WO2013105582A1 - Adhesive composition, adhesive tape, and method for processing wafer - Google Patents

Adhesive composition, adhesive tape, and method for processing wafer Download PDF

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Publication number
WO2013105582A1
WO2013105582A1 PCT/JP2013/050237 JP2013050237W WO2013105582A1 WO 2013105582 A1 WO2013105582 A1 WO 2013105582A1 JP 2013050237 W JP2013050237 W JP 2013050237W WO 2013105582 A1 WO2013105582 A1 WO 2013105582A1
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Prior art keywords
pressure
sensitive adhesive
adhesive composition
weight
wafer
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PCT/JP2013/050237
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French (fr)
Japanese (ja)
Inventor
亨 利根川
隆浩 麻生
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積水化学工業株式会社
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Publication of WO2013105582A1 publication Critical patent/WO2013105582A1/en

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
    • C09J11/02Non-macromolecular additives
    • C09J11/06Non-macromolecular additives organic
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J5/00Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/34Heterocyclic compounds having nitrogen in the ring
    • C08K5/3467Heterocyclic compounds having nitrogen in the ring having more than two nitrogen atoms in the ring
    • C08K5/3472Five-membered rings
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/408Additional features of adhesives in the form of films or foils characterized by the presence of essential components additives as essential feature of the adhesive layer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/416Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/50Additional features of adhesives in the form of films or foils characterized by process specific features
    • C09J2301/502Additional features of adhesives in the form of films or foils characterized by process specific features process for debonding adherents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2433/00Presence of (meth)acrylic polymer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/6834Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer

Definitions

  • the present invention relates to a pressure-sensitive adhesive composition that has high adhesive strength but can be easily peeled off and is excellent in heat resistance, a pressure-sensitive adhesive tape using the pressure-sensitive adhesive composition, and a wafer processing method using the pressure-sensitive adhesive tape About.
  • Adhesive compositions containing an adhesive component are widely used for adhesives such as adhesives, sealing agents, paints and coating agents, adhesives such as adhesive tapes and self-supporting tapes, and the like.
  • the performance required for these pressure-sensitive adhesive compositions varies depending on the application, but depending on the application, it may exhibit adhesiveness only for the required period, but may be required to be easily removed thereafter.
  • a thick film wafer cut from a high-purity silicon single crystal or the like is polished to a predetermined thickness to form a thin film wafer, and the thick film wafer is bonded to a support plate. It has been proposed to work efficiently by reinforcing.
  • An adhesive tape called a dicing tape is also used when dicing a thin film wafer ground to a predetermined thickness into individual semiconductor chips.
  • the pressure-sensitive adhesive composition used in such a semiconductor manufacturing process can be firmly bonded during the process, and can be peeled without damaging the thin film wafer or semiconductor chip obtained after the process is finished (hereinafter, It is also called “high adhesion easy peeling”).
  • TSV Three-dimensional stacking technology using a TSV (Through Si via) that has been dramatically improved in performance by stacking a plurality of semiconductor chips
  • TSV can increase the density of semiconductor mounting, has an extremely fast access speed, and is excellent in releasing heat generated during use.
  • it is necessary to perform a high-temperature processing process of 200 ° C. or higher, such as bumping a thin film wafer obtained by grinding, bump formation on the back surface, or reflow during three-dimensional lamination. It becomes. Therefore, the pressure-sensitive adhesive composition used in the TSV manufacturing process is required to have heat resistance capable of maintaining adhesion even at a high temperature of about 250 ° C. in addition to high adhesion easy peeling.
  • PTL 1 discloses a pressure-sensitive adhesive tape that uses a photo-curable pressure-sensitive adhesive that is cured by irradiation with light such as ultraviolet rays to reduce its adhesive strength. . It is said that such an adhesive tape can reliably fix the semiconductor during the processing step and can be easily peeled off by irradiating ultraviolet rays or the like.
  • the pressure-sensitive adhesive tape described in Patent Document 1 has insufficient reduction in adhesive strength after irradiation with ultraviolet rays and the like, and it has been difficult to peel the film without damaging the thin film wafer, the semiconductor chip, or the like.
  • Patent Document 2 discloses a heat-peelable pressure-sensitive adhesive sheet having a pressure-sensitive adhesive layer containing thermally expandable microspheres.
  • the heat-peelable pressure-sensitive adhesive sheet of Patent Document 2 is heated to a certain temperature or more, the thermally expandable microspheres expand, the entire pressure-sensitive adhesive layer is foamed and irregularities are formed on the surface, and the adhesion area with the adherend is reduced. Therefore, the adherend can be easily peeled off.
  • the heat-expandable microspheres are expanded by heating, and fine irregularities are generated on the pressure-sensitive adhesive surface.
  • Patent Document 3 describes a double-sided pressure-sensitive adhesive tape having an adhesive layer containing a gas generating agent that generates a gas by stimulation with an azo compound or the like.
  • gas generated from the gas generating agent is released to the interface between the surface of the tape and the adherend, and at least a part of the adherend is peeled off by the pressure.
  • the double-sided adhesive tape of patent document 3 is used, it can peel, without damaging a thin film wafer, a semiconductor chip, etc., and without the adhesive residue.
  • the double-sided pressure-sensitive adhesive tape of Patent Document 3 also has a problem in terms of heat resistance, and it has been difficult to use it in the TSV manufacturing process.
  • the TSV manufacturing process uses a pressure-sensitive adhesive containing light absorber fine particles such as carbon black, and uses laser-induced heat to decompose and separate the pressure-sensitive adhesive ( Non-patent document 1).
  • Non-patent document 1 a pressure-sensitive adhesive containing light absorber fine particles such as carbon black, and uses laser-induced heat to decompose and separate the pressure-sensitive adhesive.
  • Non-patent Document 1 there is a problem of equipment that a laser irradiation device is required, and in addition, the fine particle powder is scattered by the decomposition of the adhesive by laser irradiation, and the cleanliness of the manufacturing environment There was a problem of lowering.
  • the present invention relates to a pressure-sensitive adhesive composition that has high adhesive strength but can be easily peeled off and is excellent in heat resistance, a pressure-sensitive adhesive tape using the pressure-sensitive adhesive composition, and a wafer processing method using the pressure-sensitive adhesive tape
  • the purpose is to provide.
  • the present invention is a pressure-sensitive adhesive composition
  • a pressure-sensitive adhesive composition comprising a photocurable pressure-sensitive adhesive component, a photopolymerization initiator, and a gas generating agent that generates gas when irradiated with light, wherein the gas generating agent is a pressure-sensitive adhesive composition.
  • the pressure-sensitive adhesive composition is dispersed in the adhesive composition with a dispersion diameter of 0.05 to 37 ⁇ m.
  • the gas generating agent is dissolved in the pressure-sensitive adhesive. . This is because if the gas generating agent is not dissolved in the adhesive, when the gas is generated from the gas generating agent at the time of peeling, the gas generating agent itself becomes the core and the entire adhesive is foamed. This is because the properties of the adhesive may be reduced or adhesive residue may be caused.
  • the inventor selects an incompatible gas generator as the pressure-sensitive adhesive component and disperses the solid gas-generating agent in the pressure-sensitive adhesive composition, the inventor generates gas in the pressure-sensitive adhesive composition.
  • the heat resistance is clearly improved as compared with the case where the agent is dissolved.
  • a compound having a relatively high thermal decomposition temperature such as a bistetrazole compound or a salt thereof described later
  • high heat resistance that does not decompose even at a high temperature of about 250 ° C. can be exhibited.
  • the material state is more stable when the gas generating agent is dispersed in a solid state than when the gas generating agent is dissolved.
  • the present inventor makes the adhesive component a photo-curing type and has sufficient adhesion to the adherend after irradiation with light. It was found that the pressure-sensitive adhesive can be easily peeled without foaming, and the present invention has been completed.
  • the pressure-sensitive adhesive composition of the present invention contains a photocurable pressure-sensitive adhesive component.
  • the photocurable pressure-sensitive adhesive component (hereinafter also simply referred to as “pressure-sensitive adhesive component”) is not particularly limited, and a conventionally known one can be used. Specific examples include a photocurable pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule.
  • a photocurable pressure-sensitive adhesive is uniformly and quickly polymerized and cross-linked by light irradiation, so that the elastic modulus is remarkably increased due to polymerization and curing, and the adhesive strength is greatly reduced.
  • the polymerizable polymer is prepared by, for example, previously synthesizing a (meth) acrylic polymer having a functional group in the molecule (hereinafter referred to as a functional group-containing (meth) acrylic polymer) It can be obtained by reacting with a compound having a reactive functional group and a radical polymerizable unsaturated bond (hereinafter referred to as a functional group-containing unsaturated compound).
  • the functional group-containing (meth) acrylic polymer is an acrylic polymer having an alkyl group usually in the range of 2 to 18 as a polymer having adhesiveness at room temperature, as in the case of general (meth) acrylic polymers.
  • a functional group-containing monomer, and, if necessary, another modifying monomer copolymerizable therewith by a conventional method It is obtained.
  • the weight average molecular weight of the functional group-containing (meth) acrylic polymer is usually about 200,000 to 2,000,000.
  • Examples of the functional group-containing monomer include a carboxyl group-containing monomer such as acrylic acid and methacrylic acid; a hydroxyl group-containing monomer such as hydroxyethyl acrylate and hydroxyethyl methacrylate; and an epoxy group containing glycidyl acrylate and glycidyl methacrylate.
  • Examples of other modifying monomers that can be copolymerized include various monomers used in general (meth) acrylic polymers such as vinyl acetate, acrylonitrile, and styrene.
  • the functional group-containing unsaturated compound to be reacted with the functional group-containing (meth) acrylic polymer is the same as the functional group-containing monomer described above according to the functional group of the functional group-containing (meth) acrylic polymer. it can.
  • the functional group of the functional group-containing (meth) acrylic polymer is a carboxyl group
  • an epoxy group-containing monomer or an isocyanate group-containing monomer is used
  • the functional group is a hydroxyl group
  • an isocyanate group-containing monomer is used.
  • the functional group is an epoxy group
  • a carboxyl group-containing monomer or an amide group-containing monomer such as acrylamide is used
  • the functional group is an amino group, an epoxy group-containing monomer is used.
  • the (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule may be used in combination with a polyfunctional oligomer or monomer.
  • the polyfunctional oligomer or monomer preferably has a molecular weight of 10,000 or less, and more preferably has a molecular weight of 5, so that the three-dimensional network of the pressure-sensitive adhesive layer can be efficiently formed by heating or light irradiation. 000 or less and the number of radically polymerizable unsaturated bonds in the molecule is 2 to 20.
  • polyfunctional oligomers or monomers for example, trimethylolpropane triacrylate, tetramethylolmethane tetraacrylate, pentaerythritol triacrylate, pentaerythritol tetraacrylate, dipentaerythritol monohydroxypentaacrylate, dipentaerythritol hexaacrylate Or the above-mentioned methacrylates etc. are mentioned.
  • Other examples include 1,4-butylene glycol diacrylate, 1,6-hexanediol diacrylate, polyethylene glycol diacrylate, commercially available oligoester acrylate, and methacrylates similar to those described above. These polyfunctional oligomers or monomers may be used alone or in combination of two or more.
  • the pressure-sensitive adhesive composition of the present invention contains a photopolymerization initiator.
  • the photopolymerization initiator include those activated by irradiation with light having a wavelength of 250 to 800 nm.
  • Examples of such a photopolymerization initiator include acetophenone derivative compounds such as methoxyacetophenone.
  • Benzoin ether compounds such as benzoin propyl ether and benzoin isobutyl ether; ketal derivative compounds such as benzyldimethyl ketal and acetophenone diethyl ketal; phosphine oxide derivative compounds; bis ( ⁇ 5-cyclopentadienyl) titanocene derivative compounds, benzophenone, Michler's ketone , Chlorothioxanthone, dodecylthioxanthone, dimethylthioxanthone, diethylthioxanthone, ⁇ -hydroxycyclohexyl phenyl ketone, 2-hydroxymethylphenyl pro Examples thereof include photo radical polymerization initiators such as bread. These photoinitiators may be used independently and 2 or more types may be used together.
  • the pressure-sensitive adhesive composition of the present invention contains a gas generating agent that generates gas when irradiated with light.
  • the gas generating agent is incompatible with the photocurable pressure-sensitive adhesive component and is dispersed in a solid state in the pressure-sensitive adhesive composition.
  • the pressure-sensitive adhesive composition of the present invention can exhibit higher heat resistance than when the gas generating agent is dissolved.
  • being incompatible means that particles of 0.005 ⁇ m or more can be observed when an adhesive composition is prepared, cured at 40 ° C. for 2 days, and then observed with an electron microscope or the like. means.
  • the gas generating agent is not particularly limited as long as it is incompatible with the photocurable pressure-sensitive adhesive component.
  • the photocurable pressure-sensitive adhesive component is a photocurable pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule
  • examples include tetrazole compounds or salts thereof, triazole compounds or salts thereof, azo compounds, azide compounds, xanthone acetic acid, and carbonates.
  • These gas generating agents may be used independently and may use 2 or more types together. Of these, a tetrazole compound or a salt thereof, or a triazole compound or a salt thereof is preferable.
  • a bistetrazole compound or a salt thereof which is a kind of a tetrazole compound or a salt thereof, is particularly preferable since it has a high heat resistance and can exhibit a high heat resistance that does not decompose even at a high temperature of about 250 ° C.
  • Examples of the tetrazole compound include tetrazole compounds represented by the following general formulas (1) to (3).
  • Examples of the salt of the tetrazole compound include tetrazole compounds represented by the following general formulas (1) to (3) and basic compounds such as amines, hydrazine compounds, quaternary ammonium hydroxide salts, and phosphine compounds. Examples thereof include salts represented by the following general formulas (1 ′) to (3 ′) prepared by mixing in a container.
  • R 1 and R 2 represent hydrogen, a hydroxyl group, an amino group, or an alkyl group having 1 to 7 carbon atoms, an alkene group, a phenyl group, or a mercapto group.
  • the alkyl group having 1 to 7 carbon atoms, alkene group, phenyl group or mercapto group may be substituted.
  • examples of the substituent include an amino group, an alkyl group, an alkene group, a phenyl group, and a mercapto group.
  • Examples of the salts represented by the general formulas (1 ') to (3') include metal salts such as sodium salts, potassium salts, zinc salts, copper salts, iron salts, ammonium salts, guanidine salts, and the like.
  • the maximum value of the molar extinction coefficient at a wavelength of 250 to 400 nm (hereinafter, “ ⁇ max (250-400)”) is 100 or more, and the weight residual ratio when heated from 100 ° C. to 200 ° C. measured using a thermobalance (hereinafter simply referred to as “weight residual ratio”).
  • weight residual ratio when the tetrazole compound or salt thereof is 80% or more, the heat resistance is extremely excellent, and even when light is irradiated using a light source having a relatively small output such as ultraviolet light or white light. Gas (nitrogen gas) can be easily generated.
  • a tetrazole compound or a salt thereof having a maximum molar extinction coefficient at a wavelength of 270 to 400 nm (hereinafter also referred to as “ ⁇ max (270-400)”) of 100 or more is preferable.
  • ⁇ max (250-400) is 100 or more
  • ⁇ max (270- 400) is 100 or more and the weight residual ratio is 80% or more
  • 5-phenyl-1H-tetrazole (401 is ⁇ max (250-400)
  • 401 is ⁇ max (270-400) 401
  • Weight residual ratio is 98%)
  • 4,5 ditetrazolyl- [1,2,3] triazole ( ⁇ max (250-400) is 629
  • ⁇ max (270-400) is 605, weight residual ratio is 85%)
  • 1 -(P-Ethoxyphenyl) -5-mercaptotetrazole ( ⁇ max (250-400) is 718
  • ⁇ max (270-400) is 718
  • weight residual rate is 83 %)
  • 1- (4-benzamide) -5-mercaptotetrazole ( ⁇ max (250-400) is 7
  • ⁇ max (270-400) is less than 100.
  • the tetrazole compound or salt thereof in which (250-400) is 100 or more and the weight residual ratio is 80% or more is, for example, a bistetrazole piperazine salt ( ⁇ max (250-400) is 606, weight residual ratio is 98%) Bistetrazole ammonium salt ( ⁇ max (250-400) is 473, weight residual rate is 99%), bistetrazole disodium salt ( ⁇ max (250-400) is 320, weight residual rate is 100%), bistetrazole monohydride Rate ( ⁇ max (250-400) is 402, weight residual rate is 98%), bistetrazole monoammonium ( ⁇ max 250-400) 506, weight residual rate 97%), 5-aminotetrazole monohydrate ( ⁇ max (250-400) 299, weight residual rate 83%), 5-amino
  • the molar extinction coefficient means that 10 mg of tetrazole compound or a salt thereof is weighed and dissolved in a mixed solvent of 5 mL of methyl alcohol and 5 mL of 1N sodium hydroxide aqueous solution, and a spectrophotometer (for example, Hitachi It means a value obtained by measuring an absorption spectrum in a wavelength range of 200 to 600 nm according to the following formula using U-3000) manufactured by Seisakusho and using the absorbance in the obtained absorption spectrum to calculate by the following formula.
  • a spectrophotometer for example, Hitachi It means a value obtained by measuring an absorption spectrum in a wavelength range of 200 to 600 nm according to the following formula using U-3000
  • A / c ⁇ d (In the formula, ⁇ represents the molar extinction coefficient, A represents the absorbance, c represents the molar concentration, and d represents the cell thickness.)
  • the maximum value of the molar extinction coefficient at a wavelength of 250 to 400 nm is 100 or more as long as the molar extinction coefficient at any wavelength between the wavelengths of 250 nm and 400 nm is 100 or more. It is not necessary that a peak of the molar extinction coefficient exists between wavelengths of 250 nm to 400 nm.
