WO2010041668A1 - Flux, conductive paste, bonded component, and method for producing bonded component - Google Patents

Flux, conductive paste, bonded component, and method for producing bonded component Download PDF

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Publication number
WO2010041668A1
WO2010041668A1 PCT/JP2009/067430 JP2009067430W WO2010041668A1 WO 2010041668 A1 WO2010041668 A1 WO 2010041668A1 JP 2009067430 W JP2009067430 W JP 2009067430W WO 2010041668 A1 WO2010041668 A1 WO 2010041668A1
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Prior art keywords
flux
conductive paste
substrate
component
aromatic compound
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PCT/JP2009/067430
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French (fr)
Japanese (ja)
Inventor
和雄 河口
秀俊 宮本
毅 渡邉
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Jsr株式会社
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Priority to JP2010532931A priority Critical patent/JPWO2010041668A1/en
Publication of WO2010041668A1 publication Critical patent/WO2010041668A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material

Definitions

  • the present invention relates to a flux used for soldering with an electronic component or the like, a conductive paste containing the same, a bonded component using the same, and a method of manufacturing the bonded component.
  • flux is used in soldering electronic components to a component mounting board.
  • This flux contains an organic acid such as rosin or a halogen compound for the purpose of removing an oxide film on the substrate. If a flux residue remains after soldering using such a solder paste containing flux, there is a problem that the soldered substrate is gradually corroded due to the corrosive action of the flux residue. Therefore, after the soldering is completed, the soldered substrate needs to be cleaned for the purpose of removing the flux residue. For the cleaning, a chlorofluorocarbon solvent is generally used.
  • Patent Document 1 uses a solvent that substantially does not evaporate before soldering and exhibits an activity of thermally decomposing and reducing and removing the oxide film on the soldering surface during soldering.
  • a soldering flux is disclosed.
  • This solvent is a solvent that gradually evaporates after soldering, and a low residue flux is obtained by using this solvent.
  • solder paste the material composition of the paste is generally composed of solder powder, solvent, solid content (rosin, activator, etc.).
  • the conventional non-cleaning flux described in Patent Document 1 has been devised such as reducing the solid content and not containing a halide.
  • the resin component or activator component such as rosin must be used. Residues such as these may be generated.
  • the number of reflow processes can be reduced if the solder paste used is an adhesive paste that does not melt the solder. Soldering can be performed without applying thermal stress. Accordingly, there is a demand for development of a solder paste having an adhesive force without melting the solder.
  • the present invention solves the above-described problems. Specifically, the flux has adhesiveness and does not generate a residue after joining (soldering, etc.), and a conductive paste containing this flux, and using the same It is an object of the present invention to provide a joining component formed by joining constituent members with high joining (soldering, etc.) reliability and a method for manufacturing the joining component.
  • the present invention is as follows. 1. An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring or having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring Containing flux, The flux characterized by the melting point of the aromatic compound under 1 atm being 23 ° C. or higher. 2. The vaporization temperature of the aromatic compound is 100 ° C. or higher under 1 atm. Flux described in 3.
  • An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (1), and In the above 1., the aromatic compound having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (2). Or 2. Flux described in [In the general formulas (1) and (2), R represents an alkyl group, and n represents an integer of 0 to 4. ] 4).
  • An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (3) or the following general formula (4), and In the above 1., the aromatic compound having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (5). Or 2. Flux described in [In the general formulas (3) to (5), R represents an alkyl group, and n represents an integer of 0 to 4. ] 5). The above-mentioned 1. containing two or more kinds of compounds as the aromatic compound. To 4. The flux according to any one of the above. The above 1. which is a solid under an atmosphere of 6.1 atm and 23 ° C. To 5.
  • a conductive paste comprising the flux according to any one of the above and conductive metal particles. 8).
  • the constituent member and the other constituent members are the above-mentioned 7.
  • Joined parts characterized by being joined using the conductive paste described in 1.
  • a method of manufacturing a joined part in which a constituent member and another constituent member are joined A conductive paste application step of applying the conductive paste according to claim 7 to the constituent members; A component mounting process for mounting other components on the applied conductive paste;
  • a method for manufacturing a joined part comprising:
  • the flux of the present invention has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring, or two phenolic hydroxyl groups at two positions of one position number of the aromatic ring.
