole resin formed after the heat treatment. To preferred.
The resin having the structural unit represented by the general formula (IX) is, for example, as shown in Polymer Science Society, New Polymer Experiments 3 Polymer Synthesis and Reaction (2) P177-P183 (1996). For example, it can be obtained by reacting dicarboxylic acid dihalide obtained by halogenating dicarboxylic acid and dihydroxydiamine.
Examples of the dicarboxylic acid include isophthalic acid, terephthalic acid, 2,2-bis (4-carboxyphenyl) hexapropane, 4,4′-biphenyldicarboxylic acid, 4,4′-dicarboxyphenyl ether, bis (4- Carboxyphenyl) sulfone, 2,2-bis (4-carboxyphenyl) propane, 5-tert-butylisophthalic acid, 5-fluoroisophthalic acid, aromatic dicarboxylic acid such as 2,6-naphthalenedicarboxylic acid, 1,2 -Aliphatic dicarboxylic acids such as cyclobutanedicarboxylic acid, 1,4-cyclobutanedicarboxylic acid, 1,3-cyclopentanedicarboxylic acid, oxalic acid, malonic acid, succinic acid, etc., and these may be used alone or in combination of two or more Can be used in combination.
 フェノール性水酸基を有するポリ(メタ)アクリレートとしては、下記一般式(XII)で表される繰り返し単位を有していることが好ましい。 The poly (meth) acrylate having a phenolic hydroxyl group preferably has a repeating unit represented by the following general formula (XII).
Figure JPOXMLDOC01-appb-C000041
Figure JPOXMLDOC01-appb-C000041
 一般式(XII)において、R15は水素原子又はメチル基を表し、Lは単結合又はアルキレン基を表し、Arはアリーレン基を表す。
 R15はメチル基であることがより好ましい。
 Arにより表されるアリーレン基は、置換基を有していてもよい。これらのアリーレン基は、炭素数6~18の、置換基を有していてもよいアリーレン基であることが好ましく、置換基を有していてもよいフェニレン基又はナフチレン基がより好ましく、置換基を有していてもよいフェニレン基が最も好ましい。またこれらが有していてもよい置換基としては、例えば、アルキル基、ハロゲン原子、水酸基、アルコキシ基、カルボキシル基、アルコキシカルボニル基が挙げられる。
 一般式(XII)で表される繰り返し単位の具体例を示すが、本発明はこれに限定されるものではない。
In the general formula (XII), R 15 represents a hydrogen atom or a methyl group, L 2 represents a single bond or an alkylene group, and Ar represents an arylene group.
R 15 is more preferably a methyl group.
The arylene group represented by Ar may have a substituent. These arylene groups are preferably an arylene group having 6 to 18 carbon atoms which may have a substituent, more preferably a phenylene group or a naphthylene group which may have a substituent. Most preferred are phenylene groups which may have Moreover, as a substituent which these may have, an alkyl group, a halogen atom, a hydroxyl group, an alkoxy group, a carboxyl group, and an alkoxycarbonyl group are mentioned, for example.
Specific examples of the repeating unit represented by the general formula (XII) are shown below, but the present invention is not limited thereto.
Figure JPOXMLDOC01-appb-C000042
Figure JPOXMLDOC01-appb-C000042
 また、ヒドロキシル基を有する樹脂ないし重合体としては、市販の樹脂を用いることもできる。
 ヒドロキシル基を有する重合体の重量平均分子量は、1,000~200,000であることが好ましく、1,000~100,000であることがより好ましく、1,000~50,000であることが更に好ましい。
 ヒドロキシル基を有する樹脂ないし重合体は、精製して固体として用いることもできる。また、製造の際に溶媒を使用した場合には、溶液として用いることもできる。
A commercially available resin can also be used as the hydroxyl group-containing resin or polymer.
The weight average molecular weight of the polymer having a hydroxyl group is preferably 1,000 to 200,000, more preferably 1,000 to 100,000, and 1,000 to 50,000. Further preferred.
The resin or polymer having a hydroxyl group can be purified and used as a solid. Moreover, when a solvent is used in the production, it can be used as a solution.
 <本発明の保護剤と反応し保護され得るカルボキシル基を有する化合物、及び本発明の保護剤によりカルボキシル基が保護された化合物(樹脂)>
 本発明の保護剤と反応し保護され得るカルボキシル基を有する化合物としては、例えば、ギ酸、酢酸、プロピオン酸、プロピオール酸、酪酸、イソ酪酸、ヘキサン酸、ヘプタン酸、オクチル酸、ノナン酸、イソノナン酸、デカン酸、ドデカン酸、ステアリン酸、安息香酸、桂皮酸、2-ナフトエ酸、ニコチン酸、イソニコチン酸、アミニ油脂肪酸、トール油脂肪酸、大豆油脂肪酸、脱水ヒマシ油脂肪酸等のモノカルボン酸、コハク酸、グルタル酸、アジピン酸、アゼライン酸、セバシン酸、ドデカンジ酸、デカメチレンジカルボキシル基を有する化合物、フタル酸、マレイン酸、トリメリット酸、ピロメリット酸、テトラヒドロフタル酸、ヘキサヒドロフタル酸、メチルヘキサヒドロフタル酸等の多価カルボン酸、乳酸、クエン酸、ヒドロキシピバリン酸、12-ヒドロキシステアリン酸、リンゴ酸等のヒドロキシカルボン酸、アクリル酸、メタクリル酸、イタコン酸、メサコン酸、マレイン酸、フマル酸等のカルボキシル基を有するα,β-不飽和単量体、ポリ(メタ)アクリル樹脂等のカルボキシル基を有する重合性不飽和単量体の単独重合体又はカルボキシル基を有する重合性不飽和単量体とこれと共重合可能な他の単量体との共重合体、カルボキシル基を有するポリエステル、アルキッド樹脂、ウレタン樹脂、エポキシ樹脂、カルボキシル基変性エポキシ樹脂、ポリイミド前駆体のポリアミック酸等のカルボキシル基を含有する重合体等が挙げられ、中でも、カルボキシル基を含有する重合性不飽和単量体の単独重合体、カルボキシル基を含有する重合性不飽和単量体とこれと共重合可能な他の単量体との共重合体、又はポリイミド前駆体として用いられるポリアミック酸が好ましい。
 カルボキシル基を含有する重合性不飽和単量体及びこれと共重合可能な他の単量体としては、例えば、<本発明の保護剤と反応し保護され得るヒドロキシル基を有する化合物、及び本発明の保護剤によりヒドロキシル基が保護された化合物(樹脂)>の項において前述したものと同様のものが挙げられる。これらの単量体は、それぞれ単独で用いてもよく、2種以上組み合わせて使用することもできる。
 カルボキシル基を含有する重合性不飽和単量体の重合及びカルボキシル基を含有する重合性不飽和単量体とこれと共重合可能な他の単量体との共重合は、公知の方法により行うことができる。
<Compound having a carboxyl group that can be protected by reacting with the protective agent of the present invention, and a compound (resin) in which the carboxyl group is protected by the protective agent of the present invention>
Examples of the compound having a carboxyl group that can be protected by reacting with the protective agent of the present invention include formic acid, acetic acid, propionic acid, propiolic acid, butyric acid, isobutyric acid, hexanoic acid, heptanoic acid, octylic acid, nonanoic acid, and isononanoic acid. Monocarboxylic acids such as decanoic acid, dodecanoic acid, stearic acid, benzoic acid, cinnamic acid, 2-naphthoic acid, nicotinic acid, isonicotinic acid, amin oil fatty acid, tall oil fatty acid, soybean oil fatty acid, dehydrated castor oil fatty acid, Succinic acid, glutaric acid, adipic acid, azelaic acid, sebacic acid, dodecanediic acid, compound having decamethylene dicarboxyl group, phthalic acid, maleic acid, trimellitic acid, pyromellitic acid, tetrahydrophthalic acid, hexahydrophthalic acid, Polyvalent carboxylic acids such as methyl hexahydrophthalic acid, lactic acid, citric acid, hydroxy Α, β-unsaturated monomers having a carboxyl group such as pivalic acid, hydroxycarboxylic acid such as 12-hydroxystearic acid, malic acid, acrylic acid, methacrylic acid, itaconic acid, mesaconic acid, maleic acid, fumaric acid, A homopolymer of a polymerizable unsaturated monomer having a carboxyl group such as a poly (meth) acrylic resin or a copolymer of a polymerizable unsaturated monomer having a carboxyl group and another monomer copolymerizable therewith. Polymers, polyesters having carboxyl groups, alkyd resins, urethane resins, epoxy resins, carboxyl group-modified epoxy resins, polymers containing carboxyl groups such as polyamic acids of polyimide precursors, etc., among others, containing carboxyl groups Polymerizable unsaturated monomer homopolymer, polymerizable unsaturated monomer containing carboxyl group, and Copolymers of copolymerizable other monomer, or polyamic acid used as a polyimide precursor preferable.
Examples of the polymerizable unsaturated monomer containing a carboxyl group and other monomers copolymerizable therewith include, for example, <a compound having a hydroxyl group that can be protected by reacting with the protective agent of the present invention, and the present invention. And the same as those described above in the section of compound (resin) in which the hydroxyl group is protected by the protecting agent. These monomers may be used alone or in combination of two or more.
Polymerization of a polymerizable unsaturated monomer containing a carboxyl group and copolymerization of a polymerizable unsaturated monomer containing a carboxyl group and another monomer copolymerizable therewith are carried out by known methods. be able to.
 カルボキシル基を含有する重合性不飽和単量体の単独重合体、又はカルボキシル基を含有する重合性不飽和単量体とこれと共重合可能な他の単量体との共重合体としては、下記一般式(VII)で表される繰り返し単位を有するポリアクリル酸樹脂ないしはポリメタクリル酸樹脂であることが好ましい。本発明の保護剤によりカルボキシル基が保護されたポリアクリル酸樹脂ないしはポリメタクリル酸樹脂としては、下記一般式(VII)で表される繰り返し単位を有し、重量平均分子量が1000~100000である重合体のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアクリル酸樹脂ないしはポリメタクリル酸樹脂であることが好ましい。 As a homopolymer of a polymerizable unsaturated monomer containing a carboxyl group, or a copolymer of a polymerizable unsaturated monomer containing a carboxyl group and another monomer copolymerizable therewith, A polyacrylic acid resin or polymethacrylic acid resin having a repeating unit represented by the following general formula (VII) is preferable. The polyacrylic acid resin or polymethacrylic acid resin in which the carboxyl group is protected by the protective agent of the present invention has a repeating unit represented by the following general formula (VII) and has a weight average molecular weight of 1,000 to 100,000. It is preferable that all or part of the carboxyl group of the coalescence is a polyacrylic acid resin or a polymethacrylic acid resin substituted with a group represented by the following general formula (IV).
Figure JPOXMLDOC01-appb-C000043
Figure JPOXMLDOC01-appb-C000043
(上記一般式中、Rは、水素原子又はアルキル基を表す。) (In the above general formula, R 8 represents a hydrogen atom or an alkyl group.)
Figure JPOXMLDOC01-appb-C000044
Figure JPOXMLDOC01-appb-C000044
(上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。*は一般式(VII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
 Rについてのアルキル基としては、置換基を有していてもよく、炭素数1~4のアルキル基であることが好ましく、メチル基、エチル基などが挙げられる。有し得る置換基としては、ヒドロキシル基、ハロゲン原子(フッ素原子、塩素原子など)、シアノ基などが挙げられ、ヒドロキシル基が好ましい。
(In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom, * represents a residue obtained by removing a carboxyl group from the repeating unit represented by the general formula (VII) Represents the binding site.)
The alkyl group for R 8 may have a substituent and is preferably an alkyl group having 1 to 4 carbon atoms, and examples thereof include a methyl group and an ethyl group. Examples of the substituent that can be included include a hydroxyl group, a halogen atom (such as a fluorine atom and a chlorine atom), a cyano group, and the like, and a hydroxyl group is preferable.
 ポリアミック酸はポリイミド前駆体として機能し用いることができる。ポリアミック酸を用いることで、耐熱性に優れ、加熱硬化後のアウトガスの少ない高信頼性の硬化レリーフパターンを得ることができる。前記ポリアミック酸としては、下記一般式(VIII)で表される繰り返し単位を含むポリアミック酸が好ましい。本発明の保護剤によりカルボキシル基が保護されたポリアミック酸としては、下記一般式(VIII)で表される繰り返し単位を有するポリアミック酸のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアミック酸であることが好ましい。 Polyamic acid can function and be used as a polyimide precursor. By using polyamic acid, it is possible to obtain a highly reliable cured relief pattern having excellent heat resistance and less outgassing after heat curing. As said polyamic acid, the polyamic acid containing the repeating unit represented by the following general formula (VIII) is preferable. As the polyamic acid in which the carboxyl group is protected by the protective agent of the present invention, all or part of the carboxyl group of the polyamic acid having a repeating unit represented by the following general formula (VIII) is represented by the following general formula (IV). A polyamic acid substituted with the group represented is preferable.
Figure JPOXMLDOC01-appb-C000045
Figure JPOXMLDOC01-appb-C000045
(式中、Rは4価の有機基を表し、R10は2価の有機基を表す。) (In the formula, R 9 represents a tetravalent organic group, and R 10 represents a divalent organic group.)
Figure JPOXMLDOC01-appb-C000046
Figure JPOXMLDOC01-appb-C000046
(式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。*は前記一般式(VIII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
 前記一般式(VIII)で表される繰り返し単位は、Rを核として4個のカルボキシル基を有する化合物、そのカルボン酸無水物、又は前記4個のカルボキシル基のうちの少なくとも1つが前記一般式(IV)で表される基で置換されてなる化合物に由来する酸成分と、R10を核として2個のアミノ基を有する化合物に由来するジアミン成分とから構成される。換言すると、前記一般式(VIII)中の2つのカルボニル基で挟まれた該2つのカルボニル基を含む部分構造である酸成分と、前記一般式(VIII)中の-NH-R-NH-で表される部分構造であるジアミン成分とから構成される。
 4価の有機基Rとしては、炭素数4~30であることが好ましく、単環式又は縮合多環式の脂肪族基又は芳香族基を有する4価の連結基であることがより好ましい。樹脂中に複数存在するRは互いに同一であっても異なっていてもよい。
 4価の有機基Rにおける単環式の芳香族基としては、ベンゼン環基、ピリジン環基等が挙げられる。
 4価の有機基Rにおける縮合多環式の芳香族基としては、ナフタレン環基、ペリレン環基などが挙げられる。
 4価の有機基Rにおける単環式の脂肪族基としては、シクロブタン環基、シクロペンタン環基、シクロへキサン環基などが挙げられる。
 4価の有機基Rにおける縮合多環式の脂肪族基としては、ビシクロ[2.2.1]へプタン環基、ビシクロ[2.2.2]オクタン環基、ビシクロ[2.2.2]オクト-7-エン環基などが挙げられる。
 4価の有機基Rについての単環式又は縮合多環式の脂肪族基又は芳香族基を有する4価の連結基としては、前述の単環式又は縮合多環式の脂肪族基又は芳香族基そのものであってもよいが、複数の単環式又は縮合多環式の脂肪族基又は芳香族基が単結合ないしは2価の連結基を介して連結して、Rとしての4価の連結基を形成していてもよい。
 前記2価の連結基としては、アルキレン基(炭素数1~6のアルキレン基が好ましく、例えば、メチレン基、エチレン基、プロピレン基など)、酸素原子、イオウ原子、2価のスルホン基、エステル結合、ケトン基、アミド基などが挙げられる。
 Rを核として少なくとも4個のカルボキシル基に由来する基を有する酸成分の具体例としては、ピロメリット酸無水物、3,3’,4,4’-ビフェニルテトラカルボン酸無水物、2,3,3’,4’-ビフェニルテトラカルボン酸無水物、2,2’,3,3’-ビフェニルテトラカルボン酸無水物、3,3’,4,4’-ベンゾフェノンテトラカルボン酸無水物、2,2’,3,3’-ベンゾフェノンテトラカルボン酸無水物、4,4’-(ヘキサフルオロイソプロピリデン)二フタル酸無水物、1,2,5,6-ナフタレンテトラカルボン酸無水物、2,3,6,7-ナフタレンテトラカルボン酸無水物、2,3,5,6-ピリジンテトラカルボン酸無水物、3,4,9,10-ペリレンテトラカルボン酸無水物、(トリフルオロメチル)ピロメリット酸無水物、ジ(トリフルオロメチル)ピロメリット酸無水物、ジ(ヘプタフルオロプロピル)ピロメリット酸無水物、ペンタフルオロエチルピロメリット酸無水物、ビス〔3、5-ジ(トリフルオロメチル)フェノキシ〕ピロメリット酸無水物、3,3’,4,4’-テトラカルボキシジフェニルエーテル二無水物、2,3’,3,4’-テトラカルボキシジフェニルエーテル二無水物、3,3’,4,4’-テトラカルボキシジフェニルメタン二無水物、3,3’,4,4’-テトラカルボキシジフェニルスルホン二無水物、2,2-ビス(3,4-ジカルボキシフェニル)プロパン二無水物、2,2-ビス(3,4-ジカルボキシフェニル)ヘキサフルオロプロパン二無水物、5,5’-ビス(トリフルオロメチル)-3,3’,4,4’-テトラカルボキシビフェニル二無水物、2,2’,5,5’-テトラキス(トリフルオロメチル)-3,3’,4,4’-テトラカルボキシビフェニル二無水物、5,5’-ビス(トリフルオロメチル)-3,3’,4,4’-テトラカルボキシジフェニルエーテル二無水物、5,5’-ビス(トリフルオロメチル)-3,3’,4,4’-テトラカルボキシベンゾフェノン二無水物、ビス〔(トリフルオロメチル)ジカルボキシフェノキシ〕ベンゼン二無水物、ビス(ジカルボキシフェノキシ)ビス(トリフルオロメチル)ベンゼン二無水物、ビス(ジカルボキシフェノキシ)テトラキス(トリフルオロメチル)ベンゼン二無水物、2,2-ビス〔4-(3,4-ジカルボキシフェノキシ)フェニル〕プロパン二無水物、2,2-ビス(4-(3,4-ジカルボキシフェノキシ)フェニル)ヘキサフルオロプロパン二無水物、5,5’-[p-フェニレンビス(オキシカルボニル)]ジ無水フタル酸などの芳香族テトラカルボン酸無水物に由来する成分や、
(Wherein, R 1, R 2 and R 3 are respectively synonymous with R 1, R 2 and R 3 in Formula (I), at least one of R 1 and R 2, an aryl group, an alkoxy A group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom, and * represents a residue obtained by removing the carboxyl group from the repeating unit represented by the general formula (VIII). Represents the binding site.)
The repeating unit represented by the general formula (VIII) includes a compound having four carboxyl groups with R 9 as a nucleus, a carboxylic acid anhydride thereof, or at least one of the four carboxyl groups represented by the general formula It composed of an acid component derived from a compound comprising substituted with a group represented by (IV), a diamine component derived from the R 10 in the compound having two amino groups as nucleus. In other words, an acid component which is a partial structure including the two carbonyl groups sandwiched between two carbonyl groups in the general formula (VIII), and —NH—R 2 —NH— in the general formula (VIII) It is comprised from the diamine component which is the partial structure represented by these.
The tetravalent organic group R 9 preferably has 4 to 30 carbon atoms, and more preferably a tetravalent linking group having a monocyclic or condensed polycyclic aliphatic group or aromatic group. . A plurality of R 9 present in the resin may be the same or different.
Examples of the monocyclic aromatic group in the tetravalent organic group R 9 include a benzene ring group and a pyridine ring group.
Examples of the condensed polycyclic aromatic group in the tetravalent organic group R 9 include a naphthalene ring group and a perylene ring group.
Examples of the monocyclic aliphatic group in the tetravalent organic group R 9 include a cyclobutane ring group, a cyclopentane ring group, and a cyclohexane ring group.
Examples of the condensed polycyclic aliphatic group in the tetravalent organic group R 9 include a bicyclo [2.2.1] heptane ring group, a bicyclo [2.2.2] octane ring group, and a bicyclo [2.2. 2] Oct-7-ene ring group and the like.
As the tetravalent linking group having a monocyclic or condensed polycyclic aliphatic group or aromatic group for the tetravalent organic group R 9 , the above-mentioned monocyclic or condensed polycyclic aliphatic group or The aromatic group itself may be used, but a plurality of monocyclic or condensed polycyclic aliphatic groups or aromatic groups are linked via a single bond or a divalent linking group, and 4 as R 9 A valent linking group may be formed.
The divalent linking group is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, such as a methylene group, an ethylene group, or a propylene group), an oxygen atom, a sulfur atom, a divalent sulfone group, or an ester bond. , Ketone group, amide group and the like.
Specific examples of the acid component having a group derived from at least four carboxyl groups with R 9 as a nucleus include pyromellitic acid anhydride, 3,3 ′, 4,4′-biphenyltetracarboxylic acid anhydride, 2, 3,3 ′, 4′-biphenyltetracarboxylic anhydride, 2,2 ′, 3,3′-biphenyltetracarboxylic anhydride, 3,3 ′, 4,4′-benzophenonetetracarboxylic anhydride, 2 , 2 ′, 3,3′-benzophenonetetracarboxylic acid anhydride, 4,4 ′-(hexafluoroisopropylidene) diphthalic acid anhydride, 1,2,5,6-naphthalenetetracarboxylic acid anhydride, 2, 3,6,7-naphthalenetetracarboxylic anhydride, 2,3,5,6-pyridinetetracarboxylic anhydride, 3,4,9,10-perylenetetracarboxylic anhydride, (trifluoromethyl) pyromelli Acid anhydride, di (trifluoromethyl) pyromellitic acid anhydride, di (heptafluoropropyl) pyromellitic acid anhydride, pentafluoroethylpyromellitic acid anhydride, bis [3,5-di (trifluoromethyl) phenoxy Pyromellitic anhydride, 3,3 ′, 4,4′-tetracarboxydiphenyl ether dianhydride, 2,3 ′, 3,4′-tetracarboxydiphenyl ether dianhydride, 3,3 ′, 4,4 ′ -Tetracarboxydiphenylmethane dianhydride, 3,3 ', 4,4'-tetracarboxydiphenylsulfone dianhydride, 2,2-bis (3,4-dicarboxyphenyl) propane dianhydride, 2,2-bis (3,4-Dicarboxyphenyl) hexafluoropropane dianhydride, 5,5′-bis (trifluoromethyl) -3,3 ′, 4,4′-tetracar Boxibiphenyl dianhydride, 2,2 ′, 5,5′-tetrakis (trifluoromethyl) -3,3 ′, 4,4′-tetracarboxybiphenyl dianhydride, 5,5′-bis (trifluoro Methyl) -3,3 ′, 4,4′-tetracarboxydiphenyl ether dianhydride, 5,5′-bis (trifluoromethyl) -3,3 ′, 4,4′-tetracarboxybenzophenone dianhydride, bis [(Trifluoromethyl) dicarboxyphenoxy] benzene dianhydride, bis (dicarboxyphenoxy) bis (trifluoromethyl) benzene dianhydride, bis (dicarboxyphenoxy) tetrakis (trifluoromethyl) benzene dianhydride, 2 , 2-bis [4- (3,4-dicarboxyphenoxy) phenyl] propane dianhydride, 2,2-bis (4- (3,4-dicarboxy) Components derived from aromatic tetracarboxylic anhydrides such as phenoxy) phenyl) hexafluoropropane dianhydride, 5,5 ′-[p-phenylenebis (oxycarbonyl)] diphthalic anhydride,
 シクロブタンテトラカルボン酸無水物、シクロペンタンテトラカルボン酸無水物、シクロヘキサンテトラカルボン酸無水物、1,2,4,5-シクロヘキサンテトラカルボン酸、ビシクロ[2.2.1]へプタン-2,3,5,6-テトラカルボン酸、ビシクロ[2.2.2]オクタン-2,3,5,6-テトラカルボン酸、又はビシクロ[2.2.2]オクト-7-エン-2,3,5,6-テトラカルボン酸、ビシクロ[2.2.2]オクタン-2,3,5,6-テトラカルボン酸二無水物、(1S,2S,4R,5R)‐シクロヘキサンテトラカルボン酸二無水物、(1R,2S,4S,5R)‐シクロヘキサンテトラカルボン酸二無水物などの脂肪族テトラカルボン酸無水物に由来する成分などを挙げることができる。
 好ましくは、ピロメリット酸無水物に由来する成分、3,3’,4,4’-ビフェニルテトラカルボン酸無水物に由来する成分、2,3,3’,4’-ビフェニルテトラカルボン酸無水物に由来する成分、2,2’,3,3’-ビフェニルテトラカルボン酸無水物に由来する成分、3,3’,4,4’-ベンゾフェノンテトラカルボン酸無水物に由来する成分、4,4’-(ヘキサフルオロイソプロピリデン)二フタル酸無水物に由来する成分、3,3’,4,4’-テトラカルボキシジフェニルエーテル二無水物に由来する成分、1,2,5,6-ナフタレンテトラカルボン酸無水物に由来する成分、5,5’-[p-フェニレンビス(オキシカルボニル)]ジ無水フタル酸に由来する成分、シクロブタンテトラカルボン酸無水物に由来する成分、シクロペンタンテトラカルボン酸無水物に由来する成分、ビシクロ[2.2.2]オクタン-2,3,5,6-テトラカルボン酸二無水物に由来する成分、(1S,2S,4R,5R)‐シクロヘキサンテトラカルボン酸二無水物に由来する成分、(1R,2S,4S,5R)‐シクロヘキサンテトラカルボン酸二無水物に由来する成分であり、
Cyclobutanetetracarboxylic acid anhydride, cyclopentanetetracarboxylic acid anhydride, cyclohexanetetracarboxylic acid anhydride, 1,2,4,5-cyclohexanetetracarboxylic acid, bicyclo [2.2.1] heptane-2,3, 5,6-tetracarboxylic acid, bicyclo [2.2.2] octane-2,3,5,6-tetracarboxylic acid, or bicyclo [2.2.2] oct-7-ene-2,3,5 , 6-tetracarboxylic acid, bicyclo [2.2.2] octane-2,3,5,6-tetracarboxylic dianhydride, (1S, 2S, 4R, 5R) -cyclohexanetetracarboxylic dianhydride, Examples include components derived from aliphatic tetracarboxylic anhydrides such as (1R, 2S, 4S, 5R) -cyclohexanetetracarboxylic dianhydride.
Preferably, a component derived from pyromellitic acid anhydride, a component derived from 3,3 ′, 4,4′-biphenyltetracarboxylic acid anhydride, 2,3,3 ′, 4′-biphenyltetracarboxylic acid anhydride A component derived from 2,2 ′, 3,3′-biphenyltetracarboxylic anhydride, a component derived from 3,3 ′, 4,4′-benzophenonetetracarboxylic anhydride, 4,4 Component derived from '-(hexafluoroisopropylidene) diphthalic anhydride, component derived from 3,3', 4,4'-tetracarboxydiphenyl ether dianhydride, 1,2,5,6-naphthalenetetracarboxylic A component derived from an acid anhydride, a component derived from 5,5 ′-[p-phenylenebis (oxycarbonyl)] diphthalic anhydride, a component derived from cyclobutanetetracarboxylic anhydride, Component derived from tantetracarboxylic anhydride, component derived from bicyclo [2.2.2] octane-2,3,5,6-tetracarboxylic dianhydride, (1S, 2S, 4R, 5R)- A component derived from cyclohexanetetracarboxylic dianhydride, a component derived from (1R, 2S, 4S, 5R) -cyclohexanetetracarboxylic dianhydride,
 より好ましくはピロメリット酸無水物に由来する成分、3,3’,4,4’-ビフェニルテトラカルボン酸無水物に由来する成分、4,4’-(ヘキサフルオロイソプロピリデン)二フタル酸無水物に由来する成分、シクロブタンテトラカルボン酸無水物に由来する成分、3,3’,4,4’-テトラカルボキシジフェニルエーテル二無水物に由来する成分、シクロペンタンテトラカルボン酸無水物に由来する成分、5,5’-[p-フェニレンビス(オキシカルボニル)]ジ無水フタル酸に由来する成分、(1S,2S,4R,5R)‐シクロヘキサンテトラカルボン酸二無水物に由来する成分、(1R,2S,4S,5R)‐シクロヘキサンテトラカルボン酸二無水物に由来する成分である。これらを使用することによって良好な溶剤溶解性、アルカリ溶解速度、透明性、応力特性が実現できる。
 Rを核として4個のカルボキシル基を有する化合物などに由来する酸成分の樹脂中における含有量としては、樹脂を構成する全繰り返し単位に対して20~70モル%であることが好ましく、30~60モル%であることがより好ましい。
 2価の有機基R10としては、脂環基を有する2価の基、芳香族基を有する2価の基、ケイ素原子を含有する2価の基などが挙げられる。樹脂中に複数存在するR10は互いに同一であっても異なっていてもよい。
 以下、R10が脂環基を有する2価の基のときのR10を核とするジアミン成分を、脂環ジアミン成分ということもあり、R10が芳香族基を有する2価の基のときのR10を核とするジアミン成分を、芳香族ジアミン成分ということもあり、R10がケイ素原子を含有する2価の基のときのR10を核とするジアミン成分を、シリコンジアミン成分ということもある。
 樹脂中に複数存在するジアミン成分中のR10のうち少なくとも1つは脂環基を有する2価の基であることが好ましい。樹脂が脂環基を有するジアミン成分を含有することによって良好な溶剤溶解性、アルカリ溶解速度、透明性、感度が実現できる。
 R10が有し得る脂環基としては、炭素数3~20の2価の脂環基が好ましく、シクロペンチレン基、シクロヘキシレン基などの単環のシクロアルキレン基、ビシクロ[2.2.1]ヘプチレン基、ノルボルニレン基、テトラシクロデカニレン基、テトラシクロドデカニレン基、アダマンチレン基などの多環のシクロアルキレン基などを挙げることができる。
 R10についての脂環基を有する2価の基としては、前記脂環基そのものであってもよいが、複数の脂環基がアルキレン基(炭素数1~6のアルキレン基が好ましく、例えば、メチレン基、エチレン基、プロピレン基など)で連結して、Rとしての脂環基を有する2価の基を形成していてもよく、ジアミン成分中のアミノ基と脂環基とがアルキレン基で連結していてもよい。
More preferably a component derived from pyromellitic anhydride, a component derived from 3,3 ′, 4,4′-biphenyltetracarboxylic anhydride, 4,4 ′-(hexafluoroisopropylidene) diphthalic anhydride A component derived from cyclobutanetetracarboxylic anhydride, a component derived from 3,3 ′, 4,4′-tetracarboxydiphenyl ether dianhydride, a component derived from cyclopentanetetracarboxylic anhydride, 5 , 5 ′-[p-phenylenebis (oxycarbonyl)] diphthalic anhydride component, (1S, 2S, 4R, 5R) -cyclohexanetetracarboxylic dianhydride component, (1R, 2S, It is a component derived from 4S, 5R) -cyclohexanetetracarboxylic dianhydride. By using these, good solvent solubility, alkali dissolution rate, transparency, and stress characteristics can be realized.
The content of the acid component derived from the compound having four carboxyl groups with R 9 as the nucleus in the resin is preferably 20 to 70 mol% with respect to all repeating units constituting the resin. More preferably, it is ˜60 mol%.
Examples of the divalent organic group R 10 include a divalent group having an alicyclic group, a divalent group having an aromatic group, and a divalent group containing a silicon atom. A plurality of R 10 present in the resin may be the same as or different from each other.
Hereinafter, the diamine component of the R 10 to the core when the divalent group having a R 10 is an alicyclic group, sometimes called alicyclic diamine component, when R 10 is a divalent group having an aromatic group the diamine component of the R 10 and nuclei, sometimes called the aromatic diamine component, the diamine component of the R 10 to the core when the divalent group R 10 contains a silicon atom, that silicon diamine There is also.
It is preferable that at least one of R 10 in the diamine component present in plural in the resin is a divalent group having an alicyclic group. When the resin contains a diamine component having an alicyclic group, good solvent solubility, alkali dissolution rate, transparency, and sensitivity can be realized.
The alicyclic group that R 10 may have is preferably a divalent alicyclic group having 3 to 20 carbon atoms, such as a monocyclic cycloalkylene group such as a cyclopentylene group or a cyclohexylene group, or bicyclo [2.2. 1] Polycyclic cycloalkylene groups such as a heptylene group, norbornylene group, tetracyclodecanylene group, tetracyclododecanylene group, adamantylene group, and the like can be given.
The divalent group having an alicyclic group for R 10 may be the alicyclic group itself, but a plurality of alicyclic groups is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, for example, Methylene group, ethylene group, propylene group, etc.) may be linked to form a divalent group having an alicyclic group as R 2 , and the amino group and alicyclic group in the diamine component are alkylene groups. You may connect with.
 脂環基を有する2価の基を構成し得る前記脂環基、アルキレン基は置換基を有していてもよく、そのような置換基としてアルキル基(好ましくは炭素数1~4のアルキル基)、ハロゲン原子などが挙げられる。
 特に好ましいR10を核とする脂環基構造をもつジアミン成分としては5-アミノ-1,3,3-トリメチルシクロヘキサンメチルアミン成分、cis-1,4-シクロヘキサンジアミン成分、trans-1,4-シクロヘキサンジアミン成分、1,4-シクロヘキサンジアミン成分(cis、trans混合物)、4,4’-メチレンビス(シクロヘキシルアミン)成分及びその3,3’-ジメチル置換体、ビス(アミノメチル)ビシクロ[2.2.1]ヘプタン成分、1,3-ジアミノアダマンタン成分、3,3’-ジアミノ-1,1’-ビアダマンチル成分、4,4’-ヘキサフルオロイソプロピリデンビス(シクロヘキシルアミン)成分が挙げられ、この内3,3’-ジアミノ-1,1’-ビアダマンチル成分、trans-1,4-シクロヘキサンジアミン成分が応力を低くする観点から好ましい。
The alicyclic group and alkylene group that can form a divalent group having an alicyclic group may have a substituent, and an alkyl group (preferably an alkyl group having 1 to 4 carbon atoms) as such a substituent. ), Halogen atoms and the like.
Particularly preferred diamine components having an alicyclic group structure having R 10 as a nucleus include a 5-amino-1,3,3-trimethylcyclohexanemethylamine component, a cis-1,4-cyclohexanediamine component, and trans-1,4- Cyclohexanediamine component, 1,4-cyclohexanediamine component (cis, trans mixture), 4,4′-methylenebis (cyclohexylamine) component and its 3,3′-dimethyl-substituted product, bis (aminomethyl) bicyclo [2.2 .1] heptane component, 1,3-diaminoadamantane component, 3,3′-diamino-1,1′-biadamantyl component, 4,4′-hexafluoroisopropylidenebis (cyclohexylamine) component, Of which 3,3'-diamino-1,1'-biadamantyl component, trans-1,4-cycl From the viewpoint of hexane diamine component to lower the stress.
 R10を核として2個のアミノ基を有する脂環ジアミン成分の樹脂中の含有量としては、樹脂を構成する全繰り返し単位に対して20~70モル%であることが好ましく、30~60モル%であることがより好ましい。
 R10についての芳香族基を有する2価の基における芳香族基としては、炭素数5~16の芳香族基であることが好ましく、フェニレン基、ナフチレン基などが挙げられる。また、前記芳香族基は窒素原子、酸素原子などのヘテロ原子を含んでいてもよく、例えば、2価のベンゾオキサゾール基などが挙げられる。
 R10についての芳香族基を有する2価の基としては前記芳香族基そのものであってもよいが、複数の芳香族基が単結合ないしは2価の連結基を介して連結して、Rとしての芳香族基を有する2価の基を形成していてもよく、ジアミン成分中のアミノ基と芳香族基とが2価の連結基を介して連結していてもよい。
 前記2価の連結基としては、アルキレン基(炭素数1~6のアルキレン基が好ましく、例えば、メチレン基、エチレン基、プロピレン基など)、酸素原子、イオウ原子、2価のスルホン基、エステル結合、ケトン基、アミド基などが挙げられる。
 芳香族基を有する2価の基を構成し得る前記芳香族基、アルキレン基は置換基を有していてもよく、そのような置換基としてアルキル基(好ましくは炭素数1~4のアルキル基)、ハロゲン原子、メトキシ基などのアルコキシ基、シアノ基、フェニル基などのアリール基などが挙げられる。
The content of the alicyclic diamine component having two amino groups with R 10 as a nucleus in the resin is preferably 20 to 70 mol%, and preferably 30 to 60 mol based on all repeating units constituting the resin. % Is more preferable.
The aromatic group in the divalent group having an aromatic group for R 10 is preferably an aromatic group having 5 to 16 carbon atoms, and examples thereof include a phenylene group and a naphthylene group. Further, the aromatic group may contain a hetero atom such as a nitrogen atom or an oxygen atom, and examples thereof include a divalent benzoxazole group.
The divalent group having an aromatic group for R 10 may be the aromatic group itself, but a plurality of aromatic groups may be linked via a single bond or a divalent linking group to form R 2. The divalent group which has an aromatic group as may be formed, and the amino group in the diamine component and the aromatic group may be linked via a divalent linking group.
The divalent linking group is preferably an alkylene group (an alkylene group having 1 to 6 carbon atoms, such as a methylene group, an ethylene group, or a propylene group), an oxygen atom, a sulfur atom, a divalent sulfone group, or an ester bond. , Ketone group, amide group and the like.
The aromatic group and alkylene group that can form a divalent group having an aromatic group may have a substituent, and an alkyl group (preferably an alkyl group having 1 to 4 carbon atoms) as such a substituent. ), An alkoxy group such as a halogen atom and a methoxy group, and an aryl group such as a cyano group and a phenyl group.
 R10を核とする芳香族ジアミン成分の具体例としては、例えば、m-フェニレンジアミン成分、p-フェニレンジアミン成分、2,4-トリレンジアミン成分、3,3’-ジアミノジフェニルエーテル成分、3,4’-ジアミノジフェニルエーテル成分、4,4’-ジアミノジフェニルエーテル成分、3,3’-ジアミノジフェニルスルホン成分、4,4’-ジアミノジフェニルスルホン成分、3,4’-ジアミノジフェニルスルホン成分、3,3’-ジアミノジフェニルメタン成分、4,4’-ジアミノジフェニルメタン成分、3,4’-ジアミノジフェニルメタン成分、4,4’-ジアミノジフェニルスルフィド成分、3,3’-ジアミノジフェニルケトン成分、4,4’-ジアミノジフェニルケトン成分、3,4’-ジアミノジフェニルケトン成分、2,2’-ビス(4-アミノフェニル)プロパン成分、2,2’-ビス(4-アミノフェニル)ヘキサフルオロプロパン成分、1,3-ビス(3-アミノフェノキシ)ベンゼン成分、1,3-ビス(4-アミノフェノキシ)ベンゼン成分、1,4-ビス(4-アミノフェノキシ)ベンゼン成分、4-メチル-2,4-ビス(4-アミノフェニル)-1-ペンテン成分、4-メチル-2,4-ビス(4-アミノフェニル)-2-ペンテン成分、1,4-ビス(α,α-ジメチル-4-アミノベンジル)ベンゼン成分、イミノ-ジ-p-フェニレンジアミン成分、1,5-ジアミノナフタレン成分、2,6-ジアミノナフタレン成分、4-メチル-2,4-ビス(4-アミノフェニル)ペンタン成分、5(又は6)-アミノ-1-(4-アミノフェニル)-1,3,3-トリメチルインダン成分、ビス(p-アミノフェニル)ホスフィンオキシド成分、4,4’-ジアミノアゾベンゼン成分、4,4’-ジアミノジフェニル尿素成分、4,4’-ビス(4-アミノフェノキシ)ビフェニル成分、2,2-ビス[4-(4-アミノフェノキシ)フェニル]プロパン成分、2,2-ビス[4-(4-アミノフェノキシ)フェニル]ヘキサフルオロプロパン成分、2,2-ビス[4-(3-アミノフェノキシ)フェニル]ベンゾフェノン成分、4,4’-ビス(4-アミノフェノキシ)ジフェニルスルホン成分、4,4’-ビス[4-(α,α-ジメチル-4-アミノベンジル)フェノキシ]ベンゾフェノン成分、4,4’-ビス[4-(α,α―ジメチル-4-アミノベンジル)フェノキシ]ジフェニルスルホン成分、4,4’-ジアミノビフェニル成分、4,4’-ジアミノベンゾフェノン成分、フェニルインダンジアミン成分、3,3’-ジメトキシ-4,4’-ジアミノビフェニル成分、3,3’-ジメチル-4,4’-ジアミノビフェニル成分、2,2’-ジメチル4,4’-ジアミノビフェニル成分、2,2’-ビス(トリフルオロメチル)ベンジジン成分、o-トルイジンスルホン成分、2,2-ビス(4-アミノフェノキシフェニル)プロパン成分、ビス(4-アミノフェノキシフェニル)スルホン成分、ビス(4-アミノフェノキシフェニル)スルフィド成分、1,4-(4-アミノフェノキシフェニル)ベンゼン成分、1,3-(4-アミノフェノキシフェニル)ベンゼン成分、9,9-ビス(4-アミノフェニル)フルオレン成分、4,4’-ジ-(3-アミノフェノキシ)ジフェニルスルホン成分、4,4’-ジアミノベンズアニリド成分、4-アミノフェニル-4’-アミノフェニルベンゾエート成分、ビス(4-アミノフェニル)テレフタレート成分、2-(4-アミノフェニル)ベンゾオキサゾール-5-イルアミン、4,4’’-ジアミノ-p-ターフェニル成分等、及びこれら芳香族ジアミンの芳香核の水素原子が、塩素原子、フッ素原子、臭素原子、メチル基、メトキシ基、シアノ基、フェニル基からなる群より選ばれた少なくとも一種の基又は原子によって置換された構造が挙げられる。 Specific examples of the aromatic diamine component having R 10 as a core include, for example, an m-phenylenediamine component, a p-phenylenediamine component, a 2,4-tolylenediamine component, a 3,3′-diaminodiphenyl ether component, 3, 4'-diaminodiphenyl ether component, 4,4'-diaminodiphenyl ether component, 3,3'-diaminodiphenyl sulfone component, 4,4'-diaminodiphenyl sulfone component, 3,4'-diaminodiphenyl sulfone component, 3,3 ' -Diaminodiphenylmethane component, 4,4'-diaminodiphenylmethane component, 3,4'-diaminodiphenylmethane component, 4,4'-diaminodiphenyl sulfide component, 3,3'-diaminodiphenyl ketone component, 4,4'-diaminodiphenyl Ketone component, 3,4'-diaminodiphenyl ketone component, , 2′-bis (4-aminophenyl) propane component, 2,2′-bis (4-aminophenyl) hexafluoropropane component, 1,3-bis (3-aminophenoxy) benzene component, 1,3-bis (4-aminophenoxy) benzene component, 1,4-bis (4-aminophenoxy) benzene component, 4-methyl-2,4-bis (4-aminophenyl) -1-pentene component, 4-methyl-2, 4-bis (4-aminophenyl) -2-pentene component, 1,4-bis (α, α-dimethyl-4-aminobenzyl) benzene component, imino-di-p-phenylenediamine component, 1,5-diamino Naphthalene component, 2,6-diaminonaphthalene component, 4-methyl-2,4-bis (4-aminophenyl) pentane component, 5 (or 6) -amino-1- (4-aminophenyl) ) -1,3,3-trimethylindane component, bis (p-aminophenyl) phosphine oxide component, 4,4′-diaminoazobenzene component, 4,4′-diaminodiphenylurea component, 4,4′-bis (4 -Aminophenoxy) biphenyl component, 2,2-bis [4- (4-aminophenoxy) phenyl] propane component, 2,2-bis [4- (4-aminophenoxy) phenyl] hexafluoropropane component, 2,2 -Bis [4- (3-aminophenoxy) phenyl] benzophenone component, 4,4'-bis (4-aminophenoxy) diphenylsulfone component, 4,4'-bis [4- (α, α-dimethyl-4- Aminobenzyl) phenoxy] benzophenone component, 4,4′-bis [4- (α, α-dimethyl-4-aminobenzyl) phenoxy] diphenylsulfur Component, 4,4'-diaminobiphenyl component, 4,4'-diaminobenzophenone component, phenylindanediamine component, 3,3'-dimethoxy-4,4'-diaminobiphenyl component, 3,3'-dimethyl-4 , 4′-diaminobiphenyl component, 2,2′-dimethyl 4,4′-diaminobiphenyl component, 2,2′-bis (trifluoromethyl) benzidine component, o-toluidine sulfone component, 2,2-bis (4 -Aminophenoxyphenyl) propane component, bis (4-aminophenoxyphenyl) sulfone component, bis (4-aminophenoxyphenyl) sulfide component, 1,4- (4-aminophenoxyphenyl) benzene component, 1,3- (4 -Aminophenoxyphenyl) benzene component, 9,9-bis (4-aminophenyl) fluorene component, 4,4 ' Di- (3-aminophenoxy) diphenylsulfone component, 4,4′-diaminobenzanilide component, 4-aminophenyl-4′-aminophenylbenzoate component, bis (4-aminophenyl) terephthalate component, 2- (4- Aminophenyl) benzoxazol-5-ylamine, 4,4 ″ -diamino-p-terphenyl component, etc., and the hydrogen atom of the aromatic nucleus of these aromatic diamines is a chlorine atom, a fluorine atom, a bromine atom, a methyl group, Examples include a structure substituted with at least one group or atom selected from the group consisting of a methoxy group, a cyano group, and a phenyl group.
 特に好ましい芳香族ジアミン成分としては、p-フェニレンジアミン成分、4,4’-ジアミノジフェニルエーテル成分、3,3’-ジアミノジフェニルスルホン成分、4,4’-ジアミノジフェニルスルホン成分、2,2’-ビス(4-アミノフェニル)ヘキサフルオロプロパン成分、1,4-ビス(4-アミノフェノキシ)ベンゼン成分、イミノ-ジ-p-フェニレンジアミン成分、4,4’-ジアミノビフェニル成分、4,4’-ジアミノベンゾフェノン成分、3,3’-ジメトキシ-4,4’-ジアミノビフェニル成分、3,3’-ジメチル-4,4’-ジアミノビフェニル成分、2,2’-ジメチル4,4’-ジアミノビフェニル成分、2,2’-ビス(トリフルオロメチル)ベンジジン成分、o-トルイジンスルホン成分、2,2-ビス(4-アミノフェノキシフェニル)プロパン成分、9,9-ビス(4-アミノフェニル)フルオレン成分、4,4’-ジ-(3-アミノフェノキシ)ジフェニルスルホン成分、4,4’-ジアミノベンズアニリド成分、4-アミノフェニル-4’-アミノフェニルベンゾエート成分、ビス(4-アミノフェニル)テレフタレート、2-(4-アミノフェニル)ベンゾオキサゾール-5-イルアミン成分、4,4’’-ジアミノ-p-ターフェニル成分が挙げられ、良好な靭性を有し、応力が低い膜が得られる。
 また、上記ジアミン成分には水酸基が置換されていても良い。このようなビスアミノフェノール成分としては、例えば、3,3’-ジヒドロキシベンジジン成分、3,3’-ジアミノ-4,4’-ジヒドロキシビフェニル成分、4,4’-ジアミノ-3,3’-ジヒドロキシビフェニル成分、3,3’-ジアミノ-4,4’-ジヒドロキシジフェニルスルホン成分、4,4’-ジアミノ-3,3’-ジヒドロキシジフェニルスルホン成分、ビス-(3-アミノ-4-ヒドロキシフェニル)メタン成分、2,2-ビス-(3-アミノ-4-ヒドロキシフェニル)プロパン成分、2,2-ビス-(3-アミノ-4-ヒドロキシフェニル)ヘキサフルオロプロパン成分、2,2-ビス-(4-アミノ-3-ヒドロキシフェニル)ヘキサフルオロプロパン成分、ビス-(4-アミノ-3-ヒドロキシフェニル)メタン成分、2,2-ビス-(4-アミノ-3-ヒドロキシフェニル)プロパン成分、4,4’-ジアミノ-3,3’-ジヒドロキシベンゾフェノン成分、3,3’-ジアミノ-4,4’-ジヒドロキシベンゾフェノン成分、4,4’-ジアミノ-3,3’-ジヒドロキシジフェニルエーテル成分、3,3’-ジアミノ-4,4’-ジヒドロキシジフェニルエーテル成分、1,4-ジアミノ-2,5-ジヒドロキシベンゼン成分、1,3-ジアミノ-2,4-ジヒドロキシベンゼン成分、1,3-ジアミノ-4,6-ジヒドロキシベンゼン成分などが挙げられる。これらのビスアミノフェノール成分は単独あるいは混合して使用してもよい。
Particularly preferred aromatic diamine components include p-phenylenediamine component, 4,4′-diaminodiphenyl ether component, 3,3′-diaminodiphenylsulfone component, 4,4′-diaminodiphenylsulfone component, and 2,2′-bis. (4-aminophenyl) hexafluoropropane component, 1,4-bis (4-aminophenoxy) benzene component, imino-di-p-phenylenediamine component, 4,4'-diaminobiphenyl component, 4,4'-diamino Benzophenone component, 3,3′-dimethoxy-4,4′-diaminobiphenyl component, 3,3′-dimethyl-4,4′-diaminobiphenyl component, 2,2′-dimethyl 4,4′-diaminobiphenyl component, 2,2′-bis (trifluoromethyl) benzidine component, o-toluidine sulfone component, 2,2-bis (4-amino Nophenoxyphenyl) propane component, 9,9-bis (4-aminophenyl) fluorene component, 4,4′-di- (3-aminophenoxy) diphenylsulfone component, 4,4′-diaminobenzanilide component, 4- Aminophenyl-4′-aminophenylbenzoate component, bis (4-aminophenyl) terephthalate, 2- (4-aminophenyl) benzoxazol-5-ylamine component, 4,4 ″ -diamino-p-terphenyl component A film having good toughness and low stress can be obtained.
The diamine component may be substituted with a hydroxyl group. Examples of such bisaminophenol components include 3,3′-dihydroxybenzidine component, 3,3′-diamino-4,4′-dihydroxybiphenyl component, and 4,4′-diamino-3,3′-dihydroxy. Biphenyl component, 3,3′-diamino-4,4′-dihydroxydiphenylsulfone component, 4,4′-diamino-3,3′-dihydroxydiphenylsulfone component, bis- (3-amino-4-hydroxyphenyl) methane Component, 2,2-bis- (3-amino-4-hydroxyphenyl) propane component, 2,2-bis- (3-amino-4-hydroxyphenyl) hexafluoropropane component, 2,2-bis- (4 -Amino-3-hydroxyphenyl) hexafluoropropane component, bis- (4-amino-3-hydroxyphenyl) methane component, 2 2-bis- (4-amino-3-hydroxyphenyl) propane component, 4,4′-diamino-3,3′-dihydroxybenzophenone component, 3,3′-diamino-4,4′-dihydroxybenzophenone component, 4 , 4'-diamino-3,3'-dihydroxydiphenyl ether component, 3,3'-diamino-4,4'-dihydroxydiphenyl ether component, 1,4-diamino-2,5-dihydroxybenzene component, 1,3-diamino -2,4-dihydroxybenzene component, 1,3-diamino-4,6-dihydroxybenzene component and the like. These bisaminophenol components may be used alone or in combination.
 これらのビスアミノフェノール構造のうち特に好ましい態様として、前記一般式(VIII)中のR10が下記から選ばれる芳香族基を有する2価の基の場合が挙げられる。 Among these bisaminophenol structures, a particularly preferred embodiment includes a case where R 10 in the general formula (VIII) is a divalent group having an aromatic group selected from the following.
Figure JPOXMLDOC01-appb-C000047
Figure JPOXMLDOC01-appb-C000047
 上記式中、Xは-O-、-S-、-C(CF-、-CH-、-SO-、-NHCO-を表す。*は前記一般式(1)中のRに結合する-NH-、又は-OHとの結合位置を表す。また、上記構造において、Rに結合する-NH-と-OHとは互いにオルト位(隣接位)に結合する。
 R10を核として2個のアミノ基を有する芳香族ジアミン成分の樹脂中の含有量としては、樹脂を構成する全繰り返し単位に対して5~40モル%であることが好ましく、10~30モル%であることがより好ましい。
 また、基板との接着性を高めるためにR10を核とするジアミン成分としてシリコンジアミン成分とすることができる。この例としては、ビス(4-アミノフェニル)ジメチルシラン成分、ビス(4-アミノフェニル)テトラメチルシロキサン成分、ビス(4-アミノフェニル)テトラメチルジシロキサン成分、ビス(γ―アミノプロピル)テトラメチルジシロキサン成分、1,4-ビス(γ―アミノプロピルジメチルシリル)ベンゼン成分、ビス(4-アミノブチル)テトラメチルジシロキサン成分、ビス(γ―アミノプロピル)テトラフェニルジシロキサン成分等が挙げられる。
 シリコンジアミン成分として、下記構造も挙げることができる。
In the above formula, X 1 represents —O—, —S—, —C (CF 3 ) 2 —, —CH 2 —, —SO 2 —, —NHCO—. * Represents a bonding position with —NH— or —OH bonded to R 2 in the general formula (1). In the above structure, —NH— and —OH bonded to R 2 are bonded to each other in the ortho position (adjacent position).
The content of the aromatic diamine component having two amino groups with R 10 as a nucleus in the resin is preferably 5 to 40 mol% with respect to all repeating units constituting the resin, and preferably 10 to 30 mol. % Is more preferable.
Moreover, the R 10 to enhance the adhesion to the substrate can be a silicon diamine component as the diamine component to the nucleus. Examples include bis (4-aminophenyl) dimethylsilane component, bis (4-aminophenyl) tetramethylsiloxane component, bis (4-aminophenyl) tetramethyldisiloxane component, bis (γ-aminopropyl) tetramethyl. Examples thereof include a disiloxane component, a 1,4-bis (γ-aminopropyldimethylsilyl) benzene component, a bis (4-aminobutyl) tetramethyldisiloxane component, and a bis (γ-aminopropyl) tetraphenyldisiloxane component.
The following structure can also be mentioned as a silicon diamine component.
Figure JPOXMLDOC01-appb-C000048
Figure JPOXMLDOC01-appb-C000048
 上記式において、R16は2価の有機基を表し、R17は1価の有機基を表す。複数のR16は互いに同一であっても異なっていてもよい。複数のR17は互いに同一であっても異なっていてもよい。
 R16で表される2価の有機基としては、置換基を有していてもよい炭素数1~20の直鎖もしくは分岐のアルキレン基、炭素数6~20のフェニレン基、炭素数3~20の2価の脂環基、又はこれらを組み合わせて構成される基を表す。
 R17で表される1価の有機基としては、置換基を有していてもよい炭素数1~20の直鎖もしくは分岐のアルキル基もしくは炭素数6~20のアリール基を表す。
 より具体的には、下記を挙げることができる。
In the above formula, R 16 represents a divalent organic group, and R 17 represents a monovalent organic group. A plurality of R 16 may be the being the same or different. The plurality of R 17 may be the same as or different from each other.
Examples of the divalent organic group represented by R 16 include an optionally substituted linear or branched alkylene group having 1 to 20 carbon atoms, a phenylene group having 6 to 20 carbon atoms, and 3 to 3 carbon atoms. 20 represents a divalent alicyclic group or a group formed by combining these.
The monovalent organic group represented by R 17 represents a linear or branched alkyl group having 1 to 20 carbon atoms or an aryl group having 6 to 20 carbon atoms which may have a substituent.
More specifically, the following can be mentioned.