  • the weight residual rate is determined by, for example, weighing 5 to 10 mg of a tetrazole compound or a salt thereof in an aluminum pan of a thermobalance (eg, TG / DTA6200 manufactured by SII), and heating in an air atmosphere (flow rate 200 mL / min). It can be obtained by measuring the weight loss rate when the temperature is raised from room temperature (30 ° C.) to 400 ° C. under the condition of 5 ° C./min. Here, “from 100 ° C.” is used to eliminate the influence of water adsorbed on the tetrazole compound or a salt thereof.
  • a thermobalance eg, TG / DTA6200 manufactured by SII
  • the gas generating agent is dispersed in the pressure-sensitive adhesive composition with a dispersion diameter of 0.05 to 37 ⁇ m. If the dispersion diameter of the gas generating agent is less than 0.05 ⁇ m, the effect of improving the heat resistance to the extent that it can withstand a heat treatment step of about 250 ° C. cannot be obtained. When the dispersion diameter of the gas generating agent exceeds 37 ⁇ m, the generation of gas when irradiated with light is non-uniform, and there is a possibility that poor peeling occurs. Moreover, the adhesive force of an adhesive composition may be impaired.
  • the pressure-sensitive adhesive layer made of the pressure-sensitive adhesive composition of the present invention is formed on at least one surface of the substrate as described later, when the dispersion diameter of the gas generating agent is larger than the thickness of the pressure-sensitive adhesive layer, The adhesive strength is significantly reduced.
  • the preferable lower limit of the dispersion diameter of the gas generating agent is 0.1 ⁇ m
  • the preferable upper limit is 10.0 ⁇ m
  • the more preferable upper limit is 5.0 ⁇ m.
  • the dispersion diameter of the gas generating agent in the pressure-sensitive adhesive composition is the D50 particle diameter measured by the following method (when the gas generating agent particles are divided into two from a certain particle diameter, the larger side). And the smaller side means an equivalent particle diameter, generally also referred to as “median diameter”). That is, the pressure-sensitive adhesive composition was placed in a solvent capable of dissolving the photocurable pressure-sensitive adhesive component, stirred for 24 hours to dissolve the pressure-sensitive adhesive component, and then dispersed for 1 hour using an ultrasonic irradiator. The solution is filtered through a 50 ⁇ m mesh to separate the gas generant particles. The separated gas generating agent is measured using a laser diffraction / scattering particle size distribution analyzer (for example, LA-950, manufactured by HORIBA), and the D50 particle size is calculated.
  • a laser diffraction / scattering particle size distribution analyzer for example, LA-950, manufactured by HORIBA
  • the content of the gas generating agent is such that a preferable lower limit with respect to 100 parts by weight of the pressure-sensitive adhesive component is 5 parts by weight, and a preferable upper limit is 50 parts by weight. If the content of the gas generating agent is less than 5 parts by weight, gas generation due to light irradiation may be reduced and sufficient peeling may not be performed. If the content exceeds 50 parts by weight, the adhesive strength is reduced. It may end up.
  • the minimum with more preferable content of the said gas generating agent is 10 weight part, and a more preferable upper limit is 30 weight part.
  • the pressure-sensitive adhesive composition of the present invention may contain a photosensitizer. Since the photosensitizer has an effect of amplifying stimulation by light on the gas generating agent, gas can be released by irradiation with less light. In addition, gas can be emitted by light in a wider wavelength region.
  • the photosensitizer is not particularly limited as long as it has excellent heat resistance.
  • Examples of the photosensitizer excellent in heat resistance include polycyclic aromatic compounds having at least one alkoxy group. Among these, a substituted alkoxy polycyclic aromatic compound having an alkoxy group partially substituted with a glycidyl group or a hydroxyl group is preferable. These photosensitizers have high resistance to sublimation and can be used at high temperatures.
  • the polycyclic aromatic compound is preferably an anthracene derivative.
  • the alkoxy group preferably has 1 to 18 carbon atoms, and more preferably has 1 to 8 carbon atoms.
  • polycyclic aromatic compound having at least one alkoxy group examples include 9,10-dimethoxyanthracene, 2-ethyl-9,10-dimethoxyanthracene, 2-tbutyl-9,10-dimethoxyanthracene, 2, 3-dimethyl-9,10-dimethoxyanthracene, 9-methoxy-10-methylanthracene, 9,10-diethoxyanthracene, 2-ethyl-9,10-diethoxyanthracene, 2-tbutyl-9,10-di Ethoxyanthracene, 2,3-dimethyl-9,10-diethoxyanthracene, 9-ethoxy-10-methylanthracene, 9,10-dipropoxyanthracene, 2-ethyl-9,10-dipropoxyanthracene, 2-tbutyl -9,10-dipropoxyanthracene, 2,3-dimethyl-9, 0-dipropoxyanthracene
  • the substituted alkoxy polycyclic aromatic compound having an alkoxy group partially substituted with a glycidyl group or a hydroxyl group includes, for example, 9,10-di (glycidyloxy) anthracene, 2-ethyl-9,10-di (glycidyloxy) ) Anthracene, 2-tbutyl-9,10-di (glycidyloxy) anthracene, 2,3-dimethyl-9,10-di (glycidyloxy) anthracene, 9- (glycidyloxy) -10-methylanthracene, 9, 10-di (2-vinyloxyethoxy) anthracene, 2-ethyl-9,10-di (2-vinyloxyethoxy) anthracene, 2-tbutyl-9,10-di (2-vinyloxyethoxy) anthracene, 2 , 3-Dimethyl-9,10-di (2-vinyloxyeth
  • the content of the photosensitizer is preferably 0.05 parts by weight and preferably 10 parts by weight with respect to 100 parts by weight of the pressure-sensitive adhesive component.
  • the content of the photosensitizer is less than 0.05 parts by weight, a sufficient sensitizing effect may not be obtained.
  • the content exceeds 10 parts by weight the residue derived from the photosensitizer increases. , Sufficient peeling may not be performed.
  • the minimum with more preferable content of the said photosensitizer is 0.1 weight part, and a more preferable upper limit is 5 weight part.
  • the pressure-sensitive adhesive composition of the present invention preferably contains a silicone compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component (hereinafter also simply referred to as “silicone compound A”). Since the silicone compound is excellent in heat resistance, the adhesive is prevented from being burnt even after a high temperature processing process of 200 ° C. or higher, and at the time of peeling, it bleeds out to the adherend interface to facilitate peeling. Thereby, it can suppress more effectively that the whole adhesive composition foams with the gas generated from the gas generating agent at the time of peeling.
  • silicone compound A silicone compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component
  • the silicone compound since the silicone compound has a functional group capable of cross-linking with the pressure-sensitive adhesive component, it is incorporated into the pressure-sensitive adhesive component by chemically reacting with the pressure-sensitive adhesive component by light irradiation at the time of peeling. Silicone compounds do not adhere and become contaminated.
  • one of the adherends is a support plate made of a glass plate, by adding a silicone compound having a functional group capable of crosslinking with the above-mentioned pressure-sensitive adhesive component, the affinity for the support plate is improved. The effect of preventing adhesive residue on the skin is also exhibited.
  • the silicone skeleton of the silicone compound A is not particularly limited, and may be either D-form or DT-form.
  • the silicone compound A preferably has the functional group at the side chain or terminal of the silicone skeleton.
  • the use of a silicone compound having a D-form silicone skeleton and having a functional group capable of crosslinking with the above-mentioned pressure-sensitive adhesive component at the end achieves both high initial adhesive strength and peeling strength after a high-temperature processing process. It is preferable because it is easy.
  • the functional group of the silicone compound A an appropriate one is selected and used according to the pressure-sensitive adhesive component.
  • the pressure-sensitive adhesive component is a photocurable pressure-sensitive adhesive mainly composed of a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule
  • (meth) A functional group capable of crosslinking with an acrylic group is selected.
  • the functional group capable of crosslinking with the (meth) acryl group is a functional group having an unsaturated double bond, and specific examples include a vinyl group, a (meth) acryl group, an allyl group, and a maleimide group. .
  • the functional group equivalent of the silicone compound A is not particularly limited, but the preferred lower limit is 1, and the preferred upper limit is 20. When the functional group equivalent is less than 1, the silicone compound A is not sufficiently taken into the pressure-sensitive adhesive component when the resulting pressure-sensitive adhesive composition is cured, and the adherend is contaminated or exhibits sufficient peelability. If it exceeds 20, sufficient adhesive strength may not be obtained.
  • a more preferable upper limit of the functional group equivalent is 10, a more preferable lower limit is 2, and a more preferable upper limit is 6.
  • the molecular weight of the silicone compound A is not particularly limited, but a preferred lower limit is 300 and a preferred upper limit is 50000. If the molecular weight is less than 300, the resulting pressure-sensitive adhesive composition may have insufficient heat resistance, and if it exceeds 50,000, mixing with the pressure-sensitive adhesive component may be difficult.
  • the more preferable lower limit of the molecular weight is 400, the more preferable upper limit is 10,000, the still more preferable lower limit is 500, and the more preferable upper limit is 5000.
  • the method of synthesizing the silicone compound A is not particularly limited. For example, by reacting a silicone resin having a SiH group with a vinyl compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component, a hydrosilylation reaction is performed. Examples thereof include a method of introducing a functional group capable of crosslinking with the pressure-sensitive adhesive component into the silicone resin, and a method of causing a condensation reaction between the siloxane compound and a siloxane compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component.
  • silicone compounds A include, for example, X-22-164, X-22-164AS, X-22-164A, X-22-164B, X-22-164C manufactured by Shin-Etsu Chemical Co., Ltd. , X-22-164E and other silicone compounds having methacrylic groups at both ends, and X-22-174DX, X-22-2426, X-22-2475 manufactured by Shin-Etsu Chemical Co., Ltd. Silicone compounds having acrylic groups such as EBECRYL350 and EBECRYL1360 manufactured by Daicel-Cytec, and silicone compounds having acrylic groups such as AC-SQ TA-100 and AC-SQ SI-20 manufactured by Toagosei Co., Ltd. MAC-SQ TM-100, MAC-SQ SI-20, MAC manufactured by Toagosei Co., Ltd. Silicone compounds having a methacryl group such as SQ HDM like.
  • the silicone compound A has particularly high heat resistance and high polarity, so that bleeding out from the pressure-sensitive adhesive composition is easy. Therefore, the following general formula (I), general formula (II), and general formula A silicone compound represented by (III) having a (meth) acryl group in the siloxane skeleton is preferred.
  • X and Y represent an integer of 0 to 1200, and R represents a functional group having an unsaturated double bond.
  • silicone compounds having a (meth) acryl group in the siloxane skeleton represented by the above general formula (I), general formula (II), or general formula (III) commercially available products are, for example, Daicel Cytec Examples thereof include EBECRYL350, EBECRYL1360 (both of which R is an acrylic group).
  • a preferable minimum is 0.1 weight% and a preferable upper limit is 30 weight%. If the content of the silicone compound A is less than 0.1% by weight, it may not be peeled from the adherend, and if it exceeds 30% by weight, the initial adhesive strength may not be obtained. The more preferable lower limit of the content of the silicone compound A is 0.2% by weight, and the more preferable upper limit is 20% by weight.
  • the content of the silicone compound A is preferably 0.5 parts by weight with respect to 100 parts by weight of the pressure-sensitive adhesive component, and 40 parts by weight with a preferred upper limit.
  • the content of the silicone compound A is less than 0.5 parts by weight, the adhesive strength may not be sufficiently reduced even when irradiated with light, and may not be peeled off from the adherend. May cause body contamination.
  • the more preferable lower limit of the content of the silicone compound A is 1 part by weight, and the more preferable upper limit is 30 parts by weight.
  • the pressure-sensitive adhesive composition of the present invention may appropriately contain various polyfunctional compounds that are blended with general pressure-sensitive adhesives such as isocyanate compounds, melamine compounds, and epoxy compounds for the purpose of adjusting the cohesive force.
  • general pressure-sensitive adhesives such as isocyanate compounds, melamine compounds, and epoxy compounds for the purpose of adjusting the cohesive force.
  • known additives such as an antistatic agent, a plasticizer, a resin, a surfactant, a wax, and a fine particle filler can be added.
  • the method for producing the pressure-sensitive adhesive composition of the present invention is not particularly limited.
  • the pressure-sensitive adhesive component, the photopolymerization initiator, the gas generating agent, and the silicone compound to be blended as necessary are mixed with a bead mill, an ultrasonic wave.
  • Examples of the method include mixing using a dispersion, a homogenizer, a high output disper, a roll mill, and the like.
  • the method of dispersing the gas generating agent in the pressure-sensitive adhesive composition with a dispersion diameter of 0.05 to 37 ⁇ m is not particularly limited, but the gas generating agent is finely pulverized in advance and classified by a sieve of each mesh size.
  • Examples thereof include a method of adjusting the particle diameter to 0.05 to 37 ⁇ m and then mixing with the above-mentioned pressure-sensitive adhesive component.
  • the dispersion method is also important for fine dispersion so that the dispersion diameter is 30 ⁇ m or less.
  • the dispersion diameter of the gas generating agent can be reduced by increasing the rotation speed of the bead mill, increasing the dispersion time, or reducing the particle diameter of the beads. Can be adjusted.
  • the pressure-sensitive adhesive composition of the present invention has a high initial adhesive strength, it can be easily peeled off by irradiation with light such as ultraviolet rays. Since the pressure-sensitive adhesive composition of the present invention is particularly excellent in heat resistance, the wafer is fixed to the support plate in the TSV manufacturing process, the wafer or chip is temporarily fixed to the support plate when passing through a reflow furnace, etc. It can also be used in applications where high-temperature treatment at 220 to 270 ° C., preferably 230 to 260 ° C.
  • the pressure-sensitive adhesive composition of the present invention can be used for various adhesive products.
  • the adhesive product is, for example, an adhesive, a pressure-sensitive adhesive, a paint, a coating agent, a sealing agent or the like using the pressure-sensitive adhesive composition of the present invention as a binder resin, or the pressure-sensitive adhesive composition of the present invention as a pressure-sensitive adhesive.
  • Examples thereof include adhesive tapes such as single-sided adhesive tape, double-sided adhesive tape, and non-support tape (self-supporting tape).
  • a support plate fixing tape at high temperature processing a fixing tape for both high temperature processing and back grinding, a fixing tape for high temperature processing and dicing, and used for further high temperature processing of individual semiconductor chips. It is suitable for a semiconductor chip temporary fixing tape or the like.
  • the base material is, for example, a sheet made of a transparent resin such as acrylic, olefin, polycarbonate, vinyl chloride, ABS, polyethylene terephthalate (PET), polyethylene naphthalate (PEN), nylon, urethane, polyimide, or a network structure. And a sheet having a hole and the like.
  • the method for producing the pressure-sensitive adhesive tape of the present invention is not particularly limited.
  • a conventionally known method such as coating the above-mentioned pressure-sensitive adhesive or the like on a base material using a doctor knife, a spin coater or the like can be used. .
  • the pressure-sensitive adhesive composition of the present invention is intended to facilitate handling of a wafer and prevent damage during processing of a wafer including a high-temperature processing process of about 250 ° C., more specifically, 220 to 270 ° C. It is suitable as an adhesive for fixing the wafer to the support plate.
  • a wafer processing method is also included in the present invention, which includes a support plate peeling step of irradiating the treated wafer with light to cure the pressure-sensitive adhesive composition and peeling the support plate from the wafer.
  • the said support plate is not specifically limited, For example, a glass plate, a quartz glass plate, a stainless steel plate etc. are mentioned.
  • a process involving heating at about 250 ° C. on the surface of the wafer fixed to the support plate is not particularly limited, and examples thereof include chemical vapor deposition (CVD), reflow, reactive ion etching (RIE), and the like.
  • Example 1 A reactor equipped with a thermometer, a stirrer, and a cooling tube was prepared. In this reactor, 94 parts by weight of 2-ethylhexyl acrylate, 1 part by weight of acrylic acid, 5 parts by weight of 2-hydroxyethyl acrylate, 0.01% lauryl mercaptan After adding parts by weight and 80 parts by weight of ethyl acetate, the reactor was heated to start refluxing. Subsequently, 0.01 parts by weight of 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane was added as a polymerization initiator in the reactor, and polymerization was started under reflux. It was.
  • the bistetrazole sodium salt was finely pulverized in advance and then classified with a sieve having a mesh size of 100 ⁇ m, and added to ethyl acetate.
  • a bead mill produced by AIMEX, RMB-08
  • the rotational speed was 1000 rpm, 12 What was disperse
  • a doctor knife so that the ethyl acetate solution of the obtained pressure-sensitive adhesive composition has a dry film thickness of 30 ⁇ m on the corona-treated surface of a transparent polyethylene naphthalate film having a thickness of 50 ⁇ m that has been corona-treated on one side.
  • the coating solution was dried by heating at 110 ° C. for 5 minutes. Thereafter, static curing was performed at 40 ° C. for 3 days to obtain an adhesive tape.
  • the obtained adhesive tape was cut finely. 1 g of the cut adhesive tape is placed in 5 mL of a solvent capable of dissolving the acrylic copolymer, and stirred for 24 hours to dissolve the adhesive component, and then an ultrasonic irradiator (manufactured by ASONE, VS-100III) is used. Then, the solution dispersed for 1 hour was filtered through a 50 ⁇ m mesh to separate particles of bistetrazole sodium salt. When the separated bistetrazole sodium salt was measured using a laser diffraction / scattering particle size distribution analyzer (HORIBA, LA-950), the dispersion diameter of bistetrazole sodium salt (D50 particle size) was 0.7 ⁇ m. Met.
  • HORIBA laser diffraction / scattering particle size distribution analyzer
  • Example 2 An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that bistetrazole ammonium salt was blended instead of bistetrazole sodium salt.
  • the bistetrazole ammonium salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m, and the mixture was added to ethyl acetate.
  • a bead mill produced by AIMEX, RMB-08
  • Example 3 An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that a bistetrazole piperazine salt was added instead of the bistetrazole sodium salt.