  • a flux containing an aromatic compound having a melting point, and the melting point of the aromatic compound at 1 atm. Is 23 ° C. or higher. Can be removed.
  • this flux has adhesiveness and can fix components only with a flux. Therefore, even in a joining component (such as an electronic circuit device) that requires a plurality of component mounting processes and reflow processes, positioning between electronic components is performed without melting conductive metal particles (solder, etc.). And can be joined (soldered or the like) with a smaller number of reflows.
  • the flux of the present invention contains the aromatic compound, so that the residue of the flux after joining components such as electronic components to the substrate is suppressed, and it can be made a non-cleaning flux. Further, when the vaporization temperature of the aromatic compound is 100 ° C. or higher under 1 atm, a flux residue can be made more difficult to remain.
  • the conductive paste of the present invention contains the flux of the present invention, whereby flux residue generated after bonding electronic components or the like to the substrate is suppressed, and a cleaning step after bonding can be made unnecessary.
  • the bonded component of the present invention can be bonded with a small number of reflows. Excessive thermal stress on the constituent members is reduced, and a highly reliable joining component can be provided.
  • Flux The flux of the present invention has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring or two positions of position numbers of one jump of the aromatic ring.
  • a flux containing an aromatic compound having two phenolic hydroxyl groups hereinafter simply referred to as “aromatic compound”), wherein the aromatic compound has a melting point of 23 ° C. or more under 1 atm. To do.
  • the aromatic compound has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring, or two phenolic hydroxyl groups at two positions of one position number of the aromatic ring.
  • the flux of the present invention contains this aromatic compound, the oxide film formed on the surface of the metal such as the substrate to be soldered can be reduced and the oxide film can be removed. This improves the so-called solder wettability.
  • the flux of this invention has adhesiveness in addition to having said reducing property by including this aromatic compound. Since it has adhesiveness, components can be bonded to each other only by flux (without using molten solder).
  • the constituent member examples include various substrates such as a component mounting substrate and a chip mounting substrate, and various electronic components such as an electronic circuit module, a flip chip IC, and a semiconductor chip (the same applies hereinafter). Furthermore, since the flux of the present invention contains this aromatic compound, in addition to the reducing property and the adhesive property, it is extremely difficult to remain as a residue after joining, and it is necessary to perform a flux cleaning step that has been conventionally required. Absent.
  • the melting point of the aromatic compound at 1 atm is 23 ° C. or higher. Usually, this melting point is 250 ° C. or lower. When the melting point of the aromatic compound is 23 ° C. or higher, good adhesion can be maintained even at room temperature.
  • the melting point at 1 atm is preferably 25 to 230 ° C., more preferably 100 to 200 ° C., and still more preferably 120 to 200 ° C.
  • Examples of the position number in the case of having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring in the aromatic compound include 1st position, 2nd position, 2nd position, 3rd position and 3rd position. And 4th position.
  • the position number when there are two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring in the aromatic compound for example, the 1st position, the 3rd position, the 2nd position and 4th position Rank.
  • the structure is not specifically limited.
  • the skeleton of the aromatic compound include benzene, naphthalene, acenaphthene, and the like. Of these skeletons, benzene and naphthalene are preferred.
  • compounds represented by the following general formulas (1) to (5) are more preferable. [In the general formulas (1) to (5), R represents an alkyl group, and n represents an integer of 0 to 4. ]
  • the number of carbon atoms of the alkyl group in R in the general formulas (1) to (5) is preferably 1 to 10, more preferably 1 to 8, and still more preferably 1 to 5.
  • the structure of this alkyl group is not particularly limited, and may be linear or have a side chain (branched).
  • alkyl group examples include a methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, i-butyl group, sec-butyl group, t-butyl group, pentyl group, isopentyl group, Neopentyl group, hexyl group, heptyl group, octyl group, 2-ethylhexyl group and the like can be mentioned.
  • n is preferably 0 to 2, more preferably 0 or 1.
  • each R may be the same or different.
  • the compound of the formula (1) is preferably a compound of the following formula (6) in which n is 0 or 1, and the compound of the formula (2) is in the following of n of 0 or 1
  • a compound of formula (7) is preferred.
