WO2012090339A1 - カルコパイライト構造を有する化合物の製造方法 - Google Patents
カルコパイライト構造を有する化合物の製造方法 Download PDFInfo
- Publication number
- WO2012090339A1 WO2012090339A1 PCT/JP2010/073909 JP2010073909W WO2012090339A1 WO 2012090339 A1 WO2012090339 A1 WO 2012090339A1 JP 2010073909 W JP2010073909 W JP 2010073909W WO 2012090339 A1 WO2012090339 A1 WO 2012090339A1
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- Prior art keywords
- compound
- group
- solvent
- chalcopyrite
- solution
- Prior art date
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- 150000001875 compounds Chemical class 0.000 title claims abstract description 84
- DVRDHUBQLOKMHZ-UHFFFAOYSA-N chalcopyrite Chemical group [S-2].[S-2].[Fe+2].[Cu+2] DVRDHUBQLOKMHZ-UHFFFAOYSA-N 0.000 title claims abstract description 57
- 238000000034 method Methods 0.000 title claims abstract description 57
- 238000004519 manufacturing process Methods 0.000 title claims description 27
- 239000002904 solvent Substances 0.000 claims abstract description 42
- 239000002245 particle Substances 0.000 claims abstract description 36
- 239000003638 chemical reducing agent Substances 0.000 claims abstract description 22
- 230000000737 periodic effect Effects 0.000 claims abstract description 8
- 239000000126 substance Substances 0.000 claims description 31
- 239000000203 mixture Substances 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 21
- 238000006243 chemical reaction Methods 0.000 claims description 17
- 239000002798 polar solvent Substances 0.000 claims description 17
- 229910052798 chalcogen Inorganic materials 0.000 claims description 16
- 239000012454 non-polar solvent Substances 0.000 claims description 12
- 229910052795 boron group element Inorganic materials 0.000 claims description 10
- 238000005240 physical vapour deposition Methods 0.000 claims description 10
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 9
- 239000003444 phase transfer catalyst Substances 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 claims description 6
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 claims description 6
- GEHJYWRUCIMESM-UHFFFAOYSA-L sodium sulfite Chemical compound [Na+].[Na+].[O-]S([O-])=O GEHJYWRUCIMESM-UHFFFAOYSA-L 0.000 claims description 6
- IKHGUXGNUITLKF-XPULMUKRSA-N acetaldehyde Chemical compound [14CH]([14CH3])=O IKHGUXGNUITLKF-XPULMUKRSA-N 0.000 claims description 3
- 239000011668 ascorbic acid Substances 0.000 claims description 3
- 235000010323 ascorbic acid Nutrition 0.000 claims description 3
- 229960005070 ascorbic acid Drugs 0.000 claims description 3
- 150000004678 hydrides Chemical class 0.000 claims description 3
- 235000006408 oxalic acid Nutrition 0.000 claims description 3
- 235000010265 sodium sulphite Nutrition 0.000 claims description 3
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 claims description 2
- 229910052951 chalcopyrite Inorganic materials 0.000 abstract description 29
- 238000010438 heat treatment Methods 0.000 abstract description 10
- 239000002994 raw material Substances 0.000 abstract description 9
- 239000000243 solution Substances 0.000 description 33
- 239000011669 selenium Substances 0.000 description 24
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 23
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 19
- 239000004065 semiconductor Substances 0.000 description 18
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 15
- -1 chalcopyrite compound Chemical class 0.000 description 13
- 239000010410 layer Substances 0.000 description 12
- 239000006185 dispersion Substances 0.000 description 11
- 239000010949 copper Substances 0.000 description 10
- 239000000843 powder Substances 0.000 description 9
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 8
- 230000005291 magnetic effect Effects 0.000 description 8
- 229910052711 selenium Inorganic materials 0.000 description 8
- 230000015572 biosynthetic process Effects 0.000 description 7
- 229910052738 indium Inorganic materials 0.000 description 7
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 6
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 6
- 229910052733 gallium Inorganic materials 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 229910052717 sulfur Inorganic materials 0.000 description 6
- 238000003786 synthesis reaction Methods 0.000 description 6
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 5
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 5
- 239000012298 atmosphere Substances 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 238000000151 deposition Methods 0.000 description 5
- 239000002243 precursor Substances 0.000 description 5
- 150000003839 salts Chemical class 0.000 description 5
- 238000003756 stirring Methods 0.000 description 5
- 239000010408 film Substances 0.000 description 4
- 230000031700 light absorption Effects 0.000 description 4
- 238000013507 mapping Methods 0.000 description 4
- 239000012071 phase Substances 0.000 description 4
- 239000011734 sodium Substances 0.000 description 4
- 239000012279 sodium borohydride Substances 0.000 description 4
- 229910000033 sodium borohydride Inorganic materials 0.000 description 4
- 230000002194 synthesizing effect Effects 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
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- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000012044 organic layer Substances 0.000 description 3
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 3
