WO2013138090A1 - Mesure spectroscopique rapide de paramètres polarimétriques - Google Patents

Mesure spectroscopique rapide de paramètres polarimétriques Download PDF

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Publication number
WO2013138090A1
WO2013138090A1 PCT/US2013/028586 US2013028586W WO2013138090A1 WO 2013138090 A1 WO2013138090 A1 WO 2013138090A1 US 2013028586 W US2013028586 W US 2013028586W WO 2013138090 A1 WO2013138090 A1 WO 2013138090A1
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WO
WIPO (PCT)
Prior art keywords
sample
source
microplate
wells
steps
Prior art date
Application number
PCT/US2013/028586
Other languages
English (en)
Inventor
Baoliang Wang
Original Assignee
Hinds Instruments, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hinds Instruments, Inc. filed Critical Hinds Instruments, Inc.
Priority to EP13760626.5A priority Critical patent/EP2825858A4/fr
Publication of WO2013138090A1 publication Critical patent/WO2013138090A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/19—Dichroism
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne la mesure spectroscopique rapide de paramètres polarimétriques, et en particulier un procédé et un appareil permettant d'accroître fortement la vitesse de fonctionnement d'un spectromètre.
PCT/US2013/028586 2012-03-15 2013-03-01 Mesure spectroscopique rapide de paramètres polarimétriques WO2013138090A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP13760626.5A EP2825858A4 (fr) 2012-03-15 2013-03-01 Mesure spectroscopique rapide de paramètres polarimétriques

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261611072P 2012-03-15 2012-03-15
US61/611,072 2012-03-15

Publications (1)

Publication Number Publication Date
WO2013138090A1 true WO2013138090A1 (fr) 2013-09-19

Family

ID=49161661

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2013/028586 WO2013138090A1 (fr) 2012-03-15 2013-03-01 Mesure spectroscopique rapide de paramètres polarimétriques

Country Status (2)

Country Link
EP (1) EP2825858A4 (fr)
WO (1) WO2013138090A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017062644A1 (fr) * 2015-10-06 2017-04-13 Hinds Instruments, Inc. Atténuation des effets de ménisque dans une spectrométrie de dichroïsme circulaire orientée verticalement
US9683930B2 (en) 2013-05-23 2017-06-20 Hinds Instruments, Inc. Polarization properties imaging systems
US10228287B2 (en) 2014-06-27 2019-03-12 University Of Salford Enterprises Limited Measuring polarisation via a gating frequency

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010007496A1 (en) * 1998-07-27 2001-07-12 Ljl Biosystems, Inc. Apparatus and methods for spectroscopic measurements
US20040042009A1 (en) * 1996-07-24 2004-03-04 Aspnes David E. Broadband spectroscopic rotating compensator ellipsometer
US20050134849A1 (en) * 2003-02-03 2005-06-23 Beaglehole Instruments Ltd Method of performing optical measurement on a sample
US20110063617A1 (en) * 2008-04-04 2011-03-17 Hiromi Takahashi Method and Device for Measuring Circular Dichroism Spectra

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD218791A3 (de) * 1982-06-29 1985-02-13 Akad Wissenschaften Ddr Circulardichroismus (cd)-messgeraet
JP2009109439A (ja) * 2007-10-31 2009-05-21 Chiba Univ 振動円偏光二色性分光光度計、それに用いられるアタッチメント及びサンプル保持機構

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040042009A1 (en) * 1996-07-24 2004-03-04 Aspnes David E. Broadband spectroscopic rotating compensator ellipsometer
US20010007496A1 (en) * 1998-07-27 2001-07-12 Ljl Biosystems, Inc. Apparatus and methods for spectroscopic measurements
US20050134849A1 (en) * 2003-02-03 2005-06-23 Beaglehole Instruments Ltd Method of performing optical measurement on a sample
US20110063617A1 (en) * 2008-04-04 2011-03-17 Hiromi Takahashi Method and Device for Measuring Circular Dichroism Spectra

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2825858A4 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9683930B2 (en) 2013-05-23 2017-06-20 Hinds Instruments, Inc. Polarization properties imaging systems
US10168274B2 (en) 2013-05-23 2019-01-01 Hinds Instrumsnts, Inc. Polarization properties imaging systems
US10228287B2 (en) 2014-06-27 2019-03-12 University Of Salford Enterprises Limited Measuring polarisation via a gating frequency
WO2017062644A1 (fr) * 2015-10-06 2017-04-13 Hinds Instruments, Inc. Atténuation des effets de ménisque dans une spectrométrie de dichroïsme circulaire orientée verticalement
US10436644B2 (en) 2015-10-06 2019-10-08 Hinds Instruments, Inc. Mitigating meniscus effects in vertically oriented circular dichroism spectrometery

Also Published As

Publication number Publication date
EP2825858A4 (fr) 2015-11-18
EP2825858A1 (fr) 2015-01-21

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