  • the bistetrazole piperazine salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m, and the mixture was added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse
  • Example 4 As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m was added to ethyl acetate, and a bead mill (produced by AIMEX, RMB-08) was used at a rotational speed of 1000 rpm for 24 hours. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used. When the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated
  • Example 5 As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was rotated at 1500 rpm for 30 hours. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used. With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 0.1 ⁇ m.
  • Example 6 As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m was added to ethyl acetate, and the mixture was rotated at 3000 rpm for 48 hours using a bead mill (RIM-08 manufactured by AIMEX). An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used. With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 0.05 ⁇ m.
  • Example 7 As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was used at a rotational speed of 1000 rpm for 30 minutes. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used. About the obtained adhesive tape, when the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated
  • Example 8 Bistetrazole sodium salt, which was finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m, was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was used for 15 minutes at a rotation speed of 1000 rpm.
  • An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
  • the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated
  • Example 9 An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that the bistetrazole sodium salt was finely pulverized in advance and then classified with a sieve having a mesh size of 40 ⁇ m. With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 37 ⁇ m.
  • Example 10 An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that 5- (m-aminophenyl) tetrazole was added instead of bistetrazole sodium salt.
  • the 5- (m-aminophenyl) tetrazole used was finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m.
  • the dispersion diameter (D50 particle diameter) of 5- (m-aminophenyl) tetrazole was determined in the same manner as in Example 1. As a result, it was 9 ⁇ m.
  • the resin solid content of 100 parts by weight of the ethyl acetate solution containing the acrylic copolymer thus obtained is reacted by adding 3.5 parts by weight of 2-isocyanatoethyl methacrylate, and further the resin of the ethyl acetate solution after the reaction.
  • a photopolymerization initiator (Esacure One, manufactured by Nippon Siebel Hegner)
  • EBECRYL 350 manufactured by Daicel Cytec
  • 5- (m-aminophenyl) tetrazole 20 with respect to 100 parts by weight of solid content Part by weight and 0.5 part by weight of a polyisocyanate-based crosslinking agent (Coronate L45, manufactured by Nippon Polyurethane Co., Ltd.) were mixed to prepare an ethyl acetate solution of the pressure-sensitive adhesive composition.
  • a doctor knife so that the ethyl acetate solution of the obtained pressure-sensitive adhesive composition has a dry film thickness of 30 ⁇ m on the corona-treated surface of a transparent polyethylene naphthalate film having a thickness of 50 ⁇ m that has been corona-treated on one side.
  • the coating solution was dried by heating at 110 ° C. for 5 minutes. Thereafter, static curing was performed at 40 ° C. for 3 days to obtain an adhesive tape.
  • 5- (m-aminophenyl) tetrazole was dissolved in the pressure-sensitive adhesive layer, and no particles were observed.
  • the bistetrazole ammonium salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 ⁇ m, and the mixture was added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse

Abstract

The purpose of the present invention is to provide: an adhesive composition having excellent heat resistance, which has high adhesive power and can still be easily released; an adhesive tape which uses the adhesive composition; and a method for processing a wafer, wherein the adhesive tape is used. The present invention is an adhesive composition which contains a photocurable adhesive component, a photopolymerization initiator, and a gas generator that generates a gas when irradiated with light. The gas generator is dispersed in the adhesive composition with a dispersion diameter of 0.05-37 μm.

Description

粘着剤組成物、粘着テープ、及び、ウエハの処理方法Adhesive composition, adhesive tape, and wafer processing method
本発明は、高い接着力を有する一方で容易に剥離でき、かつ、耐熱性に優れる粘着剤組成物、該粘着剤組成物を用いた粘着テープ、及び、該粘着テープを用いたウエハの処理方法に関する。 The present invention relates to a pressure-sensitive adhesive composition that has high adhesive strength but can be easily peeled off and is excellent in heat resistance, a pressure-sensitive adhesive tape using the pressure-sensitive adhesive composition, and a wafer processing method using the pressure-sensitive adhesive tape About.
粘着剤成分を含有する粘着剤組成物は、粘着剤、シーリング剤、塗料、コーティング剤等のバインダー剤、粘着テープ又は自立テープ等の粘着剤等に広く用いられている。
これらの粘着剤組成物に求められる性能はその用途により様々であるが、用途によっては、必要な間だけ接着性を示すがその後は容易に剥がせることが要求されることがある。
Adhesive compositions containing an adhesive component are widely used for adhesives such as adhesives, sealing agents, paints and coating agents, adhesives such as adhesive tapes and self-supporting tapes, and the like.
The performance required for these pressure-sensitive adhesive compositions varies depending on the application, but depending on the application, it may exhibit adhesiveness only for the required period, but may be required to be easily removed thereafter.
例えば、半導体チップの製造工程において、高純度なシリコン単結晶等から切り出した厚膜ウエハを所定の厚さにまで研磨して薄膜ウエハとする工程等において、厚膜ウエハを支持板に接着して補強することにより、効率よく作業を進めることが提案されている。また、所定の厚さに研削された薄膜ウエハを個々の半導体チップにダイシングする際にも、ダイシングテープと呼ばれる粘着テープが用いられる。このような半導体の製造工程に用いる粘着剤組成物には、工程中には強固に接着する一方で、工程終了後には得られた薄膜ウエハや半導体チップ等を損傷することなく剥離できること(以下、「高接着易剥離」ともいう。)が求められる。 For example, in a semiconductor chip manufacturing process, a thick film wafer cut from a high-purity silicon single crystal or the like is polished to a predetermined thickness to form a thin film wafer, and the thick film wafer is bonded to a support plate. It has been proposed to work efficiently by reinforcing. An adhesive tape called a dicing tape is also used when dicing a thin film wafer ground to a predetermined thickness into individual semiconductor chips. The pressure-sensitive adhesive composition used in such a semiconductor manufacturing process can be firmly bonded during the process, and can be peeled without damaging the thin film wafer or semiconductor chip obtained after the process is finished (hereinafter, It is also called “high adhesion easy peeling”).
次世代の技術として、複数の半導体チップを積層させてデバイスを飛躍的に高性能化、小型化したTSV(Si貫通ビヤ/Through Si via)を使った3次元積層技術が注目されている。TSVは、半導体実装の高密度化が可能であり、アクセススピードが飛躍的に速く、使用中に発生する熱の放出にも優れる。
このようなTSVの製造では、研削して得た薄膜ウエハをバンピングしたり、裏面にバンプ形成したり、3次元積層時にリフローを行ったりする等の200℃以上の高温処理プロセスを行うことが必要となる。従って、TSVの製造工程に用いる粘着剤組成物には、高接着易剥離に加えて、250℃程度の高温下でも接着性を維持できる耐熱性が求められる。
As a next-generation technology, a three-dimensional stacking technology using a TSV (Through Si via) that has been dramatically improved in performance by stacking a plurality of semiconductor chips has attracted attention. TSV can increase the density of semiconductor mounting, has an extremely fast access speed, and is excellent in releasing heat generated during use.
In manufacturing such a TSV, it is necessary to perform a high-temperature processing process of 200 ° C. or higher, such as bumping a thin film wafer obtained by grinding, bump formation on the back surface, or reflow during three-dimensional lamination. It becomes. Therefore, the pressure-sensitive adhesive composition used in the TSV manufacturing process is required to have heat resistance capable of maintaining adhesion even at a high temperature of about 250 ° C. in addition to high adhesion easy peeling.
高接着易剥離を実現した粘着剤組成物として特許文献1には、紫外線等の光を照射することにより硬化して粘着力が低下する光硬化型粘着剤を用いた粘着テープが開示されている。このような粘着テープは、加工工程中には確実に半導体を固定できるとともに、紫外線等を照射することにより容易に剥離することができるとされている。しかしながら特許文献1に記載された粘着テープでは、紫外線等を照射した後の粘着力の低下が不充分であり、薄膜ウエハや半導体チップ等を損傷することなく剥離するのは困難であった。 As a pressure-sensitive adhesive composition that achieves high adhesion and easy peeling, PTL 1 discloses a pressure-sensitive adhesive tape that uses a photo-curable pressure-sensitive adhesive that is cured by irradiation with light such as ultraviolet rays to reduce its adhesive strength. . It is said that such an adhesive tape can reliably fix the semiconductor during the processing step and can be easily peeled off by irradiating ultraviolet rays or the like. However, the pressure-sensitive adhesive tape described in Patent Document 1 has insufficient reduction in adhesive strength after irradiation with ultraviolet rays and the like, and it has been difficult to peel the film without damaging the thin film wafer, the semiconductor chip, or the like.
特許文献2には、熱膨張性微小球を含有する粘着層を有する加熱剥離型粘着シートが開示されている。特許文献2の加熱剥離型粘着シートを一定の温度以上に加熱すると、熱膨張性微小球が膨張して粘着層全体が発泡して表面に凹凸が形成され、被着体との接着面積が減少することから、容易に被着体を剥離することができる。しかしながら特許文献2に記載された加熱剥離型粘着シートでは、加熱して熱膨張性微小球が膨張し、粘着剤表面に微細な凹凸が生じる。この形状変化により被着体と面で接着していたものが、膨張過程で被着体より粘着層を引き剥がす応力が発現し剥離が進行するが、微細な凹凸は被着体と点接着となり、接着力が残るため、薄膜ウエハや半導体チップ等を損傷することなく剥離するのは困難であった。また、剥離した被着体の表面に糊残りするという問題もあった。更に、比較的耐熱性の高い熱膨張性微小球を用いた場合でも、せいぜい130℃程度の耐熱性しかなく、TSVの製造工程に用いることは困難であった。 Patent Document 2 discloses a heat-peelable pressure-sensitive adhesive sheet having a pressure-sensitive adhesive layer containing thermally expandable microspheres. When the heat-peelable pressure-sensitive adhesive sheet of Patent Document 2 is heated to a certain temperature or more, the thermally expandable microspheres expand, the entire pressure-sensitive adhesive layer is foamed and irregularities are formed on the surface, and the adhesion area with the adherend is reduced. Therefore, the adherend can be easily peeled off. However, in the heat-peelable pressure-sensitive adhesive sheet described in Patent Document 2, the heat-expandable microspheres are expanded by heating, and fine irregularities are generated on the pressure-sensitive adhesive surface. The surface that adheres to the adherend due to this shape change develops stress that peels off the adhesive layer from the adherend during the expansion process, and the peeling progresses, but the fine irregularities become point adherence to the adherend. Since the adhesive force remains, it is difficult to peel the thin film wafer or the semiconductor chip without damaging them. In addition, there is also a problem that glue remains on the surface of the peeled adherend. Furthermore, even when heat-expandable microspheres having relatively high heat resistance are used, they have only heat resistance of about 130 ° C. and are difficult to use in the TSV manufacturing process.
特許文献3には、アゾ化合物等の刺激により気体を発生する気体発生剤を含有する粘着層を有する両面粘着テープが記載されている。特許文献3の両面粘着テープに刺激を与えると、気体発生剤から発生した気体がテープの表面と被着体との界面に放出され、その圧力によって被着体の少なくとも一部が剥離される。特許文献3の両面粘着テープを用いれば、薄膜ウエハや半導体チップ等を損傷することなく、かつ、糊残りもすることなく剥離できる。しかしながら、特許文献3の両面粘着テープも耐熱性の点では問題があり、TSVの製造工程に用いることは困難であった。 Patent Document 3 describes a double-sided pressure-sensitive adhesive tape having an adhesive layer containing a gas generating agent that generates a gas by stimulation with an azo compound or the like. When the double-sided pressure-sensitive adhesive tape of Patent Document 3 is stimulated, gas generated from the gas generating agent is released to the interface between the surface of the tape and the adherend, and at least a part of the adherend is peeled off by the pressure. If the double-sided adhesive tape of patent document 3 is used, it can peel, without damaging a thin film wafer, a semiconductor chip, etc., and without the adhesive residue. However, the double-sided pressure-sensitive adhesive tape of Patent Document 3 also has a problem in terms of heat resistance, and it has been difficult to use it in the TSV manufacturing process.
現在のところTSVの製造工程では、カーボンブラックのような光吸収体微粒子粉を含む粘粘着剤を用いて接着を行い、レーザー誘導熱を利用して粘粘着剤の分解・分離を行っている(非特許文献1)。しかしながら、非特許文献1の技術を用いるには、レーザー照射装置が必要となるという設備的な問題があることに加え、レーザー照射による粘着剤の分解によって微粒子粉が飛散し、製造環境のクリーン度を低下させるという問題があった。 At present, the TSV manufacturing process uses a pressure-sensitive adhesive containing light absorber fine particles such as carbon black, and uses laser-induced heat to decompose and separate the pressure-sensitive adhesive ( Non-patent document 1). However, in order to use the technique of Non-Patent Document 1, there is a problem of equipment that a laser irradiation device is required, and in addition, the fine particle powder is scattered by the decomposition of the adhesive by laser irradiation, and the cleanliness of the manufacturing environment There was a problem of lowering.
特開平5-32946号公報JP-A-5-32946 特開平11-166164号公報JP-A-11-166164 特開2003-231872号公報JP 2003-231872 A
本発明は、高い接着力を有する一方で容易に剥離でき、かつ、耐熱性に優れる粘着剤組成物、該粘着剤組成物を用いた粘着テープ、及び、該粘着テープを用いたウエハの処理方法を提供することを目的とする。 The present invention relates to a pressure-sensitive adhesive composition that has high adhesive strength but can be easily peeled off and is excellent in heat resistance, a pressure-sensitive adhesive tape using the pressure-sensitive adhesive composition, and a wafer processing method using the pressure-sensitive adhesive tape The purpose is to provide.
本発明は、光硬化型の粘着剤成分、光重合開始剤、及び、光を照射することにより気体を発生する気体発生剤を含有する粘着剤組成物であって、前記気体発生剤は、粘着剤組成物中に0.05~37μmの分散径で分散している粘着剤組成物である。
以下に本発明を詳述する。
The present invention is a pressure-sensitive adhesive composition comprising a photocurable pressure-sensitive adhesive component, a photopolymerization initiator, and a gas generating agent that generates gas when irradiated with light, wherein the gas generating agent is a pressure-sensitive adhesive composition. The pressure-sensitive adhesive composition is dispersed in the adhesive composition with a dispersion diameter of 0.05 to 37 μm.
The present invention is described in detail below.
特許文献3等に記載された、アゾ化合物等の刺激により気体を発生する気体発生剤を含有する粘着剤では、気体発生剤は粘着剤中に溶解していることが必須であるとされていた。これは、気体発生剤が粘着剤中に溶解していないと、剥離時に気体発生剤から気体が発生する際に、気体発生剤自体が核となって粘着剤の全体が発泡してしまい、剥離性が低下したり、糊残り等の原因となったりするためである。
しかしながら、本発明者は、粘着剤成分に非相溶の気体発生剤を選択し、粘着剤組成物中に固体状の気体発生剤を分散させた場合には、粘着剤組成物中に気体発生剤を溶解した場合に比べて、明らかに耐熱性が向上することを見出した。とりわけ、後述するビステトラゾール化合物又はその塩のように、熱分解温度が比較的高いものを用いた場合には、250℃程度の高温下でも分解しない高い耐熱性を発揮できる。これは、気体発生剤を固体状に分散させた場合には、相溶した場合に比べて物質状態が安定であるためと考えられる。
そして本発明者は、このような粘着剤成分に非相溶の気体発生剤を用いた場合でも、粘着剤成分を光硬化型のものとして、光を照射後の被着体に対する粘着力を充分に低減させた場合には、粘着剤を発泡させることなく容易に剥離可能であることを見出し、本発明を完成した。
In the pressure-sensitive adhesive containing a gas generating agent that generates a gas by stimulation of an azo compound or the like described in Patent Document 3 or the like, it is essential that the gas generating agent is dissolved in the pressure-sensitive adhesive. . This is because if the gas generating agent is not dissolved in the adhesive, when the gas is generated from the gas generating agent at the time of peeling, the gas generating agent itself becomes the core and the entire adhesive is foamed. This is because the properties of the adhesive may be reduced or adhesive residue may be caused.
However, when the inventor selects an incompatible gas generator as the pressure-sensitive adhesive component and disperses the solid gas-generating agent in the pressure-sensitive adhesive composition, the inventor generates gas in the pressure-sensitive adhesive composition. It has been found that the heat resistance is clearly improved as compared with the case where the agent is dissolved. In particular, when a compound having a relatively high thermal decomposition temperature, such as a bistetrazole compound or a salt thereof described later, high heat resistance that does not decompose even at a high temperature of about 250 ° C. can be exhibited. This is presumably because the material state is more stable when the gas generating agent is dispersed in a solid state than when the gas generating agent is dissolved.
And even when an incompatible gas generating agent is used for such an adhesive component, the present inventor makes the adhesive component a photo-curing type and has sufficient adhesion to the adherend after irradiation with light. It was found that the pressure-sensitive adhesive can be easily peeled without foaming, and the present invention has been completed.
本発明の粘着剤組成物は、光硬化型の粘着剤成分を含有する。
上記光硬化型の粘着剤成分(以下、単に「粘着剤成分」ともいう。)としては特に限定されず、従来公知のものを用いることができる。具体的には、例えば、分子内にラジカル重合性の不飽和結合を有する(メタ)アクリル酸アルキルエステル系の重合性ポリマーを含有する光硬化型粘着剤等が挙げられる。
このような光硬化型粘着剤は、光の照射により全体が均一にかつ速やかに重合架橋して一体化するため、重合硬化による弾性率の上昇が著しくなり、粘着力が大きく低下する。
The pressure-sensitive adhesive composition of the present invention contains a photocurable pressure-sensitive adhesive component.
The photocurable pressure-sensitive adhesive component (hereinafter also simply referred to as “pressure-sensitive adhesive component”) is not particularly limited, and a conventionally known one can be used. Specific examples include a photocurable pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule.