  • R represents a hydrogen atom or an alkyl group.
  • the compound of the formula (3) is a compound of the following formula (8) in which n is 0 or 1, and the R is bonded to a benzene ring having no phenolic hydroxyl group.
  • the compound of the formula (4) is a compound of the following formula (9) in which n is 0 or 1, and the R is bonded to a benzene ring having no phenolic hydroxyl group.
  • the compound of the formula (5) is a compound of the following formula (10) in which n is 0 or 1 and the R is bonded to a benzene ring having no phenolic hydroxyl group.
  • R represents a hydrogen atom or an alkyl group.
  • aromatic compounds include resorcinol, 4-methylcatechol, 4-t-butylcatechol, 3-methylcatechol, 5-methylresorcinol, 5-t-butylresorcinol, 1,2 -Dihydroxynaphthalene, 1,3-dihydroxynaphthalene, 2,3-dihydroxynaphthalene and the like. These may use only 1 type and may use 2 or more types together. Of these aromatic compounds, 4-methylcatechol and 4-t-butylcatechol are preferred. These are preferable because of their strong ability to reduce to metal oxides compared to other aromatic compounds.
  • the blending ratio when used in combination is not particularly limited, but when the total of 4-methylcatechol and 4-t-butylcatechol is 100 mol%, the ratio of 4-methylcatechol is 30 to 80 mol%. It is preferable to do. In this range, a particularly excellent reducing effect can be obtained.
  • the range is more preferably 40 to 70 mol%, and particularly preferably 50 to 60 mol%.
  • the vaporization temperature of the aromatic compound is preferably 100 ° C. or higher under 1 atm.
  • the vaporization temperature under 1 atm is usually 400 ° C. or lower, more preferably 150 ° C. or higher, and further preferably 200 ° C. or higher.
  • the vaporization temperature under 1 atm is a temperature at which a decrease in weight is observed when the temperature is raised under the condition of 1 atm. This vaporization temperature is measured by the following method. That is, using a differential thermal balance (TG / DTA), the temperature inside the system was raised under nitrogen, and the temperature at which weight loss due to flux vaporization (usually 5 mass% or more of the entire sample) was first observed was The vaporization temperature.
  • the amount of the aromatic compound contained in the flux of the present invention is not particularly limited and may be contained as a part of the flux or may constitute the entire amount of the flux. That is, for example, when the total flux is 100% by mass, the aromatic compound can be contained in an amount of 70 to 100% by mass. If content of the said aromatic compound is this range, it can be set as the flux excellent in reducibility and low residue property.
  • the content is preferably 80 to 100% by mass, more preferably 90 to 100% by mass, and particularly preferably 95 to 100% by mass.
  • the flux of the present invention can contain other components in addition to the aromatic compound as long as the object of the present invention is achieved.
  • other components include solvents, activators, and thixotropic agents. These may use only 1 type and may use 2 or more types together.
  • Examples of the solvent include alcohols, esters, ethers and hydrocarbons.
  • Examples of the solvent include monohydric alcohols such as isopropanol and butanol; dihydric alcohols such as ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, tripropylene glycol, butanediol, pentanediol, and hexanediol.
  • Ethylene glycol monoalkyl ether acetates such as ethylene glycol monomethyl ether acetate and ethylene glycol monoethyl ether acetate; propylene glycol monoalkyl ethers such as propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether and propylene glycol monobutyl ether Alkyl ethers; propylene glycol di Propylene glycol dialkyl ethers such as chill ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, propylene glycol dibutyl ether; propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate Propylene glycol monoalkyl ether acetates such as; cellosolves such as
  • Ketones such as N-dimethylformamide, N-methylacetamide, N, N-dimethylacetamide, N-methylpyrrolidone; and lactones such as ⁇ -butyrolactone. These may use only 1 type and may use 2 or more types together.
  • the flux of the present invention can contain a solvent.
  • the amount of the solvent is not particularly limited, but when the total amount of aromatic compounds is 100 parts by mass, 0.1 to 100,000 parts by mass can be used, preferably 1 to 10,000 parts by mass, and more preferably Is 10 to 1000 parts by mass.