- LNBXMNQCXXEHFT-UHFFFAOYSA-N selenium tetrachloride Chemical compound Cl[Se](Cl)(Cl)Cl LNBXMNQCXXEHFT-UHFFFAOYSA-N 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000004729 solvothermal method Methods 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- PMBXCGGQNSVESQ-UHFFFAOYSA-N 1-Hexanethiol Chemical compound CCCCCCS PMBXCGGQNSVESQ-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- WDODWFPDZYSKIA-UHFFFAOYSA-N benzeneselenol Chemical compound [SeH]C1=CC=CC=C1 WDODWFPDZYSKIA-UHFFFAOYSA-N 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000005119 centrifugation Methods 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- SXTLQDJHRPXDSB-UHFFFAOYSA-N copper;dinitrate;trihydrate Chemical compound O.O.O.[Cu+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O SXTLQDJHRPXDSB-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000002270 dispersing agent Substances 0.000 description 2
- 238000007606 doctor blade method Methods 0.000 description 2
- WNAHIZMDSQCWRP-UHFFFAOYSA-N dodecane-1-thiol Chemical compound CCCCCCCCCCCCS WNAHIZMDSQCWRP-UHFFFAOYSA-N 0.000 description 2
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 2
- CHPZKNULDCNCBW-UHFFFAOYSA-N gallium nitrate Chemical compound [Ga+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O CHPZKNULDCNCBW-UHFFFAOYSA-N 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- HVDZMISZAKTZFP-UHFFFAOYSA-N indium(3+) trinitrate trihydrate Chemical compound O.O.O.[In+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O HVDZMISZAKTZFP-UHFFFAOYSA-N 0.000 description 2
- 238000007641 inkjet printing Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- XKBGEWXEAPTVCK-UHFFFAOYSA-M methyltrioctylammonium chloride Chemical compound [Cl-].CCCCCCCC[N+](C)(CCCCCCCC)CCCCCCCC XKBGEWXEAPTVCK-UHFFFAOYSA-M 0.000 description 2
- 239000002105 nanoparticle Substances 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- JPJALAQPGMAKDF-UHFFFAOYSA-N selenium dioxide Chemical compound O=[Se]=O JPJALAQPGMAKDF-UHFFFAOYSA-N 0.000 description 2
- IYKVLICPFCEZOF-UHFFFAOYSA-N selenourea Chemical compound NC(N)=[Se] IYKVLICPFCEZOF-UHFFFAOYSA-N 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- WGPCGCOKHWGKJJ-UHFFFAOYSA-N sulfanylidenezinc Chemical compound [Zn]=S WGPCGCOKHWGKJJ-UHFFFAOYSA-N 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- CMQCNTNASCDNGR-UHFFFAOYSA-N toluene;hydrate Chemical compound O.CC1=CC=CC=C1 CMQCNTNASCDNGR-UHFFFAOYSA-N 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000000108 ultra-filtration Methods 0.000 description 2
- 229910052984 zinc sulfide Inorganic materials 0.000 description 2
- GTXIYTMABDZZGQ-UHFFFAOYSA-N 2-dodecyl-1h-pyrrole Chemical compound CCCCCCCCCCCCC1=CC=CN1 GTXIYTMABDZZGQ-UHFFFAOYSA-N 0.000 description 1
- RPVYMRBTVNNTGY-UHFFFAOYSA-N 2-hexyl-1h-pyrrole Chemical compound CCCCCCC1=CC=CN1 RPVYMRBTVNNTGY-UHFFFAOYSA-N 0.000 description 1
- CXMYWOCYTPKBPP-UHFFFAOYSA-N 3-(3-hydroxypropylamino)propan-1-ol Chemical compound OCCCNCCCO CXMYWOCYTPKBPP-UHFFFAOYSA-N 0.000 description 1
- RFKWIEFTBMACPZ-UHFFFAOYSA-N 3-dodecylthiophene Chemical compound CCCCCCCCCCCCC=1C=CSC=1 RFKWIEFTBMACPZ-UHFFFAOYSA-N 0.000 description 1
- JEDHEMYZURJGRQ-UHFFFAOYSA-N 3-hexylthiophene Chemical compound CCCCCCC=1C=CSC=1 JEDHEMYZURJGRQ-UHFFFAOYSA-N 0.000 description 1
- FTCDURIBSNQWOO-UHFFFAOYSA-N 3-pentadecyl-1h-pyrrole Chemical compound CCCCCCCCCCCCCCCC=1C=CNC=1 FTCDURIBSNQWOO-UHFFFAOYSA-N 0.000 description 1
- WVDDGKGOMKODPV-UHFFFAOYSA-N Benzyl alcohol Chemical compound OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- GSNUFIFRDBKVIE-UHFFFAOYSA-N DMF Natural products CC1=CC=C(C)O1 GSNUFIFRDBKVIE-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- 229910021617 Indium monochloride Inorganic materials 0.000 description 1
- 240000002329 Inga feuillei Species 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 230000005290 antiferromagnetic effect Effects 0.000 description 1
- 239000000010 aprotic solvent Substances 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- GKFJEDWZQZKYHV-UHFFFAOYSA-N borane;2-methylpropan-2-amine Chemical compound B.CC(C)(C)N GKFJEDWZQZKYHV-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- RJTANRZEWTUVMA-UHFFFAOYSA-N boron;n-methylmethanamine Chemical compound [B].CNC RJTANRZEWTUVMA-UHFFFAOYSA-N 0.000 description 1
- RDHPKYGYEGBMSE-UHFFFAOYSA-N bromoethane Chemical compound CCBr RDHPKYGYEGBMSE-UHFFFAOYSA-N 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- QGJOPFRUJISHPQ-NJFSPNSNSA-N carbon disulfide-14c Chemical compound S=[14C]=S QGJOPFRUJISHPQ-NJFSPNSNSA-N 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 150000003841 chloride salts Chemical class 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 description 1
- 150000003983 crown ethers Chemical class 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 238000006392 deoxygenation reaction Methods 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 235000019256 formaldehyde Nutrition 0.000 description 1
- 229940044658 gallium nitrate Drugs 0.000 description 1
- UPWPDUACHOATKO-UHFFFAOYSA-K gallium trichloride Chemical compound Cl[Ga](Cl)Cl UPWPDUACHOATKO-UHFFFAOYSA-K 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- GNOIPBMMFNIUFM-UHFFFAOYSA-N hexamethylphosphoric triamide Chemical compound CN(C)P(=O)(N(C)C)N(C)C GNOIPBMMFNIUFM-UHFFFAOYSA-N 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000005457 ice water Substances 0.000 description 1
- APHGZSBLRQFRCA-UHFFFAOYSA-M indium(1+);chloride Chemical compound [In]Cl APHGZSBLRQFRCA-UHFFFAOYSA-M 0.000 description 1
- PSCMQHVBLHHWTO-UHFFFAOYSA-K indium(iii) chloride Chemical compound Cl[In](Cl)Cl PSCMQHVBLHHWTO-UHFFFAOYSA-K 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 229910017053 inorganic salt Inorganic materials 0.000 description 1
- HYJBTSSKSKRUBH-UHFFFAOYSA-N iodo selenohypoiodite Chemical compound I[Se]I HYJBTSSKSKRUBH-UHFFFAOYSA-N 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000012280 lithium aluminium hydride Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 150000002823 nitrates Chemical class 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 150000005324 oxide salts Chemical class 0.000 description 1
- 229910052699 polonium Inorganic materials 0.000 description 1