Such a photocurable pressure-sensitive adhesive is uniformly and quickly polymerized and cross-linked by light irradiation, so that the elastic modulus is remarkably increased due to polymerization and curing, and the adhesive strength is greatly reduced.
上記重合性ポリマーは、例えば、分子内に官能基を持った(メタ)アクリル系ポリマー(以下、官能基含有(メタ)アクリル系ポリマーという。)をあらかじめ合成し、分子内に上記の官能基と反応する官能基とラジカル重合性の不飽和結合とを有する化合物(以下、官能基含有不飽和化合物という。)と反応させることにより得ることができる。 The polymerizable polymer is prepared by, for example, previously synthesizing a (meth) acrylic polymer having a functional group in the molecule (hereinafter referred to as a functional group-containing (meth) acrylic polymer) It can be obtained by reacting with a compound having a reactive functional group and a radical polymerizable unsaturated bond (hereinafter referred to as a functional group-containing unsaturated compound).
上記官能基含有(メタ)アクリル系ポリマーは、常温で粘着性を有するポリマーとして、一般の(メタ)アクリル系ポリマーの場合と同様に、アルキル基の炭素数が通常2~18の範囲にあるアクリル酸アルキルエステル及び/又はメタクリル酸アルキルエステルを主モノマーとし、これと官能基含有モノマーと、更に必要に応じてこれらと共重合可能な他の改質用モノマーとを常法により共重合させることにより得られるものである。上記官能基含有(メタ)アクリル系ポリマーの重量平均分子量は通常20万~200万程度である。 The functional group-containing (meth) acrylic polymer is an acrylic polymer having an alkyl group usually in the range of 2 to 18 as a polymer having adhesiveness at room temperature, as in the case of general (meth) acrylic polymers. By copolymerizing an acid alkyl ester and / or methacrylic acid alkyl ester as a main monomer, a functional group-containing monomer, and, if necessary, another modifying monomer copolymerizable therewith by a conventional method It is obtained. The weight average molecular weight of the functional group-containing (meth) acrylic polymer is usually about 200,000 to 2,000,000.
上記官能基含有モノマーとしては、例えば、アクリル酸、メタクリル酸等のカルボキシル基含有モノマー;アクリル酸ヒドロキシエチル、メタクリル酸ヒドロキシエチル等のヒドロキシル基含有モノマー;アクリル酸グリシジル、メタクリル酸グリシジル等のエポキシ基含有モノマー;アクリル酸イソシアネートエチル、メタクリル酸イソシアネートエチル等のイソシアネート基含有モノマー;アクリル酸アミノエチル、メタクリル酸アミノエチル等のアミノ基含有モノマー等が挙げられる。
上記共重合可能な他の改質用モノマーとしては、例えば、酢酸ビニル、アクリロニトリル、スチレン等の一般の(メタ)アクリル系ポリマーに用いられている各種のモノマーが挙げられる。
Examples of the functional group-containing monomer include a carboxyl group-containing monomer such as acrylic acid and methacrylic acid; a hydroxyl group-containing monomer such as hydroxyethyl acrylate and hydroxyethyl methacrylate; and an epoxy group containing glycidyl acrylate and glycidyl methacrylate. Monomers; Isocyanate group-containing monomers such as isocyanate ethyl acrylate and isocyanate ethyl methacrylate; and amino group-containing monomers such as aminoethyl acrylate and aminoethyl methacrylate.
Examples of other modifying monomers that can be copolymerized include various monomers used in general (meth) acrylic polymers such as vinyl acetate, acrylonitrile, and styrene.
上記官能基含有(メタ)アクリル系ポリマーに反応させる官能基含有不飽和化合物としては、上記官能基含有(メタ)アクリル系ポリマーの官能基に応じて上述した官能基含有モノマーと同様のものを使用できる。例えば、上記官能基含有(メタ)アクリル系ポリマーの官能基がカルボキシル基の場合はエポキシ基含有モノマーやイソシアネート基含有モノマーが用いられ、同官能基がヒドロキシル基の場合はイソシアネート基含有モノマーが用いられ、同官能基がエポキシ基の場合はカルボキシル基含有モノマーやアクリルアミド等のアミド基含有モノマーが用いられ、同官能基がアミノ基の場合はエポキシ基含有モノマーが用いられる。 The functional group-containing unsaturated compound to be reacted with the functional group-containing (meth) acrylic polymer is the same as the functional group-containing monomer described above according to the functional group of the functional group-containing (meth) acrylic polymer. it can. For example, when the functional group of the functional group-containing (meth) acrylic polymer is a carboxyl group, an epoxy group-containing monomer or an isocyanate group-containing monomer is used, and when the functional group is a hydroxyl group, an isocyanate group-containing monomer is used. When the functional group is an epoxy group, a carboxyl group-containing monomer or an amide group-containing monomer such as acrylamide is used, and when the functional group is an amino group, an epoxy group-containing monomer is used.
上記分子内にラジカル重合性の不飽和結合を有する(メタ)アクリル酸アルキルエステル系の重合性ポリマーは、多官能オリゴマー又はモノマーを併用してもよい。
上記多官能オリゴマー又はモノマーとしては、分子量が1万以下であるものが好ましく、より好ましくは加熱又は光の照射による粘着剤層の三次元網状化が効率よくなされるように、その分子量が5,000以下でかつ分子内のラジカル重合性の不飽和結合の数が2~20個のものである。このようなより好ましい多官能オリゴマー又はモノマーとしては、例えば、トリメチロールプロパントリアクリレート、テトラメチロールメタンテトラアクリレート、ペンタエリスリトールトリアクリレート、ペンタエリスリトールテトラアクリレート、ジペンタエリスリトールモノヒドロキシペンタアクリレート、ジペンタエリスリトールヘキサアクリレート又は上記同様のメタクリレート類等が挙げられる。その他、1,4-ブチレングリコールジアクリレート、1,6-ヘキサンジオールジアクリレート、ポリエチレングリコールジアクリレート、市販のオリゴエステルアクリレート、上記同様のメタクリレート類等が挙げられる。これらの多官能オリゴマー又はモノマーは、単独で用いられてもよく、2種以上が併用されてもよい。
The (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule may be used in combination with a polyfunctional oligomer or monomer.
The polyfunctional oligomer or monomer preferably has a molecular weight of 10,000 or less, and more preferably has a molecular weight of 5, so that the three-dimensional network of the pressure-sensitive adhesive layer can be efficiently formed by heating or light irradiation. 000 or less and the number of radically polymerizable unsaturated bonds in the molecule is 2 to 20. As such more preferred polyfunctional oligomers or monomers, for example, trimethylolpropane triacrylate, tetramethylolmethane tetraacrylate, pentaerythritol triacrylate, pentaerythritol tetraacrylate, dipentaerythritol monohydroxypentaacrylate, dipentaerythritol hexaacrylate Or the above-mentioned methacrylates etc. are mentioned. Other examples include 1,4-butylene glycol diacrylate, 1,6-hexanediol diacrylate, polyethylene glycol diacrylate, commercially available oligoester acrylate, and methacrylates similar to those described above. These polyfunctional oligomers or monomers may be used alone or in combination of two or more.
本発明の粘着剤組成物は、光重合開始剤を含有する。
上記光重合開始剤としては、例えば、250~800nmの波長の光を照射することにより活性化されるものが挙げられ、このような光重合開始剤としては、例えば、メトキシアセトフェノン等のアセトフェノン誘導体化合物;ベンゾインプロピルエーテル、ベンゾインイソブチルエーテル等のベンゾインエーテル系化合物;ベンジルジメチルケタール、アセトフェノンジエチルケタール等のケタール誘導体化合物;フォスフィンオキシド誘導体化合物;ビス(η5-シクロペンタジエニル)チタノセン誘導体化合物、ベンゾフェノン、ミヒラーケトン、クロロチオキサントン、ドデシルチオキサントン、ジメチルチオキサントン、ジエチルチオキサントン、α-ヒドロキシシクロヘキシルフェニルケトン、2-ヒドロキシメチルフェニルプロパン等の光ラジカル重合開始剤が挙げられる。これらの光重合開始剤は単独で用いられてもよく、2種以上が併用されてもよい。
The pressure-sensitive adhesive composition of the present invention contains a photopolymerization initiator.
Examples of the photopolymerization initiator include those activated by irradiation with light having a wavelength of 250 to 800 nm. Examples of such a photopolymerization initiator include acetophenone derivative compounds such as methoxyacetophenone. Benzoin ether compounds such as benzoin propyl ether and benzoin isobutyl ether; ketal derivative compounds such as benzyldimethyl ketal and acetophenone diethyl ketal; phosphine oxide derivative compounds; bis (η5-cyclopentadienyl) titanocene derivative compounds, benzophenone, Michler's ketone , Chlorothioxanthone, dodecylthioxanthone, dimethylthioxanthone, diethylthioxanthone, α-hydroxycyclohexyl phenyl ketone, 2-hydroxymethylphenyl pro Examples thereof include photo radical polymerization initiators such as bread. These photoinitiators may be used independently and 2 or more types may be used together.
本発明の粘着剤組成物は、光を照射することにより気体を発生する気体発生剤を含有する。
上記気体発生剤は、上記光硬化型の粘着剤成分と非相溶であって、粘着剤組成物中に固体状に分散している。上記気体発生剤が固体状に分散していることにより、本発明の粘着剤組成物は、気体発生剤が溶解している場合に比べて高い耐熱性を発揮することができる。
なお、本明細書において非相溶であるとは、粘着剤組成物を調製し、40℃で2日間養生した後、電子顕微鏡等により観察したときに、0.005μm以上の粒子が観察できることを意味する。
The pressure-sensitive adhesive composition of the present invention contains a gas generating agent that generates gas when irradiated with light.
The gas generating agent is incompatible with the photocurable pressure-sensitive adhesive component and is dispersed in a solid state in the pressure-sensitive adhesive composition. When the gas generating agent is dispersed in a solid state, the pressure-sensitive adhesive composition of the present invention can exhibit higher heat resistance than when the gas generating agent is dissolved.
In the present specification, being incompatible means that particles of 0.005 μm or more can be observed when an adhesive composition is prepared, cured at 40 ° C. for 2 days, and then observed with an electron microscope or the like. means.
上記気体発生剤は、上記光硬化型の粘着剤成分と非相溶のものであれば特に限定されない。上記光硬化型の粘着剤成分が上記分子内にラジカル重合性の不飽和結合を有する(メタ)アクリル酸アルキルエステル系の重合性ポリマーを含有する光硬化型粘着剤である場合には、例えば、テトラゾール化合物又はその塩、トリアゾール化合物又はその塩、アゾ化合物、アジド化合物、キサントン酢酸、炭酸塩等が挙げられる。これらの気体発生剤は単独で用いてもよく、2種以上を併用してもよい。なかでも、テトラゾール化合物若しくはその塩、又は、トリアゾール化合物若しくはその塩が好ましい。テトラゾール化合物又はその塩の一種であるビステトラゾール化合物又はその塩は特に耐熱性が高く、250℃程度の高温下でも分解しない高い耐熱性を発揮できることから更に好ましい。 The gas generating agent is not particularly limited as long as it is incompatible with the photocurable pressure-sensitive adhesive component. When the photocurable pressure-sensitive adhesive component is a photocurable pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule, Examples include tetrazole compounds or salts thereof, triazole compounds or salts thereof, azo compounds, azide compounds, xanthone acetic acid, and carbonates. These gas generating agents may be used independently and may use 2 or more types together. Of these, a tetrazole compound or a salt thereof, or a triazole compound or a salt thereof is preferable. A bistetrazole compound or a salt thereof, which is a kind of a tetrazole compound or a salt thereof, is particularly preferable since it has a high heat resistance and can exhibit a high heat resistance that does not decompose even at a high temperature of about 250 ° C.
上記テトラゾール化合物は、例えば、下記一般式(1)~(3)で表されるテトラゾール化合物が挙げられる。
また、上記テトラゾール化合物の塩は、例えば、下記一般式(1)~(3)で表されるテトラゾール化合物と、アミン、ヒドラジン化合物、水酸化四級アンモニウム塩、ホスフィン化合物等の塩基性化合物とを容器中で混合して調製した、下記一般式(1’)~(3’)で表される塩が挙げられる。
Examples of the tetrazole compound include tetrazole compounds represented by the following general formulas (1) to (3).
Examples of the salt of the tetrazole compound include tetrazole compounds represented by the following general formulas (1) to (3) and basic compounds such as amines, hydrazine compounds, quaternary ammonium hydroxide salts, and phosphine compounds. Examples thereof include salts represented by the following general formulas (1 ′) to (3 ′) prepared by mixing in a container.
Figure JPOXMLDOC01-appb-C000001
Figure JPOXMLDOC01-appb-C000001
上記一般式(1)~(3)中、R、Rは、水素、水酸基、アミノ基、又は炭素数が1~7のアルキル基、アルケン基、フェニル基、メルカプト基を表す。上記炭素数が1~7のアルキル基、アルケン基、フェニル基、又は、メルカプト基は、置換されていてもよい。上記アルキル基等が置換されたものである場合、該置換基は、例えば、アミノ基、アルキル基、アルケン基、フェニル基、メルカプト基等が挙げられる。 In the above general formulas (1) to (3), R 1 and R 2 represent hydrogen, a hydroxyl group, an amino group, or an alkyl group having 1 to 7 carbon atoms, an alkene group, a phenyl group, or a mercapto group. The alkyl group having 1 to 7 carbon atoms, alkene group, phenyl group or mercapto group may be substituted. In the case where the alkyl group or the like is substituted, examples of the substituent include an amino group, an alkyl group, an alkene group, a phenyl group, and a mercapto group.
Figure JPOXMLDOC01-appb-C000002
Figure JPOXMLDOC01-appb-C000002
上記一般式(1’)~(3’)で表される塩は、例えば、ナトリウム塩、カリウム塩、亜鉛塩、銅塩、鉄塩等の金属塩やアンモニウム塩、グアニジン塩等が挙げられる。 Examples of the salts represented by the general formulas (1 ') to (3') include metal salts such as sodium salts, potassium salts, zinc salts, copper salts, iron salts, ammonium salts, guanidine salts, and the like.
上記一般式(1)~(3)や上記一般式(1’)~(3’)で表されるテトラゾール化合物又はその塩のなかでも、波長250~400nmにおけるモル吸光係数の最大値(以下、「εmax(250-400)」ともいう。)が100以上であり、かつ、熱天秤を用いて測定した100℃から200℃に加熱したときの重量残存率(以下、単に「重量残存率」ともいう。)が80%以上であるテトラゾール化合物又はその塩を用いた場合には、極めて耐熱性に優れるうえ、紫外線や白色光等の比較的出力の小さい光源を用いて光を照射した場合でも容易に気体(窒素ガス)を発生させることができる。特に、波長270~400nmにおけるモル吸光係数の最大値(以下、「εmax(270-400)」ともいう。)が100以上であるテトラゾール化合物又はその塩が好ましい。 Among the tetrazole compounds represented by the general formulas (1) to (3) and the general formulas (1 ′) to (3 ′) or salts thereof, the maximum value of the molar extinction coefficient at a wavelength of 250 to 400 nm (hereinafter, “Ε max (250-400)”) is 100 or more, and the weight residual ratio when heated from 100 ° C. to 200 ° C. measured using a thermobalance (hereinafter simply referred to as “weight residual ratio”). When the tetrazole compound or salt thereof is 80% or more, the heat resistance is extremely excellent, and even when light is irradiated using a light source having a relatively small output such as ultraviolet light or white light. Gas (nitrogen gas) can be easily generated. In particular, a tetrazole compound or a salt thereof having a maximum molar extinction coefficient at a wavelength of 270 to 400 nm (hereinafter also referred to as “ε max (270-400)”) of 100 or more is preferable.
上記一般式(1)~(3)や上記一般式(1’)~(3’)で表されるテトラゾール化合物又はその塩のなかでも、εmax(250-400)が100以上、εmax(270-400)が100以上であり、かつ、重量残存率が80%以上であるテトラゾール化合物は、例えば、5-フェニル-1H-テトラゾール(εmax(250-400)が401、εmax(270-400)が401、重量残存率が98%)、4,5ジテトラゾリル-[1,2,3]トリアゾール(εmax(250-400)が629、εmax(270-400)が605、重量残存率が85%)、1-(p-エトキシフェニル)-5-メルカプトテトラゾール(εmax(250-400)が718、εmax(270-400)が718、重量残存率が83%)、1-(4-ベンザミド)-5-メルカプトテトラゾール(εmax(250-400)が713、εmax(270-400)が713、重量残存率が82%)、5-トリルテトラゾール(εmax(250-400)が368、εmax(270-400)が368、重量残存率が99%)、2-(5-テトラゾイル)アニリン(εmax(250-400)が372、εmax(270-400)が372、重量残存率が99%)、5-(m-アミノフェニル)テトラゾール(εmax(250-400)が301、εmax(270-400)が301、重量残存率が100%)、5-アセタミドテトラゾール(εmax(250-400)が262、εmax(270-400)が258、重量残存率が100%)、N-(1Hテトラゾール-5-イル)-n-オクタンアミド(εmax(250-400)が562、εmax(270-400)が428、重量残存率が98%)、1-シクロヘキシル-5-クロロブチルテトラゾール(εmax(250-400)が304、εmax(270-400)が262、重量残存率が82%)等が挙げられる。 Among the tetrazole compounds represented by the general formulas (1) to (3) and the general formulas (1 ′) to (3 ′) or salts thereof, εmax (250-400) is 100 or more, and εmax (270- 400) is 100 or more and the weight residual ratio is 80% or more, for example, 5-phenyl-1H-tetrazole (401 is εmax (250-400), 401 is εmax (270-400) 401 , Weight residual ratio is 98%), 4,5 ditetrazolyl- [1,2,3] triazole (εmax (250-400) is 629, εmax (270-400) is 605, weight residual ratio is 85%), 1 -(P-Ethoxyphenyl) -5-mercaptotetrazole (εmax (250-400) is 718, εmax (270-400) is 718, weight residual rate is 83 %), 1- (4-benzamide) -5-mercaptotetrazole (εmax (250-400) is 713, εmax (270-400) is 713, weight residual rate is 82%), 5-tolyltetrazole (εmax (250 -400) is 368, εmax (270-400) is 368, weight residual ratio is 99%), 2- (5-tetrazoyl) aniline (εmax (250-400) is 372, εmax (270-400) is 372, Residual weight is 99%), 5- (m-aminophenyl) tetrazole (εmax (250-400) is 301, εmax (270-400) is 301, residual weight is 100%), 5-acetamidotetrazole (Εmax (250-400) is 262, εmax (270-400) is 258, weight residual rate is 100%), N- (1H tet Zol-5-yl) -n-octaneamide (εmax (250-400) is 562, εmax (270-400) is 428, weight residual rate is 98%), 1-cyclohexyl-5-chlorobutyltetrazole (εmax ( 250-400) is 304, εmax (270-400) is 262, and the weight residual ratio is 82%).