Figure JPOXMLDOC01-appb-C000049
Figure JPOXMLDOC01-appb-C000049
 R10を核として少なくとも2個のアミノ基を有するシリコンジアミン成分の樹脂中の含有量としては、樹脂を構成する全繰り返し単位に対して5~40モル%であることが好ましく、10~30モル%であることがより好ましい。
 一般式(VIII)で表される繰り返し単位を含むポリアミック酸は、例えば、高分子学会編 新高分子実験学3 高分子の合成・反応(2) P155-P171(1996)に示されているように、酸成分とジアミンとを有機溶媒中で反応させて得ることができる。
 有機溶媒としては、N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド、N-メチル-2-ピロリジノン、1,3-ジメチル-2-イミダゾリジノン等のアミド系溶媒、ベンゼン、アニソール、ジフェニルエーテル、ニトロベンゼン、ベンゾニトリル、ピリジンのような芳香族系溶媒、クロロホルム、ジクロロメタン、1,2-ジクロロエタン、1,1,2,2-テトラクロロエタンのようなハロゲン系溶媒、テトラヒドロフラン、ジオキサン、ジグリムのようなエーテル系溶媒、ジメチルスルホキシド等を例示することができる。中でもアミド系溶媒が好ましく、高分子量のポリアミック酸を得ることができる。
The content of the silicon diamine component having at least two amino groups with R 10 as a nucleus in the resin is preferably 5 to 40 mol% with respect to all repeating units constituting the resin, and preferably 10 to 30 mol. % Is more preferable.
The polyamic acid containing the repeating unit represented by the general formula (VIII) is, for example, as shown in Polymer Science Society edited by New Polymer Experiments 3 Polymer Synthesis and Reaction (2) P155-P171 (1996). It can be obtained by reacting an acid component and a diamine in an organic solvent.
Examples of organic solvents include amide solvents such as N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidinone, 1,3-dimethyl-2-imidazolidinone, benzene, anisole, diphenyl ether, Aromatic solvents such as nitrobenzene, benzonitrile, pyridine, halogenated solvents such as chloroform, dichloromethane, 1,2-dichloroethane, 1,1,2,2-tetrachloroethane, ethers such as tetrahydrofuran, dioxane, diglyme Examples thereof include system solvents and dimethyl sulfoxide. Of these, amide solvents are preferred, and high molecular weight polyamic acid can be obtained.
 一般式(VIII)で表される繰り返し単位を含むポリアミック酸の末端に末端封止剤を反応させてもよい。末端封止剤は、モノアミン、酸無水物、モノカルボン酸、モノ酸クロリド化合物、モノ活性エステル化合物などを用いることができる。末端封止剤を反応させることにより、構造単位の繰り返し数、すなわち分子量を好ましい範囲に制御できる点で好ましい。更に、末端封止剤により、末端アミンと発生酸の中和による酸失活を抑制する事ができる。また、末端に末端封止剤を反応させることにより、末端基として種々の有機基、例えば炭素-炭素不飽和結合を有する架橋反応性基を導入することができる。
 末端封止剤に用いられるモノアミンは、5-アミノ-8-ヒドロキシキノリン、4-アミノ-8-ヒドロキシキノリン、1-ヒドロキシ-8-アミノナフタレン、1-ヒドロキシ-7-アミノナフタレン、1-ヒドロキシ-6-アミノナフタレン、1-ヒドロキシ-5-アミノナフタレン、1-ヒドロキシ-4-アミノナフタレン、1-ヒドロキシ-3-アミノナフタレン、1-ヒドロキシ-2-アミノナフタレン、1-アミノ-7-ヒドロキシナフタレン、2-ヒドロキシ-7-アミノナフタレン、2-ヒドロキシ-6-アミノナフタレン、2-ヒドロキシ-5-アミノナフタレン、2-ヒドロキシ-4-アミノナフタレン、2-ヒドロキシ-3-アミノナフタレン、1-アミノ-2-ヒドロキシナフタレン、1-カルボキシ-8-アミノナフタレン、1-カルボキシ-7-アミノナフタレン、1-カルボキシ-6-アミノナフタレン、1-カルボキシ-5-アミノナフタレン、1-カルボキシ-4-アミノナフタレン、1-カルボキシ-3-アミノナフタレン、1-カルボキシ-2-アミノナフタレン、1-アミノ-7-カルボキシナフタレン、2-カルボキシ-7-アミノナフタレン、2-カルボキシ-6-アミノナフタレン、2-カルボキシ-5-アミノナフタレン、2-カルボキシ-4-アミノナフタレン、2-カルボキシ-3-アミノナフタレン、1-アミノ-2-カルボキシナフタレン、2-アミノニコチン酸、4-アミノニコチン酸、5-アミノニコチン酸、6-アミノニコチン酸、4-アミノサリチル酸、5-アミノサリチル酸、6-アミノサリチル酸、3-アミノ-O-トルイック酸、アメライド、2-アミノ安息香酸、3-アミノ安息香酸、4-アミノ安息香酸、2-アミノベンゼンスルホン酸、3-アミノベンゼンスルホン酸、4-アミノベンゼンスルホン酸、3-アミノ-4,6-ジヒドロキシピリミジン、2-アミノフェノール、3-アミノフェノール、4-アミノフェノール、5-アミノ-8-メルカプトキノリン、4-アミノ-8-メルカプトキノリン、1-メルカプト-8-アミノナフタレン、1-メルカプト-7-アミノナフタレン、1-メルカプト-6-アミノナフタレン、1-メルカプト-5-アミノナフタレン、1-メルカプト-4-アミノナフタレン、1-メルカプト-3-アミノナフタレン、1-メルカプト-2-アミノナフタレン、1-アミノ-7-メルカプトナフタレン、2-メルカプト-7-アミノナフタレン、2-メルカプト-6-アミノナフタレン、2-メルカプト-5-アミノナフタレン、2-メルカプト-4-アミノナフタレン、2-メルカプト-3-アミノナフタレン、1-アミノ-2-メルカプトナフタレン、3-アミノ-4,6-ジメルカプトピリミジン、2-アミノチオフェノール、3-アミノチオフェノール、4-アミノチオフェノール、2-エチニルアニリン、3-エチニルアニリン、4-エチニルアニリン、2,4-ジエチニルアニリン、2,5-ジエチニルアニリン、2,6-ジエチニルアニリン、3,4-ジエチニルアニリン、3,5-ジエチニルアニリン、1-エチニル-2-アミノナフタレン、1-エチニル-3-アミノナフタレン、1-エチニル-4-アミノナフタレン、1-エチニル-5-アミノナフタレン、1-エチニル-6-アミノナフタレン、1-エチニル-7-アミノナフタレン、1-エチニル-8-アミノナフタレン、2-エチニル-1-アミノナフタレン、2-エチニル-3-アミノナフタレン、2-エチニル-4-アミノナフタレン、2-エチニル-5-アミノナフタレン、2-エチニル-6-アミノナフタレン、2-エチニル-7-アミノナフタレン、2-エチニル-8-アミノナフタレン、3,5-ジエチニル-1-アミノナフタレン、3,5-ジエチニル-2-アミノナフタレン、3,6-ジエチニル-1-アミノナフタレン、3,6-ジエチニル-2-アミノナフタレン、3,7-ジエチニル-1-アミノナフタレン、3,7-ジエチニル-2-アミノナフタレン、4,8-ジエチニル-1-アミノナフタレン、4,8-ジエチニル-2-アミノナフタレン等が挙げられるが、これらに限定されるものではない。
You may make terminal blocker react with the terminal of the polyamic acid containing the repeating unit represented by general formula (VIII). As the terminal capping agent, monoamine, acid anhydride, monocarboxylic acid, monoacid chloride compound, monoactive ester compound and the like can be used. By making terminal blocker react, it is preferable at the point which can control the repeating number of a structural unit, ie, molecular weight, in a preferable range. Furthermore, acid deactivation due to neutralization of the terminal amine and the generated acid can be suppressed by the terminal blocking agent. In addition, by reacting a terminal blocking agent at the terminal, various organic groups such as a crosslinking reactive group having a carbon-carbon unsaturated bond can be introduced as a terminal group.
Monoamines used for end-capping agents are 5-amino-8-hydroxyquinoline, 4-amino-8-hydroxyquinoline, 1-hydroxy-8-aminonaphthalene, 1-hydroxy-7-aminonaphthalene, 1-hydroxy- 6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 1-hydroxy-3-aminonaphthalene, 1-hydroxy-2-aminonaphthalene, 1-amino-7-hydroxynaphthalene, 2-hydroxy-7-aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 2-hydroxy-4-aminonaphthalene, 2-hydroxy-3-aminonaphthalene, 1-amino-2 -Hydroxynaphthalene, 1-carboxy-8-amino Phthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5-aminonaphthalene, 1-carboxy-4-aminonaphthalene, 1-carboxy-3-aminonaphthalene, 1-carboxy -2-aminonaphthalene, 1-amino-7-carboxynaphthalene, 2-carboxy-7-aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-carboxy-4-aminonaphthalene 2-carboxy-3-aminonaphthalene, 1-amino-2-carboxynaphthalene, 2-aminonicotinic acid, 4-aminonicotinic acid, 5-aminonicotinic acid, 6-aminonicotinic acid, 4-aminosalicylic acid, 5- Aminosalicylic acid, 6-aminosalicylic acid, 3-a No-O-toluic acid, amelide, 2-aminobenzoic acid, 3-aminobenzoic acid, 4-aminobenzoic acid, 2-aminobenzenesulfonic acid, 3-aminobenzenesulfonic acid, 4-aminobenzenesulfonic acid, 3-aminobenzoic acid Amino-4,6-dihydroxypyrimidine, 2-aminophenol, 3-aminophenol, 4-aminophenol, 5-amino-8-mercaptoquinoline, 4-amino-8-mercaptoquinoline, 1-mercapto-8-aminonaphthalene 1-mercapto-7-aminonaphthalene, 1-mercapto-6-aminonaphthalene, 1-mercapto-5-aminonaphthalene, 1-mercapto-4-aminonaphthalene, 1-mercapto-3-aminonaphthalene, 1-mercapto- 2-aminonaphthalene, 1-amino-7-mercaptonaphthalene 2-mercapto-7-aminonaphthalene, 2-mercapto-6-aminonaphthalene, 2-mercapto-5-aminonaphthalene, 2-mercapto-4-aminonaphthalene, 2-mercapto-3-aminonaphthalene, 1-amino -2-Mercaptonaphthalene, 3-amino-4,6-dimercaptopyrimidine, 2-aminothiophenol, 3-aminothiophenol, 4-aminothiophenol, 2-ethynylaniline, 3-ethynylaniline, 4-ethynylaniline 2,4-diethynylaniline, 2,5-diethynylaniline, 2,6-diethynylaniline, 3,4-diethynylaniline, 3,5-diethynylaniline, 1-ethynyl-2-aminonaphthalene, 1-ethynyl-3-aminonaphthalene, 1-ethynyl-4-aminonaphthalene 1-ethynyl-5-aminonaphthalene, 1-ethynyl-6-aminonaphthalene, 1-ethynyl-7-aminonaphthalene, 1-ethynyl-8-aminonaphthalene, 2-ethynyl-1-aminonaphthalene, 2-ethynyl-3 -Aminonaphthalene, 2-ethynyl-4-aminonaphthalene, 2-ethynyl-5-aminonaphthalene, 2-ethynyl-6-aminonaphthalene, 2-ethynyl-7-aminonaphthalene, 2-ethynyl-8-aminonaphthalene, 3 , 5-diethynyl-1-aminonaphthalene, 3,5-diethynyl-2-aminonaphthalene, 3,6-diethynyl-1-aminonaphthalene, 3,6-diethynyl-2-aminonaphthalene, 3,7-diethynyl-1 -Aminonaphthalene, 3,7-diethynyl-2-aminonaphthalene, 4,8-diethini 1-aminonaphthalene, 4,8-diethynyl-2-Amino-naphthalene, but it is not limited thereto.
 これらのうち、5-アミノ-8-ヒドロキシキノリン、1-ヒドロキシ-7-アミノナフタレン、1-ヒドロキシ-6-アミノナフタレン、1-ヒドロキシ-5-アミノナフタレン、1-ヒドロキシ-4-アミノナフタレン、2-ヒドロキシ-7-アミノナフタレン、2-ヒドロキシ-6-アミノナフタレン、2-ヒドロキシ-5-アミノナフタレン、1-カルボキシ-7-アミノナフタレン、1-カルボキシ-6-アミノナフタレン、1-カルボキシ-5-アミノナフタレン、2-カルボキシ-7-アミノナフタレン、2-カルボキシ-6-アミノナフタレン、2-カルボキシ-5-アミノナフタレン、2-アミノ安息香酸、3-アミノ安息香酸、4-アミノ安息香酸、4-アミノサリチル酸、5-アミノサリチル酸、6-アミノサリチル酸、2-アミノベンゼンスルホン酸、3-アミノベンゼンスルホン酸、4-アミノベンゼンスルホン酸、3-アミノ-4,6-ジヒドロキシピリミジン、2-アミノフェノール、3-アミノフェノール、4-アミノフェノール、2-アミノチオフェノール、3-アミノチオフェノール、4-アミノチオフェノール、3-エチニルアニリン、4-エチニルアニリン、3,4-ジエチニルアニリン、3,5-ジエチニルアニリン等が好ましい。
 末端封止剤として用いられる酸無水物、モノカルボン酸、モノ酸クロリド化合物、活性エステル化合物は、無水フタル酸、無水マレイン酸、無水ナジック酸、シクロヘキサンジカルボン酸無水物、3-ヒドロキシフタル酸無水物等の酸無水物、2-カルボキシフェノール、3-カルボキシフェノール、4-カルボキシフェノール、2-カルボキシチオフェノール、3-カルボキシチオフェノール、4-カルボキシチオフェノール、1-ヒドロキシ-8-カルボキシナフタレン、1-ヒドロキシ-7-カルボキシナフタレン、1-ヒドロキシ-6-カルボキシナフタレン、1-ヒドロキシ-5-カルボキシナフタレン、1-ヒドロキシ-4-カルボキシナフタレン、1-ヒドロキシ-3-カルボキシナフタレン、1-ヒドロキシ-2-カルボキシナフタレン、1-メルカプト-8-カルボキシナフタレン、1-メルカプト-7-カルボキシナフタレン、1-メルカプト-6-カルボキシナフタレン、1-メルカプト-5-カルボキシナフタレン、1-メルカプト-4-カルボキシナフタレン、1-メルカプト-3-カルボキシナフタレン、1-メルカプト-2-カルボキシナフタレン、2-カルボキシベンゼンスルホン酸、3-カルボキシベンゼンスルホン酸、4-カルボキシベンゼンスルホン酸、2-エチニル安息香酸、3-エチニル安息香酸、4-エチニル安息香酸、2,4-ジエチニル安息香酸、2,5-ジエチニル安息香酸、2,6-ジエチニル安息香酸、3,4-ジエチニル安息香酸、3,5-ジエチニル安息香酸、2-エチニル-1-ナフトエ酸、3-エチニル-1-ナフトエ酸、4-エチニル-1-ナフトエ酸、5-エチニル-1-ナフトエ酸、6-エチニル-1-ナフトエ酸、7-エチニル-1-ナフトエ酸、8-エチニル-1-ナフトエ酸、2-エチニル-2-ナフトエ酸、3-エチニル-2-ナフトエ酸、4-エチニル-2-ナフトエ酸、5-エチニル-2-ナフトエ酸、6-エチニル-2-ナフトエ酸、7-エチニル-2-ナフトエ酸、8-エチニル-2-ナフトエ酸等のモノカルボン酸類及びこれらのカルボキシル基が酸クロリド化したモノ酸クロリド化合物、及びテレフタル酸、フタル酸、マレイン酸、シクロヘキサンジカルボン酸、3-ヒドロキシフタル酸、5-ノルボルネン-2,3-ジカルボン酸、1,2-ジカルボキシナフタレン、1,3-ジカルボキシナフタレン、1,4-ジカルボキシナフタレン、1,5-ジカルボキシナフタレン、1,6-ジカルボキシナフタレン、1,7-ジカルボキシナフタレン、1,8-ジカルボキシナフタレン、2,3-ジカルボキシナフタレン、2,6-ジカルボキシナフタレン、2,7-ジカルボキシナフタレン等のジカルボン酸類のモノカルボキシル基だけが酸クロリド化したモノ酸クロリド化合物、モノ酸クロリド化合物とN-ヒドロキシベンゾトリアゾールやN-ヒドロキシ-5-ノルボルネン-2,3-ジカルボキシイミドとの反応により得られる活性エステル化合物等が挙げられる。
Of these, 5-amino-8-hydroxyquinoline, 1-hydroxy-7-aminonaphthalene, 1-hydroxy-6-aminonaphthalene, 1-hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 2 -Hydroxy-7-aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-hydroxy-5-aminonaphthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene, 1-carboxy-5 Aminonaphthalene, 2-carboxy-7-aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-aminobenzoic acid, 3-aminobenzoic acid, 4-aminobenzoic acid, 4- Aminosalicylic acid, 5-aminosalicylic acid, 6-aminosalicylic acid 2-aminobenzenesulfonic acid, 3-aminobenzenesulfonic acid, 4-aminobenzenesulfonic acid, 3-amino-4,6-dihydroxypyrimidine, 2-aminophenol, 3-aminophenol, 4-aminophenol, 2- Aminothiophenol, 3-aminothiophenol, 4-aminothiophenol, 3-ethynylaniline, 4-ethynylaniline, 3,4-diethynylaniline, 3,5-diethynylaniline and the like are preferable.
Acid anhydrides, monocarboxylic acids, monoacid chloride compounds and active ester compounds used as end-capping agents are phthalic anhydride, maleic anhydride, nadic anhydride, cyclohexanedicarboxylic anhydride, 3-hydroxyphthalic anhydride Acid anhydrides such as 2-carboxyphenol, 3-carboxyphenol, 4-carboxyphenol, 2-carboxythiophenol, 3-carboxythiophenol, 4-carboxythiophenol, 1-hydroxy-8-carboxynaphthalene, 1- Hydroxy-7-carboxynaphthalene, 1-hydroxy-6-carboxynaphthalene, 1-hydroxy-5-carboxynaphthalene, 1-hydroxy-4-carboxynaphthalene, 1-hydroxy-3-carboxynaphthalene, 1-hydroxy-2-carboxyl Naphthalene, 1-mercapto-8-carboxynaphthalene, 1-mercapto-7-carboxynaphthalene, 1-mercapto-6-carboxynaphthalene, 1-mercapto-5-carboxynaphthalene, 1-mercapto-4-carboxynaphthalene, 1-mercapto -3-carboxynaphthalene, 1-mercapto-2-carboxynaphthalene, 2-carboxybenzenesulfonic acid, 3-carboxybenzenesulfonic acid, 4-carboxybenzenesulfonic acid, 2-ethynylbenzoic acid, 3-ethynylbenzoic acid, 4- Ethynylbenzoic acid, 2,4-diethynylbenzoic acid, 2,5-diethynylbenzoic acid, 2,6-diethynylbenzoic acid, 3,4-diethynylbenzoic acid, 3,5-diethynylbenzoic acid, 2-ethynyl-1- Naphthoic acid, 3-ethynyl-1-na Toeic acid, 4-ethynyl-1-naphthoic acid, 5-ethynyl-1-naphthoic acid, 6-ethynyl-1-naphthoic acid, 7-ethynyl-1-naphthoic acid, 8-ethynyl-1-naphthoic acid, 2- Ethynyl-2-naphthoic acid, 3-ethynyl-2-naphthoic acid, 4-ethynyl-2-naphthoic acid, 5-ethynyl-2-naphthoic acid, 6-ethynyl-2-naphthoic acid, 7-ethynyl-2-naphthoic acid Acids, monocarboxylic acids such as 8-ethynyl-2-naphthoic acid, and monoacid chloride compounds in which these carboxyl groups are acid chloride, and terephthalic acid, phthalic acid, maleic acid, cyclohexanedicarboxylic acid, 3-hydroxyphthalic acid, 5-norbornene-2,3-dicarboxylic acid, 1,2-dicarboxynaphthalene, 1,3-dicarboxynaphthalene, 1,4-dicarboxyl Sinaphthalene, 1,5-dicarboxynaphthalene, 1,6-dicarboxynaphthalene, 1,7-dicarboxynaphthalene, 1,8-dicarboxynaphthalene, 2,3-dicarboxynaphthalene, 2,6-dicarboxynaphthalene , Monoacid chloride compounds in which only the monocarboxylic group of dicarboxylic acids such as 2,7-dicarboxynaphthalene is acid chloride, monoacid chloride compounds and N-hydroxybenzotriazole or N-hydroxy-5-norbornene-2,3- Examples include active ester compounds obtained by reaction with dicarboximide.
 これらのうち、無水フタル酸、無水マレイン酸、無水ナジック酸、シクロヘキサンジカルボン酸無水物、3-ヒドロキシフタル酸無水物等の酸無水物、3-カルボキシフェノール、4-カルボキシフェノール、3-カルボキシチオフェノール、4-カルボキシチオフェノール、1-ヒドロキシ-7-カルボキシナフタレン、1-ヒドロキシ-6-カルボキシナフタレン、1-ヒドロキシ-5-カルボキシナフタレン、1-メルカプト-7-カルボキシナフタレン、1-メルカプト-6-カルボキシナフタレン、1-メルカプト-5-カルボキシナフタレン、3-カルボキシベンゼンスルホン酸、4-カルボキシベンゼンスルホン酸、3-エチニル安息香酸、4-エチニル安息香酸、3,4-ジエチニル安息香酸、3,5-ジエチニル安息香酸等のモノカルボン酸類、及びこれらのカルボキシル基が酸クロリド化したモノ酸クロリド化合物、テレフタル酸、フタル酸、マレイン酸、シクロヘキサンジカルボン酸、1,5-ジカルボキシナフタレン、1,6-ジカルボキシナフタレン、1,7-ジカルボキシナフタレン、2,6-ジカルボキシナフタレン等のジカルボン酸類のモノカルボキシル基だけが酸クロリド化したモノ酸クロリド化合物、モノ酸クロリド化合物とN-ヒドロキシベンゾトリアゾールやN-ヒドロキシ-5-ノルボルネン-2,3-ジカルボキシイミドとの反応により得られる活性エステル化合物等が好ましい。
 末端封止剤に用いられるモノアミンの導入割合は、全アミン成分に対して、0.1~60モル%の範囲が好ましく、特に好ましくは5~50モル%である。末端封止剤として用いられる酸無水物、モノカルボン酸、モノ酸クロリド化合物及びモノ活性エステル化合物から選ばれた化合物の導入割合は、ジアミン成分に対して、0.1~100モル%の範囲が好ましく、特に好ましくは5~90モル%である。複数の末端封止剤を反応させることにより、複数の異なる末端基を導入しても良い。
 ポリマー中に導入された末端封止剤は、以下の方法で容易に検出できる。例えば、末端封止剤が導入されたポリマーを酸性溶液に溶解し、ポリマーの構成単位であるアミン成分と酸無水物成分に分解する。これをガスクロマトグラフィー(GC)や、NMR測定することにより、末端封止剤を容易に検出できる。その他に、末端封止剤が導入されたポリマー成分を直接、熱分解ガスクロマトグラフ(PGC)や赤外スペクトル及び13CNMRスペクトル測定することによっても、容易に検出可能である。
Among these, phthalic anhydride, maleic anhydride, nadic anhydride, cyclohexanedicarboxylic anhydride, acid anhydrides such as 3-hydroxyphthalic anhydride, 3-carboxyphenol, 4-carboxyphenol, 3-carboxythiophenol 4-carboxythiophenol, 1-hydroxy-7-carboxynaphthalene, 1-hydroxy-6-carboxynaphthalene, 1-hydroxy-5-carboxynaphthalene, 1-mercapto-7-carboxynaphthalene, 1-mercapto-6-carboxy Naphthalene, 1-mercapto-5-carboxynaphthalene, 3-carboxybenzenesulfonic acid, 4-carboxybenzenesulfonic acid, 3-ethynylbenzoic acid, 4-ethynylbenzoic acid, 3,4-diethynylbenzoic acid, 3,5-diethynyl benzoic acid Monocarboxylic acids, and monoacid chloride compounds in which these carboxyl groups are converted to an acid chloride, terephthalic acid, phthalic acid, maleic acid, cyclohexanedicarboxylic acid, 1,5-dicarboxynaphthalene, 1,6-dicarboxynaphthalene, 1 , 7-dicarboxynaphthalene, 2,6-dicarboxynaphthalene and the like monoacid chloride compounds in which only the monocarboxyl group of the dicarboxylic acid is converted to acid chloride, monoacid chloride compounds and N-hydroxybenzotriazole or N-hydroxy-5- Active ester compounds obtained by reaction with norbornene-2,3-dicarboximide are preferred.
The introduction ratio of the monoamine used for the end-capping agent is preferably in the range of 0.1 to 60 mol%, particularly preferably 5 to 50 mol%, based on the total amine component. The introduction ratio of the compound selected from the acid anhydride, monocarboxylic acid, monoacid chloride compound and monoactive ester compound used as the end-capping agent is in the range of 0.1 to 100 mol% with respect to the diamine component. The amount is particularly preferably 5 to 90 mol%. A plurality of different end groups may be introduced by reacting a plurality of end capping agents.
The end-capping agent introduced into the polymer can be easily detected by the following method. For example, a polymer having an end-capping agent introduced therein is dissolved in an acidic solution and decomposed into an amine component and an acid anhydride component that are constituent units of the polymer. The end-capping agent can be easily detected by gas chromatography (GC) or NMR measurement. In addition, it can also be easily detected by directly measuring the polymer component into which the end capping agent has been introduced by pyrolysis gas chromatography (PGC), infrared spectrum and 13 CNMR spectrum.
 また、カルボキシル基を含有する樹脂ないし重合体としては、市販の樹脂を用いることもできる。
 カルボキシル基を含有する樹脂ないし重合体におけるカルボキシル基の割合は、特に限定されないが、好ましくは、酸価として20~200、より好ましくは40~160である。ここで、酸価とは、重合体1gに含まれるカルボキシル基を中和するのに必要な水酸化カリウムのmg数である。
 カルボキシル基を含有する樹脂ないし重合体の重量平均分子量は、好ましくは、1,000~200,000であり、より好ましくは3,000~10,000であり、更に好ましくは3,000~50,000である。
 カルボキシル基を含有する重合体は、精製して固体として用いることもできる。また、製造の際に溶媒を使用した場合には、溶液として用いることもできる。
A commercially available resin can also be used as the resin or polymer containing a carboxyl group.
The ratio of the carboxyl group in the resin or polymer containing a carboxyl group is not particularly limited, but the acid value is preferably 20 to 200, more preferably 40 to 160. Here, the acid value is the number of mg of potassium hydroxide necessary to neutralize the carboxyl group contained in 1 g of the polymer.
The weight average molecular weight of the resin or polymer containing a carboxyl group is preferably 1,000 to 200,000, more preferably 3,000 to 10,000, and still more preferably 3,000 to 50,000. 000.
The polymer containing a carboxyl group can be purified and used as a solid. Moreover, when a solvent is used in the production, it can be used as a solution.
<一般式(I)で表される化合物を用いるヒドロキシル基又はカルボキシル基の保護方法>
 前記一般式(I)で表される化合物を用いてヒドロキシル基又はカルボキシル基を有する化合物のヒドロキシル基又はカルボキシル基を保護する方法は、前記一般式(III)で表される基を有する化合物の製造方法でもある。
 前記一般式(I)で表される化合物と、ヒドロキシル基又はカルボキシル基を有する化合物とを反応させることにより、ヒドロキシル基又はカルボキシル基を保護することができ、前記一般式(III)で表される基を有する化合物を製造することができる。
 ヒドロキシル基又はカルボキシル基を有する化合物に対する、前記一般式(I)で表される化合物の使用量(モル比)は、特に限定されないが、ヒドロキシル基又はカルボキシル基を有する化合物における保護の対象となるヒドロキシル基又はカルボキシル基1モルに対して、0.1~10モルであることが好ましく、0.2~5モルであることがより好ましく、0.3~3モルであることが更に好ましい。
 反応温度は、0~100℃であることが好ましく、0~50℃であることがより好ましく、0~20℃であることが更に好ましい。
 また、反応系に塩基を含有させることが好ましい。該塩基としては、特に限定はされないが、例えば、水酸化ナトリウム、水酸化カリウム等の無機塩基、エチルアミン、ジエチルアミン、トリエチルアミン、ジイソプロピルエチルアミン等の有機塩基等が挙げられ、中でも、トリエチルアミン又はジイソプロピルエチルアミンが好ましい。塩基の含有量は、特に限定されないが、前記一般式(I)で表される化合物1モルに対して、1~10モルであることが好ましく、1~3モルであることがより好ましい。また、必要に応じて、有機溶媒を使用してもよい。該有機溶媒としては、例えば、ヘキサン、トルエン、キシレン等の炭化水素系溶媒、ジオキサン、テトラヒドロフラン等のエーテル系溶媒、アセトン、メチルエチルケトン、メチルイソブチルケトン等のケトン系溶媒、N,N-ジメチルアセトアミド、N,N-ジメチルホルムアミド、ジメチルスルホキシド等の非プロトン性極性溶媒等が挙げられ、1種又は2種以上のものが用いられる。
 反応終了後、必要に応じて水洗、蒸留、晶析、再沈殿等の公知の手法により精製し、一般式(III)で表される基を有する化合物を得ることもできる。
 一般式(III)で表される基を有する化合物が、重合性不飽和二重結合を有する化合物である場合、必要に応じて、公知の方法により、単独、又は、他の重合性不飽和単量体と重合させてもよい。
<Method for protecting hydroxyl group or carboxyl group using compound represented by formula (I)>
A method for protecting a hydroxyl group or a carboxyl group of a compound having a hydroxyl group or a carboxyl group using the compound represented by the general formula (I) is a method for producing a compound having a group represented by the general formula (III). It is also a method.
By reacting the compound represented by the general formula (I) with a compound having a hydroxyl group or a carboxyl group, the hydroxyl group or the carboxyl group can be protected and represented by the general formula (III). A compound having a group can be produced.
The use amount (molar ratio) of the compound represented by the general formula (I) with respect to the compound having a hydroxyl group or a carboxyl group is not particularly limited, but hydroxyl to be protected in a compound having a hydroxyl group or a carboxyl group The amount is preferably 0.1 to 10 mol, more preferably 0.2 to 5 mol, and still more preferably 0.3 to 3 mol with respect to 1 mol of the group or carboxyl group.
The reaction temperature is preferably 0 to 100 ° C, more preferably 0 to 50 ° C, still more preferably 0 to 20 ° C.
Moreover, it is preferable to contain a base in the reaction system. The base is not particularly limited, and examples thereof include inorganic bases such as sodium hydroxide and potassium hydroxide, and organic bases such as ethylamine, diethylamine, triethylamine, and diisopropylethylamine. Among them, triethylamine or diisopropylethylamine is preferable. . The content of the base is not particularly limited, but is preferably 1 to 10 mol, and more preferably 1 to 3 mol, per 1 mol of the compound represented by the general formula (I). Moreover, you may use an organic solvent as needed. Examples of the organic solvent include hydrocarbon solvents such as hexane, toluene and xylene, ether solvents such as dioxane and tetrahydrofuran, ketone solvents such as acetone, methyl ethyl ketone and methyl isobutyl ketone, N, N-dimethylacetamide, N , N-dimethylformamide, aprotic polar solvents such as dimethyl sulfoxide and the like, and one or more of them are used.
After completion of the reaction, the compound having a group represented by the general formula (III) can be obtained by purification by a known method such as washing with water, distillation, crystallization, reprecipitation, etc., if necessary.
When the compound having a group represented by the general formula (III) is a compound having a polymerizable unsaturated double bond, if necessary, it may be used alone or in other polymerizable unsaturated units by a known method. It may be polymerized with a monomer.
<前記一般式(III)で表される基(保護基)の脱離方法>
 保護基の脱離方法としては、前記一般式(III)で表される基を有する化合物を熱又は酸で処理する方法が挙げられる。
 熱で処理する場合、150~250℃で行われることが好ましい。
 酸で処理する場合、使用される酸としては、硫酸、塩酸、p-トルエンスルホン酸、カンファースルホン酸等が挙げられ、中でも、p-トルエンスルホン酸が好ましい。酸の使用量は、脱離させる一般式(I)で表される化合物に由来する構造1モルに対して、0.01~50モルであることが好ましい。酸で処理する際の温度は、20~150℃であることが好ましい。酸で処理する際には、水を加えてもよい。水の使用量は、一般式(III)で表される基を有する化合物に対して、0.1~100質量%であることが好ましい。また、水を加えた場合、酸で処理する際の温度は、20~80℃であることが好ましい。
 一般式(I)で表される化合物に由来する構造を脱離させる場合、有機溶媒を使用してもよい。該有機溶媒としては前記と同様のものが挙げられ、その使用量は一般式(I)で表される化合物に対して10~300質量%であることが好ましく、20~100質量%であることがより好ましい。
 また、前記一般式(III)で表される基を有する化合物と光酸発生剤を共存させ、光酸発生剤に放射線等を照射し、酸を発生させることにより脱保護をして、ヒドロキシル基又はカルボキシル基を再生することもできる。
 以上のように、前記一般式(I)で表される化合物は、ヒドロキシル基を有する化合物のヒドロキシル基又はカルボキシル基を有する化合物のカルボキシル基の保護及び脱保護に利用できる。したがって、前記一般式(III)で表される基を有する化合物は、化学増幅型レジスト組成物等の構成成分として使用することができる。
<Method for removing group (protecting group) represented by formula (III)>
Examples of the method for removing the protecting group include a method of treating a compound having a group represented by the general formula (III) with heat or an acid.
When processing with heat, it is preferably performed at 150 to 250 ° C.
In the case of treatment with an acid, examples of the acid to be used include sulfuric acid, hydrochloric acid, p-toluenesulfonic acid, camphorsulfonic acid and the like, and among them, p-toluenesulfonic acid is preferable. The amount of the acid used is preferably 0.01 to 50 mol with respect to 1 mol of the structure derived from the compound represented by the general formula (I) to be eliminated. The temperature during the treatment with an acid is preferably 20 to 150 ° C. When treating with an acid, water may be added. The amount of water used is preferably 0.1 to 100% by mass relative to the compound having a group represented by the general formula (III). In addition, when water is added, the temperature during the treatment with an acid is preferably 20 to 80 ° C.
When desorbing the structure derived from the compound represented by the general formula (I), an organic solvent may be used. Examples of the organic solvent include those described above, and the amount used is preferably 10 to 300% by mass, and 20 to 100% by mass with respect to the compound represented by the general formula (I). Is more preferable.
In addition, a compound having a group represented by the general formula (III) and a photoacid generator are allowed to coexist, and the photoacid generator is irradiated with radiation or the like to generate an acid, thereby deprotecting the hydroxyl group. Alternatively, the carboxyl group can be regenerated.
As described above, the compound represented by the general formula (I) can be used for protecting and deprotecting a carboxyl group of a compound having a hydroxyl group or a compound having a carboxyl group. Therefore, the compound having a group represented by the general formula (III) can be used as a constituent component of a chemically amplified resist composition or the like.
<感光性樹脂組成物>
 本発明の感光性樹脂組成物は、(a)前記一般式(III)又は(IV)で表される基を有する樹脂、及び(b)活性光線又は放射線の照射により酸を発生する化合物を含有する。
 前記一般式(III)又は(IV)で表される基を有する樹脂(以下、単に「ベースポリマー」ということもある)は、好ましくは、前記一般式(V)で表される繰り返し単位を有するポリヒドロキシスチレンのヒドロキシル基の全て又は一部が前記一般式(III)で表される基で置換されたポリヒドロキシスチレン樹脂、前記一般式(VI)で表される繰り返し単位を有するノボラック樹脂のヒドロキシル基の全て又は一部が前記一般式(III)で表される基で置換されたノボラック樹脂、前記一般式(VII)で表される繰り返し単位を有するポリアクリレート又はポリメタクリレートのカルボキシル基の全て又は一部が前記一般式(IV)で表される基で置換されたポリアクリレート樹脂ないしはポリメタクリレート樹脂、前記一般式(VIII)で表される繰り返し単位を有するポリアミック酸のカルボキシル基の全て又は一部が一般式(IV)で表される基で置換されたポリアミック酸、前記一般式(IX)で表される繰り返し単位を有するポリヒドロキシアミドのヒドロキシル基の全て又は一部が前記一般式(III)で表される基で置換されたポリヒドロキシアミドである。
 ベースポリマーの重量平均分子量は、1,000~200,000であることが好ましく、1,000~150,000であることがより好ましく、1,000~100,000であることが更に好ましい。
 本発明の感光性樹脂組成物において、前記一般式(III)又は(IV)で表される基を有する樹脂(a)は1種単独で又は2種以上を組み合わせて使用してもよい。また、前記一般式(III)又は(IV)で表される基を有する樹脂(a)以外の樹脂を含んでいてもよい。
<Photosensitive resin composition>
The photosensitive resin composition of the present invention contains (a) a resin having a group represented by the general formula (III) or (IV), and (b) a compound that generates an acid upon irradiation with actinic rays or radiation. To do.
The resin having a group represented by the general formula (III) or (IV) (hereinafter sometimes simply referred to as “base polymer”) preferably has a repeating unit represented by the general formula (V). Polyhydroxystyrene resin in which all or part of hydroxyl groups of polyhydroxystyrene are substituted with groups represented by the above general formula (III), hydroxyl of novolak resin having a repeating unit represented by the above general formula (VI) A novolak resin in which all or part of the group is substituted with the group represented by the general formula (III), all or all of the carboxyl groups of the polyacrylate or polymethacrylate having the repeating unit represented by the general formula (VII) A polyacrylate resin or polymethacrylate resin partially substituted with a group represented by the general formula (IV), A polyamic acid in which all or part of the carboxyl groups of the polyamic acid having a repeating unit represented by the formula (VIII) are substituted with a group represented by the general formula (IV), represented by the general formula (IX) A polyhydroxyamide in which all or a part of hydroxyl groups of a polyhydroxyamide having a repeating unit is substituted with a group represented by the general formula (III).
The weight average molecular weight of the base polymer is preferably 1,000 to 200,000, more preferably 1,000 to 150,000, and still more preferably 1,000 to 100,000.
In the photosensitive resin composition of the present invention, the resin (a) having a group represented by the general formula (III) or (IV) may be used alone or in combination of two or more. Moreover, you may contain resin other than resin (a) which has group represented by the said general formula (III) or (IV).
(b)活性光線又は放射線の照射により酸を発生する化合物
 本発明の組成物は活性光線又は放射線の照射により酸を発生する化合物(「光酸発生剤」又は「(b)成分」ともいう)を含有する。これらは2種以上を併用して用いることもできる。また、感度調整のために、増感剤などを併用して用いることもできる。
(B) Compound that generates acid upon irradiation with actinic ray or radiation The composition of the present invention is a compound that generates acid upon irradiation with actinic ray or radiation (also referred to as “photoacid generator” or “(b) component”). Containing. These may be used in combination of two or more. Moreover, a sensitizer etc. can also be used together for sensitivity adjustment.
(b1)光酸発生剤
 光酸発生剤としては、光カチオン重合の光開始剤、光ラジカル重合の光開始剤、色素類の光消色剤、光変色剤、あるいはマイクロレジスト等に使用されている活性光線又は放射線の照射により酸を発生する公知の化合物及びそれらの混合物を適宜に選択して使用することができる。
(B1) Photoacid generator The photoacid generator is used as a photoinitiator for photocationic polymerization, a photoinitiator for radical photopolymerization, a photodecolorant for dyes, a photochromic agent, or a microresist. Known compounds that generate an acid upon irradiation with active light or radiation and mixtures thereof can be appropriately selected and used.
 たとえば、ジアゾニウム塩、ホスホニウム塩、スルホニウム塩、ヨードニウム塩、イミドスルホネート、オキシムスルホネート、ジアゾジスルホン、ジスルホン、o-ニトロベンジルスルホネートを挙げることができる。 Examples include diazonium salts, phosphonium salts, sulfonium salts, iodonium salts, imide sulfonates, oxime sulfonates, diazodisulfones, disulfones, and o-nitrobenzyl sulfonates.
 また、活性光線又は放射線の照射により酸を発生する基、あるいは化合物をポリマーの主鎖又は側鎖に導入した化合物、たとえば、米国特許第3,849,137号、独国特許第3914407号、特開昭63-26653号、特開昭55-164824号、特開昭62-69263号、特開昭63-146038号、特開昭63-163452号、特開昭62-153853号、特開昭63-146029号等に記載の化合物を用いることができる。 Further, a group that generates an acid upon irradiation with actinic rays or radiation, or a compound in which a compound is introduced into the main chain or side chain of the polymer, such as US Pat. No. 3,849,137, German Patent No. 3914407, JP 63-26653, JP 55-164824, JP 62-69263, JP 63-146038, JP 63-163452, JP 62-153853, JP The compounds described in 63-146029 and the like can be used.
 さらに米国特許第3,779,778号、欧州特許第126,712号等に記載の光により酸を発生する化合物も使用することができる。 Further, compounds capable of generating an acid by light described in US Pat. No. 3,779,778, European Patent 126,712 and the like can also be used.
 活性光線又は放射線の照射により酸を発生する化合物の内で好ましい化合物として、下記一般式(ZI)、(ZII)、(ZIII)で表される化合物を挙げることができる。 Among the compounds that generate an acid upon irradiation with actinic rays or radiation, compounds represented by the following general formulas (ZI), (ZII), and (ZIII) can be exemplified.
Figure JPOXMLDOC01-appb-C000050
Figure JPOXMLDOC01-appb-C000050
 前記一般式(ZI)において、
 R201、R202及びR203は、各々独立に有機基を表す。
 Xは、非求核性アニオンを表し、好ましくはスルホン酸アニオン、カルボン酸アニオン、ビス(アルキルスルホニル)アミドアニオン、トリス(アルキルスルホニル)メチドアニオン、BF 、PF 、SbF などが挙げられ、好ましくは炭素原子を有する有機アニオンである。
 前記一般式(ZII)、(ZIII)中、R204~R207は、各々独立に、アリール基、アルキル基又はシクロアルキル基を表す。Xは、非求核性アニオンを表す。
In the general formula (ZI),
R 201 , R 202 and R 203 each independently represents an organic group.
X represents a non-nucleophilic anion, preferably sulfonate anion, carboxylate anion, bis (alkylsulfonyl) amide anion, tris (alkylsulfonyl) methide anion, BF 4 , PF 6 , SbF 6 An organic anion having a carbon atom is preferable.
In the general formulas (ZII) and (ZIII), R 204 to R 207 each independently represents an aryl group, an alkyl group, or a cycloalkyl group. X represents a non-nucleophilic anion.
 好ましい有機アニオンとしては、下記一般式に示す有機アニオンが挙げられる。 Preferred organic anions include organic anions represented by the following general formula.
Figure JPOXMLDOC01-appb-C000051
Figure JPOXMLDOC01-appb-C000051
 上記一般式に於いて、
 Rcは、有機基を表す。
 Rcにおける有機基として、炭素数1~30のものが挙げられ、好ましくは置換していてもよいアルキル基、シクロアルキル基、アリール基、又はこれらの複数が、単結合、-O-、-CO-、-S-、-SO-、-SON(Rd)-などの連結基で連結された基を挙げることができる。
 Rdは、水素原子又はアルキル基を表す。
 Rc、Rc及びRcは、各々独立に、有機基を表す。
 Rc、Rc及びRcの有機基としては、Rcにおける好ましい有機基と同じものを挙げることができ、好ましくは、炭素数1~4のパーフロロアルキル基である。
 RcとRcが結合して環を形成していてもよい。
 RcとRcが結合して形成される基としてはアルキレン基、シクロアルキレン基、アリーレン基が挙げられる。好ましくは炭素数2~4のパーフロロアルキレン基である。
 Rc及びRc~Rcの有機基として、好ましくは1位がフッ素原子又はフロロアルキル基で置換されたアルキル基、フッ素原子又はフロロアルキル基で置換されたフェニル基である。フッ素原子又はフロロアルキル基を有することにより、光照射によって発生した酸の酸性度が上がり、感度が向上する。また、RcとRcが結合して環を形成することにより光照射によって発生した酸の酸性度が上がり、感度が向上し、好ましい。
In the above general formula,
Rc 1 represents an organic group.
Examples of the organic group in Rc 1 include those having 1 to 30 carbon atoms, and preferably an alkyl group, a cycloalkyl group, an aryl group, or a plurality of these which may be substituted is a single bond, —O—, — And groups linked by a linking group such as CO 2 —, —S—, —SO 3 —, —SO 2 N (Rd 1 ) —.
Rd 1 represents a hydrogen atom or an alkyl group.
Rc 3 , Rc 4 and Rc 5 each independently represents an organic group.
Examples of the organic group for Rc 3 , Rc 4 and Rc 5 include the same organic groups as those for Rc 1 , preferably a perfluoroalkyl group having 1 to 4 carbon atoms.
Rc 3 and Rc 4 may be bonded to form a ring.
Examples of the group formed by combining Rc 3 and Rc 4 include an alkylene group, a cycloalkylene group, and an arylene group. A perfluoroalkylene group having 2 to 4 carbon atoms is preferred.
The organic group of Rc 1 and Rc 3 to Rc 5 is preferably an alkyl group substituted at the 1-position with a fluorine atom or a fluoroalkyl group, or a phenyl group substituted with a fluorine atom or a fluoroalkyl group. By having a fluorine atom or a fluoroalkyl group, the acidity of the acid generated by light irradiation is increased and the sensitivity is improved. Further, Rc 3 and Rc 4 are combined to form a ring, so that the acidity of the acid generated by light irradiation is increased, and the sensitivity is improved, which is preferable.
 一般式(ZI)に於いて、
 R201、R202及びR203としての有機基の炭素数は、一般的に1~30、好ましくは1~20である。R201~R203についての有機基としては、アリール基、アルキル基、シクロアルキル基などが挙げられる。
 また、R201~R203のうち2つが結合して環構造を形成してもよく、環内に酸素原子、硫黄原子、エステル結合、アミド結合、カルボニル基を含んでいてもよい。R201~R203の内の2つが結合して形成する基としては、アルキレン基(例えば、ブチレン基、ペンチレン基)を挙げることができる。
 前記一般式(ZII)、(ZIII)において、R204~R207のアリール基としてはフェニル基、ナフチル基が好ましく、更に好ましくはフェニル基である。R204~R207のアリール基は、酸素原子、窒素原子、硫黄原子等を有する複素環構造を有するアリール基であってもよい。複素環構造を有するアリール基の骨格としては、例えば、ピロール、フラン、チオフェン、インドール、ベンゾフラン、ベンゾチオフェン等を挙げることができる。 
 R204~R207におけるアルキル基及びシクロアルキル基としては、好ましくは、炭素数1~10の直鎖又は分岐アルキル基(例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基)、炭素数3~10のシクロアルキル基(シクロペンチル基、シクロヘキシル基、ノルボニル基)を挙げることができる。
 R204~R207のアリール基、アルキル基、シクロアルキル基は、置換基を有していてもよい。R204~R207のアリール基、アルキル基、シクロアルキル基が有していてもよい置換基としては、例えば、アルキル基(例えば炭素数1~15)、シクロアルキル基(例えば炭素数3~15)、アリール基(例えば炭素数6~15)、アルコキシ基(例えば炭素数1~15)、ハロゲン原子、水酸基、フェニルチオ基等を挙げることができる。
In general formula (ZI),
The organic group as R 201 , R 202 and R 203 generally has 1 to 30 carbon atoms, preferably 1 to 20 carbon atoms. Examples of the organic group for R 201 to R 203 include an aryl group, an alkyl group, and a cycloalkyl group.
Two of R 201 to R 203 may be bonded to form a ring structure, and the ring may contain an oxygen atom, a sulfur atom, an ester bond, an amide bond, or a carbonyl group. Examples of the group formed by combining two of R 201 to R 203 include an alkylene group (eg, butylene group, pentylene group).
In the general formulas (ZII) and (ZIII), the aryl group of R 204 to R 207 is preferably a phenyl group or a naphthyl group, and more preferably a phenyl group. The aryl group of R 204 to R 207 may be an aryl group having a heterocyclic structure having an oxygen atom, a nitrogen atom, a sulfur atom, or the like. Examples of the skeleton of the aryl group having a heterocyclic structure include pyrrole, furan, thiophene, indole, benzofuran, benzothiophene, and the like.
The alkyl group and cycloalkyl group in R 204 to R 207 are preferably a linear or branched alkyl group having 1 to 10 carbon atoms (for example, methyl group, ethyl group, propyl group, butyl group, pentyl group), carbon Examples thereof include cycloalkyl groups having a number of 3 to 10 (cyclopentyl group, cyclohexyl group, norbornyl group).
The aryl group, alkyl group, and cycloalkyl group of R 204 to R 207 may have a substituent. Examples of the substituent that the aryl group, alkyl group, and cycloalkyl group represented by R 204 to R 207 may have include an alkyl group (eg, having 1 to 15 carbon atoms) and a cycloalkyl group (eg, having 3 to 15 carbon atoms). ), Aryl groups (for example, having 6 to 15 carbon atoms), alkoxy groups (for example, having 1 to 15 carbon atoms), halogen atoms, hydroxyl groups, phenylthio groups, and the like.
<トリアリールスルフォニウム塩>
 トリアリールスルホニウム塩は熱安定性、感度の面で特に好ましく、更に増感剤を併用することが好ましい。
 このような化合物は必要に応じて2種類以上併用して使用することができる。
<Triarylsulfonium salt>
Triarylsulfonium salts are particularly preferable in terms of thermal stability and sensitivity, and it is preferable to use a sensitizer in combination.
Two or more kinds of such compounds can be used in combination as required.
 トリアリールスルフォニウム塩は、少なくとも一つのアリール基が電子求引性基を置換基として有することが好ましく、更に、アリール骨格に結合する置換基のハメット値の総和が0.18より大きいことが好ましい。 In the triarylsulfonium salt, it is preferable that at least one aryl group has an electron withdrawing group as a substituent, and the total Hammett value of the substituents bonded to the aryl skeleton is preferably larger than 0.18. .
 ここで、電子求引性基とは、ハメット値(Hammet置換基定数σ)が0より大きい置換基を意味する。本発明においては、高感度化の観点から、特定光酸発生剤中のアリール骨格に結合する置換基のハメット値の総和が0.18以上であることが好ましく、0.46より大きいことがより好ましく、0.60より大きいことが更に好ましい。
 また、ハメット値は、トリアリールスルホニウム塩構造を有するカチオンの電子求引性の程度を表すものであり、高感度化の観点からは特に上限値はないが、反応性と安定性との観点からは、0.46を超え4.0未満であることが好ましく、より好ましくは0.50を超え、3.5未満であり、特に好ましくは0.60を超え3.0未満の範囲である。
Here, the electron withdrawing group means a substituent having a Hammett value (Hammet substituent constant σ) larger than 0. In the present invention, from the viewpoint of high sensitivity, it is preferable that the sum total of the Hammett value is 0.18 or more substituents bonded to aryl skeletons in a particular photoacid generator, and more is greater than 0.46 Preferably, it is more preferably larger than 0.60.
The Hammett value represents the degree of electron withdrawing property of a cation having a triarylsulfonium salt structure, and there is no particular upper limit from the viewpoint of increasing sensitivity, but from the viewpoint of reactivity and stability. Is preferably more than 0.46 and less than 4.0, more preferably more than 0.50 and less than 3.5, and particularly preferably more than 0.60 and less than 3.0.
 なお、本発明におけるハメット値は、稲本直樹 編、化学セミナー10 ハメット則-構造と反応性-(1983年、丸善(株)発行)に記載の数値を用いている。
 アリール骨格に導入する電子求引性基としては、トリフルオロメチル基、ハロゲン原子、エステル基、スルホキシド基、シアノ基、アミド基、カルボキシル基、カルボニル基等が挙げられる。これらの置換基のハメット値を以下に示す。トリフルオロメチル基(-CF、m:0.43、p:0.54)、ハロゲン原子〔例えば、-F(m:0.34、p:0.06)、-Cl(m:0.37、p:0.23)、-Br(m:0.39、p:0.23)、-I(m:0.35、p:0.18)〕、エステル基(例えば、-COCH、o:0.37、p:0.45)、スルホキシド基(例えば、-SOCH、m:0.52、p:0.45)、シアノ基(-CN、m:0.56、p:0.66)、アミド基(例えば、-NHCOCH、m:0.21、p:0.00)、カルボキシ基(-COOH、m:0.37、p:0.45)、カルボニル基(-CHO、m:0.36、p:(043))等が挙げられる。かっこ内は、その置換基のアリール骨格における導入位置と、そのハメット値を表し、(m:0.50)とは、当該置換基がメタ位に導入された時のハメット値が0.50であることを示す。
The Hammett value in the present invention uses the numerical values described in Naoki Inamoto, Chemistry Seminar 10 Hammett's Law-Structure and Reactivity (published by Maruzen Co., Ltd. in 1983).
Examples of the electron withdrawing group introduced into the aryl skeleton include a trifluoromethyl group, a halogen atom, an ester group, a sulfoxide group, a cyano group, an amide group, a carboxyl group, and a carbonyl group. The Hammett values of these substituents are shown below. A trifluoromethyl group (—CF 3 , m: 0.43, p: 0.54), a halogen atom [eg, —F (m: 0.34, p: 0.06), —Cl (m: 0. 37, p: 0.23), -Br (m: 0.39, p: 0.23), -I (m: 0.35, p: 0.18)], an ester group (for example, -COCH 3 , O: 0.37, p: 0.45), sulfoxide group (for example, —SOCH 3 , m: 0.52, p: 0.45), cyano group (—CN, m: 0.56, p: 0.66), an amide group (for example, —NHCOCH 3 , m: 0.21, p: 0.00), a carboxy group (—COOH, m: 0.37, p: 0.45), a carbonyl group (— CHO, m: 0.36, p: (043)) and the like. The parenthesis represents the introduction position of the substituent in the aryl skeleton and the Hammett value, and (m: 0.50) is the Hammett value of 0.50 when the substituent is introduced at the meta position. Indicates that there is.
 これらの置換基のなかでも、疎水性の観点から、ハロゲン原子、ハロゲン化アルキル基等の非イオン性の置換基が好ましく、なかでも、反応性の観点から-Clが好ましく、疎水性を与えるという観点からは、-F、-CF、-Cl、-Brが好ましい。 Among these substituents, nonionic substituents such as a halogen atom and a halogenated alkyl group are preferable from the viewpoint of hydrophobicity. Among them, —Cl is preferable from the viewpoint of reactivity, and imparts hydrophobicity. From the viewpoint, —F, —CF 3 , —Cl, and —Br are preferable.