- 229920000301 poly(3-hexylthiophene-2,5-diyl) polymer Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000003223 protective agent Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 238000013341 scale-up Methods 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 229910000058 selane Inorganic materials 0.000 description 1
- 229940000207 selenious acid Drugs 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- MCAHWIHFGHIESP-UHFFFAOYSA-N selenous acid Chemical compound O[Se](O)=O MCAHWIHFGHIESP-UHFFFAOYSA-N 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005477 sputtering target Methods 0.000 description 1
- 150000003467 sulfuric acid derivatives Chemical class 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- IBWGNZVCJVLSHB-UHFFFAOYSA-M tetrabutylphosphanium;chloride Chemical compound [Cl-].CCCC[P+](CCCC)(CCCC)CCCC IBWGNZVCJVLSHB-UHFFFAOYSA-M 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0272—Selenium or tellurium
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
- C01B19/002—Compounds containing, besides selenium or tellurium, more than one other element, with -O- and -OH not being considered as anions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02568—Chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2004/00—Particle morphology
- C01P2004/60—Particles characterised by their size
- C01P2004/64—Nanometer sized, i.e. from 1-100 nanometer
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a method for producing a compound having a chalcopyrite structure.
- the present invention relates to a method for producing a photoelectric conversion element such as a solar cell using the obtained compound having a chalcopyrite structure.
- 11-13-15 group 2 chalcopyrite compound semiconductor such as CuInSe 2 has a direct transition type energy band gap, has a very high light absorption coefficient, and manufactures a highly efficient solar cell even with a thin film of several micrometers. Therefore, it is highly expected as a material for a light absorption layer of a solar cell.
- a Cu (InGa) Se 2 (hereinafter abbreviated as CIGS) solar cell has the highest power generation efficiency (19%), a film thickness that is one-hundred that of a silicon solar cell, a manufacturing process that is half that of a silicon solar cell, and light degradation. Therefore, the solar cell is expected to replace the existing expensive silicon solar cell.
- the multi-source vapor deposition method is a method for vapor-depositing each element of a raw material, and a high efficiency of 18% or more can be realized in a small area cell.
- a substrate is fixed, and a chalcopyrite compound film is formed by selecting a deposition element by opening and closing a shutter placed in front of a deposition source.
- the National Renewable Energy Laboratory (NREL) in the United States has reported that a CIGS solar cell having an energy conversion efficiency of 19.5% was manufactured using this method.
- NREL National Renewable Energy Laboratory
- a metal precursor made of Cu—In—Ga or the like is first deposited by sputtering, and a chalcopyrite compound film is formed by heat treatment in a diluted H 2 Se atmosphere.
- chalcopyrite compound or its precursor particles can be obtained in the form of nanoparticles, it is advantageous for forming a film by a printing method or a spray method, and various methods have been reported for its synthesis.
- Non-Patent Document 1 reports a method of synthesizing CIS nanoparticles by putting CuCl 2 , InCl 3 , and Se powder as raw materials in a solvent of ethylenediamine and diethylamine and reacting them by a solvothermal method (solvothermal method). ing.
- solvothermal method solvothermal method
- CIGS can be obtained by reacting a pyridine solvent in which CuI, InI 3 and GaI 3 are dissolved and a methanol solvent in which Na 2 Se is dissolved at a low temperature.
- a pyridine solvent in which CuI, InI 3 and GaI 3 are dissolved and a methanol solvent in which Na 2 Se is dissolved at a low temperature.
- This method requires a pretreatment for deoxygenation and dehydration of the solvent, and has the disadvantage that all processes must be performed in an inert atmosphere.
- Na 2 Se is not a general material and is expensive.
- Non-Patent Document 2 also reports a method of synthesizing chalcopyrite particles by a mechanochemical process method. This is a process in which mechanical energy such as pulverization, friction, and compression is applied to the raw material powder, and physicochemical changes are caused by the mechanical energy, and it has the features of high energy efficiency, high productivity, and short cycle time.
- the chalcopyrite particles obtained by this method have a relatively large particle size of 0.1 to 0.7 ⁇ m, there is a limit to increasing the power generation efficiency when applied to photoelectric conversion elements. It is done.
- the present invention provides the following aspects. (1) a step of dissolving a group 11 element A, a group 13 element B, and a group 16 element C in the periodic table in a solvent to prepare a solution, and a step of bringing a reducing agent into contact with the solution; Represented by 2 having a composition formula ABC, a method for producing a compound having a chalcopyrite structure.
- the Group 11 element A, Group 13 element B, and Group 16 element C are prepared in the form of a compound having a solubility in the solvent at 20 ° C. ⁇ 15 ° C. or a simple substance.
- the manufacturing method according to any one of (1) to (3).
- the reducing agent is at least one selected from the group consisting of a hydride reducing agent, hydrazine, oxalic acid, ascorbic acid, formaldehyde, acetaldehyde, and sodium sulfite, or a mixture thereof. ) To (7).
- Example 1 The compound preparation procedure in Example 1 is shown.