上記一般式(1)~(3)や上記一般式(1’)~(3’)で表されるテトラゾール化合物又はその塩のなかでも、εmax(270-400)は100未満であるが、εmax(250-400)が100以上、かつ、重量残存率が80%以上であるテトラゾール化合物又はその塩は、例えば、ビステトラゾールピペラジン塩(εmax(250-400)が606、重量残存率が98%)、ビステトラゾールアンモニウム塩(εmax(250-400)が473、重量残存率が99%)、ビステトラゾールジナトリウム塩(εmax(250-400)が320、重量残存率が100%)、ビステトラゾールモノハイドレート(εmax(250-400)が402、重量残存率が98%)、ビステトラゾールモノアンモニウム(εmax(250-400)が506、重量残存率が97%)、5-アミノテトラゾールモノハイドレート(εmax(250-400)が299、重量残存率が83%)、5-アミノメチル-1H-テトラゾール(εmax(250-400)が282、重量残存率が82%)、1-メチル-5-メルカプトテトラゾール(εmax(250-400)が364、εmax(270-400)が364、重量残存率が80%)等が挙げられる。 Among the tetrazole compounds represented by the general formulas (1) to (3) and the general formulas (1 ′) to (3 ′) or salts thereof, εmax (270-400) is less than 100. The tetrazole compound or salt thereof in which (250-400) is 100 or more and the weight residual ratio is 80% or more is, for example, a bistetrazole piperazine salt (εmax (250-400) is 606, weight residual ratio is 98%) Bistetrazole ammonium salt (εmax (250-400) is 473, weight residual rate is 99%), bistetrazole disodium salt (εmax (250-400) is 320, weight residual rate is 100%), bistetrazole monohydride Rate (εmax (250-400) is 402, weight residual rate is 98%), bistetrazole monoammonium (εmax 250-400) 506, weight residual rate 97%), 5-aminotetrazole monohydrate (εmax (250-400) 299, weight residual rate 83%), 5-aminomethyl-1H-tetrazole (εmax (250-400) is 282, weight residual rate is 82%), 1-methyl-5-mercaptotetrazole (εmax (250-400) is 364, εmax (270-400) is 364, weight residual rate is 80%) Etc.
本明細書において、モル吸光係数とは、10mgのテトラゾール化合物又はその塩を秤量し、5mLのメチルアルコールと5mLの1規定水酸化ナトリウム水溶液との混合溶媒に溶解し、分光光度計(例えば、日立製作所製U-3000)を用いて下記式に従い200~600nmの波長域の吸収スペクトルを測定し、得られた吸収スペクトルにおける吸光度を用いて、下記式により計算して得た値を意味する。
 ε=A/c×d
(式中εはモル吸光係数を表し、Aは吸光度を表し、cはモル濃度を表し、dはセル厚みを表す。)
なお、本明細書において、波長250~400nmにおけるモル吸光係数の最大値が100以上であるとは、波長250nm~400nmの間のいずれかの波長におけるモル吸光係数の値が100以上であればよく、波長250nm~400nmの間にモル吸光係数のピークが存在する必要はない。
In this specification, the molar extinction coefficient means that 10 mg of tetrazole compound or a salt thereof is weighed and dissolved in a mixed solvent of 5 mL of methyl alcohol and 5 mL of 1N sodium hydroxide aqueous solution, and a spectrophotometer (for example, Hitachi It means a value obtained by measuring an absorption spectrum in a wavelength range of 200 to 600 nm according to the following formula using U-3000) manufactured by Seisakusho and using the absorbance in the obtained absorption spectrum to calculate by the following formula.
ε = A / c × d
(In the formula, ε represents the molar extinction coefficient, A represents the absorbance, c represents the molar concentration, and d represents the cell thickness.)
In the present specification, the maximum value of the molar extinction coefficient at a wavelength of 250 to 400 nm is 100 or more as long as the molar extinction coefficient at any wavelength between the wavelengths of 250 nm and 400 nm is 100 or more. It is not necessary that a peak of the molar extinction coefficient exists between wavelengths of 250 nm to 400 nm.
上記重量残存率は、例えば、熱天秤(例えば、SII社製TG/DTA6200)のアルミパンに5~10mgのテトラゾール化合物又はその塩を秤量し、空気雰囲気中(流量200mL/分)、昇温速度5℃/分の条件で常温(30℃)から400℃まで昇温したときの重量減少率を測定することにより得ることができる。
なお、ここで「100℃から」としたのは、テトラゾール化合物又はその塩に吸着した水の影響を排除するためである。
The weight residual rate is determined by, for example, weighing 5 to 10 mg of a tetrazole compound or a salt thereof in an aluminum pan of a thermobalance (eg, TG / DTA6200 manufactured by SII), and heating in an air atmosphere (flow rate 200 mL / min). It can be obtained by measuring the weight loss rate when the temperature is raised from room temperature (30 ° C.) to 400 ° C. under the condition of 5 ° C./min.
Here, “from 100 ° C.” is used to eliminate the influence of water adsorbed on the tetrazole compound or a salt thereof.
上記気体発生剤は、粘着剤組成物中に0.05~37μmの分散径で分散している。上記気体発生剤の分散径が0.05μm未満であると、250℃程度の加熱処理工程に耐え得る程度の耐熱性の向上効果が得られない。上記気体発生剤の分散径が37μmを超えると、光を照射したときの気体の発生が不均一となり剥離不良が生じるおそれがある。また、粘着剤組成物の粘着力を損なうことがある。とりわけ、後述するように基材の少なくとも一方の面に本発明の粘着剤組成物からなる粘着剤層を形成した場合、上記気体発生剤の分散径が該粘着層の厚さよりも大きくなると、実質的な粘着力が著しく低下してしまう。上記気体発生剤の分散径の好ましい下限は0.1μm、好ましい上限は10.0μmであり、より好ましい上限は5.0μmである。 The gas generating agent is dispersed in the pressure-sensitive adhesive composition with a dispersion diameter of 0.05 to 37 μm. If the dispersion diameter of the gas generating agent is less than 0.05 μm, the effect of improving the heat resistance to the extent that it can withstand a heat treatment step of about 250 ° C. cannot be obtained. When the dispersion diameter of the gas generating agent exceeds 37 μm, the generation of gas when irradiated with light is non-uniform, and there is a possibility that poor peeling occurs. Moreover, the adhesive force of an adhesive composition may be impaired. In particular, when the pressure-sensitive adhesive layer made of the pressure-sensitive adhesive composition of the present invention is formed on at least one surface of the substrate as described later, when the dispersion diameter of the gas generating agent is larger than the thickness of the pressure-sensitive adhesive layer, The adhesive strength is significantly reduced. The preferable lower limit of the dispersion diameter of the gas generating agent is 0.1 μm, the preferable upper limit is 10.0 μm, and the more preferable upper limit is 5.0 μm.
なお、本明細書において粘着剤組成物中における気体発生剤の分散径は、以下の方法にて測定したD50粒子径(気体発生剤の粒子をある粒子径から2つに分けたとき、大きい側と小さい側とが等量となる粒子径を意味する。一般に「メジアン径」ともいう。)を意味する。
即ち、粘着剤組成物を上記光硬化型の粘着剤成分を溶解可能な溶媒中に入れ、24時間攪拌して粘着剤成分を溶解した後、超音波照射機を用いて1時間分散を行った溶液を50μmのメッシュにてろ過して気体発生剤の粒子を分離する。分離した気体発生剤を、レーザー回折/散乱式粒子径分布測定装置(例えば、HORIBA社製、LA-950)を用いて測定を行い、D50粒子径を算出する。
In this specification, the dispersion diameter of the gas generating agent in the pressure-sensitive adhesive composition is the D50 particle diameter measured by the following method (when the gas generating agent particles are divided into two from a certain particle diameter, the larger side). And the smaller side means an equivalent particle diameter, generally also referred to as “median diameter”).
That is, the pressure-sensitive adhesive composition was placed in a solvent capable of dissolving the photocurable pressure-sensitive adhesive component, stirred for 24 hours to dissolve the pressure-sensitive adhesive component, and then dispersed for 1 hour using an ultrasonic irradiator. The solution is filtered through a 50 μm mesh to separate the gas generant particles. The separated gas generating agent is measured using a laser diffraction / scattering particle size distribution analyzer (for example, LA-950, manufactured by HORIBA), and the D50 particle size is calculated.
上記気体発生剤の含有量は、上記粘着剤成分100重量部に対する好ましい下限が5重量部、好ましい上限が50重量部である。上記気体発生剤の含有量が5重量部未満であると、光照射による気体の発生が少なくなり充分な剥離を行うことができないことがあり、50重量部を超えると、粘着力が低下してしまうことがある。上記気体発生剤の含有量のより好ましい下限は10重量部、より好ましい上限は30重量部である。 The content of the gas generating agent is such that a preferable lower limit with respect to 100 parts by weight of the pressure-sensitive adhesive component is 5 parts by weight, and a preferable upper limit is 50 parts by weight. If the content of the gas generating agent is less than 5 parts by weight, gas generation due to light irradiation may be reduced and sufficient peeling may not be performed. If the content exceeds 50 parts by weight, the adhesive strength is reduced. It may end up. The minimum with more preferable content of the said gas generating agent is 10 weight part, and a more preferable upper limit is 30 weight part.
本発明の粘着剤組成物は、光増感剤を含有してもよい。
上記光増感剤は、上記気体発生剤への光による刺激を増幅する効果を有することから、より少ない光の照射により気体を放出させることができる。また、より広い波長領域の光により気体を放出させることができる。
The pressure-sensitive adhesive composition of the present invention may contain a photosensitizer.
Since the photosensitizer has an effect of amplifying stimulation by light on the gas generating agent, gas can be released by irradiation with less light. In addition, gas can be emitted by light in a wider wavelength region.
上記光増感剤は、耐熱性に優れるものであれば特に限定されない。
耐熱性に優れた光増感剤は、例えば、アルコキシ基を少なくとも1つ以上有する多環芳香族化合物が挙げられる。なかでも、一部がグリシジル基又は水酸基で置換されたアルコキシ基を有する置換アルコキシ多環芳香族化合物が好適である。これらの光増感剤は、耐昇華性が高く、高温下で使用することができる。
The photosensitizer is not particularly limited as long as it has excellent heat resistance.
Examples of the photosensitizer excellent in heat resistance include polycyclic aromatic compounds having at least one alkoxy group. Among these, a substituted alkoxy polycyclic aromatic compound having an alkoxy group partially substituted with a glycidyl group or a hydroxyl group is preferable. These photosensitizers have high resistance to sublimation and can be used at high temperatures.
上記多環芳香族化合物は、アントラセン誘導体が好ましい。上記アルコキシ基は、炭素数1~18のものが好ましく、炭素数1~8のものがより好ましい。 The polycyclic aromatic compound is preferably an anthracene derivative. The alkoxy group preferably has 1 to 18 carbon atoms, and more preferably has 1 to 8 carbon atoms.
上記アルコキシ基を少なくとも1つ以上有する多環芳香族化合物は、例えば、9,10-ジメトキシアントラセン、2-エチル-9,10-ジメトキシアントラセン、2-tブチル-9,10-ジメトキシアントラセン、2,3-ジメチル-9,10-ジメトキシアントラセン、9-メトキシ-10-メチルアントラセン、9,10-ジエトキシアントラセン、2-エチル-9,10-ジエトキシアントラセン、2-tブチル-9,10-ジエトキシアントラセン、2,3-ジメチル-9,10-ジエトキシアントラセン、9-エトキシ-10-メチルアントラセン、9,10-ジプロポキシアントラセン、2-エチル-9,10-ジプロポキシアントラセン、2-tブチル-9,10-ジプロポキシアントラセン、2,3-ジメチル-9,10-ジプロポキシアントラセン、9-イソプロポキシ-10-メチルアントラセン、9,10-ジブトキシアントラセン、9,10-ジベンジルオキシアントラセン、2-エチル-9,10-ジベンジルオキシアントラセン、2-tブチル-9,10-ジベンジルオキシアントラセン、2,3-ジメチル-9,10-ジベンジルオキシアントラセン、9-ベンジルオキシ-10-メチルアントラセン、9,10-ジ-α-メチルベンジルオキシアントラセン、2-エチル-9,10-ジ-α-メチルベンジルオキシアントラセン、2-tブチル-9,10-ジ-α-メチルベンジルオキシアントラセン、2,3-ジメチル-9,10-ジ-α-メチルベンジルオキシアントラセン、9-(α-メチルベンジルオキシ)-10-メチルアントラセン、9,10-ジ(2-ヒドロキシエトキシ)アントラセン、2-エチル-9,10-ジ(2-カルボキシエトキシ)アントラセン等のアントラセン誘導体等が挙げられる。 Examples of the polycyclic aromatic compound having at least one alkoxy group include 9,10-dimethoxyanthracene, 2-ethyl-9,10-dimethoxyanthracene, 2-tbutyl-9,10-dimethoxyanthracene, 2, 3-dimethyl-9,10-dimethoxyanthracene, 9-methoxy-10-methylanthracene, 9,10-diethoxyanthracene, 2-ethyl-9,10-diethoxyanthracene, 2-tbutyl-9,10-di Ethoxyanthracene, 2,3-dimethyl-9,10-diethoxyanthracene, 9-ethoxy-10-methylanthracene, 9,10-dipropoxyanthracene, 2-ethyl-9,10-dipropoxyanthracene, 2-tbutyl -9,10-dipropoxyanthracene, 2,3-dimethyl-9, 0-dipropoxyanthracene, 9-isopropoxy-10-methylanthracene, 9,10-dibutoxyanthracene, 9,10-dibenzyloxyanthracene, 2-ethyl-9,10-dibenzyloxyanthracene, 2-tbutyl -9,10-dibenzyloxyanthracene, 2,3-dimethyl-9,10-dibenzyloxyanthracene, 9-benzyloxy-10-methylanthracene, 9,10-di-α-methylbenzyloxyanthracene, 2- Ethyl-9,10-di-α-methylbenzyloxyanthracene, 2-tbutyl-9,10-di-α-methylbenzyloxyanthracene, 2,3-dimethyl-9,10-di-α-methylbenzyloxy Anthracene, 9- (α-methylbenzyloxy) -10-methylanthracase , 9,10-di (2-hydroxyethoxy) anthracene, and the like anthracene derivative such as 2-ethyl-9,10-di (2-carboxyethoxy) anthracene.
