WO2012161270A1 - Cleaning agent and method for cleaning glass substrate - Google Patents

Cleaning agent and method for cleaning glass substrate Download PDF

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Publication number
WO2012161270A1
WO2012161270A1 PCT/JP2012/063360 JP2012063360W WO2012161270A1 WO 2012161270 A1 WO2012161270 A1 WO 2012161270A1 JP 2012063360 W JP2012063360 W JP 2012063360W WO 2012161270 A1 WO2012161270 A1 WO 2012161270A1
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Prior art keywords
cleaning
glass substrate
cleaning agent
cerium oxide
acid
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PCT/JP2012/063360
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French (fr)
Japanese (ja)
Inventor
榎本 久男
幸治 佐原
愛子 金子
智章 石川
哲史 横山
佳孝 前柳
田中 明
Original Assignee
旭硝子株式会社
株式会社パーカーコーポレーション
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Application filed by 旭硝子株式会社, 株式会社パーカーコーポレーション filed Critical 旭硝子株式会社
Priority to KR1020137030821A priority Critical patent/KR20140053003A/en
Priority to CN201280022749.5A priority patent/CN103562366A/en
Priority to JP2013516439A priority patent/JPWO2012161270A1/en
Publication of WO2012161270A1 publication Critical patent/WO2012161270A1/en

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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C23/00Other surface treatment of glass not in the form of fibres or filaments
    • C03C23/0075Cleaning of glass
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/42Amino alcohols or amino ethers
    • C11D1/44Ethers of polyoxyalkylenes with amino alcohols; Condensation products of epoxyalkanes with amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/02Inorganic compounds ; Elemental compounds
    • C11D3/12Water-insoluble compounds
    • C11D3/1213Oxides or hydroxides, e.g. Al2O3, TiO2, CaO or Ca(OH)2
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/20Organic compounds containing oxygen
    • C11D3/2075Carboxylic acids-salts thereof
    • C11D3/2082Polycarboxylic acids-salts thereof
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/34Organic compounds containing sulfur
    • C11D3/3418Toluene -, xylene -, cumene -, benzene - or naphthalene sulfonates or sulfates
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/34Organic compounds containing sulfur
    • C11D3/3454Organic compounds containing sulfur containing sulfone groups, e.g. vinyl sulfones
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/36Organic compounds containing phosphorus
    • C11D3/362Phosphates or phosphites

Definitions

  • the present invention relates to a cleaning agent for cleaning a glass substrate polished with a cerium oxide-containing abrasive and a method for cleaning a glass substrate.
  • a glass substrate used for FPD such as a liquid crystal display (LCD) is obtained by forming a molten glass into a plate shape by a manufacturing method called a float method, and cutting the glass substrate, for example, By polishing with a rotating and revolving polishing tool to remove minute irregularities and waviness on the surface, a predetermined thickness satisfying the flatness required for the glass substrate for FPD (for example, 0.4 to 1.. 1 mm) (see, for example, Patent Document 1).
  • polishing abrasive grains containing cerium oxide as a main component and containing a rare earth element such as lanthanum are used.
  • a glass substrate that requires high flatness such as an FPD glass substrate.
  • the remaining abrasive on the substrate surface is a problem.
  • the polishing agent (abrasive grains) adhering to the glass substrate surface is washed and removed (see, for example, Patent Document 2).
  • cleaning agents containing alkali components are used, but for abrasives containing abrasive grains mainly composed of cerium oxide, The detergency was insufficient.
  • a cleaning agent containing an inorganic or organic alkali component and a surfactant is also used. Abrasive grain residues could not be reduced sufficiently.
  • a cleaning agent containing citric acid which is one of organic acids, to dissolve cerium oxide.
  • citric acid which is one of organic acids
  • the cleaning agent using citric acid as the organic acid has good initial cleaning characteristics, but there is a problem that the abrasive residue in the drainage agglomerates with time, resulting in problems in wastewater treatment.
  • the present invention has been made to solve the above-described problems, and for glass substrates that can disperse and remove the abrasive grains remaining and / or adhered to the surface thereof without impairing the flatness of the glass substrate. It aims at providing the cleaning agent and the cleaning method of a glass substrate.
  • a first aspect of the present invention is a cleaning agent for cleaning a glass substrate polished with a cerium oxide-containing polishing agent, wherein (A) an organic phosphonic acid, (B) a polycarboxylate, and (C) A cleaning agent characterized by being a water-based cleaning agent containing an aromatic sulfonic acid and (D) an amine-alkylene oxide adduct.
  • the cleaning agent of the first aspect the sum of the (A) organic phosphonic acid, the (B) polycarboxylic acid salt, the (C) aromatic sulfonic acid, and the (D) amine-alkylene oxide adduct
  • the amount of the (A) organic phosphonic acid is 0.01 to 50% by mass
  • the amount of the (B) polycarboxylic acid salt is 0.01 to 10% by mass
  • the amount of the (C) aromatic sulfonic acid is 0.01% by mass. It is preferable that the content of the amine-alkylene oxide adduct is 0.02 to 10% by mass.
  • the organic phosphonic acid (A) is preferably an organic compound having a structure in which a group represented by the formula: —P ( ⁇ O) (OH) 2 is bonded to a carbon atom.
  • the (D) amine-alkylene oxide adduct is preferably a propylene oxide-ethylene oxide adduct of alkylenediamine.
  • (A) an organic phosphonic acid, the (B) polycarboxylate, the (C) aromatic sulfonic acid, the (D) amine-alkylene oxide adduct, and water It is preferable to contain 55 to 98% by mass of water with respect to the total amount of each component of A) to (D) and water.
  • the term “to” indicating the above numerical range is used in the sense that the numerical values described before and after it are used as the lower limit value and the upper limit value, and unless otherwise specified, “to” is the same hereinafter. Used with meaning.
  • a second aspect of the present invention is a method for cleaning a glass substrate, wherein a polishing step of polishing a glass substrate using an abrasive containing cerium oxide, and the glass substrate after the polishing step are combined with the first substrate. And a cleaning step of cleaning with the cleaning agent according to the aspect.
  • the abrasive preferably contains abrasive grains containing cerium oxide as a main component and a rare earth element.
  • the glass substrate can be preferably cleaned by a single wafer type. Furthermore, it is preferable to clean the glass substrate after the polishing step with a diluted cleaning solution obtained by diluting the cleaning agent with water. Furthermore, in the said washing
  • polishing abrasive grains made of cerium oxide or the like remaining on and adhered to the surface of the glass substrate polished with an abrasive containing cerium oxide are dispersed and removed without impairing the flatness of the glass substrate. can do.
  • the glass substrate after polishing with the abrasive containing cerium oxide is efficiently cleaned without impairing the flatness of the surface, and the surface is free of foreign substances such as abrasive grains.
  • a glass substrate with very little residue can be provided.
  • an embodiment of the present invention will be described by taking as an example a cleaning agent for cleaning a glass substrate used for FPD such as an LCD and a cleaning method using the cleaning agent.
  • the FPD glass substrate polished with the cerium oxide-containing polishing agent is cleaned to remove the residue of the polishing agent on the polished glass substrate, and the embodiment of the present invention is a cleaning for this cleaning.
  • Agent and cleaning method The present invention is not limited to these embodiments, and other embodiments may belong to the category of the present invention as long as they match the gist of the present invention.
  • Embodiment of this invention is a cleaning agent of the glass substrate for FPD, (A) organic phosphonic acid, (B) polycarboxylate, (C) aromatic sulfonic acid, (D) amine -An aqueous detergent containing an alkylene oxide adduct.
  • polishing abrasive grains made of cerium oxide or the like remaining on and / or attached to the surface of the polished glass substrate can be well dispersed and removed, thereby impairing the flatness of the glass substrate.
  • the abrasive residue in the cleaning waste liquid does not aggregate over time, and the cleaning drainage can be processed well.
  • the organic phosphonic acid as component (A) acts as a chelating agent for cerium oxide, and remains and / or adheres to the surface of the glass substrate. It promotes the dispersion of abrasive grains composed of, etc., and peels off from the surface of the glass substrate to remove it.
  • the organic phosphonic acid which is the component (A) has a structure in which a group represented by the formula: —P ( ⁇ O) (OH) 2 (hereinafter referred to as a phosphonic acid group) is bonded to a carbon atom.
  • the number of phosphonic acid groups per molecule of organic phosphonic acid is preferably 2 or more, more preferably 2 to 8, and particularly preferably 2 to 4.
  • organic phosphonic acid in the present invention a compound having a structure in which a hydrogen atom bonded to carbon of a hydrocarbon which may have a substituent is substituted with a phosphonic acid group, and a nitrogen atom of ammonia or amines
  • a compound having a structure in which a hydrogen atom bonded to is substituted with a methylenephosphonic acid group represented by —CH 2 —P ( ⁇ O) (OH) 2 is preferable.
  • the hydrocarbon which may have a substituent is preferably an aliphatic hydrocarbon or a hydroxyl group-containing aliphatic hydrocarbon.
  • the number of carbon atoms is preferably 1 to 6, and the number of hydroxyl groups is preferably 2 or less.
  • Specific examples of the organic phosphonic acid having this structure include methyl diphosphonic acid and 1-hydroxyethane-1,1-diphosphonic acid.
  • the organic phosphonic acid in the present invention includes a compound having a structure in which a hydrogen atom bonded to carbon of a hydroxyl group-containing aliphatic hydrocarbon is substituted with a phosphonic acid group.
  • organic phosphonic acid having the latter structure a compound having a structure in which all hydrogen atoms bonded to nitrogen atoms of ammonia or aliphatic amines are substituted with methylenephosphonic acid groups is preferable.
  • a part of hydrogen atoms bonded to amine nitrogen atoms may be substituted with an organic group such as an alkyl group.
  • an alkylene diamine or a polyalkylene polyamine which is a multimer thereof is preferable.
  • the alkylenediamine preferably has 2 to 4 carbon atoms.
  • the number of hydrogen atoms bonded to nitrogen atoms of these amines (hydrogen atoms substituted for methylenephosphonic acid groups) is preferably 2 to 8, and more preferably 2 to 4.
  • organic phosphonic acids having this structure include aminotri (methylenephosphonic acid), ethylenediaminetetra (methylenephosphonic acid), hexamethylenediaminetetra (methylenephosphonic acid), propylenediaminetetra (methylenephosphonic acid), and diethylenetriamine.
  • Penta methylenephosphonic acid
  • triethylenetetraminehexa methylenephosphonic acid
  • tris (2-aminoethyl) aminehexa (methylenephosphonic acid)
  • trans-1,2-cyclohexanediaminetetra methylenephosphonic acid
  • glycol etherdiaminetetra Methylene phosphonic acid
  • tetraethylene pentamine hepta methylene phosphonic acid
  • the (B) component polycarboxylate and the (C) component aromatic sulfonic acid improve the dispersibility and / or removability of the abrasive grains by the (A) organic phosphonic acid, and polish the abrasive. It works to prevent the reattachment of grains.
  • the polycarboxylic acid salt as the component (B) include poly (meth) acrylates and salts of (meth) acrylic acid-maleic acid copolymers.
  • the notation (meth) acrylic acid means both acrylic acid and methacrylic acid.
  • the weight average molecular weight (hereinafter abbreviated as Mw) of the polycarboxylic acid is preferably in the range of 2,000 to 50,000 from the viewpoint of preventing reattachment of abrasive grains and low foaming properties.
  • Mw is a value measured by gel permeation chromatography (hereinafter abbreviated as GPC).