 これらの置換基は、トリアリールスルホニウム塩構造の3つのアリール骨格のいずれか一つに導入されていてもよく、2以上のアリール骨格に導入されていてもよい。また、3つのアリール骨格のそれぞれに導入される置換基は、1つでも複数でもよい。本発明においては、これらのアリール骨格に導入された置換基のハメット値の総和が0.18を超えるものが好ましく、0.46を越えるものがより好ましい。導入される置換基の数は、任意である。例えば、トリアリールスルホニウム塩構造のアリール骨格のうち1ヶ所に特にハメット値の大きい(例えば、ハメット値が単独で0.46を超える)置換基を1つだけ導入していてもよい。また、例えば、複数の置換基が導入されそれぞれのハメット値の合計が0.46を超えるものを導入してもよい。 These substituents may be introduced into any one of the three aryl skeletons of the triarylsulfonium salt structure, or may be introduced into two or more aryl skeletons. Moreover, the substituent introduced into each of the three aryl skeletons may be one or plural. In the present invention, the sum of Hammett values of substituents introduced into these aryl skeletons is preferably more than 0.18, more preferably more than 0.46. The number of substituents to be introduced is arbitrary. For example, only one substituent having a particularly large Hammett value (for example, a Hammett value exceeding 0.46 alone) may be introduced into one position of an aryl skeleton having a triarylsulfonium salt structure. Moreover, for example, a plurality of substituents introduced and the sum of the Hammett values exceeding 0.46 may be introduced.
 上記のように、置換基のハメット値は導入される位置によって異なるため、本発明に係る特定光酸発生剤におけるハメット値の総和は、置換基の種類、導入位置、導入数により確定されることになる。
 なお、ハメット則は、通常、m位、p位で表されるが、本発明においては、電子求引性の指標として、o位での置換基効果はp位と同値として計算する。好ましい置換位置としては、合成上の観点からm位、p位が好ましく、p位が最も好ましい。
 本発明において好ましいのは、ハロゲン原子により3置換以上されているスルホニウム塩であり、最も好ましいのは、クロロ基により3置換されているスルホニウム塩であり、具体的には、3つのアリール骨格のそれぞれにハロゲン原子、最も好ましくは、-Clが導入されたトリアリールスルホニウム塩構造を有するものが好ましく、-Clがp位に置換されているものがより好ましい。
As described above, since the Hammett value of the substituent varies depending on the position where it is introduced, the sum of Hammett values in the specific photoacid generator according to the present invention is determined by the type of substituent, the position of introduction, and the number of introductions. become.
The Hammett's rule is usually expressed in the m-position and p-position, but in the present invention, the substituent effect at the o-position is calculated as the same value as the p-position as an index of electron withdrawing property. Preferred substitution positions are preferably m-position and p-position, and most preferably p-position from the viewpoint of synthesis.
Preferred in the present invention is a sulfonium salt that is tri- or more substituted with a halogen atom, and most preferred is a sulfonium salt that is tri-substituted with a chloro group, specifically, each of the three aryl skeletons. And preferably have a triarylsulfonium salt structure in which —Cl is introduced, and more preferably —Cl is substituted at the p-position.
 本発明の組成物が含有するトリアリールスルフォニウム塩が有するスルフォン酸アニオンとしては、例えば、アリールスルフォン酸アニオン、アルカンスルフォン酸アニオンなどが挙げられ、フッ素原子又はフッ素原子を有する有機基で置換されているアニオンが好ましい。 Examples of the sulfonate anion possessed by the triarylsulfonium salt contained in the composition of the present invention include an aryl sulfonate anion, an alkane sulfonate anion, and the like, which are substituted with a fluorine atom or an organic group having a fluorine atom. An anion is preferred.
 トリアリールスルホニウム塩構造を有する化合物は、例えば、J.Am.Chem.Soc.第112巻(16)、1990年;pp.6004-6015、J.Org.Chem.1988年;pp.5571-5573、国際公開第02/081439A1号公報、或いは欧州特許(EP)第1113005号明細書等に記載の方法により容易に合成することが可能である。 Examples of the compound having a triarylsulfonium salt structure are J.P. Am. Chem. Soc. 112 (16), 1990; 6004-6015, J.A. Org. Chem. 1988; It can be easily synthesized by the methods described in 5571-5573, WO02 / 081439A1, European Patent (EP) 1113005, and the like.
 以下に具体例を挙げるが、これらに限定されるものではない。 Specific examples are given below, but are not limited thereto.
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000052
Figure JPOXMLDOC01-appb-C000053
Figure JPOXMLDOC01-appb-C000053
 さらに、トリフェニルスルホニウムトリフルオロメタンスルホナート、トリフェニルスルホニウムトリフルオロアセテート、4-メトキシフェニルジフェニルスルホニウムトリフルオロメタンスルホナート、4-メトキシフェニルジフェニルスルホニウムトリフルオロアセテート、4-フェニルチオフェニルジフェニルスルホニウムトリフルオロメタンスルホナート又は4-フェニルチオフェニルジフェニルスルホニウムトリフルオロアセテート等が挙げられる。 Further, triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium trifluoroacetate, 4-methoxyphenyldiphenylsulfonium trifluoromethanesulfonate, 4-methoxyphenyldiphenylsulfonium trifluoroacetate, 4-phenylthiophenyldiphenylsulfonium trifluoromethanesulfonate or 4-phenylthiophenyl diphenylsulfonium trifluoroacetate and the like.
 ジアリールヨードニウム塩類としては、ジフェニルヨードニウムトリフルオロアセテート、ジフェニルヨードニウムトリフルオロメタンスルホナート、4-メトキシフェニルフェニルヨードニウムトリフルオロメタンスルホナート、4-メトキシフェニルフェニルヨードニウムトリフルオロアセテート、フェニル,4-(2’-ヒドロキシ-1’-テトラデカオキシ)フェニルヨードニウムトリフルオロメタンスルホナート、4-(2’-ヒドロキシ-1’-テトラデカオキシ)フェニルヨードニウムヘキサフルオロアンチモナート、フェニル,4-(2’-ヒドロキシ-1’-テトラデカオキシ)フェニルヨードニウム-p-トルエンスルホナート等;ジアゾメタン誘導体として、ビス(シクロヘキシルスルホニル)ジアゾメタン、ビス(t-ブチルスルホニル)ジアゾメタン、ビス(p-トルエンスルホニル)ジアゾメタン等;
 イミドスルホネート誘導体として、トリフルオロメチルスルホニルオキシビシクロ[2.2.1]ヘプト-5-エンジカルボキシイミド、スクシンイミドトリフルオロメチルスルホネート、フタルイミドp-トルエンスルホネート、フタルイミドトリフルオロメチルスルホネート、N-ヒドロキシナフタルイミドメタンスルホネート、N-ヒドロキシ-5-ノルボルネン-2,3-ジカルボキシイミドプロパンスルホネート等が挙げられる。
Examples of diaryliodonium salts include diphenyliodonium trifluoroacetate, diphenyliodonium trifluoromethanesulfonate, 4-methoxyphenylphenyliodonium trifluoromethanesulfonate, 4-methoxyphenylphenyliodonium trifluoroacetate, phenyl, 4- (2'-hydroxy- 1'-tetradecaoxy) phenyliodonium trifluoromethanesulfonate, 4- (2'-hydroxy-1'-tetradecoxy) phenyliodonium hexafluoroantimonate, phenyl, 4- (2'-hydroxy-1'-tetra Decaoxy) phenyliodonium-p-toluenesulfonate, etc .; diazomethane derivatives such as bis (cyclohexylsulfonyl) diazomethane, bis (t-butyl) Sulfonyl) diazomethane, bis (p- toluenesulfonyl) diazomethane;
Examples of imide sulfonate derivatives include trifluoromethylsulfonyloxybicyclo [2.2.1] hept-5-enedicarboximide, succinimide trifluoromethyl sulfonate, phthalimide p-toluene sulfonate, phthalimide trifluoromethyl sulfonate, N-hydroxynaphthalimide methane. Examples thereof include sulfonate, N-hydroxy-5-norbornene-2,3-dicarboximide propane sulfonate, and the like.
 また、活性光線又は放射線の照射により酸を発生する化合物の中で、感度、解像性、誘電率、寸法安定性などの観点で、最も好ましいものの例としてオキシム化合物、より好ましくはオキシムスルホネート化合物を挙げることができる。 Among compounds that generate an acid upon irradiation with actinic rays or radiation, oxime compounds, more preferably oxime sulfonate compounds, are the most preferable examples from the viewpoint of sensitivity, resolution, dielectric constant, dimensional stability, and the like. Can be mentioned.
 オキシムスルホネート化合物、すなわち、オキシムスルホネート残基を有する化合物としては、式(b1)で表されるオキシムスルホネート残基を含有する化合物が好ましく例示できる。 Preferred examples of the oxime sulfonate compound, that is, the compound having an oxime sulfonate residue include compounds containing an oxime sulfonate residue represented by the formula (b1).
Figure JPOXMLDOC01-appb-C000054
Figure JPOXMLDOC01-appb-C000054
(式(b1)中、Rは、アルキル基又はアリール基を表す。)
 いずれの基も置換されてもよく、Rにおけるアルキル基は直鎖状でも分岐状でも環状でもよい。許容される置換基は以下に説明する。
 Rのアルキル基としては、炭素数1~10の、直鎖状又は分岐状アルキル基が好ましい。Rのアルキル基は、炭素数6~11のアリール基、炭素数1~10のアルコキシ基、又は、シクロアルキル基(7,7-ジメチル-2-オキソノルボルニル基などの有橋式脂環基を含む、好ましくはビシクロアルキル基等)で置換されてもよい。
 Rのアリール基としては、炭素数6~11のアリール基が好ましく、フェニル基又はナフチル基がより好ましい。Rのアリール基は、低級アルキル基、アルコキシ基あるいはハロゲン原子で置換されてもよい。
(In formula (b1), R 5 represents an alkyl group or an aryl group.)
Any group may be substituted, and the alkyl group in R 5 may be linear, branched or cyclic. Acceptable substituents are described below.
The alkyl group for R 5 is preferably a linear or branched alkyl group having 1 to 10 carbon atoms. The alkyl group represented by R 5 is an aryl group having 6 to 11 carbon atoms, an alkoxy group having 1 to 10 carbon atoms, or a cycloalkyl group (7,7-dimethyl-2-oxonorbornyl group or the like). It may be substituted with a cyclic group, preferably a bicycloalkyl group or the like.
The aryl group for R 5 is preferably an aryl group having 6 to 11 carbon atoms, more preferably a phenyl group or a naphthyl group. The aryl group for R 5 may be substituted with a lower alkyl group, an alkoxy group or a halogen atom.
 前記式(b1)で表されるオキシムスルホネート残基を含有する化合物としては、式(OS-3)、式(OS-4)又は式(OS-5)で表されるオキシムスルホネート化合物であることが特に好ましい。 The compound containing the oxime sulfonate residue represented by the formula (b1) is an oxime sulfonate compound represented by the formula (OS-3), the formula (OS-4) or the formula (OS-5). Is particularly preferred.
Figure JPOXMLDOC01-appb-C000055
Figure JPOXMLDOC01-appb-C000055
(式(OS-3)~式(OS-5)中、Rはアルキル基、アリール基又はヘテロアリール基を表し、Rはそれぞれ独立に、水素原子、アルキル基、アリール基又はハロゲン原子を表し、Rはそれぞれ独立に、ハロゲン原子、アルキル基、アルキルオキシ基、スルホン酸基、アミノスルホニル基又はアルコキシスルホニル基を表し、XはO又はSを表し、nは1又は2を表し、mは0~6の整数を表す。) (In the formulas (OS-3) to (OS-5), R 1 represents an alkyl group, an aryl group or a heteroaryl group, and each R 2 independently represents a hydrogen atom, an alkyl group, an aryl group or a halogen atom. R 6 represents each independently a halogen atom, an alkyl group, an alkyloxy group, a sulfonic acid group, an aminosulfonyl group or an alkoxysulfonyl group, X represents O or S, n represents 1 or 2, m Represents an integer of 0 to 6.)
 前記式(OS-3)~(OS-5)中、Rにおけるアルキル基、アリール基又はヘテロアリール基は、置換基を有していてもよい。
 前記式(OS-3)~(OS-5)中、Rにおけるアルキル基としては、置換基を有していてもよい総炭素数1~30のアルキル基であることが好ましい。
 Rにおけるアルキル基が有していてもよい置換基としては、ハロゲン原子、アルキルオキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、アルキルオキシカルボニル基、アリールオキシカルボニル基、アミノカルボニル基が挙げられる。
In the formulas (OS-3) to (OS-5), the alkyl group, aryl group or heteroaryl group in R 1 may have a substituent.
In the formula (OS-3) ~ (OS -5), the alkyl group in R 1, is preferably a alkyl group having 1 atoms in total may be carbon 30 have a substituent.
Examples of the substituent that the alkyl group in R 1 may have include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group. .
 Rにおけるアルキル基としては、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、n-ヘキシル基、n-オクチル基、n-デシル基、n-ドデシル基、トリフルオロメチル基、パーフルオロプロピル基、パーフルオロヘキシル基、ベンジル基が挙げられる。 Examples of the alkyl group in R 1 include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -Octyl group, n-decyl group, n-dodecyl group, trifluoromethyl group, perfluoropropyl group, perfluorohexyl group, benzyl group.
 また、前記式(OS-3)~(OS-5)中、Rにおけるアリール基としては、置換基を有してもよい総炭素数6~30のアリール基が好ましい。
 Rにおけるアリール基が有していてもよい置換基としては、ハロゲン原子、アルキル基、アルキルオキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、アルキルオキシカルボニル基、アリールオキシカルボニル基、アミノカルボニル基、スルホン酸基、アミノスルホニル基、アルコキシスルホニル基が挙げられる。
In the formulas (OS-3) to (OS-5), the aryl group for R 1 is preferably an aryl group having 6 to 30 carbon atoms which may have a substituent.
Examples of the substituent that the aryl group in R 1 may have include a halogen atom, an alkyl group, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group. , A sulfonic acid group, an aminosulfonyl group, and an alkoxysulfonyl group.
 Rにおけるアリール基としては、フェニル基、p-メチルフェニル基、p-クロロフェニル基、ペンタクロロフェニル基、ペンタフルオロフェニル基、o-メトキシフェニル基、p-フェノキシフェニル基が挙げられる。 The aryl group in R 1, a phenyl group, p- methylphenyl group, p- chlorophenyl group, pentachlorophenyl group, pentafluorophenyl group, o- methoxyphenyl groups include p- phenoxyphenyl group.
 また、前記式(OS-3)~(OS-5)中、Rにおけるヘテロアリール基としては、置換基を有してもよい総炭素数4~30のヘテロアリール基が好ましい。
 Rにおけるヘテロアリール基が有していてもよい置換基としては、ハロゲン原子、アルキル基、アルキルオキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、アルキルオキシカルボニル基、アリールオキシカルボニル基、アミノカルボニル基、スルホン酸基、アミノスルホニル基、アルコキシスルホニル基が挙げられる。
In the formulas (OS-3) to (OS-5), the heteroaryl group for R 1 is preferably a heteroaryl group having 4 to 30 carbon atoms which may have a substituent.
Examples of the substituent that the heteroaryl group in R 1 may have include a halogen atom, an alkyl group, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl. Group, sulfonic acid group, aminosulfonyl group and alkoxysulfonyl group.
 前記式(OS-3)~(OS-5)中、Rにおけるヘテロアリール基は、少なくとも1つの環が複素芳香環であればよく、例えば、複素芳香環とベンゼン環とが縮環していてもよい。
 Rにおけるヘテロアリール基としては、置換基を有していてもよい、チオフェン環、ピロール環、チアゾール環、イミダゾール環、フラン環、ベンゾチオフェン環、ベンゾチアゾール環及びベンゾイミダゾール環よりなる群から選ばれた環から1つの水素原子を除いた基が挙げられる。
In the above formulas (OS-3) to (OS-5), at least one of the heteroaryl groups in R 1 may be a heteroaromatic ring. For example, a heteroaromatic ring and a benzene ring are condensed. May be.
The heteroaryl group for R 1 is selected from the group consisting of optionally substituted thiophene ring, pyrrole ring, thiazole ring, imidazole ring, furan ring, benzothiophene ring, benzothiazole ring and benzimidazole ring. And a group obtained by removing one hydrogen atom from the ring.
 前記式(OS-3)~(OS-5)中、Rは、水素原子、アルキル基又はアリール基であることが好ましく、水素原子又はアルキル基であることがより好ましい。
 前記式(OS-3)~(OS-5)中、化合物中に2以上存在するRのうち、1つ又は2つがアルキル基、アリール基又はハロゲン原子であることが好ましく、1つがアルキル基、アリール基又はハロゲン原子であることがより好ましく、1つがアルキル基であり、かつ残りが水素原子であることが特に好ましい。
 前記式(OS-3)~(OS-5)中、Rにおけるアルキル基又はアリール基は、置換基を有していてもよい。Rにおけるアルキル基又はアリール基が有していてもよい置換基としては、前記Rにおけるアルキル基又はアリール基が有していてもよい置換基と同様の基が例示できる。
In the formulas (OS-3) to (OS-5), R 2 is preferably a hydrogen atom, an alkyl group or an aryl group, and more preferably a hydrogen atom or an alkyl group.
In the formulas (OS-3) to (OS-5), it is preferred that one or two of R 2 present in the compound is an alkyl group, an aryl group or a halogen atom, and one is an alkyl group. More preferably an aryl group or a halogen atom, and particularly preferably one is an alkyl group and the rest is a hydrogen atom.
In the formulas (OS-3) to (OS-5), the alkyl group or aryl group in R 2 may have a substituent. Examples of the substituent that the alkyl group or aryl group in R 2 may have include the same groups as the substituent that the alkyl group or aryl group in R 1 may have.
 Rにおけるアルキル基としては、置換基を有してもよい総炭素数1~12のアルキル基であることが好ましく、置換基を有してもよい総炭素数1~6のアルキル基であることがより好ましい。
 Rにおけるアルキル基としては、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、i-ブチル基、s-ブチル基、n-ヘキシル基、アリル基、クロロメチル基、ブロモメチル基、メトキシメチル基、ベンジル基が好ましく、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、i-ブチル基、s-ブチル基、n-ヘキシル基が好ましく、メチル基、エチル基、n-プロピル基、n-ブチル基、n-ヘキシル基が更に好ましく、メチル基が好ましい。
The alkyl group for R 2 is preferably an alkyl group having 1 to 12 carbon atoms which may have a substituent, and is an alkyl group having 1 to 6 carbon atoms which may have a substituent. It is more preferable.
Examples of the alkyl group in R 2 include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, i-butyl group, s-butyl group, n-hexyl group, allyl group, and chloromethyl group. , A bromomethyl group, a methoxymethyl group, and a benzyl group are preferable, and a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an i-butyl group, an s-butyl group, and an n-hexyl group are preferable. A methyl group, an ethyl group, an n-propyl group, an n-butyl group, and an n-hexyl group are more preferable, and a methyl group is preferable.
 Rにおけるアリール基としては、置換基を有してもよい総炭素数6~30のアリール基であることが好ましい。
 Rにおけるアリール基として具体的には、フェニル基、p-メチルフェニル基、o-クロロフェニル基、p-クロロフェニル基、o-メトキシフェニル基、p-フェノキシフェニル基が好ましい。
 Rにおけるハロゲン原子としては、フッ素原子、塩素原子、臭素原子、ヨウ素原子が挙げられる。
 これらの中でも、塩素原子、臭素原子が好ましい。
The aryl group for R 2 is preferably an aryl group having 6 to 30 carbon atoms which may have a substituent.
Specifically, the aryl group in R 2 is preferably a phenyl group, a p-methylphenyl group, an o-chlorophenyl group, a p-chlorophenyl group, an o-methoxyphenyl group, or a p-phenoxyphenyl group.
Examples of the halogen atom for R 2 include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
Among these, a chlorine atom and a bromine atom are preferable.
 前記式(OS-3)~(OS-5)中、XはO又はSを表し、Oであることが好ましい。
 式(OS-3)~(OS-5)において、Xを環員として含む環は、5員環又は6員環である。
 前記式(OS-3)~(OS-5)中、nは1又は2を表し、XがOである場合、nは1であることが好ましく、また、XがSである場合、nは2であることが好ましい。
In the formulas (OS-3) to (OS-5), X represents O or S, and is preferably O.
In formulas (OS-3) to (OS-5), the ring containing X as a ring member is a 5-membered ring or a 6-membered ring.
In the formulas (OS-3) to (OS-5), n represents 1 or 2, and when X is O, n is preferably 1, and when X is S, n is 2 is preferable.
 前記式(OS-3)~(OS-5)中、Rにおけるアルキル基及びアルキルオキシ基は、置換基を有していてもよい。
 前記式(OS-3)~(OS-5)中、Rにおけるアルキル基としては、置換基を有していてもよい総炭素数1~30のアルキル基であることが好ましい。
 Rにおけるアルキル基が有していてもよい置換基としては、ハロゲン原子、アルキルオキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、アルキルオキシカルボニル基、アリールオキシカルボニル基、アミノカルボニル基が挙げられる。
In the formulas (OS-3) to (OS-5), the alkyl group and alkyloxy group in R 6 may have a substituent.
In the formulas (OS-3) to (OS-5), the alkyl group for R 6 is preferably an alkyl group having 1 to 30 carbon atoms which may have a substituent.
Examples of the substituent that the alkyl group in R 6 may have include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, and an aminocarbonyl group. .
 Rにおけるアルキル基としては、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、n-ヘキシル基、n-オクチル基、n-デシル基、n-ドデシル基、トリフルオロメチル基、パーフルオロプロピル基、パーフルオロヘキシル基、ベンジル基が好ましい。 Examples of the alkyl group for R 6 include methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, s-butyl group, t-butyl group, n-pentyl group, n-hexyl group, n -Octyl, n-decyl, n-dodecyl, trifluoromethyl, perfluoropropyl, perfluorohexyl and benzyl are preferred.
 前記式(OS-3)~(OS-5)中、Rにおけるアルキルオキシ基としては、置換基を有してもよい総炭素数1~30のアルキルオキシ基であることが好ましい。
 Rにおけるアルキルオキシ基が有していてもよい置換基としては、ハロゲン原子、アルキルオキシ基、アリールオキシ基、アルキルチオ基、アリールチオ基、アルキルオキシカルボニル基、アリールオキシカルボニル基、アミノカルボニル基が挙げられる。
In the formula (OS-3) ~ (OS -5), the alkyl group in R 6, is preferably an alkyl group having a total carbon number of 1 to 30 which may have a substituent.
Examples of the substituent that the alkyl group optionally has at R 6, include a halogen atom, an alkyloxy group, an aryloxy group, an alkylthio group, an arylthio group, an alkyloxycarbonyl group, an aryloxycarbonyl group, an amino group It is done.
 Rにおけるアルキルオキシ基としては、メチルオキシ基、エチルオキシ基、ブチルオキシ基、ヘキシルオキシ基、フェノキシエチルオキシ基、トリクロロメチルオキシ基、又は、エトキシエチルオキシ基が好ましい。
 前記式(OS-3)~(OS-5)中、Rにおけるアミノスルホニル基としては、メチルアミノスルホニル基、ジメチルアミノスルホニル基、フェニルアミノスルホニル基、メチルフェニルアミノスルホニル基、アミノスルホニル基が挙げられる。
 前記式(OS-3)~(OS-5)中、Rにおけるアルコキシスルホニル基としては、メトキシスルホニル基、エトキシスルホニル基、プロピルオキシスルホニル基、ブチルオキシスルホニル基が挙げられる。
As the alkyloxy group in R 6 , a methyloxy group, an ethyloxy group, a butyloxy group, a hexyloxy group, a phenoxyethyloxy group, a trichloromethyloxy group, or an ethoxyethyloxy group is preferable.
In the above formulas (OS-3) to (OS-5), examples of the aminosulfonyl group for R 6 include a methylaminosulfonyl group, a dimethylaminosulfonyl group, a phenylaminosulfonyl group, a methylphenylaminosulfonyl group, and an aminosulfonyl group. It is done.
In the above formulas (OS-3) to (OS-5), examples of the alkoxysulfonyl group for R 6 include a methoxysulfonyl group, an ethoxysulfonyl group, a propyloxysulfonyl group, and a butyloxysulfonyl group.
 また、前記式(OS-3)~(OS-5)中、mは0~6の整数を表し、0~2の整数であることが好ましく、0又は1であることがより好ましく、0であることが特に好ましい。 In the formulas (OS-3) to (OS-5), m represents an integer of 0 to 6, preferably an integer of 0 to 2, more preferably 0 or 1, and 0. It is particularly preferred.
 また、前記式(b1)で表されるオキシムスルホネート残基を含有する化合物は、下記式(OS-6)~(OS-11)のいずれかで表されるオキシムスルホネート化合物であることが特に好ましい。 The compound containing an oxime sulfonate residue represented by the formula (b1) is particularly preferably an oxime sulfonate compound represented by any one of the following formulas (OS-6) to (OS-11). .
Figure JPOXMLDOC01-appb-C000056
Figure JPOXMLDOC01-appb-C000056
(式(OS-6)~(OS-11)中、Rはアルキル基、アリール基又はヘテロアリール基を表し、Rは、水素原子又は臭素原子を表し、Rは水素原子、炭素数1~8のアルキル基、ハロゲン原子、クロロメチル基、ブロモメチル基、ブロモエチル基、メトキシメチル基、フェニル基又はクロロフェニル基を表し、Rは水素原子、ハロゲン原子、メチル基又はメトキシ基を表し、R10は水素原子又はメチル基を表す。) (In the formulas (OS-6) to (OS-11), R 1 represents an alkyl group, an aryl group, or a heteroaryl group, R 7 represents a hydrogen atom or a bromine atom, R 8 represents a hydrogen atom, Represents an alkyl group of 1 to 8, a halogen atom, a chloromethyl group, a bromomethyl group, a bromoethyl group, a methoxymethyl group, a phenyl group or a chlorophenyl group; R 9 represents a hydrogen atom, a halogen atom, a methyl group or a methoxy group; 10 represents a hydrogen atom or a methyl group.)
 式(OS-6)~(OS-11)におけるRは、前記式(OS-3)~(OS-5)におけるRと同義であり、好ましい態様も同様である。
 式(OS-6)におけるRは、水素原子又は臭素原子を表し、水素原子であることが好ましい。
 式(OS-6)~(OS-11)におけるRは、水素原子、炭素数1~8のアルキル基、ハロゲン原子、クロロメチル基、ブロモメチル基、ブロモエチル基、メトキシメチル基、フェニル基又はクロロフェニル基を表し、炭素数1~8のアルキル基、ハロゲン原子又はフェニル基であることが好ましく、炭素数1~8のアルキル基であることがより好ましく、炭素数1~6のアルキル基であることが更に好ましく、メチル基であることが特に好ましい。式(OS-8)及び式(OS-9)におけるRは、水素原子、ハロゲン原子、メチル基又はメトキシ基を表し、水素原子であることが好ましい。
 式(OS-8)~(OS-11)におけるR10は、水素原子又はメチル基を表し、水素原子であることが好ましい。
 また、前記オキシムスルホネート化合物において、オキシムの立体構造(E,Z)については、どちらか一方であっても、混合物であってもよい。
R 1 in the formulas (OS-6) to (OS-11) has the same meaning as R 1 in the formulas (OS-3) to (OS-5), and preferred embodiments thereof are also the same.
R 7 in formula (OS-6) represents a hydrogen atom or a bromine atom, and is preferably a hydrogen atom.
R 8 in the formulas (OS-6) to (OS-11) is a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, a halogen atom, a chloromethyl group, a bromomethyl group, a bromoethyl group, a methoxymethyl group, a phenyl group or a chlorophenyl Represents an alkyl group having 1 to 8 carbon atoms, a halogen atom or a phenyl group, more preferably an alkyl group having 1 to 8 carbon atoms, and an alkyl group having 1 to 6 carbon atoms. Is more preferable, and a methyl group is particularly preferable. R 9 in formula (OS-8) and formula (OS-9) represents a hydrogen atom, a halogen atom, a methyl group or a methoxy group, and is preferably a hydrogen atom.
R 10 in the formulas (OS-8) to (OS-11) represents a hydrogen atom or a methyl group, and is preferably a hydrogen atom.
In the oxime sulfonate compound, the oxime steric structure (E, Z) may be either one or a mixture.
 前記式(OS-3)~式(OS-5)で表されるオキシムスルホネート化合物の具体例としては、下記例示化合物が挙げられるが、本発明は、これらに限定されるものではない。 Specific examples of the oxime sulfonate compounds represented by the above formulas (OS-3) to (OS-5) include the following exemplified compounds, but the present invention is not limited thereto.
Figure JPOXMLDOC01-appb-C000057
Figure JPOXMLDOC01-appb-C000057
Figure JPOXMLDOC01-appb-C000058
Figure JPOXMLDOC01-appb-C000058
Figure JPOXMLDOC01-appb-C000059
Figure JPOXMLDOC01-appb-C000059
Figure JPOXMLDOC01-appb-C000060
Figure JPOXMLDOC01-appb-C000060
Figure JPOXMLDOC01-appb-C000061
Figure JPOXMLDOC01-appb-C000061
Figure JPOXMLDOC01-appb-C000062
Figure JPOXMLDOC01-appb-C000062
Figure JPOXMLDOC01-appb-C000063
Figure JPOXMLDOC01-appb-C000063
 式(b1)で表されるオキシムスルホネート残基を含有する上記化合物としては、式(OS-1)で表される化合物であることも好ましい。 The compound containing an oxime sulfonate residue represented by the formula (b1) is also preferably a compound represented by the formula (OS-1).
Figure JPOXMLDOC01-appb-C000064
Figure JPOXMLDOC01-appb-C000064
 上記一般式(OS-1)中、Rは、水素原子、アルキル基、アルケニル基、アルコキシ基、アルコキシカルボニル基、アシル基、カルバモイル基、スルファモイル基、スルホ基、シアノ基、アリール基又はヘテロアリール基を表す。Rは、アルキル基又はアリール基を表す。 In the general formula (OS-1), R 1 represents a hydrogen atom, an alkyl group, an alkenyl group, an alkoxy group, an alkoxycarbonyl group, an acyl group, a carbamoyl group, a sulfamoyl group, a sulfo group, a cyano group, an aryl group, or a heteroaryl. Represents a group. R 2 represents an alkyl group or an aryl group.
 Xは-O-、-S-、-NH-、-NR-、-CH-、-CRH-又は-CR-を表し、R~Rはアルキル基又はアリール基を表す。
 R21~R24は、それぞれ独立に、水素原子、ハロゲン原子、アルキル基、アルケニル基、アルコキシ基、アミノ基、アルコキシカルボニル基、アルキルカルボニル基、アリールカルボニル基、アミド基、スルホ基、シアノ基又はアリール基を表す。R21~R24のうち2つは、それぞれ互いに結合して環を形成してもよい。
 R21~R24としては、水素原子、ハロゲン原子及びアルキル基が好ましく、また、R21~R24のうち少なくとも2つが互いに結合してアリール基を形成する態様もまた、好ましく挙げられる。中でも、R21~R24がいずれも水素原子である態様が感度の観点から好ましい。
 既述の官能基は、いずれも、更に置換基を有していてもよい。
X is -O -, - S -, - NH -, - NR 5 -, - CH 2 -, - CR 6 H- or -CR 6 R 7 - represents, R 5 ~ R 7 is an alkyl group or an aryl group Represents.
R 21 to R 24 are each independently a hydrogen atom, halogen atom, alkyl group, alkenyl group, alkoxy group, amino group, alkoxycarbonyl group, alkylcarbonyl group, arylcarbonyl group, amide group, sulfo group, cyano group or Represents an aryl group. Two of R 21 to R 24 may be bonded to each other to form a ring.
As R 21 to R 24 , a hydrogen atom, a halogen atom and an alkyl group are preferable, and an embodiment in which at least two of R 21 to R 24 are bonded to each other to form an aryl group is also preferable. Among these, an embodiment in which R 21 to R 24 are all hydrogen atoms is preferable from the viewpoint of sensitivity.
Any of the aforementioned functional groups may further have a substituent.
 前記式(OS-1)で表される化合物は、下記式(OS-2)で表される化合物であることがより好ましい。 The compound represented by the formula (OS-1) is more preferably a compound represented by the following formula (OS-2).
Figure JPOXMLDOC01-appb-C000065
Figure JPOXMLDOC01-appb-C000065
 前記式(OS-2)中、R、R、R21~R24は、それぞれ式(OS-1)におけるのと同義であり、好ましい例もまた同様である。
 これらの中でも、式(OS-1)及び式(OS-2)におけるRがシアノ基又はアリール基である態様がより好ましく、式(OS-2)で表され、Rがシアノ基、フェニル基又はナフチル基である態様が最も好ましい。
In the formula (OS-2), R 1 , R 2 and R 21 to R 24 have the same meanings as in the formula (OS-1), and preferred examples thereof are also the same.
Among these, an embodiment in which R 1 in the formula (OS-1) and the formula (OS-2) is a cyano group or an aryl group is more preferable, represented by the formula (OS-2), in which R 1 is a cyano group, phenyl The embodiment which is a group or a naphthyl group is most preferred.
 また、前記オキシムスルホネート化合物において、オキシムやベンゾチアゾール環の立体構造(E,Z等)についてはそれぞれ、どちらか一方であっても、混合物であってもよい。 In the oxime sulfonate compound, the steric structure (E, Z, etc.) of the oxime or benzothiazole ring may be either one or a mixture.
 以下に、本発明に好適に用いうる式(OS-1)で表される化合物の具体例(例示化合物b-1~b-34)を示すが、本発明はこれに限定されない。なお、Meはメチル基を表し、Etはエチル基を表し、Bnはベンジル基を表し、Phはフェニル基を表す。 Specific examples (exemplary compounds b-1 to b-34) of the compound represented by the formula (OS-1) that can be suitably used in the present invention are shown below, but the present invention is not limited thereto. Me represents a methyl group, Et represents an ethyl group, Bn represents a benzyl group, and Ph represents a phenyl group.
Figure JPOXMLDOC01-appb-C000066
Figure JPOXMLDOC01-appb-C000066
Figure JPOXMLDOC01-appb-C000067
Figure JPOXMLDOC01-appb-C000067
Figure JPOXMLDOC01-appb-C000068
Figure JPOXMLDOC01-appb-C000068
Figure JPOXMLDOC01-appb-C000069
Figure JPOXMLDOC01-appb-C000069
 上記化合物の中でも、感度と安定性との両立の観点から、b-9、b-16、b-31、b-33が好ましい。 Among the above compounds, b-9, b-16, b-31, and b-33 are preferable from the viewpoint of achieving both sensitivity and stability.
 式(b1)で表されるオキシムスルホネート残基を含有する上記化合物は、下記式(b2)で表されるオキシムスルホネート化合物であってもよい。 The above compound containing an oxime sulfonate residue represented by the formula (b1) may be an oxime sulfonate compound represented by the following formula (b2).
Figure JPOXMLDOC01-appb-C000070
Figure JPOXMLDOC01-appb-C000070
(式(b2)中、Rは、アルキル基又はアリール基を表し、Xは、アルキル基、アルコキシ基又はハロゲン原子を表し、mは、0~3の整数を表し、mが2又は3であるとき、複数のXは同一でも異なっていてもよい。) (In the formula (b2), R 5 represents an alkyl group or an aryl group, X represents an alkyl group, an alkoxy group, or a halogen atom, m represents an integer of 0 to 3, and m is 2 or 3. In some cases, multiple Xs may be the same or different.)
 Xとしてのアルキル基は、炭素数1~4の直鎖状又は分岐状アルキル基が好ましい。
 Xとしてのアルコキシ基は、炭素数1~4の直鎖状又は分岐状アルコキシ基が好ましい。
 Xとしてのハロゲン原子は、塩素原子又はフッ素原子が好ましい。
 mは、0又は1が好ましい。
 式(b2)中、mが1であり、Xがメチル基であり、Xの置換位置がオルト位であり、Rが炭素数1~10の直鎖状アルキル基、7,7-ジメチル-2-オキソノルボルニルメチル基、又はp-トルイル基である化合物が特に好ましい。
The alkyl group as X is preferably a linear or branched alkyl group having 1 to 4 carbon atoms.
The alkoxy group as X is preferably a linear or branched alkoxy group having 1 to 4 carbon atoms.
The halogen atom as X is preferably a chlorine atom or a fluorine atom.
m is preferably 0 or 1.
In the formula (b2), m is 1, X is a methyl group, the substitution position of X is the ortho position, R 5 is a linear alkyl group having 1 to 10 carbon atoms, 7,7-dimethyl- A compound that is a 2-oxonorbornylmethyl group or a p-toluyl group is particularly preferred.
 式(b1)で表されるオキシムスルホネート残基を含有する化合物は、式(b3)で表されるオキシムスルホネート化合物であってもよい。 The compound containing an oxime sulfonate residue represented by the formula (b1) may be an oxime sulfonate compound represented by the formula (b3).
Figure JPOXMLDOC01-appb-C000071
Figure JPOXMLDOC01-appb-C000071
(式(b3)中、Rは式(b1)におけるRと同義であり、X’は、ハロゲン原子、水酸基、炭素数1~4のアルキル基、炭素数1~4のアルコキシ基、シアノ基又はニトロ基を表し、Lは0~5の整数を表す。) (In the formula (b3), R 5 has the same meaning as R 5 in the formula (b1), X 'is a halogen atom, a hydroxyl group, an alkyl group having 1 to 4 carbon atoms, alkoxy group having 1 to 4 carbon atoms, cyano Represents a group or a nitro group, and L represents an integer of 0 to 5.)
 式(b3)におけるRとしては、メチル基、エチル基、n-プロピル基、n-ブチル基、n-オクチル基、トリフルオロメチル基、ペンタフルオロエチル基、パーフルオロ-n-プロピル基、パーフルオロ-n-ブチル基、p-トリル基、4-クロロフェニル基又はペンタフルオロフェニル基が好ましく、n-オクチル基が特に好ましい。
 X’としては、炭素数1~5のアルコキシ基が好ましく、メトキシ基がより好ましい。
 Lとしては、0~2が好ましく、0~1が特に好ましい。
R 5 in the formula (b3) is methyl, ethyl, n-propyl, n-butyl, n-octyl, trifluoromethyl, pentafluoroethyl, perfluoro-n-propyl, perfluoro A fluoro-n-butyl group, p-tolyl group, 4-chlorophenyl group or pentafluorophenyl group is preferred, and an n-octyl group is particularly preferred.
X ′ is preferably an alkoxy group having 1 to 5 carbon atoms, and more preferably a methoxy group.
L is preferably from 0 to 2, particularly preferably from 0 to 1.
 式(b3)で表される化合物の具体例としては、α-(メチルスルホニルオキシイミノ)ベンジルシアニド、α-(エチルスルホニルオキシイミノ)ベンジルシアニド、α-(n-プロピルスルホニルオキシイミノ)ベンジルシアニド、α-(n-ブチルスルホニルオキシイミノ)ベンジルシアニド、α-(4-トルエンスルホニルオキシイミノ)ベンジルシアニド、α-〔(メチルスルホニルオキシイミノ)-4-メトキシフェニル〕アセトニトリル、α-〔(エチルスルホニルオキシイミノ)-4-メトキシフェニル〕アセトニトリル、α-〔(n-プロピルスルホニルオキシイミノ)-4-メトキシフェニル〕アセトニトリル、α-〔(n-ブチルスルホニルオキシイミノ)-4-メトキシフェニル〕アセトニトリル、α-〔(4-トルエンスルホニルオキシイミノ)-4-メトキシフェニル〕アセトニトリルを挙げることができる。 Specific examples of the compound represented by the formula (b3) include α- (methylsulfonyloxyimino) benzyl cyanide, α- (ethylsulfonyloxyimino) benzyl cyanide, α- (n-propylsulfonyloxyimino) benzyl. Cyanide, α- (n-butylsulfonyloxyimino) benzyl cyanide, α- (4-toluenesulfonyloxyimino) benzyl cyanide, α-[(methylsulfonyloxyimino) -4-methoxyphenyl] acetonitrile, α- [(Ethylsulfonyloxyimino) -4-methoxyphenyl] acetonitrile, α-[(n-propylsulfonyloxyimino) -4-methoxyphenyl] acetonitrile, α-[(n-butylsulfonyloxyimino) -4-methoxyphenyl ] Acetonitrile, α-[(4-True Can be exemplified sulfonyl) -4-methoxyphenyl] acetonitrile.
 好ましいオキシムスルホネート化合物の具体例としては、下記化合物(i)~(viii)等が挙げられ、1種単独で使用したり、又は、2種類以上を併用することができる。化合物(i)~(viii)は、市販品として、入手することができる。また、他の種類の(C)感放射線酸発生剤と組み合わせて使用することもできる。 Specific examples of preferable oxime sulfonate compounds include the following compounds (i) to (viii), and the like can be used singly or in combination of two or more. Compounds (i) to (viii) can be obtained as commercial products. It can also be used in combination with other types of (C) radiation-sensitive acid generators.
Figure JPOXMLDOC01-appb-C000072
Figure JPOXMLDOC01-appb-C000072
 本発明の感光性樹脂組成物において、光酸発生剤の含有量は、感光性樹脂組成物の全固形分を基準として、1~30質量%が好ましく、3~20質量%がより好ましい。 In the photosensitive resin composition of the present invention, the content of the photoacid generator is preferably 1 to 30% by mass, more preferably 3 to 20% by mass based on the total solid content of the photosensitive resin composition.
 酸発生剤は、1種単独で又は2種以上を組み合わせて使用することができる。2種以上を組み合わせて使用する際には、水素原子を除く全原子数が2以上異なる2種の有機酸を発生する化合物を組み合わせることが好ましい。 The acid generator can be used alone or in combination of two or more. When two or more types are used in combination, it is preferable to combine two types of compounds that generate two types of organic acids that differ in the total number of atoms excluding hydrogen atoms by two or more.
(b2)増感剤
 本発明の組成物には、活性光線又は放射線を吸収して上記スルフォニウム塩の分解を促進させるために増感剤を添加してもよい。増感剤は、活性光線又は放射線を吸収して電子励起状態となる。電子励起状態となった増感剤は、スルフォニウムと接触して、電子移動、エネルギー移動、発熱などの作用が生じる。これにより重合開始剤は化学変化を起こして分解し、ラジカル、酸或いは塩基を生成する。
 好ましい増感剤の例としては、以下の化合物類に属しており、かつ350nmから450nm域に吸収波長を有する化合物を挙げることができる。
 多核芳香族類(例えば、ピレン、ペリレン、トリフェニレン、アントラセン)、キサンテン類(例えば、フルオレッセイン、エオシン、エリスロシン、ローダミンB、ローズベンガル)、シアニン類(例えばチアカルボシアニン、オキサカルボシアニン)、メロシアニン類(例えば、メロシアニン、カルボメロシアニン)、チアジン類(例えば、チオニン、メチレンブルー、トルイジンブルー)、アクリジン類(例えば、アクリジンオレンジ、クロロフラビン、アクリフラビン)、アントラキノン類(例えば、アントラキノン)、スクアリウム類(例えば、スクアリウム)、クマリン類(例えば、7-ジエチルアミノ-4-メチルクマリン)。
(B2) Sensitizer A sensitizer may be added to the composition of the present invention in order to absorb actinic rays or radiation and promote the decomposition of the sulfonium salt. The sensitizer absorbs actinic rays or radiation and enters an electronically excited state. The sensitizer in an electronically excited state comes into contact with sulfonium, and effects such as electron transfer, energy transfer, and heat generation occur. As a result, the polymerization initiator undergoes a chemical change and decomposes to generate radicals, acids or bases.
Examples of preferred sensitizers include compounds belonging to the following compounds and having an absorption wavelength in the 350 nm to 450 nm region.
Polynuclear aromatics (eg, pyrene, perylene, triphenylene, anthracene), xanthenes (eg, fluorescein, eosin, erythrosine, rhodamine B, rose bengal), cyanines (eg, thiacarbocyanine, oxacarbocyanine), merocyanine (Eg, merocyanine, carbomerocyanine), thiazines (eg, thionine, methylene blue, toluidine blue), acridines (eg, acridine orange, chloroflavin, acriflavine), anthraquinones (eg, anthraquinone), squalium (eg, , Squalium), coumarins (eg, 7-diethylamino-4-methylcoumarin).
 より好ましい増感剤の例としては、下記式(IX)~(XIV)で表される化合物が挙げられる。 More preferred examples of the sensitizer include compounds represented by the following formulas (IX) to (XIV).
Figure JPOXMLDOC01-appb-C000073
Figure JPOXMLDOC01-appb-C000073
 式(IX)中、Aは硫黄原子又はNR50を表し、R50はアルキル基又はアリール基を表し、Lは隣接するA及び隣接炭素原子と共同して色素の塩基性核を形成する非金属原子団を表し、R51、R52はそれぞれ独立に水素原子又は一価の非金属原子団を表し、R51、R52は互いに結合して、色素の酸性核を形成してもよい。Wは酸素原子又は硫黄原子を表す。 In formula (IX), A 1 represents a sulfur atom or NR 50 , R 50 represents an alkyl group or an aryl group, and L 2 forms a basic nucleus of the dye together with adjacent A 1 and an adjacent carbon atom. R 51 and R 52 each independently represent a hydrogen atom or a monovalent nonmetallic atomic group, and R 51 and R 52 may be bonded to each other to form an acidic nucleus of the dye. Good. W represents an oxygen atom or a sulfur atom.
Figure JPOXMLDOC01-appb-C000074
Figure JPOXMLDOC01-appb-C000074
 式(X)中、Ar及びArはそれぞれ独立にアリール基を表し、-L-による結合を介して連結している。ここでLは-O-又は-S-を表す。また、Wは式(IX)に示したものと同義である。 In the formula (X), Ar 1 and Ar 2 each independently represent an aryl group and are linked via a bond with —L 3 —. Here, L 3 represents —O— or —S—. W is synonymous with that shown in Formula (IX).
Figure JPOXMLDOC01-appb-C000075
Figure JPOXMLDOC01-appb-C000075
 式(XI)中、Aは硫黄原子又はNR59を表し、Lは隣接するA及び炭素原子と共同して色素の塩基性核を形成する非金属原子団を表し、R53、R54、R55、R56、R57及びR58はそれぞれ独立に一価の非金属原子団の基を表し、R59はアルキル基又はアリール基を表す。 In the formula (XI), A 2 represents a sulfur atom or NR 59 , L 4 represents a nonmetallic atomic group that forms a basic nucleus of the dye in combination with adjacent A 2 and a carbon atom, R 53 , R 54 , R 55 , R 56 , R 57 and R 58 each independently represent a monovalent nonmetallic atomic group, and R 59 represents an alkyl group or an aryl group.
Figure JPOXMLDOC01-appb-C000076
Figure JPOXMLDOC01-appb-C000076
 式(XII)中、A、Aはそれぞれ独立に-S-、-NR62-又は-NR63-を表し、R62、R63はそれぞれ独立に置換若しくは非置換のアルキル基、置換若しくは非置換のアリール基を表し、L、Lはそれぞれ独立に、隣接するA、A及び隣接炭素原子と共同して色素の塩基性核を形成する非金属原子団を表し、R60、R61はそれぞれ独立に水素原子又は一価の非金属原子団であるか又は互いに結合して脂肪族性又は芳香族性の環を形成することができる。 In formula (XII), A 3 and A 4 each independently represent —S—, —NR 62 — or —NR 63 —, and R 62 and R 63 each independently represent a substituted or unsubstituted alkyl group, substituted or Represents an unsubstituted aryl group, and L 5 and L 6 each independently represent a nonmetallic atomic group that forms a basic nucleus of a dye in cooperation with adjacent A 3 , A 4, and adjacent carbon atoms, and R 60 , R 61 each independently represents a hydrogen atom or a monovalent nonmetallic atomic group, or may be bonded to each other to form an aliphatic or aromatic ring.
Figure JPOXMLDOC01-appb-C000077
Figure JPOXMLDOC01-appb-C000077
 式(XIII)中、R66は置換基を有してもよい芳香族環又はヘテロ環を表し、Aは酸素原子、硫黄原子又は=NR67を表す。R64、R65及びR67はそれぞれ独立に水素原子又は一価の非金属原子団を表し、R67とR64、及びR65とR67はそれぞれ互いに脂肪族性又は芳香族性の環を形成するため結合することができる。 In formula (XIII), R 66 represents an aromatic ring or a hetero ring which may have a substituent, and A 5 represents an oxygen atom, a sulfur atom or ═NR 67 . R 64 , R 65 and R 67 each independently represent a hydrogen atom or a monovalent non-metallic atomic group, R 67 and R 64 , and R 65 and R 67 each represent an aliphatic or aromatic ring. Can be combined to form.
Figure JPOXMLDOC01-appb-C000078
Figure JPOXMLDOC01-appb-C000078
 式(XIV)中、R68、及びR69それぞれ独立に水素原子又は一価の非金属原子団を表す。R70、及び、R71は、それぞれ独立に一価の非金属原子団を表しnは0~4の整数を表す。nが2以上のときR70、R71はそれぞれ互いに脂肪族性又は芳香族性の環を形成するため結合することができる。 In formula (XIV), R 68 and R 69 each independently represent a hydrogen atom or a monovalent nonmetallic atomic group. R 70 and R 71 each independently represent a monovalent nonmetallic atomic group, and n represents an integer of 0 to 4. When n is 2 or more, R 70 and R 71 can be bonded to each other to form an aliphatic or aromatic ring.
 増感剤として、特にアントラセン誘導体が好ましい。 As the sensitizer, an anthracene derivative is particularly preferable.
 式(IX)~(XIV)で表される化合物の好ましい具体例としては、以下に示す(C-1)~(C-26)が挙げられるが、これらに限定されるものではない。 Specific preferred examples of the compounds represented by the formulas (IX) to (XIV) include (C-1) to (C-26) shown below, but are not limited thereto.
Figure JPOXMLDOC01-appb-C000079
Figure JPOXMLDOC01-appb-C000079
Figure JPOXMLDOC01-appb-C000080
Figure JPOXMLDOC01-appb-C000080
Figure JPOXMLDOC01-appb-C000081
Figure JPOXMLDOC01-appb-C000081
Figure JPOXMLDOC01-appb-C000082
Figure JPOXMLDOC01-appb-C000082
 上述のような増感剤は、市販のものを用いてもよいし、公知の合成方法により合成してもよい。 The sensitizer as described above may be a commercially available one or may be synthesized by a known synthesis method.
 本発明の感光性樹脂組成物において、増感剤の含有量は、感光性樹脂組成物の全固形分を基準として、1~30質量%が好ましく、3~20質量%がより好ましい。 In the photosensitive resin composition of the present invention, the content of the sensitizer is preferably 1 to 30% by mass, more preferably 3 to 20% by mass based on the total solid content of the photosensitive resin composition.
(c)塩基性化合物
 本発明に係る組成物は、露光から加熱までの経時による性能変化を低減するために、塩基性化合物を含有することが好ましい。
 塩基性化合物としては、好ましくは、下記式(A)~(E)で示される構造を有する化合物を挙げることができる。
(C) Basic compound The composition according to the present invention preferably contains a basic compound in order to reduce a change in performance over time from exposure to heating.
Preferred examples of the basic compound include compounds having a structure represented by the following formulas (A) to (E).
Figure JPOXMLDOC01-appb-C000083
Figure JPOXMLDOC01-appb-C000083
 一般式(A)及び(E)中、
 R200、R201及びR202は、同一でも異なってもよく、水素原子、アルキル基(好ましくは炭素数1~20)、シクロアルキル基(好ましくは炭素数3~20)又はアリール基(炭素数6~20)を表し、ここで、R201とR202は、互いに結合して環を形成してもよい。
In general formulas (A) and (E),
R 200 , R 201 and R 202 may be the same or different and are a hydrogen atom, an alkyl group (preferably having a carbon number of 1 to 20), a cycloalkyl group (preferably having a carbon number of 3 to 20) or an aryl group (having a carbon number). 6-20), wherein R 201 and R 202 may combine with each other to form a ring.
 R203、R204、R205及びR206は、同一でも異なってもよく、炭素数1~20個のアルキル基を表す。
 上記アルキル基について、置換基を有するアルキル基としては、炭素数1~20のアミノアルキル基、炭素数1~20のヒドロキシアルキル基、又は炭素数1~20のシアノアルキル基が好ましい。
 これら一般式(A)及び(E)中のアルキル基は、無置換であることがより好ましい。
R 203 , R 204 , R 205 and R 206 may be the same or different and each represents an alkyl group having 1 to 20 carbon atoms.
Regarding the alkyl group, the alkyl group having a substituent is preferably an aminoalkyl group having 1 to 20 carbon atoms, a hydroxyalkyl group having 1 to 20 carbon atoms, or a cyanoalkyl group having 1 to 20 carbon atoms.
The alkyl groups in the general formulas (A) and (E) are more preferably unsubstituted.
 好ましい化合物として、グアニジン、アミノピロリジン、ピラゾール、ピラゾリン、ピペラジン、アミノモルホリン、アミノアルキルモルフォリン、ピペリジン等を挙げることができ、更に好ましい化合物として、イミダゾール構造、ジアザビシクロ構造、オニウムヒドロキシド構造、オニウムカルボキシレート構造、トリアルキルアミン構造、アニリン構造又はピリジン構造を有する化合物、水酸基及び/又はエーテル結合を有するアルキルアミン誘導体、水酸基及び/又はエーテル結合を有するアニリン誘導体等を挙げることができる。 Preferred compounds include guanidine, aminopyrrolidine, pyrazole, pyrazoline, piperazine, aminomorpholine, aminoalkylmorpholine, piperidine and the like, and more preferred compounds include imidazole structure, diazabicyclo structure, onium hydroxide structure, onium carboxylate Examples thereof include a compound having a structure, a trialkylamine structure, an aniline structure or a pyridine structure, an alkylamine derivative having a hydroxyl group and / or an ether bond, and an aniline derivative having a hydroxyl group and / or an ether bond.
