Classifications

• • G—PHYSICS
  • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
  • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
  • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
  • G03F7/26—Processing photosensitive materials; Apparatus therefor
  • G03F7/40—Treatment after imagewise removal, e.g. baking
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
  • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
  • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
  • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
• • G—PHYSICS
  • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
  • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
  • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
  • G03F7/26—Processing photosensitive materials; Apparatus therefor
  • G03F7/40—Treatment after imagewise removal, e.g. baking
  • G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal

Definitions

• the present invention is related generally to perfluoroalkyl sulfonamide surfactants.
• the present invention is a method of controlling the modification of a photoresist surface by varying the pH of an aqueous perfluoroalkyl sulfonamide solution.
• An integrated circuit consists of series of patterned functional layers (insulators, metal wires, etc). The structure of each layer is transferred from a mask via photolithography followed by etching or ion implantation. In the photolithographic process, the functional layer is covered by a photoresist film.
• the circuit patterns are fabricated with a chemically amplified photoresist consisting of a polymer with an acid-labile pendant protecting group, photoacid generator (PAG), and additional additives.
• PAG photoacid generator
• the PAG Upon exposure to UV radiation through a patterned mask, the PAG is decomposed, generating a low concentration of acid.
• the acid diffuses and catalyzes a deprotection reaction that cleaves a pendant group of the insoluble polymer resulting in formation of a polymer that is soluble in the developer solution.
• the exposed regions of the positive tone photoresist are removed by dissolution in a developer solution, generally using solutions including tetramethyl ammonium hydroxide in water, leaving a pattern of unexposed photoresist lines.
• a developer solution generally using solutions including tetramethyl ammonium hydroxide in water, leaving a pattern of unexposed photoresist lines.
• the width of the photoresist structures must shrink adequately. Their heights cannot be reduced in the same way since etch resistance must be retained.
• the mechanical strength of the photoresist lines decreases, leading to collapse of the structures during the development process. This pattern collapse is caused by unbalanced capillary forces acting between the lines after development and during the drying steps.
• Surfactant rinses have been used to control the contact angle of aqueous fluids on the photoresist (U.S. Patent No. 7,741,260) and reduce water marks (U.S. Patent Application Publication Nos. 2008/0280230 and 2008/0299487).
• surfactants to the rinse liquid has many potential benefits, but identifying the optimal surfactant for a particular photoresist can be a complicated process. Other than surfactant concentration, the known candidates do not offer any process handle for tuning the surfactant interaction with the photoresist.
• the surfactants in question must be sufficiently soluble in the rinse solution (e.g., water) to fully dissolve otherwise unwanted defects might be introduced onto the surface of the photoresist.
• the present invention is a method of modifying a surface of a photoresist material.
• the method includes exposing the photoresist material to an aqueous ionic surfactant solution and varying the pH of the aqueous ionic surfactant solution until a fluorochemical layer is formed in or on the photoresist material.
• the aqueous ionic surfactant solution has a pH of within about 3 pH units of a pKa of the perfluoroalkyl sulfonamide.
• the present invention describes a method of modifying a surface of a photoresist material by contacting the surface of the photoresist material with an aqueous ionic surfactant solution, for example, an aqueous perfluoroalkyl sulfonamide solution, and varying the pH of the aqueous ionic surfactant solution to obtain a desired result.
• an aqueous ionic surfactant solution for example, an aqueous perfluoroalkyl sulfonamide solution
• aqueous ionic surfactant solution is an ionic surfactant rinse solution.
• the aqueous ionic surfactant solution has tunable interaction with the photoresist material and allows tailoring as needed depending on the photoresist material and semiconductor manufacturing requirements.
• the aqueous ionic surfactant solution is an aqueous perfluoroalkyl sulfonamide solution of Formula I.
• R' is a hydrocarbon alkyl group including greater than 2 carbon atoms, such as -C 3 H 7 , do not have sufficient solubility in the rinse solution over a wide pH range to be useful in imparting a defect free adsorbed fluorochemical layer onto the surface of the photo resist using the pH adjustment method of the present invention.
• the aqueous perfluoroalkyl sulfonamide solution has a concentration of between about 10 ppm and about 10,000 ppm and particularly between about 50 ppm and about 5000 ppm. In one embodiment, the aqueous perfluoroalkyl sulfonamide solution has a pH within about 3 pH units of the pKa of the perfluoroalkyl sulfonamide and particularly within about 2 pH units of the pKa of the perfluoroalkyl sulfonamide.
• the pH range of the aqueous perfluoroalkyl sulfonamide solution would be between about 3.5 and about 9.5.
