WO2012014370A1 - 荷電粒子線放射装置 - Google Patents
荷電粒子線放射装置 Download PDFInfo
- Publication number
- WO2012014370A1 WO2012014370A1 PCT/JP2011/003394 JP2011003394W WO2012014370A1 WO 2012014370 A1 WO2012014370 A1 WO 2012014370A1 JP 2011003394 W JP2011003394 W JP 2011003394W WO 2012014370 A1 WO2012014370 A1 WO 2012014370A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- insulator
- electron
- conductive insulator
- electron gun
- tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/484—Eliminating deleterious effects due to thermal effects, electrical or magnetic fields; Preventing unwanted emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/073—Electron guns using field emission, photo emission, or secondary emission electron sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/488—Schematic arrangements of the electrodes for beam forming; Place and form of the elecrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/027—Construction of the gun or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements common to two or more basic types of discharge tubes or lamps
- H01J3/40—Arrangements for removing or diverting unwanted particles, e.g. for negative ions or fringing electrons; Arrangements for velocity or mass selection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/248—Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/03—Mounting, supporting, spacing or insulating electrodes
- H01J2237/038—Insulating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06325—Cold-cathode sources
- H01J2237/06341—Field emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0802—Field ionization sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
Definitions
- the present invention relates to the structure of an electron gun and an ion gun of a charged particle beam apparatus.
- an electron gun or ion gun of a charged particle beam apparatus such as an electron microscope or a focused ion beam processing apparatus
- a high voltage is stably applied particularly in an electron gun (or ion gun) that generates a charged particle beam having high acceleration energy. Therefore, those having an accelerating tube structure are widely used.
- the charge accumulates in that portion, which may cause non-uniform potential distribution and cause discharge.
- a cylindrical conductive insulator 7 fixed on the metal member 14 is disposed below the insulator insulator 6, and the inner wall surface side of the connecting portion between the insulator insulator 6 and the conductive insulator 7 is controlled.
- An electrode 5 is disposed.
- a control voltage (V2) of several kV to several tens of kV is applied to the control electrode 5 from the external voltage source 16 to the FE electron source, and is used for the purpose of controlling the trajectory of the extracted electron beam 4.
- the extraction electrode 3, the metal member 13, and the control electrode 5 are insulated by the insulator 6 so that the potential difference is maintained.
- the insulator 6 for example, alumina ceramics or the like is used.
- the potential distribution in the acceleration tube has a substantially constant potential gradient as shown in FIG.
- the acceleration voltage (V0) is ⁇ 200 kV and the control voltage (V2) is 20 kV.
- each interstage voltage is calculated to be the same voltage at 36 kV.
- the potential gradient below the control electrode 5 becomes gentle in the metal metallized region, but is almost constant as a whole. Therefore, the electron beam 4 that has passed through the control electrode 5 is accelerated along a substantially linear trajectory and emitted from the electron gun. At this time, the aberration generated in the acceleration tube 2 is reduced.
- the potential distributions are respectively shown.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
Description
V0-V2
で表される。このとき、各段間のブリーダ抵抗11が同一の場合、各段間電圧は
(V0-V2)/5
と等しくなる。よって、加速管内の電位勾配の変化が小さくなる。この結果、加速管構造をとることにより静電レンズ効果の影響を小さくしたまま、電子線を加速することができる。
2 加速管
3 引出電極
4 電子線
5 制御電極
6 絶縁体碍子
7 導電性碍子
8 金属メタライズ領域
9 導体金属
10 加速電極
11 ブリーダ抵抗
12 抵抗が大きい領域
13,14 金属部材
Claims (3)
- 電子ビームを放出するチップ部を備えた電子源と、
当該電子源の下部に設けられた接地電極と、
当該接地電極上に固定され、前記電子ビームの軌道を囲むように配置された円柱状の導電性碍子と、
前記円柱状の導電性碍子の内部に配置され、前記電子源から電子ビームを引出すための引出電圧が印加される引出電極と、
前記導電性碍子の上部に設けられ、前記引出電圧を前記引出電極に印加するための導電性部材とを備え、
前記円柱状の導電性碍子は、内壁面にメタライズ領域が形成されていることを特徴とする電子銃。 - 請求項1に記載の電子銃において、
前記導電性部材と前記円柱状の導電性碍子との間であって、前記電子ビームの軌道を囲むように配置された円柱状の絶縁性碍子と、
前記円柱状の絶縁性碍子と円柱状の導電性碍子とにより構成される空間であって、前記引出電極の下部に配置された制御電極とを備えることを特徴とする電子銃。 - 請求項1または2に記載の電子銃において、
前記メタライズ領域は、前記円柱状の導電性碍子の内壁面に形成された複数の溝であることを特徴とする電子銃。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112011102526T DE112011102526T5 (de) | 2010-07-29 | 2011-06-15 | Strahlvorrichtung für einen Strahl geladener Teilchen |
