WO2011031024A3 - 대면적 기판용 마그네트론 스퍼터링 타겟 장치 - Google Patents
대면적 기판용 마그네트론 스퍼터링 타겟 장치 Download PDFInfo
- Publication number
- WO2011031024A3 WO2011031024A3 PCT/KR2010/005780 KR2010005780W WO2011031024A3 WO 2011031024 A3 WO2011031024 A3 WO 2011031024A3 KR 2010005780 W KR2010005780 W KR 2010005780W WO 2011031024 A3 WO2011031024 A3 WO 2011031024A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sputtering target
- sized substrate
- target device
- magnetron sputtering
- magnet
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3455—Movable magnets
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
대면적 기판용 마그네트론 스퍼터링 타겟 장치에 관해 개시한다. 본 발명의 대면적 기판용 마그네트론 스퍼터링 타겟 장치는: 대면적 기판으로부터 이격되게 위치하며, 상기 대면적 기판의 박막 형성 부위를 모두 커버하는 형상을 갖는 스퍼터링 타겟과; 이동가능하게 상기 스퍼터링 타겟 부근에 위치한 마그네트와; 상기 마그네트를 이동시켜서 상기 스퍼터링 타겟의 전체 면을 스캔할 수 있도록 해주는 마그네트 이동수단을 구비하는 것을 특징으로 한다. 본 발명에 따르면, 챔버의 사이즈를 크게 늘릴 필요가 없어서 장비가 차지하는 면적의 측면에서 유리하다. 또한, 대면적 기판 또는 스퍼터링 타겟을 움직이지 않을 경우에 발생할 수도 있는 박막형성의 불균일, 비효율성을 마그네트 이동수단으로 해결할 수 있어서 형성된 박막의 질을 높이는 동시에 박막을 효율적으로 형성할 수 있다.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090085172A KR20110027187A (ko) | 2009-09-10 | 2009-09-10 | 대면적 기판용 마그네트론 스퍼터링 타겟 장치 |
KR10-2009-0085172 | 2009-09-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2011031024A2 WO2011031024A2 (ko) | 2011-03-17 |
WO2011031024A3 true WO2011031024A3 (ko) | 2011-07-07 |
Family
ID=43732911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2010/005780 WO2011031024A2 (ko) | 2009-09-10 | 2010-08-27 | 대면적 기판용 마그네트론 스퍼터링 타겟 장치 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR20110027187A (ko) |
WO (1) | WO2011031024A2 (ko) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20000014681A (ko) * | 1998-08-24 | 2000-03-15 | 구자홍 | 스퍼터링 장치의 자석 이송장치 |
JP2000239841A (ja) * | 1999-02-24 | 2000-09-05 | Ulvac Japan Ltd | スパッタリング方法と装置 |
KR20010076022A (ko) * | 2000-01-24 | 2001-08-11 | 한전건 | 평판 마그네트론 스퍼터링 장치 |
KR20050018716A (ko) * | 2003-08-12 | 2005-02-24 | 엘지전자 주식회사 | 마그네트론 스퍼터링 장치 및 그 동작방법 |
KR20050046170A (ko) * | 2003-11-13 | 2005-05-18 | 엘지전자 주식회사 | 스퍼터링 장치 |
KR20090007795A (ko) * | 2006-06-08 | 2009-01-20 | 시바우라 메카트로닉스 가부시키가이샤 | 마그네트론 스퍼터용 자석 장치, 마그네트론 스퍼터 장치 및 마그네트론 스퍼터 방법 |
-
2009
- 2009-09-10 KR KR1020090085172A patent/KR20110027187A/ko not_active Application Discontinuation
-
2010
- 2010-08-27 WO PCT/KR2010/005780 patent/WO2011031024A2/ko active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20000014681A (ko) * | 1998-08-24 | 2000-03-15 | 구자홍 | 스퍼터링 장치의 자석 이송장치 |
JP2000239841A (ja) * | 1999-02-24 | 2000-09-05 | Ulvac Japan Ltd | スパッタリング方法と装置 |
KR20010076022A (ko) * | 2000-01-24 | 2001-08-11 | 한전건 | 평판 마그네트론 스퍼터링 장치 |
KR20050018716A (ko) * | 2003-08-12 | 2005-02-24 | 엘지전자 주식회사 | 마그네트론 스퍼터링 장치 및 그 동작방법 |
KR20050046170A (ko) * | 2003-11-13 | 2005-05-18 | 엘지전자 주식회사 | 스퍼터링 장치 |
KR20090007795A (ko) * | 2006-06-08 | 2009-01-20 | 시바우라 메카트로닉스 가부시키가이샤 | 마그네트론 스퍼터용 자석 장치, 마그네트론 스퍼터 장치 및 마그네트론 스퍼터 방법 |
Also Published As
Publication number | Publication date |
---|---|
WO2011031024A2 (ko) | 2011-03-17 |
KR20110027187A (ko) | 2011-03-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2922083A3 (en) | Plasma pre-clean process | |
WO2011142957A3 (en) | Inductive plasma source with metallic shower head using b-field concentrator | |
WO2011082020A3 (en) | Shadow ring for modifying wafer edge and bevel deposition | |
WO2012145702A3 (en) | Lithium sputter targets | |
EP2666877A4 (en) | Method for producing high-purity lanthanum, high-purity lanthanum, sputtering target formed from high-purity lanthanum, and metal gate film having high-purity lanthanum as main component | |
WO2012096466A3 (ko) | 박막 증착 장치 및 이를 포함한 기판 처리 시스템 | |
WO2012115907A3 (en) | Edge ring for a thermal processing chamber | |
FR2955336B1 (fr) | Procede de fabrication de produits en alliage 6xxx pour chambre a vide | |
EP3807921A4 (en) | DIRECT DRIVE RF CIRCUIT FOR SUBSTRATE TREATMENT SYSTEMS | |
GB2459917B (en) | A process for the manufacture of a high density ITO sputtering target | |
WO2014085315A3 (en) | Method for forming a barrier layer | |
EP2087144A4 (en) | METHOD FOR REHABILITATION OF A CATHODIC SPUTTER TARGET | |
WO2016099635A3 (en) | Apparatus for pvd dielectric deposition | |
WO2008078500A1 (ja) | 成膜装置および成膜方法 | |
EP3984216A4 (en) | METHOD FOR UNIFIED COMBINATION OF POSITION DEPENDENT PREDICTION | |
WO2012150814A3 (ko) | 대면적 전사용 스탬프 및 이를 이용한 대면적 전사 장비 | |
EP3914751A4 (en) | PULSED THIN FILM DEPOSITION PROCESS | |
EP3984061A4 (en) | SUBSTRATE TREATMENT APPARATUS | |
EP3932592A4 (en) | ALLOY FOR SPUTTER TARGET MATERIAL | |
WO2013023173A3 (en) | Sputtering systems for liquid target materials | |
WO2011031024A3 (ko) | 대면적 기판용 마그네트론 스퍼터링 타겟 장치 | |
EP3650412A4 (en) | METHOD OF CONTROLLING AN ACTUATION MECHANISM FOR A GLASS PLATE CURING PROCESS | |
EP3928799A4 (en) | OPTIMAL PS MODIFICATION PATTERN FOR HETEROPOLY ACIDS | |
WO2012078711A3 (en) | Hydrophilic surfaces and process for preparing | |
EP3307744A4 (en) | VAPOR DEPOSITION METHODS FOR FORMING THIN FILMS CONTAINING OXYGEN AND SILICON |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 10815569 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 10815569 Country of ref document: EP Kind code of ref document: A2 |