  • the counter ion forming the salt is not particularly limited, but alkali metal (for example, sodium and potassium) salts, ammonium salts, primary amines (for example, alkylamines such as methylamine, ethylamine, and butylamine).
  • alkali metal for example, sodium and potassium
  • ammonium salts for example, ammonium salts
  • primary amines for example, alkylamines such as methylamine, ethylamine, and butylamine.
  • secondary amines eg, dialkylamines such as dimethylamine, diethylamine and dibutylamine, and diethanolamine
  • tertiary amines eg, trialkylamines such as trimethylamine, triethylamine and tributylamine, triethanolamine, N-methyl
  • 1H imidazole 2-methyl-1H-imidazole, 2-ethyl-1H-imidazole, 4,5-dihydro-1H imidazole, 2-methyl-4,5-dihydro-1H imidazole 1,4,5,6-tetrahydro-pyrimidine, 1,6 (4) -dihydropyrimidine) salts
  • DBU 1,8
  • alkali metal for example, sodium and potassium
  • ammonium salts for example, sodium and potassium
  • primary amine salts secondary amine salts
  • secondary amine salts tertiary amine salts
  • quaternary ammonium salts particularly preferred are salts of alkali metals (for example, sodium and potassium) and ammonium salts.
  • aromatic sulfonic acid (C) examples include alkylbenzene sulfonic acid having 8 to 14 carbon atoms, petroleum sulfonate, toluene sulfonic acid, xylene sulfonic acid, and cumene sulfonic acid.
  • alkylbenzene sulfonic acid having 8 to 14 carbon atoms petroleum sulfonate, toluene sulfonic acid, xylene sulfonic acid, and cumene sulfonic acid.
  • metaxylene sulfonic acid (2,4-dimethylbenzene sulfonic acid) is preferable.
  • the amine-alkylene oxide adduct as the component (D) functions to promote the penetration of the organic phosphonic acid (A) into the interface between the abrasive grains and the glass substrate.
  • the amine-alkylene oxide adduct is preferably a compound known as an alkylene oxide addition type nonionic surfactant.
  • an alkylene oxide addition type nonionic surfactant As the alkylene oxide, ethylene oxide (hereinafter also referred to as EO) and propylene oxide (hereinafter also referred to as PO) are preferable, and a compound having a structure in which only one of them is added may be added. It may be a compound having the above structure.
  • the EO unit that is, oxyethylene group
  • the PO unit that is, oxypropylene group
  • the former is obtained by sequentially adding EO and PO separately to the amine, and the latter is obtained by adding a mixture of EO and PO to the amine.
  • the PO-EO adduct refers to an adduct obtained by any of these addition methods.
  • amines to which alkylene oxide is added amines having 2 to 8 hydrogen atoms bonded to nitrogen atoms and 1 to 4 amino groups are preferred. Moreover, 16 or less are preferable and, as for carbon number of amines, 10 or less are more preferable.
  • examples of such amines include aliphatic monoamines and polyamines, alicyclic monoamines and polyamines, and aromatic monoamines and polyamines. More specifically, alkyl monoamines, alkylene diamines and polyalkylene polyamines that are multimers thereof, alicyclic monoamines and polyamines having at least one amino group or aminoalkyl group bonded to an alicyclic ring, and amino groups bonded to an aromatic ring. An alicyclic monoamine or polyamine having at least one group or aminoalkyl group is preferred.
  • the amine-alkylene oxide adduct as the component (D) is a PO-EO adduct of alkylenediamine.
  • alkylene diamine an alkylene diamine having 2 to 4 carbon atoms is preferable, and ethylene diamine is particularly preferable.
  • the PO—EO adduct of ethylenediamine include a compound in which PO and EO are added to four hydrogen atoms bonded to the nitrogen atom of ethylenediamine. It is also preferable to use an aromatic amine PO adduct together with the ethylenediamine PO-EO adduct as the amine-alkylene oxide adduct as the component (D).
  • Examples of the PO adducts of aromatic amines include metaxylylenediamine PO adducts.
  • D When an amine-alkylene oxide adduct is used in combination with a PO-EO adduct of ethylenediamine and a PO adduct of aromatic amine, the stability of the cleaning / removing ability of the cleaning agent is further improved.
  • the content ratio of each component of (A) to (D) with respect to the total amount of each component of (A) to (D) including water is 0.01 to 50% by mass of organic phosphonic acid, 0.01 to 10% by mass of (B) polycarboxylate, 0.01 to 50% by mass of (C) aromatic sulfonic acid, (D) amine-alkylene
  • the oxide adduct is preferably 0.02 to 10% by mass.
  • the mass% of the total of (B) polycarboxylate and (C) aromatic sulfonic acid with respect to the total amount of (A) to (D) including water is 0.03 to 60 mass%. Is preferred.
  • (D) When an amine-alkylene oxide adduct is used in combination with an alkylenediamine PO-EO adduct and an aromatic amine PO adduct, 0.01 to 5% by mass of an alkylenediamine PO-EO adduct The PO group adduct of the aromatic amine is 0.01 to 5% by mass, and the total mass% of the total amount of (A) to (D) including water is 0.02 to 10% by mass. It is preferable.
  • the cleaning agent of the present invention is an aqueous cleaning agent obtained by dissolving the components (A) to (D) in water.
  • the water in the cleaning agent dissolves the above-mentioned (A) organic phosphonic acid, (B) polycarboxylic acid salt, (C) aromatic sulfonic acid, and (D) amine-alkylene oxide adduct. It is a solvent.
  • this water deionized water, ultrapure water, charged ion water, hydrogen water, ozone water, or the like can be used. Since water has a function of controlling the fluidity of the cleaning agent of the present invention, the content thereof can be appropriately set according to the target cleaning characteristics such as the cleaning speed.
  • the content ratio of water to the total amount of the components (A) to (D) and water is 55 to 98% by mass.
  • a cleaning agent containing the components (A) to (D) and water in the above ranges is also referred to as a “cleaning agent stock solution”.
  • additives can be added to water.
  • examples of other additives include a dispersant, a water-soluble organic solvent, an antioxidant, a rust inhibitor, a pH adjuster, a buffer, an antifoaming agent, an antiseptic, and a hydrotrope.
  • the cleaning agent of the present invention configured as described above cleans a glass substrate using a polishing agent containing abrasive grains mainly composed of cerium oxide, and a glass substrate after the polishing step.
  • a polishing agent containing abrasive grains mainly composed of cerium oxide In the manufacturing method of the glass substrate including at least 2 process with a washing
  • the cleaning agent stock solution is further diluted with water so that the content (concentration) of the cleaning agent stock solution is 0.5 to 2.5% by mass. Are preferably used. By diluting with water as described above, it is possible to satisfactorily remove the abrasive grains made of cerium oxide and the like that remain and adhere without roughening the surface of the glass substrate.
  • the surface of the glass substrate is polished using a polishing pad and containing abrasive grains containing cerium oxide as a main component and rare earth elements, for example, abrasive grains having an average grain size of 0.5 to 3.0 ⁇ m. It can be set as the process grind
  • the above average particle diameter is a value obtained by measuring the abrasive grains by the air permeation method (Blaine method).
  • the average particle diameter is expressed in the present specification, the value obtained by this measurement method. Say.
  • the abrasive grains containing cerium oxide as a main component and containing a rare earth element include 45% by mass or more of cerium oxide and 0% of a rare earth element compound (for example, rare earth element oxide). This refers to those containing from 55% to 55% by weight.
  • rare earth elements include La, Pr, and Nd.
  • the cleaning step can be carried out by a method in which the cleaning agent of the present invention is brought into direct contact with the polished glass substrate and cleaned by a single wafer method.
  • the cleaning nozzle 4 is provided on both upper and lower surfaces of the glass substrate 3 that is continuously transported in the cleaning chamber 2 in the horizontal direction by a mechanism such as a transport roll 1.
  • a method of scribing with the rotating brush 6 disposed on both sides while spraying the sprayed cleaning agent 5 is employed.
  • the temperature of the cleaning agent 5 is not particularly limited, and is used at room temperature (15 ° C.) to 95 ° C. If the temperature exceeds 95 ° C., water may be boiled, which is inconvenient in the washing operation and is not preferable.
  • the rotating brush 6 for cleaning for example, a plurality of cylindrical brushes made of PVA (polyvinyl alcohol) sponge and having an outer diameter of 70 to 100 mm can be used. In this case, for example, these brushes are arranged such that the rotation axis is perpendicular to the surface to be cleaned of the glass substrate 3 and the tip part is in contact with the surface to be cleaned of the glass substrate 3 or less than 2 mm. Arrange them at intervals.
  • the rotation speed of the rotary brush 6 is preferably 100 to 500 rpm.
  • the cleaning agent 5 a solution obtained by diluting the above-described cleaning agent stock solution of the present invention with water so as to have a desired concentration can be used.
  • the injection amount can be 15 to 40 liters / minute.
  • a test piece was prepared. That is, a known polishing cerium oxide (CeO 2 ) on one side of a glass substrate (product name: AN100; manufactured by Asahi Glass Co., Ltd., hereinafter the same) having a length of 5.0 cm ⁇ width of 4.0 cm ⁇ thickness of 0.07 cm. A 4% by mass aqueous solution of particles (average particle size 0.8 to 1.0 ⁇ m) was added dropwise and dried at room temperature for 20 minutes. Thus, as a test piece, a glass substrate (hereinafter, referred to as a particle-attached glass substrate) having white cerium oxide (CeO 2 ) particles attached on one side was produced.
  • a glass substrate hereinafter, referred to as a particle-attached glass substrate having white cerium oxide (CeO 2 ) particles attached on one side was produced.
  • ⁇ Preliminary test 2 for cleaning performance of cerium oxide> A 4% by mass aqueous solution of a known polishing cerium oxide (CeO 2 ) particle (average particle size 0.8 to 1.0 ⁇ m) is dropped on one side of the same glass substrate (trade name: AN100) for 60 minutes at room temperature. It was made to dry and the cerium oxide particle adhesion glass substrate was produced.
  • a known polishing cerium oxide (CeO 2 ) particle average particle size 0.8 to 1.0 ⁇ m
  • each component shown in Table 3 was blended with the composition shown in the same table to prepare a detergent stock solution.
  • the cleaning property of the cleaning agent stock solution thus obtained was examined as follows. That is, after the obtained cleaning agent stock solution (including water) was diluted by adding water so that the concentration became 2% by mass, the above-mentioned particle-attached glass substrate was immersed in this cleaning dilution solution at room temperature for 9 hours. did. And the surface state of the glass substrate after immersion was observed with the naked eye, and the detergency was evaluated according to the following criteria. The evaluation results are shown in Table 3. (Evaluation criteria) ⁇ : The cerium oxide particles on the glass substrate surface are completely removed. ⁇ : Some cerium oxide particles remain on the glass substrate surface. X: The cerium oxide particle is hardly removed and remains on the glass substrate surface.
  • Example 3 The glass substrate after the polishing step was cleaned by the method shown in FIG.
  • the concentration of the stock solution (concentration of the stock solution containing water) of the cleaning agent stock solution obtained in Example 1 (hereinafter referred to as organic acid system 1) is 0.5% by mass.
  • the detergent stock solution obtained in Example 2 (hereinafter referred to as “organic acid system 2”) was used as the concentration of the stock solution (the concentration of the stock solution containing water).
  • a diluted washing solution diluted with water so as to be 0.5% by mass was used.
  • the alkaline detergent is a detergent comprising potassium hydroxide and sodium hydroxide as inorganic alkali, ethylenediaminetetraacetate as a chelating agent, and polyoxyethylene dodecyl ether as a surfactant, and the balance water.
