WO2010136824A1 - Perfectionnements apportés à l'efficacité d'une source d'ions s'utilisant avec un spectromètre de masse - Google Patents

Perfectionnements apportés à l'efficacité d'une source d'ions s'utilisant avec un spectromètre de masse Download PDF

Info

Publication number
WO2010136824A1
WO2010136824A1 PCT/GB2010/050924 GB2010050924W WO2010136824A1 WO 2010136824 A1 WO2010136824 A1 WO 2010136824A1 GB 2010050924 W GB2010050924 W GB 2010050924W WO 2010136824 A1 WO2010136824 A1 WO 2010136824A1
Authority
WO
WIPO (PCT)
Prior art keywords
ion source
mass spectrometer
housing
chamber
enclosure
Prior art date
Application number
PCT/GB2010/050924
Other languages
English (en)
Inventor
Kevin R. Howes
Eliot Powell
Paul Read
Original Assignee
Micromass Uk Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/474,763 external-priority patent/US8084888B2/en
Priority claimed from US12/474,597 external-priority patent/US8119981B2/en
Priority claimed from US12/474,530 external-priority patent/US8487239B2/en
Priority claimed from US12/474,548 external-priority patent/US8536522B2/en
Priority claimed from US12/474,562 external-priority patent/US8598512B2/en
Application filed by Micromass Uk Limited filed Critical Micromass Uk Limited
Publication of WO2010136824A1 publication Critical patent/WO2010136824A1/fr

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M7/00—Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
    • H02M7/42—Conversion of dc power input into ac power output without possibility of reversal
    • H02M7/44—Conversion of dc power input into ac power output without possibility of reversal by static converters
    • H02M7/48—Conversion of dc power input into ac power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0067—Converter structures employing plural converter units, other than for parallel operation of the units on a single load
    • H02M1/008—Plural converter units for generating at two or more independent and non-parallel outputs, e.g. systems with plural point of load switching regulators