 イミダゾール構造を有する化合物としてはイミダゾール、2、4、5-トリフェニルイミダゾール、ベンズイミダゾール、2-フェニルベンゾイミダゾール等が挙げられる。ジアザビシクロ構造を有する化合物としては1、4-ジアザビシクロ[2,2,2]オクタン、1、5-ジアザビシクロ[4,3,0]ノナ-5-エン、1、8-ジアザビシクロ[5,4,0]ウンデカー7-エン等が挙げられる。オニウムヒドロキシド構造を有する化合物としてはテトラブチルアンモニウムヒドロキシド、トリアリールスルホニウムヒドロキシド、フェナシルスルホニウムヒドロキシド、2-オキソアルキル基を有するスルホニウムヒドロキシド、具体的にはトリフェニルスルホニウムヒドロキシド、トリス(t-ブチルフェニル)スルホニウムヒドロキシド、ビス(t-ブチルフェニル)ヨードニウムヒドロキシド、フェナシルチオフェニウムヒドロキシド、2-オキソプロピルチオフェニウムヒドロキシド等が挙げられる。オニウムカルボキシレート構造を有する化合物としてはオニウムヒドロキシド構造を有する化合物のアニオン部がカルボキシレートになったものであり、例えばアセテート、アダマンタンー1-カルボキシレート、パーフロロアルキルカルボキシレート等が挙げられる。トリアルキルアミン構造を有する化合物としては、トリ(n-ブチル)アミン、トリ(n-オクチル)アミン等を挙げることができる。アニリン化合物としては、2,6-ジイソプロピルアニリン、N,N-ジメチルアニリン、N,N-ジブチルアニリン、N,N-ジヘキシルアニリン等を挙げることができる。水酸基及び/又はエーテル結合を有するアルキルアミン誘導体としては、エタノールアミン、ジエタノールアミン、トリエタノールアミン、N-フェニルジエタノールアミン、トリス(メトキシエトキシエチル)アミン等を挙げることができる。水酸基及び/又はエーテル結合を有するアニリン誘導体としては、N,N-ビス(ヒドロキシエチル)アニリン等を挙げることができる。 Examples of the compound having an imidazole structure include imidazole, 2,4,5-triphenylimidazole, benzimidazole, 2-phenylbenzimidazole and the like. As compounds having a diazabicyclo structure, 1,4-diazabicyclo [2,2,2] octane, 1,5-diazabicyclo [4,3,0] non-5-ene, 1,8-diazabicyclo [5,4,0 ] Undecar 7-ene and the like. Examples of the compound having an onium hydroxide structure include tetrabutylammonium hydroxide, triarylsulfonium hydroxide, phenacylsulfonium hydroxide, sulfonium hydroxide having a 2-oxoalkyl group, specifically, triphenylsulfonium hydroxide, tris ( t-butylphenyl) sulfonium hydroxide, bis (t-butylphenyl) iodonium hydroxide, phenacylthiophenium hydroxide, 2-oxopropylthiophenium hydroxide, and the like. The compound having an onium carboxylate structure is a compound having an onium hydroxide structure in which the anion moiety is converted to a carboxylate, and examples thereof include acetate, adamantane-1-carboxylate, and perfluoroalkylcarboxylate. Examples of the compound having a trialkylamine structure include tri (n-butyl) amine and tri (n-octyl) amine. Examples of aniline compounds include 2,6-diisopropylaniline, N, N-dimethylaniline, N, N-dibutylaniline, N, N-dihexylaniline and the like. Examples of the alkylamine derivative having a hydroxyl group and / or an ether bond include ethanolamine, diethanolamine, triethanolamine, N-phenyldiethanolamine, and tris (methoxyethoxyethyl) amine. Examples of aniline derivatives having a hydroxyl group and / or an ether bond include N, N-bis (hydroxyethyl) aniline.
 好ましい塩基性化合物として、更に、フェノキシ基を有するアミン化合物、フェノキシ基を有するアンモニウム塩化合物、スルホン酸エステル基を有するアミン化合物及びスルホン酸エステル基を有するアンモニウム塩化合物を挙げることができる。 Preferred examples of the basic compound further include an amine compound having a phenoxy group, an ammonium salt compound having a phenoxy group, an amine compound having a sulfonic acid ester group, and an ammonium salt compound having a sulfonic acid ester group.
 アミン化合物は、1級、2級、3級のアミン化合物を使用することができ、少なくとも1つのアルキル基が窒素原子に結合しているアミン化合物が好ましい。アミン化合物は、3級アミン化合物であることがより好ましい。アミン化合物は、少なくとも1つのアルキル基(好ましくは炭素数1~20)が窒素原子に結合していれば、アルキル基の他に、シクロアルキル基(好ましくは炭素数3~20)又はアリール基(好ましくは炭素数6~12)が窒素原子に結合していてもよい。アミン化合物は、アルキル鎖中に、酸素原子を有し、オキシアルキレン基が形成されていることが好ましい。オキシアルキレン基の数は、分子内に1つ以上、好ましくは3~9個、更に好ましくは4~6個である。オキシアルキレン基の中でもオキシエチレン基(-CHCHO-)又はオキシプロピレン基(-CH(CH)CHO-もしくは-CHCHCHO-)が好ましく、更に好ましくはオキシエチレン基である。 As the amine compound, a primary, secondary or tertiary amine compound can be used, and an amine compound in which at least one alkyl group is bonded to a nitrogen atom is preferable. The amine compound is more preferably a tertiary amine compound. As long as at least one alkyl group (preferably having 1 to 20 carbon atoms) is bonded to a nitrogen atom, the amine compound has an cycloalkyl group (preferably having 3 to 20 carbon atoms) or an aryl group (preferably having 3 to 20 carbon atoms). Preferably 6 to 12 carbon atoms may be bonded to the nitrogen atom. The amine compound preferably has an oxygen atom in the alkyl chain and an oxyalkylene group is formed. The number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6. Among the oxyalkylene groups, an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
 アンモニウム塩化合物は、1級、2級、3級、4級のアンモニウム塩化合物を使用することができ、少なくとも1つのアルキル基が窒素原子に結合しているアンモニウム塩化合物が好ましい。アンモニウム塩化合物は、少なくとも1つのアルキル基(好ましくは炭素数1~20)が窒素原子に結合していれば、アルキル基の他に、シクロアルキル基(好ましくは炭素数3~20)又はアリール基(好ましくは炭素数6~12)が窒素原子に結合していてもよい。アンモニウム塩化合物は、アルキル鎖中に、酸素原子を有し、オキシアルキレン基が形成されていることが好ましい。オキシアルキレン基の数は、分子内に1つ以上、好ましくは3~9個、更に好ましくは4~6個である。オキシアルキレン基の中でもオキシエチレン基(-CHCHO-)もしくはオキシプロピレン基(-CH(CH)CHO-もしくは-CHCHCHO-)が好ましく、更に好ましくはオキシエチレン基である。 As the ammonium salt compound, a primary, secondary, tertiary, or quaternary ammonium salt compound can be used, and an ammonium salt compound in which at least one alkyl group is bonded to a nitrogen atom is preferable. In addition to the alkyl group, the ammonium salt compound may be a cycloalkyl group (preferably having 3 to 20 carbon atoms) or an aryl group, provided that at least one alkyl group (preferably having 1 to 20 carbon atoms) is bonded to the nitrogen atom. (Preferably having 6 to 12 carbon atoms) may be bonded to a nitrogen atom. The ammonium salt compound preferably has an oxygen atom in the alkyl chain and an oxyalkylene group is formed. The number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6. Among the oxyalkylene groups, an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
 アンモニウム塩化合物のアニオンとしては、ハロゲン原子、スルホネート、ボレート、フォスフェート等が挙げられるが、中でもハロゲン原子、スルホネートが好ましい。ハロゲン原子としてはクロライド、ブロマイド、アイオダイドが特に好ましく、スルホネートとしては、炭素数1~20の有機スルホネートが特に好ましい。有機スルホネートとしては、炭素数1~20のアルキルスルホネート、アリールスルホネートが挙げられる。アルキルスルホネートのアルキル基は置換基を有していてもよく、置換基としては例えばフッ素、塩素、臭素、アルコキシ基、アシル基、アリール基等が挙げられる。アルキルスルホネートとして、具体的にはメタンスルホネート、エタンスルホネート、ブタンスルホネート、ヘキサンスルホネート、オクタンスルホネート、ベンジルスルホネート、トリフルオロメタンスルホネート、ペンタフルオロエタンスルホネート、ノナフルオロブタンスルホネート等が挙げられる。アリールスルホネートのアリール基としてはベンゼン環、ナフタレン環、アントラセン環が挙げられる。ベンゼン環、ナフタレン環、アントラセン環は置換基を有していてもよく、置換基としては炭素数1~6の直鎖若しくは分岐アルキル基、炭素数3~6のシクロアルキル基が好ましい。直鎖若しくは分岐アルキル基、シクロアルキル基として、具体的にはメチル、エチル、n-プロピル、イソプロピル、n-ブチル、i-ブチル、t-ブチル、n-ヘキシル、シクロヘキシル等が挙げられる。他の置換基としては炭素数1~6のアルコキシ基、ハロゲン原子、シアノ、ニトロ、アシル基、アシロキシ基等が挙げられる。 Examples of the anion of the ammonium salt compound include halogen atoms, sulfonates, borates, and phosphates. Among them, halogen atoms and sulfonates are preferable. The halogen atom is particularly preferably chloride, bromide or iodide, and the sulfonate is particularly preferably an organic sulfonate having 1 to 20 carbon atoms. Examples of the organic sulfonate include alkyl sulfonates having 1 to 20 carbon atoms and aryl sulfonates. The alkyl group of the alkyl sulfonate may have a substituent, and examples of the substituent include fluorine, chlorine, bromine, alkoxy groups, acyl groups, and aryl groups. Specific examples of the alkyl sulfonate include methane sulfonate, ethane sulfonate, butane sulfonate, hexane sulfonate, octane sulfonate, benzyl sulfonate, trifluoromethane sulfonate, pentafluoroethane sulfonate, and nonafluorobutane sulfonate. Examples of the aryl group of the aryl sulfonate include a benzene ring, a naphthalene ring and an anthracene ring. The benzene ring, naphthalene ring and anthracene ring may have a substituent, and the substituent is preferably a linear or branched alkyl group having 1 to 6 carbon atoms or a cycloalkyl group having 3 to 6 carbon atoms. Specific examples of the linear or branched alkyl group and cycloalkyl group include methyl, ethyl, n-propyl, isopropyl, n-butyl, i-butyl, t-butyl, n-hexyl, cyclohexyl and the like. Examples of the other substituent include an alkoxy group having 1 to 6 carbon atoms, a halogen atom, cyano, nitro, an acyl group, and an acyloxy group.
 フェノキシ基を有するアミン化合物、フェノキシ基を有するアンモニウム塩化合物とは、アミン化合物又はアンモニウム塩化合物のアルキル基の窒素原子と反対側の末端にフェノキシ基を有するものである。フェノキシ基は、置換基を有していてもよい。フェノキシ基の置換基としては、例えば、アルキル基、アルコキシ基、ハロゲン原子、シアノ基、ニトロ基、カルボキシル基、カルボン酸エステル基、スルホン酸エステル基、アリール基、アラルキル基、アシロキシ基、アリールオキシ基等が挙げられる。置換基の置換位は、2~6位のいずれであってもよい。置換基の数は、1~5の範囲で何れであってもよい。 An amine compound having a phenoxy group and an ammonium salt compound having a phenoxy group are those having a phenoxy group at the terminal opposite to the nitrogen atom of the alkyl group of the amine compound or ammonium salt compound. The phenoxy group may have a substituent. Examples of the substituent of the phenoxy group include an alkyl group, an alkoxy group, a halogen atom, a cyano group, a nitro group, a carboxyl group, a carboxylic acid ester group, a sulfonic acid ester group, an aryl group, an aralkyl group, an acyloxy group, and an aryloxy group. Etc. The substitution position of the substituent may be any of the 2-6 positions. The number of substituents may be any in the range of 1 to 5.
 フェノキシ基と窒素原子との間に、少なくとも1つのオキシアルキレン基を有することが好ましい。オキシアルキレン基の数は、分子内に1つ以上、好ましくは3~9個、更に好ましくは4~6個である。オキシアルキレン基の中でもオキシエチレン基(-CHCHO-)もしくはオキシプロピレン基(-CH(CH)CHO-もしくは-CHCHCHO-)が好ましく、更に好ましくはオキシエチレン基である。 It is preferable to have at least one oxyalkylene group between the phenoxy group and the nitrogen atom. The number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6. Among the oxyalkylene groups, an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
 スルホン酸エステル基を有するアミン化合物、スルホン酸エステル基を有するアンモニウム塩化合物に於ける、スルホン酸エステル基としては、アルキルスルホン酸エステル、シクロアルキル基スルホン酸エステル、アリールスルホン酸エステルのいずれであっても良く、アルキルスルホン酸エステルの場合にアルキル基は炭素数1~20、シクロアルキルスルホン酸エステルの場合にシクロアルキル基は炭素数3~20、アリールスルホン酸エステルの場合にアリール基は炭素数6~12が好ましい。アルキルスルホン酸エステル、シクロアルキルスルホン酸エステル、アリールスルホン酸エステルは置換基を有していてもよく、置換基としては、ハロゲン原子、シアノ基、ニトロ基、カルボキシル基、カルボン酸エステル基、スルホン酸エステル基が好ましい。 In the amine compound having a sulfonic acid ester group and the ammonium salt compound having a sulfonic acid ester group, the sulfonic acid ester group may be any of alkyl sulfonic acid ester, cycloalkyl group sulfonic acid ester, and aryl sulfonic acid ester. In the case of an alkyl sulfonate ester, the alkyl group has 1 to 20 carbon atoms, in the case of a cycloalkyl sulfonate ester, the cycloalkyl group has 3 to 20 carbon atoms, and in the case of an aryl sulfonate ester, the aryl group has 6 carbon atoms. ~ 12 are preferred. Alkyl sulfonic acid ester, cycloalkyl sulfonic acid ester, and aryl sulfonic acid ester may have a substituent. Examples of the substituent include a halogen atom, a cyano group, a nitro group, a carboxyl group, a carboxylic acid ester group, and a sulfonic acid. An ester group is preferred.
 スルホン酸エステル基と窒素原子との間に、少なくとも1つのオキシアルキレン基を有することが好ましい。オキシアルキレン基の数は、分子内に1つ以上、好ましくは3~9個、更に好ましくは4~6個である。オキシアルキレン基の中でもオキシエチレン基(-CHCHO-)もしくはオキシプロピレン基(-CH(CH)CHO-もしくは-CHCHCHO-)が好ましく、更に好ましくはオキシエチレン基である。
 また、下記化合物も塩基性化合物として好ましい。
It is preferable to have at least one oxyalkylene group between the sulfonate group and the nitrogen atom. The number of oxyalkylene groups is one or more in the molecule, preferably 3 to 9, and more preferably 4 to 6. Among the oxyalkylene groups, an oxyethylene group (—CH 2 CH 2 O—) or an oxypropylene group (—CH (CH 3 ) CH 2 O— or —CH 2 CH 2 CH 2 O—) is preferable, and more preferably oxy Ethylene group.
The following compounds are also preferable as the basic compound.
Figure JPOXMLDOC01-appb-C000084
Figure JPOXMLDOC01-appb-C000084
 これらの塩基性化合物は、1種類を単独で用いてもよく、2種類以上を組み合わせて用いてもよい。
 本発明に係る組成物は、塩基性化合物を含有してもしなくても良いが、含有する場合、塩基性化合物の含有量は、組成物の全固形分を基準として、通常は0.001~10質量%であり、好ましくは0.01~5質量%である。
These basic compounds may be used individually by 1 type, and may be used in combination of 2 or more types.
The composition according to the present invention may or may not contain a basic compound. However, when it is contained, the content of the basic compound is usually 0.001 to on the basis of the total solid content of the composition. It is 10% by mass, preferably 0.01-5% by mass.
 酸発生剤と塩基性化合物との使用割合は、酸発生剤/塩基性化合物(モル比)=2.5~300であることが好ましい。即ち、感度、解像度の点からモル比が2.5以上が好ましく、露光後加熱処理までの経時でのレリーフパターンの太りによる解像度の低下抑制の点から300以下が好ましい。酸発生剤/塩基性化合物(モル比)は、より好ましくは5.0~200、更に好ましくは7.0~150である。 The use ratio of the acid generator and the basic compound is preferably acid generator / basic compound (molar ratio) = 2.5 to 300. That is, the molar ratio is preferably 2.5 or more from the viewpoints of sensitivity and resolution, and is preferably 300 or less from the viewpoint of suppressing the reduction in resolution due to the thickening of the relief pattern over time until post-exposure heat treatment. The acid generator / basic compound (molar ratio) is more preferably from 5.0 to 200, still more preferably from 7.0 to 150.
(d)熱酸発生剤
 本発明には熱酸発生剤を含有してもよい。熱酸発生剤とは、熱により酸が発生する化合物であり、通常、熱分解点が130℃~250℃、好ましくは150℃~220℃の範囲の化合物であり、例えば、加熱によりスルホン酸、カルボン酸、ジスルホニルイミドなどの低求核性の酸を発生する化合物である。
 発生酸としてはpKaが2以下と強い、スルホン酸や電子求引基の置換したアルキル乃至はアリールカルボン酸、同じく電子求引基の置換したジスルホニルイミドなどが好ましい。電子求引基としてはF原子などのハロゲン原子、トリフルオロメチル基等のハロアルキル基、ニトロ基、シアノ基を挙げることができる。
 熱酸発生剤は保存経時中や組成物を塗布した後のプリベーク工程では分解せず、パターニング後の加熱硬化工程で速やかに分解することが求められる。従って熱分解点としては100℃~300℃が好ましい。より好ましくは120℃~250℃であり、更に好ましくは150℃~200℃である。
 熱酸発生剤としては、上記露光により酸を発生する光酸発生剤の適用が可能である。例えばスルホニウム塩やヨードニウム塩等のオニウム塩、N-ヒドロキシイミドスルホネート化合物、オキシムスルホネート、o-ニトロベンジルスルホネート等を挙げることができる。
(D) Thermal acid generator The present invention may contain a thermal acid generator. The thermal acid generator is a compound that generates an acid by heat, and is usually a compound having a thermal decomposition point in the range of 130 ° C. to 250 ° C., preferably 150 ° C. to 220 ° C., for example, sulfonic acid, It is a compound that generates a low nucleophilic acid such as carboxylic acid or disulfonylimide.
As the generated acid, sulfonic acid, alkyl substituted with an electron withdrawing group or arylcarboxylic acid having a strong pKa of 2 or less, disulfonylimide substituted with an electron withdrawing group, and the like are preferable. Examples of the electron withdrawing group include a halogen atom such as an F atom, a haloalkyl group such as a trifluoromethyl group, a nitro group, and a cyano group.
The thermal acid generator is required not to be decomposed during storage time or in a pre-baking process after applying the composition, but to be quickly decomposed in a heat-curing process after patterning. Therefore, the thermal decomposition point is preferably 100 ° C to 300 ° C. More preferably, it is 120 ° C to 250 ° C, and further preferably 150 ° C to 200 ° C.
As the thermal acid generator, a photoacid generator that generates an acid by the above-described exposure can be applied. Examples thereof include onium salts such as sulfonium salts and iodonium salts, N-hydroxyimide sulfonate compounds, oxime sulfonates, o-nitrobenzyl sulfonates and the like.
 好ましいスルホニウム塩としては例えば下記一般式(TA-1)~(TA-3)で表される化合物を挙げることができる。 Preferred examples of the sulfonium salt include compounds represented by the following general formulas (TA-1) to (TA-3).
Figure JPOXMLDOC01-appb-C000085
Figure JPOXMLDOC01-appb-C000085
 一般式(TA-1)において、
 RT1~RT5は、各々独立に、水素原子、アルキル基、シクロアルキル基、アルコキシ基又はハロゲン原子を表す。
 RT6及びRT7は、各々独立に、水素原子、アルキル基又はシクロアルキル基を表す。
 RT8及びRT9は、各々独立に、アルキル基、シクロアルキル基、アリル基又はビニル基を表す。
 RT1~RT5のいずれか2つ以上、RT6とRT7及びRT8とRT9は、それぞれ結合して環構造を形成しても良く、この環構造は、酸素原子、硫黄原子、ケトン結合、エステル結合、アミド結合を含んでいてもよい。
 RT1~RT5のいずれか2つ以上、RT6とRT7及びRT8とRT9が結合して形成する基としては、ブチレン基、ペンチレン基等を挙げることができる。
 Xは、非求核性アニオンを表し、前述の通りpKaが2以下と強い、スルホン酸や電子求引基の置換したアルキル乃至はアリールカルボン酸、同じく電子求引基の置換したジスルホニルイミドなどが好ましい。電子求引基としてはF原子などのハロゲン原子、トリフルオロメチル基等のハロアルキル基、ニトロ基、シアノ基を挙げることができる。
In general formula (TA-1),
R T1 to R T5 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an alkoxy group or a halogen atom.
R T6 and R T7 each independently represent a hydrogen atom, an alkyl group or a cycloalkyl group.
R T8 and R T9 each independently represents an alkyl group, a cycloalkyl group, an allyl group or a vinyl group.
Any two or more of R T1 to R T5 , R T6 and R T7, and R T8 and R T9 may be bonded to each other to form a ring structure, and this ring structure includes an oxygen atom, a sulfur atom, a ketone A bond, an ester bond, or an amide bond may be included.
Examples of the group formed by combining any two or more of R T1 to R T5 , R T6 and R T7, and R T8 and R T9 include a butylene group and a pentylene group.
X represents a non-nucleophilic anion, and has a strong pKa of 2 or less as described above, a sulfonic acid or an alkyl or aryl carboxylic acid substituted with an electron withdrawing group, or a disulfonylimide substituted with an electron withdrawing group. Etc. are preferable. Examples of the electron withdrawing group include a halogen atom such as an F atom, a haloalkyl group such as a trifluoromethyl group, a nitro group, and a cyano group.
 一般式(TA-2)において、
 RT10及びRT11は、各々独立に、アルキル基、シクロアルキル基、アリル基又はビニル基を表す。
 RT10及びRT11は、それぞれ結合して環構造を形成しても良く、この環構造は、酸素原子、硫黄原子、ケトン結合、エステル結合、アミド結合を含んでいてもよい。
 RT10とRT11が結合して形成する基としては、ブチレン基、ペンチレン基等を挙げることができる。
 RT12~RT16は、各々独立に、水素原子、アルキル基、シクロアルキル基、アリール基、アルコキシ基、チオアルコキシ基、水酸基を表し、2つ以上が互いに結合してナフタレン環、アントラセン環等の多環芳香族環を形成しても良い。
 Xは、非求核性アニオンを表す。
In general formula (TA-2),
R T10 and R T11 each independently represent an alkyl group, a cycloalkyl group, an allyl group, or a vinyl group.
R T10 and R T11 may be bonded to each other to form a ring structure, and this ring structure may contain an oxygen atom, a sulfur atom, a ketone bond, an ester bond, or an amide bond.
Examples of the group formed by combining R T10 and R T11 include a butylene group and a pentylene group.
R T12 to R T16 each independently represent a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an alkoxy group, a thioalkoxy group, or a hydroxyl group, and two or more of them are bonded to each other to form a naphthalene ring, an anthracene ring, etc. A polycyclic aromatic ring may be formed.
X represents a non-nucleophilic anion.
 一般式(TA-3)において、
 RT17は、アルキル基(直鎖又は分岐)又はシクロアルキル基を表し、好ましくは炭素数1~20個、より好ましくは炭素数1~12個の直鎖及び分岐アルキル基(例えば、メチル基、エチル基、直鎖又は分岐プロピル基、直鎖又は分岐ブチル基、直鎖又は分岐ペンチル基)を挙げることができる。シクロアルキル基としては、シクロペンチル基、シクロヘキシル基のような単環の環状アルキル基だけでなく、ノルボルニル基、トリシクロデカニル基、アダマンチル基の様な橋かけ部位を有する環状アルキル基も挙げることができる。
 RT18及びRT19は、各々独立に、水素原子、アルキル基又はシクロアルキル基を表す。
 RT20及びRT21は、各々独立に、アルキル基、シクロアルキル基、アリル基又はビニル基を表す。
 RT18とRT19及びRT20とRT21は、それぞれ結合して環構造を形成しても良く、この環構造は、酸素原子、硫黄原子、ケトン結合、エステル結合、アミド結合を含んでいてもよい。RT18とRT19及びRT20とRT21が結合して形成する基としては、ブチレン基、ペンチレン基等を挙げることができる。
 Xは、非求核性アニオンを表す。
In general formula (TA-3),
R T17 represents an alkyl group (straight chain or branched) or a cycloalkyl group, preferably a straight chain and branched alkyl group having 1 to 20 carbon atoms, more preferably 1 to 12 carbon atoms (for example, a methyl group, Ethyl group, linear or branched propyl group, linear or branched butyl group, linear or branched pentyl group). Examples of the cycloalkyl group include not only a monocyclic cyclic alkyl group such as a cyclopentyl group and a cyclohexyl group, but also a cyclic alkyl group having a bridging site such as a norbornyl group, a tricyclodecanyl group, and an adamantyl group. it can.
R T18 and R T19 each independently represent a hydrogen atom, an alkyl group or a cycloalkyl group.
R T20 and R T21 each independently represents an alkyl group, a cycloalkyl group, an allyl group or a vinyl group.
R T18 and R T19 and R T20 and R T21 may be bonded to each other to form a ring structure, and this ring structure may contain an oxygen atom, a sulfur atom, a ketone bond, an ester bond, or an amide bond. Good. Examples of the group formed by combining R T18 and R T19 and R T20 and R T21 include a butylene group and a pentylene group.
X represents a non-nucleophilic anion.
 RT1~RT17としてのアルキル基は、直鎖、分岐状のいずれであってもよく、例えば炭素数1~20個、好ましくは炭素数1~12個の直鎖及び分岐アルキル基(例えば、メチル基、エチル基、直鎖又は分岐プロピル基、直鎖又は分岐ブチル基、直鎖又は分岐ペンチル基)を挙げることができる。
 RT1~RT17としてのシクロアルキル基は、単環のアルキル基とともに、多環、橋かけ部位を有する環状アルキル基をも含む意であり、RT12~RT16としてのシクロアルキル基は、好ましくは、炭素数3~8個のシクロアルキル基(例えば、シクロペンチル基、シクロヘキシル基)である。
 RT17としてのシクロアルキル基は、炭素数3~8個のシクロアルキル基(例えば、シクロペンチル基、シクロヘキシル基)とともに、ノルボルニル基、トリシクロデカニル基、アダマンチル基の様な橋かけ部位を有する環状アルキル基も好ましい。
The alkyl group as R T1 to R T17 may be linear or branched. For example, a linear or branched alkyl group having 1 to 20 carbon atoms, preferably 1 to 12 carbon atoms (for example, Methyl group, ethyl group, linear or branched propyl group, linear or branched butyl group, linear or branched pentyl group).
The cycloalkyl group as R T1 to R T17 is meant to include a monocyclic alkyl group as well as a polycyclic and cyclic alkyl group having a bridging site, and the cycloalkyl group as R T12 to R T16 is preferably Is a cycloalkyl group having 3 to 8 carbon atoms (eg, cyclopentyl group, cyclohexyl group).
The cycloalkyl group as R T17 has a cycloalkyl group having 3 to 8 carbon atoms (eg, cyclopentyl group, cyclohexyl group) and a cyclic group having a bridging site such as a norbornyl group, a tricyclodecanyl group, or an adamantyl group. Also preferred are alkyl groups.
 RT1~RT5、T12~RT16としてのとしてのアルコキシ基は、直鎖、分岐、環状のいずれであってもよく、例えば炭素数1~10のアルコキシ基、好ましくは、炭素数1~5の直鎖及び分岐アルコキシ基(例えば、メトキシ基、エトキシ基、直鎖又は分岐プロポキシ基、直鎖又は分岐ブトキシ基、直鎖又は分岐ペントキシ基)、炭素数3~8の環状アルコキシ基(例えば、シクロペンチルオキシ基、シクロヘキシルオキシ基)を挙げることができる。
 RT12~RT16としてのチオアルコキシ基は、直鎖、分岐、環状のいずれであってもよく、例えば炭素数1~10のチオアルコキシ基、好ましくは、炭素数1~5の直鎖及び分岐チオアルコキシ基(例えば、チオメトキシ基、チオエトキシ基、直鎖又は分岐チオプロポキシ基、直鎖又は分岐チオブトキシ基、直鎖又は分岐チオペントキシ基)、炭素数3~8の環状チオアルコキシ基(例えば、チオシクロペンチルオキシ基、チオシクロヘキシルオキシ基)を挙げることができる。
The alkoxy group as R T1 to R T5 and R T12 to R T16 may be linear, branched or cyclic, for example, an alkoxy group having 1 to 10 carbon atoms, preferably 1 to 1 carbon atoms. 5 linear and branched alkoxy groups (for example, methoxy group, ethoxy group, linear or branched propoxy group, linear or branched butoxy group, linear or branched pentoxy group), cyclic alkoxy groups having 3 to 8 carbon atoms (for example, , Cyclopentyloxy group, cyclohexyloxy group).
The thioalkoxy group as R T12 to R T16 may be linear, branched or cyclic, for example, a thioalkoxy group having 1 to 10 carbon atoms, preferably a linear or branched group having 1 to 5 carbon atoms. A thioalkoxy group (for example, a thiomethoxy group, a thioethoxy group, a linear or branched thiopropoxy group, a linear or branched thiobutoxy group, a linear or branched thiopentoxy group), a cyclic thioalkoxy group having 3 to 8 carbon atoms (for example, thiocyclopentyl) Oxy group, thiocyclohexyloxy group).
 Xとしての非求核性アニオンは、有機アニオンが好ましく、下記一般式に示す有機アニオンが特に好ましい。 The non-nucleophilic anion as X is preferably an organic anion, and particularly preferably an organic anion represented by the following general formula.
Figure JPOXMLDOC01-appb-C000086
Figure JPOXMLDOC01-appb-C000086
 上記一般式に於いて、
 Rcは、有機基を表す。
 Rcにおける有機基として、炭素数1~30のものが挙げられ、好ましくは置換基を有していてもよいアルキル基、シクロアルキル基、アリール基、又はこれらの複数が、単結合、-O-、-CO-、-S-、-SO-、-SON(Rd)-などの連結基で連結された基を挙げることができる。
 Rdは、水素原子又はアルキル基を表す。
 Rcは、1位がフッ素原子又はフロロアルキル基で置換されたアルキル基を表す。
 Rc及びRcは、各々独立に、1位がフッ素原子又はフロロアルキル基で置換された アルキル基を表す。好ましくは、炭素数1~4のパーフロロアルキル基である。
 RcとRcは互いに結合して環を形成していてもよい。
 RcとRcが結合して形成される基としてはアルキレン基、シクロアルキレン基、アリーレン基が挙げられる。好ましくは炭素数2~4のパーフロロアルキレン基である。
In the above general formula,
Rc 1 represents an organic group.
Examples of the organic group for Rc 1 include those having 1 to 30 carbon atoms, and preferably an alkyl group, a cycloalkyl group, an aryl group, or a plurality of these optionally having a substituent is a single bond, —O. -, - CO 2 -, - S -, - SO 3 -, - SO 2 N (Rd 1) - can be exemplified linked group a linking group such as.
Rd 1 represents a hydrogen atom or an alkyl group.
Rc 2 represents 1-position an alkyl group substituted with a fluorine atom or a fluoroalkyl group.
Rc 3 and Rc 4 each independently represents an alkyl group substituted at the 1-position with a fluorine atom or a fluoroalkyl group. Preferably, it is a perfluoroalkyl group having 1 to 4 carbon atoms.
Rc 3 and Rc 4 may be bonded to each other to form a ring.
Examples of the group formed by combining Rc 3 and Rc 4 include an alkylene group, a cycloalkylene group, and an arylene group. A perfluoroalkylene group having 2 to 4 carbon atoms is preferred.
 好ましいヨードニウム塩としては以下の一般式(TA-4)で表される化合物を挙げることができる。 Preferred examples of the iodonium salt include compounds represented by the following general formula (TA-4).
Figure JPOXMLDOC01-appb-C000087
Figure JPOXMLDOC01-appb-C000087
 式(TA-4)中、R41及びR42は、それぞれ水素原子、置換基を有していてもよいアルキル基、置換基を有していてもよいシクロアルキル基、置換基を有していてもよいアルコキシ基、置換基を有していてもよいアルコキシカルボニル基、置換基を有していてもよいアシル基、置換基を有していてもよいアシロキシ基、ニトロ基、ハロゲン原子、水酸基、カルボキシル基を表す。
 aは1~5を表し、bは1~5を表す。
 但し、R41及びR42の少なくとも一方は、炭素数5個以上の、置換基を有していてもよいアルキル基、置換基を有していてもよいシクロアルキル基、置換基を有していてもよいアルコキシ基、置換基を有していてもよいアルコキシカルボニル基、置換基を有していてもよいアシル基、置換基を有していてもよいアシロキシ基を表す。
 XはR-SOを表し、Rは置換基を有していてもよい脂肪族炭化水素基、置換基を有していてもよい芳香族炭化水素基を表す。
In formula (TA-4), R 41 and R 42 each have a hydrogen atom, an optionally substituted alkyl group, an optionally substituted cycloalkyl group, or a substituent. An alkoxy group which may have a substituent, an alkoxycarbonyl group which may have a substituent, an acyl group which may have a substituent, an acyloxy group which may have a substituent, a nitro group, a halogen atom, a hydroxyl group Represents a carboxyl group.
a represents 1 to 5, and b represents 1 to 5.
However, at least one of R 41 and R 42 has an alkyl group having 5 or more carbon atoms, which may have a substituent, a cycloalkyl group which may have a substituent, or a substituent. An alkoxy group which may have a substituent, an alkoxycarbonyl group which may have a substituent, an acyl group which may have a substituent, and an acyloxy group which may have a substituent.
X represents R—SO 3 , and R represents an aliphatic hydrocarbon group which may have a substituent and an aromatic hydrocarbon group which may have a substituent.
 R41及びR42のアルキル基としては、置換基を有してもよい、メチル基、エチル基、プロピル基、n-ブチル基、イソブチル基、sec-ブチル基、t-ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、t-アミル基、デカニル基、ドデカニル基、ヘキサデカニル基のような炭素数1~25個のものが挙げられる。シクロアルキル基としては、置換基を有してもよい、シクロプロピル基、シクロペンチル基、シクロヘキシル基、シクロオクチル基、シクロドデカニル基、シクロヘキサデカニル基等のような炭素数3~25個のものが挙げられる。アルコキシ基としては、置換基を有してもよい、メトキシ基、エトキシ基、プロポキシ基、イソプロポキシ基、n-ブトキシ基、イソブトキシ基、sec-ブトキシ基もしくはt-ブトキシ基、ペンチルオキシ基、t-アミロキシ基、n-ヘキシロキシ基、n-オクチルオキシ基、n-ドデカンオキシ基等のような炭素数1~25個のものが挙げられる。 As the alkyl group for R 41 and R 42 , an optionally substituted methyl group, ethyl group, propyl group, n-butyl group, isobutyl group, sec-butyl group, t-butyl group, pentyl group, Examples thereof include those having 1 to 25 carbon atoms such as hexyl group, heptyl group, octyl group, t-amyl group, decanyl group, dodecanyl group and hexadecanyl group. The cycloalkyl group has 3 to 25 carbon atoms which may have a substituent, such as cyclopropyl group, cyclopentyl group, cyclohexyl group, cyclooctyl group, cyclododecanyl group, cyclohexadecanyl group and the like. Things. The alkoxy group may have a substituent, such as a methoxy group, an ethoxy group, a propoxy group, an isopropoxy group, an n-butoxy group, an isobutoxy group, a sec-butoxy group or a t-butoxy group, a pentyloxy group, t Examples thereof include those having 1 to 25 carbon atoms such as -amyloxy group, n-hexyloxy group, n-octyloxy group, n-dodecanoxy group and the like.
 アルコキシカルボニル基としては、置換基を有してもよい、メトキシカルボニル基、エトキシカルボニル基、プロポキシカルボニル基、イソプロポキシカルボニル基、n-ブトキシカルボニル基、イソブトキシカルボニル基、sec-ブトキシカルボニル基もしくはt-ブトキシカルボニル基、ペンチルオキシカルボニル基、t-アミロキシカルボニル基、n-ヘキシロキシカルボニル基、n-オクチルオキシカルボニル基、n-ドデカンオキシカルボニル基等のような炭素数2~25個のものが挙げられる。アシル基としては、置換基を有してもよい、ホルミル基、アセチル基、ブチリル基、バレリル基、ヘキサノイル基、オクタノイル基、t-ブチルカルボニル基、t-アミルカルボニル基等のような炭素数1~25個のものが挙げられる。アシロキシ基としては、置換基を有してもよい、アセトキシ基、プロピオニルオキシ基、ブチリルオキシ基、t-ブチリルオキシ基、t-アミリルオキシ基、n-ヘキサンカルボニロキシ基、n-オクタンカルボニロキシ基、n-ドデカンカルボニロキシ基、n-ヘキサデカンカルボニロキシ基、等のような炭素数2~25個のものが挙げられる。ハロゲン原子としては、フッ素原子、塩素原子、臭素原子もしくはヨウ素原子を挙げることができる。 As the alkoxycarbonyl group, a methoxycarbonyl group, ethoxycarbonyl group, propoxycarbonyl group, isopropoxycarbonyl group, n-butoxycarbonyl group, isobutoxycarbonyl group, sec-butoxycarbonyl group or t which may have a substituent may be used. Those having 2 to 25 carbon atoms such as -butoxycarbonyl group, pentyloxycarbonyl group, t-amyloxycarbonyl group, n-hexyloxycarbonyl group, n-octyloxycarbonyl group, n-dodecanoxycarbonyl group, etc. Can be mentioned. The acyl group may have a substituent and has 1 carbon atom such as formyl group, acetyl group, butyryl group, valeryl group, hexanoyl group, octanoyl group, t-butylcarbonyl group, t-amylcarbonyl group and the like. Up to 25 can be mentioned. As the acyloxy group, an acetoxy group, propionyloxy group, butyryloxy group, t-butyryloxy group, t-amylyloxy group, n-hexanecarbonyloxy group, n-octanecarbonyloxy group, which may have a substituent, Examples thereof include those having 2 to 25 carbon atoms such as n-dodecane carbonyloxy group, n-hexadecane carbonyloxy group, and the like. As the halogen atom, there can be mentioned a fluorine atom, a chlorine atom, a bromine atom or an iodine atom.
 これらの基に対する置換基として好ましくは、炭素数1~4個のアルコキシ基、ハロゲン原子(フッ素原子、塩素原子、臭素原子、ヨウ素原子)、アシル基、アシロキシ基、シアノ基、水酸基、カルボキシ基、アルコキシカルボニル基、ニトロ基等を挙げることができる。なお、前記のように、R、Rの少なくとも一方は、炭素数5個以上である、置換基を有していてもよいアルキル基、置換基を有していてもよいシクロアルキル基、置換基を有していてもよいアルコキシ基、置換基を有していてもよいアルコキシカルボニル基、置換基を有していてもよいアシル基、置換基を有していてもよいアシロキシ基を表す。上記これらの炭素数5個以上の置換基としては、上記具体例のうち炭素数5~25個のものを挙げることができる。 As a substituent for these groups, an alkoxy group having 1 to 4 carbon atoms, a halogen atom (a fluorine atom, a chlorine atom, a bromine atom, an iodine atom), an acyl group, an acyloxy group, a cyano group, a hydroxyl group, a carboxy group, An alkoxycarbonyl group, a nitro group, etc. can be mentioned. As described above, at least one of R 1 and R 2 has 5 or more carbon atoms and may have a substituent, a cycloalkyl group that may have a substituent, An alkoxy group which may have a substituent, an alkoxycarbonyl group which may have a substituent, an acyl group which may have a substituent, an acyloxy group which may have a substituent . Examples of the substituent having 5 or more carbon atoms include those having 5 to 25 carbon atoms in the above specific examples.
 上記の中でも、R41及びR42としての、置換基を有していてもよい、アルキル基としては、メチル基、エチル基、プロピル基、イソプロピル基、ブチル基、t-ブチル基、n-ペンチル基、t-アミル基、n-ヘキシル基、n-オクチル基、デカニル基が好ましく、シクロアルキル基としては、置換基を有してもよい、シクロヘキシル基、シクロオクチル基、シクロドデカニル基が好ましく、アルコキシ基としては、置換基を有してもよい、メトキシ基、エトキシ基、イソプロポキシ基、n-ブトキシ基、sec-ブトキシ基、t-ブトキシ基、ペンチルオキシ基、t-アミロキシ基、n-ヘキシロキシ基、n-オクチルオキシ基、n-ドデカンオキシ基が好ましく、アルコキシカルボニル基としては、置換基を有してもよい、メトキシカルボニル基、エトキシカルボニル基、イソプロポキシカルボニル基、n-ブトキシカルボニル基、sec-ブトキシカルボニル基、t-ブトキシカルボニル基、ペンチルオキシカルボニル基、t-アミロキシカルボニル基、n-ヘキシロキシカルボニル基、n-オクチルオキシカルボニル基、n-ドデカンオキシカルボニル基が好ましく、アシル基としては、置換基を有してもよい、ホルミル基、アセチル基、ブチリル基、バレリル基、ヘキサノイル基、オクタノイル基、t-ブチルカルボニル基、t-アミルカルボニル基が好ましく、アシロキシ基としては、置換基を有してもよい、アセトキシ基、プロピオニルオキシ基、ブチリルオキシ基、t-ブチリルオキシ基、t-アミリルオキシ基、n-ヘキサンカルボニロキシ基、n-オクタンカルボニロキシ基が好ましい。 Among these, as R 41 and R 42 , which may have a substituent, examples of the alkyl group include a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, a t-butyl group, and n-pentyl. Group, t-amyl group, n-hexyl group, n-octyl group and decanyl group are preferable, and the cycloalkyl group is preferably a cyclohexyl group, cyclooctyl group or cyclododecanyl group which may have a substituent. As the alkoxy group, which may have a substituent, a methoxy group, an ethoxy group, an isopropoxy group, an n-butoxy group, a sec-butoxy group, a t-butoxy group, a pentyloxy group, a t-amyloxy group, n -Hexyloxy group, n-octyloxy group and n-dodecanoxy group are preferable, and the alkoxycarbonyl group may be a methoxy group which may have a substituent. Carbonyl group, ethoxycarbonyl group, isopropoxycarbonyl group, n-butoxycarbonyl group, sec-butoxycarbonyl group, t-butoxycarbonyl group, pentyloxycarbonyl group, t-amyloxycarbonyl group, n-hexyloxycarbonyl group, n -Octyloxycarbonyl group and n-dodecanoxycarbonyl group are preferred, and the acyl group may have a substituent, formyl group, acetyl group, butyryl group, valeryl group, hexanoyl group, octanoyl group, t-butyl A carbonyl group and a t-amylcarbonyl group are preferable, and the acyloxy group may have an acetoxy group, a propionyloxy group, a butyryloxy group, a t-butyryloxy group, a t-amylyloxy group, and an n-hexanecarbonyl group, which may have a substituent. Roxy group, n-octa N-carbonyloxy group is preferred.
 また、炭素数5個以上の、置換基を有していてもよい、アルキル基としてはn-ペンチル基、t-アミル基、n-ヘキシル基、n-オクチル基、デカニル基が好ましい。炭素数5個以上の、置換基を有していてもよい、シクロアルキル基としてはシクロヘキシル基、シクロオクチル基、シクロドデカニル基が好ましい。炭素数5個以上の、置換基を有していてもよい、アルコキシ基としては、ペンチルオキシ基、t-アミロキシ基、ヘキシルオキシ基、n-オクチルオキシ基、ドデカンオキシ基が好ましい。炭素数5個以上の、置換基を有していてもよい、アルコキシカルボニル基としては、ペンチルオキシカルボニル基、t-アミロキシカルボニル基、ヘキシルオキシカルボニル基、n-オクチルオキシカルボニル基、ドデカンオキシカルボニル基が好ましい。炭素数5個以上の、置換基を有していてもよい、アシル基としては、バレリル基、ヘキサノイル基、オクタノイル基、t-アミルカルボニル基が好ましい。炭素数5個以上の、置換基を有していてもよいアシロキシ基としては、t-アミリルオキシ基、n-ヘキサンカルボニロキシ基、n-オクタンカルボニロキシ基が好ましい。これらの基に対する置換基としては、メトキシ基、エトキシ基、t-ブトキシ基、塩素原子、臭素原子、シアノ基、水酸基、メトキシカルボニル基、エトキシカルボニル基、t-ブトキシカルボニル基、t-アミロキシカルボニル基が好ましい。 The alkyl group having 5 or more carbon atoms and optionally having a substituent is preferably an n-pentyl group, a t-amyl group, an n-hexyl group, an n-octyl group or a decanyl group. The cycloalkyl group having 5 or more carbon atoms and optionally having a substituent is preferably a cyclohexyl group, a cyclooctyl group or a cyclododecanyl group. The alkoxy group having 5 or more carbon atoms and optionally having a substituent is preferably a pentyloxy group, a t-amyloxy group, a hexyloxy group, an n-octyloxy group, or a dodecanoxy group. Examples of the alkoxycarbonyl group having 5 or more carbon atoms which may have a substituent include a pentyloxycarbonyl group, a t-amyloxycarbonyl group, a hexyloxycarbonyl group, an n-octyloxycarbonyl group, and dodecaneoxycarbonyl. Groups are preferred. The acyl group having 5 or more carbon atoms and optionally having a substituent is preferably a valeryl group, a hexanoyl group, an octanoyl group or a t-amylcarbonyl group. As the acyloxy group having 5 or more carbon atoms, which may have a substituent, a t-amylyloxy group, an n-hexanecarbonyloxy group, and an n-octanecarbonyloxy group are preferable. Substituents for these groups include methoxy group, ethoxy group, t-butoxy group, chlorine atom, bromine atom, cyano group, hydroxyl group, methoxycarbonyl group, ethoxycarbonyl group, t-butoxycarbonyl group, t-amyloxycarbonyl group Groups are preferred.
 本発明で使用される一般式(TA-4)で表されるヨードニウム化合物は、その対アニオン、Xとして、上記のように特定の構造を有するスルフォン酸を用いる。対アニオンにおける、Rの置換基を有していてもよい脂肪族炭化水素基としては、炭素数1~20個の直鎖あるいは分岐したアルキル基、又は環状のアルキル基を挙げることができる。また、Rは置換基を有していてもよい芳香族基を挙げることができる。上記のRのアルキル基としては、置換基を有してもよい、メチル基、エチル基、プロピル基、n-ブチル基、n-ペンチル基、n-ヘキシル基、n-オクチル基、2-エチルヘキシル基、デシル基、ドデシル基等の炭素数1~20のものを挙げることができる。環状アルキル基としては、置換基を有してもよい、シクロペンチル基、シクロヘキシル基、シクロオクチル基、シクロドデシル基、アダマンチル基、ノルボルニル基、樟脳基、トリシクロデカニル基、メンチル基等を挙げることができる。芳香族基としては、置換基を有してもよい、フェニル基、ナフチル基を挙げることができる。 The iodonium compound represented by formula (TA-4) used in the present invention uses sulfonic acid having a specific structure as described above as its counter anion, X . Examples of the aliphatic hydrocarbon group which may have an R substituent in the counter anion include a linear or branched alkyl group having 1 to 20 carbon atoms, or a cyclic alkyl group. Moreover, R can mention the aromatic group which may have a substituent. Examples of the alkyl group for R include a methyl group, an ethyl group, a propyl group, an n-butyl group, an n-pentyl group, an n-hexyl group, an n-octyl group, and 2-ethylhexyl, which may have a substituent. And those having 1 to 20 carbon atoms such as a group, a decyl group and a dodecyl group. Examples of the cyclic alkyl group include an optionally substituted cyclopentyl group, cyclohexyl group, cyclooctyl group, cyclododecyl group, adamantyl group, norbornyl group, camphor group, tricyclodecanyl group, menthyl group and the like. Can do. Examples of the aromatic group include a phenyl group and a naphthyl group, which may have a substituent.
 上記の中でも、Rの置換基を有していてもよい、アルキル基としては、メチル基、トリフルオロメチル基、エチル基、ペンタフルオロエチル基、2,2,2-トリフルオロエチル基、n-プロピル基、n-ブチル基、ノナフルオロブチル基、n-ペンチル基、n-ヘキシル基、n-オクチル基、ヘプタデカフルオロオクチル基、2-エチルヘキシル基、デシル基、ドデシル基、環状アルキル基としてはシクロペンチル基、シクロヘキシル基、樟脳基を挙げることができる。芳香族基としては、置換基を有してもよい、フェニル基、ナフチル基、ペンタフルオロフェニル基、p-トルイル基、p-フルオロフェニル基、p-クロロフェニル基、p-ヒドロキフェニル基、p-メトキシフェニル基、ドデシルフェニル基、メシチル基、トリイソプロピルフェニル基、4-ヒドロキシ-1-ナフチル基、6-ヒドロキシ-2-ナフチル基を挙げることができる。 Among the above, as the alkyl group which may have a substituent of R, a methyl group, a trifluoromethyl group, an ethyl group, a pentafluoroethyl group, a 2,2,2-trifluoroethyl group, n- Propyl group, n-butyl group, nonafluorobutyl group, n-pentyl group, n-hexyl group, n-octyl group, heptadecafluorooctyl group, 2-ethylhexyl group, decyl group, dodecyl group, cyclic alkyl group A cyclopentyl group, a cyclohexyl group, and a camphor group can be mentioned. As the aromatic group, a phenyl group, a naphthyl group, a pentafluorophenyl group, a p-toluyl group, a p-fluorophenyl group, a p-chlorophenyl group, a p-hydroxyphenyl group, p-, which may have a substituent. Examples thereof include a methoxyphenyl group, dodecylphenyl group, mesityl group, triisopropylphenyl group, 4-hydroxy-1-naphthyl group, and 6-hydroxy-2-naphthyl group.
 上記の各置換基の中でも、より好ましいR41及びR42の具体例としては、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、t-ブチル基、n-ペンチル基、t-アミル基、n-ヘキシル基、n-オクチル基、シクロヘキシル基、メトキシ基、エトキシ基、イソプロポキシ基、n-ブトキシ基、t-ブトキシ基、ペンチルオキシ基、t-アミロキシ基、ヘキシルオキシ基、n-オクチルオキシ基、メトキシカルボニル基、エトキシカルボニル基、n-ブトキシカルボニル基、t-ブトキシカルボニル基、t-アミロキシカルボニル基、ヘキシルオキシカルボニル基、n-オクチルオキシカルボニル基、ホルミル基、アセチル基、ブチリル基、ヘキサノイル基、オクタノイル基、t-ブチルカルボニル基、t-アミルカルボニル基、アセトキシ基、プロピオニルオキシ基、ブチリルオキシ基、t-ブチリルオキシ基、t-アミリルオキシ基、n-ヘキサンカルボニロキシ基、n-オクタンカルボニロキシ基、水酸基、塩素原子、臭素原子、ニトロ基である。より好ましい炭素数5個以上の基の具体例としては、n-ペンチル基、t-アミル基、n-ヘキシル基、n-オクチル基、デカニル基、シクロヘキシル基、ペンチルオキシ基、t-アミロキシ基、ヘキシルオキシ基、n-オクチルオキシ基、ドデカンオキシ基、ペンチルオキシカルボニル基、t-アミロキシカルボニル基、ヘキシルオキシカルボニル基、n-オクチルオキシカルボニル基、ドデカンオキシカルボニル基、バレリル基、ヘキサノイル基、オクタノイル基、t-アミルヵルボニル基、t-アミリルオキシ基、n-ヘキサンカルボニロキシ基、n-オククンカルボニロキシ基である。 Among the above substituents, more preferred specific examples of R 41 and R 42 are methyl group, ethyl group, propyl group, isopropyl group, n-butyl group, t-butyl group, n-pentyl group, t- Amyl group, n-hexyl group, n-octyl group, cyclohexyl group, methoxy group, ethoxy group, isopropoxy group, n-butoxy group, t-butoxy group, pentyloxy group, t-amyloxy group, hexyloxy group, n -Octyloxy group, methoxycarbonyl group, ethoxycarbonyl group, n-butoxycarbonyl group, t-butoxycarbonyl group, t-amyloxycarbonyl group, hexyloxycarbonyl group, n-octyloxycarbonyl group, formyl group, acetyl group, Butyryl group, hexanoyl group, octanoyl group, t-butylcarbonyl group, t-amylca Bonyl group, acetoxy group, propionyloxy group, butyryloxy group, t-butyryloxy group, t-amylyloxy group, n-hexanecarbonyloxy group, n-octanecarbonyloxy group, hydroxyl group, chlorine atom, bromine atom, nitro group is there. Specific examples of more preferable groups having 5 or more carbon atoms include n-pentyl group, t-amyl group, n-hexyl group, n-octyl group, decanyl group, cyclohexyl group, pentyloxy group, t-amyloxy group, Hexyloxy group, n-octyloxy group, dodecaneoxy group, pentyloxycarbonyl group, t-amyloxycarbonyl group, hexyloxycarbonyl group, n-octyloxycarbonyl group, dodecanoxyoxycarbonyl group, valeryl group, hexanoyl group, octanoyl group A t-amylcarbonyl group, a t-amylyloxy group, an n-hexanecarbonyloxy group, and an n-octenecarbonyloxy group.
 より好ましいスルフォン酸置換基Rの具体例としては、メチル基、トリフルオロメチル基、エチル基、ペンタフルオロエチル基、2,2,2-トリフルオロエチル基、n-ブチル基、ノナフルオロブチル基、n-ヘキシル基、n-オクチル基、ヘプタデカフルオロオクチル基、2-エチルヘキシル基、樟脳基、フェニル基、ナフチル基、ペンタフルオロフェニル基、p-トルイル基、p-フルオロフェニル基、p-クロロフェニル基、p-メトキシフェニル基、ドデシルフェニル基、メシチル基、トリイソプロピルフェニル基、4-ヒドロキシ-1-ナフチル基、6-ヒドロキシ-2-ナフチル基である。 Specific examples of the more preferable sulfonic acid substituent R include methyl group, trifluoromethyl group, ethyl group, pentafluoroethyl group, 2,2,2-trifluoroethyl group, n-butyl group, nonafluorobutyl group, n-hexyl group, n-octyl group, heptadecafluorooctyl group, 2-ethylhexyl group, camphor group, phenyl group, naphthyl group, pentafluorophenyl group, p-toluyl group, p-fluorophenyl group, p-chlorophenyl group P-methoxyphenyl group, dodecylphenyl group, mesityl group, triisopropylphenyl group, 4-hydroxy-1-naphthyl group, 6-hydroxy-2-naphthyl group.
