WO2011124185A3 - 内存检测方法和内存检测装置 - Google Patents

内存检测方法和内存检测装置 Download PDF

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Publication number
WO2011124185A3
WO2011124185A3 PCT/CN2011/074099 CN2011074099W WO2011124185A3 WO 2011124185 A3 WO2011124185 A3 WO 2011124185A3 CN 2011074099 W CN2011074099 W CN 2011074099W WO 2011124185 A3 WO2011124185 A3 WO 2011124185A3
Authority
WO
WIPO (PCT)
Prior art keywords
memory
memory detecting
basic unit
write operation
detecting device
Prior art date
Application number
PCT/CN2011/074099
Other languages
English (en)
French (fr)
Other versions
WO2011124185A2 (zh
Inventor
叶荣标
张志龙
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to CN201180001054.4A priority Critical patent/CN102893263B/zh
Priority to PCT/CN2011/074099 priority patent/WO2011124185A2/zh
Publication of WO2011124185A2 publication Critical patent/WO2011124185A2/zh
Publication of WO2011124185A3 publication Critical patent/WO2011124185A3/zh

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

一种内存检测方法和内存检测装置。方法包括以下步骤：对内存物理单元中的基本单元进行间隔写入操作(S101)；对进行写入操作的基本单元进行回读检测，以确定写入数值与回读数值不同的基本单元（S102)。本内存检测方法和内存检测装置，通过对内存物理单元上的基本单元进行间隔写入操作，在对执行写入操作后的基本单元进行回读时，能够及时发现存在故障而互相影响的相邻基本单元，从而提高了内存检测的准确性，提高了内存和设备的可靠性。
PCT/CN2011/074099 2011-05-16 2011-05-16 内存检测方法和内存检测装置 WO2011124185A2 (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201180001054.4A CN102893263B (zh) 2011-05-16 2011-05-16 内存检测方法和内存检测装置
PCT/CN2011/074099 WO2011124185A2 (zh) 2011-05-16 2011-05-16 内存检测方法和内存检测装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2011/074099 WO2011124185A2 (zh) 2011-05-16 2011-05-16 内存检测方法和内存检测装置

Publications (2)

Publication Number Publication Date
WO2011124185A2 WO2011124185A2 (zh) 2011-10-13
WO2011124185A3 true WO2011124185A3 (zh) 2012-04-19

Family

ID=44763329

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2011/074099 WO2011124185A2 (zh) 2011-05-16 2011-05-16 内存检测方法和内存检测装置

Country Status (2)

Country Link
CN (1) CN102893263B (zh)
WO (1) WO2011124185A2 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106776173B (zh) * 2016-12-15 2019-09-17 郑州云海信息技术有限公司 一种内存检测方法及装置
CN107516546B (zh) * 2017-07-07 2020-09-22 中国航空工业集团公司西安飞行自动控制研究所 一种随机存储器的在线检测装置及方法
CN110647436A (zh) * 2018-06-26 2020-01-03 北京自动化控制设备研究所 一种ddr2/ddr3存储器的快速检测方法
CN109961824A (zh) * 2019-03-27 2019-07-02 苏州浪潮智能科技有限公司 一种内存测试方法
CN112053731A (zh) * 2020-07-28 2020-12-08 深圳市宏旺微电子有限公司 Ddr测试方法和装置
CN113407372B (zh) * 2021-06-01 2023-10-20 中国科学院计算技术研究所 一种独立于操作系统的计算机系统内存检测方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410687A (en) * 1990-03-19 1995-04-25 Advantest Corporation Analyzing device for saving semiconductor memory failures
CN1479207A (zh) * 2002-08-29 2004-03-03 深圳市中兴通讯股份有限公司 内存检测方法
CN101576838A (zh) * 2009-05-13 2009-11-11 北京中星微电子有限公司 一种检测内存的方法和装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410687A (en) * 1990-03-19 1995-04-25 Advantest Corporation Analyzing device for saving semiconductor memory failures
CN1479207A (zh) * 2002-08-29 2004-03-03 深圳市中兴通讯股份有限公司 内存检测方法
CN101576838A (zh) * 2009-05-13 2009-11-11 北京中星微电子有限公司 一种检测内存的方法和装置

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Publication number Publication date
CN102893263B (zh) 2016-12-07
WO2011124185A2 (zh) 2011-10-13
CN102893263A (zh) 2013-01-23

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