  • the viscosity of the flux can be adjusted by the content of the solvent. That is, an appropriate viscosity can be selected according to the flux application method, and the viscosity can be adjusted by the amount of solvent in the above range.
  • Examples of the activator include amine salts of hydrochloric acid and hydrobromic acid, and carboxylic acids and amine salts thereof.
  • Examples of the activator include primary amines such as methylamine, ethylamine, n-propylamine, isopropylamine, n-butylamine; dimethylamine, diethylamine, di-n-propylamine, diisopropylamine, di-n Secondary amines such as butylamine; Tertiary amines such as trimethylamine, triethylamine, tri-n-propylamine and triisopropylamine; Hydrogen chlorides such as alkanolamines such as monoethanolamine, diethanolamine and triethanolamine Acid salts and hydrobromides, as well as oxalic acid, malonic acid, succinic acid, adipic acid, glutaric acid, diethyl glutaric acid, pimelic acid, azelaic acid, sebacic acid, maleic acid,
  • thixotropic property-imparting agent examples include polyolefin waxes such as castor wax (hardened castor oil); fatty acid amides such as m-xylylene bis stearamide; substituted urea waxes such as N-butyl-N′-stearyl urea; Examples thereof include polymer compounds such as polyethylene glycol, polyethylene oxide, methyl cellulose, ethyl cellulose, and hydroxyethyl cellulose; inorganic particles such as silica particles and kaolin particles. These may use only 1 type and may use 2 or more types together.
  • polyolefin waxes such as castor wax (hardened castor oil); fatty acid amides such as m-xylylene bis stearamide; substituted urea waxes such as N-butyl-N′-stearyl urea
  • polymer compounds such as polyethylene glycol, polyethylene oxide, methyl cellulose, ethyl cellulose, and hydroxyethy
  • a thixotropic agent can be contained.
  • the amount of the thixotropy-imparting agent is not particularly limited. When the total amount of aromatic compounds is 100 parts by mass, 0.1 to 30 parts by mass can be used, preferably 0.1 to 20 parts by mass. More preferably, it is 0.1 to 10 parts by mass.
  • the adhesive force between the constituent members can be adjusted by the content of the thixotropic agent.
  • the properties of the flux of the present invention are not particularly limited, that is, for example, it may be a solid or a liquid (including a paste, the same shall apply hereinafter).
  • the solid means a state in which it does not flow in an atmosphere of 1 atm and 23 ° C. regardless of whether or not an external force is applied.
  • the liquid means a state in which it flows without applying an external force in an atmosphere of 1 atm and 23 ° C.
  • the viscosity at 1 atmosphere and a temperature of 23 ° C. can be 0.001 to 1000 Pa ⁇ S. This viscosity can be further set to 0.01 to 800 Pa ⁇ S, and can be set to 0.1 to 700 Pa ⁇ S.
  • the flux of the present invention may be in any of the above states, and can be appropriately selected depending on the usage situation.
  • the solid flux can be used after being cut into pieces and placed on a target site.
  • the liquid flux can be attached to the target site by screen printing or the like, and can be further attached to the target site by coating.
  • the flux of this invention can exhibit adhesiveness as mentioned above by containing the said aromatic compound.
  • This adhesion usually occurs when this flux is interposed between metals, but with a liquid flux, the adhesion tends to be exhibited in a shorter time.
  • the solid flux tends to have a longer time until sufficient adhesiveness is obtained compared to the liquid flux. For this reason, when using a solid-state flux, it is preferable to heat.
  • the heating temperature is preferably not higher than the vaporization temperature, and particularly preferably 20 to 100 ° C. lower than the vaporization temperature and 10 to 50 ° C. higher than the melting point.
  • Conductive paste The conductive paste of the present invention contains the flux in the present invention and conductive metal particles.
  • the flux of the present invention described above can be applied as it is.
  • the amount of the flux contained in the conductive paste of the present invention is not particularly limited, but the content of the flux is preferably 0.1 to 30% by mass when the conductive paste is 100% by mass. More preferably, the content is 1 to 20% by mass, and still more preferably 5 to 10% by mass. When the content of the flux is in the above range, a conductive paste having excellent substrate wettability can be obtained.