• the aqueous perfluoroalkyl sulfonamide solution has a neutral sulfonamide to sulfonamide salt ratio of about 99.9:0.1 to 0.1 :99.9 and particularly about 99: 1 to 1 :99.
• aqueous perfluoroalkyl sulfonamide solutions include, but are not limited to, C 4 F 9 S0 2 N(H)CH 2 CH 2 OH (N-HFBSE), C 4 F 9 S0 2 N(H)CH 3 (N-MeFBSA) and C 4 F 9 S0 2 NH 2 (N-HFBSA) in dilute aqueous ammonia.
• N-HFBSE C 4 F 9 S0 2 N(H)CH 2 CH 2 OH
• N-MeFBSA C 4 F 9 S0 2 N(H)CH 3
• N-HFBSA C 4 F 9 S0 2 NH 2
• the surface of the photoresist material is modified by controlling the level of adsorption of the aqueous perfluoroalkyl sulfonamide solution onto the surface of the photoresist material.
• the photoresist material is a patterned photoresist. Both the surface tension and adsorption of the aqueous perfluoroalkyl sulfonamide solution into or onto a photoresist material can be controlled by altering the pH of the aqueous perfluoroalkyl sulfonamide solution in water. By decreasing the pH of the solution, the surface tension is reduced significantly as the ratio of perfluoralkyl sulfonamide to perfluoroalkyl sulfonamide salt increases. For the N-HFBSE and N-HFBSA, the surface tension decreases linearly above the pKa as the pH decreases. Surface tension can be measured, for example, using a Kruss K12 tensiometer using a plate method.
• Surface modification of, or adsorption to, the photoresist material can be determined by measuring the mass change of the photoresist material.
• the mass change can be measured, for example, using a Q-Sense E4 QCM-D (quartz crystal microbalance - dissipative).
• the QCM-D measures frequency shift, which is proportional to the mass adsorbance of the aqueous perfluoroalkyl sulfonamide solution on the photoresist material.
• An increased (negative) frequency shift measured by QCM-D indicates increasing mass adsorbance, which is observed as the pH of the aqueous perfluoroalkyl sulfonamide solution is decreased.
• One method of preparing the aqueous perfluoroalkyl sulfonamide solution involves first adding aqueous ammonia to water to form a solution.
• aqueous ammonia includes, but is not limited to, product number 3265-45, 28-30% ammonia in water, available from Mallinkrodt Chemicals.
• the water is 18.2 ⁇ water.
• Molten perfluoroalkyl sulfonamide is then charged to the solution to make an aqueous perfluoroalkyl sulfonamide solution.
• the solutions are mixed for about one hour and allowed to settle overnight.
• the solution is then filtered to remove insoluble material and particles.
• the filter membrane is polytetrafluoroethylene (PTFE), polyethylene (PE), polyether sulfone (PES) or glass fiber.
• PTFE polytetrafluoroethylene
• PE polyethylene
• PES polyether sulfone
• the filter is at least a 1 um rating and particularly at least a 0.2 ⁇ rating.
• the surface of the photoresist material is modified, for example, in a lithography process, by first exposing the photoresist material to an aqueous perfluoroalkyl sulfonamide solution.
• the photoresist material is rinsed with deionized (DI) water rinse prior to exposing the photoresist material to the aqueous perfluoroalkyl sulfonamide solution rinse.
• the photoresist material is rinsed with DI water rinse subsequent to exposing the photoresist material to the aqueous perfluoroalkyl sulfonamide solution.
• DI deionized
• the pH of the aqueous perfluoroalkyl sulfonamide solution may be varied until a fluorochemical layer is formed on the photoresist material.
• the pH may also be varied until the LER or LWR of the patterned photoresist material has been reduced by at least about 10% and particularly by at least about 25%.
• the pH may also be varied until the amount of water defects on the photoresist material has been reduced by at least about 25% and particularly by at least about 50%. In all cases, the photoresist material must be monitored to ensure that melting, deformity or other defects on the patterned surface have not occurred.
• Imaging data can be performed on the surface of the patterened photoresist material (e.g., by SEM) to measure various parameters critical to photoresist performance, such as whether there has been formation of any deformities or water mark or particle defects or any melting of features or pattern collapse.
• SEM surface-e.g., by SEM
• parameters critical to photoresist performance such as whether there has been formation of any deformities or water mark or particle defects or any melting of features or pattern collapse.
• the impact of the surfactant rinse on process window, critical line dimensions (CD), LER and LWR can be determined as well.
• the photoresist material is dried to remove the aqueous perfluoroalkyl sulfonamide solution from the surface of the photoresist material.
• the photoresist material is dried by spin drying. After exposure to the aqueous solution of the perfluoroalkyl sulfonamide at controlled pH, the drying time of the photoresist material pH may be reduced by at least about 10% and particularly by at least about 25%.