上記一部がグリシジル基又は水酸基で置換されたアルコキシ基を有する置換アルコキシ多環芳香族化合物は、例えば、9,10-ジ(グリシジルオキシ)アントラセン、2-エチル-9,10-ジ(グリシジルオキシ)アントラセン、2-tブチル-9,10-ジ(グリシジルオキシ)アントラセン、2,3-ジメチル-9,10-ジ(グリシジルオキシ)アントラセン、9-(グリシジルオキシ)-10-メチルアントラセン、9,10-ジ(2-ビニルオキシエトキシ)アントラセン、2-エチル-9,10-ジ(2-ビニルオキシエトキシ)アントラセン、2-tブチル-9,10-ジ(2-ビニルオキシエトキシ)アントラセン、2,3-ジメチル-9,10-ジ(2-ビニルオキシエトキシ)アントラセン、9-(2-ビニルオキシエトキシ)-10-メチルアントラセン、9,10-ジ(3-メチル-3-オキセタニルメトキシ)アントラセン、2-エチル-9,10-ジ(3-メチル-3-オキセタニルメメトキシ)アントラセン、2-tブチル-9,10-ジ(3-メチル-3-オキセタニルメメトキシ)アントラセン、2,3-ジメチル-9,10-ジ(3-メチル-3-オキセタニルメメトキシ)アントラセン、9-(3-メチル-3-オキセタニルメメトキシ)-10-メチルアントラセン、9,10-ジ(p-エポキシフェニルメトキシ)アントラセン、2-エチル-9,10-ジ(p-エポキシフェニルメトキシ)アントラセン、2-tブチル-9,10-ジ(p-エポキシフェニルメトキシ)アントラセン、2,3-ジメチル-9,10-ジ(p-エポキシフェニルメトキシ)アントラセン、9-(p-エポキシフェニルメトキシ)-10-メチルアントラセン、9,10-ジ(p-ビニルフェニルメトキシ)アントラセン、2-エチル-9,10-ジ(p-ビニルフェニルメトキシ)アントラセン、2-tブチル-9,1-ジ(p-ビニルフェニルメトキシ)アントラセン、2,3-ジメチル-9,10-ジ(p-ビニルフェニルメトキシ)アントラセン、9-(p-ビニルフェニルメトキシ)-10-メチルアントラセン、9,10-ジ(2-ヒドロキシエトキシ)アントラセン、9,10-ジ(2-ヒドロキシプロポキシ)アントラセン、9,10-ジ(2-ヒドロキシブトキシ)アントラセン、9,10-ジ(2-ヒドロキシ-3-ブトキシプロポキシ)アントラセン、9,10-ジ(2-ヒドロキシ-3-(2-エチルヘキシルオキシ)プロポキシ)アントラセン、9,10-ジ(2-ヒドロキシ-3-アリロキシプロポキシ)アントラセン、9,10-ジ(2-ヒドロキシ-3-フェノキシプロポキシ)アントラセン、9,10-ジ(2,3-ジヒドロキシプロポキシ)アントラセン等が挙げられる。 The substituted alkoxy polycyclic aromatic compound having an alkoxy group partially substituted with a glycidyl group or a hydroxyl group includes, for example, 9,10-di (glycidyloxy) anthracene, 2-ethyl-9,10-di (glycidyloxy) ) Anthracene, 2-tbutyl-9,10-di (glycidyloxy) anthracene, 2,3-dimethyl-9,10-di (glycidyloxy) anthracene, 9- (glycidyloxy) -10-methylanthracene, 9, 10-di (2-vinyloxyethoxy) anthracene, 2-ethyl-9,10-di (2-vinyloxyethoxy) anthracene, 2-tbutyl-9,10-di (2-vinyloxyethoxy) anthracene, 2 , 3-Dimethyl-9,10-di (2-vinyloxyethoxy) anthracene, 9- (2-vinyloxy) Ethoxy) -10-methylanthracene, 9,10-di (3-methyl-3-oxetanylmethoxy) anthracene, 2-ethyl-9,10-di (3-methyl-3-oxetanylmemethoxy) anthracene, 2-t Butyl-9,10-di (3-methyl-3-oxetanylmemethoxy) anthracene, 2,3-dimethyl-9,10-di (3-methyl-3-oxetanylmemethoxy) anthracene, 9- (3-methyl -3-Oxetanylmemethoxy) -10-methylanthracene, 9,10-di (p-epoxyphenylmethoxy) anthracene, 2-ethyl-9,10-di (p-epoxyphenylmethoxy) anthracene, 2-tbutyl- 9,10-di (p-epoxyphenylmethoxy) anthracene, 2,3-dimethyl-9,10-di (p-ethylene) Xylphenylmethoxy) anthracene, 9- (p-epoxyphenylmethoxy) -10-methylanthracene, 9,10-di (p-vinylphenylmethoxy) anthracene, 2-ethyl-9,10-di (p-vinylphenylmethoxy) ) Anthracene, 2-tbutyl-9,1-di (p-vinylphenylmethoxy) anthracene, 2,3-dimethyl-9,10-di (p-vinylphenylmethoxy) anthracene, 9- (p-vinylphenylmethoxy) ) -10-methylanthracene, 9,10-di (2-hydroxyethoxy) anthracene, 9,10-di (2-hydroxypropoxy) anthracene, 9,10-di (2-hydroxybutoxy) anthracene, 9,10- Di (2-hydroxy-3-butoxypropoxy) anthracene, 9,10-di (2-hydroxy-3- (2-ethylhexyloxy) propoxy) anthracene, 9,10-di (2-hydroxy-3-allyloxypropoxy) anthracene, 9,10-di (2-hydroxy-3-phenoxypropoxy) Anthracene, 9,10-di (2,3-dihydroxypropoxy) anthracene and the like can be mentioned.
上記光増感剤の含有量は、上記粘着剤成分100重量部に対する好ましい下限が0.05重量部、好ましい上限が10重量部である。上記光増感剤の含有量が0.05重量部未満であると、充分な増感効果が得られないことがあり、10重量部を超えると、光増感剤に由来する残存物が増え、充分な剥離を行えなくなることがある。上記光増感剤の含有量のより好ましい下限は0.1重量部、より好ましい上限は5重量部である。 The content of the photosensitizer is preferably 0.05 parts by weight and preferably 10 parts by weight with respect to 100 parts by weight of the pressure-sensitive adhesive component. When the content of the photosensitizer is less than 0.05 parts by weight, a sufficient sensitizing effect may not be obtained. When the content exceeds 10 parts by weight, the residue derived from the photosensitizer increases. , Sufficient peeling may not be performed. The minimum with more preferable content of the said photosensitizer is 0.1 weight part, and a more preferable upper limit is 5 weight part.
本発明の粘着剤組成物は、上記粘着剤成分と架橋可能な官能基を有するシリコーン化合物(以下、単に「シリコーン化合物A」ともいう。)を含有することが好ましい。
シリコーン化合物は、耐熱性に優れることから、200℃以上の高温加工プロセスを経ても粘着剤の焦げ付きを防止し、剥離時には被着体界面にブリードアウトして、剥離を容易にする。これにより、剥離時に気体発生剤から発生した気体により粘着剤組成物の全体が発泡してしまうのを、より効果的に抑制することができる。
また、シリコーン化合物が上記粘着剤成分と架橋可能な官能基を有することにより、剥離時の光照射により上記粘着剤成分と化学反応して上記粘着剤成分中に取り込まれることから、被着体にシリコーン化合物が付着して汚染することがない。また、被着体の一方がガラス板からなる支持板である場合には、上記粘着剤成分と架橋可能な官能基を有するシリコーン化合物を配合することにより支持板に対する親和性が向上し、ウエハ上への糊残りを防止する効果も発揮される。
The pressure-sensitive adhesive composition of the present invention preferably contains a silicone compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component (hereinafter also simply referred to as “silicone compound A”).
Since the silicone compound is excellent in heat resistance, the adhesive is prevented from being burnt even after a high temperature processing process of 200 ° C. or higher, and at the time of peeling, it bleeds out to the adherend interface to facilitate peeling. Thereby, it can suppress more effectively that the whole adhesive composition foams with the gas generated from the gas generating agent at the time of peeling.
In addition, since the silicone compound has a functional group capable of cross-linking with the pressure-sensitive adhesive component, it is incorporated into the pressure-sensitive adhesive component by chemically reacting with the pressure-sensitive adhesive component by light irradiation at the time of peeling. Silicone compounds do not adhere and become contaminated. In addition, when one of the adherends is a support plate made of a glass plate, by adding a silicone compound having a functional group capable of crosslinking with the above-mentioned pressure-sensitive adhesive component, the affinity for the support plate is improved. The effect of preventing adhesive residue on the skin is also exhibited.
上記シリコーン化合物Aのシリコーン骨格は特に限定はされず、D体、DT体のいずれでもよい。
上記シリコーン化合物Aは、該官能基をシリコーン骨格の側鎖又は末端に有することが好ましい。
なかでも、D体のシリコーン骨格を有し、かつ、末端に上記粘着剤成分と架橋可能な官能基を有するシリコーン化合物を用いると、高い初期粘着力と高温加工プロセス後の剥離力とを両立しやすいことから好適である。
The silicone skeleton of the silicone compound A is not particularly limited, and may be either D-form or DT-form.
The silicone compound A preferably has the functional group at the side chain or terminal of the silicone skeleton.
In particular, the use of a silicone compound having a D-form silicone skeleton and having a functional group capable of crosslinking with the above-mentioned pressure-sensitive adhesive component at the end achieves both high initial adhesive strength and peeling strength after a high-temperature processing process. It is preferable because it is easy.
上記シリコーン化合物Aの官能基は、上記粘着剤成分に応じて適当なものを選択して用いる。例えば、粘着剤成分が上記分子内にラジカル重合性の不飽和結合を有する(メタ)アクリル酸アルキルエステル系の重合性ポリマーを主成分とする光硬化型粘着剤である場合には、(メタ)アクリル基と架橋可能な官能基を選択する。
上記(メタ)アクリル基と架橋可能な官能基は、不飽和二重結合を有する官能基であり、具体的には例えば、ビニル基、(メタ)アクリル基、アリル基、マレイミド基等が挙げられる。
As the functional group of the silicone compound A, an appropriate one is selected and used according to the pressure-sensitive adhesive component. For example, when the pressure-sensitive adhesive component is a photocurable pressure-sensitive adhesive mainly composed of a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond in the molecule, (meth) A functional group capable of crosslinking with an acrylic group is selected.
The functional group capable of crosslinking with the (meth) acryl group is a functional group having an unsaturated double bond, and specific examples include a vinyl group, a (meth) acryl group, an allyl group, and a maleimide group. .
上記シリコーン化合物Aの官能基当量は特に限定されないが、好ましい下限は1、好ましい上限は20である。上記官能基当量が1未満であると、得られる粘着剤組成物の硬化時に、シリコーン化合物Aが充分に粘着剤成分に取り込まれず、被着体を汚染してしまったり、剥離性を充分に発揮できなかったりすることがあり、20を超えると、充分な粘着力が得られないことがある。上記官能基当量のより好ましい上限は10であり、より好ましい下限は2、更に好ましい上限は6である。 The functional group equivalent of the silicone compound A is not particularly limited, but the preferred lower limit is 1, and the preferred upper limit is 20. When the functional group equivalent is less than 1, the silicone compound A is not sufficiently taken into the pressure-sensitive adhesive component when the resulting pressure-sensitive adhesive composition is cured, and the adherend is contaminated or exhibits sufficient peelability. If it exceeds 20, sufficient adhesive strength may not be obtained. A more preferable upper limit of the functional group equivalent is 10, a more preferable lower limit is 2, and a more preferable upper limit is 6.
上記シリコーン化合物Aの分子量は特に限定されないが、好ましい下限は300、好ましい上限は50000である。上記分子量が300未満であると、得られる粘着剤組成物の耐熱性が不充分となることがあり、50000を超えると、上記粘着剤成分との混合が困難となることがある。上記分子量のより好ましい下限は400、より好ましい上限は10000であり、更に好ましい下限は500、更に好ましい上限は5000である。 The molecular weight of the silicone compound A is not particularly limited, but a preferred lower limit is 300 and a preferred upper limit is 50000. If the molecular weight is less than 300, the resulting pressure-sensitive adhesive composition may have insufficient heat resistance, and if it exceeds 50,000, mixing with the pressure-sensitive adhesive component may be difficult. The more preferable lower limit of the molecular weight is 400, the more preferable upper limit is 10,000, the still more preferable lower limit is 500, and the more preferable upper limit is 5000.
上記シリコーン化合物Aを合成する方法は特に限定されず、例えば、SiH基を有するシリコーン樹脂と、上記粘着剤成分と架橋可能な官能基を有するビニル化合物とをハイドロシリレーション反応により反応させることにより、シリコーン樹脂に上記粘着剤成分と架橋可能な官能基を導入する方法や、シロキサン化合物と、上記粘着剤成分と架橋可能な官能基を有するシロキサン化合物とを縮合反応させる方法等が挙げられる。 The method of synthesizing the silicone compound A is not particularly limited. For example, by reacting a silicone resin having a SiH group with a vinyl compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component, a hydrosilylation reaction is performed. Examples thereof include a method of introducing a functional group capable of crosslinking with the pressure-sensitive adhesive component into the silicone resin, and a method of causing a condensation reaction between the siloxane compound and a siloxane compound having a functional group capable of crosslinking with the pressure-sensitive adhesive component.
上記シリコーン化合物Aのうち市販されているものは、例えば、信越化学工業社製のX-22-164、X-22-164AS、X-22-164A、X-22-164B、X-22-164C、X-22-164E等の両末端にメタクリル基を有するシリコーン化合物や、信越化学工業社製のX-22-174DX、X-22-2426、X-22-2475等の片末端にメタクリル基を有するシリコーン化合物や、ダイセル・サイテック社製のEBECRYL350、EBECRYL1360等のアクリル基を有するシリコーン化合物や、東亞合成社製のAC-SQ TA-100、AC-SQ SI-20等のアクリル基を有するシリコーン化合物や、東亞合成社製のMAC-SQ TM-100、MAC-SQ SI-20、MAC-SQ HDM等のメタクリル基を有するシリコーン化合物等が挙げられる。 Commercially available silicone compounds A include, for example, X-22-164, X-22-164AS, X-22-164A, X-22-164B, X-22-164C manufactured by Shin-Etsu Chemical Co., Ltd. , X-22-164E and other silicone compounds having methacrylic groups at both ends, and X-22-174DX, X-22-2426, X-22-2475 manufactured by Shin-Etsu Chemical Co., Ltd. Silicone compounds having acrylic groups such as EBECRYL350 and EBECRYL1360 manufactured by Daicel-Cytec, and silicone compounds having acrylic groups such as AC-SQ TA-100 and AC-SQ SI-20 manufactured by Toagosei Co., Ltd. MAC-SQ TM-100, MAC-SQ SI-20, MAC manufactured by Toagosei Co., Ltd. Silicone compounds having a methacryl group such as SQ HDM like.
なかでも、上記シリコーン化合物Aは、耐熱性が特に高く、極性が高いために粘着剤組成物からのブリードアウトが容易であることから、下記一般式(I)、一般式(II)、一般式(III)で表される、シロキサン骨格に(メタ)アクリル基を有するシリコーン化合物が好適である。 Among these, the silicone compound A has particularly high heat resistance and high polarity, so that bleeding out from the pressure-sensitive adhesive composition is easy. Therefore, the following general formula (I), general formula (II), and general formula A silicone compound represented by (III) having a (meth) acryl group in the siloxane skeleton is preferred.
Figure JPOXMLDOC01-appb-C000003
Figure JPOXMLDOC01-appb-C000003
式中、X、Yは0~1200の整数を表し、Rは不飽和二重結合を有する官能基を表す。 In the formula, X and Y represent an integer of 0 to 1200, and R represents a functional group having an unsaturated double bond.
上記一般式(I)、一般式(II)、一般式(III)で表される、シロキサン骨格に(メタ)アクリル基を有するシリコーン化合物のうち市販されているものは、例えば、ダイセル・サイテック社製のEBECRYL350、EBECRYL1360(いずれもRがアクリル基)等が挙げられる。 Of the silicone compounds having a (meth) acryl group in the siloxane skeleton represented by the above general formula (I), general formula (II), or general formula (III), commercially available products are, for example, Daicel Cytec Examples thereof include EBECRYL350, EBECRYL1360 (both of which R is an acrylic group).
上記シリコーン化合物Aの含有量は特に限定されないが、好ましい下限は0.1重量%、好ましい上限は30重量%である。シリコーン化合物Aの含有量が0.1重量%未満であると被着体から剥離できないことがあり、30重量%を超えると初期接着力が得られないことがある。シリコーン化合物Aの含有量のより好ましい下限は0.2重量%、より好ましい上限は20重量%である。 Although content of the said silicone compound A is not specifically limited, A preferable minimum is 0.1 weight% and a preferable upper limit is 30 weight%. If the content of the silicone compound A is less than 0.1% by weight, it may not be peeled from the adherend, and if it exceeds 30% by weight, the initial adhesive strength may not be obtained. The more preferable lower limit of the content of the silicone compound A is 0.2% by weight, and the more preferable upper limit is 20% by weight.
上記シリコーン化合物Aの含有量は、上記粘着剤成分100重量部に対する好ましい下限が0.5重量部、好ましい上限が40重量部である。シリコーン化合物Aの含有量が0.5重量部未満であると、光を照射しても充分に粘着力が低減せず被着体から剥離できないことがあり、40重量部を超えると、被着体の汚染の原因となることがある。シリコーン化合物Aの含有量のより好ましい下限は1重量部、より好ましい上限は30重量部である。 The content of the silicone compound A is preferably 0.5 parts by weight with respect to 100 parts by weight of the pressure-sensitive adhesive component, and 40 parts by weight with a preferred upper limit. When the content of the silicone compound A is less than 0.5 parts by weight, the adhesive strength may not be sufficiently reduced even when irradiated with light, and may not be peeled off from the adherend. May cause body contamination. The more preferable lower limit of the content of the silicone compound A is 1 part by weight, and the more preferable upper limit is 30 parts by weight.
本発明の粘着剤組成物は、凝集力の調節を図る目的でイソシアネート化合物、メラミン化合物、エポキシ化合物等の一般の粘着剤に配合される各種の多官能性化合物を適宜配合してもよい。また、帯電防止剤、可塑剤、樹脂、界面活性剤、ワックス、微粒子充填剤等の公知の添加剤を加えることもできる。更に、粘着剤の安定性を高めるために熱安定剤、酸化防止剤を配合してもよい。 The pressure-sensitive adhesive composition of the present invention may appropriately contain various polyfunctional compounds that are blended with general pressure-sensitive adhesives such as isocyanate compounds, melamine compounds, and epoxy compounds for the purpose of adjusting the cohesive force. In addition, known additives such as an antistatic agent, a plasticizer, a resin, a surfactant, a wax, and a fine particle filler can be added. Furthermore, you may mix | blend a heat stabilizer and antioxidant in order to improve stability of an adhesive.
本発明の粘着剤組成物を製造する方法は特に限定されず、例えば、上記粘着剤成分、光重合開始剤、気体発生剤、及び、必要に応じて配合する上記シリコーン化合物を、ビーズミル、超音波分散、ホモジナイザー、高出力ディスパー、ロールミル等を用いて混合する方法等が挙げられる。
上記気体発生剤を粘着剤組成物中に0.05~37μmの分散径で分散させる方法は特に限定されないが、あらかじめ上記気体発生剤を微粉砕し、各メッシュサイズの篩にて分級して平均粒径を0.05~37μmに調整した後、上記粘着剤成分等と混合する方法が挙げられる。特に分散径が30μm以下となるように微分散させるためには、分散方法も重要となる。例えば、ビーズミルを用いて混練を行う場合には、ビーズミルの回転速度を高くしたり、分散時間を長くしたり、ビーズの粒子径を小さくしたりすることにより、気体発生剤の分散径をより小さく調整することができる。
The method for producing the pressure-sensitive adhesive composition of the present invention is not particularly limited. For example, the pressure-sensitive adhesive component, the photopolymerization initiator, the gas generating agent, and the silicone compound to be blended as necessary are mixed with a bead mill, an ultrasonic wave. Examples of the method include mixing using a dispersion, a homogenizer, a high output disper, a roll mill, and the like.