  • AN100 (trade name) is used, and in the polishing step, the surface of the glass substrate is polished mainly using known cerium oxide particles having an average particle diameter of 0.8 to 1.0 ⁇ m as an abrasive.
  • An abrasive slurry containing abrasive grains (trade name SHOROX A10; manufactured by Showa Denko KK) was used, and the polishing was performed using a polishing pad.
  • the various diluted cleaning solutions described above are sprayed onto the surface of the polished glass substrate at a rate of 250 to 700 mL per second, and a PVA brush rotating at a speed of 100 to 500 rpm for 6 to 10 seconds. Scrub.
  • Examples 5 to 8, Comparative Examples 7 and 8 In Examples 5 to 8, as shown in Table 5, a diluted cleaning solution in which the organic acid system 1 or the organic acid system 2 was diluted with water to the concentration shown in the same table was used, and the polishing process was performed by the method shown in FIG. The glass substrate was cleaned. In Comparative Examples 7 and 8, a conventional alkaline cleaning agent diluted to the concentration shown in Table 5 was used, and cleaning was performed in the same manner. The alkaline cleaning agent is the same cleaning agent used in Comparative Example 6.
  • AN100 As a glass substrate, AN100 (trade name) is used, and in the polishing step, the surface of the glass substrate is composed mainly of known cerium oxide particles for polishing having an average particle size of 0.8 to 1.0 ⁇ m as an abrasive.
  • a polishing agent slurry (trade name SHOROX A10) containing polishing abrasive grains to be used was used, and a polishing pad was used.
  • the diluted cleaning solution was sprayed onto the surface of the polished glass substrate at a rate of 250 to 700 mL per second, and scrubbed with a PVA brush rotating at a speed of 100 to 500 rpm for 6 to 10 seconds.
  • the number of particles such as abrasive grains remaining on the surface of the glass substrate was measured separately for each particle slice level.
  • the slice level is one of the classification methods.
  • the particle size is classified based on the intensity of the scattered light by irradiating the particles with laser light.
  • the measurement was performed by a laser scattering imaging method (HS830E; manufactured by Toray Engineering Co., Ltd.). Table 5 shows the measurement results.
  • Examples 5 to 8 where cleaning was performed using a diluted cleaning solution diluted to a concentration particles (particles) residue on the surface of the glass substrate compared to Comparative Examples 7 and 8 using an alkaline cleaning agent
  • the residual of fine particles of abrasive grains having a size (slice level) of about 0.3 ⁇ m was extremely small.
  • the cleaning agent of the present invention can be used for FPD because it can disperse and remove abrasive grains made of cerium oxide or the like remaining on or adhered to the surface of the glass substrate after polishing without impairing the flatness of the glass substrate after polishing. It can be effectively applied to a glass substrate cleaning method.

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  • Detergent Compositions (AREA)
  • Surface Treatment Of Glass (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning In General (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

In order to disperse and remove abrasive grains left behind or deposited on a surface without compromising the flatness of a glass substrate polished using a cerium oxide-containing polishing agent, the present invention provides a water-based cleaning agent that contains (A) an organic phosphonic acid, (B) a polycaboxylate, (C) an aromatic sulfonic acid, and (D) an amine-alkylene oxide adduct, in order to clean a glass substrate polished using a cerium oxide-containing polishing agent. The method for cleaning a glass substrate has a polishing step for polishing a glass substrate using a polishing agent containing cerium oxide, and a cleaning step for cleaning the glass substrate using the cleaning agent after the polishing step.

Description

洗浄剤およびガラス基板の洗浄方法Cleaning agent and glass substrate cleaning method
 本発明は、酸化セリウム含有研磨剤で研磨されたガラス基板を洗浄するための洗浄剤、およびガラス基板の洗浄方法に関する。 The present invention relates to a cleaning agent for cleaning a glass substrate polished with a cerium oxide-containing abrasive and a method for cleaning a glass substrate.
 例えば、液晶ディスプレイ(LCD)等のFPD(Flat Panel Display)用に使用されるガラス基板は、フロート法と呼ばれる製法により溶融ガラスを板状に成形し、切断して得られたガラス基板を、例えば自転および公転する研磨具で研磨して、表面の微小な凹凸やうねりを除去することによって、FPD用ガラス基板に要求される平坦度を満足した所定の厚さ(例えば、0.4~1.1mm)の薄板状に製造されている(例えば、特許文献1参照)。 For example, a glass substrate used for FPD (Flat Panel Display) such as a liquid crystal display (LCD) is obtained by forming a molten glass into a plate shape by a manufacturing method called a float method, and cutting the glass substrate, for example, By polishing with a rotating and revolving polishing tool to remove minute irregularities and waviness on the surface, a predetermined thickness satisfying the flatness required for the glass substrate for FPD (for example, 0.4 to 1.. 1 mm) (see, for example, Patent Document 1).
 このようなガラス基板を研磨するために、酸化セリウムを主成分としランタンなどの希土類元素を含む研磨砥粒が使用されているが、FPD用ガラス基板のような高い平坦性を要求されるガラス基板においては、基板表面の研磨剤の残留が問題となっている。そのため、研磨後、ガラス基板表面に付着している研磨剤(砥粒)を洗浄し除去することが行われている(例えば、特許文献2参照)。 In order to polish such a glass substrate, polishing abrasive grains containing cerium oxide as a main component and containing a rare earth element such as lanthanum are used. However, a glass substrate that requires high flatness such as an FPD glass substrate. In this case, the remaining abrasive on the substrate surface is a problem. For this reason, after polishing, the polishing agent (abrasive grains) adhering to the glass substrate surface is washed and removed (see, for example, Patent Document 2).
 通常の研磨剤の洗浄および除去には、アルカリ成分を含有してなる洗浄剤が使用されているが、酸化セリウムを主成分とする砥粒を含む研磨剤に対しては、アルカリ系洗浄剤では洗浄性が不十分であった。また、酸化セリウムを主成分とする砥粒の洗浄・除去性を高めるために、無機または有機のアルカリ成分と界面活性剤とを含む洗浄剤も使用されているが、粒径がサブミクロンオーダーの砥粒残渣を十分に低減することができなかった。 For cleaning and removal of normal abrasives, cleaning agents containing alkali components are used, but for abrasives containing abrasive grains mainly composed of cerium oxide, The detergency was insufficient. In addition, in order to improve the cleaning / removability of abrasive grains mainly composed of cerium oxide, a cleaning agent containing an inorganic or organic alkali component and a surfactant is also used. Abrasive grain residues could not be reduced sufficiently.
 さらに、ガラス基板上の砥粒の残渣を除去するため、有機酸の1種であるクエン酸を含む洗浄剤を使用し、酸化セリウムを溶かすことが考えられている。しかしながら、有機酸としてクエン酸を用いた洗浄剤では、初期の洗浄特性は良好であるが、経時的に排液中の砥粒残渣が凝集し、排水処理に不具合が生じるという問題があった。 Furthermore, in order to remove abrasive residues on the glass substrate, it is considered to use a cleaning agent containing citric acid, which is one of organic acids, to dissolve cerium oxide. However, the cleaning agent using citric acid as the organic acid has good initial cleaning characteristics, but there is a problem that the abrasive residue in the drainage agglomerates with time, resulting in problems in wastewater treatment.
日本特開2007-190657号公報Japanese Unexamined Patent Publication No. 2007-190657 日本特開2009-215093号公報Japanese Unexamined Patent Publication No. 2009-215093
 本発明は、上記問題を解決するためになされたもので、ガラス基板の平坦性を損なうことなく、その表面に残留および/または付着した研磨砥粒を分散して除去することができるガラス基板用洗浄剤、およびガラス基板の洗浄方法を提供することを目的としている。 The present invention has been made to solve the above-described problems, and for glass substrates that can disperse and remove the abrasive grains remaining and / or adhered to the surface thereof without impairing the flatness of the glass substrate. It aims at providing the cleaning agent and the cleaning method of a glass substrate.
 本発明の第1の態様は、酸化セリウム含有研磨剤で研磨されたガラス基板を洗浄するための洗浄剤であり、(A)有機ホスホン酸と、(B)ポリカルボン酸塩と、(C)芳香族スルホン酸と、(D)アミン-アルキレンオキサイド付加物とを含む水系洗浄剤であることを特徴とする洗浄剤である。 A first aspect of the present invention is a cleaning agent for cleaning a glass substrate polished with a cerium oxide-containing polishing agent, wherein (A) an organic phosphonic acid, (B) a polycarboxylate, and (C) A cleaning agent characterized by being a water-based cleaning agent containing an aromatic sulfonic acid and (D) an amine-alkylene oxide adduct.
 第1の態様の洗浄剤において、前記(A)有機ホスホン酸と、前記(B)ポリカルボン酸塩と、前記(C)芳香族スルホン酸、および前記(D)アミン-アルキレンオキサイド付加物の合計量に対して、前記(A)有機ホスホン酸を0.01~50質量%、前記(B)ポリカルボン酸塩を0.01~10質量%、前記(C)芳香族スルホン酸を0.01~50質量%、前記(D)アミン-アルキレンオキサイド付加物を0.02~10質量%含むことが好ましい。
 また、前記(A)有機ホスホン酸は、式:-P(=O)(OH)で表わされる基が炭素原子に結合した構造を有する有機化合物であることが好ましい。
 さらに、前記(D)アミン-アルキレンオキサイド付加物は、アルキレンジアミンのプロピレンオキサイド-エチレンオキサイド付加物であることが好ましい。
 さらに、前記(A)有機ホスホン酸と、前記(B)ポリカルボン酸塩と、前記(C)芳香族スルホン酸と、前記(D)アミン-アルキレンオキサイド付加物と、水とを含み、前記(A)から(D)の各成分および水の合計量に対して、水を55~98質量%含むことが好ましい。
 上記した数値範囲を示す「~」とは、その前後に記載された数値を下限値および上限値として含む意味で使用され、特段の定めがない限り、以下本明細書において「~」は、同様の意味をもって使用される。
In the cleaning agent of the first aspect, the sum of the (A) organic phosphonic acid, the (B) polycarboxylic acid salt, the (C) aromatic sulfonic acid, and the (D) amine-alkylene oxide adduct The amount of the (A) organic phosphonic acid is 0.01 to 50% by mass, the amount of the (B) polycarboxylic acid salt is 0.01 to 10% by mass, and the amount of the (C) aromatic sulfonic acid is 0.01% by mass. It is preferable that the content of the amine-alkylene oxide adduct is 0.02 to 10% by mass.
The organic phosphonic acid (A) is preferably an organic compound having a structure in which a group represented by the formula: —P (═O) (OH) 2 is bonded to a carbon atom.
Further, the (D) amine-alkylene oxide adduct is preferably a propylene oxide-ethylene oxide adduct of alkylenediamine.
And (A) an organic phosphonic acid, the (B) polycarboxylate, the (C) aromatic sulfonic acid, the (D) amine-alkylene oxide adduct, and water, It is preferable to contain 55 to 98% by mass of water with respect to the total amount of each component of A) to (D) and water.
The term “to” indicating the above numerical range is used in the sense that the numerical values described before and after it are used as the lower limit value and the upper limit value, and unless otherwise specified, “to” is the same hereinafter. Used with meaning.