• the adsorption of the surfactant to a photoresist material was measured using a Q-Sense E4 QCM-D microbalance (available from Bolin Scientific, Vastra Frolunda, SWEDEN).
• This instrument analyzes both the dissipation and frequency shift of a quartz crystal sensor to characterize thin films coated on the sensor. This allows the mass of material adsorbed onto the thin film and the viscoelastic properties of the thin film to be measured. In particular, it allows measurement of the mass adsorbed onto the photoresist material during exposure to the surfactant solution.
• a gold plated quartz crystal sensor (QSX 301, Biolin Scientific, Sweden) was single side coated with photoresist (EPIC 2135 193 nm) by spin coating. One to three droplets of the resist material were applied to a clean sensor. The sensor was then spun at 1500 rpm for 27 seconds. The resist was baked by placing the sensor on a hot plate at 120°C for 60 seconds.
• the coated sensors were then tested in three stages. During all stages, dissipation and frequency shift were monitored on multiple bands.
• 18 megaohm water was run over the sensor for four to five minutes to establish a baseline. No frequency shift or dissipation was observed during this stage.
• the second stage was started by changing the flow to the surfactant solution (150 ⁇ / ⁇ ). This flow was continued until the frequency shift and dissipation stabilized (10 to 15 minutes). Reported values for frequency shift were measured at this time.
• the third stage the flow was shifted back to 18 megaohm water. The shift in frequency and dissipation were again monitored for 5 to 10 minutes to determine if the adsorbance was reversible.
• N-HFBSE N(H)CH 2 CH 2 OH
• 25% solutions of N-HFBSE were prepared by dissolving molten N-HFBSE in aqueous ammonia (29% ammonia in water available from Mallinkrodt Chemicals, St. Louis, MO) which had been diluted with 18.2 megaohm water. The solutions were mixed for one hour, allowed to settle overnight and then filtered through a 0.2 ⁇ polytetrafluoroethylene (PTFE) syringe filter.
• Examples 1-7 were prepared according to Table 1 below.
• N-HFBSE ppm surfactant
• N-HFBSE 25% solutions were prepared by dissolving molten N-HFBSE in aqueous tetramethyl ammonium (TMAH, 25% in water available from Alfa Aesar, Ward Hill, MA) which had been diluted with 18.2 megaohm water. The solutions were mixed for one hour, allowed to settle overnight and then filtered through a 0.45 ⁇ polytetrafluoroethylene (PTFE) syringe filter.
• TMAH tetramethyl ammonium
• PTFE polytetrafluoroethylene
• N-HFBSA C 4 F 9 S0 2 NH 2
• PTFE polytetrafiuoroethylene
• N-HFBSA 25% solution of N-HFBSA was prepared by dissolving 2.50 g of molten N-HFBSA in 6.086 g of tetramethyl ammonium and 1.412 g of 18.2 megaohm water. The solution was mixed for one hour, allowed to settle overnight and then filtered through a 0.45 ⁇ polytetrafiuoroethylene (PTFE) syringe filter.
• PTFE polytetrafiuoroethylene
• a solution of dilute nitric acid was prepared by adding 0.62 g of 70%> nitric acid to 60.41 g 18.2 megaohm water.
• the N-HFBSA / TMAH solution was diluted with water to 2000 ppm surfactant (N-HFBSA) with 18.2 megaohm water and the dilute nitric acid to vary the pH of the resulting solutions.
• N-HFBSA surfactant
• Table 7 N-HFBSA / TMAH at 2000ppm
• C 4 F 9 S0 2 N(H)CH3 was prepared according to WO2001/30873.
• 25% solutions of C 4 F 9 S0 2 N(H)CH 3 were prepared by dissolving molten C 4 F 9 S0 2 N(H)CH 3 in aqueous tetramethyl ammonium which had been diluted with 18.2 megaohm water. The solutions were mixed for one hour, allowed to settle overnight and then filtered through a 0.45 ⁇ polytetrafluoroethylene (PTFE) syringe filter.
• Examples 27-30 were prepared according to Table 8 below.
• C 3 F 7 C0 2 H was prepared according to US2567011. 25% solutions of C 3 F 7 C0 2 H were prepared by dissolving C 3 F 7 C0 2 H in aqueous ammonia which had been diluted with 18.2 megaohm water. The solutions were mixed for one hour, allowed to settle overnight and then filtered through a 0.45 ⁇ polytetrafluoroethylene (PTFE) syringe filter. Examples 31-34 were prepared according to Table 10 below. Table 10: Sample Preparation of C 3 F 7 C0 2 H / NH 4 OH

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