The method of dispersing the gas generating agent in the pressure-sensitive adhesive composition with a dispersion diameter of 0.05 to 37 μm is not particularly limited, but the gas generating agent is finely pulverized in advance and classified by a sieve of each mesh size. Examples thereof include a method of adjusting the particle diameter to 0.05 to 37 μm and then mixing with the above-mentioned pressure-sensitive adhesive component. In particular, the dispersion method is also important for fine dispersion so that the dispersion diameter is 30 μm or less. For example, when kneading using a bead mill, the dispersion diameter of the gas generating agent can be reduced by increasing the rotation speed of the bead mill, increasing the dispersion time, or reducing the particle diameter of the beads. Can be adjusted.
本発明の粘着剤組成物は、高い初期粘着力を有する一方、紫外線等の光を照射することにより容易に剥離することができる。本発明の粘着剤組成物は、特に耐熱性に優れることから、TSVの製造工程においてウエハを支持板に固定する、ウエハやチップをリフロー炉に通す際に支持板等に仮固定する等の、220~270℃、好ましくは230~260℃の高温処理を行う用途にも用いることができる。 While the pressure-sensitive adhesive composition of the present invention has a high initial adhesive strength, it can be easily peeled off by irradiation with light such as ultraviolet rays. Since the pressure-sensitive adhesive composition of the present invention is particularly excellent in heat resistance, the wafer is fixed to the support plate in the TSV manufacturing process, the wafer or chip is temporarily fixed to the support plate when passing through a reflow furnace, etc. It can also be used in applications where high-temperature treatment at 220 to 270 ° C., preferably 230 to 260 ° C.
本発明の粘着剤組成物は、様々な接着性製品に用いることができる。
上記接着性製品は、例えば、本発明の粘着剤組成物をバインダー樹脂として用いた接着剤、粘着剤、塗料、コーティング剤、シーリング剤等、又は、本発明の粘着剤組成物を粘着剤として用いた片面粘着テープ、両面粘着テープ、ノンサポートテープ(自立テープ)等の粘着テープ等が挙げられる。なかでも、高温処理時の支持板固定用テープ、高温処理及びバックグラインドに兼用する固定用テープ、高温処理及びダイシングに兼用する固定用テープ、個片化した半導体チップを更に高温処理する際に用いる半導体チップ仮固定用テープ等に好適である。
The pressure-sensitive adhesive composition of the present invention can be used for various adhesive products.
The adhesive product is, for example, an adhesive, a pressure-sensitive adhesive, a paint, a coating agent, a sealing agent or the like using the pressure-sensitive adhesive composition of the present invention as a binder resin, or the pressure-sensitive adhesive composition of the present invention as a pressure-sensitive adhesive. Examples thereof include adhesive tapes such as single-sided adhesive tape, double-sided adhesive tape, and non-support tape (self-supporting tape). Among them, a support plate fixing tape at high temperature processing, a fixing tape for both high temperature processing and back grinding, a fixing tape for high temperature processing and dicing, and used for further high temperature processing of individual semiconductor chips. It is suitable for a semiconductor chip temporary fixing tape or the like.
基材の少なくとも一方の面に、本発明の粘着剤組成物からなる粘着剤層を有する粘着テープもまた、本発明の1つである。
上記基材は、例えば、アクリル、オレフィン、ポリカーボネート、塩化ビニル、ABS、ポリエチレンテレフタレート(PET)、ポリエチレンナフタレート(PEN)、ナイロン、ウレタン、ポリイミド等の透明な樹脂からなるシート、網目状の構造を有するシート、孔が開けられたシート等が挙げられる。
An adhesive tape having an adhesive layer made of the adhesive composition of the present invention on at least one surface of the substrate is also one aspect of the present invention.
The base material is, for example, a sheet made of a transparent resin such as acrylic, olefin, polycarbonate, vinyl chloride, ABS, polyethylene terephthalate (PET), polyethylene naphthalate (PEN), nylon, urethane, polyimide, or a network structure. And a sheet having a hole and the like.
本発明の粘着テープを製造する方法は特に限定されず、例えば、基材上に、上記粘着剤等をドクターナイフやスピンコーター等を用いて塗工する等の従来公知の方法を用いることができる。 The method for producing the pressure-sensitive adhesive tape of the present invention is not particularly limited. For example, a conventionally known method such as coating the above-mentioned pressure-sensitive adhesive or the like on a base material using a doctor knife, a spin coater or the like can be used. .
本発明の粘着剤組成物は、250℃程度、より具体的には220~270℃の高温加工プロセスを含むウエハの加工時において、ウエハの取扱いを容易にし、破損したりしないようにするためにウエハを支持板に固定するための接着剤として好適である。
本発明の粘着剤組成物を介してウエハを支持板に固定する支持板固定工程と、上記支持板に固定されたウエハの表面に220~270℃の加熱を伴う処理を施すウエハ処理工程と、上記処理後のウエハに光照射を行い、上記粘着剤組成物を硬化させて、支持板をウエハから剥離する支持板剥離工程とを有するウエハの処理方法もまた、本発明の1つである。
The pressure-sensitive adhesive composition of the present invention is intended to facilitate handling of a wafer and prevent damage during processing of a wafer including a high-temperature processing process of about 250 ° C., more specifically, 220 to 270 ° C. It is suitable as an adhesive for fixing the wafer to the support plate.
A support plate fixing step of fixing the wafer to the support plate via the pressure-sensitive adhesive composition of the present invention, a wafer processing step of subjecting the surface of the wafer fixed to the support plate to a treatment involving heating at 220 to 270 ° C., A wafer processing method is also included in the present invention, which includes a support plate peeling step of irradiating the treated wafer with light to cure the pressure-sensitive adhesive composition and peeling the support plate from the wafer.
上記支持板は特に限定されず、例えば、ガラス板、石英ガラス板、ステンレス板等が挙げられる。
上記支持板に固定されたウエハの表面に250℃程度の加熱を伴う処理は特に限定されず、例えば、化学気相成長法(CVD)、リフロー、リアクティブイオンエッチング(RIE)等が挙げられる。
The said support plate is not specifically limited, For example, a glass plate, a quartz glass plate, a stainless steel plate etc. are mentioned.
A process involving heating at about 250 ° C. on the surface of the wafer fixed to the support plate is not particularly limited, and examples thereof include chemical vapor deposition (CVD), reflow, reactive ion etching (RIE), and the like.
本発明によれば、高い接着力を有する一方で容易に剥離でき、かつ、耐熱性に優れる粘着剤組成物、該粘着剤組成物を用いた粘着テープ、及び、該粘着テープを用いたウエハの処理方法を提供することができる。 ADVANTAGE OF THE INVENTION According to this invention, while having high adhesive force, it can peel easily and is excellent in heat resistance, the adhesive tape using this adhesive composition, and the wafer using this adhesive tape A processing method can be provided.
以下に実施例を挙げて本発明の態様を更に詳しく説明するが、本発明はこれら実施例にのみ限定されるものではない。 Hereinafter, embodiments of the present invention will be described in more detail with reference to examples. However, the present invention is not limited to these examples.
(実施例1)
温度計、攪拌機、冷却管を備えた反応器を用意し、この反応器内に、2-エチルヘキシルアクリレート94重量部、アクリル酸1重量部、2-ヒドロキシエチルアクリレート5重量部、ラウリルメルカプタン0.01重量部と、酢酸エチル80重量部を加えた後、反応器を加熱して還流を開始した。続いて、上記反応器内に、重合開始剤として1,1-ビス(t-ヘキシルパーオキシ)-3,3,5-トリメチルシクロヘキサン0.01重量部を添加し、還流下で重合を開始させた。次に、重合開始から1時間後及び2時間後にも、1,1-ビス(t-ヘキシルパーオキシ)-3,3,5-トリメチルシクロヘキサンを0.01重量部ずつ添加し、更に、重合開始から4時間後にt-ヘキシルパーオキシピバレートを0.05重量部添加して重合反応を継続させた。そして、重合開始から8時間後に、固形分55重量%、重量平均分子量60万のアクリル共重合体を得た。
Example 1
A reactor equipped with a thermometer, a stirrer, and a cooling tube was prepared. In this reactor, 94 parts by weight of 2-ethylhexyl acrylate, 1 part by weight of acrylic acid, 5 parts by weight of 2-hydroxyethyl acrylate, 0.01% lauryl mercaptan After adding parts by weight and 80 parts by weight of ethyl acetate, the reactor was heated to start refluxing. Subsequently, 0.01 parts by weight of 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane was added as a polymerization initiator in the reactor, and polymerization was started under reflux. It was. Next, after 1 hour and 2 hours from the start of polymerization, 0.01 parts by weight of 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane was added, and the polymerization was started. 4 hours later, 0.05 part by weight of t-hexylperoxypivalate was added to continue the polymerization reaction. And 8 hours after the start of polymerization, an acrylic copolymer having a solid content of 55% by weight and a weight average molecular weight of 600,000 was obtained.
得られたアクリル共重合体を含む酢酸エチル溶液の樹脂固形分100重量部に対して、2-イソシアナトエチルメタクリレート3.5重量部を加えて反応させた。更に、反応後の酢酸エチル溶液の樹脂固形分100重量部に対して、光重合開始剤(エサキュアワン、日本シイベルヘグナー社製)1重量部、シリコーン化合物(EBECRYL350、ダイセル・サイテック社製)5重量部、ビステトラゾール ナトリウム塩20重量部、ポリイソシアネート系架橋剤(コロネートL45、日本ポリウレタン社製)0.5重量部を加え、粘着剤組成物の酢酸エチル溶液を調製した。
なお、ビステトラゾール ナトリウム塩は、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、12時間の条件で分散させたものを用いた。
3.5 parts by weight of 2-isocyanatoethyl methacrylate was added to and reacted with 100 parts by weight of the resin solid content of the resulting ethyl acetate solution containing the acrylic copolymer. Furthermore, with respect to 100 parts by weight of the resin solid content of the ethyl acetate solution after the reaction, 1 part by weight of a photopolymerization initiator (Esacure One, manufactured by Nippon Shibel Hegner), 5 parts by weight of a silicone compound (EBECRYL 350, manufactured by Daicel Cytec), 20 parts by weight of bistetrazole sodium salt and 0.5 parts by weight of a polyisocyanate crosslinking agent (Coronate L45, manufactured by Nippon Polyurethane Co., Ltd.) were added to prepare an ethyl acetate solution of the pressure-sensitive adhesive composition.
The bistetrazole sodium salt was finely pulverized in advance and then classified with a sieve having a mesh size of 100 μm, and added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse | distributed on condition of time was used.
得られた粘着剤組成物の酢酸エチル溶液を、片面にコロナ処理を施した厚さ50μmの透明なポリエチレンナフタレートフィルムのコロナ処理面上に、乾燥皮膜の厚さが30μmとなるようにドクターナイフで塗工し、110℃、5分間加熱して塗工溶液を乾燥させた。その後、40℃、3日間静置養生を行い、粘着テープを得た。 A doctor knife so that the ethyl acetate solution of the obtained pressure-sensitive adhesive composition has a dry film thickness of 30 μm on the corona-treated surface of a transparent polyethylene naphthalate film having a thickness of 50 μm that has been corona-treated on one side. The coating solution was dried by heating at 110 ° C. for 5 minutes. Thereafter, static curing was performed at 40 ° C. for 3 days to obtain an adhesive tape.
得られた粘着テープを細かく切断した。切断した粘着テープ1gを、上記アクリル共重合体を溶解可能な溶媒5mL中に入れ、24時間攪拌して粘着剤成分を溶解した後、超音波照射機(アズワン社製、VS-100III)を用いて1時間分散を行った溶液を50μmのメッシュにてろ過してビステトラゾール ナトリウム塩の粒子を分離した。分離したビステトラゾール ナトリウム塩を、レーザー回折/散乱式粒子径分布測定装置(HORIBA社製、LA-950)を用いて測定したところ、ビステトラゾール ナトリウム塩の分散径(D50粒子径)は0.7μmであった。 The obtained adhesive tape was cut finely. 1 g of the cut adhesive tape is placed in 5 mL of a solvent capable of dissolving the acrylic copolymer, and stirred for 24 hours to dissolve the adhesive component, and then an ultrasonic irradiator (manufactured by ASONE, VS-100III) is used. Then, the solution dispersed for 1 hour was filtered through a 50 μm mesh to separate particles of bistetrazole sodium salt. When the separated bistetrazole sodium salt was measured using a laser diffraction / scattering particle size distribution analyzer (HORIBA, LA-950), the dispersion diameter of bistetrazole sodium salt (D50 particle size) was 0.7 μm. Met.
(実施例2)
ビステトラゾール ナトリウム塩の代わりに、ビステトラゾール アンモニウム塩を配合した以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
なお、ビステトラゾール アンモニウム塩は、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、12時間の条件で分散させたものを用いた。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール アンモニウム塩の分散径(D50粒子径)を求めたところ、0.7μmであった。
(Example 2)
An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that bistetrazole ammonium salt was blended instead of bistetrazole sodium salt.
The bistetrazole ammonium salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 μm, and the mixture was added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse | distributed on condition of time was used.
When the dispersion diameter (D50 particle diameter) of the bistetrazole ammonium salt was calculated | required by the method similar to Example 1 about the obtained adhesive tape, it was 0.7 micrometer.
(実施例3)
ビステトラゾール ナトリウム塩の代わりに、ビステトラゾール ピペラジン塩を配合した以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
なお、ビステトラゾール ピペラジン塩は、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、12時間の条件で分散させたものを用いた。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ピペラジン塩の分散径(D50粒子径)を求めたところ、0.7μmであった。
(Example 3)
An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that a bistetrazole piperazine salt was added instead of the bistetrazole sodium salt.
The bistetrazole piperazine salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 μm, and the mixture was added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse | distributed on condition of time was used.
When the dispersion diameter (D50 particle diameter) of the bistetrazole piperazine salt was determined for the obtained adhesive tape by the same method as in Example 1, it was 0.7 μm.
(実施例4)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、24時間の条件で分散させたものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、0.4μmであった。
(Example 4)
As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 μm was added to ethyl acetate, and a bead mill (produced by AIMEX, RMB-08) was used at a rotational speed of 1000 rpm for 24 hours. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
When the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated | required by the method similar to Example 1 about the obtained adhesive tape, it was 0.4 micrometer.
(実施例5)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1500rpm、30時間の条件で分散させたものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、0.1μmであった。
(Example 5)
As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 μm was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was rotated at 1500 rpm for 30 hours. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 0.1 μm.
(実施例6)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数3000rpm、48時間の条件で分散させたものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、0.05μmであった。
(Example 6)
As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 μm was added to ethyl acetate, and the mixture was rotated at 3000 rpm for 48 hours using a bead mill (RIM-08 manufactured by AIMEX). An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 0.05 μm.
(実施例7)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、30分間の条件で分散させたものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、5μmであった。
(Example 7)
As bistetrazole sodium salt, finely pulverized in advance and classified with a sieve having a mesh size of 100 μm was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was used at a rotational speed of 1000 rpm for 30 minutes. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
About the obtained adhesive tape, when the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated | required by the method similar to Example 1, it was 5 micrometers.
(実施例8)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、15分間の条件で分散させたものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、10μmであった。
(Example 8)
Bistetrazole sodium salt, which was finely pulverized in advance and classified with a sieve having a mesh size of 100 μm, was added to ethyl acetate, and a bead mill (manufactured by AIMEX, RMB-08) was used for 15 minutes at a rotation speed of 1000 rpm. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that those dispersed under conditions were used.
When the dispersion diameter (D50 particle diameter) of the bistetrazole sodium salt was calculated | required by the method similar to Example 1 about the obtained adhesive tape, it was 10 micrometers.
(実施例9)
ビステトラゾール ナトリウム塩として、予め微粉砕した後、40μmのメッシュサイズの篩にて分級したものを用いた以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール ナトリウム塩の分散径(D50粒子径)を求めたところ、37μmであった。
Example 9
An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that the bistetrazole sodium salt was finely pulverized in advance and then classified with a sieve having a mesh size of 40 μm.
With respect to the obtained pressure-sensitive adhesive tape, the dispersion diameter (D50 particle diameter) of bistetrazole sodium salt was determined in the same manner as in Example 1. As a result, it was 37 μm.
(実施例10)
ビステトラゾール ナトリウム塩の代わりに、5-(m-アミノフェニル)テトラゾールを配合した以外は実施例1と同様にして接着剤組成物及び粘着テープを得た。
なお、5-(m-アミノフェニル)テトラゾールは、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを用いた。
得られた粘着テープについて実施例1と同様の方法により5-(m-アミノフェニル)テトラゾールの分散径(D50粒子径)を求めたところ、9μmであった。
(Example 10)
An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that 5- (m-aminophenyl) tetrazole was added instead of bistetrazole sodium salt.
The 5- (m-aminophenyl) tetrazole used was finely pulverized in advance and classified with a sieve having a mesh size of 100 μm.
With respect to the obtained adhesive tape, the dispersion diameter (D50 particle diameter) of 5- (m-aminophenyl) tetrazole was determined in the same manner as in Example 1. As a result, it was 9 μm.
(比較例1)
ビステトラゾール ナトリウム塩を配合しなかった以外は、実施例1と同様にして接着剤組成物及び粘着テープを得た。
(Comparative Example 1)
An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that bistetrazole sodium salt was not blended.