  • the conductive metal particles are not particularly limited as long as they are conductive metal particles used for bonding between metals, or fixing each member (electronic component, etc.) to a substrate in an electronic circuit or the like.
  • a solder powder, a metal powder made of gold, silver, copper, aluminum, an alloy containing these metals, or the like can be used. Among these, solder powder is preferable when used for joining metals at low temperatures.
  • solder powder examples include Sn—Pb, Sn—Pb—Ag, Sn—Pb—Bi, Sn—Pb—In, Sn—Pb—Sb, etc., as well as lead-free Sn—Sb alloys, Sn -Bi alloy, Sn-Ag alloy, Sn-Zn alloy (Ag, Cu, Bi, In, Ni, P, etc. may be added) and the like. These may use only 1 type and may use 2 or more types together.
  • the shape of the conductive metal particles may be either spherical or irregular.
  • the particle diameter of the conductive metal particles may be a normal one. In the case of a spherical shape, the diameter is preferably 5 to 200 ⁇ m, more preferably 5 to 100 ⁇ m, and further preferably 5 to 50 ⁇ m.
  • the content of the conductive metal particles is preferably 70 to 99.9% by mass, more preferably 80 to 99% by mass, and still more preferably when the entire conductive paste is 100% by mass. 90 to 95% by mass.
  • the content of the conductive metal particles is in the above range, a conductive paste having excellent substrate wettability can be obtained.
  • Examples of the method for producing the conductive paste of the present invention include a method of kneading the flux, the solder powder, and an additive added as necessary by a conventional method.
  • Examples of the kneading machine include a vacuum stirring device, a kneading device, and a planetary mixer.
  • the temperature and conditions at the time of blending are not particularly limited, but kneading at 5 to 25 ° C. is usually preferable.
  • constituent members and other constituent members are not particularly limited as long as they are members bonded by bonding.
  • the members include various substrates such as a component mounting substrate and a chip mounting substrate, and various electronic components such as an electronic circuit module, a flip chip IC, and a semiconductor chip.
  • the constituent members are joined together via a conductive metal derived from the conductive paste of the present invention.
  • a conductive metal derived from the conductive paste of the present invention for example, a surface mounting type electronic substrate (hereinafter referred to as “mounting body”) shown in FIG.
  • This mounting body will be described below as an example.
  • external electrodes 5a and 5b of a multilayer ceramic capacitor 4 are provided on component connection conductors (hereinafter referred to as “lands”) 2a and 2b of a substrate 1 for component mounting. These are bonded via conductive bonding materials (solder or the like) 23a, 23b derived from the conductive paste of the present invention.
  • the manufacturing method of the said joining component (joining method at the time of using the electrically conductive paste of this invention) will not be specifically limited if it is a manufacturing method to which the said structural member is joined using the electrically conductive paste of this invention.
  • a normal manufacturing method including a conductive paste application process and a component mounting process in this order can be given. That is, the method for manufacturing a bonded part of the present invention is a method for manufacturing a bonded part in which a component member and another component member are bonded, and the conductive paste application for applying the conductive paste of the present invention to the component member. And a component mounting step of mounting other constituent members on the applied conductive paste.
  • the method for manufacturing a joined component of the present invention usually further includes a reflow step after the component mounting step. Moreover, as a preferable manufacturing method, a manufacturing method including a preheating step between the component mounting step and the reflow step can be cited.
  • a method for manufacturing a joined part in which a constituent member and another constituent member are joined the conductive paste applying step of applying the conductive paste of the present invention to the constituent member, and the applied conductive paste
  • a component mounting step for mounting other constituent members and a preheating step for preheating the constituent members mounted with the other constituent members without melting the conductive metal particles.
  • particles for example, solder powder
  • a reflow step of melting the conductive metal particles contained in the conductive paste can be provided as necessary.
  • Conductive paste application process Conducted on the lands 2a and 2b on the substrate 1 (component) having the component connecting conductors (hereinafter referred to as “lands”) 2a and 2b shown in FIG.
  • Printing paste 3a, 3b is printed or applied [see FIG. 2 (b)].
  • Component mounting step After the step (1), the electronic component 4 (other components) including the external electrodes 5a and 5b is mounted on the conductive pastes 3a and 3b [FIG. )reference ⁇ .