 本発明の第2の態様は、ガラス基板の洗浄方法であり、酸化セリウムを含有する研磨剤を用いてガラス基板を研磨する研磨工程と、当該研磨工程後の該ガラス基板を、前記第1の態様の洗浄剤により洗浄する洗浄工程とを有することを特徴とする。 A second aspect of the present invention is a method for cleaning a glass substrate, wherein a polishing step of polishing a glass substrate using an abrasive containing cerium oxide, and the glass substrate after the polishing step are combined with the first substrate. And a cleaning step of cleaning with the cleaning agent according to the aspect.
 第2の態様のガラス基板の洗浄方法において、前記研磨剤は、酸化セリウムを主成分とし希土類元素を含む研磨砥粒を含有するものが好ましく使用ができる。
 また、前記洗浄工程において、前記ガラス基板を枚葉式により、好ましく洗浄することができる。
 さらに、前記洗浄剤を水で希釈した希釈洗浄液により、前記研磨工程後の該ガラス基板を洗浄することが好ましい。
 さらに、前記洗浄工程において、連続的に搬送される前記ガラス基板の両面を、前記洗浄剤を吹き付けながらブラシを用いてスクラブすることにより、好ましく洗浄することができる。
In the glass substrate cleaning method according to the second aspect, the abrasive preferably contains abrasive grains containing cerium oxide as a main component and a rare earth element.
In the cleaning step, the glass substrate can be preferably cleaned by a single wafer type.
Furthermore, it is preferable to clean the glass substrate after the polishing step with a diluted cleaning solution obtained by diluting the cleaning agent with water.
Furthermore, in the said washing | cleaning process, it can wash | clean preferably by scrubbing both surfaces of the said glass substrate conveyed continuously using a brush, spraying the said cleaning agent.
 本発明の洗浄剤によれば、酸化セリウムを含有する研磨剤で研磨されたガラス基板の平坦性を損なうことなく、その表面に残留・付着した酸化セリウム等からなる研磨砥粒を分散して除去することができる。 According to the cleaning agent of the present invention, polishing abrasive grains made of cerium oxide or the like remaining on and adhered to the surface of the glass substrate polished with an abrasive containing cerium oxide are dispersed and removed without impairing the flatness of the glass substrate. can do.
 また、本発明の洗浄方法によれば、酸化セリウムを含有する研磨剤による研磨後のガラス基板を、表面の平坦性を損なうことなく効率的に洗浄し、表面に研磨砥粒のような異物の残留が極めて少ないガラス基板を提供することができる。 Further, according to the cleaning method of the present invention, the glass substrate after polishing with the abrasive containing cerium oxide is efficiently cleaned without impairing the flatness of the surface, and the surface is free of foreign substances such as abrasive grains. A glass substrate with very little residue can be provided.
本発明のガラス基板の洗浄方法の一実施形態を示す図である。It is a figure which shows one Embodiment of the washing | cleaning method of the glass substrate of this invention.
 以下、本発明の実施の形態を、LCD等のFPD用として使用されるガラス基板を洗浄する洗浄剤およびその洗浄剤を用いた洗浄方法を例にして説明する。酸化セリウム含有研磨剤で研磨されたFPD用ガラス基板は、研磨後のガラス基板上の研磨剤の残渣を除去するために洗浄が行われ、本発明の実施の形態は、この洗浄のための洗浄剤および洗浄方法である。本発明はこれらの実施形態に限定されるものではなく、本発明の趣旨に合致する限り、他の実施の形態も本発明の範疇に属し得る。 Hereinafter, an embodiment of the present invention will be described by taking as an example a cleaning agent for cleaning a glass substrate used for FPD such as an LCD and a cleaning method using the cleaning agent. The FPD glass substrate polished with the cerium oxide-containing polishing agent is cleaned to remove the residue of the polishing agent on the polished glass substrate, and the embodiment of the present invention is a cleaning for this cleaning. Agent and cleaning method. The present invention is not limited to these embodiments, and other embodiments may belong to the category of the present invention as long as they match the gist of the present invention.
 本発明の第1の実施形態は、FPD用ガラス基板の洗浄剤であり、(A)有機ホスホン酸と、(B)ポリカルボン酸塩と、(C)芳香族スルホン酸と、(D)アミン-アルキレンオキサイド付加物とを含む水系洗浄剤である。 1st Embodiment of this invention is a cleaning agent of the glass substrate for FPD, (A) organic phosphonic acid, (B) polycarboxylate, (C) aromatic sulfonic acid, (D) amine -An aqueous detergent containing an alkylene oxide adduct.
 この洗浄剤によれば、研磨後のガラス基板の表面に残留および/または付着した酸化セリウム等からなる研磨砥粒を、良好に分散して除去することができ、ガラス基板の平坦性を損なうこともない。また、洗浄排液中の砥粒残渣が経時的に凝集することがなく、洗浄排液の処理も良好に行なうことができる。 According to this cleaning agent, polishing abrasive grains made of cerium oxide or the like remaining on and / or attached to the surface of the polished glass substrate can be well dispersed and removed, thereby impairing the flatness of the glass substrate. Nor. In addition, the abrasive residue in the cleaning waste liquid does not aggregate over time, and the cleaning drainage can be processed well.
 本発明の第1の実施形態であるガラス基板の洗浄剤において、(A)成分である有機ホスホン酸は、酸化セリウムに対するキレート剤として作用し、ガラス基板の表面に残留および/または付着する酸化セリウム等からなる研磨砥粒の分散を促し、ガラス基板表面から引き剥がし、除去する働きをする。 In the glass substrate cleaning agent according to the first embodiment of the present invention, the organic phosphonic acid as component (A) acts as a chelating agent for cerium oxide, and remains and / or adheres to the surface of the glass substrate. It promotes the dispersion of abrasive grains composed of, etc., and peels off from the surface of the glass substrate to remove it.
 本発明において、(A)成分である有機ホスホン酸とは、式:-P(=O)(OH)で表わされる基(以下、ホスホン酸基という。)が炭素原子に結合した構造を有する有機化合物をいう。有機ホスホン酸1分子あたりのホスホン酸基の数は、2以上が好ましく、2~8がより好ましく、2~4が特に好ましい。 In the present invention, the organic phosphonic acid which is the component (A) has a structure in which a group represented by the formula: —P (═O) (OH) 2 (hereinafter referred to as a phosphonic acid group) is bonded to a carbon atom. An organic compound. The number of phosphonic acid groups per molecule of organic phosphonic acid is preferably 2 or more, more preferably 2 to 8, and particularly preferably 2 to 4.
 本発明における有機ホスホン酸としては、置換基を有していてもよい炭化水素類の炭素に結合した水素原子を、ホスホン酸基に置換した構造を有する化合物、および、アンモニアやアミン類の窒素原子に結合した水素原子を、-CH-P(=O)(OH)で表わされるメチレンホスホン酸基に置換した構造を有する化合物、が好ましい。 As the organic phosphonic acid in the present invention, a compound having a structure in which a hydrogen atom bonded to carbon of a hydrocarbon which may have a substituent is substituted with a phosphonic acid group, and a nitrogen atom of ammonia or amines A compound having a structure in which a hydrogen atom bonded to is substituted with a methylenephosphonic acid group represented by —CH 2 —P (═O) (OH) 2 is preferable.
 上記前者の構造の有機ホスホン酸において、置換基を有していてもよい炭化水素類としては、脂肪族炭化水素および水酸基含有脂肪族炭化水素が好ましい。これら脂肪族炭化水素等において、その炭素数は1~6が好ましく、また水酸基数は2以下が好ましい。この構造を有する有機ホスホン酸としては、具体的には、例えば、メチルジホスホン酸、および1-ヒドロキシエタン-1,1-ジホスホン酸等を挙げることができる。
 下記メチレンホスホン酸基を有する構造の有機ホスホン酸も含めて、本発明における有機ホスホン酸としては、水酸基含有脂肪族炭化水素の炭素に結合した水素原子をホスホン酸基に置換した構造を有する化合物が特に好ましく、具体的には、1-ヒドロキシエタン-1,1-ジホスホン酸が最も好ましい。
In the organic phosphonic acid having the former structure, the hydrocarbon which may have a substituent is preferably an aliphatic hydrocarbon or a hydroxyl group-containing aliphatic hydrocarbon. In these aliphatic hydrocarbons, the number of carbon atoms is preferably 1 to 6, and the number of hydroxyl groups is preferably 2 or less. Specific examples of the organic phosphonic acid having this structure include methyl diphosphonic acid and 1-hydroxyethane-1,1-diphosphonic acid.
The organic phosphonic acid in the present invention, including organic phosphonic acid having a structure having the following methylenephosphonic acid group, includes a compound having a structure in which a hydrogen atom bonded to carbon of a hydroxyl group-containing aliphatic hydrocarbon is substituted with a phosphonic acid group. Particularly preferred, specifically, 1-hydroxyethane-1,1-diphosphonic acid is most preferred.
 前記後者の構造の有機ホスホン酸としては、アンモニアや脂肪族アミンの窒素原子に結合した水素原子の全てが、メチレンホスホン酸基に置換した構造を有する化合物が好ましい。ただし、アミン類窒素原子に結合した水素原子の一部は、アルキル基等の有機基に置換されていてもよい。脂肪族アミンとしては、アルキレンジアミンやその多量体であるポリアルキレンポリアミンが好ましい。アルキレンジアミンの炭素数は2~4が好ましい。これらアミン類の窒素原子に結合した水素原子(メチレンホスホン酸基に置換される水素原子)の数は2~8が好ましく、2~4がより好ましい。 As the organic phosphonic acid having the latter structure, a compound having a structure in which all hydrogen atoms bonded to nitrogen atoms of ammonia or aliphatic amines are substituted with methylenephosphonic acid groups is preferable. However, a part of hydrogen atoms bonded to amine nitrogen atoms may be substituted with an organic group such as an alkyl group. As the aliphatic amine, an alkylene diamine or a polyalkylene polyamine which is a multimer thereof is preferable. The alkylenediamine preferably has 2 to 4 carbon atoms. The number of hydrogen atoms bonded to nitrogen atoms of these amines (hydrogen atoms substituted for methylenephosphonic acid groups) is preferably 2 to 8, and more preferably 2 to 4.
 この構造を有する有機ホスホン酸としては、具体的には、アミノトリ(メチレンホスホン酸)、エチレンジアミンテトラ(メチレンホスホン酸)、ヘキサメチレンジアミンテトラ(メチレンホスホン酸)、プロピレンジアミンテトラ(メチレンホスホン酸)、ジエチレントリアミンペンタ(メチレンホスホン酸)、トリエチレンテトラミンヘキサ(メチレンホスホン酸)、トリス(2-アミノエチル)アミンヘキサ(メチレンホスホン酸)、トランス-1、2-シクロヘキサンジアミンテトラ(メチレンホスホン酸)、グリコールエーテルジアミンテトラ(メチレンホスホン酸)、およびテトラエチレンペンタミンヘプタ(メチレンホスホン酸)等を挙げることができる。 Specific examples of organic phosphonic acids having this structure include aminotri (methylenephosphonic acid), ethylenediaminetetra (methylenephosphonic acid), hexamethylenediaminetetra (methylenephosphonic acid), propylenediaminetetra (methylenephosphonic acid), and diethylenetriamine. Penta (methylenephosphonic acid), triethylenetetraminehexa (methylenephosphonic acid), tris (2-aminoethyl) aminehexa (methylenephosphonic acid), trans-1,2-cyclohexanediaminetetra (methylenephosphonic acid), glycol etherdiaminetetra (Methylene phosphonic acid), and tetraethylene pentamine hepta (methylene phosphonic acid).