- the XRD analysis chart of the compound obtained in Example 1 is shown.
- the compound preparation procedure in Examples 2 and 3 is shown.
- the XRD analysis chart of the compound obtained in Example 2 is shown.
- the XRD analysis chart of the compound obtained in Example 3 is shown.
- the SEM observation image of the compound obtained in Example 1 is shown.
- the EDS analysis image of the compound obtained in Example 1 is shown.
- Chalcopyrite is the English name for chalcopyrite CuFeS 2 which is a golden mineral.
- This material is an antiferromagnetic semiconductor having a tetragonal crystal structure in which zinc-blende (ZB) structure typified by ZnS is stacked in two layers and Zn is orderedly replaced by two elements of Cu and Fe.
- ZB zinc-blende
- a member of chalcopyrite includes a compound having the same crystal structure and a composition formula of ABC 2 , which is referred to as a compound having a chalcopyrite structure represented by a composition formula of ABC 2 in this specification.
- ABC type 2 compound semiconductors There are two types of ABC type 2 compound semiconductors. One is a series of 14 group ⁇ 13-15 group ⁇ 12-14-15 group 2 , and the other is a series of 14 group ⁇ 12-16 group ⁇ 11-13-16 2 group.
- the method for producing a compound having a chalcopyrite structure represented by the composition formula ABC 2 according to the present invention dissolves Group 11 element A, Group 13 element B, and Group 16 element C in a solvent in the periodic table. And preparing a solution.
- the present invention will be described in detail below along this process.
- any of Cu, Ag, Au, or a combination thereof can be used.
- group 13 element B any of B (boron), Al, Ga, In, Tl, or a combination thereof can be used.
- group 16 element C any of S, Se, Te, Po, or a combination thereof can be used.
- a compound having a chalcopyrite structure represented by a composition formula of ABC 2 is obtained by setting the mixing amount of the elements A, B, and C to 1: 1: 2 in atomic weight ratio.
- the composition formula ABC 2 means a base composition, and the composition can be used as a compound semiconductor by appropriately fine-tuning the mixing amount of the elements A, B and C. That is, if the total atomic weight of the Group 11 element A and the Group 13 element B is larger than the atomic weight of the Group 16 element C, the compound becomes a p-type semiconductor. If the total atomic weight of Group 11 element A and Group 13 element B is less than the atomic weight of Group 16 element C, the compound becomes an n-type semiconductor. Furthermore, the atomic weights of the group 11 element A and the group 13 element B can be appropriately adjusted. Thus, by adjusting the ratio of these elements, the compound semiconductor can be adjusted to either p-type or n-type.
- each of the elements A, B and C does not have to be one kind of element, and may be used in combination with elements of the same group in the periodic table. If it is the element B, you may use Ga and In by atomic ratio of 1: 1. If it is the element C, you may use S and Se by atomic ratio of 1: 1. Thus, by adjusting the ratio of these elements, the forbidden band width as a compound semiconductor can be appropriately adjusted.
- the compound semiconductor (Ag, Cu) (Al, In, Ga) (S, Se) 2 having a chalcopyrite structure is a direct transition and has a large band gap of 1.0 to 3.6 eV. Therefore, it is known as a light emitting / receiving material for infrared light, visible light to ultraviolet light.
- Cu copper
- In indium
- Ga gallium
- S, Se sulfur
- S selenium
- a band gap of 1.4 eV can be realized, and it is considered that a CIS-based thin film solar cell using such a CIGS compound semiconductor can obtain high photoelectric conversion efficiency.
- the solvent is not particularly limited as long as it can dissolve the elements A, B and C.
- the solvent can be appropriately selected depending on the form of the compound containing the elements A, B and C or the simple substance so that the elements A, B and C are dissolved in the solvent.
- the solvent may comprise either a polar solvent or a nonpolar solvent.
- polar solvent when the solvent is a polar solvent, many substances that have a large dissolving power with respect to the electrolyte compound and do not dissolve in the nonpolar solvent can be dissolved.
- Water and ethanol are typical hydrogen bonding polar solvents.
- Dipolar aprotic solvents having no protic hydrogen such as N, N-dimethylformamide, N, N-dimethylacetamide, dimethylsulfoxide, N-methylpyrrolidone, hexamethylphosphoramide, etc.
- the solvent is a nonpolar solvent, a substance having a small polarity that does not dissolve in the polar solvent can be dissolved.
- the nonpolar solvent hexane, benzene, toluene, diethyl ether, chloroform, ethyl acetate, methylene chloride, or the like can be used.
- a polar solvent and a nonpolar solvent may be used in combination as the solvent, and the phase transfer catalyst may be contacted with these solvents.
- the phase transfer catalyst is effective for reacting inorganic salts that are soluble in a polar solvent with organic compounds that are sparingly soluble in the polar solvent.
- phase transfer catalyst options for combinations of solvents and solutes are further expanded, and more appropriate combinations can be employed. That is, when there is a readily soluble solute and a hardly soluble solute in the polar solvent, dissolve the easily soluble solute in the polar solvent in the polar solvent, dissolve the hardly soluble solute in the polar solvent in the nonpolar solvent, and perform phase transfer. By contacting the catalyst, all solutes can be contacted.
- phase transfer catalyst As a phase transfer catalyst, tetrabutylammonium bromide (TBA-Br, (C 4 H 9) 4 N + Br -), trioctylmethylammonium chloride (TOMAC, (C 8 H 17 ) 3 N + CH 3 Cl -) Ya
- TSA-Br tetrabutylammonium bromide
- TOMAC trioctylmethylammonium chloride
- TBPC tetrabutylphosphonium chloride
- crown ethers are also preferred as neutral catalysts. Bring results.
- the elements A, B and C are preferably in the form of a compound having solubility in a solvent at room temperature or a simple substance.