  • Preheating step After the step (2), the conductive pastes 3a and 3b are printed or applied on the substrate 1 (component), and the electronic component 4 (other component) is mounted.
  • the conductive pastes 13a and 13b become viscous and exhibit more adhesive force (see FIG. 2D).
  • the substrate 1 and the electronic component 4 are bonded by the conductive pastes 13a and 13b having the adhesive force, and the electronic component 4 is held on the conductive pastes 13a and 13b.
  • a conductive paste is newly apply
  • the conductive pastes 13a and 13b have adhesive strength, positioning between components mounted on the substrate 1 can be easily performed without melting the conductive metal particles.
  • Reflow step in the case where the conductive metal particles are meltable particles, the conductive particles contained in the conductive pastes 13a and 13b are heated by passing through a reflow furnace or the like after the preliminary heating. Are melted and bonded. In other words, the constituent member and the other constituent member are joined by the conductive metal.
  • the heating temperature in the preheating step can be appropriately selected depending on the type of conductive metal particles, but is preferably 80 to 200 ° C, more preferably 100 to 180 ° C.
  • the conductive paste exhibits an adhesive force, and can bond the substrate and the electronic component.
  • the preheating step can be performed by a normal reflow furnace or the like.
  • the heating temperature in the reflow step can be appropriately selected depending on the type of conductive metal particles, but is preferably 200 to 350 ° C., more preferably 250 to 300 ° C.
  • the heating temperature in this reflow step is within the above range, the flux and the like contained in the conductive paste are volatilized and the flux residue hardly remains.
  • the conductive metal particles contained in the conductive paste can be melted to join the substrate and the electronic component.
  • the substrate and the electronic component can be bonded without melting the conductive metal particles, and the number of reflows related to the manufacture of the bonded component can be reduced. it can. That is, for example, when a module board (other constituent member) to which an electronic component is joined (soldered or the like) is joined to a mother circuit board (constituent member), the electronic component is first joined to the module substrate. It is necessary to join the joined module board (other constituent member) to the mother circuit board (constituent member). In this case, the module substrate bonded to the mother circuit board is passed through the reflow furnace again when being bonded to the mother circuit board, and the module substrate is reflowed for the second time.
  • this method for manufacturing a joined part is a method for producing a joined part in which a constituent member and another constituent member are joined using the conductive paste of the present invention, and the first constituent member is electrically conductive.
  • Conductive first paste applying step of applying paste, first component mounting step of mounting a second component on the applied conductive paste, and first of mounting the second component A first preheating step of preheating the component member without melting the conductive metal particles to bond the second component member and the first component member; and conducting to the third component member
  • a third configuration in which the first component is mounted A second preheating step of preheating the material without melting the conductive metal particles to bond the first component and the third component; and, if necessary, a conductive metal
  • a reflow step of melting the conductive metal particles contained in the conductive paste can be provided.
  • Excessive thermal stress on a joining component such as an electronic substrate may cause melting of conductive metal particles joined to the substrate, cracking of the substrate or joint due to thermal expansion, or the like. Melting or cracking of the conductive metal particles may cause problems such as short-circuit failure and reduction in bonding strength between the substrate and the electronic component. Therefore, when the conductive paste of the present invention is used, bonding can be performed without applying excessive thermal stress, and a highly reliable bonded component can be provided.
  • the joined part of the present invention is joined using the conductive paste of the present invention, the flux residue is hardly left after joining, and it is not necessary to clean the joined part after joining. Furthermore, since excessive thermal stress can be reduced in the joining, a joining component with high joining reliability can be obtained.
  • the two oxide film substrates after adhesion were cooled to room temperature, and whether or not the oxide film (copper oxide) substrate was firmly adhered was visually evaluated. The case where it was firmly bonded was evaluated as “ ⁇ ”, and the case where it was not firmly bonded was evaluated as “x”.
  • the flux composition of the present invention is not only excellent in reducing ability to metal oxides, but also excellent in substrate adhesion and does not generate any residue that adversely affects wiring insulation. It has excellent characteristics not found in the flux composition.