 (B)成分であるポリカルボン酸塩と(C)成分である芳香族スルホン酸とは、前記(A)有機ホスホン酸による研磨砥粒の分散性および/または除去性を向上させるとともに、研磨砥粒の再付着を防止する働きをする。(B)成分であるポリカルボン酸塩としては、ポリ(メタ)アクリル酸塩、(メタ)アクリル酸-マレイン酸共重合体の塩等を例示することができる。
 ここで、(メタ)アクリル酸という表記は、アクリル酸とメタクリル酸の両方を意味する。ポリカルボン酸の重量平均分子量(以下、Mwと略記。)は、研磨砥粒の再付着防止および低泡性の観点から、2,000~50,000の範囲であることが好ましい。なお、Mwは、ゲルパーミエーションクロマトグラフィー(以下、GPCと略記。)によって、測定された値である。
The (B) component polycarboxylate and the (C) component aromatic sulfonic acid improve the dispersibility and / or removability of the abrasive grains by the (A) organic phosphonic acid, and polish the abrasive. It works to prevent the reattachment of grains. Examples of the polycarboxylic acid salt as the component (B) include poly (meth) acrylates and salts of (meth) acrylic acid-maleic acid copolymers.
Here, the notation (meth) acrylic acid means both acrylic acid and methacrylic acid. The weight average molecular weight (hereinafter abbreviated as Mw) of the polycarboxylic acid is preferably in the range of 2,000 to 50,000 from the viewpoint of preventing reattachment of abrasive grains and low foaming properties. Mw is a value measured by gel permeation chromatography (hereinafter abbreviated as GPC).
 ポリカルボン酸塩において、塩を形成する対イオンは、特に限定されないが、アルカリ金属(例えば、ナトリウムおよびカリウム)塩、アンモニウム塩、1級アミン(例えば、メチルアミン、エチルアミンおよびブチルアミン等のアルキルアミン)塩、2級アミン(例えば、ジメチルアミン、ジエチルアミンおよびジブチルアミン等のジアルキルアミン、ならびにジエタノールアミン)塩、3級アミン(例えば、トリメチルアミン、トリエチルアミンおよびトリブチルアミン等のトリアルキルアミン、トリエタノールアミン、N-メチルジエタノールアミン、ならびに1,8-ジアザビシクロ[5.4.0]-7-ウンデセン(DBU)、1,5-ジアザビシクロ[4.3.0]-5-ノネン(DBN)、または1,4-ジアザビシクロ[2.2.2]オクタン(DABCO)、1Hイミダゾール、2-メチル-1H-イミダゾール、2-エチル-1H-イミダゾール、4,5-ジヒドロ-1Hイミダゾール、2-メチル-4,5-ジヒドロ-1Hイミダゾール、1,4,5,6-テトラヒドロ-ピリミジン、1,6(4)-ジヒドロピリミジン)塩、および第4級アンモニウム塩(例えば、テトラアルキルアンモニウム)塩が好ましい。パーティクルの再付着防止の観点から、これらの中で好ましいものは、アルカリ金属(例えば、ナトリウムおよびカリウム)塩、アンモニウム塩、1級アミン塩、2級アミン塩、3級アミン塩および第4級アンモニウム塩であり、特に好ましいものは、アルカリ金属(例えば、ナトリウムおよびカリウム)塩、アンモニウム塩である。 In the polycarboxylate, the counter ion forming the salt is not particularly limited, but alkali metal (for example, sodium and potassium) salts, ammonium salts, primary amines (for example, alkylamines such as methylamine, ethylamine, and butylamine). Salts, secondary amines (eg, dialkylamines such as dimethylamine, diethylamine and dibutylamine, and diethanolamine) salts, tertiary amines (eg, trialkylamines such as trimethylamine, triethylamine and tributylamine, triethanolamine, N-methyl) Diethanolamine and 1,8-diazabicyclo [5.4.0] -7-undecene (DBU), 1,5-diazabicyclo [4.3.0] -5-nonene (DBN), or 1,4-diazabicyclo [ 2.2] Octane (DABCO), 1H imidazole, 2-methyl-1H-imidazole, 2-ethyl-1H-imidazole, 4,5-dihydro-1H imidazole, 2-methyl-4,5-dihydro-1H imidazole 1,4,5,6-tetrahydro-pyrimidine, 1,6 (4) -dihydropyrimidine) salts, and quaternary ammonium salts (eg, tetraalkylammonium) salts are preferred. From the viewpoint of preventing the reattachment of particles, among these, preferred are alkali metal (for example, sodium and potassium) salts, ammonium salts, primary amine salts, secondary amine salts, tertiary amine salts and quaternary ammonium. Particularly preferred are salts of alkali metals (for example, sodium and potassium) and ammonium salts.
 (C)成分である芳香族スルホン酸としては、炭素数8~14のアルキル基を有するアルキルベンゼンスルホン酸、石油スルホネート、トルエンスルホン酸、キシレンスルホン酸、およびクメンスルホン酸等が挙げられる。特に、メタキシレンスルホン酸(2,4-ジメチルベンゼンスルホン酸)の使用が好ましい。 Examples of the aromatic sulfonic acid (C) include alkylbenzene sulfonic acid having 8 to 14 carbon atoms, petroleum sulfonate, toluene sulfonic acid, xylene sulfonic acid, and cumene sulfonic acid. In particular, use of metaxylene sulfonic acid (2,4-dimethylbenzene sulfonic acid) is preferable.
 (D)成分であるアミン-アルキレンオキサイド付加物は、研磨砥粒とガラス基板との界面への前記(A)有機ホスホン酸の浸透を促進する働きをする。本実施形態においては、アミン-アルキレンオキサイド付加物としては、アルキレンオキサイド付加型のノニオン系界面活性剤として知られている化合物が好ましい。アルキレンオキサイドとしては、エチレンオキサイド(以下、EOともいう。)とプロピレンオキサイド(以下、POともいう。)が好ましく、それらの一方のみを付加した構造の化合物であってもよく、それらの両方を付加した構造の化合物であってもよい。EOとPOの両者を付加した化合物においては、EOの単位(すなわち、オキシエチレン基)とPOの単位(すなわち、オキシプロピレン基)はブロック状に存在していてもよく、ランダム状に存在していてもよい。前者はアミンにEOとPOを別々に順次付加して得られ、後者はアミンにEOとPOの混合物を付加して得られる。本発明においてPO-EO付加物とは、それら付加方法のいずれかで得られる付加物をいう。 The amine-alkylene oxide adduct as the component (D) functions to promote the penetration of the organic phosphonic acid (A) into the interface between the abrasive grains and the glass substrate. In the present embodiment, the amine-alkylene oxide adduct is preferably a compound known as an alkylene oxide addition type nonionic surfactant. As the alkylene oxide, ethylene oxide (hereinafter also referred to as EO) and propylene oxide (hereinafter also referred to as PO) are preferable, and a compound having a structure in which only one of them is added may be added. It may be a compound having the above structure. In a compound in which both EO and PO are added, the EO unit (that is, oxyethylene group) and the PO unit (that is, oxypropylene group) may exist in a block form or in a random form. May be. The former is obtained by sequentially adding EO and PO separately to the amine, and the latter is obtained by adding a mixture of EO and PO to the amine. In the present invention, the PO-EO adduct refers to an adduct obtained by any of these addition methods.
 アルキレンオキサイドが付加されるアミン類としては、窒素原子に結合した水素原子の数が2~8であり、アミノ基の数が1~4のアミン類が好ましい。また、アミン類の炭素数は16以下が好ましく、10以下がより好ましい。このようなアミン類としては、例えば、脂肪族のモノアミンやポリアミン、脂環族のモノアミンやポリアミン、芳香族のモノアミンやポリアミンを挙げることができる。より具体的は、アルキルモノアミン、アルキレンジアミンやその多量体であるポリアルキレンポリアミン、脂環に結合したアミノ基やアミノアルキル基を1個以上有する脂環族のモノアミンやポリアミン、芳香環に結合したアミノ基やアミノアルキル基を1個以上有する脂環族のモノアミンやポリアミンなどが好ましい。 As amines to which alkylene oxide is added, amines having 2 to 8 hydrogen atoms bonded to nitrogen atoms and 1 to 4 amino groups are preferred. Moreover, 16 or less are preferable and, as for carbon number of amines, 10 or less are more preferable. Examples of such amines include aliphatic monoamines and polyamines, alicyclic monoamines and polyamines, and aromatic monoamines and polyamines. More specifically, alkyl monoamines, alkylene diamines and polyalkylene polyamines that are multimers thereof, alicyclic monoamines and polyamines having at least one amino group or aminoalkyl group bonded to an alicyclic ring, and amino groups bonded to an aromatic ring. An alicyclic monoamine or polyamine having at least one group or aminoalkyl group is preferred.
 (D)成分であるアミン-アルキレンオキサイド付加物としては、その少なくとも一部がアルキレンジアミンのPO-EO付加物であることが好ましい。アルキレンジアミンとしては、炭素数2~4のアルキレンジアミンが好ましく、エチレンジアミンが特に好ましい。エチレンジアミンのPO-EO付加物としては、例えばエチレンジアミンの窒素原子に結合した4個の水素原子にPOとEOが付加した化合物を挙げることができる。また、(D)成分であるアミン-アルキレンオキサイド付加物として、前記エチレンジアミンのPO-EO付加物とともに、芳香族アミンのPO付加物を併用することも好ましい。芳香族アミンのPO付加物としては、例えばメタキシリレンジアミンのPO付加物が挙げられる。(D)アミン-アルキレンオキサイド付加物として、エチレンジアミンのPO-EO付加物と芳香族アミンのPO付加物を併用した場合には、洗浄剤の洗浄・除去能力の安定性がより一層向上する。 It is preferable that at least a part of the amine-alkylene oxide adduct as the component (D) is a PO-EO adduct of alkylenediamine. As the alkylene diamine, an alkylene diamine having 2 to 4 carbon atoms is preferable, and ethylene diamine is particularly preferable. Examples of the PO—EO adduct of ethylenediamine include a compound in which PO and EO are added to four hydrogen atoms bonded to the nitrogen atom of ethylenediamine. It is also preferable to use an aromatic amine PO adduct together with the ethylenediamine PO-EO adduct as the amine-alkylene oxide adduct as the component (D). Examples of the PO adducts of aromatic amines include metaxylylenediamine PO adducts. (D) When an amine-alkylene oxide adduct is used in combination with a PO-EO adduct of ethylenediamine and a PO adduct of aromatic amine, the stability of the cleaning / removing ability of the cleaning agent is further improved.
 本発明の洗浄剤の水を含めた全体に対する(A)成分、(B)成分、(C)成分、および(D)成分(以下、(A)成分から(D)成分を纏めて称する場合には、「(A)~(D)」と称することもある。)の各成分の含有割合は、水を含めた(A)~(D)の各成分の合計量に対して、(A)有機ホスホン酸は0.01~50質量%、(B)ポリカルボン酸塩は0.01~10質量%、(C)芳香族スルホン酸は0.01~50質量%、(D)アミン-アルキレンオキサイド付加物は0.02~10質量%であることが好ましい。
 また、(B)ポリカルボン酸塩と(C)芳香族スルホン酸の合計の、水を含めた(A)~(D)の合計量に対する質量%は、0.03~60質量%であることが好ましい。
 (D)アミン-アルキレンオキサイド付加物として、アルキレンジアミンのPO-EO付加物と芳香族アミンのPO付加物を併用する場合は、アルキレンジアミンのPO-EO付加物0.01~5質量%と芳香族アミンのPO付加物0.01~5質量%であって、その合計の、水を含めた(A)~(D)の合計量に対する質量%は、上記0.02~10質量%であることが好ましい。
(A) component, (B) component, (C) component, and (D) component (hereinafter referred to as (A) component to (D) component collectively) with respect to the whole of the cleaning agent of the present invention including water. Is sometimes referred to as “(A) to (D)”.) The content ratio of each component of (A) to (D) with respect to the total amount of each component of (A) to (D) including water is 0.01 to 50% by mass of organic phosphonic acid, 0.01 to 10% by mass of (B) polycarboxylate, 0.01 to 50% by mass of (C) aromatic sulfonic acid, (D) amine-alkylene The oxide adduct is preferably 0.02 to 10% by mass.