- Normal temperature is defined as a range of 20 ° C. ⁇ 15 ° C. (5-35 ° C.) according to JIS Z 8703, but the use environment, the solvent used, the compound containing elements A, B and C, or a simple substance This temperature range can be appropriately adjusted according to the form and the like.
- the form of a compound having solubility at room temperature or a simple substance can be appropriately selected according to the above-mentioned solvent.
- the compounds may be oxide salts, nitrates, sulfates, carbonates, chloride salts, acetates, and the like.
- it may be a double salt or a complex salt containing two or more of the elements A, B and C. Having solubility at room temperature means that no special heating or the like is required, which is advantageous as it is a simpler process than conventional solvothermal methods.
- a compound in which the valence of the group 16 element C is not -II may be used.
- compounds valence is -II of Group 16 elements C Na 2 Se, benzeneselenol, selenourea, and the like.
- Na 2 Se has a problem that it needs to be handled in an inert atmosphere and is not a general material but expensive.
- Benzene selenol has an unpleasant odor and is expensive.
- Selenourea is also an expensive material.
- the present invention makes it possible to use compounds other than these expensive compounds.
- H 2 Se as -II valent selenide, which are those gaseous.
- halogens such as selenium powder (acid solubility), selenium tetrachloride (hydrolyzable), selenium bromide (soluble in carbon disulfide, chloroform, ethyl bromide), selenium iodide (decomposed in cold water), etc. Salts, selenious acid (easily soluble in water and ethanol), selenium dioxide (easily soluble in water, ethanol and acetic acid) and the like may be used.
- the method for producing a compound having a chalcopyrite structure represented by the composition formula ABC 2 according to the present invention also includes a step of bringing a reducing agent into contact with a solution in which elements A, B and C are dissolved.
- the present invention will be described in detail below along this process.
- the reducing agent donates electrons to the dissolved elements in the solution and precipitates these elements directly from the solution, whereby a compound having a chalcopyrite structure represented by a composition formula of ABC 2 is obtained.
- the reducing agent include dimethylamine borane, diborane, tert-butylamine borane, hydride reducing agents such as sodium borohydride and lithium aluminum hydride, hydrazine, oxalic acid, ascorbic acid, formaldehyde and acetaldehyde, sodium sulfite, and the like. It may be at least one of these, or a mixture thereof.
- the present invention finally relates to a method for producing a compound having a chalcopyrite structure represented by a composition formula of ABC 2 , and a composition comprising AC as a precursor (for example, Cu-Se) or a composition comprising BC. Needless to say, the present invention can also be applied to the synthesis of (for example, In-Se). Therefore, a reducing agent may be added at the stage where some elements are dissolved in the solvent, and then a solution in which the remaining elements are dissolved may be added.
- the selenium powder is used as the group 16 element C and water is used as the polar solvent
- the selenium powder is insoluble in water and dispersed in water, but by adding a reducing agent.
- Selenium is reduced and becomes soluble in water.
- a solution in which the remaining Group 11 element A and Group 13 element B are dissolved can be added to precipitate the compound.
- the contact may be promoted by using stirring, ultrasonic irradiation, or the like, but a heating operation or a vacuum operation is not particularly required.
- the precipitated compound having a chalcopyrite structure may be dispersed in the solution.
- a dispersion stabilizer may be added to the solution.
- dodecanethiol, poly (3-hexylthiophene), 3-hexylthiophene, 3-dodecylthiophene, poly (3-pentadecylpyrrole), hexylpyrrole, dodecylpyrrole, hexylthiol, polyhexylaniline, etc. are used. May be.
- the solvent with an evaporator In order to extract a compound having a chalcopyrite structure present in the liquid, removal of the solvent with an evaporator, separation of the compound with a centrifuge, filtration with an ultrafiltration membrane, and the like are performed. Any of these operations may be used or may be used in combination.
- the compound obtained may be washed during or after these operations.
- the washing liquid can be appropriately selected according to the solvent, reducing agent, etc. used for the production of the compound, but may be appropriately selected from ethanol, water, toluene and the like. This washing and extraction of the compound by an evaporator, a centrifuge, and / or an ultrafiltration membrane may be repeated a plurality of times as appropriate.
- the compound having a chalcopyrite structure that has been extracted and washed may be dried using a desiccator or the like.
- the obtained compound having a chalcopyrite structure may contain particles of nanometer to submicron order.
- the lower limit of the particle size of the compound is several nm or more, preferably 10 nm or more
- the upper limit of the particle size of the compound is 500 nm or less, preferably 100 nm or less, more preferably 50 nm or less.
- the particle size of the compound is smaller than this range, a compound having a chalcopyrite structure represented by a composition formula of ABC 2 cannot be formed.
- the particle size of the compound is larger than this range, it is difficult to reduce the thickness of the compound when applied to a photoelectric conversion element or the like.
- the particle size can be determined from an observation image obtained by a transmission electron microscope (SEM).
- the present invention also relates to a method for producing a photoelectric conversion element or the like using the obtained compound having a chalcopyrite structure. This aspect will be described in detail below.
- a coating type material or a physical vapor deposition (PVD) material can be produced.
- the coating type material is obtained by dispersing the obtained compound having a chalcopyrite structure in a solvent such as toluene, chloroform, DMF, DMSO, pyridine, alcohol, hydrocarbons, etc., and making it into an ink or paste.
- the coating type material may further include a dispersant such as alkane selenol, alkane thiol, alcohol, aromatic selenol, aromatic thiol, aromatic alcohol.
- the above-mentioned coating type material can be applied to the substrate by spraying, screen printing, ink jet printing, doctor blade method or the like. By heat-treating the applied coating type material to remove the solvent and / or dispersant, only the compound having a chalcopyrite structure is sintered on the substrate to form a compound semiconductor layer. A photoelectric conversion element can be obtained using this compound semiconductor layer.