Definitions

  • the present invention relates to the field of mass spectrometry.
  • Ion sources are an important part of the mass spectrometer. Mass spectrometers can only produce results of what is input into the instrument. If the ion source is very inefficient, which means that very few sample ions are produced, the mass spectrometer will also be inefficient. Equally, if the ion source produces too many ions from solvent or other impurities in the instrument noise produced within the instrument may reduce the potential performance.
  • Ion sources produce greater numbers of sample ions at higher temperatures. However, they will also produce more noise ions at higher temperatures too. These high temperatures also result in the access to source enclosures needing to be restricted for compliance with regulatory requirements. To date, this has been achieved by the use of additional instrument panels.
  • One aspect of the present invention provides a method of enhancing the performance of an ion source for use with a mass spectrometer which ion source has a housing incorporating an ion source enclosure defining a chamber and an outer cover remote from the chamber and wherein a fluid flow passageway is provided between the ion source enclosure and the outer cover, the method comprising supplying to the ion source housing a regulated flow of fluid through the fluid passageways so as to maintain the ion source enclosure within a predetermined temperature range of substantially between 60°c and 80°c.
  • the predetermined temperature range is approximately 70°c.
  • an ion source housing for use with a mass spectrometer which housing incorporates an ion source enclosure defining a chamber and an outer cover remote from the chamber and wherein a fluid flow passageway is provided between the ion source enclosure and the outer cover which passageway has an inlet and at least one outlet positioned so as to encourage an efficient flow of fluid through said fluid flow passageway in order to maintain the ion source enclosure within a predetermined temperature range of substantially between 60c and 80c.
  • the fluid flow passageway incorporates a heat sink.
  • Yet another aspect of the present invention provides a mass spectrometer having an ion source enclosure according to the immediately preceding paragraph wherein the ion source has mounting means complementary to mounting means provided by the mass spectrometer to detachably couple the ion source with said mass spectrometer and to allow movement of the housing to bring the ion source chamber into position of use at the inlet of said mass spectrometer and to take the ion source chamber from said position of use into a retracted position, and a release mechanism that cooperates with said mass spectrometer to allow said movement of said housing.
  • the ion source mounting and the complementary mass spectrometer mounting together allow pivotal movement of the ion source housing towards and away from the inlet of said mass spectrometer.
  • the ion source mounting and the complementary mass spectrometer mounting together allow translatory movement of the ion source housing when in the retracted position in a direction along the axis of said pivotal movement to allow detachment and replacement of the ion source housing with respect to said inlet of the mass spectrometer .
  • pressure sensor means may be provided to allow continuous monitoring of source pressure and periodic leak checking of the source enclosure and wherein the pressure sensor means may be adapted to actuate a pressure check valve to prevent potentially dangerous source over-pressurization occurring in fault conditions.
  • the pressure sensor means is operatively connected to an atmospheric pressure ionization (API) solenoid which is adapted to close at a predetermined pressure to protect the pressure sensor means.
  • API atmospheric pressure ionization
  • an exhaust isolation valve is provided and operative in the event that API gas is not present to prevent migration of external gases into the ion source.
  • sealing means may be provided to create an air tight seal between said housing and said mass spectrometer when the ion source chamber is in said position of use.
  • Figure 1 is a diagram of an ion source from the side adapted for attachment to the mass spectrometer
  • Figure 2 is a diagram of the ion source from the external side when attached to the mass spectrometer
  • FIG. 3 is a diagram of a source in accordance with the current invention.
  • Figure 4 is a graph illustrating the performance of the ion source against temperature.
  • Figure 1 shows an ion source (1) in accordance with the invention.
  • the ion source has a housing(3), an ion source enclosure (5) which defines an ion chamber (7) and an outer cover (9) remote from the chamber.
  • a fluid flow passageway shown by a series of arrows (11) is provided between the ion source enclosure (5) and the outer cover (9) .
  • Figure 2 shows an alternative ion source (1) in accordance with the invention.
  • the ion source has a housing (3), an ion source enclosure (5) which defines an ion chamber (7) and an outer cover (9) remote from the chamber.
  • a fluid flow passageway (not visible) is provided between the ion source enclosure (5) and the outer cover ( 9) .
  • FIG. 3 is a diagram of an ion source in accordance with the present invention.
  • the ion source (1) is hinged away from, but proximal to the mass spectrometer (13) .
  • the source detachably latches on to the mass spectrometer by latch mechanism (15) on the mass spectrometer and release mechanism (17) upon the ion source housing.
  • the release handle (19) actuates release mechanism (17) so as to release the ion source (1) from the mass spectrometer (13) when in a closed position of use so that it can be hinged into a retracted position as shown.
  • the source may be mounted on the mass spectrometer by way of mounting points (21 and 23) and corresponding mounting cavities (not shown) upon the source at a mounting plate (25) .
  • the mounting plate is hingably attached to the main source body by a plurality of hinges (27 and 29) .
  • a seal (31) seals the ion source to the mass spectrometer so that the source enclosure (33) is sealed in an air tight manner.
  • the figure also shows outlet port (35) from which air is pumped from the mass spectrometer into the cavity (37) of the ion source (1) .
  • Heat sink (39) is arranged within the air path to cool the air passing through. Table 1 and Figure 4 are results from an experimental test of the performance of the ion source over a range of temperatures .

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

L'invention concerne une source d'ions, un spectromètre de masse et un procédé visant à améliorer l'efficacité d'une source d'ions s'utilisant avec un spectromètre de masse. La source d'ions comporte un boîtier contenant une enveloppe de source d'ions qui délimite une chambre, et une enveloppe extérieure située à distance de la chambre. Un passage d'écoulement de fluide relie l'enveloppe de source d'ions à l'enveloppe extérieure. Le procédé selon l'invention consiste à fournir au boîtier de source d'ions un flux régulé de fluide par les passages de fluide, de manière à maintenir l'enveloppe de source d'ions dans une plage prédéterminée de températures, comprises sensiblement entre 60°C et 80°C, la température s'élevant de préférence à 70°C.
PCT/GB2010/050924 2009-05-29 2010-06-01 Perfectionnements apportés à l'efficacité d'une source d'ions s'utilisant avec un spectromètre de masse WO2010136824A1 (fr)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
US12/474,763 US8084888B2 (en) 2009-05-29 2009-05-29 Method for the production of high amplitude RF voltages with control of the phase angle between outputs
US12/474,548 2009-05-29
US12/474,763 2009-05-29
US12/474,597 US8119981B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,530 2009-05-29
US12/474,562 2009-05-29
US12/474,597 2009-05-29
US12/474,530 US8487239B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,548 US8536522B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,562 US8598512B2 (en) 2009-05-29 2009-05-29 Mass spectrometer and method of mass spectrometry

Publications (1)

Publication Number Publication Date
WO2010136824A1 true WO2010136824A1 (fr) 2010-12-02