 発生する酸の総炭素数としては1~30個が好ましい。より好ましくは1~28個であり、更に好ましくは1~25個である。その総炭素数が1個未満の場合、揮発による解像不良など支障をきたす場合があり、30個を超えると、現像残渣が生じる場合があるなど好ましくない。
 以下に、一般式(TA-4)で表される化合物の具体例を示すが、これらに限定されるものではない。これらの化合物は、単独で、もしくは2種以上の組み合わせで用いられる。
The total number of carbon atoms of the acid generated is preferably 1-30. More preferably, the number is 1 to 28, and still more preferably 1 to 25. If the total number of carbon atoms is less than 1, troubles such as poor resolution due to volatilization may occur, and if it exceeds 30, the development residue may be generated.
Specific examples of the compound represented by formula (TA-4) are shown below, but are not limited thereto. These compounds are used alone or in combination of two or more.
Figure JPOXMLDOC01-appb-C000088
Figure JPOXMLDOC01-appb-C000088
 熱酸発生剤として好ましいイミドスルホネート化合物としては、以下の一般式の化合物を挙げることができる。 Examples of the imide sulfonate compound preferable as the thermal acid generator include compounds of the following general formula.
Figure JPOXMLDOC01-appb-C000089
Figure JPOXMLDOC01-appb-C000089
 式中、C(炭素原子)とC(炭素原子)間は単結合あるいは二重結合で結合され、R51又はR52は、同じでも異なってもよく、下記(1)~(4)のいずれかを表し、(1)それぞれ独立に水素原子、アルキル基、シクロアルキル基、アリール基、(2)C、Cとともに1つあるいは複数のヘテロ原子を含んでよい単環又は多環を形成する、(3)CとCを含む縮合した芳香環を形成する、(4)N-スルフォニルオキシイミドを含む残基を表す。
 R53はアルキル基、ハロゲン化アルキル基、環状アルキル基、アルケニル基、置換基を有してよいアリール基、置換基を有してよいアラルキル基、又は樟脳基を表す。
In the formula, C 1 (carbon atom) and C 2 (carbon atom) are bonded by a single bond or a double bond, and R 51 or R 52 may be the same or different, and the following (1) to (4) (1) each independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, or (2) a monocyclic or polycyclic ring that may contain one or more heteroatoms together with C 1 and C 2 (3) represents a residue containing N-sulfonyloxyimide that forms a condensed aromatic ring containing C 1 and C 2 .
R 53 represents an alkyl group, a halogenated alkyl group, a cyclic alkyl group, an alkenyl group, an aryl group which may have a substituent, an aralkyl group which may have a substituent, or a camphor group.
 一般式(TA-5)における、R51及びR52が(1)のケースに当たる場合、アルキル基としては、メチル基、エチル基、プロピル基、イソプロピル基、n-ブチル基、sec-ブチル基、tert-ブチル基の様な炭素数1~4個のアルキル基が挙げられる。シクロアルキル基としては、シクロプロピル基、シクロペンチル基、シクロヘキシル基、シクロオクチル基等炭素数3~8個のものが挙げられる。アリール基としては、フェニル基、トリル基、キシリル基、メシチル基、ナフチル基の様な炭素数6~14個のものをあげることができる。R51及びR52が(2)のケースに当たる場合、例えば以下の様な部分構造をあげることができる。 In the general formula (TA-5), when R 51 and R 52 correspond to the case of (1), the alkyl group includes a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, a sec-butyl group, Examples thereof include an alkyl group having 1 to 4 carbon atoms such as a tert-butyl group. Examples of the cycloalkyl group include those having 3 to 8 carbon atoms such as cyclopropyl group, cyclopentyl group, cyclohexyl group, cyclooctyl group and the like. Examples of the aryl group include those having 6 to 14 carbon atoms such as phenyl group, tolyl group, xylyl group, mesityl group, and naphthyl group. When R 51 and R 52 correspond to the case (2), for example, the following partial structure can be given.
Figure JPOXMLDOC01-appb-C000090
Figure JPOXMLDOC01-appb-C000090
 R51及びR52が(3)のケースに当たる場合、例えば以下の様な部分構造をあげることができる。 When R 51 and R 52 correspond to the case of (3), for example, the following partial structure can be given.
Figure JPOXMLDOC01-appb-C000091
Figure JPOXMLDOC01-appb-C000091
 R51及びR52が(4)のケースに当たる場合は、いわゆる少なくとも2つのN-スルフォニルオキシイミド残基が上記(1)~(3)の部分構造を有するR51及びR52の部分で単結合もしくは以下のような2価の有機基で結合したものをあげることができる。但し、下記連結基は単独であるいは2つ以上の組合せで使用される。
 〔2価の有機基〕:-O-、-S-、-SO-、-SO-、-NH-、-CO-、-CO-、-NHSO-、-NHCO-、-NHCO-、
When R 51 and R 52 correspond to the case of (4), so-called at least two N-sulfonyloxyimide residues are a single bond at the R 51 and R 52 portions having the partial structures of (1) to (3) above. Or the thing couple | bonded with the following bivalent organic groups can be mention | raise | lifted. However, the following linking groups are used alone or in combination of two or more.
[Divalent organic group]: -O -, - S -, - SO -, - SO 2 -, - NH -, - CO -, - CO 2 -, - NHSO 2 -, - NHCO -, - NHCO 2 -,
Figure JPOXMLDOC01-appb-C000092
Figure JPOXMLDOC01-appb-C000092
(R55及びR56は、各々、水素原子又はメチル基を表す。mは1~4の整数を表す。) (R 55 and R 56 each represents a hydrogen atom or a methyl group. M represents an integer of 1 to 4.)
 R53のアルキル基としては炭素数1~20個の直鎖あるいは分岐のアルキル基をあげることができる。好ましくは炭素数1~16個の直鎖あるいは分岐のアルキル基であり、更に好ましくは炭素数1~12個のものである。炭素数が21個以上のアルキル基の場合、感度、解像力が低下するため好ましくない。ハロゲン化アルキル基としては上記アルキル基の1つあるいは2つ以上の水素原子がハロゲン化されたものをあげることができる。置換するハロゲン原子としてはフッ素原子、塩素原子、臭素原子、ヨウ素原子をあげることができる。好ましくはフッ素原子、塩素原子、臭素原子であり、特に好ましくはフッ素原子である。但し、置換するハロゲン原子は一分子当たり複数の種類であってもよい。環状アルキル基としては、シクロプロピル基、シクロペンチル基、シクロヘキシル基、シクロオクチル基等の炭素数3~12個のシクロアルキル基やノルボルニル基、アダマンチル基、トリシクロデカニル基等の多環状置換基をあげることができる。アルケニル基としては炭素数2~20個の直鎖あるいは分岐のアルケニル基をあげることができる。好ましくは炭素数2~16個の直鎖あるいは分岐のアルケニル基であり、更に好ましくは炭素数2~12個のものである。炭素数が21個以上のアルケニル基の場合、感度、解像力が低下するため好ましくない。 Examples of the alkyl group for R 53 include linear or branched alkyl groups having 1 to 20 carbon atoms. Preferred is a linear or branched alkyl group having 1 to 16 carbon atoms, and more preferred is one having 1 to 12 carbon atoms. In the case of an alkyl group having 21 or more carbon atoms, sensitivity and resolving power decrease, which is not preferable. Examples of the halogenated alkyl group include those in which one or two or more hydrogen atoms of the alkyl group are halogenated. Examples of the halogen atom to be substituted include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom. Preferred are a fluorine atom, a chlorine atom and a bromine atom, and particularly preferred is a fluorine atom. However, the halogen atom to be substituted may be plural types per molecule. Examples of the cyclic alkyl group include cycloalkyl groups having 3 to 12 carbon atoms such as cyclopropyl group, cyclopentyl group, cyclohexyl group, and cyclooctyl group, and polycyclic substituents such as norbornyl group, adamantyl group, and tricyclodecanyl group. I can give you. Examples of the alkenyl group include linear or branched alkenyl groups having 2 to 20 carbon atoms. A straight-chain or branched alkenyl group having 2 to 16 carbon atoms is preferable, and one having 2 to 12 carbon atoms is more preferable. In the case of an alkenyl group having 21 or more carbon atoms, sensitivity and resolving power decrease, which is not preferable.
 R53のアリール基としてはフェニル基、ナフチル基をあげることができ、アラルキル基としてはベンジル基をあげることができる。アリール基とアラルキル基の置換基としては、メチル基、エチル基、プロピル基、イソプロピル基、tert-ブチル基等の低級アルキル基、シクロペンチル基、シクロヘキシル基等のシクロアルキル基、フェニル基、トルイル基、キシリル基、メシチル基等のアリール基、メトキシ基、エトキシ基、プロポキシ基、イソプロポキシ基、sec-ブトキシ基、tert-ブトキシ基等の低級アルコキシ基、ビニル基、アリル基、プロペニル基、ブテニル基等のアルケニル基、ホルミル基、アセチル基等のアシル基、ヒドロキシ基、カルボキシ基、シアノ基、ニトロ基、フッ素原子、塩素原子、臭素原子、ヨウ素原子等のハロゲン原子をあげることができる。好ましくは、メチル基、エチル基、プロピル基、イソプロピル基、tert-ブチル基等の低級アルキル基、シクロヘキシル基、フェニル基、トルイル基、メトキシ基、エトキシ基、プロポキシ基、イソプロポキシ基、sec-ブトキシ基、tert-ブトキシ基等の低級アルコキシ基、シアノ基、ニトロ基、フッ素原子、塩素原子、臭素原子、ヨウ素原子等のハロゲン原子である。なおアリール基、アラルキル基上の置換基は2種類以上であっても構わない。
 以下にこれらの化合物の具体例を示すが、これらに限定されるものではない。
Examples of the aryl group of R 53 include a phenyl group and a naphthyl group, and examples of the aralkyl group include a benzyl group. Examples of the substituent of the aryl group and the aralkyl group include a lower alkyl group such as a methyl group, an ethyl group, a propyl group, an isopropyl group, and a tert-butyl group, a cycloalkyl group such as a cyclopentyl group and a cyclohexyl group, a phenyl group, a toluyl group, Aryl groups such as xylyl and mesityl groups, methoxy groups, ethoxy groups, propoxy groups, isopropoxy groups, sec-butoxy groups, tert-butoxy groups and other lower alkoxy groups, vinyl groups, allyl groups, propenyl groups, butenyl groups, etc. And an acyl group such as alkenyl group, formyl group and acetyl group, and halogen atoms such as hydroxy group, carboxy group, cyano group, nitro group, fluorine atom, chlorine atom, bromine atom and iodine atom. Preferably, a lower alkyl group such as a methyl group, ethyl group, propyl group, isopropyl group, tert-butyl group, cyclohexyl group, phenyl group, toluyl group, methoxy group, ethoxy group, propoxy group, isopropoxy group, sec-butoxy Group, lower alkoxy group such as tert-butoxy group, halogen atom such as cyano group, nitro group, fluorine atom, chlorine atom, bromine atom and iodine atom. Two or more kinds of substituents on the aryl group and the aralkyl group may be used.
Specific examples of these compounds are shown below, but are not limited thereto.
Figure JPOXMLDOC01-appb-C000093
Figure JPOXMLDOC01-appb-C000093
Figure JPOXMLDOC01-appb-C000094
Figure JPOXMLDOC01-appb-C000094
 熱酸発生剤として好ましいオキシムスルホネート化合物としては以下の一般式の化合物を挙げることができる。 Preferred oxime sulfonate compounds as thermal acid generators include compounds of the following general formula.
Figure JPOXMLDOC01-appb-C000095
Figure JPOXMLDOC01-appb-C000095
 上記一般式(TA-6)中、R61及びR62は、炭素数1から16の置換基を有していても良いアルキル基、アルケニル基、アルキニル基、シクロアルキル基、シクロアルケニル基、置換基を有していても良いアリール基、ヘテロアリール基、シアノ基を表す。また、R61及びR62は、炭素数2から8の置換基を有していても良いアルキレン鎖、アルケニレン鎖、アルキニリン鎖、又は、置換基を有していても良いフェニレン、フリーレン、チエニレン、-O-、-S-、-N-、-CO-を含む連結鎖を介して、別の一般式(TA-6)で表される化合物のR61又はR62と結合されていても良い。即ち、一般式(TA-6)で表される化合物は、オキシムスルホネート構造が連結鎖を介して2つ又は3つ有するものも包含する。
 R63は炭素数1~16個の置換基を有していても良いアルキル基、シクロアルキル基、置換基を有していても良いアリール基を表す。
In the above general formula (TA-6), R 61 and R 62 are an alkyl group, alkenyl group, alkynyl group, cycloalkyl group, cycloalkenyl group, substituted group which may have a substituent having 1 to 16 carbon atoms. An aryl group, a heteroaryl group or a cyano group which may have a group. R 61 and R 62 are an alkylene chain, alkenylene chain, alkynylline chain, which may have a substituent having 2 to 8 carbon atoms, or phenylene, freelen, thienylene, which may have a substituent, It may be bonded to R 61 or R 62 of the compound represented by another general formula (TA-6) through a linking chain containing —O—, —S—, —N—, and —CO—. . That is, the compound represented by the general formula (TA-6) includes those having two or three oxime sulfonate structures via a linking chain.
R 63 represents an alkyl group, a cycloalkyl group, or an aryl group which may have a substituent, which may have a substituent having 1 to 16 carbon atoms.
 R61~R63における炭素数1~16個のアルキル基としては、メチル基、エチル基、プロピル基、i-プロピル基、ブチル基、i-ブチル基、t-ブチル基、t-アミル基、n-ヘキシル基、n-オクチル基、i-オクチル基、n-デシル基、ウンデシル基、ドデシル基、ヘキサデシル基等のアルキル基、トリフルオロメチル基、ペルフルオロプロピル基、ペルフルオロブチル基、ペルフルオロ-t-ブチル基、ペルフルオロオクチル基、ペルフルオロウンデシル基、1,1-ビストリフルオロメチルエチル基、等が挙げられる。 Examples of the alkyl group having 1 to 16 carbon atoms in R 61 to R 63 include a methyl group, an ethyl group, a propyl group, an i-propyl group, a butyl group, an i-butyl group, a t-butyl group, a t-amyl group, alkyl groups such as n-hexyl group, n-octyl group, i-octyl group, n-decyl group, undecyl group, dodecyl group, hexadecyl group, trifluoromethyl group, perfluoropropyl group, perfluorobutyl group, perfluoro-t- Examples thereof include a butyl group, a perfluorooctyl group, a perfluoroundecyl group, and a 1,1-bistrifluoromethylethyl group.
 R61及びR62におけるアルケニル基としては、アリル基、メタリル基、ビニル基、メチルアリル基、1-ブテニル基、3-ブテニル基、2-ブテニル基、1,3-ペンタジエニル基、5-ヘキセニル基、2-オキソ-3-ペンテニル基、デカペンタエニル基、7-オクテニル基等が挙げられる。 Examples of the alkenyl group for R 61 and R 62 include allyl group, methallyl group, vinyl group, methylallyl group, 1-butenyl group, 3-butenyl group, 2-butenyl group, 1,3-pentadienyl group, 5-hexenyl group, Examples include 2-oxo-3-pentenyl group, decapentaenyl group, 7-octenyl group and the like.
 R61及びR62におけるアルキニル基としては、エチニル基、プロパルギル基、2-ブチニル基、4-ヘキシニル基、2-オクチニル基、フェニルエチニル基、シクロヘキシルエチニル基等が挙げられる。 Examples of the alkynyl group in R 61 and R 62 include ethynyl group, propargyl group, 2-butynyl group, 4-hexynyl group, 2-octynyl group, phenylethynyl group, cyclohexylethynyl group and the like.
 R61~R63におけるシクロアルキル基としては、置換基を有していてもよい、シクロプロピル基、シクロペンチル基、シクロヘキシル基のような炭素数3~8個のものが挙げられる。 Examples of the cycloalkyl group in R 61 to R 63 include those having 3 to 8 carbon atoms, such as a cyclopropyl group, a cyclopentyl group, and a cyclohexyl group, which may have a substituent.
 R61及びR62におけるシクロアルケニル基としては、シクロブテニル基、シクロヘキセニル基、シクロペンタジエニル基、ビシクロ〔4.2.4〕ドデカ-3,7-ジエン-5-イル基等が挙げられる。 Examples of the cycloalkenyl group for R 61 and R 62 include a cyclobutenyl group, a cyclohexenyl group, a cyclopentadienyl group, a bicyclo [4.2.4] dodeca-3,7-dien-5-yl group, and the like.
 R61~R63におけるアリール基としては、置換基を有していてもよい、フェニル基、トリル基、メトキシフェニル基、ナフチル基のような炭素数6~14個のものが挙げられる。 Examples of the aryl group in R 61 to R 63 include those having 6 to 14 carbon atoms, such as phenyl group, tolyl group, methoxyphenyl group, and naphthyl group, which may have a substituent.
 上記の置換基としては、アルキル基、シクロアルキル基、アルコキシ基、ハロゲン原子(フッ素原子、塩素原子、沃素原子)、シアノ基、ヒドロキシ基、カルボキシ基、ニトロ基、アリールオキシ基、アルキルチオ基、アラルキル基、下記一般式(1A)で示される基等が挙げられる。
 ここでアルキル基、シクロアルキル基は上記で挙げたものと同義である。アルコキシ基としては、メトキシ基、エトキシ基、ヒドロキシエトキシ基、プロポキシ基、n-ブトキシ基、イソブトキシ基、sec-ブトキシ基、t-ブトキシ基のような炭素数1~4個のものが挙げられる。アラルキル基としては、ベンジル基、ナフチルメチル基、フリル基、チエニル基などが挙げられる。
The above substituents include alkyl groups, cycloalkyl groups, alkoxy groups, halogen atoms (fluorine atoms, chlorine atoms, iodine atoms), cyano groups, hydroxy groups, carboxy groups, nitro groups, aryloxy groups, alkylthio groups, aralkyls. And groups represented by the following general formula (1A).
Here, the alkyl group and the cycloalkyl group have the same meanings as described above. Examples of the alkoxy group include those having 1 to 4 carbon atoms such as methoxy group, ethoxy group, hydroxyethoxy group, propoxy group, n-butoxy group, isobutoxy group, sec-butoxy group and t-butoxy group. Examples of the aralkyl group include a benzyl group, a naphthylmethyl group, a furyl group, and a thienyl group.
Figure JPOXMLDOC01-appb-C000096
Figure JPOXMLDOC01-appb-C000096
 上記式中、R61及びR62は、前記一般式(TA-6)中のR61及びR62と同義である。 In the above formula, R 61 and R 62 have the same meanings as R 61 and R 62 in formula (TA-6).
 一般式(TA-6)で表される化合物の具体例を以下に示すが、本発明はこれらに限定されるものではない。 Specific examples of the compound represented by the general formula (TA-6) are shown below, but the present invention is not limited thereto.
Figure JPOXMLDOC01-appb-C000097
Figure JPOXMLDOC01-appb-C000097
Figure JPOXMLDOC01-appb-C000098
Figure JPOXMLDOC01-appb-C000098
 熱酸発生剤として好ましいオキシムスルホネート系酸発生剤として、下記一般式(TA-7)で表される基を少なくとも1つ有する化合物を挙げることができる。 Preferred examples of the oxime sulfonate-based acid generator as the thermal acid generator include compounds having at least one group represented by the following general formula (TA-7).
Figure JPOXMLDOC01-appb-C000099
Figure JPOXMLDOC01-appb-C000099
(式(TA-7)中、R70a及びR70bは、それぞれ独立に有機基を表す。)
 R70a及びR70bの有機基は、炭素原子を含む基であり、炭素原子以外の原子(たとえば水素原子、酸素原子、窒素原子、硫黄原子、ハロゲン原子(フッ素原子、塩素原子等)等)を有していてもよい。
 R70aの有機基としては、直鎖、分岐又は環状のアルキル基又はアリール基が好ましい。これらのアルキル基、アリール基は置換基を有していても良い。該置換基としては、特に制限はなく、たとえばフッ素原子、炭素数1~6の直鎖、分岐又は環状のアルキル基等が挙げられる。ここで、「置換基を有する」とは、アルキル基又はアリール基の水素原子の一部又は全部が置換基で置換されていることを意味する。
 アルキル基としては、炭素数1~20が好ましく、炭素数1~10がより好ましく、炭素数1~8が更に好ましく、炭素数1~6が特に好ましく、炭素数1~4が最も好ましい。アルキル基としては、特に、部分的又は完全にハロゲン化されたアルキル基(以下、ハロゲン化アルキル基ということがある)が好ましい。なお、部分的にハロゲン化されたアルキル基とは、水素原子の一部がハロゲン原子で置換されたアルキル基を意味し、完全にハロゲン化されたアルキル基とは、水素原子の全部がハロゲン原子で置換されたアルキル基を意味する。ハロゲン原子としては、フッ素原子、塩素原子、臭素原子、ヨウ素原子等が挙げられ、特にフッ素原子が好ましい。すなわち、ハロゲン化アルキル基は、フッ素化アルキル基であることが好ましい。
 アリール基は、炭素数4~20が好ましく、炭素数4~10がより好ましく、炭素数6~10が最も好ましい。アリール基としては、特に、部分的又は完全にハロゲン化されたアリール基が好ましい。なお、部分的にハロゲン化されたアリール基とは、水素原子の一部がハロゲン原子で置換されたアリール基を意味し、完全にハロゲン化されたアリール基とは、水素原子の全部がハロゲン原子で置換されたアリール基を意味する。
 R70aとしては、特に、置換基を有さない炭素数1~4のアルキル基、又は炭素数1~4のフッ素化アルキル基が好ましい。
(In formula (TA-7), R 70a and R 70b each independently represents an organic group.)
The organic group of R 70a and R 70b is a group containing a carbon atom, and an atom other than a carbon atom (for example, a hydrogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a halogen atom (a fluorine atom, a chlorine atom, etc.)) You may have.
As the organic group for R 70a , a linear, branched, or cyclic alkyl group or aryl group is preferable. These alkyl groups and aryl groups may have a substituent. The substituent is not particularly limited, and examples thereof include a fluorine atom and a linear, branched or cyclic alkyl group having 1 to 6 carbon atoms. Here, “having a substituent” means that part or all of the hydrogen atoms of the alkyl group or aryl group are substituted with a substituent.
The alkyl group preferably has 1 to 20 carbon atoms, more preferably 1 to 10 carbon atoms, still more preferably 1 to 8 carbon atoms, particularly preferably 1 to 6 carbon atoms, and most preferably 1 to 4 carbon atoms. As the alkyl group, a partially or completely halogenated alkyl group (hereinafter sometimes referred to as a halogenated alkyl group) is particularly preferable. The partially halogenated alkyl group means an alkyl group in which a part of hydrogen atoms is substituted with a halogen atom, and the fully halogenated alkyl group means that all of the hydrogen atoms are halogen atoms. Means an alkyl group substituted with Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom, and a fluorine atom is particularly preferable. That is, the halogenated alkyl group is preferably a fluorinated alkyl group.
The aryl group preferably has 4 to 20 carbon atoms, more preferably 4 to 10 carbon atoms, and most preferably 6 to 10 carbon atoms. As the aryl group, a partially or completely halogenated aryl group is particularly preferable. The partially halogenated aryl group means an aryl group in which a part of hydrogen atoms is substituted with a halogen atom, and the fully halogenated aryl group means that all of the hydrogen atoms are halogen atoms. Means an aryl group substituted with.
R 70a is particularly preferably an alkyl group having 1 to 4 carbon atoms having no substituent or a fluorinated alkyl group having 1 to 4 carbon atoms.
 R70bの有機基としては、直鎖、分岐又は環状のアルキル基、アリール基又はシアノ基が好ましい。R70bのアルキル基、アリール基としては、前記R70aで挙げたアルキル基、アリール基と同様のものが挙げられる。
 R70bとしては、特に、シアノ基、置換基を有さない炭素数1~8のアルキル基、又は炭素数1~8のフッ素化アルキル基が好ましい。
As the organic group for R 70b , a linear, branched, or cyclic alkyl group, aryl group, or cyano group is preferable. As the alkyl group and aryl group for R 70b, the same alkyl groups and aryl groups as those described above for R 70a can be used.
R 70b is particularly preferably a cyano group, an alkyl group having 1 to 8 carbon atoms having no substituent, or a fluorinated alkyl group having 1 to 8 carbon atoms.
 オキシムスルホネート系酸発生剤としては、下記一般式(TA-7a)又は(TA-7b)で表される化合物が、電子線の照射に対する酸発生効率が高いことから、好ましく用いられる。 As the oxime sulfonate-based acid generator, a compound represented by the following general formula (TA-7a) or (TA-7b) is preferably used because of its high acid generation efficiency against electron beam irradiation.
Figure JPOXMLDOC01-appb-C000100
Figure JPOXMLDOC01-appb-C000100
[式(TA-7a)中、m’は0又は1;Xは1又は2;R71は、炭素数1~12のアルキル基が置換していてもよいフェニル基、ヘテロアリール基、又は、m’が0の場合は更に炭素数2~6のアルコキシカルボニル基、フェノキシカルボニル基、CN(シアノ基);R72はR71と同義;R73’は、Xが1のとき炭素数1~18のアルキル基、Xが2のとき炭素数2~12のアルキレン基、フェニレン基;R74,R75は独立に水素原子、ハロゲン原子、炭素数1~6のアルキル基;Aは-S-、-O-、-N(R76)-を示す。R76はアルキル基、アリール基又はアラルキル基を示す。] [In the formula (TA-7a), m ′ is 0 or 1; X is 1 or 2; R 71 is a phenyl group, a heteroaryl group, or an alkyl group having 1 to 12 carbon atoms, or When m ′ is 0, an alkoxycarbonyl group having 2 to 6 carbon atoms, a phenoxycarbonyl group, CN (cyano group); R 72 is synonymous with R 71 ; R 73 ′ is 1 to 1 carbon atoms when X is 1; An alkyl group having 18 carbon atoms, an alkylene group having 2 to 12 carbon atoms when X is 2, a phenylene group; R 74 and R 75 are independently a hydrogen atom, a halogen atom, an alkyl group having 1 to 6 carbon atoms; A is —S— , -O-, -N (R 76 )-. R76 represents an alkyl group, an aryl group or an aralkyl group. ]
Figure JPOXMLDOC01-appb-C000101
Figure JPOXMLDOC01-appb-C000101
[式(TA-7b)中、R71’は炭素数2~12のアルキレン基;R72、R74、R75、Aは上記と同義;R73は炭素数1~18のアルキル基を示す。] [In the formula (TA-7b), R 71 ′ is an alkylene group having 2 to 12 carbon atoms; R 72 , R 74 , R 75 and A are as defined above; R 73 is an alkyl group having 1 to 18 carbon atoms. . ]
 上記化合物としては、特に、下記チオレン含有オキシムスルホネートが好ましい。 As the above compound, the following thiolene-containing oxime sulfonate is particularly preferable.
Figure JPOXMLDOC01-appb-C000102
Figure JPOXMLDOC01-appb-C000102
 好ましいニトロベンジルスルホネートの一般式としては一般式(TA-9)で表される化合物を挙げることができる。 Preferred examples of the general formula of nitrobenzyl sulfonate include compounds represented by the general formula (TA-9).
Figure JPOXMLDOC01-appb-C000103
Figure JPOXMLDOC01-appb-C000103
(この式のZは、アルキル基、アリール基、アルキルアリール基、ハロゲン置換されたアルキル基、ハロゲン置換されたアリール基、ハロゲン置換されたアルキルアリール基、ニトロ置換されたアリール基、ニトロ置換されたアルキルアリール基、ニトロ置換基とハロゲン置換基を有するアリール基、ニトロ置換基とハロゲン置換基を有するアルキルアリール基、及び、式CSOCHR’C4-m(NO)を有する基から選択され、Rは、水素原子又はメチル基を表し、R’は水素原子、メチル基、及びニトロ置換されたアリール基から選ばれ、各Qは炭化水素基、ヒドロカルボノキシ基、NO、ハロゲン原子及び有機ケイ素基から独立に選ばれ、mの値は0、1又は2であり、但しQは酸性の基ではない)
 一般式(TA-9)で表される化合物の具体例としては、例えば、以下の化合物を挙げることができる。
(Z in this formula is alkyl group, aryl group, alkylaryl group, halogen-substituted alkyl group, halogen-substituted aryl group, halogen-substituted alkylaryl group, nitro-substituted aryl group, nitro-substituted An alkylaryl group, an aryl group having a nitro substituent and a halogen substituent, an alkylaryl group having a nitro substituent and a halogen substituent, and the formula C 6 H 4 SO 3 CHR′C 6 H 4-m Q m (NO ) is selected 2 from the groups having, R represents a hydrogen atom or a methyl group, R 'are selected from hydrogen atoms and methyl groups, and nitro substituted aryl groups, each Q is a hydrocarbon radical, Hidorokarubono Independently selected from a xyl group, NO 2 , a halogen atom and an organosilicon group, the value of m being 0, 1 or 2, provided that Q is not an acidic group)
Specific examples of the compound represented by the general formula (TA-9) include the following compounds.
Figure JPOXMLDOC01-appb-C000104
Figure JPOXMLDOC01-appb-C000104
 また、スルホン酸エステルも使用することができる。
 例えば、下記一般式(TA-1)で表されるスルホン酸エステルを挙げることができる。
       R’-SO-O-R”   (TA-1)
 上記式において、R’及びR”はそれぞれ独立に、置換基を有していても良い炭素数1~10の直鎖又は分岐又は環状のアルキル基又は置換を有していても良い炭素数6~20のアリール基を示す。置換基としては、水酸基、ハロゲン原子、シアノ基、ビニル基、アセチレン基炭素数1~10の直鎖又は環状のアルキル基が挙げられる。
 該スルホン酸エステルの好ましい具体例として下記が挙げられる。
Also sulfonic acid esters can be used.
For example, a sulfonic acid ester represented by the following general formula (TA-1) can be given.
R′—SO 2 —O—R ″ (TA-1)
In the above formula, R ′ and R ″ are each independently a linear or branched alkyl group having 1 to 10 carbon atoms which may have a substituent or an optionally substituted carbon group having 6 carbon atoms. Represents an aryl group of ˜20, and examples of the substituent include a hydroxyl group, a halogen atom, a cyano group, a vinyl group, an acetylene group, and a linear or cyclic alkyl group having 1 to 10 carbon atoms.
Preferable specific examples of the sulfonic acid ester include the following.
Figure JPOXMLDOC01-appb-C000105
Figure JPOXMLDOC01-appb-C000105
 スルホン酸エステルとして、下記一般式(TA-2)で表される化合物が、耐熱性の点で更に好ましい。
 スルホン酸エステルの分子量は、一般的には230~1000、好ましくは230~800である。
As the sulfonic acid ester, a compound represented by the following general formula (TA-2) is more preferable from the viewpoint of heat resistance.
The molecular weight of the sulfonate ester is generally 230 to 1000, preferably 230 to 800.
Figure JPOXMLDOC01-appb-C000106
Figure JPOXMLDOC01-appb-C000106
 Aは、h価の連結基を表す。 
 R0は、アルキル基、アリール基、アラルキル基、又は環状アルキル基を表す。
 R0’は、水素原子、アルキル基、又はアラルキル基を表す。
 hは、2~8の整数を表す。
A represents an h-valent linking group.
R 0 represents an alkyl group, an aryl group, an aralkyl group, or a cyclic alkyl group.
R 0 ′ represents a hydrogen atom, an alkyl group, or an aralkyl group.
h represents an integer of 2 to 8.
 Aとしてのh価の連結基は、例えば、アルキレン基(例えばメチレン、エチレン、プロピレン等)、シクロアルキレン基(シクロへキシレン、シクロペンチレン等)、アリーレン基(1,2-フェニレン、1,3-フェニレン、1,4-フェニレン、ナフチレン等)、エーテル基、カルボニル基、エステル基、アミド基、及びこれらに基を組み合わせた2価の基の任意の水素原子をh-2個除いた基を挙げることができる。
 Aとしてのh価の連結基の炭素数は一般的に1~15であり、1~10であることが好ましく、1~6であることが更に好ましい。
The h-valent linking group as A includes, for example, an alkylene group (eg, methylene, ethylene, propylene, etc.), a cycloalkylene group (eg, cyclohexylene, cyclopentylene, etc.), an arylene group (1,2-phenylene, 1,3). -Phenylene, 1,4-phenylene, naphthylene, etc.), an ether group, a carbonyl group, an ester group, an amide group, and a group obtained by removing h-2 arbitrary hydrogen atoms from a divalent group combining these groups. Can be mentioned.
The carbon number of the h-valent linking group as A is generally 1 to 15, preferably 1 to 10, and more preferably 1 to 6.
 R0及びR0’のアルキル基としては、一般的には炭素数1~20のアルキル基であり、好ましくは炭素数1~15のアルキル基、更に好ましくは炭素数1~8のアルキル基である。具体的にはメチル、エチル、プロピル、ブチル、ヘキシル、オクチル等を挙げることができる。
 R0及びR0’のアラルキル基としては、一般的には炭素数7~25のアラルキル基であり、好ましくは炭素数7~20のアラルキル基、更に好ましくは炭素数7~15のアラルキル基である。具体的にはベンジル、トルイルメチル、メシチルメチル、フェネチル等を挙げることができる。
 R0の環状アルキル基としては、一般的には炭素数3~20の環状アルキル基であり、好ましくは炭素数4~20の環状アルキル基、更に好ましくは炭素数5~15の環状アルキル基である。具体的にはシクロペンチル、シクロヘキシル、ノルボルニル、樟脳基等を挙げることができる。
The alkyl group for R 0 and R 0 ′ is generally an alkyl group having 1 to 20 carbon atoms, preferably an alkyl group having 1 to 15 carbon atoms, more preferably an alkyl group having 1 to 8 carbon atoms. is there. Specific examples include methyl, ethyl, propyl, butyl, hexyl, octyl and the like.
The aralkyl group for R 0 and R 0 ′ is generally an aralkyl group having 7 to 25 carbon atoms, preferably an aralkyl group having 7 to 20 carbon atoms, more preferably an aralkyl group having 7 to 15 carbon atoms. is there. Specific examples include benzyl, toluylmethyl, mesitylmethyl, phenethyl and the like.
The cyclic alkyl group for R 0 is generally a cyclic alkyl group having 3 to 20 carbon atoms, preferably a cyclic alkyl group having 4 to 20 carbon atoms, more preferably a cyclic alkyl group having 5 to 15 carbon atoms. is there. Specific examples include cyclopentyl, cyclohexyl, norbornyl, camphor group and the like.
 Aとしての連結基は、更に置換基を有していてもよく、置換基としては、アルキル基(炭素数1~10のアルキル基であり、具体的にはメチル、エチル、プロピル、ブチル、ヘキシル、オクチル等)、アラルキル基(炭素数7~15のアラルキル基であり、具体的にはベンジル、トルイルメチル、メシチルメチル、フェネチル等)、アリール基(炭素数6~10のアリール基であり、具体的にはフェニル、トルイル、キシリル、メシチル、ナフチル等)、アルコキシ基(アルコキシ基は、直鎖、分岐、環状のいずれであってもよい、炭素数1~10のアルコキシ基であり、具体的には、メトキシ、エトキシ、直鎖又は分岐プロポキシ、直鎖又は分岐ブトキシ、直鎖又は分岐ペントキシ、シクロペンチルオキシ、シクロヘキシルオキシ等)、アリールオキシ基(炭素数6~10のアリールオキシ基であり、具体的にはフェノキシ、トルイルオキシ、1-ナフトキシ等)、アルキルチオ基(直鎖、分岐、環状のいずれであってもよい、炭素数1~10のアルキルチオ基であり、具体的には、メチルチオ、エチルチオ、直鎖又は分岐プロピルチオ、シクロペンチルチオ、シクロヘキシルチオ)、アリールチオ基(炭素数6~10のアリールチオ基であり、具体的にはフェニルチオ、トルイルチオ、1-ナフチルチオ等)、アシルオキシ基(炭素数2~10のアシルオキシ基で、具体的には、アセトキシ、プロパノイルオキシ、ベンゾイルオキシ等)、アルコキシカルボニル基(炭素数1~10のアルコキシカルボニル基であり、具体的にはメトキシカルボニル、エトキシカルボニル、直鎖又は分岐プロポキシカルボニル、シクロペンチルオキシカルボニル、シクロヘキシルオキシカルボニル等)、を挙げることができる。 The linking group as A may further have a substituent. The substituent is an alkyl group (an alkyl group having 1 to 10 carbon atoms, specifically, methyl, ethyl, propyl, butyl, hexyl). Octyl, etc.), aralkyl groups (aralkyl groups having 7 to 15 carbon atoms, specifically benzyl, toluylmethyl, mesitylmethyl, phenethyl, etc.), aryl groups (aryl groups having 6 to 10 carbon atoms, specifically Are phenyl, toluyl, xylyl, mesityl, naphthyl, etc.), an alkoxy group (the alkoxy group may be linear, branched or cyclic, and has 1 to 10 carbon atoms, specifically, Methoxy, ethoxy, linear or branched propoxy, linear or branched butoxy, linear or branched pentoxy, cyclopentyloxy, cyclohexyloxy, etc.) A reeloxy group (an aryloxy group having 6 to 10 carbon atoms, specifically phenoxy, toluyloxy, 1-naphthoxy, etc.), an alkylthio group (which may be linear, branched or cyclic, the number of carbon atoms 1 to 10 alkylthio groups, specifically methylthio, ethylthio, linear or branched propylthio, cyclopentylthio, cyclohexylthio), arylthio groups (arylthio groups having 6 to 10 carbon atoms, specifically phenylthio , Toluylthio, 1-naphthylthio, etc.), acyloxy groups (acyloxy groups having 2 to 10 carbon atoms, specifically acetoxy, propanoyloxy, benzoyloxy, etc.), alkoxycarbonyl groups (alkoxycarbonyl having 1 to 10 carbon atoms) Groups such as methoxycarbonyl, ethoxycarbonyl, Or branched propoxycarbonyl, cyclopentyloxycarbonyl, cyclohexyloxycarbonyl, etc.), can be exemplified.
 一般式(2)において、R0はアルキル基及びアリール基が好ましい。R0’は水素原子及び炭素数1~6のアルキル基が好ましく、水素原子、メチル基及びエチル基が好ましく、水素原子が最も好ましい。 In the general formula (2), R 0 is preferably an alkyl group or an aryl group. R 0 ′ is preferably a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, more preferably a hydrogen atom, a methyl group or an ethyl group, and most preferably a hydrogen atom.
 本発明におけるスルホン酸エステルとしては、下記の様な具体的化合物を例としてあげることができるが、これに限るものではない。 Examples of the sulfonic acid ester in the present invention include the following specific compounds, but are not limited thereto.
Figure JPOXMLDOC01-appb-C000107
Figure JPOXMLDOC01-appb-C000107
Figure JPOXMLDOC01-appb-C000108
Figure JPOXMLDOC01-appb-C000108
 本発明におけるスルホン酸エステルは、市販のものを用いてもよいし、公知の方法で合成したものを用いてもよい。本発明のスルホン酸エステルは、例えば、塩基性条件下、スルホニルクロリド乃至はスルホン酸無水物を対応する多価アルコールと反応させることにより合成することができる。 As the sulfonic acid ester in the present invention, a commercially available one may be used, or one synthesized by a known method may be used. The sulfonic acid ester of the present invention can be synthesized, for example, by reacting sulfonyl chloride or sulfonic acid anhydride with a corresponding polyhydric alcohol under basic conditions.
 本発明の感光性樹脂組成物において、熱酸発生剤の含有量は、感光性樹脂組成物の全固形分を基準として、1~20質量%が好ましく、3~10質量%がより好ましい。 In the photosensitive resin composition of the present invention, the content of the thermal acid generator is preferably 1 to 20% by mass, more preferably 3 to 10% by mass based on the total solid content of the photosensitive resin composition.
(e)アルコキシメチル基及びアシルオキシメチル基の少なくとも1つを含有する化合物
 本発明の組成物にはアルコキシメチル基及びアシルオキシメチル基の少なくとも1つを含有する化合物を含んでいてもよい。低温キュアプロセスにおいても、硬化時のパターンの融解や熱収縮をも防止できる。
(E) Compound containing at least one of alkoxymethyl group and acyloxymethyl group The composition of the present invention may contain a compound containing at least one of alkoxymethyl group and acyloxymethyl group. Even in the low-temperature curing process, it is possible to prevent melting and thermal shrinkage of the pattern during curing.
 本発明におけるアルコキシメチル基及びアシルオキシメチル基の少なくとも1つを含有する化合物としては、アルコキシメチル基又はアシルオキシメチル基が、直接芳香族基や下記ウレア構造の窒素原子上に、トリアジン上に置換した化合物を代表的構造として挙げることができる。
 当該化合物が有するアルコキシメチル基又はアシルオキシメチル基は、炭素数2~5が好ましく、炭素数2又は3が好ましく、特に炭素数2が好ましい。
 当該化合物が有するアルコキシメチル基及びアシルオキシメチル基の総数は1~10が好ましく、より好ましくは2~8、特に好ましくは3~6である。
 当該化合物の分子量は好ましくは1500以下であり、180~1200が好ましい。
As the compound containing at least one of an alkoxymethyl group and an acyloxymethyl group in the present invention, a compound in which an alkoxymethyl group or an acyloxymethyl group is substituted directly on an aromatic group or a nitrogen atom of the following urea structure on a triazine Can be cited as a representative structure.
The alkoxymethyl group or acyloxymethyl group of the compound preferably has 2 to 5 carbon atoms, preferably 2 or 3 carbon atoms, and particularly preferably 2 carbon atoms.
The total number of alkoxymethyl groups and acyloxymethyl groups possessed by the compound is preferably 1 to 10, more preferably 2 to 8, and particularly preferably 3 to 6.
The molecular weight of the compound is preferably 1500 or less, and preferably 180 to 1200.
Figure JPOXMLDOC01-appb-C000109
Figure JPOXMLDOC01-appb-C000109
 R100は、アルキル基又はアシル基を表す。
 R101及びR102は、独立に、一価の有機基を表し、互いに結合して環を形成してもよい。
R 100 represents an alkyl group or an acyl group.
R 101 and R 102 independently represent a monovalent organic group, and may be bonded to each other to form a ring.
 アルコキシメチル基又はアシルオキシメチル基が直接芳香族基に置換した化合物としては、例えば下記一般式の様な化合物を挙げることができる。 Examples of the compound in which an alkoxymethyl group or an acyloxymethyl group is directly substituted with an aromatic group include compounds having the following general formula.
Figure JPOXMLDOC01-appb-C000110
Figure JPOXMLDOC01-appb-C000110
 式中、Xは単結合又は2価の有機基を示し、個々のR104は独立にアルキル基又はアシル基を示し、R103は、水素原子、アルキル基、アルケニル基、アリール基、アラルキル基、又は、酸の作用により分解し、アルカリ可溶性基を生じる基(例えば、酸の作用により脱離する基、-C(RCOORで表される基(Rは水素原子又は炭素数1~4のアルキル基を表し、Rは酸の作用により脱離する基を表す。))を示す。
 R105は各々独立にアルキル基又はアルケニル基を示し、a、b及びcは各々独立に1~3であり、dは0~4であり、eは独立に0~3である。
 酸の作用により分解しアルカリ可溶性基を生じる基とは、酸の作用により分解し、水酸基、カルボキシル基のようなアルカリ可溶性基を生じる基(以下、酸分解性基ともいう。)をいう。
 酸分解性基として好ましい基は、これらのアルカリ可溶性基の水素原子を酸で脱離する基で置換した基である。
 酸で脱離する基としては、例えば、-C(R36)(R37)(R38)、-C(R36)(R37)(OR39)、-C(R01)(R02)(OR39)等を挙げることができる。
 式中、R36~R39は、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基又はアルケニル基を表す。R36とR37とは、互いに結合して環を形成してもよい。
 R01及びR02は、各々独立に、水素原子、アルキル基、シクロアルキル基、アリール基、アラルキル基又はアルケニル基を表す。
In the formula, X represents a single bond or a divalent organic group, each R 104 independently represents an alkyl group or an acyl group, and R 103 represents a hydrogen atom, an alkyl group, an alkenyl group, an aryl group, an aralkyl group, Or a group that decomposes by the action of an acid to generate an alkali-soluble group (for example, a group that is eliminated by the action of an acid, a group represented by —C (R 4 ) 2 COOR 5 (R 4 is a hydrogen atom or a carbon number) Represents an alkyl group of 1 to 4, and R 5 represents a group capable of leaving by the action of an acid))).
R 105 each independently represents an alkyl group or an alkenyl group, a, b and c are each independently 1 to 3, d is 0 to 4, and e is independently 0 to 3.
The group that decomposes by the action of an acid to generate an alkali-soluble group refers to a group that decomposes by the action of an acid to generate an alkali-soluble group such as a hydroxyl group or a carboxyl group (hereinafter also referred to as an acid-decomposable group).
A preferable group as the acid-decomposable group is a group obtained by substituting the hydrogen atom of these alkali-soluble groups with a group capable of leaving with an acid.
Examples of the group capable of leaving with an acid include —C (R 36 ) (R 37 ) (R 38 ), —C (R 36 ) (R 37 ) (OR 39 ), —C (R 01 ) (R 02 ). ) (OR 39 ) and the like.
In the formula, R 36 to R 39 each independently represents an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group. R 36 and R 37 may be bonded to each other to form a ring.
R 01 and R 02 each independently represents a hydrogen atom, an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group or an alkenyl group.
 アルコキシメチル基を有する化合物としては具体的に以下の構造を挙げることができる。アシルオキシメチル基を有する化合物は下記化合物のアルコキシメチル基をアシルオキシメチル基に変更した化合物を挙げることができる。アルコキシメチル基又はアシルオキシメチルを分子内に有する化合物としては以下の様な化合物を挙げることができるが、これらに限定されるものではない。 Specific examples of the compound having an alkoxymethyl group include the following structures. Examples of the compound having an acyloxymethyl group include compounds in which the alkoxymethyl group of the following compound is changed to an acyloxymethyl group. Examples of the compound having an alkoxymethyl group or acyloxymethyl in the molecule include, but are not limited to, the following compounds.
Figure JPOXMLDOC01-appb-C000111
Figure JPOXMLDOC01-appb-C000111
Figure JPOXMLDOC01-appb-C000112
Figure JPOXMLDOC01-appb-C000112
 アルコキシメチル基及びアシルオキシメチル基の少なくとも1つを含有する化合物は、市販のものを用いても、公知の方法により合成したものを用いても良い。
 耐熱性の観点で、アルコキシメチル基又はアシルオキシメチル基が、直接芳香環やトリアジン環上に置換した化合物が好ましい。
 これら化合物の添加量は本発明の樹脂の総量100質量部に対して、1~20質量部が好ましく、3~15質量部がより好ましい。
As the compound containing at least one of an alkoxymethyl group and an acyloxymethyl group, a commercially available product or a compound synthesized by a known method may be used.
From the viewpoint of heat resistance, a compound in which an alkoxymethyl group or an acyloxymethyl group is directly substituted on an aromatic ring or a triazine ring is preferable.
The addition amount of these compounds is preferably 1 to 20 parts by mass, and more preferably 3 to 15 parts by mass with respect to 100 parts by mass of the total amount of the resin of the present invention.
(e’)メタクリロイル基又はアクリロイル基を含む化合物
 本発明の組成物は、メタクリロイル基又はアクリロイル基を含む化合物を含有してもよい。
 メタクリロイル基又はアクリロイル基を含む化合物とは、アクリル酸エステル、メタクリル酸エステルからなる群から選択される化合物である。これら化合物は、アルカリ現像液には不溶であるため、組成物のアルカリ溶解性を抑制する働きがあり、未露光部の膜減りを抑制するために良好な画像形成に役立つ。また、具体的な反応機構は把握していないが、キュア反応の段階で、アクリル基やメタクリル基が組成物中化合物と反応することにより組成物を構成する成分の分子量が部分的に増加することで膜物性が向上する。そのため、アクリロイル基、メタクリロイル基を1分子中に2個以上、更に好ましくは4官能以上ある化合物とすることで、この化合物が架橋化合物的な機能が発揮できるために好ましい。
 また、アクリロリル基、メタクリロイル基を含む骨格が芳香環や脂環などの環構造、特に脂環構造を含む物であるものが露光光の透過率及びキュア膜の剛直性のためにより好ましい。
 更に、骨格中のエチレンオキサイド(EO)鎖、プロピレンオキサイド(PO)鎖の長さ(n)は長いと膜の剛直性が失われるためにn=1~5であることが好ましい。
(E ′) Compound containing methacryloyl group or acryloyl group The composition of the present invention may contain a compound containing methacryloyl group or acryloyl group.
The compound containing a methacryloyl group or an acryloyl group is a compound selected from the group consisting of acrylic acid esters and methacrylic acid esters. Since these compounds are insoluble in an alkaline developer, they have a function of suppressing the alkali solubility of the composition, and are useful for good image formation in order to suppress film loss in unexposed areas. In addition, although the specific reaction mechanism is not grasped, the molecular weight of components constituting the composition partially increases due to the reaction of the acrylic group or methacrylic group with the compound in the composition at the stage of the cure reaction. As a result, film properties are improved. Therefore, it is preferable to use a compound having two or more acryloyl groups and methacryloyl groups in one molecule, more preferably four or more functional groups, because this compound can exhibit a function as a crosslinking compound.
Further, it is more preferable that the skeleton containing an acrylolyl group or a methacryloyl group is a ring structure such as an aromatic ring or an alicyclic ring, particularly a substance containing an alicyclic structure, because of the exposure light transmittance and the rigidity of the cured film.
Furthermore, if the length (n) of the ethylene oxide (EO) chain and propylene oxide (PO) chain in the skeleton is long, the rigidity of the film is lost, so that n = 1 to 5 is preferable.
 好ましい具体例としては、新中村化学工業社製 NKエステルシリーズで一官能のAMP-10G、AMP-20GY、AM30G、AM90G、AM230G、ACB-3、A-BH、A-IB、A-SA、A-OC-18E、720A、S-1800A,ISA、AM-130G、LA、M-20G、M-90G、M230G、PHE-1G、SA、CB-1、CB-3、CB-23、TOPOLENE-M、S-1800M、IB、OC-18E、S、二官能のA-200、A-400、A-600、A-1000、ABE-300、A-BPE-4、A-BPE-10、A-BPE-20、A-BPE-30、A-BPP-3、A-DOD、A-DCP、A-IBD-2E、A-NPG、701A、A-B1206PE、A-HD-N、A-NOD-N、APG-100、APG-200、APG-400、APG-700、1G、2G、3G、4G、9G、14G、23G、BG、BD、HD-N、NOD、IND、BPE-100、BPE-200、BPE-300、BPE-500、BPE-900、BPE-1300N、NPG、DCP、1206PE、701、3PG、9PG、3官能のA-9300、AT-30E、A-TMPT-3EO、A-TMPT-9EO、A-TMPT-3PO、A-TMM-3、A-TMM-3L、A-TMM-3LM-N、TMPT、TMPT-9EO、4官能以上のATM-35E、ATM-4E、AD-TMP、AD-TMP-L、ATM-4P、A-TMMT、A-DPHをあげることができる。
 特に好ましい例としては以下のような多官能のモノマーを挙げることができる。
Preferable specific examples include NK-10 series made by Shin-Nakamura Chemical Co., Ltd., monofunctional AMP-10G, AMP-20GY, AM30G, AM90G, AM230G, ACB-3, A-BH, A-IB, A-SA, A -OC-18E, 720A, S-1800A, ISA, AM-130G, LA, M-20G, M-90G, M230G, PHE-1G, SA, CB-1, CB-3, CB-23, TOPOLENE-M , S-1800M, IB, OC-18E, S, bifunctional A-200, A-400, A-600, A-1000, ABE-300, A-BPE-4, A-BPE-10, A- BPE-20, A-BPE-30, A-BPP-3, A-DOD, A-DCP, A-IBD-2E, A-NPG, 701A, A-B1206PE, A-HD-N A-NOD-N, APG-100, APG-200, APG-400, APG-700, 1G, 2G, 3G, 4G, 9G, 14G, 23G, BG, BD, HD-N, NOD, IND, BPE -100, BPE-200, BPE-300, BPE-500, BPE-900, BPE-1300N, NPG, DCP, 1206PE, 701, 3PG, 9PG, trifunctional A-9300, AT-30E, A-TMPT- 3EO, A-TMPT-9EO, A-TMPT-3PO, A-TMM-3, A-TMM-3L, A-TMM-3LM-N, TMPT, TMPT-9EO, 4 or more functional ATM-35E, ATM- Examples thereof include 4E, AD-TMP, AD-TMP-L, ATM-4P, A-TMMT, and A-DPH.
Particularly preferred examples include the following polyfunctional monomers.
Figure JPOXMLDOC01-appb-C000113
Figure JPOXMLDOC01-appb-C000113
Figure JPOXMLDOC01-appb-C000114
Figure JPOXMLDOC01-appb-C000114