- the physical vapor deposition (PVD) material can be produced from the obtained compound having a chalcopyrite structure using a method such as a firing method or hot pressing.
- a method such as a firing method or hot pressing.
- the general procedure of pulverizing, mixing, calcining, molding and sintering the compound powder can be employed.
- PVD physical vapor deposition
- the photoelectric conversion element includes an element that converts electric energy into light, and conversely, an element that converts light into electric energy.
- Typical examples of the former include a light-emitting diode and a semiconductor laser, and examples of the latter include a photodiode and the like. Solar cells and the like.
- Example 1 (Synthesis of chalcopyrite particle dispersion by water-toluene two-phase method)
- Example 1 in which a chalcopyrite particle dispersion was synthesized by a water-toluene two-phase method will be described with reference to FIG.
- the phase transfer catalyst tetrabutylammonium bromide (1.61 g, manufactured by Tokyo Chemical Industry Co., Ltd., purity 98.0%) was added. The mixture was mixed and stirred vigorously with a magnetic stirrer at room temperature (20 ° C.).
- Solution A Copper nitrate trihydrate (0.5 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 99.0%) Indium nitrate trihydrate (0.43 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 98.0%) ) Gallium nitrate trihydrate (0.16 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 99.9%) Selenium tetrachloride (0.883 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 98.0%) was ion-exchanged water. A solution dissolved in (100 ml) was prepared.
- Solution B Solution A and Solution B were mixed in the atmosphere at room temperature (20 ° C.) and stirred vigorously with a magnetic stirrer for 30 minutes. Then, a solution in which dodecanethiol (1.92 ml, Wako Pure Chemical Industries, Ltd., purity 98.0%) as a protective agent was dissolved in toluene (70 ml, Wako Pure Chemical Industries, Ltd., purity 99.5%) was mixed.
- the chalcopyrite dispersion solution was washed by removing the solvent using an evaporator (Yamato Scientific Co., Ltd., RE301, under reduced pressure (200 hPa)) and adding ethanol (Wako Pure Chemical Industries, Ltd., purity 99.5%). Then, it was recovered by centrifugation (manufactured by ASONE Corporation, CN-2060, 4300 rpm, 15 minutes) and dried. 2 shows the XRD results of the obtained powder (Rigaku RAD-2B, Cu2 kW specification, 2 ⁇ / ⁇ measurement 4 ° / min. Using graphite monochromator). From FIG. 2, it was confirmed that chalcopyrite particles of CuIn 0.5 Ga 0.5 Se 2 were generated.
- Example 2 (Synthesis of chalcopyrite particles with water as solvent) With reference to FIG. 3, Example 2 in which chalcopyrite particles were synthesized using all of the solvent as water was described.
- copper nitrate trihydrate (1.45 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 99.0%
- indium nitrate trihydrate (2.13 g, manufactured by Wako Pure Chemical Industries, Ltd.) (Purity 98.0%)
- Selenium tetrachloride (2.65 g, Wako Pure Chemical Industries, Ltd., purity 98.0%) was added, and the mixture was stirred for 5 minutes at room temperature (20 ° C) with a magnetic stirrer with medium strength (This solution is called Solution A)
- a solution in which sodium borohydride as a reducing agent (4.54 g, manufactured by Wako Pure Chemical Industries, Ltd., purity 95.0%) was dissolved in ion-exchanged water (50 ml) was prepared, and
- FIG. 4 shows the XRD results of the obtained powder (RADku RAD-2B, Cu2kW specification, 2 ⁇ / ⁇ measurement 4 ° / min. Using graphite monochromator). From FIG. 4, it was confirmed that chalcopyrite particles of CuInSe 2 were generated.
- Example 3 Synthesis of chalcopyrite particle dispersion using water as the main solvent
- Example 3 in which the chalcopyrite particle dispersion was synthesized using water as the main solvent will be described.
- Disperse selenium powder (0.79 g, manufactured by Kojun Chemical Co., Ltd., purity 99.9%) in 90 ml of ion-exchanged water, cool and stir (fill a container with ice water, float a beaker on it, and use a magnetic stirrer Stirred with strength).
- FIG. 5 shows the XRD results of the obtained powder (Rigaku RAD-2B, Cu 2 kW specification, 2 ⁇ / ⁇ measurement 4 ° / min. Using graphite monochromator). From FIG. 5, it was confirmed that chalcopyrite particles of CuIn 0.5 Ga 0.5 Se 2 were generated.
- Example 1 The powder obtained in Example 1 was further observed with a scanning electron microscope (SEM, manufactured by JEOL Ltd., JSM-6010LA, with elemental analysis, acceleration voltage 15 kW, magnification x 30000 times).
- SEM scanning electron microscope
- FIG. 6 shows the obtained SEM image. From this, it was found that particles having a size of 500 nm or less were obtained.
- Example 1 The powder obtained in Example 1 was further analyzed by energy dispersive X-ray spectroscopy (EDS, manufactured by JEOL Ltd., JSM-6010LA, acceleration voltage 20 kW, magnification x 5000 times).
- FIG. 7 shows the obtained EDS image.
- the upper left is a secondary electron image (SEI), and it can be seen that particles are uniformly present on the entire screen.
- SEI secondary electron image
- the upper right is the Cu mapping image
- the lower left is the In mapping image
- the lower right is the Se mapping image.
- each element is present uniformly on the entire screen. From these images, it is considered that the powder obtained in Example 1 contains Cu, In and Se uniformly. This confirms the formation of CuIn 0.5 Ga 0.5 Se 2 confirmed by the previous XRD result (FIG. 2).
- FIG. 7 it has been confirmed that Ga is also present uniformly.
