WO2012134070A3 - Gas-injection apparatus, atomic layer deposition apparatus, and atomic layer deposition method using the apparatus - Google Patents
Gas-injection apparatus, atomic layer deposition apparatus, and atomic layer deposition method using the apparatus Download PDFInfo
- Publication number
- WO2012134070A3 WO2012134070A3 PCT/KR2012/001659 KR2012001659W WO2012134070A3 WO 2012134070 A3 WO2012134070 A3 WO 2012134070A3 KR 2012001659 W KR2012001659 W KR 2012001659W WO 2012134070 A3 WO2012134070 A3 WO 2012134070A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gas
- atomic layer
- layer deposition
- injection apparatus
- injection
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Abstract
The present invention relates to a gas-injection apparatus, to an atomic layer deposition apparatus, and to an atomic layer deposition method using the apparatus. The gas-injection apparatus is configured in the shape of a single pipe. Gas is supplied onto a substrate through the central portion of the gas-injection apparatus, and simultaneously, gas supplied through gas-intake holes formed in specific portions along an outer surface of a gas supply pipe is suctioned. Thus, when the gas-injection apparatus is disposed near the substrate, the supply and suction of the gas may be performed at the same time. Here, since a deposition process is performed at a normal pressure, it is unnecessary to provide an additional apparatus and set aside time to produce a vacuum state. Also, since consecutive processes are able to be carried out, pre- or post-processes may be performed together at the same time. In addition, a plurality of source injection apparatuses may be provided to form a multi-component compound. In this case, the type of heat source and supplied heat energy may be individually adapted for each source decomposition temperature.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201280016242.9A CN103649368B (en) | 2011-03-31 | 2012-03-07 | Gas injection device, apparatus for atomic layer deposition and use the Atomic layer deposition method of this apparatus for atomic layer deposition |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2011-0029416 | 2011-03-31 | ||
KR1020110029416A KR101311983B1 (en) | 2011-03-31 | 2011-03-31 | Gas injection apparatus, atomic layer deposition apparatus and the method of atomic layer deposition using the same |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012134070A2 WO2012134070A2 (en) | 2012-10-04 |
WO2012134070A3 true WO2012134070A3 (en) | 2012-11-29 |
Family
ID=46932043
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2012/001659 WO2012134070A2 (en) | 2011-03-31 | 2012-03-07 | Gas-injection apparatus, atomic layer deposition apparatus, and atomic layer deposition method using the apparatus |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR101311983B1 (en) |
CN (1) | CN103649368B (en) |
WO (1) | WO2012134070A2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101541155B1 (en) * | 2012-12-13 | 2015-08-06 | 엘아이지인베니아 주식회사 | atomic layer deposition apparatus |
KR101538372B1 (en) * | 2012-12-13 | 2015-07-22 | 엘아이지인베니아 주식회사 | atomic layer deposition apparatus |
KR101541154B1 (en) * | 2012-12-13 | 2015-08-03 | 엘아이지인베니아 주식회사 | atomic layer deposition apparatus |
KR101407068B1 (en) * | 2013-01-14 | 2014-06-13 | 한양대학교 산학협력단 | FAST REMOTE PLASMA ATOmic layer deposition apparatus |
KR101557483B1 (en) * | 2014-02-10 | 2015-10-07 | 엘아이지인베니아 주식회사 | Atomic layer deposition apparatus |
KR20160072630A (en) | 2014-12-15 | 2016-06-23 | 인베니아 주식회사 | Apparatus for depositing atomic layer |
KR102007866B1 (en) * | 2015-05-07 | 2019-08-06 | 에이피시스템 주식회사 | Apparatus for atomic layer depositing and the method for atomic layer depositing using the same |
KR101715223B1 (en) * | 2015-05-15 | 2017-03-14 | 고려대학교 산학협력단 | Apparatus for selectively depositing atomic layer for local area on the substrate |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0927482A (en) * | 1995-07-11 | 1997-01-28 | Speedfam Co Ltd | Plasma etching apparatus |
US6022414A (en) * | 1994-07-18 | 2000-02-08 | Semiconductor Equipment Group, Llc | Single body injector and method for delivering gases to a surface |
JP2001230211A (en) * | 2000-02-17 | 2001-08-24 | Sharp Corp | Film forming equipment |
US20040035358A1 (en) * | 2002-08-23 | 2004-02-26 | Cem Basceri | Reactors having gas distributors and methods for depositing materials onto micro-device workpieces |
KR100805345B1 (en) * | 2006-11-10 | 2008-02-20 | 주식회사 비아트론 | Apparatus for doping metal in atmospheric pressure |
JP2010092952A (en) * | 2008-10-06 | 2010-04-22 | Ihi Corp | Device and method for manufacturing white led |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101818334B (en) * | 2002-01-17 | 2012-12-12 | 松德沃技术公司 | ALD apparatus and method |
-
2011
- 2011-03-31 KR KR1020110029416A patent/KR101311983B1/en not_active IP Right Cessation
-
2012
- 2012-03-07 WO PCT/KR2012/001659 patent/WO2012134070A2/en active Application Filing
- 2012-03-07 CN CN201280016242.9A patent/CN103649368B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6022414A (en) * | 1994-07-18 | 2000-02-08 | Semiconductor Equipment Group, Llc | Single body injector and method for delivering gases to a surface |
JPH0927482A (en) * | 1995-07-11 | 1997-01-28 | Speedfam Co Ltd | Plasma etching apparatus |
JP2001230211A (en) * | 2000-02-17 | 2001-08-24 | Sharp Corp | Film forming equipment |
US20040035358A1 (en) * | 2002-08-23 | 2004-02-26 | Cem Basceri | Reactors having gas distributors and methods for depositing materials onto micro-device workpieces |
KR100805345B1 (en) * | 2006-11-10 | 2008-02-20 | 주식회사 비아트론 | Apparatus for doping metal in atmospheric pressure |
JP2010092952A (en) * | 2008-10-06 | 2010-04-22 | Ihi Corp | Device and method for manufacturing white led |
Also Published As
Publication number | Publication date |
---|---|
CN103649368B (en) | 2016-03-02 |
WO2012134070A2 (en) | 2012-10-04 |
KR20120111108A (en) | 2012-10-10 |
KR101311983B1 (en) | 2013-09-30 |
CN103649368A (en) | 2014-03-19 |
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