 本発明の分子内にメタクリロイル基又はアクリロイル基を含む化合物の添加量は、一般式(1)で表される繰り返し単位を有する樹脂100質量部に対して、0.5質量部以上30質量部以下が好ましい。更に好ましくは、1質量部以上20質量部以下、特に好ましくは2質量部以上15質量部以下である。添加量をある0.5質量部以上とすることにより、より本発明の効果が得られ、添加量を適切に抑制することによりキュア膜の耐熱性低下を防止できる。 The addition amount of the compound containing a methacryloyl group or an acryloyl group in the molecule of the present invention is 0.5 parts by mass or more and 30 parts by mass or less with respect to 100 parts by mass of the resin having a repeating unit represented by the general formula (1). Is preferred. More preferably, they are 1 mass part or more and 20 mass parts or less, Most preferably, they are 2 mass parts or more and 15 mass parts or less. By making the addition amount 0.5 parts by mass or more, the effect of the present invention can be further obtained, and by suppressing the addition amount appropriately, it is possible to prevent a decrease in heat resistance of the cured film.
(f)密着促進剤
 本発明におけるポジ型感光性樹脂組成物には、必要により密着性付与のための有機ケイ素化合物、シランカップリング剤、レベリング剤等の密着促進剤を添加してもよい。これらの例としては、例えば、γ-アミノプロピルトリメトキシシラン、γ-アミノプロピルトリエトキシシラン、ビニルトリエトキシシラン、3-メタクリロキシプロピルトリメトキシシラン、3-アクリロキシプロピルトリメトキシシラン、p-スチリルトリメトキシシラン、3-メタクリロキシプロピルメチルジメトキシシラン、3-メタクリロキシプロピルメチルジエトキシシラン、γ-グリシドキシプロピルトリエトキシシラン、γ-メタクリロキシプロピルトリメトキシシラン、尿素プロピルトリエトキシシラン、トリス(アセチルアセトネート)アルミニウム、アセチルアセテートアルミニウムジイソプロピレートなどが挙げられる。密着促進剤を用いる場合は、本発明の樹脂100質量部に対して、0.1~20質量部が好ましく、0.5~10質量部がより好ましい。
(F) Adhesion promoter In the positive photosensitive resin composition in the present invention, an adhesion promoter such as an organosilicon compound, a silane coupling agent, and a leveling agent for imparting adhesion may be added as necessary. Examples of these are, for example, γ-aminopropyltrimethoxysilane, γ-aminopropyltriethoxysilane, vinyltriethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-acryloxypropyltrimethoxysilane, p-styryl. Trimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane, γ-glycidoxypropyltriethoxysilane, γ-methacryloxypropyltrimethoxysilane, ureapropyltriethoxysilane, tris ( Acetylacetonate) aluminum, acetylacetate aluminum diisopropylate and the like. When an adhesion promoter is used, it is preferably 0.1 to 20 parts by mass, more preferably 0.5 to 10 parts by mass with respect to 100 parts by mass of the resin of the present invention.
(g)溶剤
 溶剤は本発明の組成物を溶解できるものであれば特に限定されないが、塗布時に溶剤が必要以上に蒸発して塗布時に組成物の固形分が析出しないようにするため、100℃以上の沸点の溶剤が好ましい。
 例えば、アルキレングリコールモノアルキルエーテルカルボキシレート、アルキレングリコールモノアルキルエーテル、乳酸アルキルエステル、アルコキシプロピオン酸アルキル、環状ラクトン(好ましくは炭素数4~10)、環を含有しても良いモノケトン化合物(好ましくは炭素数4~10)、アルキレンカーボネート、アルコキシ酢酸アルキル、ピルビン酸アルキル、アミド系溶媒等の有機溶剤を挙げることができる。
(G) Solvent The solvent is not particularly limited as long as it can dissolve the composition of the present invention. However, in order to prevent the solvent from evaporating more than necessary at the time of coating and precipitating the solid content of the composition at the time of coating, Solvents with the above boiling points are preferred.
For example, alkylene glycol monoalkyl ether carboxylate, alkylene glycol monoalkyl ether, alkyl lactate ester, alkyl alkoxypropionate, cyclic lactone (preferably having 4 to 10 carbon atoms), monoketone compound (preferably carbon And organic solvents such as alkylene carbonate, alkyl alkoxyacetate, alkyl pyruvate, and amide solvents.
 アルキレングリコールモノアルキルエーテルカルボキシレートとしては、例えば、プロピレングリコールモノメチルエーテルアセテート、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノプロピルエーテルアセテート、プロピレングリコールモノブチルエーテルアセテート、プロピレングリコールモノメチルエーテルプロピオネート、プロピレングリコールモノエチルエーテルプロピオネート、エチレングリコールモノメチルエーテルアセテート、エチレングリコールモノエチルエーテルアセテートが好ましく挙げられる。
 アルキレングリコールモノアルキルエーテルとしては、例えば、プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル、エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテルを好ましく挙げられる。
Examples of the alkylene glycol monoalkyl ether carboxylate include propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate, propylene glycol monomethyl ether propionate, propylene glycol monoethyl Preferred examples include ether propionate, ethylene glycol monomethyl ether acetate, and ethylene glycol monoethyl ether acetate.
Preferred examples of the alkylene glycol monoalkyl ether include propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether.
 乳酸アルキルエステルとしては、例えば、乳酸メチル、乳酸エチル、乳酸プロピル、乳酸ブチルを好ましく挙げられる。
 アルコキシプロピオン酸アルキルとしては、例えば、3-エトキシプロピオン酸エチル、3-メトキシプロピオン酸メチル、3-エトキシプロピオン酸メチル、3-メトキシプロピオン酸エチルを好ましく挙げられる。
Preferred examples of the alkyl lactate include methyl lactate, ethyl lactate, propyl lactate and butyl lactate.
Preferred examples of the alkyl alkoxypropionate include ethyl 3-ethoxypropionate, methyl 3-methoxypropionate, methyl 3-ethoxypropionate, and ethyl 3-methoxypropionate.
 環状ラクトンとしては、例えば、β-プロピオラクトン、β-ブチロラクトン、γ-ブチロラクトン、α-メチル-γ-ブチロラクトン、β-メチル-γ-ブチロラクトン、γ-バレロラクトン、γ-カプロラクトン、γ-オクタノイックラクトン、α-ヒドロキシ-γ-ブチロラクトンが好ましく挙げられる。 Examples of the cyclic lactone include β-propiolactone, β-butyrolactone, γ-butyrolactone, α-methyl-γ-butyrolactone, β-methyl-γ-butyrolactone, γ-valerolactone, γ-caprolactone, and γ-octano. Preferred are iclactone and α-hydroxy-γ-butyrolactone.
 環を含有しても良いモノケトン化合物としては、例えば、2-ブタノン、3-メチルブタノン、ピナコロン、2-ペンタノン、3-ペンタノン、3-メチル-2-ペンタノン、4-メチル-2-ペンタノン、2-メチル-3-ペンタノン、4,4-ジメチル-2-ペンタノン、2,4-ジメチル-3-ペンタノン、2,2,4,4-テトラメチル-3-ペンタノン、2-ヘキサノン、3-ヘキサノン、5-メチル-3-ヘキサノン、2-ヘプタノン、3-ヘプタノン、4-ヘプタノン、2-メチル-3-ヘプタノン、5-メチル-3-ヘプタノン、2,6-ジメチル-4-ヘプタノン、2-オクタノン、3-オクタノン、2-ノナノン、3-ノナノン、5-ノナノン、2-デカノン、3-デカノン、4-デカノン、5-ヘキセン-2-オン、3-ペンテン-2-オン、シクロペンタノン、2-メチルシクロペンタノン、3-メチルシクロペンタノン、2,2-ジメチルシクロペンタノン、2,4,4-トリメチルシクロペンタノン、シクロヘキサノン、3-メチルシクロヘキサノン、4-メチルシクロヘキサノン、4-エチルシクロヘキサノン、2,2-ジメチルシクロヘキサノン、2,6-ジメチルシクロヘキサノン、2,2,6-トリメチルシクロヘキサノン、シクロヘプタノン、2-メチルシクロヘプタノン、3-メチルシクロヘプタノンが好ましく挙げられる。 Examples of the monoketone compound which may contain a ring include 2-butanone, 3-methylbutanone, pinacolone, 2-pentanone, 3-pentanone, 3-methyl-2-pentanone, 4-methyl-2-pentanone, 2 -Methyl-3-pentanone, 4,4-dimethyl-2-pentanone, 2,4-dimethyl-3-pentanone, 2,2,4,4-tetramethyl-3-pentanone, 2-hexanone, 3-hexanone, 5-methyl-3-hexanone, 2-heptanone, 3-heptanone, 4-heptanone, 2-methyl-3-heptanone, 5-methyl-3-heptanone, 2,6-dimethyl-4-heptanone, 2-octanone, 3-octanone, 2-nonanone, 3-nonanone, 5-nonanone, 2-decanone, 3-decanone, 4-decanone, 5-hexen-2-one 3-penten-2-one, cyclopentanone, 2-methylcyclopentanone, 3-methylcyclopentanone, 2,2-dimethylcyclopentanone, 2,4,4-trimethylcyclopentanone, cyclohexanone, 3- Methylcyclohexanone, 4-methylcyclohexanone, 4-ethylcyclohexanone, 2,2-dimethylcyclohexanone, 2,6-dimethylcyclohexanone, 2,2,6-trimethylcyclohexanone, cycloheptanone, 2-methylcycloheptanone, 3-methyl Preferred is cycloheptanone.
 アルキレンカーボネートとしては、例えば、プロピレンカーボネート、ビニレンカーボネート、エチレンカーボネート、ブチレンカーボネートが好ましく挙げられる。
 アルコキシ酢酸アルキルとしては、例えば、酢酸-2-メトキシエチル、酢酸-2-エトキシエチル、酢酸-2-(2-エトキシエトキシ)エチル、酢酸-3-メトキシ-3-メチルブチル、酢酸-1-メトキシ-2-プロピルが好ましく挙げられる。
 ピルビン酸アルキルとしては、例えば、ピルビン酸メチル、ピルビン酸エチル、ピルビン酸プロピルが好ましく挙げられる。
 アミド系溶媒としては、N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド、N-メチル-2-ピロリジノン、1,3-ジメチル-2-イミダゾリジノンが好ましく挙げられる。
 その他、ジメチルスルホキシド、スルホランが好ましく挙げられる。
 上記の中で、更に好適な溶剤として、N-メチルピロリドン(NMP)、γ-ブチロラクトン(GBL)、N,N-ジメチルアセトアミド(DMAc)、1,3-ジメチル-2-イミダゾリジノン(DMI)、N,N-ジメチルホルムアミド(DMF)、シクロペンタノン、シクロヘキサノン、シクロヘプタノンなどが挙げられる。更に好ましくは、γ-ブチロラクトン及びN-メチルピロリドン、シクロペンタノン、シクロヘキサノンである。
 これら溶媒は、単独で用いても2種以上を混合して用いてもよい。
 本発明の感光性樹脂組成物中の全固形分濃度は、一般的には10~40質量%、より好ましくは10~30質量%、更に好ましくは15~30質量%である。
Preferred examples of the alkylene carbonate include propylene carbonate, vinylene carbonate, ethylene carbonate, and butylene carbonate.
Examples of the alkyl alkoxyacetate include 2-methoxyethyl acetate, 2-ethoxyethyl acetate, 2- (2-ethoxyethoxy) ethyl acetate, 3-methoxy-3-methylbutyl acetate, and 1-methoxy-acetate. 2-propyl is preferred.
Preferred examples of the alkyl pyruvate include methyl pyruvate, ethyl pyruvate, and propyl pyruvate.
Preferred examples of the amide solvent include N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidinone and 1,3-dimethyl-2-imidazolidinone.
In addition, dimethyl sulfoxide and sulfolane are preferable.
Among the above, N-methylpyrrolidone (NMP), γ-butyrolactone (GBL), N, N-dimethylacetamide (DMAc), 1,3-dimethyl-2-imidazolidinone (DMI) are more preferable solvents. , N, N-dimethylformamide (DMF), cyclopentanone, cyclohexanone, cycloheptanone and the like. More preferred are γ-butyrolactone, N-methylpyrrolidone, cyclopentanone, and cyclohexanone.
These solvents may be used alone or in combination of two or more.
The total solid concentration in the photosensitive resin composition of the present invention is generally 10 to 40% by mass, more preferably 10 to 30% by mass, and still more preferably 15 to 30% by mass.
<感光性樹脂組成物の調製方法>
 本発明の感光性樹脂組成物は、ベースポリマー、光酸発生剤、及び必要に応じて、光増感剤、有機溶剤、塩基性化合物、界面活性剤、溶解調整剤、紫外線吸収剤、保存安定剤、消泡剤等の添加剤を混合することにより溶液として調製することができる。混合の順番、方法等は、特に限定されるものではない。
 また、本発明の感光性樹脂組成物は、ドライフィルムであってもよい。ドライフィルムは、例えば、上記の溶液を金属やポリエチレンテレフタレート等の支持体の上に塗布し、乾燥後、支持体より剥がして作成することができる。また、支持体がポリエチレンテレフタレート等のフィルムである場合には、そのままの状態で、本発明の感光性樹脂組成物として用いることもできる。
 本発明の感光性樹脂組成物を支持体の上に塗布する方法としては、例えば、スピンコート、ロールコート、フローコート、ディップコート、スプレーコート、ドクターコート等の公知の方法が挙げられる。
 塗布された膜の厚さは、用途に応じて設定することができるが、好ましくは0.05~200μm、より好ましくは0.1~100μmである。
 支持体として用いられるフィルムとしては、例えば、ポリエチレンテレフタレート、ポリプロピレン、ポリエチレン、ポリエステル、ポリビニルアルコール等が挙げられる。
 本発明の感光性樹脂組成物がドライフィルムである場合、必要に応じて、該感光性樹脂組成物を傷やほこり、薬品等から保護する目的で、該感光性樹脂組成物を保護フィルムで被覆してもよい。保護フィルムとしては、例えば、ポリエチレンフィルム、ポリプロピレンフィルム等が挙げられ、本発明の感光性樹脂組成物との接着力が、支持体より小さいものが好ましい。
 また、保護フィルムと本発明の感光性樹脂組成物の間に剥離層を設けていてもよい。
 ドライフィルムは、巻き取ってロール状にしてもよい。
<Method for preparing photosensitive resin composition>
The photosensitive resin composition of the present invention, the base polymer, a photoacid generator, and if necessary, photosensitizers, organic solvent, basic compound, surfactant, dissolution modifiers, ultraviolet absorbers, storage stability It can be prepared as a solution by mixing additives such as an agent and an antifoaming agent. The order and method of mixing are not particularly limited.
Further, the photosensitive resin composition of the present invention may be a dry film. The dry film can be prepared, for example, by applying the above solution onto a support such as metal or polyethylene terephthalate, drying, and then peeling off the support. When the support is a film of polyethylene terephthalate or the like, it can be used as it is as the photosensitive resin composition of the present invention.
As a method for applying the photosensitive resin composition of the present invention on a support, for example, spin coating, roll coating, flow coating, dip coating, spray coating, and a known method such as doctor coating.
The thickness of the applied film can be set according to the use, but is preferably 0.05 to 200 μm, more preferably 0.1 to 100 μm.
Examples of the film used as the support include polyethylene terephthalate, polypropylene, polyethylene, polyester, and polyvinyl alcohol.
When the photosensitive resin composition of the present invention is a dry film, if necessary, the photosensitive resin composition is coated with a protective film for the purpose of protecting the photosensitive resin composition from scratches, dust, chemicals, and the like. May be. As a protective film, a polyethylene film, a polypropylene film, etc. are mentioned, for example, and the adhesive force with the photosensitive resin composition of this invention is smaller than a support body.
Moreover, you may provide the peeling layer between the protective film and the photosensitive resin composition of this invention.
The dry film may be wound up into a roll.
<パターン形成材料、感光性膜、及び硬化膜>
 本発明の感光性樹脂組成物を基板上に塗布することにより感光性膜を形成する工程、該基板を加熱する工程、該基板上の感光性膜に活性光線又は放射線を露光する工程、露光後に該基板を加熱する工程、次いで、アルカリ性現像液を用いて、該基板を現像する工程により、本発明の感光性樹脂組成物を用いてポジ型のパターンを形成することができる。
 したがって、本発明の感光性樹脂組成物はパターン形成材料である。
 基板としては、特に限定されないが、例えば、アルミニウム、亜鉛、金、銀、ニッケル等の金属板、銅箔ラミネート板、ガラス板、シリコンウェハー等が挙げられる。
 本発明の感光性樹脂組成物を基板上に塗布する方法としては、本発明の感光性樹脂組成物が溶液の場合、例えば、スピンコート、ロールコート、フローコート、ディップコート、スプレーコート、ドクターコート等の公知の方法が挙げられる。塗布された感光性膜の厚さは、用途に応じて設定することができるが、好ましくは0.05~200μm、より好ましくは0.1~100μmである。
 本発明の感光性樹脂組成物がドライフィルムで、保護フィルムがある場合には、保護フィルムを剥離した後、該感光性樹脂組成物層が基板に直接触れるように塗布する、例えば、ラミネートする方法等が挙げられる。ラミネート時、温度を80~160℃とすることにより、次工程の加熱処理を省略することができる。
 本発明の感光性樹脂組成物を基板に塗布後、基板を加熱してもよい。本発明の感光性樹脂組成物が溶液の場合、加熱の方法としては、例えば、ホットプレート、オーブン等による加熱等の公知の方法が挙げられる。加熱することにより、有機溶剤を蒸発させることができる。加熱温度は、80~160℃であることが好ましい。
 本発明の感光性樹脂組成物がドライフィルムの場合、ラミネート時に加熱を行えば、本工程を省略することができる。
 加熱後、フォトマスク、縮小投影露光機、直接描画機等を用いて感光性膜に活性光線又は放射線を照射することができる。
 活性光線又は放射線としては、例えば、遠赤外線、可視光線、g線、h線、i線等の近紫外線、KrFエキシマーレーザー、ArFエキシマレーザー、DUV(遠紫外線)、EUV(極紫外線)、電子線、X線等が挙げられる。放射線等が照射された部分では、光酸発生剤が分解して酸が発生する。
<Pattern forming material, photosensitive film, and cured film>
A step of forming a photosensitive film by coating the photosensitive resin composition of the present invention on a substrate, a step of heating the substrate, a step of exposing the photosensitive film on the substrate to actinic rays or radiation, after exposure A positive pattern can be formed using the photosensitive resin composition of the present invention by the step of heating the substrate and then the step of developing the substrate using an alkaline developer.
Therefore, the photosensitive resin composition of the present invention is a pattern forming material.
Although it does not specifically limit as a board | substrate, For example, metal plates, such as aluminum, zinc, gold | metal | money, silver, nickel, a copper foil laminated board, a glass plate, a silicon wafer etc. are mentioned.
As a method for coating the photosensitive resin composition of the present invention on a substrate, when the photosensitive resin composition of the present invention is a solution, for example, spin coating, roll coating, flow coating, dip coating, spray coating, doctor coating Known methods such as The thickness of the applied photosensitive film can be set according to the use, but is preferably 0.05 to 200 μm, more preferably 0.1 to 100 μm.
When the photosensitive resin composition of the present invention is a dry film and there is a protective film, after the protective film is peeled off, the photosensitive resin composition layer is applied so as to directly touch the substrate, for example, a method of laminating Etc. By setting the temperature to 80 to 160 ° C. at the time of lamination, the heat treatment in the next step can be omitted.
After applying the photosensitive resin composition of the present invention to a substrate, the substrate may be heated. When the photosensitive resin composition of the present invention is a solution, examples of the heating method include known methods such as heating with a hot plate or an oven. By heating, it is possible to evaporate the organic solvent. The heating temperature is preferably 80 ~ 160 ° C..
When the photosensitive resin composition of the present invention is a dry film, this step can be omitted if heating is performed during lamination.
After heating, the photosensitive film can be irradiated with actinic rays or radiation using a photomask, a reduction projection exposure machine, a direct drawing machine or the like.
Examples of actinic rays or radiation include far-infrared rays, visible rays, g-rays, h-rays, i-rays and other near ultraviolet rays, KrF excimer lasers, ArF excimer lasers, DUV (far-ultraviolet rays), EUV (extreme ultraviolet rays), and electron beams. And X-rays. In a portion irradiated with radiation or the like, the photoacid generator is decomposed to generate an acid.
 照射後、基板を加熱することが好ましい。加熱の方法としては、塗布後の加熱で用いるものが挙げられる。加熱することにより、一般式(III)で表される基を有する化合物より、一般式(I)で表される化合物由来の構造が脱離し、ヒドロキシル基又はカルボキシル基が再生される。加熱温度は、80~160℃であることが好ましい。
 加熱後、ドライフィルムを用いた場合は支持体を除去し、ドライフィルムを用いない場合はそのまま、アルカリ性現像液を用いて現像することにより、ポジ型のレジストパターンが得られる。現像方法としては、例えば、浸漬法、パドル法、スプレー法等の公知の方法が挙げられる。アルカリ性現像液としては、例えば、水酸化ナトリウム、水酸化カリウム、炭酸ナトリウム、硅酸ナトリウム、メタ硅酸ナトリウム、アンモニア、エチルアミン、n-プロピルアミン、ジエチルアミン、ジn-プロピルアミン、トリエチルアミン、メチルジエチルアミン、ジメチルエタノールアミン、トリエタノールアミン、テトラメチルアンモニウムヒドロキシド、テトラエチルアンモニウムヒドロキシド、コリン、ピロール、ピペリジン、1,8-ジアザビシクロ[5.4.0]-7-ウンデセン、1,5-ジアザビシクロ[4.3.0]-5-ノナン等の塩基性物質を溶解してなるアルカリ性水溶液等が挙げられる。塩基性物質は、単独で又は2種以上混合して用いてもよい。また該現像液には、水溶性有機溶媒、例えばメタノール、エタノール等のアルコール類や界面活性剤を適量添加して使用することもできる。
It is preferable to heat the substrate after irradiation. Examples of the heating method include those used for heating after coating. By heating, the structure derived from the compound represented by the general formula (I) is eliminated from the compound having the group represented by the general formula (III), and the hydroxyl group or the carboxyl group is regenerated. The heating temperature is preferably 80 to 160 ° C.
After heating, when the dry film is used, the support is removed, and when the dry film is not used, the development is performed with an alkaline developer to obtain a positive resist pattern. Examples of the developing method include known methods such as an immersion method, a paddle method, and a spray method. Examples of the alkaline developer include sodium hydroxide, potassium hydroxide, sodium carbonate, sodium oxalate, sodium metasuccinate, ammonia, ethylamine, n-propylamine, diethylamine, di-n-propylamine, triethylamine, methyldiethylamine, Dimethylethanolamine, triethanolamine, tetramethylammonium hydroxide, tetraethylammonium hydroxide, choline, pyrrole, piperidine, 1,8-diazabicyclo [5.4.0] -7-undecene, 1,5-diazabicyclo [4. 3.0] -5-nonane and an alkaline aqueous solution obtained by dissolving a basic substance. You may use a basic substance individually or in mixture of 2 or more types. In addition, a suitable amount of a water-soluble organic solvent, for example, an alcohol such as methanol or ethanol, or a surfactant can be added to the developer.
 現像後、必要に応じて基板を水洗又は加熱乾燥してもよい。
 基板上に形成されたパターンは、例えば、該パターンをマスクとした塩素系ガス、フッ素系ガス(CF/CH混合ガス等)、酸素系ガス等による基板のドライエッチング等の公知の工程に付することができる。
 さらに、本発明は、前記感光性樹脂組成物を加熱処理して得られる硬化膜に関するものでもある。具体的には、一般式(III)で表される基を有する樹脂が、一般式(VIII)で表される繰り返し単位を含むポリイミド前駆体のカルボキシル基の全て又は一部が一般式(IV)で表される基で置換されたポリイミド前駆体、又は、一般式(IX)で表される繰り返し単位を含むポリベンゾオキサゾール前駆体のヒドロキシル基の全て又は一部が一般式(III)で表される基で置換されたポリベンゾオキサゾール前駆体である場合、得られたパターンを加熱処理することで、イミド化又はオキサゾール化し、膜特性に優れるポリイミド膜又はポリベンゾオキサゾール膜を形成することができる。加熱温度は250~400℃が好ましい。
 本発明の感光性樹脂組成物は、得られる感光性膜の加熱工程の際の安定性や長期の貯蔵安定性に優れ、感度及び解像性に優れる。
After development, the substrate may be washed with water or heat-dried as necessary.
The pattern formed on the substrate may be a known pattern such as dry etching of the substrate with a chlorine-based gas, a fluorine-based gas (CF 4 / CH 2 F 2 mixed gas, etc.), an oxygen-based gas or the like using the pattern as a mask. It can be subjected to a process.
Furthermore, this invention relates to the cured film obtained by heat-processing the said photosensitive resin composition. Specifically, a resin having a group represented by formula (III), all or part of the carboxyl groups of the polyimide precursor containing a repeating unit represented by the general formula (VIII) is formula (IV) All or part of the hydroxyl group of the polyimide precursor substituted with the group represented by the formula (II) or the polybenzoxazole precursor containing the repeating unit represented by the formula (IX) is represented by the formula (III) In the case of a polybenzoxazole precursor substituted with a group, a polyimide film or a polybenzoxazole film having excellent film characteristics can be formed by heat-treating the obtained pattern to form an imidized or oxazolated film. The heating temperature is preferably 250 to 400 ° C.
The photosensitive resin composition of this invention is excellent in the stability in the heating process of the photosensitive film | membrane obtained, and long-term storage stability, and is excellent in a sensitivity and resolution.
<硬化レリーフパターン及びその製造方法>
 本発明は、硬化レリーフパターン及びその製造方法に関するものでもある。
 具体的には、本発明の硬化レリーフパターンは、
 (ア)前記感光性膜を基板上に形成する工程、
 (イ)該感光性膜を活性光線又は放射線で露光する工程、
 (ウ)該感光性膜の露光された部分を水性アルカリ現像液で除去するように現像する工程、及び
 (エ)得られたレリーフパターンを加熱処理する工程を有する製造方法により製造することができる。
 また、本発明の感光性樹脂組成物により、加熱硬化後の厚みが所定厚み(例えば0.1~30μm)になるように、半導体素子上に塗布し、プリベーク、露光、現像、加熱硬化して半導体装置を製造できる。
<Hardened relief pattern and manufacturing method thereof>
The present invention also relates to a cured relief pattern and a method for producing the same.
Specifically, the cured relief pattern of the present invention is
(A) forming the photosensitive film on a substrate;
(A) a step of exposing the photosensitive film with actinic rays or radiation;
(C) It can be produced by a production method comprising a step of developing so as to remove an exposed portion of the photosensitive film with an aqueous alkaline developer, and (d) a step of heat-treating the obtained relief pattern. .
In addition, the photosensitive resin composition of the present invention is applied on a semiconductor element so that the thickness after heat curing becomes a predetermined thickness (for example, 0.1 to 30 μm), prebaked, exposed, developed, and heat cured. A semiconductor device can be manufactured.
 以下、実施例により本発明を具体的に説明するが、本発明はこれらに限定されるものではない。
〔GPC測定条件〕
 以降におけるGPC測定は、HPC-8220GPC(東ソー製)、ガードカラム:TSKguardcolumn SuperAW-H、カラム:TSKgel SuperAWM-Hを3本直結し、カラム温度50℃、試料濃度0.5質量%のN-メチル-2-ピロリドン溶液を20μl注入し、溶出溶媒としてN-メチル-2-ピロリドン溶液(LiBr(10mM)及びHPO(10mM)を含む)を毎分0.35mlの流量でフローさせ、RI検出装置にて試料ピークを検出することでおこなった。Mw及びMnは標準ポリスチレンを用いて作製した検量線を用いて計算した。
 酸価は、0.1mol/L KOHアルコール溶液で中和滴定することにより求めた。
EXAMPLES Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited thereto.
[GPC measurement conditions]
In the GPC measurement thereafter, HPC-8220GPC (manufactured by Tosoh Corporation), guard column: TSK guard column Super AW-H, column: TSK gel Super AWM-H were directly connected, N-methyl having a column temperature of 50 ° C. and a sample concentration of 0.5 mass%. Inject 20 μl of -2-pyrrolidone solution, and flow N-methyl-2-pyrrolidone solution (containing LiBr (10 mM) and H 3 PO 4 (10 mM)) as an elution solvent at a flow rate of 0.35 ml / min. This was done by detecting the sample peak with a detector. Mw and Mn were calculated using a calibration curve prepared using standard polystyrene.
The acid value was determined by neutralization titration with a 0.1 mol / L KOH alcohol solution.
(合成例1)1-クロロ-1-メトキシ-2-フェニルプロパンの合成
 温度計、攪拌器、塩化カルシウム管を備えた1Lフラスコ中に2-フェニルプロピオンアルデヒド120.0g、硫酸マグネシウム120.0g、メタノール600mL、10-カンファースルホン酸2.08gを加え、50℃で11時間反応させた。反応液を0℃まで冷却し、トリエチルアミン4.53gを添加し、0℃で30分間攪拌した。硫酸マグネシウムをろ過し、ろ液を酢酸エチルと飽和重曹水で抽出した。得られた有機相を蒸留水、飽和食塩水で洗浄し、硫酸ナトリウムで乾燥した後、減圧下にて濃縮し、透明液体144.2gを得た。
 温度計、攪拌器、塩化カルシウム管を備えた1Lフラスコ中に上記液体144.2g、塩化アセチル84.2gを加え室温(25℃)で2時間反応させた後、減圧下にて濃縮し、透明液体132.2gを得た。H-NMR測定(重クロロホルム)より、該液体が1-クロロ-1-メトキシ-2-フェニルプロパン(a-1)であることを確認した。
H-NMR δ 7.37-7.20(5H,m),5.58(1H,m),3.46(3H,m),3.28(1H,m),1.43(3H,m)
(Synthesis Example 1) Synthesis of 1-chloro-1-methoxy-2-phenylpropane In a 1 L flask equipped with a thermometer, a stirrer and a calcium chloride tube, 120.0 g of 2-phenylpropionaldehyde, 120.0 g of magnesium sulfate, 600 mL of methanol and 2.08 g of 10-camphorsulfonic acid were added and reacted at 50 ° C. for 11 hours. The reaction solution was cooled to 0 ° C., 4.53 g of triethylamine was added, and the mixture was stirred at 0 ° C. for 30 minutes. Magnesium sulfate was filtered, and the filtrate was extracted with ethyl acetate and saturated aqueous sodium hydrogen carbonate. The obtained organic phase was washed with distilled water and saturated brine, dried over sodium sulfate, and then concentrated under reduced pressure to obtain 144.2 g of a transparent liquid.
In a 1 L flask equipped with a thermometer, stirrer, and calcium chloride tube, 144.2 g of the above liquid and 84.2 g of acetyl chloride were added and reacted at room temperature (25 ° C.) for 2 hours, and then concentrated under reduced pressure to be transparent. 132.2 g of liquid was obtained. From 1 H-NMR measurement (deuterated chloroform), it was confirmed that the liquid was 1-chloro-1-methoxy-2-phenylpropane (a-1).
1 H-NMR δ 7.37-7.20 (5H, m), 5.58 (1H, m), 3.46 (3H, m), 3.28 (1H, m), 1.43 (3H , M)
(合成例2)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパンの合成
 温度計、攪拌器、塩化カルシウム管を備えた300mLフラスコ中に2-フェニルプロピオンアルデヒド59.8g、硫酸マグネシウム50.0g、2-メトキシエタノール101.8g、10-カンファースルホン酸1.04gを加え、50℃で12時間反応させた。反応液を0℃まで冷却し、トリエチルアミン2.26gを添加し、0℃で30分間攪拌した。硫酸マグネシウムをろ過し、ろ液を酢酸エチルと飽和重曹水で抽出した。得られた有機相を蒸留水、飽和食塩水で洗浄し、硫酸ナトリウムで乾燥した後、減圧下にて濃縮し、透明液体91.6gを得た。
 温度計、攪拌器、塩化カルシウム管を備えた300mLフラスコ中に上記液体91.6g、塩化アセチル42.0gを加え室温で2時間反応させた後、減圧下にて濃縮し、透明液体97.1gを得た。H-NMR測定(重クロロホルム)より、該液体が1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン(a-2)であることを確認した。
H-NMR δ 7.44-7.11(5H,m),5.75(1H,m),3.99(1H,m),3.78-3.25(7H,m),1.48(3H,m)
Synthesis Example 2 Synthesis of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane In a 300 mL flask equipped with a thermometer, stirrer, and calcium chloride tube, 59.8 g of 2-phenylpropionaldehyde, sulfuric acid Magnesium 50.0 g, 2-methoxyethanol 101.8 g, and 10-camphorsulfonic acid 1.04 g were added and reacted at 50 ° C. for 12 hours. The reaction solution was cooled to 0 ° C., 2.26 g of triethylamine was added, and the mixture was stirred at 0 ° C. for 30 minutes. Magnesium sulfate was filtered, and the filtrate was extracted with ethyl acetate and saturated aqueous sodium hydrogen carbonate. The obtained organic phase was washed with distilled water and saturated brine, dried over sodium sulfate, and concentrated under reduced pressure to obtain 91.6 g of a transparent liquid.
91.6 g of the above liquid and 42.0 g of acetyl chloride were added to a 300 mL flask equipped with a thermometer, a stirrer, and a calcium chloride tube, reacted at room temperature for 2 hours, concentrated under reduced pressure, and 97.1 g of a transparent liquid. Got. From the 1 H-NMR measurement (deuterated chloroform), it was confirmed that the liquid was 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane (a-2).
1 H-NMR δ 7.44-7.11 (5H, m), 5.75 (1H, m), 3.99 (1H, m), 3.78-3.25 (7H, m), 1 .48 (3H, m)
(合成例3)1-クロロ-1,2-ジメトキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-メトキシプロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1-クロロ-1,2-ジメトキシプロパン(a-3)を透明液体として得た。
(合成例4)1-クロロ-1-メトキシ-2-フェノキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-フェノキシプロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1-クロロ-1-メトキシ-2-フェノキシプロパン(a-4)を透明液体として得た。
(合成例5)2-アセチル-1-クロロ-1-メトキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-アセチルプロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、2-アセチル-1-クロロ-1-メトキシプロパン(a-5)を透明液体として得た。
(合成例6)1-クロロ-2-(エトキシカルボニル)-1-メトキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-(エトキシカルボニル)プロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1-クロロ-2-(エトキシカルボニル)-1-メトキシプロパン(a-6)を透明液体として得た。
(合成例7)1-クロロ-1-メトキシ-2-(フェノキシカルボニル)プロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-(フェノキシカルボニル)プロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1-クロロ-1-メトキシ-2-(フェノキシカルボニル)プロパン(a-7)を透明液体として得た。
(Synthesis Example 3) Synthesis of 1-chloro-1,2-dimethoxypropane A reaction was conducted in the same manner as in Synthesis Example 1 except that 2-methoxypropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1-chloro-1,2-dimethoxy propane (a-3) was obtained as a clear liquid.
Synthesis Example 4 Synthesis of 1-chloro-1-methoxy-2-phenoxypropane The same reaction as in Synthesis Example 1 except that 2-phenoxypropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1-Chloro-1-methoxy-2-phenoxypropane (a-4) was obtained as a transparent liquid.
Synthesis Example 5 Synthesis of 2-acetyl-1-chloro-1-methoxypropane The same reaction as in Synthesis Example 1 except that 2-acetylpropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. And 2-acetyl-1-chloro-1-methoxypropane (a-5) was obtained as a transparent liquid.
Synthesis Example 6 Synthesis of 1-chloro-2- (ethoxycarbonyl) -1-methoxypropane Synthesis Example 1 except that 2- (ethoxycarbonyl) propionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. The reaction was carried out in the same manner as in 1 to obtain 1-chloro-2- (ethoxycarbonyl) -1-methoxypropane (a-6) as a transparent liquid.
Synthesis Example 7 Synthesis of 1-chloro-1-methoxy-2- (phenoxycarbonyl) propane Synthesis Example except that 2- (phenoxycarbonyl) propionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. The reaction was carried out in the same manner as in 1 to obtain 1-chloro-1-methoxy-2- (phenoxycarbonyl) propane (a-7) as a transparent liquid.
(合成例8)1-クロロ-2-シアノ-1-メトキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-シアノプロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1-クロロ-2-シアノ-1-メトキシプロパン(a-8)を透明液体として得た。
(合成例9)1,2-ジクロロ-1-メトキシプロパンの合成
 合成例1において2-フェニルプロピオンアルデヒドの代わりに2-クロロプロピオンアルデヒドを用いたこと以外は合成例1と同様に反応を行い、1,2-ジクロロ-1-メトキシプロパン(a-9)を透明液体として得た。
(合成例10)1-クロロ-1-(シクロヘキシルオキシ)-2-フェニルプロパンの合成
 合成例2において2-メトキシエタノールの代わりにシクロヘキサノールを用いたこと以外は合成例2と同様に反応を行い、1-クロロ-1-(シクロヘキシルオキシ)-2-フェニルプロパン(a-10)を透明液体として得た。
(合成例11)1-クロロ-1-フェノキシ-2-フェニルプロパンの合成
 合成例2において2-メトキシエタノールの代わりにフェノールを用いたこと以外は合成例2と同様に反応を行い、1-クロロ-1-フェノキシ-2-フェニルプロパン(a-11)を透明液体として得た。
(合成例12)1-クロロ-1-(2-フェノキシエトキシ)-2-フェニルプロパンの合成
 合成例2において2-メトキシエタノールの代わりに2-フェノキシエタノールを用いたこと以外は合成例2と同様に反応を行い、1-クロロ-1-(2-フェノキシエトキシ)-2-フェニルプロパン(a-12)を透明液体として得た。
(合成例13)1-ブロモ-1-メトキシ-2-フェニルプロパンの合成
 合成例1において塩化アセチルの代わりに臭化アセチルを用いたこと以外は合成例1と同様に反応を行い、1-ブロモ-1-メトキシ-2-フェニルプロパン(a-13)を黄色液体として得た。
Synthesis Example 8 Synthesis of 1-chloro-2-cyano-1-methoxypropane The same reaction as in Synthesis Example 1 except that 2-cyanopropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1-Chloro-2-cyano-1-methoxypropane (a-8) was obtained as a transparent liquid.
(Synthesis Example 9) Synthesis of 1,2-dichloro-1-methoxypropane A reaction was conducted in the same manner as in Synthesis Example 1 except that 2-chloropropionaldehyde was used instead of 2-phenylpropionaldehyde in Synthesis Example 1. 1,2-Dichloro-1-methoxypropane (a-9) was obtained as a transparent liquid.
Synthesis Example 10 Synthesis of 1-chloro-1- (cyclohexyloxy) -2-phenylpropane The same reaction as in Synthesis Example 2 was conducted except that cyclohexanol was used in place of 2-methoxyethanol in Synthesis Example 2. 1-chloro-1- (cyclohexyloxy) -2-phenylpropane (a-10) was obtained as a transparent liquid.
(Synthesis Example 11) Synthesis of 1-chloro-1-phenoxy-2-phenylpropane A reaction was conducted in the same manner as in Synthesis Example 2 except that phenol was used instead of 2-methoxyethanol in Synthesis Example 2. -1-Phenoxy-2-phenylpropane (a-11) was obtained as a transparent liquid.
(Synthesis Example 12) 1-chloro-1- (2-phenoxyethyl) -2-in Synthesis Example 2 of phenylpropane except for using 2-phenoxyethanol in place of 2-methoxyethanol in the same manner as in Synthesis Example 2 The reaction was performed to obtain 1-chloro-1- (2-phenoxyethoxy) -2-phenylpropane (a-12) as a transparent liquid.
(Synthesis Example 13) Synthesis of 1-bromo-1-methoxy-2-phenylpropane The reaction was conducted in the same manner as in Synthesis Example 1 except that acetyl bromide was used instead of acetyl chloride in Synthesis Example 1. -1-Methoxy-2-phenylpropane (a-13) was obtained as a yellow liquid.
(比較合成例1)1-クロロ-1-エトキシエタンの合成
 エチルビニルエーテル8gを5℃に冷却し、塩化水素ガス3.3gを1時間かけて液中に吹き込むことにより、無色透明液体10.1gを得た。H-NMR測定(重クロロホルム)より、該液体が1-クロロ-1-エトキシエタン(a-14)であることを確認した。
(比較合成例2)1-クロロ-1-メトキシ-2-メチルプロパンの合成
 メタノール128.2gにp-トルエンスルホン酸一水和物0.19gを溶解させ、20℃以下に冷却しながらイソブチルアルデヒド72.1gを滴下した。1%炭酸ナトリウム水溶液200gで洗浄し、分液により得られた油相を常圧蒸留することにより、イソブチルアルデヒドジメチルアセタール35gを得た。これにp-トルエンスルホン酸一水和物0.06gを溶解させ、200℃に加熱した。留出してきた液体12gを集め、1%炭酸ナトリウム水溶液10gで洗浄し、分液により得られた油相を減圧蒸留することにより、無色透明液体8gを得た。これを5℃に冷却し、塩化水素ガス3.7gを1時間かけて液中に吹き込むことにより、無色透明液体11.4gを得た。H-NMR測定(重クロロホルム)より、該液体が1-クロロ-1-メトキシ-2-メチルプロパン(a-15)であることを確認した。
(Comparative Synthesis Example 1) Synthesis of 1-chloro-1-ethoxyethane 8 g of ethyl vinyl ether was cooled to 5 ° C., and 3.3 g of hydrogen chloride gas was blown into the liquid over 1 hour, thereby allowing 10.1 g of a colorless transparent liquid. Got. From 1 H-NMR measurement (deuterated chloroform), it was confirmed that the liquid was 1-chloro-1-ethoxyethane (a-14).
(Comparative Synthesis Example 2) Synthesis of 1-chloro-1-methoxy-2-methylpropane 0.19 g of p-toluenesulfonic acid monohydrate was dissolved in 128.2 g of methanol, and isobutyraldehyde was cooled to 20 ° C. or lower. 72.1 g was dripped. Washing with 200 g of 1% sodium carbonate aqueous solution, and distillation of the oil phase obtained by liquid separation at atmospheric pressure gave 35 g of isobutyraldehyde dimethyl acetal. To this, 0.06 g of p-toluenesulfonic acid monohydrate was dissolved and heated to 200 ° C. 12 g of the distilled liquid was collected, washed with 10 g of a 1% aqueous sodium carbonate solution, and the oily phase obtained by liquid separation was distilled under reduced pressure to obtain 8 g of a colorless transparent liquid. This was cooled to 5 ° C., and 3.7 g of hydrogen chloride gas was blown into the liquid over 1 hour to obtain 11.4 g of a colorless transparent liquid. From 1 H-NMR measurement (deuterated chloroform), it was confirmed that the liquid was 1-chloro-1-methoxy-2-methylpropane (a-15).
(実施例1~13及び比較例1、2)保護剤の保存安定性試験
 合成例1~13、比較合成例1及び2で得られた保護剤5gをそれぞれ10mlのガラス製バイアルに充填し、密封した後、50℃の恒温層にて15日間経時した。経時後のH-NMR測定(重クロロホルム、内標:トリメトキシベンゼン)から保護剤の残量を定量し、経時前の保護剤量を基準として、経時後残存率を算出した。結果を表1に示す。
(Examples 1 to 13 and Comparative Examples 1 and 2) Storage Stability Test of Protective Agents 5 g of the protective agents obtained in Synthesis Examples 1 to 13 and Comparative Synthesis Examples 1 and 2 were each filled into a 10 ml glass vial, After sealing, it was aged for 15 days in a constant temperature layer at 50 ° C. The remaining amount of the protective agent was quantified from 1 H-NMR measurement (deuterated chloroform, internal standard: trimethoxybenzene) after the lapse of time, and the residual rate after aging was calculated based on the amount of the protective agent before the lapse of time. The results are shown in Table 1.
Figure JPOXMLDOC01-appb-T000115
Figure JPOXMLDOC01-appb-T000115
 表1に示した結果から明らかなように、前記一般式(I)を満たさない保護剤を使用した比較例1及び2は経時後残存率が小さいことが分かる。
 一方、前記一般式(I)で表される保護剤を使用した実施例1~13は、経時後残存率が高く、保存安定性に極めて優れていることがわかる。
As is apparent from the results shown in Table 1, it can be seen that Comparative Examples 1 and 2 using a protective agent that does not satisfy the general formula (I) have a small residual rate after aging.
On the other hand, it can be seen that Examples 1 to 13 using the protective agent represented by the general formula (I) have a high residual ratio after aging and are extremely excellent in storage stability.
(実施例14)1-クロロ-1-メトキシ-2-フェニルプロパン(a-1)によるメタクリル酸のカルボキシル基の保護
 メタクリル酸10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-メトキシ-2-フェニルプロパン22.5gを加え、攪拌しながらトリエチルアミン14.1gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、黄褐色の液体25.9gを得た。H-NMRスペクトルより、該液体がメタクリル酸1-メトキシ-2-フェニルプロピル(b-1)であることを確認した。
H-NMR δ 7.37-7.20(5H,m),6.32(1H,s),5.80(1H,m),5.59(1H,m),3.56(3H,m),3.39(1H,m),1.96(3H,m),1.43(3H,m)
(Example 14) Protection of carboxyl group of methacrylic acid with 1-chloro-1-methoxy-2-phenylpropane (a-1) 10.0 g of methacrylic acid was dissolved in 30 ml of tetrahydrofuran and cooled to 0 ° C. 22.5 g of 1-chloro-1-methoxy-2-phenylpropane was added, and 14.1 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. Distilled water (50 ml) was added to the reaction solution, extraction was performed with ethyl acetate, and the obtained organic phase was concentrated under reduced pressure to obtain 25.9 g of a tan liquid. From the 1 H-NMR spectrum, it was confirmed that the liquid was 1-methoxy-2-phenylpropyl methacrylate (b-1).
1 H-NMR δ 7.37-7.20 (5H, m), 6.32 (1H, s), 5.80 (1H, m), 5.59 (1H, m), 3.56 (3H , M), 3.39 (1H, m), 1.96 (3H, m), 1.43 (3H, m)
(実施例15)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン(a-2)によるメタクリル酸のカルボキシル基の保護
 メタクリル酸10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン27.9gを加え、攪拌しながらトリエチルアミン14.1gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、黄褐色の液体31.0gを得た。H-NMRスペクトルより、該液体がメタクリル酸1-(2-メトキシエトキシ)-2-フェニルプロピル(b-2)であることを確認した。
H-NMR δ 7.44-7.12(5H,m),6.34(1H,s),5.81(1H,m),5.60(1H,m),4.01(1H,m),3.78-3.25(7H,m),1.96(3H,m),1.45(3H,m)
(Example 15) Protection of carboxyl group of methacrylic acid by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane (a-2) 10.0 g of methacrylic acid was dissolved in 30 ml of tetrahydrofuran and dissolved at 0 ° C. After cooling, 27.9 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane was added, and 14.1 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. Distilled water (50 ml) was added to the reaction solution, extracted with ethyl acetate, and the resulting organic phase was concentrated under reduced pressure to obtain 31.0 g of a tan liquid. From the 1 H-NMR spectrum, it was confirmed that the liquid was 1- (2-methoxyethoxy) -2-phenylpropyl methacrylate (b-2) methacrylate.
1 H-NMR δ 7.44-7.12 (5H, m), 6.34 (1H, s), 5.81 (1H, m), 5.60 (1H, m), 4.01 (1H , M), 3.78-3.25 (7H, m), 1.96 (3H, m), 1.45 (3H, m)
(比較例3)1-クロロ-1-エトキシエタン(a-14)によるメタクリル酸のカルボキシル基の保護
 メタクリル酸10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-エトキシエタン13.2gを加え、攪拌しながらトリエチルアミン14.1gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、メタクリル酸1-エトキシエチル(b-14)15.1gを得た。
(比較例4)1-クロロ-1-メトキシ-2-メチルプロパン(a-15)によるメタクリル酸のカルボキシル基の保護
 メタクリル酸10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-メトキシ-2-メチルプロパン15.0gを加え、攪拌しながらトリエチルアミン14.1gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、メタクリル酸1-メトキシ-2-メチルプロピル(b-15)16.8gを得た。
(Comparative Example 3) Protection of carboxyl group of methacrylic acid with 1-chloro-1-ethoxyethane (a-14) 10.0 g of methacrylic acid was dissolved in 30 ml of tetrahydrofuran, cooled to 0 ° C., and then 1-chloro- 13.2 g of 1-ethoxyethane was added, and 14.1 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of the addition, the mixture was stirred for about 2 hours. Distilled water (50 ml) was added to the reaction mixture, and the mixture was extracted with ethyl acetate. The obtained organic phase was concentrated under reduced pressure to obtain 15.1 g of 1-ethoxyethyl methacrylate (b-14).
(Comparative Example 4) Protection of carboxyl group of methacrylic acid with 1-chloro-1-methoxy-2-methylpropane (a-15) 10.0 g of methacrylic acid was dissolved in 30 ml of tetrahydrofuran and cooled to 0 ° C. 15.0 g of 1-chloro-1-methoxy-2-methylpropane was added, and 14.1 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. Distilled water (50 ml) was added to the reaction mixture, and the mixture was extracted with ethyl acetate. The obtained organic phase was concentrated under reduced pressure to obtain 16.8 g of 1-methoxy-2-methylpropyl methacrylate (b-15).
(実施例16)1-クロロ-1-メトキシ-2-フェニルプロパン(a-1)によるm-クレゾールのヒドロキシル基の保護
 m-クレゾール10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-メトキシ-2-フェニルプロパン17.9gを加え、攪拌しながらトリエチルアミン11.2gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、(1-メトキシ-2-フェニルプロピル)-(3-メチルフェニル)エーテル(c-1)22.5gを得た。
(実施例17)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン(a-2)によるm-クレゾールのヒドロキシル基の保護
 m-クレゾール10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン22.2gを加え、攪拌しながらトリエチルアミン11.2gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、(1-(2-メトキシエトキシ)-2-フェニルプロピル)-(3-メチルフェニル)エーテル(c-2)26.7gを得た。
(比較例5)1-クロロ-1-エトキシエタン(a-14)によるm-クレゾールのヒドロキシル基の保護
 m-クレゾール10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-エトキシエタン10.5gを加え、攪拌しながらトリエチルアミン11.2gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、(1-エトキシエチル)-(3-メチルフェニル)エーテル(c-14)13.7gを得た。
(比較例6)1-クロロ-1-メトキシ-2-メチルプロパン(a-15)によるm-クレゾールのヒドロキシル基の保護
 m-クレゾール10.0gをテトラヒドロフランに30mlに溶解し、0℃に冷却した後、1-クロロ-1-メトキシ-2-メチルプロパン11.9gを加え、攪拌しながらトリエチルアミン11.2gを約10分間かけて滴下した。滴下終了後、そのまま約2時間攪拌した。反応液に蒸留水50mlを加え、酢酸エチルで抽出し、得られた有機相を減圧濃縮することで、(1-メトキシ-2-メチルプロピル)-(3-メチルフェニル)エーテル(c-15)15.1gを得た。