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Abstract
Description
多元蒸着法は原料の各元素を蒸着する方法であり、小面積セルで18%以上の高効率が実現できている。通常は基板を固定し、蒸着源の前に据えられたシャッタの開閉によって蒸着元素を選択してカルコパイライト化合物の製膜を行う。米国の国立再生エネルギー研究所(NREL)では、この方法を用いて19.5%のエネルギー変換効率を示すCIGS太陽電池を製作した報告例もある。
セレン化法では、まずCu−In−Gaなどからなる金属プリカーサをスパッタ法で堆積し、それを希釈したH2Se雰囲気で熱処理することでカルコパイライト化合物の膜を製膜している。
本発明者らは、上記課題を解決した粒子径の小さい高品位なカルコパイライト粒子を製造する方法を見出したものである。
(1)周期律表第11族元素A、第13族元素B、および第16族元素Cを溶媒に溶解させて溶液を用意する工程、および
該溶液に還元剤を接触させる工程を含む、
ABC2なる組成式で表わされる、カルコパイライト構造を有する化合物を製造する方法。
溶媒が極性溶媒であれば、概して、電解質化合物に対する溶解力が大きく、また無極性溶媒には溶解しない多くの物質を溶解することができる。水、エタノールは代表的な水素結合性の極性溶媒である。またプロトン性の水素をもたない双極性非プロトン性溶媒(dipolar aprotic solvent),たとえばN,N‐ジメチルホルムアミド,N,N‐ジメチルアセトアミド,ジメチルスルホキシド,N‐メチルピロリドン,ヘキサメチルホスホルアミドなどは,高分子化合物の溶媒などとして用いることができる。
溶媒が非極性溶媒であれば、概して、極性溶媒には溶解しないような極性の小さい物質を溶解することができる。非極性溶媒として、ヘキサン、ベンゼン、トルエン、ジエチルエーテル、クロロホルム、酢酸エチル、塩化メチレンなどを用いることができる。
また、−II価のセレン化物としてH2Seがあり、これはガス状のものである。従来の化合物半導体製造法として、セレン化水素雰囲気下での熱処理により前駆体物質のセレン化を行うことがあるが(セレン化法)、熱処理炉が必要でこの炉が非常に高価という問題がある。本発明は、液相での化合物合成を可能とするものであり、すなわち高価な熱処理炉およびそれによる熱処理工程等を必要としない。
本発明では、セレン粉末(酸溶解性)、四塩化セレン(加水分解性)、臭化セレン(二硫化炭素、クロロホルム、臭化エチルに可溶)、ヨウ化セレン(冷水で分解)等のハロゲン化塩、亜セレン酸(水、エタノールに易溶)、二酸化セレン(水、エタノール、酢酸に易溶)等を使用してもよい。
この工程に沿って本発明について以下詳述する。
(水−トルエン二相法によるカルコパイライト粒子分散液の合成)
図1を参照しながら、水−トルエン二相法によるカルコパイライト粒子分散液の合成した実施例1について説明する。
非極性溶媒のトルエン(50ml、和光純薬株式会社製、純度99.5%)に、相間移動触媒のテトラブチルアンモニウムブロミド(1.61g、東京化成工業株式会社製、純度98.0%)を混合し常温下(20℃)、マグネティックスターラーで強攪拌させた。(この溶液を溶液Aとする)
一方で、硝酸銅三水和物(0.5g、和光純薬株式会社製、純度99.0%)硝酸インジウム三水和物(0.43g、和光純薬株式会社製、純度98.0%)硝酸ガリウム三水和物(0.16g、和光純薬株式会社製、純度99.9%)四塩化セレン(0.883g、和光純薬株式会社製、純度98.0%)をイオン交換水(100ml)に溶解させた溶液を調製した。(この溶液を溶液Bとする)
溶液Aと溶液Bを大気中、室温(20℃)で混合し30分マグネティックスターラーで強攪拌した。
その後トルエン(70ml、和光純薬株式会社製、純度99.5%)に保護剤のドデカンチオール(1.92ml、和光純薬株式会社製、純度98.0%)を溶解させた溶液を混合し、更に10分マグネティックスターラーで強攪拌した後、イオン交換水100mlに還元剤の水素化硼素ナトリウムを(3.63g、和光純薬株式会社製、純度95.0%)溶解させた水溶液を加え8時間マグネティックスターラーで強攪拌し、分液漏斗で水層を除去しカルコパイライト粒子分散溶液を得た。
(カルコパイライト粒子の回収)
上記カルコパイライト分散溶液を、エバポレーター(ヤマト科学株式会社製、RE301、減圧(200hPa)下)を用いて溶媒を除去しエタノール(和光純薬株式会社製、純度99.5%)を加えて洗浄し、遠心分離(アズワン株式会社製、CN−2060、4300rpm 15分)にて回収し乾燥させた。得られた粉末のXRD結果(Rigaku社製RAD−2B、Cu2kW仕様、2θ/θ測定4°/min.グラファイトモノクロメータ使用)を図2に示す。図2より、CuIn0.5Ga0.5Se2のカルコパイライト粒子が生成していることが確認された。
(溶媒を全て水としたカルコパイライト粒子の合成)
図3を参照しながら、溶媒を全て水としたカルコパイライト粒子の合成した実施例2について説明する。
イオン交換水(250ml)に、硝酸銅三水和物(1.45g、和光純薬株式会社製、純度99.0%)硝酸インジウム三水和物(2.13g、和光純薬株式会社製、純度98.0%)四塩化セレン(2.65g、和光純薬株式会社製、純度98.0%)を加え、5分間常温(20℃)にてマグネティックスターラーで中程度の強度で攪拌を行った(この溶液を溶液Aとする)
一方でイオン交換水(50ml)に還元剤の水素化硼素ナトリウム(4.54g、和光純薬株式会社製、純度95.0%)を溶解させた溶液を調整し、これを溶液Aに加え、1時間常温(20℃)にてマグネティックスターラーで強攪拌を行った。
その後溶液を遠心分離(アズワン株式会社製、CN−2060、4300rpm 15分)にて溶媒除去及びエタノール(和光純薬株式会社製、純度99.5%)洗浄を繰り返し、乾燥させ粒子を得た。得られた粉末のXRD結果(Rigaku社製RAD−2B、Cu2kW仕様、2θ/θ測定4°/min.グラファイトモノクロメータ使用)を図4に示す。図4より、CuInSe2のカルコパイライト粒子が生成していることが確認された。