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  • Mechanical Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

Disclosed is a flux which is capable of bonding a substrate and an electronic component or the like and does not leave residues after bonding (such as soldering).  Also disclosed are a conductive paste containing the flux, a bonded component formed by bonding constituent members using the conductive paste and having high bonding reliability, and a method for producing the bonded component.  The flux contains an aromatic compound which has two phenolic hydroxy groups in two positions of each aromatic ring, said two positions being next to each other or having one position therebetween.  The aromatic compound has a melting point not less than 23˚C at 1 atm.

Description

フラックス、導電性ペースト、接合部品及び接合部品の製造方法Flux, conductive paste, bonded component and method for manufacturing bonded component
 本願発明は、電子部品等とのはんだ付け等に利用されるフラックス、及びそれを含有する導電性ペースト、それを用いた接合部品並びに接合部品の製造方法に関する。 The present invention relates to a flux used for soldering with an electronic component or the like, a conductive paste containing the same, a bonded component using the same, and a method of manufacturing the bonded component.
 従来、部品搭載基板に対する電子部品のはんだ付けにおいては、フラックスが使用されている。このフラックスには、基板上の酸化膜を除去する目的等で、ロジン等の有機酸やハロゲン化合物等が含有されている。このようなフラックスを含有するはんだペーストを用いてはんだ付けした後に、フラックスの残渣が残ると、そのフラックス残渣が有する腐食作用により、はんだ付けされた基板が徐々に腐食される等の問題がある。そこで、はんだ付け終了後に、はんだ付けされた基板は、フラックス残渣を除去する目的で、洗浄されることが必要となる。その洗浄には、一般にフロン溶剤が使用される。ところが近年、環境汚染の観点から、脱フロン化が進められており、水で洗浄を行う水系洗浄や、はんだ付け後に洗浄を要しない固形分の少ない低残渣の無洗浄フラックスが使用されている。
 しかしながら、水系洗浄の場合、洗浄に水を使用することから、洗浄に用いた水が、重金属に汚染される問題がある。また、今後さらに微細化された接続ピッチ構造を持つ半導体素子に対して、水系洗浄では洗浄性が悪いという問題があることから、洗浄を必要としない低残渣の無洗浄フラックスが多く用いられている。
Conventionally, flux is used in soldering electronic components to a component mounting board. This flux contains an organic acid such as rosin or a halogen compound for the purpose of removing an oxide film on the substrate. If a flux residue remains after soldering using such a solder paste containing flux, there is a problem that the soldered substrate is gradually corroded due to the corrosive action of the flux residue. Therefore, after the soldering is completed, the soldered substrate needs to be cleaned for the purpose of removing the flux residue. For the cleaning, a chlorofluorocarbon solvent is generally used. However, in recent years, from the viewpoint of environmental pollution, chlorofluorocarbons have been promoted, and water-based cleaning in which water is used for cleaning, and low-residue non-cleaning fluxes with low solid content that do not require cleaning after soldering are used.
However, in the case of water-based cleaning, since water is used for cleaning, there is a problem that the water used for cleaning is contaminated with heavy metals. In addition, for semiconductor elements having a connection pitch structure that has been further miniaturized in the future, there is a problem that water-based cleaning has poor cleaning properties, and therefore, a low-residue non-cleaning flux that does not require cleaning is often used. .
 また、リフロー工程が複数必要とされる電子回路装置の製造に使用されるフラックスにおいては、複数のリフロー後であっても、はんだによる接合強度が低下することなく、その接合強度が維持される必要がある。 In addition, in fluxes used in the manufacture of electronic circuit devices that require a plurality of reflow processes, the bonding strength must be maintained without lowering the bonding strength due to solder even after a plurality of reflows. There is.
 低残渣のフラックスとして、特許文献1には、はんだ付け前には実質的にほとんど蒸発せず、はんだ付け時に、熱分解してはんだ付け面の酸化皮膜を還元除去する活性を示す溶剤を用いたはんだ付け用フラックスが開示されている。この溶剤は、はんだ付け後に徐々に揮発するような溶剤であり、この溶剤を用いることにより低残渣のフラックスとしている。 As a low-residue flux, Patent Document 1 uses a solvent that substantially does not evaporate before soldering and exhibits an activity of thermally decomposing and reducing and removing the oxide film on the soldering surface during soldering. A soldering flux is disclosed. This solvent is a solvent that gradually evaporates after soldering, and a low residue flux is obtained by using this solvent.