(比較例2)
温度計、攪拌機、冷却管を備えた反応器を用意し、この反応器内に、2-エチルヘキシルアクリレート85重量部、アクリル酸2.5重量部、2-ヒドロキシエチルアクリレート2.5重量部、ジメチルアミノエチルアクリレート10重量部、ラウリルメルカプカプタン0.01重量部と、酢酸エチル180重量部を加えた後、反応器を加熱して還流を開始した。続いて、上記反応器内に、重合開始剤として1,1-ビス(t-ヘキシルパーオキシ)-3,3,5-トリメチルシクロヘキサン0.01重量部を添加し、還流下で重合を開始させた。次に、重合開始から1時間後及び2時間後にも、1,1-ビス(t-ヘキシルパーオキシ)-3,3,5-トリメチルシクロヘキサンを0.01重量部ずつ添加し、更に、重合開始から4時間後にt-ヘキシルパーオキシピバレートを0.05重量部添加して重合反応を継続させた。そして、重合開始から8時間後に、固形分55重量%、重量平均分子量60万のアクリル共重合体を得た。
(Comparative Example 2)
A reactor equipped with a thermometer, a stirrer, and a cooling tube was prepared. In this reactor, 85 parts by weight of 2-ethylhexyl acrylate, 2.5 parts by weight of acrylic acid, 2.5 parts by weight of 2-hydroxyethyl acrylate, dimethyl After 10 parts by weight of aminoethyl acrylate, 0.01 parts by weight of lauryl mercapcaptan and 180 parts by weight of ethyl acetate were added, the reactor was heated to start refluxing. Subsequently, 0.01 parts by weight of 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane was added as a polymerization initiator in the reactor, and polymerization was started under reflux. It was. Next, after 1 hour and 2 hours from the start of polymerization, 0.01 parts by weight of 1,1-bis (t-hexylperoxy) -3,3,5-trimethylcyclohexane was added, and the polymerization was started. 4 hours later, 0.05 part by weight of t-hexylperoxypivalate was added to continue the polymerization reaction. And 8 hours after the start of polymerization, an acrylic copolymer having a solid content of 55% by weight and a weight average molecular weight of 600,000 was obtained.
得られたアクリル共重合体を含む酢酸エチル溶液の樹脂固形分100重量部に対して、2-イソシアナトエチルメタクリレート3.5重量部を加えて反応させ、更に、反応後の酢酸エチル溶液の樹脂固形分100重量部に対して、光重合開始剤(エサキュアワン、日本シイベルヘグナー社製)1重量部、シリコーン化合物(EBECRYL350、ダイセル・サイテック社製)5重量部、5-(m-アミノフェニル)テトラゾール20重量部、ポリイソシアネート系架橋剤(コロネートL45、日本ポリウレタン社製)0.5重量部を混合し粘着剤組成物の酢酸エチル溶液を調製した。 The resin solid content of 100 parts by weight of the ethyl acetate solution containing the acrylic copolymer thus obtained is reacted by adding 3.5 parts by weight of 2-isocyanatoethyl methacrylate, and further the resin of the ethyl acetate solution after the reaction. 1 part by weight of a photopolymerization initiator (Esacure One, manufactured by Nippon Siebel Hegner), 5 parts by weight of a silicone compound (EBECRYL 350, manufactured by Daicel Cytec), and 5- (m-aminophenyl) tetrazole 20 with respect to 100 parts by weight of solid content Part by weight and 0.5 part by weight of a polyisocyanate-based crosslinking agent (Coronate L45, manufactured by Nippon Polyurethane Co., Ltd.) were mixed to prepare an ethyl acetate solution of the pressure-sensitive adhesive composition.
得られた粘着剤組成物の酢酸エチル溶液を、片面にコロナ処理を施した厚さ50μmの透明なポリエチレンナフタレートフィルムのコロナ処理面上に、乾燥皮膜の厚さが30μmとなるようにドクターナイフで塗工し、110℃、5分間加熱して塗工溶液を乾燥させた。その後、40℃、3日間静置養生を行い、粘着テープを得た。
なお、顕微鏡観察を行ったところ、5-(m-アミノフェニル)テトラゾールは粘着剤層中に溶解しており、粒子は認められなかった。
A doctor knife so that the ethyl acetate solution of the obtained pressure-sensitive adhesive composition has a dry film thickness of 30 μm on the corona-treated surface of a transparent polyethylene naphthalate film having a thickness of 50 μm that has been corona-treated on one side. The coating solution was dried by heating at 110 ° C. for 5 minutes. Thereafter, static curing was performed at 40 ° C. for 3 days to obtain an adhesive tape.
As a result of microscopic observation, 5- (m-aminophenyl) tetrazole was dissolved in the pressure-sensitive adhesive layer, and no particles were observed.
(比較例3)
ビステトラゾール ナトリウム塩20重量部の代わりに、2,2’-アゾビス-(N-ブチル-2-メチルプロピオンアミド)20重量部を、9,10-ジグリシジルオキシアントラセン1重量部の代わりにジエチルチオキサントン3重量部を配合した以外は、実施例1と同様にして接着剤組成物及び粘着テープを得た。
なお、顕微鏡観察を行ったところ、2,2’-アゾビス-(N-ブチル-2-メチルプロピオンアミド)は粘着剤層中に溶解しており、粒子は認められなかった。
(Comparative Example 3)
Instead of 20 parts by weight of bistetrazole sodium salt, 20 parts by weight of 2,2′-azobis- (N-butyl-2-methylpropionamide) is used instead of 1 part by weight of 9,10-diglycidyloxyanthracene. An adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that 3 parts by weight were blended.
As a result of microscopic observation, 2,2′-azobis- (N-butyl-2-methylpropionamide) was dissolved in the pressure-sensitive adhesive layer, and no particles were observed.
(比較例4)
非光硬化型粘着剤である水酸基、カルボキシル基を持つアクリル樹脂のSKダイン1495C(綜研化学社製)の樹脂固形分100重量部に対して、ビステトラゾール ナトリウム塩20重量部、ポリイソシアネート系架橋剤(コロネートL45、日本ポリウレタン社製)0.5重量部を混合し粘着剤組成物の酢酸エチル溶液を調製した以外は実施例1と同様にして粘着剤組成物及び粘着テープを得た。
なお、ビステトラゾール アンモニウム塩は、予め微粉砕した後、100μmのメッシュサイズの篩にて分級したものを酢酸エチル中に加え、ビーズミル(AIMEX社製、RMB-08)を用いて回転数1000rpm、12時間の条件で分散させたものを用いた。
得られた粘着テープについて実施例1と同様の方法によりビステトラゾール アンモニウム塩の分散径(D50粒子径)を求めたところ、0.7μmであった。
(Comparative Example 4)
Bistetrazole sodium salt 20 parts by weight, polyisocyanate-based crosslinking agent for 100 parts by weight of resin solid content of acrylic resin SK Dyne 1495C (manufactured by Soken Kagaku Co., Ltd.), which is a non-photo-curing pressure-sensitive adhesive. (Coronate L45, manufactured by Nippon Polyurethane Co., Ltd.) A pressure-sensitive adhesive composition and a pressure-sensitive adhesive tape were obtained in the same manner as in Example 1 except that 0.5 part by weight was mixed to prepare an ethyl acetate solution of the pressure-sensitive adhesive composition.
The bistetrazole ammonium salt was finely pulverized in advance and classified with a sieve having a mesh size of 100 μm, and the mixture was added to ethyl acetate. Using a bead mill (produced by AIMEX, RMB-08), the rotational speed was 1000 rpm, 12 What was disperse | distributed on condition of time was used.
When the dispersion diameter (D50 particle diameter) of the bistetrazole ammonium salt was calculated | required by the method similar to Example 1 about the obtained adhesive tape, it was 0.7 micrometer.
(評価)
実施例及び比較例で得られた粘着剤組成物及び粘着テープについて、以下の方法により評価を行った。
結果を表1に示した。
(Evaluation)
About the adhesive composition and adhesive tape obtained by the Example and the comparative example, it evaluated by the following method.
The results are shown in Table 1.
(1)粘着テープの熱処理前の接着性評価、剥離性評価
直径20cmの円形に切断した粘着テープを、直径20cm、厚さ約750μmのシリコンウエハに貼り付けた。シリコンウエハに貼り付けた面と反対の面に、直径20cm、厚さ0.7mmのテンパックスガラスを貼りつけた。
接着性評価として、ガラスが上面になるようにシリコンウエハを吸着台に設置した後、ガラス端部を吸盤で引っ張り、全くガラスが剥離できなかった場合を「○」と、比較的軽く剥離できた場合を「△」と、ほとんど抵抗なく剥離できた場合を「×」と評価した。
(1) Adhesive evaluation before heat treatment of adhesive tape, peelability evaluation An adhesive tape cut into a circle having a diameter of 20 cm was attached to a silicon wafer having a diameter of 20 cm and a thickness of about 750 μm. Tempax glass having a diameter of 20 cm and a thickness of 0.7 mm was attached to the surface opposite to the surface attached to the silicon wafer.
As an adhesive evaluation, after placing the silicon wafer on the suction table so that the glass was on the top surface, the glass edge was pulled with a suction cup, and the glass could not be peeled at all. The case was evaluated as “△”, and the case where the film could be peeled almost without resistance was evaluated as “x”.
次いで、ガラス板側から超高圧水銀灯を用いて、紫外線をガラス板表面への照射強度が254nm換算で100mW/cmとなるよう照度を調節して2分間照射した。光照射後の剥離性評価として、ガラスが上面になるようにシリコンウエハを吸着台に設置した後、ガラス端部を吸盤で引っ張り、全く抵抗なく剥離できた場合を「○」、抵抗はあったものの剥離できた場合を「△」、全く剥離できなかった場合を「×」と評価した。 Next, using an ultrahigh pressure mercury lamp from the glass plate side, ultraviolet rays were irradiated for 2 minutes while adjusting the illuminance so that the irradiation intensity on the glass plate surface was 100 mW / cm 2 in terms of 254 nm. As the evaluation of peelability after light irradiation, after placing the silicon wafer on the suction table so that the glass is on the top surface, the glass edge was pulled with a suction cup, and the case where it was possible to peel off without any resistance was "Good". The case where the product could be peeled was evaluated as “Δ”, and the case where the material was not peeled off was evaluated as “x”.
(2)粘着テープの熱処理後の接着性評価、剥離性評価
直径20cmの円形に切断した粘着テープを、直径20cm、厚さ約750μmのシリコンウエハに貼り付けた。シリコンウエハに貼り付けた面と反対の面に、直径20cm、厚さ0.7mmのテンパックスガラスを貼りつけた。この積層体を、250℃、20分間加熱した後、室温に戻した。
接着性評価として、加熱後の表面を目視にて観察し、ガラスが上面になるようにシリコンウエハを吸着台に設置した後、ガラス端部を吸盤で引っ張った時に、全面に渡って浮きがみとめられず、かつ、引っ張っても全く剥離できなかった場合を「◎」、浮きが全体の面積の3%以下であり、かつ、引っ張っても剥離できなかった場合を「○」、浮きが全体の面積の3%以上、10%以下であるが、引っ張っても剥離できなかった場合を「△」、容易に剥離できた場合を「×」と評価した。
(2) Adhesive evaluation after heat treatment of adhesive tape, evaluation of peelability An adhesive tape cut into a circle having a diameter of 20 cm was attached to a silicon wafer having a diameter of 20 cm and a thickness of about 750 μm. Tempax glass having a diameter of 20 cm and a thickness of 0.7 mm was attached to the surface opposite to the surface attached to the silicon wafer. The laminate was heated at 250 ° C. for 20 minutes and then returned to room temperature.
For adhesion evaluation, visually observe the heated surface, place the silicon wafer on the suction table so that the glass is on the top surface, and then pull the glass edge with a suction cup to observe the entire surface. "◎" when it was not peeled and could not be peeled at all even when pulled, and "○" when the float was 3% or less of the total area and could not be peeled even when pulled, Although it was 3% or more and 10% or less of the area, it was evaluated as “Δ” when it could not be peeled even when pulled, and “x” when it could be easily peeled off.
次いで、ガラス板側から超高圧水銀灯を用いて、紫外線をガラス板表面への照射強度が254nm換算で100mW/cmとなるよう照度を調節して2分間照射した。光照射後の剥離性評価として、ガラスが上面になるようにシリコンウエハを吸着台に設置した後、ガラス端部を吸盤で引っ張った時に、ウエハと接着剤層との界面から剥離しウエハに接着剤の残渣が全く認められなかった場合を「◎」、ウエハと接着剤層との界面から剥離したが、ウエハ側に僅かな汚れが認められた(ただし、汚れは洗浄で取れた)場合を「○」、剥離はできたものの、ウエハ側に汚れが認められた(ただし、汚れは洗浄で取れた)場合を「△」、全く剥離できなかった場合を「×」と評価した。
同様の評価を、260℃、10分間の熱処理を行った場合についても行った。
Next, using an ultrahigh pressure mercury lamp from the glass plate side, ultraviolet rays were irradiated for 2 minutes while adjusting the illuminance so that the irradiation intensity on the glass plate surface was 100 mW / cm 2 in terms of 254 nm. For evaluation of peelability after light irradiation, after placing the silicon wafer on the suction table so that the glass is on the top surface, when the glass edge is pulled with a suction cup, it peels from the interface between the wafer and the adhesive layer and adheres to the wafer. “◎” when no residue of the adhesive was found, and peeling from the interface between the wafer and the adhesive layer, but a slight stain was found on the wafer side (however, the stain could be removed by washing). “◯” indicates that the film was peeled off but the wafer side was soiled (however, the dirt was removed by washing).
The same evaluation was performed for a case where heat treatment was performed at 260 ° C. for 10 minutes.
Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004
本発明によれば、高い接着力を有する一方で容易に剥離でき、かつ、耐熱性に優れる粘着剤組成物、該粘着剤組成物を用いた粘着テープ、及び、該粘着テープを用いたウエハの処理方法を提供することができる。
 
ADVANTAGE OF THE INVENTION According to this invention, while having high adhesive force, it can peel easily and is excellent in heat resistance, the adhesive tape using this adhesive composition, and the wafer using this adhesive tape A processing method can be provided.

Claims (7)

  1. 光硬化型の粘着剤成分、光重合開始剤、及び、光を照射することにより気体を発生する気体発生剤を含有する粘着剤組成物であって、
    前記気体発生剤は、粘着剤組成物中に0.05~37μmの分散径で分散している
    ことを特徴とする粘着剤組成物。
    A pressure-sensitive adhesive composition, a photopolymerization initiator, and a pressure-sensitive adhesive composition containing a gas generating agent that generates gas when irradiated with light,
    The pressure-sensitive adhesive composition, wherein the gas generating agent is dispersed in the pressure-sensitive adhesive composition with a dispersion diameter of 0.05 to 37 μm.
  2. 気体発生剤がテトラゾール化合物若しくはその塩、又は、トリアゾール化合物若しくはその塩であることを特徴とする請求項1記載の粘着剤組成物。 The pressure-sensitive adhesive composition according to claim 1, wherein the gas generating agent is a tetrazole compound or a salt thereof, or a triazole compound or a salt thereof.
  3. 気体発生剤がビステトラゾール化合物又はその塩であることを特徴とする請求項1記載の粘着剤組成物。 The pressure-sensitive adhesive composition according to claim 1, wherein the gas generating agent is a bistetrazole compound or a salt thereof.
  4. 粘着剤成分がラジカル重合性の不飽和結合を有する(メタ)アクリル酸アルキルエステル系の重合性ポリマーを含有する光硬化型粘着剤であることを特徴とする請求項1、2又は3記載の粘着剤組成物。 4. The pressure-sensitive adhesive according to claim 1, 2, or 3, wherein the pressure-sensitive adhesive component is a photocurable pressure-sensitive adhesive containing a (meth) acrylic acid alkyl ester-based polymerizable polymer having a radical polymerizable unsaturated bond. Agent composition.
  5. 更に、光硬化型の粘着剤成分と架橋可能な官能基を有するシリコーン化合物を含有することを特徴とする請求項1、2、3又は4記載の粘着剤組成物。 The pressure-sensitive adhesive composition according to claim 1, 2, 3, or 4, further comprising a photocurable pressure-sensitive adhesive component and a silicone compound having a crosslinkable functional group.
  6. 基材の少なくとも一方の面に、請求項1、2、3、4又は5記載の粘着剤組成物からなる粘着剤層を有することを特徴とする粘着テープ。 A pressure-sensitive adhesive tape comprising a pressure-sensitive adhesive layer comprising the pressure-sensitive adhesive composition according to claim 1, 2, 3, 4, or 5 on at least one surface of a substrate.
  7. 請求項1、2、3、4又は5記載の粘着剤組成物を介してウエハを支持板に固定する支持板固定工程と、前記支持板に固定されたウエハの表面に220~270℃の加熱を伴う処理を施すウエハ処理工程と、前記処理後のウエハに光照射を行い、前記粘着剤組成物を硬化させて、支持板をウエハから剥離する支持板剥離工程とを有することを特徴とするウエハの処理方法。 6. A support plate fixing step for fixing a wafer to a support plate via the pressure-sensitive adhesive composition according to claim 1, and heating at 220 to 270 ° C. on the surface of the wafer fixed to the support plate. And a support plate peeling step of irradiating the processed wafer with light, curing the pressure-sensitive adhesive composition, and peeling the support plate from the wafer. Wafer processing method.
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WO2015030031A1 (en) * 2013-08-30 2015-03-05 富士フイルム株式会社 Laminate and application therefor
JP2015050268A (en) * 2013-08-30 2015-03-16 富士フイルム株式会社 Laminate and application thereof
JP2015050269A (en) * 2013-08-30 2015-03-16 富士フイルム株式会社 Laminate and application thereof
JP2016032018A (en) * 2014-07-29 2016-03-07 日立化成株式会社 Temporarily fixing resin composition, temporarily fixing resin film and temporarily fixing resin film sheet
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WO2020189764A1 (en) * 2019-03-20 2020-09-24 積水化学工業株式会社 Adhesive composition, adhesive tape, and method for processing electronic component
CN113574083A (en) * 2019-03-20 2021-10-29 积水化学工业株式会社 Adhesive composition, adhesive tape, and method for processing electronic component
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WO2022138703A1 (en) * 2020-12-25 2022-06-30 大日本印刷株式会社 Gas-generating agent, adhesive composition, and adhesive sheet

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