(Example 16) Protection of hydroxyl group of m-cresol by 1-chloro-1-methoxy-2-phenylpropane (a-1) 10.0 g of m-cresol was dissolved in 30 ml of tetrahydrofuran and cooled to 0 ° C. Thereafter, 17.9 g of 1-chloro-1-methoxy-2-phenylpropane was added, and 11.2 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. 50 ml of distilled water was added to the reaction solution, extracted with ethyl acetate, and the resulting organic phase was concentrated under reduced pressure to give (1-methoxy-2-phenylpropyl)-(3-methylphenyl) ether (c-1) 22.5 g was obtained.
Example 17 Protection of hydroxyl group of m-cresol by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane (a-2) 10.0 g of m-cresol was dissolved in 30 ml of tetrahydrofuran, After cooling to 0 ° C., 22.2 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane was added, and 11.2 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. 50 ml of distilled water was added to the reaction solution, extracted with ethyl acetate, and the resulting organic phase was concentrated under reduced pressure to give (1- (2-methoxyethoxy) -2-phenylpropyl)-(3-methylphenyl) ether. (C-2) 26.7 g was obtained.
(Comparative Example 5) Protection of hydroxyl group of m-cresol by 1-chloro-1-ethoxyethane (a-14) 10.0 g of m-cresol was dissolved in 30 ml of tetrahydrofuran and cooled to 0 ° C. 10.5 g of chloro-1-ethoxyethane was added, and 11.2 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. 50 ml of distilled water was added to the reaction solution, extracted with ethyl acetate, and the obtained organic phase was concentrated under reduced pressure to obtain 13.7 g of (1-ethoxyethyl)-(3-methylphenyl) ether (c-14). Obtained.
(Comparative Example 6) Protection of hydroxyl group of m-cresol by 1-chloro-1-methoxy-2-methylpropane (a-15) 10.0 g of m-cresol was dissolved in 30 ml of tetrahydrofuran and cooled to 0 ° C. Thereafter, 11.9 g of 1-chloro-1-methoxy-2-methylpropane was added, and 11.2 g of triethylamine was added dropwise over about 10 minutes with stirring. After completion of dropping, the mixture was stirred for about 2 hours. 50 ml of distilled water was added to the reaction solution, extracted with ethyl acetate, and the resulting organic phase was concentrated under reduced pressure to give (1-methoxy-2-methylpropyl)-(3-methylphenyl) ether (c-15) 15.1 g was obtained.
(合成例14)ポリメタクリル樹脂の合成
 滴下装置、攪拌装置、温度計、冷却管及び窒素ガス導入管を備えたフラスコ内にプロピレングリコールモノメチルエーテルアセテート100gを仕込み、80℃に加熱し、窒素雰囲気下にて攪拌しながら、メタクリル酸1-メトキシ-2-フェニルプロピル(b-1)27.4g、メチルメタクリレート57.7g、ブチルメタクリレート13.5g及びアゾビスイソブチロニトリル(AIBN)10.0gを均一に溶解したものを滴下装置より4時間かけて滴下した。滴下終了後、30分毎に2回、AIBN/プロピレングリコールモノメチルアセテート=0.15g/0.3gの混合溶液を添加して、80℃で2時間熟成し、重合反応を終了した。得られた樹脂溶液をヘキサンで再沈精製することにより、白色固体(d-1)79gを得た。固体の重量平均分子量は7,500であった。
(合成例15)ポリメタクリル樹脂の合成
 滴下装置、攪拌装置、温度計、冷却管及び窒素ガス導入管を備えたフラスコ内にプロピレングリコールモノメチルエーテルアセテート100gを仕込み、80℃に加熱し、窒素雰囲気下にて攪拌しながら、メタクリル酸1-(2-メトキシエトキシ)-2-フェニルプロピル(b-2)32.5g、メチルメタクリレート57.7g、ブチルメタクリレート13.5g及びアゾビスイソブチロニトリル(AIBN)10.0gを均一に溶解したものを滴下装置より4時間かけて滴下した。滴下終了後、30分毎に2回、AIBN/プロピレングリコールモノメチルアセテート=0.15g/0.3gの混合溶液を添加して、80℃で2時間熟成し、重合反応を終了した。得られた樹脂溶液をヘキサンで再沈精製することにより、白色固体(d-2)83gを得た。固体の重量平均分子量は8,200であった。
(Synthesis Example 14) Synthesis of polymethacrylic resin 100 g of propylene glycol monomethyl ether acetate was charged into a flask equipped with a dropping device, a stirrer, a thermometer, a cooling tube and a nitrogen gas introduction tube, heated to 80 ° C., and under a nitrogen atmosphere 27.4 g of 1-methoxy-2-phenylpropyl methacrylate (b-1), 57.7 g of methyl methacrylate, 13.5 g of butyl methacrylate, and 10.0 g of azobisisobutyronitrile (AIBN) What was melt | dissolved uniformly was dripped over 4 hours from the dripping apparatus. After completion of the dropwise addition, a mixed solution of AIBN / propylene glycol monomethyl acetate = 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction. The obtained resin solution was purified by reprecipitation with hexane to obtain 79 g of a white solid (d-1). The weight average molecular weight of the solid was 7,500.
(Synthesis Example 15) Synthesis of polymethacrylic resin 100 g of propylene glycol monomethyl ether acetate was charged into a flask equipped with a dropping device, a stirring device, a thermometer, a cooling tube and a nitrogen gas introduction tube, heated to 80 ° C., and under a nitrogen atmosphere 32.5 g of 1- (2-methoxyethoxy) -2-phenylpropyl (b-2) methacrylate, 57.7 g of methyl methacrylate, 13.5 g of butyl methacrylate and azobisisobutyronitrile (AIBN) ) A solution in which 10.0 g was uniformly dissolved was dropped from a dropping device over 4 hours. After completion of the dropwise addition, a mixed solution of AIBN / propylene glycol monomethyl acetate = 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction. The obtained resin solution was purified by reprecipitation with hexane to obtain 83 g of a white solid (d-2). The weight average molecular weight of the solid was 8,200.
(比較合成例3)ポリメタクリル樹脂の合成
 滴下装置、攪拌装置、温度計、冷却管及び窒素ガス導入管を備えたフラスコ内にプロピレングリコールモノメチルエーテルアセテート100gを仕込み、80℃に加熱し、窒素雰囲気下にて攪拌しながら、メタクリル酸1-エトキシエチル(b-14)27.4g、メチルメタクリレート57.7g、ブチルメタクリレート13.5g及びアゾビスイソブチロニトリル(AIBN)10.0gを均一に溶解したものを滴下装置より4時間かけて滴下した。滴下終了後、30分毎に2回、AIBN/プロピレングリコールモノメチルアセテート=0.15g/0.3gの混合溶液を添加して、80℃で2時間熟成し、重合反応を終了した。得られた樹脂溶液をヘキサンで再沈精製することにより、白色固体(d-14)72gを得た。固体の重量平均分子量は7,100であった。
(比較合成例4)ポリメタクリル樹脂の合成
 滴下装置、攪拌装置、温度計、冷却管及び窒素ガス導入管を備えたフラスコ内にプロピレングリコールモノメチルエーテルアセテート100gを仕込み、80℃に加熱し、窒素雰囲気下にて攪拌しながら、メタクリル酸1-メトキシ-2-メチルプロピル(b-15)27.4g、メチルメタクリレート57.7g、ブチルメタクリレート13.5g及びアゾビスイソブチロニトリル(AIBN)10.0gを均一に溶解したものを滴下装置より4時間かけて滴下した。滴下終了後、30分毎に2回、AIBN/プロピレングリコールモノメチルアセテート=0.15g/0.3gの混合溶液を添加して、80℃で2時間熟成し、重合反応を終了した。得られた樹脂溶液をヘキサンで再沈精製することにより、白色固体(d-15)73gを得た。固体の重量平均分子量は7,300であった。
(Comparative Synthesis Example 3) Synthesis of polymethacrylic resin 100 g of propylene glycol monomethyl ether acetate was charged in a flask equipped with a dropping device, a stirrer, a thermometer, a cooling tube and a nitrogen gas introduction tube, heated to 80 ° C., and a nitrogen atmosphere While stirring below, 27.4 g of 1-ethoxyethyl methacrylate (b-14), 57.7 g of methyl methacrylate, 13.5 g of butyl methacrylate and 10.0 g of azobisisobutyronitrile (AIBN) are uniformly dissolved. What was dripped was dripped over 4 hours from the dripping apparatus. After completion of the dropwise addition, a mixed solution of AIBN / propylene glycol monomethyl acetate = 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction. The obtained resin solution was purified by reprecipitation with hexane to obtain 72 g of a white solid (d-14). The weight average molecular weight of the solid was 7,100.
(Comparative Synthesis Example 4) Synthesis of polymethacrylic resin 100 g of propylene glycol monomethyl ether acetate was charged in a flask equipped with a dropping device, a stirrer, a thermometer, a cooling tube and a nitrogen gas introduction tube, heated to 80 ° C., and a nitrogen atmosphere While stirring at the bottom, 27.4 g of 1-methoxy-2-methylpropyl methacrylate (b-15), 57.7 g of methyl methacrylate, 13.5 g of butyl methacrylate and 10.0 g of azobisisobutyronitrile (AIBN) It was added dropwise over 4 hours from a dropping machine that uniformly dissolved. After completion of the dropwise addition, a mixed solution of AIBN / propylene glycol monomethyl acetate = 0.15 g / 0.3 g was added twice every 30 minutes and aged at 80 ° C. for 2 hours to complete the polymerization reaction. The obtained resin solution was purified by reprecipitation with hexane to obtain 73 g of a white solid (d-15). The weight average molecular weight of the solid was 7,300.
(実施例18)1-クロロ-1-メトキシ-2-フェニルプロパンによるフェノールノボラック樹脂のヒドロキシル基の保護
 重量平均分子量3,220のフェノールノボラック樹脂[昭和高分子(株)製]2.7gをメチルエチルケトン17.5mlに溶解し、この溶液の中に1-クロロ-1-メトキシ-2-フェニルプロパン2.30gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.53gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(e-1)4.1gを得た。H-NMRスペクトルより、ヒドロキシル基の40モル%が1-メトキシ-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、4,370であった。
(Example 18) Protection of hydroxyl group of phenol novolak resin with 1-chloro-1-methoxy-2-phenylpropane 2.7 g of phenol novolak resin [manufactured by Showa Polymer Co., Ltd.] having a weight average molecular weight of 3,220 was added to methyl ethyl ketone. was dissolved in 17.5 ml, this 1-chloro-1-methoxy-2-phenylpropane 2.30g in a solution was added and after complete dissolution by stirring, about 30 minutes triethylamine 2.53g stirring It was dripped over. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then added dropwise to 500 ml of pure water to cause reprecipitation to produce a pale yellow solid (e -1) 4.1 g was obtained. From 1 H-NMR spectrum, it was found that 40 mol% of the hydroxyl group was substituted with 1-methoxy-2-phenylpropoxy group. The weight average molecular weight of the target product was 4,370.
(実施例19)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパンによるフェノールノボラック樹脂のヒドロキシル基の保護
 重量平均分子量3,220のフェノールノボラック樹脂[昭和高分子(株)製]2.7gをメチルエチルケトン17.5mlに溶解し、この溶液の中に1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン2.85gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.53gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(e-2)4.6gを得た。H-NMRスペクトルより、ヒドロキシル基の40モル%が1-(2-メトキシエトキシ)-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、4,700であった。
(比較例7)1-クロロ-1-エトキシエタンによるフェノールノボラック樹脂のヒドロキシル基の保護
 重量平均分子量3,220のフェノールノボラック樹脂[昭和高分子(株)製]2.7gをメチルエチルケトン17.5mlに溶解し、この溶液の中に1-クロロ-1-エトキシエタン1.36gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.53gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(e-14)3.2gを得た。H-NMRスペクトルより、ヒドロキシル基の30モル%が1-エトキシエトキシ基で置換されていることがわかった。目的物の重量平均分子量は、3,780であった。
(Example 19) Protection of hydroxyl group of phenol novolak resin with 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane Phenol novolak resin having a weight average molecular weight of 3,220 [manufactured by Showa Polymer Co., Ltd.] 2.7 g is dissolved in 17.5 ml of methyl ethyl ketone, and 2.85 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane is added to this solution, and the mixture is stirred to dissolve completely. Then, 2.53 g of triethylamine was added dropwise over about 30 minutes. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then added dropwise to 500 ml of pure water to cause reprecipitation to produce a pale yellow solid (e -2) 4.6 g was obtained. From 1 H-NMR spectrum, it was found that 40 mol% of the hydroxyl group was substituted with 1- (2-methoxyethoxy) -2-phenylpropoxy group. The weight average molecular weight of the target product was 4,700.
(Comparative Example 7) Protection of hydroxyl group of phenol novolak resin with 1-chloro-1-ethoxyethane 2.7 g of phenol novolak resin having a weight average molecular weight of 3,220 [manufactured by Showa Polymer Co., Ltd.] was added to 17.5 ml of methyl ethyl ketone. After dissolution, 1.36 g of 1-chloro-1-ethoxyethane was added to this solution and stirred to dissolve completely, then 2.53 g of triethylamine was added dropwise over about 30 minutes with stirring. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then added dropwise to 500 ml of pure water to cause reprecipitation to produce a pale yellow solid (e -14) 3.2 g was obtained. From 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl groups were substituted with 1-ethoxyethoxy group. The target product had a weight average molecular weight of 3,780.
(比較例8)1-クロロ-1-メトキシ-2-メチルプロパンによるフェノールノボラック樹脂のヒドロキシル基の保護
 重量平均分子量3,220のフェノールノボラック樹脂[昭和高分子(株)製]2.7gをメチルエチルケトン17.5mlに溶解し、この溶液の中に1-クロロ-1-メトキシ-2-メチルプロパン1.53gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.53gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(e-15)3.4gを得た。H-NMRスペクトルより、ヒドロキシル基の30モル%が1-メトキシ-2-メチルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、3,890であった。
(Comparative Example 8) Protection of hydroxyl group of phenol novolak resin by 1-chloro-1-methoxy-2-methylpropane 2.7 g of phenol novolak resin [manufactured by Showa Polymer Co., Ltd.] having a weight average molecular weight of 3,220 was added to methyl ethyl ketone. was dissolved in 17.5 ml, this 1-chloro-1-methoxy-2-methyl propane 1.53g in a solution was added and after complete dissolution by stirring, about 30 minutes triethylamine 2.53g stirring It was dripped over. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then added dropwise to 500 ml of pure water to cause reprecipitation to produce a pale yellow solid (e -15) 3.4 g was obtained. From 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl group was substituted with 1-methoxy-2-methylpropoxy group. The target product had a weight average molecular weight of 3,890.
(実施例20)1-クロロ-1-メトキシ-2-フェニルプロパンによるポリヒドロキシスチレンのヒドロキシル基の保護
 重量平均分子量20,000のポリヒドロキシスチレン(アルドリッチ社製)2.7gをN,N-ジメチルアセトアミド17.5mlに溶解し、この溶液の中に1-クロロ-1-メトキシ-2-フェニルプロパン2.04gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.23gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(f-1)3.6gを得た。H-NMRスペクトルより、ヒドロキシル基の35モル%が1-メトキシ-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、25,200であった。
(実施例21)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパンによるポリヒドロキシスチレンのヒドロキシル基の保護
 重量平均分子量20,000のポリヒドロキシスチレン(アルドリッチ社製)2.7gをN,N-ジメチルアセトアミド17.5mlに溶解し、この溶液の中に1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン2.52gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.23gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(f-2)4.0gを得た。H-NMRスペクトルより、ヒドロキシル基の35モル%が1-(2-メトキシエトキシ)-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、26,800であった。
(Example 20) 1-chloro-1-methoxy-2-phenylpropane according polyhydroxystyrene polyhydroxystyrene protected weight average molecular weight of 20,000 of the hydroxyl groups (manufactured by Aldrich) 2.7 g of N, N-dimethyl Dissolve in 17.5 ml of acetamide, add 2.04 g of 1-chloro-1-methoxy-2-phenylpropane to this solution, stir to dissolve completely, then add 2.23 g of triethylamine to about 30 with stirring. Added dropwise over a period of minutes. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then dropped into 500 ml of pure water to cause reprecipitation, whereby a pale yellow solid (f -1) 3.6 g was obtained. From 1 H-NMR spectrum, it was found that 35 mol% of the hydroxyl group was substituted with 1-methoxy-2-phenylpropoxy group. The weight average molecular weight of the target product was 25,200.
(Example 21) Protection of hydroxyl group of polyhydroxystyrene by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane 2.7 g of polyhydroxystyrene (Aldrich) having a weight average molecular weight of 20,000 was used. After dissolving in 17.5 ml of N, N-dimethylacetamide and adding 2.52 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane to this solution and stirring to dissolve completely, While stirring, 2.23 g of triethylamine was added dropwise over about 30 minutes. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then dropped into 500 ml of pure water to cause reprecipitation, whereby a pale yellow solid (f -2) 4.0 g was obtained. From 1 H-NMR spectrum, it was found that 35 mol% of the hydroxyl group was substituted with 1- (2-methoxyethoxy) -2-phenylpropoxy group. The weight average molecular weight of the target product was 26,800.
(比較例9)1-クロロ-1-エトキシエタンによるポリヒドロキシスチレンのヒドロキシル基の保護
 重量平均分子量20,000のポリヒドロキシスチレン(アルドリッチ社製)2.7gをN,N-ジメチルアセトアミド17.5mlに溶解し、この溶液の中に1-クロロ-1-エトキシエタン1.20gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.23gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(f-14)2.9gを得た。H-NMRスペクトルより、ヒドロキシル基の30モル%が1-エトキシエトキシ基で置換されていることがわかった。目的物の重量平均分子量は、22,500であった。
(比較例10)1-クロロ-1-メトキシ-2-メチルプロパンによるポリヒドロキシスチレンのヒドロキシル基の保護
 重量平均分子量20,000のポリヒドロキシスチレン(アルドリッチ社製)2.7gをN,N-ジメチルアセトアミド17.5mlに溶解し、この溶液の中に1-クロロ-1-メトキシ-2-メチルプロパン1.35gを加え、攪拌して完全に溶解した後、攪拌しながらトリエチルアミン2.23gを約30分間かけて滴下した。滴下終了後、そのまま約3時間攪拌した。次いで、得られた溶液に対して20倍量の純水を加え、メチルイソブチルケトンで抽出し、溶媒を留去した後、純水500ml中に滴下し再沈殿させることにより淡黄色の固体(f-15)3.0gを得た。H-NMRスペクトルより、ヒドロキシル基の30モル%が1-メトキシ-2-メチルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、23,000であった。
(Comparative Example 9) Protection of hydroxyl group of polyhydroxystyrene by 1-chloro-1-ethoxyethane 2.7 g of polyhydroxystyrene having a weight average molecular weight of 20,000 (Aldrich) was added to 17.5 ml of N, N-dimethylacetamide. 1-Chloro-1-ethoxyethane (1.20 g) was added to this solution, and the mixture was completely dissolved by stirring. Then, 2.23 g of triethylamine was added dropwise over about 30 minutes with stirring. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then dropped into 500 ml of pure water to cause reprecipitation, whereby a pale yellow solid (f -14) 2.9 g was obtained. From 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl groups were substituted with 1-ethoxyethoxy group. The weight average molecular weight of the target product, was 22,500.
(Comparative Example 10) 1-chloro-1-methoxy-2-methylpropane by polyhydroxystyrene polyhydroxystyrene protected weight average molecular weight of 20,000 of the hydroxyl groups (manufactured by Aldrich) 2.7 g of N, N-dimethyl Dissolve in 17.5 ml of acetamide, add 1.35 g of 1-chloro-1-methoxy-2-methylpropane to this solution, stir to dissolve completely, then add 2.23 g of triethylamine to about 30 with stirring. Added dropwise over a period of minutes. After completion of dropping, the mixture was stirred for about 3 hours. Next, 20 times the amount of pure water was added to the resulting solution, extracted with methyl isobutyl ketone, the solvent was distilled off, and then dropped into 500 ml of pure water to cause reprecipitation, whereby a pale yellow solid (f -15) 3.0 g was obtained. From 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl group was substituted with 1-methoxy-2-methylpropoxy group. The target product had a weight average molecular weight of 23,000.
(合成例16)ポリアミック酸の合成
 温度計、攪拌器、窒素導入管を備えた5000mLフラスコ中にtrans-1,4-シクロヘキサンジアミン(岩谷瓦斯(株)製)64.04gを入れ、NMP(N-メチル-2-ピロリドン)2427.2gに溶解した後、3,3’,4,4’-ビフェニルテトラカルボン酸無水物(三菱化学(株)製)275.00gを添加した。60℃で4時間攪拌し室温まで放冷した。次いで2,2’-ジメチル-4,4’-ジアミノビフェニル(和歌山精化(株)製)89.29gを添加し60℃で2時間攪拌した。室温まで放冷し、無水フタル酸27.69gを添加し、室温で10時間攪拌してやや褐色透明のポリアミック酸溶液を得た。得られたポリアミック酸の重量平均分子量は18,800であった。
(Synthesis Example 16) Synthesis of polyamic acid In a 5000 mL flask equipped with a thermometer, a stirrer, and a nitrogen introduction tube, 64.04 g of trans-1,4-cyclohexanediamine (manufactured by Iwatani Gas Co., Ltd.) was placed, and NMP (N -Methyl-2-pyrrolidone) was dissolved in 2427.2 g, and 275.00 g of 3,3 ′, 4,4′-biphenyltetracarboxylic anhydride (manufactured by Mitsubishi Chemical Corporation) was added. The mixture was stirred at 60 ° C. for 4 hours and allowed to cool to room temperature. Subsequently, 89.29 g of 2,2′-dimethyl-4,4′-diaminobiphenyl (manufactured by Wakayama Seika Co., Ltd.) was added and stirred at 60 ° C. for 2 hours. The mixture was allowed to cool to room temperature, 27.69 g of phthalic anhydride was added, and the mixture was stirred at room temperature for 10 hours to obtain a slightly brown transparent polyamic acid solution. The obtained polyamic acid had a weight average molecular weight of 18,800.
(実施例22)1-クロロ-1-メトキシ-2-フェニルプロパンによるポリアミック酸のカルボキシル基の保護
 合成例16で得られたポリアミック酸溶液250.0gを温度計、攪拌器、窒素導入管を備えた1Lフラスコ中に加え、NMP124.0gを加え冷却し、0℃以下でN,N-ジイソプロピルエチルアミン28.51g、続いて1-クロロ-1-メトキシ-2-フェニルプロパン37.60gを添加した。0℃以下で4時間反応させた後、反応液をイソプロパノール2.7Lに加え、析出固体を濾取、乾燥し、白色固体(g-1)66.54gを得た。固体を重DMSOに溶解してH-NMRスペクトルを測定し、カルボン酸エステルとカルボン酸のピーク積分比から、カルボキシル基の99%が1-メトキシ-2-フェニルプロピル基に置換されていることがわかった。得られた樹脂の重量平均分子量は24,300であった。
(実施例23)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパンによるポリアミック酸のカルボキシル基の保護
 合成例16で得られたポリアミック酸溶液125.0gを温度計、攪拌器、窒素導入管を備えた300mLフラスコ中に加え、NMP62.0gを加え冷却し、0℃以下でN,N-ジイソプロピルエチルアミン16.45g、続いて1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン29.11gを添加した。0℃以下で4時間反応させた後、反応液をイソプロパノール1.5Lに加え、析出固体を濾取、乾燥し、白色固体(g-2)29.96gを得た。固体を重DMSOに溶解してH-NMRスペクトルを測定し、カルボン酸エステルとカルボン酸のピーク積分比から、カルボキシル基の96%が1-(2-メトキシエトキシ)-2-フェニルプロポキシ基に置換されていることがわかった。得られた樹脂の重量平均分子量は24,400であった。
(比較例11)1-クロロ-1-エトキシエタンによるポリアミック酸のカルボキシル基の保護
 合成例16で得られたポリアミック酸溶液125.0gを温度計、攪拌器、窒素導入管を備えた300mLフラスコ中に加え、NMP62.0gを加え冷却し、0℃以下でN,N-ジイソプロピルエチルアミン16.45g、続いて1-クロロ-1-エトキシエタン13.82gを添加した。0℃以下で4時間反応させた後、反応液をイソプロパノール1.5Lに加え、析出固体を濾取、乾燥し、白色固体(g-14)22.95gを得た。固体を重DMSOに溶解してH-NMRスペクトルを測定し、カルボン酸エステルとカルボン酸のピーク積分比から、カルボキシル基の77%が1-エトキシエチル基に置換されていることがわかった。得られた樹脂の重量平均分子量は20,900であった。
(比較例12)1-クロロ-1-メトキシ-2-メチルプロパンによるポリアミック酸のカルボキシル基の保護
 合成例16で得られたポリアミック酸溶液125.0gを温度計、攪拌器、窒素導入管を備えた300mLフラスコ中に加え、NMP62.0gを加え冷却し、0℃以下でN,N-ジイソプロピルエチルアミン16.45g、続いて1-クロロ-1-メトキシ-2-メチルプロパン15.60gを添加した。0℃以下で4時間反応させた後、反応液をイソプロパノール1.5Lに加え、析出固体を濾取、乾燥し、白色固体(g-15)23.77gを得た。固体を重DMSOに溶解してH-NMRスペクトルを測定し、カルボン酸エステルとカルボン酸のピーク積分比から、カルボキシル基の89%が1-メトキシ-2-メチルプロピル基に置換されていることがわかった。得られた樹脂の重量平均分子量は21,300であった。
(Example 22) Protection of carboxyl group of polyamic acid by 1-chloro-1-methoxy-2-phenylpropane 250.0 g of the polyamic acid solution obtained in Synthesis Example 16 was equipped with a thermometer, a stirrer, and a nitrogen introduction tube. Then, 124.0 g of NMP was added and cooled, and 28.51 g of N, N-diisopropylethylamine was added at 0 ° C. or lower, followed by 37.60 g of 1-chloro-1-methoxy-2-phenylpropane. After 0 ℃ 4 hours at below the reaction solution was added to isopropanol 2.7 L, and the precipitated solid collected by filtration and dried to give a white solid (g-1) 66.54g. The solid was dissolved in deuterated DMSO and 1 H-NMR spectrum was measured. From the peak integral ratio of the carboxylic acid ester and carboxylic acid, 99% of the carboxyl groups were substituted with 1-methoxy-2-phenylpropyl groups. I understood. The weight average molecular weight of the obtained resin was 24,300.
(Example 23) Protection of carboxyl group of polyamic acid with 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane 125.0 g of the polyamic acid solution obtained in Synthesis Example 16 was added to a thermometer, stirrer, Add to a 300 mL flask equipped with a nitrogen inlet tube, add 62.0 g of NMP, cool, and at 0 ° C. or lower, 16.45 g of N, N-diisopropylethylamine, followed by 1-chloro-1- (2-methoxyethoxy) -2 -29.11 g of phenylpropane was added. After reacting at 0 ° C. or less for 4 hours, the reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 29.96 g of a white solid (g-2). The solid was dissolved in deuterated DMSO, and the 1 H-NMR spectrum was measured. From the peak integration ratio of the carboxylic acid ester to the carboxylic acid, 96% of the carboxyl groups were converted to 1- (2-methoxyethoxy) -2-phenylpropoxy groups. It was found that it was replaced. The weight average molecular weight of the obtained resin was 24,400.
(Comparative Example 11) Protection of carboxyl group of polyamic acid with 1-chloro-1-ethoxyethane 125.0 g of the polyamic acid solution obtained in Synthesis Example 16 was placed in a 300 mL flask equipped with a thermometer, a stirrer, and a nitrogen introduction tube. In addition, 62.0 g of NMP was added and cooled, and at 0 ° C. or lower, 16.45 g of N, N-diisopropylethylamine was added, followed by 13.82 g of 1-chloro-1-ethoxyethane. After reacting at 0 ° C. or less for 4 hours, the reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 22.95 g of a white solid (g-14). The solid was dissolved in deuterated DMSO and 1 H-NMR spectrum was measured. From the peak integration ratio of the carboxylic acid ester and carboxylic acid, it was found that 77% of the carboxyl groups were substituted with 1-ethoxyethyl groups. The weight average molecular weight of the obtained resin was 20,900.
(Comparative Example 12) Protection of carboxyl group of polyamic acid with 1-chloro-1-methoxy-2-methylpropane 125.0 g of the polyamic acid solution obtained in Synthesis Example 16 was equipped with a thermometer, stirrer and nitrogen introduction tube. Then, 62.0 g of NMP was added and cooled, and 16.45 g of N, N-diisopropylethylamine was added at 0 ° C. or lower, followed by 15.60 g of 1-chloro-1-methoxy-2-methylpropane. After reacting at 0 ° C. or lower for 4 hours, the reaction solution was added to 1.5 L of isopropanol, and the precipitated solid was collected by filtration and dried to obtain 23.77 g of a white solid (g-15). The solid was dissolved in heavy DMSO and 1 H-NMR spectrum was measured. From the peak integral ratio of carboxylic acid ester and carboxylic acid, 89% of the carboxyl groups were substituted with 1-methoxy-2-methylpropyl groups. I understood. The weight average molecular weight of the obtained resin was 21,300.
(合成例17)ポリヒドロキシアミドの合成
 攪拌機、温度計を備えたフラスコに、4,4’-ジカルボキシフェニルエーテル129g、N-メチルピロリドン700mLを仕込み、フラスコを5℃に冷却した後、塩化チオニル59.4gを滴下し、1時間反応させて、4,4’-ジフェニルエーテルジカルボン酸クロリドの溶液を得た。次いで、攪拌機、温度計、冷却管を備えたフラスコに、N-メチルピロリドン600mLを仕込み、2,2’-ビス(3-アミノ-4-ヒドロキシフェニル)ヘキサフルオロプロパン153.6gを添加し、攪拌溶解した後、ピリジン158gを添加し、温度を0~5℃に保ちながら、4,4’-ジフェニルエーテルジカルボン酸クロリドの溶液を1時間で滴下した後、1時間攪拌を続けた。溶液を20Lの水に投入し、析出物を回収、洗浄した後、減圧乾燥してポリヒドロキシアミドを得た。得られたポリヒドロキシアミドの重量平均分子量は18,000であった。
(実施例24)1-クロロ-1-メトキシ-2-フェニルプロパンによるポリヒドロキシアミドのヒドロキシル基の保護
 攪拌機、温度計を備えたフラスコに、上記で得られたポリヒドロキシアミドを20g、酢酸エチル200gを仕込み、攪拌溶解した後、1-クロロ-1-メトキシ-2-フェニルプロパン99.4gを添加し、次いでトリエチルアミン20.5g室温下で1時間攪拌を継続した。その後、反応溶液を分液ロートに移し、有機相と水相に分取した。有機相をエバポレーターで濃縮後、アセトンで希釈し純水1リットル中に投入し、析出物を回収、nーヘキサンと純水により洗浄した後、減圧乾燥して白色固体(h-1)23.8gを得た。H-NMRスペクトルより、ヒドロキシル基の38モル%が1-メトキシ-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、21,400であった。
(Synthesis Example 17) Synthesis of polyhydroxyamide A flask equipped with a stirrer and a thermometer was charged with 129 g of 4,4′-dicarboxyphenyl ether and 700 mL of N-methylpyrrolidone. After the flask was cooled to 5 ° C., thionyl chloride was added. 59.4 g was added dropwise and reacted for 1 hour to obtain a solution of 4,4′-diphenyl ether dicarboxylic acid chloride. Next, 600 mL of N-methylpyrrolidone was charged into a flask equipped with a stirrer, a thermometer, and a cooling tube, and 153.6 g of 2,2′-bis (3-amino-4-hydroxyphenyl) hexafluoropropane was added and stirred. After dissolution, 158 g of pyridine was added, and while maintaining the temperature at 0 to 5 ° C., a solution of 4,4′-diphenyl ether dicarboxylic acid chloride was added dropwise over 1 hour, and stirring was continued for 1 hour. The solution was poured into 20 L of water, and the precipitate was collected and washed, and then dried under reduced pressure to obtain polyhydroxyamide. The resulting polyhydroxyamide had a weight average molecular weight of 18,000.
(Example 24) Protection of hydroxyl group of polyhydroxyamide by 1-chloro-1-methoxy-2-phenylpropane In a flask equipped with a stirrer and a thermometer, 20 g of polyhydroxyamide obtained above and 200 g of ethyl acetate After stirring and dissolving, 99.4 g of 1-chloro-1-methoxy-2-phenylpropane was added, and then 20.5 g of triethylamine was stirred at room temperature for 1 hour. Thereafter, the reaction solution was transferred to a separating funnel and separated into an organic phase and an aqueous phase. The organic phase is concentrated with an evaporator, diluted with acetone and poured into 1 liter of pure water. The precipitate is recovered, washed with n-hexane and pure water, dried under reduced pressure, and 23.8 g of a white solid (h-1). Got. From 1 H-NMR spectrum, it was found that 38 mol% of the hydroxyl group was substituted with 1-methoxy-2-phenylpropoxy group. The weight average molecular weight of the target product, was 21,400.
(実施例25)1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパンによるポリヒドロキシアミドのヒドロキシル基の保護
 攪拌機、温度計を備えたフラスコに、上記で得られたポリヒドロキシアミドを20g、酢酸エチル200gを仕込み、攪拌溶解した後、1-クロロ-1-(2-メトキシエトキシ)-2-フェニルプロパン123.1gを添加し、次いでトリエチルアミン20.5g室温下で1時間攪拌を継続した。その後、反応溶液を分液ロートに移し、有機相と水相に分取した。有機相をエバポレーターで濃縮後、アセトンで希釈し純水1リットル中に投入し、析出物を回収、nーヘキサンと純水により洗浄した後、減圧乾燥して白色固体(h-2)24.7gを得た。H-NMRスペクトルより、ヒドロキシル基の36モル%が1-(2-メトキシエトキシ)-2-フェニルプロポキシ基で置換されていることがわかった。目的物の重量平均分子量は、22,200であった。
(Example 25) Protection of hydroxyl group of polyhydroxyamide by 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane Into a flask equipped with a stirrer and a thermometer, the polyhydroxyamide obtained above was added. 20 g of ethyl acetate and 200 g of ethyl acetate were added and dissolved by stirring. Then, 123.1 g of 1-chloro-1- (2-methoxyethoxy) -2-phenylpropane was added, and then 20.5 g of triethylamine was stirred at room temperature for 1 hour. did. Thereafter, the reaction solution was transferred to a separating funnel and separated into an organic phase and an aqueous phase. The organic phase is concentrated with an evaporator, diluted with acetone and poured into 1 liter of pure water. The precipitate is recovered, washed with n-hexane and pure water, dried under reduced pressure, and 24.7 g of a white solid (h-2). Got. From the 1 H-NMR spectrum, it was found that 36 mol% of the hydroxyl groups were substituted with 1- (2-methoxyethoxy) -2-phenylpropoxy group. The weight average molecular weight of the target product was 22,200.
(比較例13)1-クロロ-1-エトキシエタンによるポリヒドロキシアミドのヒドロキシル基の保護
 攪拌機、温度計を備えたフラスコに、上記で得られたポリヒドロキシアミドを20g、酢酸エチル200gを仕込み、攪拌溶解した後、1-クロロ-1-エトキシエタン58.5gを添加し、次いでトリエチルアミン20.5g室温下で1時間攪拌を継続した。その後、反応溶液を分液ロートに移し、有機相と水相に分取した。有機相をエバポレーターで濃縮後、アセトンで希釈し純水1リットル中に投入し、析出物を回収、nーヘキサンと純水により洗浄した後、減圧乾燥して白色固体(h-14)21.5gを得た。H-NMRスペクトルより、ヒドロキシル基の30モル%が1-エトキシエチル基で置換されていることがわかった。目的物の重量平均分子量は、19,300であった。
(Comparative Example 13) Protection of hydroxyl group of polyhydroxyamide by 1-chloro-1-ethoxyethane A flask equipped with a stirrer and a thermometer was charged with 20 g of the polyhydroxyamide obtained above and 200 g of ethyl acetate and stirred. After dissolution, 58.5 g of 1-chloro-1-ethoxyethane was added, and then 20.5 g of triethylamine was stirred for 1 hour at room temperature. Thereafter, the reaction solution was transferred to a separating funnel and separated into an organic phase and an aqueous phase. The organic phase is concentrated with an evaporator, diluted with acetone and poured into 1 liter of pure water. The precipitate is collected, washed with n-hexane and pure water, dried under reduced pressure, and 21.5 g of a white solid (h-14). Got. From the 1 H-NMR spectrum, it was found that 30 mol% of the hydroxyl groups were substituted with 1-ethoxyethyl groups. The weight average molecular weight of the target product was 19,300.
(比較例14)1-クロロ-1-メトキシ-2-メチルプロパンによるポリヒドロキシアミドのヒドロキシル基の保護
 攪拌機、温度計を備えたフラスコに、上記で得られたポリヒドロキシアミドを20g、酢酸エチル200gを仕込み、攪拌溶解した後、1-クロロ-1-メトキシ-2-メチルプロパン66.0gを添加し、次いでトリエチルアミン20.5g室温下で1時間攪拌を継続した。その後、反応溶液を分液ロートに移し、有機相と水相に分取した。有機相をエバポレーターで濃縮後、アセトンで希釈し純水1リットル中に投入し、析出物を回収、nーヘキサンと純水により洗浄した後、減圧乾燥して白色固体(h-15)22.0gを得た。H-NMRスペクトルより、ヒドロキシル基の38モル%が1-メトキシ-2-メチルプロピル基で置換されていることがわかった。目的物の重量平均分子量は、19,800であった。
 下記表2に記載の保護剤、及びそれと反応し保護され得る化合物(ないしは樹脂)を使用し、下記表2に記載の保護体を上記と同様の合成方法で製造した。なお、表中の保護率(モル%)は、H-NMRスペクトルにより測定した値である。
(Comparative Example 14) Protection of hydroxyl group of polyhydroxyamide with 1-chloro-1-methoxy-2-methylpropane In a flask equipped with a stirrer and a thermometer, 20 g of polyhydroxyamide obtained above and 200 g of ethyl acetate After stirring and dissolving, 66.0 g of 1-chloro-1-methoxy-2-methylpropane was added, and then 20.5 g of triethylamine was stirred at room temperature for 1 hour. Thereafter, the reaction solution was transferred to a separating funnel and separated into an organic phase and an aqueous phase. The organic phase is concentrated with an evaporator, diluted with acetone and poured into 1 liter of pure water. The precipitate is recovered, washed with n-hexane and pure water, dried under reduced pressure, and 22.0 g of a white solid (h-15). Got. From the 1 H-NMR spectrum, it was found that 38 mol% of the hydroxyl groups were substituted with 1-methoxy-2-methylpropyl groups. The weight average molecular weight of the target product was 19,800.
Using the protective agent described in Table 2 below and a compound (or resin) that can be protected by reacting therewith, the protective body described in Table 2 below was produced by the same synthesis method as described above. The protection ratio (mol%) in the table is a value measured by 1 H-NMR spectrum.
Figure JPOXMLDOC01-appb-T000116
Figure JPOXMLDOC01-appb-T000116
(実施例26~109及び比較例15~28)保護体の保存安定性試験
 実施例3~25、合成例14、15、比較例3~14、比較合成例3、4で得られた保護体、及び上記表2に記載の各保護体の2質量%重ジメチルスルホキシド溶液を調製し、40℃で15日間経時した。経時後のH-NMR測定から保護率を算出し、下記式より分解率を求めた。結果を表3に示す。
分解率(%)=(100-経時後の保護率(%))/調製直後の保護率(%)
(Examples 26 to 109 and Comparative Examples 15 to 28) Storage Stability Test of Protective Body Protective bodies obtained in Examples 3 to 25, Synthesis Examples 14 and 15, Comparative Examples 3 to 14, and Comparative Synthesis Examples 3 and 4 A 2% by weight heavy dimethyl sulfoxide solution of each protector described in Table 2 above was prepared and aged for 15 days at 40 ° C. The protection rate was calculated from 1 H-NMR measurement after the lapse of time, and the decomposition rate was determined from the following formula. The results are shown in Table 3.
Degradation rate (%) = (100−protection rate after aging (%)) / protection rate immediately after preparation (%)
Figure JPOXMLDOC01-appb-T000117
Figure JPOXMLDOC01-appb-T000117
 表3に示した結果から明らかなように、前記一般式(I)を満たさない保護剤を使用して保護された樹脂ないしは化合物を使用した比較例15~28は分解率が大きく、保存安定性に劣ることが分かる。
 一方、前記一般式(I)で表される保護剤を使用して保護された樹脂ないしは化合物を使用した実施例26~109は、分解率が低く保存安定性に極めて優れていることがわかる。
As is apparent from the results shown in Table 3, Comparative Examples 15 to 28 using resins or compounds protected with a protective agent that does not satisfy the general formula (I) have a high decomposition rate and storage stability. It turns out that it is inferior to.
On the other hand, it can be seen that Examples 26 to 109 using resins or compounds protected with the protective agent represented by the above general formula (I) have a low decomposition rate and extremely excellent storage stability.
(実施例110~169及び比較例29~38)感光性樹脂組成物及びパターンの形成
 下記表に示す成分を同表に示す溶媒に溶解させ、全固形分濃度25質量%とし、孔径0.1μmのポリテトラフルオロエチレン製カセット型フィルターにてろ過を行い、感光性樹脂組成物を調製した。表中において、各成分の固形分含有量を質量%として表す。
(Examples 110 to 169 and Comparative Examples 29 to 38) Formation of photosensitive resin composition and pattern The components shown in the following table were dissolved in the solvents shown in the same table to obtain a total solid concentration of 25% by mass, and a pore size of 0.1 μm. The mixture was filtered through a polytetrafluoroethylene cassette-type filter to prepare a photosensitive resin composition. In the table, the solid content of each component is expressed as mass%.
Figure JPOXMLDOC01-appb-T000118
Figure JPOXMLDOC01-appb-T000118
 表中の略語を下記に示す。
PAI-101:α-(p-トリルスルホニルオキシイミノ)-4-メトキシフェニルアセトニトリル(みどり化学株式会社製)
NAI-105:N-(トリフルオロメチルスルホニルオキシ)ナフチルジカルボキシルイミド(みどり化学株式会社製)
TESPEC:トリエトキシシリルプロピル エチルカーバメート
EOA:下記構造のアミン
Abbreviations in the table are shown below.
PAI-101: α- (p-Tolylsulfonyloxyimino) -4-methoxyphenylacetonitrile (Midori Chemical Co., Ltd.)
NAI-105: N- (trifluoromethylsulfonyloxy) naphthyl dicarboxylimide (manufactured by Midori Chemical Co., Ltd.)
TESPEC: triethoxysilylpropyl ethyl carbamate EOA: amine of the following structure
Figure JPOXMLDOC01-appb-C000119
Figure JPOXMLDOC01-appb-C000119
PF6320:(OMNOVA社製、フッ素系)
PGMEA:プロピレングリコールモノメチルエーテルアセテート
DMAc:N,N-ジメチルアセトアミド
PF6320: (made by OMNOVA, fluorine type)
PGMEA: Propylene glycol monomethyl ether acetate DMAc: N, N-dimethylacetamide
 以下の方法でパターンを形成し、パターン形状について評価した。
<パターンの形成方法>
 調製した感光性樹脂組成物を、4インチシリコンウエハ上にスピンコートし、ホットプレート上にて120℃3分間の予備乾燥を行い、膜厚5.0μmのフィルム(感光性膜)を得た。次いでi線ステッパー露光装置FPA-3000i5+(Canon(株)製)にて、1~30μmのビアホール繰り返しパターンマスクを用いてパターン露光を行った。次いで120℃3分間加熱し、2.38質量%のテトラメチルアンモニウムヒドロキシド(TMAH)水溶液にてパドル現像し、純水にてリンス処理を行った。
 実施例146~169及び比較例35~38で得られたパターンについて窒素条件下350℃60分間加熱させることで硬化レリーフパターンを得た。
<解像性>
 得られたパターン膜を測長SEM((株)日立製作所S-8840)により観察し、解像したビアホールの最小寸法が2μm未満をA、2μm以上5μm未満をB、5μm以上をCとした。A、Bを合格とした。
<感度>
 得られたパターン膜を測長SEM((株)日立製作所S-8840)により観察し、最小寸法のビアホールが解像した露光量を感度とし、100mJ/cm未満をA、100mJ/cm以上500mJ/cm未満をB、500mJ/cm以上をCとした。A、Bを合格とした。
A pattern was formed by the following method, and the pattern shape was evaluated.
<Pattern formation method>
The prepared photosensitive resin composition was spin-coated on a 4 inch silicon wafer, subjected to pre-drying of 120 ° C. 3 minutes on a hot plate to give a film thickness of 5.0μm film (photosensitive film). Next, pattern exposure was performed using an i-line stepper exposure apparatus FPA-3000i5 + (manufactured by Canon, Inc.) using a 1-30 μm via hole repeating pattern mask. Subsequently, it heated at 120 degreeC for 3 minute (s), carried out the paddle development with the 2.38 mass% tetramethylammonium hydroxide (TMAH) aqueous solution, and the rinse process was performed with the pure water.
The patterns obtained in Examples 146 to 169 and Comparative Examples 35 to 38 were heated under nitrogen conditions at 350 ° C. for 60 minutes to obtain cured relief patterns.
<Resolution>
The obtained pattern film was observed with a length measurement SEM (Hitachi, Ltd. S-8840), and the resolved via hole had a minimum dimension of less than 2 μm, A, 2 μm or more and less than 5 μm, and C, and 5 μm or more. A and B were set to pass.
<Sensitivity>
The obtained pattern film was observed with a length measurement SEM (Hitachi, Ltd. S-8840), and the exposure amount obtained by resolving the via hole having the smallest dimension was defined as sensitivity. A less than 100 mJ / cm 2 was A, 100 mJ / cm 2 or more. 500 mJ / cm 2 less than the B, and 500 mJ / cm 2 or more was C. A and B were set to pass.
 表4に示した結果から明らかなように、比較例29~38はいずれも解像性に劣り、硬化レリーフパターンについての比較例35~38については感度についても劣っていることが分かる。
 一方、実施例110~145で得られた感光性樹脂組成物により得られたパターンは、解像性及び感度のいずれにも優れていることがわかる。
 同様に、硬化レリーフパターンについての実施例146~169についても解像性及び感度のいずれにも優れていることがわかる。
As is clear from the results shown in Table 4, it can be seen that Comparative Examples 29 to 38 are all inferior in resolution, and Comparative Examples 35 to 38 with respect to the cured relief pattern are also inferior in sensitivity.
On the other hand, it can be seen that the patterns obtained from the photosensitive resin compositions obtained in Examples 110 to 145 are excellent in both resolution and sensitivity.
Similarly, it can be seen that Examples 146 to 169 of the cured relief pattern are both excellent in resolution and sensitivity.
 本発明によれば、保存安定性に優れるカルボキシル基又はヒドロキシル基の保護剤、該保護剤によりカルボキシル基又はヒドロキシル基が保護され、保存安定性に優れる樹脂、解像性及び感度に優れる前記保護された樹脂を含有する感光性樹脂組成物、該感光性樹脂組成物を用いたパターン形成材料、感光性膜、及び硬化膜、並びに該感光性樹脂組成物を用いた硬化レリーフパターンの製造方法、それにより得られた硬化レリーフパターン及び該硬化レリーフパターンを具備する半導体装置を提供することができる。 According to the present invention, a carboxyl group or hydroxyl group protecting agent having excellent storage stability, the carboxyl group or hydroxyl group being protected by the protecting agent, a resin having excellent storage stability, and the above-described protected product having excellent resolution and sensitivity. Photosensitive resin composition containing the resin, pattern forming material using the photosensitive resin composition, photosensitive film, and cured film, and method for producing a cured relief pattern using the photosensitive resin composition, The cured relief pattern obtained by the above and a semiconductor device comprising the cured relief pattern can be provided.
 本発明を詳細にまた特定の実施態様を参照して説明したが、本発明の精神と範囲を逸脱することなく様々な変更や修正を加えることができることは当業者にとって明らかである。
 本出願は、2012年03月23日出願の日本特許出願(特願2012-068198)に基づくものであり、その内容はここに参照として取り込まれる。
Although the present invention has been described in detail and with reference to specific embodiments, it will be apparent to those skilled in the art that various changes and modifications can be made without departing from the spirit and scope of the invention.
This application is based on a Japanese patent application filed on Mar. 23, 2012 (Japanese Patent Application No. 2012-068198), the contents of which are incorporated herein by reference.