Further, the mass% of the total of (B) polycarboxylate and (C) aromatic sulfonic acid with respect to the total amount of (A) to (D) including water is 0.03 to 60 mass%. Is preferred.
(D) When an amine-alkylene oxide adduct is used in combination with an alkylenediamine PO-EO adduct and an aromatic amine PO adduct, 0.01 to 5% by mass of an alkylenediamine PO-EO adduct The PO group adduct of the aromatic amine is 0.01 to 5% by mass, and the total mass% of the total amount of (A) to (D) including water is 0.02 to 10% by mass. It is preferable.
 本発明の洗浄剤は、前記(A)~(D)の各成分を水に溶解させてなる水系洗浄剤である。本発明において、洗浄剤における水は、上記した(A)有機ホスホン酸、(B)ポリカルボン酸塩、(C)芳香族スルホン酸、および(D)アミン-アルキレンオキサイド付加物を溶解するための溶媒である。この水としては、脱イオン水、超純水、電荷イオン水、水素水およびオゾン水などを使用することができる。なお、水は本発明の洗浄剤の流動性を制御する機能を有するので、その含有量は、洗浄速度等の目標とする洗浄特性に合わせて適宜設定することができる。前記(A)~(D)の各成分を前記範囲で含有し、かつ水を含有する洗浄剤において、前記(A)~(D)の各成分および水との合計量に対する水の含有割合は、55~98質量%とすることができる。以下、(A)~(D)の各成分および水を、前記範囲で含有する洗浄剤を、「洗浄剤原液」とも称する。 The cleaning agent of the present invention is an aqueous cleaning agent obtained by dissolving the components (A) to (D) in water. In the present invention, the water in the cleaning agent dissolves the above-mentioned (A) organic phosphonic acid, (B) polycarboxylic acid salt, (C) aromatic sulfonic acid, and (D) amine-alkylene oxide adduct. It is a solvent. As this water, deionized water, ultrapure water, charged ion water, hydrogen water, ozone water, or the like can be used. Since water has a function of controlling the fluidity of the cleaning agent of the present invention, the content thereof can be appropriately set according to the target cleaning characteristics such as the cleaning speed. In the cleaning agent containing each of the components (A) to (D) in the above range and containing water, the content ratio of water to the total amount of the components (A) to (D) and water is 55 to 98% by mass. Hereinafter, a cleaning agent containing the components (A) to (D) and water in the above ranges is also referred to as a “cleaning agent stock solution”.
 本発明の洗浄剤においては、上記(A)~(D)の各成分以外にその他の添加剤を水に配合することができる。その他の添加剤としては、分散剤、水溶性有機溶剤、酸化防止剤、防錆剤、pH調整剤、緩衝剤、消泡剤、防腐剤、ハイドロトロープ剤等が挙げられる。 In the cleaning agent of the present invention, in addition to the components (A) to (D), other additives can be added to water. Examples of other additives include a dispersant, a water-soluble organic solvent, an antioxidant, a rust inhibitor, a pH adjuster, a buffer, an antifoaming agent, an antiseptic, and a hydrotrope.
 以上のように構成される本発明の洗浄剤は、酸化セリウムを主成分とする研磨砥粒を含有する研磨剤を用いてガラス基板を研磨する研磨工程と、研磨工程後のガラス基板を洗浄する洗浄工程との少なくとも2工程を含むガラス基板の製造方法において、洗浄工程に用いられる。本発明の洗浄剤を実際に洗浄に使用するに当たっては、前記洗浄剤原液を、該洗浄剤原液の含有割合(濃度)が0.5~2.5質量%となるように水で更に希釈して使用することが好ましい。このように水で希釈して使用することで、ガラス基板表面を荒らすことなく、残留・付着した酸化セリウム等からなる研磨砥粒を良好に除去することができる。 The cleaning agent of the present invention configured as described above cleans a glass substrate using a polishing agent containing abrasive grains mainly composed of cerium oxide, and a glass substrate after the polishing step. In the manufacturing method of the glass substrate including at least 2 process with a washing | cleaning process, it is used for a washing process. In actually using the cleaning agent of the present invention for cleaning, the cleaning agent stock solution is further diluted with water so that the content (concentration) of the cleaning agent stock solution is 0.5 to 2.5% by mass. Are preferably used. By diluting with water as described above, it is possible to satisfactorily remove the abrasive grains made of cerium oxide and the like that remain and adhere without roughening the surface of the glass substrate.
 研磨工程は、ガラス基板の表面を、研磨パッドを使用し、酸化セリウムを主成分とし、希土類元素を含む研磨砥粒、例えば平均粒径が0.5~3.0μmの研磨砥粒を含む研磨剤スラリーにより研磨する工程とすることができる。上記した平均粒径は、研磨砥粒を空気透過法(ブレーン法:BLAIN method)で測定した値であり、以下、本明細書において平均粒径を表記する場合は、この測定方法により求めた値をいう。
 なお、ここにおいて酸化セリウムを主成分とし、希土類元素を含む研磨砥粒とは、研磨砥粒全体において、酸化セリウムを45質量%以上含み、希土類元素の化合物(例えば、希土類元素酸化物)を0質量%~55質量%含むものを指す。なお、希土類元素としては、La、Pr、Ndなどが挙げられる。
In the polishing step, the surface of the glass substrate is polished using a polishing pad and containing abrasive grains containing cerium oxide as a main component and rare earth elements, for example, abrasive grains having an average grain size of 0.5 to 3.0 μm. It can be set as the process grind | polished with an agent slurry. The above average particle diameter is a value obtained by measuring the abrasive grains by the air permeation method (Blaine method). Hereinafter, when the average particle diameter is expressed in the present specification, the value obtained by this measurement method. Say.
Here, the abrasive grains containing cerium oxide as a main component and containing a rare earth element include 45% by mass or more of cerium oxide and 0% of a rare earth element compound (for example, rare earth element oxide). This refers to those containing from 55% to 55% by weight. Examples of rare earth elements include La, Pr, and Nd.
 洗浄工程は、研磨後のガラス基板に本発明の洗浄剤を直接接触させ、枚葉方式で洗浄する方法で行なうことができる。本発明の洗浄方法においては、例えば、図1に示すように、搬送ロール1等の機構により洗浄室2内を水平方向に連続的に搬送されるガラス基板3の上下両面に、洗浄ノズル4から噴射された洗浄剤5を吹き付けながら、両面側に配置された回転ブラシ6で擦る(scribe)方法が採られる。 The cleaning step can be carried out by a method in which the cleaning agent of the present invention is brought into direct contact with the polished glass substrate and cleaned by a single wafer method. In the cleaning method of the present invention, for example, as shown in FIG. 1, the cleaning nozzle 4 is provided on both upper and lower surfaces of the glass substrate 3 that is continuously transported in the cleaning chamber 2 in the horizontal direction by a mechanism such as a transport roll 1. A method of scribing with the rotating brush 6 disposed on both sides while spraying the sprayed cleaning agent 5 is employed.
 ここで、洗浄剤5の温度は、特に限定されることはなく、室温(15℃)~95℃で使用される。95℃を越える場合には水が沸騰するおそれがあり、洗浄操作上不便であり好ましくない。また、洗浄用の回転ブラシ6としては、例えば、PVA(ポリビニルアルコール)のスポンジ製で外径70~100mmの円柱形状のものを複数個使用することができる。そして、この場合、例えば、これらのブラシを、回転軸がガラス基板3の被洗浄面に対して垂直になるように、かつ先端部がガラス基板3の被洗浄面と接触するか、2mm未満の間隔となるように配置する。回転ブラシ6の回転速度は、100~500rpmとすることが好ましい。 Here, the temperature of the cleaning agent 5 is not particularly limited, and is used at room temperature (15 ° C.) to 95 ° C. If the temperature exceeds 95 ° C., water may be boiled, which is inconvenient in the washing operation and is not preferable. Further, as the rotating brush 6 for cleaning, for example, a plurality of cylindrical brushes made of PVA (polyvinyl alcohol) sponge and having an outer diameter of 70 to 100 mm can be used. In this case, for example, these brushes are arranged such that the rotation axis is perpendicular to the surface to be cleaned of the glass substrate 3 and the tip part is in contact with the surface to be cleaned of the glass substrate 3 or less than 2 mm. Arrange them at intervals. The rotation speed of the rotary brush 6 is preferably 100 to 500 rpm.
 洗浄剤5としては、前記した本発明の洗浄剤原液を所望の濃度になるように水で希釈して希釈洗浄液としたものを使用することができる。噴射量は、15~40リットル/分とすることができる。 As the cleaning agent 5, a solution obtained by diluting the above-described cleaning agent stock solution of the present invention with water so as to have a desired concentration can be used. The injection amount can be 15 to 40 liters / minute.
 以下に本発明の実施例について具体的に説明するが、本発明はこれらの実施例に限定されるものではない。以下の例において、「%」は、特に断らない限り質量%を意味する。 Examples of the present invention will be specifically described below, but the present invention is not limited to these examples. In the following examples, “%” means mass% unless otherwise specified.
<酸化セリウムの洗浄性に関する予備試験1>
 まず、試験片を作製した。すなわち、縦5.0cm×横4.0cm×厚さ0.07cmのガラス基板(商品名:AN100;旭硝子(株)製。以下、同様)の片面に、公知の研磨用酸化セリウム(CeO)粒子(平均粒径0.8~1.0μm)の4質量%水溶液を滴下し、室温で20分間乾燥させた。こうして、試験片として、片面に白色の酸化セリウム(CeO)粒子が付着したガラス基板(以下、粒子付着ガラス基板と示す。)を作製した。
<Preliminary test 1 for detergency of cerium oxide>
First, a test piece was prepared. That is, a known polishing cerium oxide (CeO 2 ) on one side of a glass substrate (product name: AN100; manufactured by Asahi Glass Co., Ltd., hereinafter the same) having a length of 5.0 cm × width of 4.0 cm × thickness of 0.07 cm. A 4% by mass aqueous solution of particles (average particle size 0.8 to 1.0 μm) was added dropwise and dried at room temperature for 20 minutes. Thus, as a test piece, a glass substrate (hereinafter, referred to as a particle-attached glass substrate) having white cerium oxide (CeO 2 ) particles attached on one side was produced.
 次いで、表1に示す有機酸を1質量%の濃度で含有する酸水溶液を調製した。そして、この水溶液中に前記した粒子付着ガラス基板を室温で1時間浸漬した。そして、浸漬後のガラス基板の表面状態を肉眼で観察し、下記基準に従って洗浄性を評価した。評価結果を表1に示す。
(評価基準)
○:ガラス基板表面から酸化セリウム粒子が完全に除去されている。
△:ガラス基板表面に酸化セリウム粒子が若干残留している。
×:酸化セリウム粒子の残留が見られる。
Next, an acid aqueous solution containing the organic acid shown in Table 1 at a concentration of 1% by mass was prepared. And the above-mentioned particle adhesion glass substrate was immersed in this aqueous solution at room temperature for 1 hour. And the surface state of the glass substrate after immersion was observed with the naked eye, and the detergency was evaluated according to the following criteria. The evaluation results are shown in Table 1.