| US13/812,700 US8803411B2 (en) | 2010-07-29 | 2011-06-15 | Charged particle beam radiation apparatus |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010169967A JP5023199B2 (ja) | 2010-07-29 | 2010-07-29 | 荷電粒子線放射装置 |
| JP2010-169967 | 2010-07-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2012014370A1 true WO2012014370A1 (ja) | 2012-02-02 |
Family
ID=45529609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2011/003394 Ceased WO2012014370A1 (ja) | 2010-07-29 | 2011-06-15 | 荷電粒子線放射装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8803411B2 (ja) |
| JP (1) | JP5023199B2 (ja) |
| DE (1) | DE112011102526T5 (ja) |
| WO (1) | WO2012014370A1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013505545A (ja) * | 2009-09-18 | 2013-02-14 | エフ・イ−・アイ・カンパニー | 分散イオン源加速カラム |
| CN103068142A (zh) * | 2012-12-26 | 2013-04-24 | 江苏达胜加速器制造有限公司 | 一种中间电极及应用该中间电极的加速管 |
| WO2022244268A1 (ja) * | 2021-05-21 | 2022-11-24 | 株式会社日立ハイテク | 粒子加速用構造体および荷電粒子ビーム装置 |
| JP2022188764A (ja) * | 2021-06-09 | 2022-12-21 | 韓國電子通信研究院 | 高電圧駆動装置 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5959326B2 (ja) * | 2012-06-11 | 2016-08-02 | 株式会社日立ハイテクノロジーズ | 荷電粒子ビーム発生装置、荷電粒子線装置、高電圧発生装置、および高電位装置 |
| US9006689B2 (en) * | 2013-03-26 | 2015-04-14 | Ion Technology Solutions, Llc | Source bushing shielding |
| DE112014006978B4 (de) * | 2014-10-20 | 2022-01-27 | Hitachi High-Tech Corporation | Rasterelektronenmikroskop |
| WO2016117099A1 (ja) | 2015-01-23 | 2016-07-28 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置、荷電粒子線装置用光学素子、及び、荷電粒子線装置用部材の製造方法 |
| JP6573835B2 (ja) * | 2016-01-12 | 2019-09-11 | 株式会社荏原製作所 | 検査装置及び高圧基準管の製造方法 |
| DE102016214750A1 (de) * | 2016-05-19 | 2017-11-23 | Siemens Aktiengesellschaft | Verfahren zur Herstellung eines keramischen Isolators |
| DE102018200593B4 (de) * | 2018-01-15 | 2019-08-08 | Carl Zeiss Microscopy Gmbh | Steckverbindungseinheit, Teilchenstrahlerzeuger mit einer Steckverbindungseinheit sowie Teilchenstrahlgerät mit einem Teilchenstrahlerzeuger |
| KR102689054B1 (ko) * | 2021-06-09 | 2024-07-29 | 한국전자통신연구원 | 고전압 구동 장치 |
| US11830699B2 (en) * | 2021-07-06 | 2023-11-28 | Kla Corporation | Cold-field-emitter electron gun with self-cleaning extractor using reversed e-beam current |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08222160A (ja) * | 1995-02-17 | 1996-08-30 | Kyocera Corp | 加速管 |
| JP2010015818A (ja) * | 2008-07-03 | 2010-01-21 | Hitachi High-Technologies Corp | 電子源装置及びイオン装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3631282A (en) * | 1969-01-23 | 1971-12-28 | Nat Electrostatics Corp | Accelerating tube with heating means |
| JPH0630235B2 (ja) * | 1985-06-11 | 1994-04-20 | 浜松ホトニクス株式会社 | 高時間分解電子顕微鏡装置 |
| EP1122761B1 (en) * | 2000-02-01 | 2004-05-26 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Optical column for charged particle beam device |
| JP4576437B2 (ja) | 2008-02-18 | 2010-11-10 | 株式会社日立ハイテクノロジーズ | 荷電粒子加速装置 |
| JP5141321B2 (ja) | 2008-03-18 | 2013-02-13 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
-
2010
- 2010-07-29 JP JP2010169967A patent/JP5023199B2/ja not_active Expired - Fee Related
-
2011
- 2011-06-15 WO PCT/JP2011/003394 patent/WO2012014370A1/ja not_active Ceased
- 2011-06-15 US US13/812,700 patent/US8803411B2/en not_active Expired - Fee Related
- 2011-06-15 DE DE112011102526T patent/DE112011102526T5/de not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08222160A (ja) * | 1995-02-17 | 1996-08-30 | Kyocera Corp | 加速管 |
| JP2010015818A (ja) * | 2008-07-03 | 2010-01-21 | Hitachi High-Technologies Corp | 電子源装置及びイオン装置 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013505545A (ja) * | 2009-09-18 | 2013-02-14 | エフ・イ−・アイ・カンパニー | 分散イオン源加速カラム |
| CN103068142A (zh) * | 2012-12-26 | 2013-04-24 | 江苏达胜加速器制造有限公司 | 一种中间电极及应用该中间电极的加速管 |
| WO2022244268A1 (ja) * | 2021-05-21 | 2022-11-24 | 株式会社日立ハイテク | 粒子加速用構造体および荷電粒子ビーム装置 |
| JP7564357B2 (ja) | 2021-05-21 | 2024-10-08 | 株式会社日立ハイテク | 粒子加速用構造体および荷電粒子ビーム装置 |
| US12586748B2 (en) | 2021-05-21 | 2026-03-24 | Hitachi High-Tech Corporation | Structure for particle acceleration and charged particle beam apparatus |
| JP2022188764A (ja) * | 2021-06-09 | 2022-12-21 | 韓國電子通信研究院 | 高電圧駆動装置 |
| US11894224B2 (en) | 2021-06-09 | 2024-02-06 | Electronics And Telecommunications Research Institute | High voltage driving device |
| JP7458441B2 (ja) | 2021-06-09 | 2024-03-29 | 韓國電子通信研究院 | 高電圧駆動装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US8803411B2 (en) | 2014-08-12 |
| DE112011102526T5 (de) | 2013-07-11 |
| JP2012033298A (ja) | 2012-02-16 |
| US20130140977A1 (en) | 2013-06-06 |
| JP5023199B2 (ja) | 2012-09-12 |
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