WO2013064737A3 - Apparatus and method for processing substrate - Google Patents
Apparatus and method for processing substrate Download PDFInfo
- Publication number
- WO2013064737A3 WO2013064737A3 PCT/FI2012/051050 FI2012051050W WO2013064737A3 WO 2013064737 A3 WO2013064737 A3 WO 2013064737A3 FI 2012051050 W FI2012051050 W FI 2012051050W WO 2013064737 A3 WO2013064737 A3 WO 2013064737A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- precursor
- reaction space
- supplying
- supply line
- processing substrate
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
Abstract
The present invention relates to an apparatus and a method for subjecting a surface of a substrate (5) to successive surface reactions of at least a first precursor (A) and a second precursor (B). The apparatus comprises a reaction space (7) and a precursor system (6) for supplying the at least first and second precursors (A, B) to the reaction space (7).The precursor system (6) comprises a precursor vessel (10, 12), a precursor supply line (16, 18, 30) for supplying the precursor (A, B) from precursor vessel (10, 12) to the reaction space (2) and a dosing valve (22, 24, 32) provided to the precursor supply line (16, 18, 30). The apparatus further comprises a temperature sensor (8, 9, 11, 13, 15, 17, 19) arranged to the precursor system (6) in free gas space (16, 18, 30, 38) upstream of the dosing valve (22, 24, 32).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20116071 | 2011-11-01 | ||
FI20116071 | 2011-11-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2013064737A2 WO2013064737A2 (en) | 2013-05-10 |
WO2013064737A3 true WO2013064737A3 (en) | 2013-08-01 |
Family
ID=48192938
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FI2012/051050 WO2013064737A2 (en) | 2011-11-01 | 2012-10-31 | Apparatus and method for processing substrate |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW201339354A (en) |
WO (1) | WO2013064737A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102204536B1 (en) * | 2018-12-31 | 2021-01-20 | 한국표준과학연구원 | Capsule Type Viscometer, Liquid Phase Precursor Degasser and Liquid Phase Precursor Management System Including Thereof |
FI129579B (en) * | 2019-06-28 | 2022-05-13 | Beneq Oy | Precursor source arrangement and atomic layer deposition apparatus |
FI129578B (en) | 2019-06-28 | 2022-05-13 | Beneq Oy | An atomic layer deposition apparatus |
FI130416B (en) * | 2019-06-28 | 2023-08-21 | Beneq Oy | Precursor source arrangement and atomic layer deposition apparatus |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040226507A1 (en) * | 2003-04-24 | 2004-11-18 | Carpenter Craig M. | Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers |
US20050000427A1 (en) * | 2003-07-02 | 2005-01-06 | Samsung Electronics Co., Ltd. | Gas supplying apparatus for atomic layer deposition |
US20080099933A1 (en) * | 2006-10-31 | 2008-05-01 | Choi Kenric T | Ampoule for liquid draw and vapor draw with a continous level sensor |
US20080178809A1 (en) * | 2007-01-29 | 2008-07-31 | Spohn Ronald F | Diptube apparatus and method for delivering vapor phase reagent to a deposition chamber |
KR20110078959A (en) * | 2009-12-31 | 2011-07-07 | 에스엔유 프리시젼 주식회사 | Vaporizing apparatus and control method for the same |
US20120034369A1 (en) * | 2010-08-05 | 2012-02-09 | Tokyo Electron Limited | Vaporizing apparatus, substrate processing apparatus, coating and developing apparatus, and substrate processing method |
-
2012
- 2012-10-31 WO PCT/FI2012/051050 patent/WO2013064737A2/en active Application Filing
- 2012-10-31 TW TW101140251A patent/TW201339354A/en unknown
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040226507A1 (en) * | 2003-04-24 | 2004-11-18 | Carpenter Craig M. | Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers |
US20050000427A1 (en) * | 2003-07-02 | 2005-01-06 | Samsung Electronics Co., Ltd. | Gas supplying apparatus for atomic layer deposition |
US20080099933A1 (en) * | 2006-10-31 | 2008-05-01 | Choi Kenric T | Ampoule for liquid draw and vapor draw with a continous level sensor |
US20080178809A1 (en) * | 2007-01-29 | 2008-07-31 | Spohn Ronald F | Diptube apparatus and method for delivering vapor phase reagent to a deposition chamber |
KR20110078959A (en) * | 2009-12-31 | 2011-07-07 | 에스엔유 프리시젼 주식회사 | Vaporizing apparatus and control method for the same |
US20120034369A1 (en) * | 2010-08-05 | 2012-02-09 | Tokyo Electron Limited | Vaporizing apparatus, substrate processing apparatus, coating and developing apparatus, and substrate processing method |
Also Published As
Publication number | Publication date |
---|---|
WO2013064737A2 (en) | 2013-05-10 |
TW201339354A (en) | 2013-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2012148801A3 (en) | Semiconductor substrate processing system | |
WO2013016191A3 (en) | Methods and apparatus for the deposition of materials on a substrate | |
WO2012118955A3 (en) | Apparatus and process for atomic layer deposition | |
WO2011159690A3 (en) | Multiple precursor showerhead with by-pass ports | |
EP2532013A4 (en) | Method of forming ceramic wire, system of forming the same, and superconductor wire using the same | |
WO2012136876A8 (en) | Atomic layer deposition with plasma source | |
WO2012145492A3 (en) | Apparatus for deposition of materials on a substrate | |
GB201121034D0 (en) | Apparatus and method for depositing a layer onto a substrate | |
WO2010114274A3 (en) | Apparatus for depositing film and method for depositing film and system for depositing film | |
SG10201406621WA (en) | Method and apparatus for depositing a material layer originating from process gas on a substrate wafer | |
WO2012008789A3 (en) | Method for producing graphene at a low temperature, method for direct transfer of graphene using same, and graphene sheet | |
WO2012118952A3 (en) | Apparatus and process for atomic layer deposition | |
WO2011068936A3 (en) | Methods and apparatus for treating exhaust gas in a processing system | |
EA201270338A1 (en) | METHOD AND DEVICE FOR CONTROLLING THE COATING PROCESS BY DEPOSITION METHOD | |
WO2012118887A3 (en) | Apparatus and process for atomic layer deposition | |
WO2007016592A3 (en) | Gas manifold valve cluster | |
WO2012047035A3 (en) | Substrate processing device for supplying reaction gas through symmetry-type inlet and outlet | |
WO2007120776A3 (en) | Plasma deposition apparatus and method for making solar cells | |
WO2013064737A3 (en) | Apparatus and method for processing substrate | |
TW201130073A (en) | Coating and developing apparatus and coating and developing method | |
WO2013019285A3 (en) | Apparatus for depositing thin film coatings and method of deposition utilizing such apparatus | |
WO2012057770A3 (en) | Reactor clean | |
AP3747A (en) | Temperature control system, hydrocarbon synthesis reaction apparatus, hydrocarbon synthesis reaction system, and temperature control process | |
WO2012134070A3 (en) | Gas-injection apparatus, atomic layer deposition apparatus, and atomic layer deposition method using the apparatus | |
WO2010060630A3 (en) | Method and device for the production of high-purity silicon |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 12846594 Country of ref document: EP Kind code of ref document: A2 |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 12846594 Country of ref document: EP Kind code of ref document: A2 |