Family

ID=42752175

Family Applications (5)

Application Number Title Priority Date Filing Date
PCT/GB2010/050926 WO2010136826A1 (fr) 2009-05-29 2010-06-01 Procédé d'obtention de données améliorées provenant d'un spectromètre de masse
PCT/GB2010/050924 WO2010136824A1 (fr) 2009-05-29 2010-06-01 Perfectionnements apportés à l'efficacité d'une source d'ions s'utilisant avec un spectromètre de masse
PCT/GB2010/050927 WO2010136827A1 (fr) 2009-05-29 2010-06-01 Système de détection de défaillances destiné une source d'ions d'un spectromètre de masse
PCT/GB2010/050925 WO2010136825A1 (fr) 2009-05-29 2010-06-01 Source d'ions détachable et remplaçable pour spectromètre de masse
PCT/GB2010/050928 WO2010136828A2 (fr) 2009-05-29 2010-06-01 Procédé pour la commande de générateurs électriques à verrouillage de phase dans le fonctionnement de spectromètres de masse

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/GB2010/050926 WO2010136826A1 (fr) 2009-05-29 2010-06-01 Procédé d'obtention de données améliorées provenant d'un spectromètre de masse

Family Applications After (3)

Application Number Title Priority Date Filing Date
PCT/GB2010/050927 WO2010136827A1 (fr) 2009-05-29 2010-06-01 Système de détection de défaillances destiné une source d'ions d'un spectromètre de masse
PCT/GB2010/050925 WO2010136825A1 (fr) 2009-05-29 2010-06-01 Source d'ions détachable et remplaçable pour spectromètre de masse
PCT/GB2010/050928 WO2010136828A2 (fr) 2009-05-29 2010-06-01 Procédé pour la commande de générateurs électriques à verrouillage de phase dans le fonctionnement de spectromètres de masse

Country Status (1)

Country Link
WO (5) WO2010136826A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351309A (zh) * 2020-03-11 2020-06-30 合肥美的电冰箱有限公司 制冷设备及其故障检测方法、控制方法和处理装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106206238B (zh) * 2016-08-30 2018-06-05 聚光科技(杭州)股份有限公司 换锥装置及方法
GB202117744D0 (en) * 2021-12-08 2022-01-19 Micromass Ltd A temperature monitoring system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63299042A (ja) * 1987-05-29 1988-12-06 Tokyo Electron Ltd イオン注入装置
US5118938A (en) * 1989-12-20 1992-06-02 Nippon Oil Company, Limited Rydberg atom impact type ion source

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA558420A (fr) * 1954-11-12 1958-06-03 A. Ramey Robert Amplificateur magnetique pour fins de commande
US3046490A (en) 1959-08-13 1962-07-24 Philco Corp Synchronized oscillator control system
JPS54109895A (en) * 1978-02-17 1979-08-28 Hitachi Ltd Ion source
JP2622128B2 (ja) * 1987-10-20 1997-06-18 キヤノン株式会社 振動波モーター装置
JPH0675390B2 (ja) * 1990-11-30 1994-09-21 株式会社島津製作所 質量分析計イオン源装置
US5737203A (en) 1994-10-03 1998-04-07 Delco Electronics Corp. Controlled-K resonating transformer
US5684678A (en) 1995-12-08 1997-11-04 Delco Electronics Corp. Resonant converter with controlled inductor
WO2003087770A2 (fr) * 2002-04-12 2003-10-23 Northeastern University Filtration adaptee mettant en oeuvre une determination de bruit experimental qui permet de proceder a un debruitage, a une selection de crete, et a une quantification dans une analyse lc-ms
GB0624535D0 (en) * 2006-12-08 2007-01-17 Micromass Ltd Mass spectrometer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63299042A (ja) * 1987-05-29 1988-12-06 Tokyo Electron Ltd イオン注入装置
US5118938A (en) * 1989-12-20 1992-06-02 Nippon Oil Company, Limited Rydberg atom impact type ion source

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351309A (zh) * 2020-03-11 2020-06-30 合肥美的电冰箱有限公司 制冷设备及其故障检测方法、控制方法和处理装置

Also Published As

Publication number Publication date
WO2010136826A1 (fr) 2010-12-02
WO2010136825A1 (fr) 2010-12-02
WO2010136828A3 (fr) 2011-04-14
WO2010136827A1 (fr) 2010-12-02
WO2010136828A2 (fr) 2010-12-02

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