(Evaluation criteria)
○: The cerium oxide particles are completely removed from the glass substrate surface.
Δ: Some cerium oxide particles remain on the glass substrate surface.
X: Residue of cerium oxide particles is observed.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 表1の結果から、有機酸として1-ヒドロキシエタン-1,1-ジホスホン酸を用いた場合に、酸化セリウムの洗浄性が高く、ガラス基板表面の酸化セリウム粒子が良好に除去されることがわかった。 From the results in Table 1, it can be seen that when 1-hydroxyethane-1,1-diphosphonic acid is used as the organic acid, the cerium oxide has a high detergency and the cerium oxide particles on the glass substrate surface are well removed. It was.
<酸化セリウムの洗浄性に関する予備試験2>
 同上のガラス基板(商品名:AN100)の片面に、公知の研磨用酸化セリウム(CeO)粒子(平均粒径0.8~1.0μm)の4質量%水溶液を滴下し、室温で60分間乾燥させて、酸化セリウム粒子付着ガラス基板を作製した。
<Preliminary test 2 for cleaning performance of cerium oxide>
A 4% by mass aqueous solution of a known polishing cerium oxide (CeO 2 ) particle (average particle size 0.8 to 1.0 μm) is dropped on one side of the same glass substrate (trade name: AN100) for 60 minutes at room temperature. It was made to dry and the cerium oxide particle adhesion glass substrate was produced.
 次いで、表2に示す、酸化セリウム粒子の分散性を改良すると考えられる各種の界面活性剤等の化合物をそれぞれ1質量%の割合(濃度)で含有する水溶液を調製した後、この水溶液中に前記した酸化セリウム粒子付着ガラス基板を室温で20時間浸漬した。そして、浸漬後のガラス基板の表面状態を肉眼で観察し、下記基準に従って酸化セリウム粒子の分散除去性を評価した。評価結果を表2に示す。なお、使用した化合物は界面活性剤等として市販されている化合物である。
(評価基準)
○:ガラス基板表面の酸化セリウム粒子が、界面活性剤の水溶液中に分散され、完全に除去されている。
△:酸化セリウム粒子の界面活性剤水溶液中への分散および/または除去が、ともに不十分である。酸化セリウム粒子は水溶液中で塊状になって沈降している。
×:酸化セリウム粒子の界面活性剤水溶液中への分散および/または除去がほとんど見られない。
Next, after preparing an aqueous solution containing compounds such as various surfactants, which are considered to improve the dispersibility of the cerium oxide particles, shown in Table 2 at a ratio (concentration) of 1% by mass, The cerium oxide particle-attached glass substrate was immersed at room temperature for 20 hours. And the surface state of the glass substrate after immersion was observed with the naked eye, and the dispersibility of the cerium oxide particles was evaluated according to the following criteria. The evaluation results are shown in Table 2. In addition, the used compound is a compound marketed as surfactant.
(Evaluation criteria)
○: The cerium oxide particles on the surface of the glass substrate are dispersed in the surfactant aqueous solution and completely removed.
Δ: Both dispersion and / or removal of the cerium oxide particles in the surfactant aqueous solution are insufficient. The cerium oxide particles are agglomerated and precipitated in the aqueous solution.
X: Almost no dispersion and / or removal of the cerium oxide particles in the surfactant aqueous solution is observed.
Figure JPOXMLDOC01-appb-T000002
Figure JPOXMLDOC01-appb-T000002
 表2の結果から、以下のことが確かめられた。すなわち、酸化セリウム粒子の分散性の観点から、ポリカルボン酸塩、メタキシレンスルホン酸およびエチレンジアミンのPO-EO付加物の使用が好ましいことがわかった。また、メタキシリレンジアミンのPO付加物も使用できることがわかった。 From the results in Table 2, the following was confirmed. That is, from the viewpoint of dispersibility of the cerium oxide particles, it was found preferable to use a PO-EO adduct of polycarboxylate, metaxylenesulfonic acid and ethylenediamine. Moreover, it turned out that the PO adduct of metaxylylenediamine can also be used.
(実施例1、2、比較例1~5)
 縦5.0cm×横4.0cm×厚さ0.07cmのガラス基板(商品名:AN100)の片面に、公知の研磨用酸化セリウム(CeO)粒子(平均粒径0.8~1.0μm)の4質量%水溶液を滴下し、50℃で30分間乾燥させた。こうして、表面に白色の酸化セリウム(CeO)粒子が付着したガラス基板を作製した。
(Examples 1 and 2 and Comparative Examples 1 to 5)
Known cerium oxide (CeO 2 ) particles for polishing (average particle size: 0.8 to 1.0 μm) on one side of a glass substrate (trade name: AN100) 5.0 cm long × 4.0 cm wide × 0.07 cm thick ) Was added dropwise and dried at 50 ° C. for 30 minutes. In this way, a glass substrate having white cerium oxide (CeO 2 ) particles attached to the surface was produced.
 また、実施例1、2、および比較例1~5として、表3に示す各成分を同表に示す組成で配合して、洗浄剤原液を調製した。次いで、こうして得られた洗浄剤原液の洗浄性を以下に示すようにして調べた。すなわち、得られた洗浄剤原液(水を含む)を、濃度が2質量%になるように水を加えて希釈した後、この洗浄希釈液中に前記した粒子付着ガラス基板を室温で9時間浸漬した。そして、浸漬後のガラス基板の表面状態を肉眼で観察し、下記の基準に従って洗浄性を評価した。評価結果を表3に示す。
(評価基準)
○:ガラス基板表面の酸化セリウム粒子が完全に除去されている。
△:ガラス基板表面に酸化セリウム粒子が若干残留している。
×:酸化セリウム粒子がほとんど除去されず、ガラス基板表面に残留している。
Further, as Examples 1 and 2 and Comparative Examples 1 to 5, each component shown in Table 3 was blended with the composition shown in the same table to prepare a detergent stock solution. Next, the cleaning property of the cleaning agent stock solution thus obtained was examined as follows. That is, after the obtained cleaning agent stock solution (including water) was diluted by adding water so that the concentration became 2% by mass, the above-mentioned particle-attached glass substrate was immersed in this cleaning dilution solution at room temperature for 9 hours. did. And the surface state of the glass substrate after immersion was observed with the naked eye, and the detergency was evaluated according to the following criteria. The evaluation results are shown in Table 3.
(Evaluation criteria)
○: The cerium oxide particles on the glass substrate surface are completely removed.
Δ: Some cerium oxide particles remain on the glass substrate surface.
X: The cerium oxide particle is hardly removed and remains on the glass substrate surface.
Figure JPOXMLDOC01-appb-T000003
Figure JPOXMLDOC01-appb-T000003
 表3から、(A)成分としての1-ヒドロキシエタン-1,1-ジホスホン酸、(B)成分としてのポリカルボン酸塩、(C)成分としてのメタキシレンスルホン酸、および(D)成分としてのエチレンジアミンのPO-EO付加物を含有する実施例1および実施例2(さらにメタキシリレンジアミンのPO付加物を含む)の洗浄剤原液を希釈して使用した場合は、ガラス基板表面の酸化セリウム粒子が良好に除去されることがわかった。 From Table 3, 1-hydroxyethane-1,1-diphosphonic acid as component (A), polycarboxylic acid salt as component (B), metaxylene sulfonic acid as component (C), and component (D) When the diluted stock solutions of Examples 1 and 2 (further including the PO adduct of metaxylylenediamine) containing the ethylenediamine PO-EO adduct were diluted with cerium oxide on the surface of the glass substrate It was found that the particles were well removed.
(実施例3、4、比較例6)
 図1に示す方法で研磨工程後のガラス基板の洗浄を行なった。洗浄剤として、実施例3では、実施例1で得られた洗浄剤原液(以下、有機酸系1と示す。)を原液の濃度(水を含む原液の濃度)が0.5質量%になるように水で希釈した希釈洗浄液を使用し、実施例4では、実施例2で得られた洗浄剤原液(以下、有機酸系2と示す。)を原液の濃度(水を含む原液の濃度)が0.5質量%になるように水で希釈した希釈洗浄液を使用した。さらに、比較例6では、従来からのアルカリ系洗浄剤を濃度が0.1質量%になるように水で希釈した希釈洗浄液を使用し、同様にして洗浄を行なった。なお、アルカリ系洗浄剤は、無機アルカリとして水酸化カリウムおよび水酸化ナトリウム、キレート剤としてエチレンジアミン四酢酸塩、界面活性剤としてポリオキシエチレンドデシルエーテルをそれぞれ含有し、残部水からなる洗浄剤である。
(Examples 3 and 4 and Comparative Example 6)
The glass substrate after the polishing step was cleaned by the method shown in FIG. As a cleaning agent, in Example 3, the concentration of the stock solution (concentration of the stock solution containing water) of the cleaning agent stock solution obtained in Example 1 (hereinafter referred to as organic acid system 1) is 0.5% by mass. In Example 4, the detergent stock solution obtained in Example 2 (hereinafter referred to as “organic acid system 2”) was used as the concentration of the stock solution (the concentration of the stock solution containing water). A diluted washing solution diluted with water so as to be 0.5% by mass was used. Further, in Comparative Example 6, cleaning was performed in the same manner using a diluted cleaning solution obtained by diluting a conventional alkaline cleaning agent with water so that the concentration became 0.1% by mass. The alkaline detergent is a detergent comprising potassium hydroxide and sodium hydroxide as inorganic alkali, ethylenediaminetetraacetate as a chelating agent, and polyoxyethylene dodecyl ether as a surfactant, and the balance water.
 ガラス基板としては、AN100(商品名)を使用し、研磨工程は、このガラス基板の表面を、研磨剤として平均粒径0.8~1.0μmの公知の酸化セリウム粒子を主成分とする研磨砥粒を含む研磨剤スラリー(商品名SHOROX A10;昭和電工(株)製)を使用し、研磨パッドを用いて行なった。また、洗浄工程では、研磨後のガラス基板の表面に前記した各種の希釈洗浄液を1秒間に250~700mLの割合で吹き付けながら、100~500rpmの速度で回転するPVA製のブラシで6~10秒間スクラブした。 As the glass substrate, AN100 (trade name) is used, and in the polishing step, the surface of the glass substrate is polished mainly using known cerium oxide particles having an average particle diameter of 0.8 to 1.0 μm as an abrasive. An abrasive slurry containing abrasive grains (trade name SHOROX A10; manufactured by Showa Denko KK) was used, and the polishing was performed using a polishing pad. In the cleaning step, the various diluted cleaning solutions described above are sprayed onto the surface of the polished glass substrate at a rate of 250 to 700 mL per second, and a PVA brush rotating at a speed of 100 to 500 rpm for 6 to 10 seconds. Scrub.
 こうして洗浄を行なった後、実施例3および実施例4で洗浄されたガラス基板、ならびに比較例6で洗浄されたガラス基板の表面に残留するCeおよびLa量を、誘導結合プラズマ発光法による質量分析(略称ICP-MS)によって測定した。測定結果を表4に示す。 After cleaning in this manner, the amount of Ce and La remaining on the surfaces of the glass substrates cleaned in Example 3 and Example 4 and the glass substrate cleaned in Comparative Example 6 were analyzed by mass spectrometry using inductively coupled plasma emission method. (Abbreviation ICP-MS). Table 4 shows the measurement results.
Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004
 表4から、実施例1および実施例2で得られた洗浄剤原液である有機酸系1および有機酸系2を水で0.5%の濃度に希釈した希釈洗浄液を使用して洗浄を行なった実施例3および実施例4では、アルカリ系の洗浄剤を使用した比較例6に比べて、ガラス基板表面のCeの残留が極めて少ないうえに、Laの残留も極めて少なくなっていることがわかった。 From Table 4, cleaning was performed using a diluted cleaning solution obtained by diluting the organic acid system 1 and the organic acid system 2 as the cleaning agent stock solutions obtained in Example 1 and Example 2 with water to a concentration of 0.5%. In Examples 3 and 4, it was found that there was very little Ce residue on the surface of the glass substrate and very little La residue compared to Comparative Example 6 using an alkaline cleaner. It was.
 実施例5~8、比較例7,8
 実施例5~8では、表5に示すように、前記有機酸系1または有機酸系2を同表に示す濃度に水で希釈した希釈洗浄液を使用し、図1に示す方法で研磨工程後のガラス基板の洗浄を行なった。また、比較例7および8では、表5に示す濃度に希釈した従来からのアルカリ系洗浄剤を使用し、同様にして洗浄を行なった。なお、アルカリ系洗浄剤は、前記比較例6で使用したものと同じ洗浄剤である。
Examples 5 to 8, Comparative Examples 7 and 8
In Examples 5 to 8, as shown in Table 5, a diluted cleaning solution in which the organic acid system 1 or the organic acid system 2 was diluted with water to the concentration shown in the same table was used, and the polishing process was performed by the method shown in FIG. The glass substrate was cleaned. In Comparative Examples 7 and 8, a conventional alkaline cleaning agent diluted to the concentration shown in Table 5 was used, and cleaning was performed in the same manner. The alkaline cleaning agent is the same cleaning agent used in Comparative Example 6.
 ガラス基板としては、AN100(商品名)を使用し、研磨工程は、このガラス基板の表面を、研磨剤として平均粒径0.8~1.0μmの公知の研磨用酸化セリウム粒子を主成分とする研磨砥粒を含む研磨剤スラリー(商品名SHOROX A10)を使用し、研磨パッドを用いて行なった。また、洗浄工程では、研磨後のガラス基板の表面に前記希釈洗浄液を1秒間に250~700mLの割合で吹き付けながら、100~500rpmの速度で回転するPVA製のブラシで6~10秒間スクラブした。 As a glass substrate, AN100 (trade name) is used, and in the polishing step, the surface of the glass substrate is composed mainly of known cerium oxide particles for polishing having an average particle size of 0.8 to 1.0 μm as an abrasive. A polishing agent slurry (trade name SHOROX A10) containing polishing abrasive grains to be used was used, and a polishing pad was used. In the cleaning step, the diluted cleaning solution was sprayed onto the surface of the polished glass substrate at a rate of 250 to 700 mL per second, and scrubbed with a PVA brush rotating at a speed of 100 to 500 rpm for 6 to 10 seconds.
 こうして洗浄を行なった後、ガラス基板の表面に残留する砥粒等の粒子(パーティクル)の数を、粒子のスライスレベルごと分けてそれぞれ測定した。スライスレベルは、分類を行なう方法の一つであって、粒子にレーザー光を照射し、その散乱した光の強度により、粒子サイズの分類を実施している。測定は、レーザー散乱結像方式(HS830E;東レエンジニアリング(株)社製)により行なった。測定結果を表5に示す。 After cleaning, the number of particles such as abrasive grains remaining on the surface of the glass substrate was measured separately for each particle slice level. The slice level is one of the classification methods. The particle size is classified based on the intensity of the scattered light by irradiating the particles with laser light. The measurement was performed by a laser scattering imaging method (HS830E; manufactured by Toray Engineering Co., Ltd.). Table 5 shows the measurement results.
Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000005
 表5から、実施例1および実施例2で得られた洗浄剤原液である有機酸系1および有機酸系2を水で0.5質量%、2.0質量%、2.5質量%の濃度に希釈した希釈洗浄液を使用して洗浄を行なった実施例5~8では、アルカリ系の洗浄剤を使用した比較例7および比較例8に比べて、ガラス基板表面の粒子(パーティクル)の残渣が少なくなっており、特にサイズ(スライスレベル)0.3μm程度の研磨砥粒の微粒子の残留が極めて少なくなっていることがわかった。 From Table 5, the organic acid system 1 and the organic acid system 2, which are the detergent stock solutions obtained in Example 1 and Example 2, were 0.5% by mass, 2.0% by mass, and 2.5% by mass with water. In Examples 5 to 8 where cleaning was performed using a diluted cleaning solution diluted to a concentration, particles (particles) residue on the surface of the glass substrate compared to Comparative Examples 7 and 8 using an alkaline cleaning agent In particular, it was found that the residual of fine particles of abrasive grains having a size (slice level) of about 0.3 μm was extremely small.
 本発明の洗浄剤は、研磨後のガラス基板の平坦性を損なうことなく、その表面に残留・付着した酸化セリウム等からなる研磨砥粒を分散して除去することができるので、FPD用に使用されるガラス基板の洗浄方法に有効に適用することができる。
 なお、2011年5月24日に出願された日本特許出願2011-115353号の明細書、特許請求の範囲、図面および要約書の全内容をここに引用し、本発明の開示として取り入れるものである。
The cleaning agent of the present invention can be used for FPD because it can disperse and remove abrasive grains made of cerium oxide or the like remaining on or adhered to the surface of the glass substrate after polishing without impairing the flatness of the glass substrate after polishing. It can be effectively applied to a glass substrate cleaning method.
The entire contents of the specification, claims, drawings, and abstract of Japanese Patent Application No. 2011-115353 filed on May 24, 2011 are incorporated herein as the disclosure of the present invention. .
 1…搬送ロール、2…洗浄室、3…ガラス基板、4…洗浄ノズル、5…洗浄剤、6…回転ブラシ。 DESCRIPTION OF SYMBOLS 1 ... Conveyance roll, 2 ... Cleaning chamber, 3 ... Glass substrate, 4 ... Cleaning nozzle, 5 ... Cleaning agent, 6 ... Rotating brush.

Claims (10)

  1.  酸化セリウム含有研磨剤で研磨されたガラス基板を洗浄するための洗浄剤であり、
     (A)有機ホスホン酸と、(B)ポリカルボン酸塩と、(C)芳香族スルホン酸と、(D)アミン-アルキレンオキサイド付加物とを含む水系洗浄剤であることを特徴とする洗浄剤。
    A cleaning agent for cleaning a glass substrate polished with a cerium oxide-containing abrasive,
    A water-based cleaning agent comprising (A) an organic phosphonic acid, (B) a polycarboxylic acid salt, (C) an aromatic sulfonic acid, and (D) an amine-alkylene oxide adduct. .
  2.  前記(A)有機ホスホン酸と、前記(B)ポリカルボン酸塩と、前記(C)芳香族スルホン酸および前記(D)アミン-アルキレンオキサイド付加物の合計量に対して、前記(A)有機ホスホン酸を0.01~50質量%、前記(B)ポリカルボン酸塩を0.01~10質量%、前記(C)芳香族スルホン酸を0.01~50質量%、前記(D)アミン-アルキレンオキサイド付加物を0.02~10質量%含む、請求項1に記載の洗浄剤。 The (A) organic phosphonic acid, the (B) polycarboxylic acid salt, the (C) aromatic sulfonic acid, and the (D) amine-alkylene oxide adduct are combined in the total amount of the (A) organic phosphonic acid. 0.01 to 50% by mass of phosphonic acid, 0.01 to 10% by mass of (B) polycarboxylate, 0.01 to 50% by mass of (C) aromatic sulfonic acid, and (D) amine The cleaning agent according to claim 1, comprising 0.02 to 10% by mass of an alkylene oxide adduct.
  3.  前記(A)有機ホスホン酸は、式:-P(=O)(OH)で表わされる基が炭素原子に結合した構造を有する有機化合物である、請求項1または2に記載の洗浄剤。 The cleaning agent according to claim 1 or 2, wherein the (A) organic phosphonic acid is an organic compound having a structure in which a group represented by the formula: -P (= O) (OH) 2 is bonded to a carbon atom.
  4.  前記(D)アミン-アルキレンオキサイド付加物は、アルキレンジアミンのプロピレンオキサイド-エチレンオキサイド付加物である、請求項1~3のいずれか1項に記載の洗浄剤。 The cleaning agent according to any one of claims 1 to 3, wherein the (D) amine-alkylene oxide adduct is a propylene oxide-ethylene oxide adduct of alkylenediamine.
  5.  前記(A)有機ホスホン酸と、前記(B)ポリカルボン酸塩と、前記(C)芳香族スルホン酸と、前記(D)アミン-アルキレンオキサイド付加物と、水とを含み、前記(A)から(D)の各成分および水の合計量に対して、水を55~98質量%含む、請求項1~4のいずれか1項に記載の洗浄剤。  The (A) organic phosphonic acid, the (B) polycarboxylate, the (C) aromatic sulfonic acid, the (D) amine-alkylene oxide adduct, and water, The cleaning agent according to any one of claims 1 to 4, comprising 55 to 98% by mass of water based on the total amount of each component of (D) to (D). *
  6.  酸化セリウムを含有する研磨剤を用いてガラス基板を研磨する研磨工程と、
     当該研磨工程後の該ガラス基板を、請求項1~5のいずれか1項に記載の洗浄剤により洗浄する洗浄工程を有することを特徴とするガラス基板の洗浄方法。
    A polishing step of polishing a glass substrate with an abrasive containing cerium oxide;
    A glass substrate cleaning method comprising a cleaning step of cleaning the glass substrate after the polishing step with the cleaning agent according to any one of claims 1 to 5.
  7.  前記研磨剤は、酸化セリウムを主成分とし希土類元素を含む研磨砥粒を含有するものである請求項6に記載のガラス基板の洗浄方法。 The method for cleaning a glass substrate according to claim 6, wherein the abrasive contains abrasive grains containing cerium oxide as a main component and a rare earth element.
  8.  前記洗浄工程において、前記ガラス基板を枚葉式で洗浄することを特徴とする請求項6または7に記載のガラス基板の洗浄方法。 The glass substrate cleaning method according to claim 6 or 7, wherein, in the cleaning step, the glass substrate is cleaned in a single wafer mode.
  9.  前記洗浄剤を水で希釈した希釈洗浄液により、前記研磨工程後の該ガラス基板を洗浄することを特徴とする請求項6~8のいずれか1項に記載のガラス基板の洗浄方法。 The method for cleaning a glass substrate according to any one of claims 6 to 8, wherein the glass substrate after the polishing step is cleaned with a diluted cleaning solution obtained by diluting the cleaning agent with water.
  10.  前記洗浄工程において、連続的に搬送される前記ガラス基板の両面を、前記洗浄剤または前記希釈洗浄液を吹き付けながらブラシを用いてスクラブすることを特徴とする請求項6~9のいずれか1項に記載のガラス基板の洗浄方法。 10. The scrubbing process according to any one of claims 6 to 9, wherein in the cleaning step, both surfaces of the glass substrate that are continuously conveyed are scrubbed using a brush while spraying the cleaning agent or the diluted cleaning liquid. A method for cleaning a glass substrate as described.
PCT/JP2012/063360 2011-05-24 2012-05-24 Cleaning agent and method for cleaning glass substrate WO2012161270A1 (en)

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KR20140053003A (en) 2014-05-07

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