Claims (17)

  1.  下記一般式(I)で表される化合物であるヒドロキシル基又はカルボキシル基の保護剤。
    Figure JPOXMLDOC01-appb-C000001

    (上記一般式中、R及びRは、各々独立に、水素原子、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。Xは前記ヒドロキシル基又はカルボキシル基の作用により脱離し得る基を表す。)
    A protective agent for a hydroxyl group or a carboxyl group, which is a compound represented by the following general formula (I).
    Figure JPOXMLDOC01-appb-C000001

    (In the above general formula, R 1 and R 2 are each independently a hydrogen atom, alkyl group, cycloalkyl group, aryl group, aralkyl group, alkoxy group, aryloxy group, acyl group, alkoxycarbonyl group, aryloxycarbonyl. Represents a group, a cyano group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom. .
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring. X represents a group capable of leaving by the action of the hydroxyl group or carboxyl group. )
  2.  前記一般式(I)で表される化合物中のR及びRの少なくとも1つがアリール基である請求項1に記載のヒドロキシル基又はカルボキシル基の保護剤。 The hydroxyl group or carboxyl group protective agent according to claim 1, wherein at least one of R 1 and R 2 in the compound represented by the general formula (I) is an aryl group.
  3.  請求項1又は2に記載の保護剤と、ヒドロキシル基又はカルボキシル基を有する化合物とを反応させることにより、下記一般式(III)で表される基を有する化合物を製造する方法。
    Figure JPOXMLDOC01-appb-C000002

    (上記一般式中、R、R及びRは、それぞれ前記一般式(I)におけるR、R及びRと同義であり、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     *は前記ヒドロキシル基又はカルボキシル基を有する化合物の前記基から-OHを除いた残基との結合部位を表す。)
    A method for producing a compound having a group represented by the following general formula (III) by reacting the protective agent according to claim 1 or 2 with a compound having a hydroxyl group or a carboxyl group.
    Figure JPOXMLDOC01-appb-C000002

    (In the above general formula, R 1 , R 2 and R 3 are respectively synonymous with R 1 , R 2 and R 3 in the general formula (I), and at least one of R 1 and R 2 is an aryl group. , An alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, or a halogen atom.
    * Represents a binding site with a residue obtained by removing —OH from the group of the compound having a hydroxyl group or a carboxyl group. )
  4.  ポリヒドロキシスチレン樹脂、ノボラック樹脂、ポリアクリル酸樹脂、ポリメタクリル酸樹脂、ポリアミック酸及びポリヒドロキシアミドからなる群より選ばれる樹脂であって、前記樹脂中のヒドロキシル基又はカルボキシル基の全て又は一部が、下記一般式(III)で表される基で置換された樹脂。
    Figure JPOXMLDOC01-appb-C000003

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
     *は上記樹脂のヒドロキシル基又はカルボキシル基から-OHを除いた残基との結合部位を表す。)
    A resin selected from the group consisting of a polyhydroxystyrene resin, a novolac resin, a polyacrylic acid resin, a polymethacrylic acid resin, a polyamic acid and a polyhydroxyamide, wherein all or part of the hydroxyl groups or carboxyl groups in the resin , resin substituted with a group represented by the following general formula (III).
    Figure JPOXMLDOC01-appb-C000003

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, Represents a group or a halogen atom, and at least one of R 1 and R 2 is an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
    * Represents a binding site with a residue obtained by removing —OH from the hydroxyl group or carboxyl group of the resin. )
  5.  下記一般式(V)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるポリヒドロキシスチレン樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシスチレン樹脂。
    Figure JPOXMLDOC01-appb-C000004

    (上記一般式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、kは0~4の整数を表す。)
    Figure JPOXMLDOC01-appb-C000005

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
     *は前記一般式(V)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
    All or part of the hydroxyl groups of the polyhydroxystyrene resin having a repeating unit represented by the following general formula (V) and having a weight average molecular weight of 1,000 to 100,000 are groups represented by the following general formula (III) Polyhydroxystyrene resin substituted with
    Figure JPOXMLDOC01-appb-C000004

    (In the above general formula, R 4 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, and k represents an integer of 0 to 4)
    Figure JPOXMLDOC01-appb-C000005

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, It represents a group or a halogen atom, at least one of R 1 and R 2, an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
    * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (V). )
  6.  下記一般式(VI)で表される繰り返し単位を有し、重量平均分子量が1000~100000であるノボラック樹脂のヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたノボラック樹脂。
    Figure JPOXMLDOC01-appb-C000006

    (上記一般式中、Rは、ハロゲン原子、ヒドロキシル基、アルコキシ基、アルキル基、アリール基又はアラルキル基を表し、mは0~3の整数を表し、R及びRは、各々独立に、水素原子、アルキル基、アリール基又はアラルキル基を表す。)
    Figure JPOXMLDOC01-appb-C000007

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。*は前記一般式(VI)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
    A repeating unit represented by the following general formula (VI), all or a portion of the hydroxyl groups of novolak resin having a weight average molecular weight of 1,000 to 100,000 is substituted with a group represented by the following general formula (III) Novolac resin.
    Figure JPOXMLDOC01-appb-C000006

    (In the above general formula, R 5 represents a halogen atom, a hydroxyl group, an alkoxy group, an alkyl group, an aryl group or an aralkyl group, m represents an integer of 0 to 3, and R 6 and R 7 each independently represents Represents a hydrogen atom, an alkyl group, an aryl group or an aralkyl group.)
    Figure JPOXMLDOC01-appb-C000007

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, It represents a group or a halogen atom, at least one of R 1 and R 2, an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring. * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (VI). )
  7.  下記一般式(VII)で表される繰り返し単位を有し、重量平均分子量が1000~100000である重合体のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアクリル酸樹脂ないしはポリメタクリル酸樹脂。
    Figure JPOXMLDOC01-appb-C000008

    (上記一般式中、Rは、水素原子又はアルキル基を表す。)
    Figure JPOXMLDOC01-appb-C000009

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
     *は前記一般式(VII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
    All or part of the carboxyl groups of the polymer having a repeating unit represented by the following general formula (VII) and having a weight average molecular weight of 1,000 to 100,000 are substituted with a group represented by the following general formula (IV) Polyacrylic acid resin or polymethacrylic acid resin.
    Figure JPOXMLDOC01-appb-C000008

    (In the above general formula, R 8 represents a hydrogen atom or an alkyl group.)
    Figure JPOXMLDOC01-appb-C000009

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, It represents a group or a halogen atom, at least one of R 1 and R 2, an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
    * Represents a binding site with a residue obtained by removing a carboxyl group from the repeating unit represented by the general formula (VII). )
  8.  下記一般式(VIII)で表される繰り返し単位を有するポリアミック酸のカルボキシル基の全て又は一部が、下記一般式(IV)で表される基で置換されたポリアミック酸。
    Figure JPOXMLDOC01-appb-C000010

    (上記一般式中、Rは4価の有機基を表し、R10は2価の有機基を表す。)
    Figure JPOXMLDOC01-appb-C000011

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
     *は前記一般式(VIII)で表される繰り返し単位からカルボキシル基を除いた残基との結合部位を表す。)
    The polyamic acid by which all or one part of the carboxyl group of the polyamic acid which has a repeating unit represented by the following general formula (VIII) was substituted by the group represented by the following general formula (IV).
    Figure JPOXMLDOC01-appb-C000010

    (In the above general formula, R 9 represents a tetravalent organic group, and R 10 represents a divalent organic group.)
    Figure JPOXMLDOC01-appb-C000011

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, It represents a group or a halogen atom, at least one of R 1 and R 2, an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
    * Represents a binding site with a residue obtained by removing a carboxyl group from the repeating unit represented by the general formula (VIII). )
  9.  下記一般式(IX)で表される繰り返し単位を有するポリヒドロキシアミドのヒドロキシル基の全て又は一部が、下記一般式(III)で表される基で置換されたポリヒドロキシアミド。
    Figure JPOXMLDOC01-appb-C000012

    (上記一般式中、R11は4価の有機基を表し、R12は2価の有機基を表す。)
    Figure JPOXMLDOC01-appb-C000013

    (上記一般式中、R及びRは、各々独立に、アルキル基、シクロアルキル基、アリール基、アラルキル基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子を表し、R及びRの少なくとも1つは、アリール基、アルコキシ基、アリールオキシ基、アシル基、アルコキシカルボニル基、アリールオキシカルボニル基、シアノ基又はハロゲン原子である。
     Rは、アルキル基、シクロアルキル基、アリール基又はアラルキル基を表す。
     R及びRが互いに結合して環を形成していてもよく、R又はRがRと結合して環を形成していてもよい。
     *は前記一般式(IX)で表される繰り返し単位からヒドロキシル基を除いた残基との結合部位を表す。)
    A polyhydroxyamide in which all or part of hydroxyl groups of a polyhydroxyamide having a repeating unit represented by the following general formula (IX) is substituted with a group represented by the following general formula (III).
    Figure JPOXMLDOC01-appb-C000012

    (In the above general formula, R 11 represents a tetravalent organic group, and R 12 represents a divalent organic group.)
    Figure JPOXMLDOC01-appb-C000013

    (In the above general formula, R 1 and R 2 are each independently an alkyl group, a cycloalkyl group, an aryl group, an aralkyl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group, It represents a group or a halogen atom, at least one of R 1 and R 2, an aryl group, an alkoxy group, an aryloxy group, an acyl group, an alkoxycarbonyl group, an aryloxycarbonyl group, a cyano group or a halogen atom.
    R 3 represents an alkyl group, a cycloalkyl group, an aryl group or an aralkyl group.
    R 1 and R 2 may be bonded to each other to form a ring, or R 1 or R 2 may be bonded to R 3 to form a ring.
    * Represents a binding site with a residue obtained by removing the hydroxyl group from the repeating unit represented by the general formula (IX). )
  10. (a)請求項4~9のいずれか1項に記載の樹脂、及び(b)活性光線又は放射線の照射により酸を発生する化合物を含有する感光性樹脂組成物。 A photosensitive resin composition comprising (a) the resin according to any one of claims 4 to 9, and (b) a compound that generates an acid upon irradiation with actinic rays or radiation.
  11.  ポジ型現像用である、請求項10に記載の感光性樹脂組成物。 The photosensitive resin composition according to claim 10, which is for positive development.
  12.  請求項10又は11に記載の感光性樹脂組成物であるパターン形成材料。 The pattern formation material which is the photosensitive resin composition of Claim 10 or 11.
  13.  請求項10又は11に記載の感光性樹脂組成物により形成される感光性膜。 A photosensitive film formed from the photosensitive resin composition according to claim 10.
  14.  請求項10又は11に記載の感光性樹脂組成物を加熱処理して得られる硬化膜。 A cured film obtained by heat-treating the photosensitive resin composition according to claim 10 or 11.
  15.  (ア)請求項13に記載の感光性膜を基板上に形成する工程、
     (イ)該感光性膜を活性光線又は放射線で露光する工程、
     (ウ)該感光性膜の露光された部分を水性アルカリ現像液で除去するように現像する工程、及び
     (エ)得られたレリーフパターンを加熱処理する工程を有する硬化レリーフパターンの製造方法。
    (A) forming the photosensitive film according to claim 13 on a substrate;
    (A) a step of exposing the photosensitive film with actinic rays or radiation;
    (C) A process for developing the photosensitive film so as to remove the exposed portion with an aqueous alkaline developer, and (d) a method for producing a cured relief pattern comprising a step of heat-treating the obtained relief pattern.
  16.  請求項15に記載の製造方法により得られた硬化レリーフパターン。 A cured relief pattern obtained by the production method according to claim 15.
  17.  請求項16に記載の硬化レリーフパターンを具備する半導体装置。 A semiconductor device comprising the cured relief pattern according to claim 16.
PCT/JP2013/058366 2012-03-23 2013-03-22 Protectant, method for producing compound protected by protectant, resin protected by protectant, photosensitive resin composition containing resin protected by protectant, pattern-forming material, photosensitive film, cured relief pattern, method for producing same, and semiconductor device WO2013141376A1 (en)

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JP2016212380A (en) * 2015-04-28 2016-12-15 富士フイルム株式会社 Photosensitive resin composition, production method of cured film, cured film, liquid crystal display device, organic electroluminescence display device and touch panel
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WO2022044521A1 (en) * 2020-08-27 2022-03-03 富士フイルム株式会社 Method for manufacturing cured product, resin composition, developing solution, method for manufacturing layered body, and method for manufacturing semiconductor device
CN116178145A (en) * 2022-12-26 2023-05-30 徐州博康信息化学品有限公司 Preparation method of fluorine-containing photoresist resin monomer and intermediate thereof

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