(主溶媒を水とした、カルコパイライト粒子分散液の合成)
図3を参照しながら、主溶媒を水とした、カルコパイライト粒子分散液の合成した実施例3について説明する。
イオン交換水90mlにセレン粉末(0.79g、株式会社高純度化学製、純度99.9%)を分散させ、冷却攪拌(容器に氷水を満たし、そこにビーカーを浮かべてマグネティックスターラーで中程度の強度で攪拌させた)を行った。分散液の温度が0℃に下がったところで、イオン交換水10mlに還元剤の水素化硼素ナトリウム(0.76g、和光純薬株式会社製、純度95.0%)を溶解させた溶液を加え、透明な溶液を得た。(溶液A)
一方で70℃のピリジン(100ml)に塩化銅(II)(0.67g、和光純薬株式会社製、純度95.0%)、塩化インジウム(III)(0.77g、東京化成工業株式会社製、純度98.0%)塩化ガリウム(III)(0.26g、和光純薬株式会社製、純度99.0%)を溶解させた溶液を調整し、溶液Aと混合させ20分マグネティックスターラーで強攪拌し、カルコパイライト分散液を得た。
(カルコパイライト粒子の回収)
上記カルコパイライト分散液を遠心分離(アズワン株式会社製、CN−2060、4300rpm 15分)で粒子を回収した。エタノール(和光純薬株式会社製、純度99.5%)で洗浄後、更に遠心分離(アズワン株式会社製、CN−2060、4300rpm 15分)にて回収し、乾燥した。得られた粉末のXRD結果(Rigaku社製RAD−2B、Cu2kW仕様、2θ/θ測定4°/min.グラファイトモノクロメータ使用)を図5に示す。図5より、CuIn0.5Ga0.5Se2のカルコパイライト粒子が生成していることが確認された。
Claims (11)
- 周期律表第11族元素A、第13族元素B、および第16族元素Cを溶媒に溶解させて溶液を用意する工程、および
該溶液に還元剤を接触させる工程を含む、
ABC2なる組成式で表わされる、カルコパイライト構造を有する化合物を製造する方法。 - 該カルコパイライト構造を有する化合物が該溶液中で分散していることを特徴とする、請求項1に記載の方法。
- 該カルコパイライト構造を有する化合物がナノメートルからサブミクロンオーダーの粒子を含むことを特徴とする、請求項1または2に記載の方法。
- 該第11族元素A、第13族元素B、および第16族元素Cが、該溶媒に20℃±15℃で溶解性を有する化合物または単体の形態で用意されることを特徴とする、請求項1~3のいずれか1項に記載の製造方法。
- 該第16族元素Cの化合物において、第16族元素Cの価数が−IIではないことを特徴とする、請求項4に記載の製造方法。
- 該溶媒が、少なくとも極性溶媒または非極性溶媒のいずれかを含むことを特徴とする、請求項1~5のいずれか1項に記載の製造方法。
- 該溶媒として極性溶媒および非極性溶媒を併用し、且つこれらの溶媒に相間移動触媒を接触させることを特徴とする、請求項1~6のいずれか1項に記載の製造方法。
- 該還元剤が、ヒドリド還元剤、ヒドラジン、シュウ酸、アスコルビン酸、ホルムアルデヒド、アセトアルデヒド、および亜硫酸ナトリウムからなる群から選択される少なくとも一種またはそれらの混合物であることを特徴とする、請求項1~7のいずれか1項に記載の製造方法。
- 請求項1~8のいずれか1項に記載の方法にて製造されたカルコパイライト構造を有する化合物を用いて、塗布型材料、又は物理蒸着(PVD)材料を製造する方法。
- 請求項1~8のいずれか1項に記載の方法にて製造されたカルコパイライト構造を有する化合物を用いて、光電変換素子を製造する方法。
- 該光電変換素子が太陽電池またはフォトダイオードである、請求項10に記載の方法。
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CN103400894A (zh) * | 2013-07-09 | 2013-11-20 | 山东建筑大学 | 一种制备硫化锌光电薄膜的方法 |
WO2015008858A1 (ja) * | 2013-07-19 | 2015-01-22 | 株式会社太陽電池総合研究所 | カルコパイライトナノ粒子の製造方法 |
JPWO2013054623A1 (ja) * | 2011-10-13 | 2015-03-30 | 京セラ株式会社 | 半導体層の製造方法、光電変換装置の製造方法および半導体形成用原料 |
JP2016521922A (ja) * | 2013-08-01 | 2016-07-25 | エルジー・ケム・リミテッド | 太陽電池光吸収層製造用凝集相前駆体及びその製造方法 |
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US20150174613A1 (en) * | 2013-12-19 | 2015-06-25 | Sk Innovation Co., Ltd. | Method for fabricating flexible nano structure |
US11014854B2 (en) * | 2017-08-07 | 2021-05-25 | Consolidated Nuclear Security, LLC | Ceramic radiation detector device and method |
CN108483412A (zh) * | 2018-06-14 | 2018-09-04 | 西南大学 | 基于水热法一步制备金属硒化物纳米材料的方法 |
CN108963244B (zh) * | 2018-07-25 | 2020-07-14 | 广州大学 | 一种复合电极材料的制备方法 |
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