特開平8-112692号公報Japanese Patent Laid-Open No. 8-112692
 はんだペーストにおいては、ペーストの材料構成が、はんだ粉、溶剤、固形分(ロジン、活性剤等)から成るのが一般的である。特許文献1に記載されている従来の無洗浄型フラックスは、固形分を減らし、ハロゲン化物を含有させない等の工夫は成されているが、はんだ付後、必ずロジン等の樹脂成分或いは活性剤成分等の残渣が発生する恐れがある。 In solder paste, the material composition of the paste is generally composed of solder powder, solvent, solid content (rosin, activator, etc.). The conventional non-cleaning flux described in Patent Document 1 has been devised such as reducing the solid content and not containing a halide. However, after soldering, the resin component or activator component such as rosin must be used. Residues such as these may be generated.
 また、リフロー工程が複数必要とされる電子回路装置を製造する場合、使用されるはんだペーストが、はんだを溶融させなくとも接着性を有するはんだペーストであれば、リフロー工程の回数を低減でき、過度の熱ストレスを与えることなく、はんだ付けを行うことができる。従って、はんだを溶融させなくとも接着力を有するはんだペーストの開発が求められている。 Moreover, when manufacturing an electronic circuit device that requires a plurality of reflow processes, the number of reflow processes can be reduced if the solder paste used is an adhesive paste that does not melt the solder. Soldering can be performed without applying thermal stress. Accordingly, there is a demand for development of a solder paste having an adhesive force without melting the solder.
 本願発明は、前記課題を解決するものであり、具体的には、接着性を有し、接合(はんだ付け等)後に残渣の発生しないフラックス、及びこのフラックスを含有する導電性ペースト、それを用いて構成部材を接合することにより形成された、接合(はんだ付け等)信頼性の高い接合部品、並びに接合部品の製造方法を提供することを目的とする。 The present invention solves the above-described problems. Specifically, the flux has adhesiveness and does not generate a residue after joining (soldering, etc.), and a conductive paste containing this flux, and using the same It is an object of the present invention to provide a joining component formed by joining constituent members with high joining (soldering, etc.) reliability and a method for manufacturing the joining component.
 本発明は、以下の通りである。
 1.芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する、又は芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物を含有するフラックスであって、
 上記芳香族化合物の1気圧下における融点が、23℃以上であることを特徴とするフラックス。
 2.前記芳香族化合物の気化温度が、1気圧下で、100℃以上である上記1.に記載のフラックス。
 3.前記芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(1)で表される化合物であり、且つ、
 前記芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(2)で表される化合物である上記1.又は2.に記載のフラックス。
Figure JPOXMLDOC01-appb-C000006
Figure JPOXMLDOC01-appb-C000007
〔前記一般式(1)及び(2)において、Rはアルキル基を表し、nは0~4の整数を表す。〕
 4.前記芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(3)又は下記一般式(4)で表される化合物であり、且つ、
 前記芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(5)で表される化合物である上記1.又は2.に記載のフラックス。
Figure JPOXMLDOC01-appb-C000008
Figure JPOXMLDOC01-appb-C000009
Figure JPOXMLDOC01-appb-C000010
〔前記一般式(3)~(5)において、Rはアルキル基を表し、nは0~4の整数を表す。〕
 5.前記芳香族化合物として、2種類以上の化合物を含有する上記1.乃至4.のいずれかに記載のフラックス。
 6.1気圧、23℃の雰囲気下で、固体である上記1.乃至5.のいずれかに記載のフラックス。
 7.上記1.乃至6.のいずれかに記載のフラックスと、導電性金属粒子と、を含有することを特徴とする導電性ペースト。
 8.構成部材と他の構成部材とが、上記7.に記載の導電性ペーストを用いて接合されていることを特徴とする接合部品。
 9.構成部材と他の構成部材とが接合された接合部品を製造する方法であって、
 構成部材に請求項7に記載の導電性ペーストを塗布する導電性ペースト塗布工程と、
 塗布された導電性ペースト上に、他の構成部材を搭載する部品搭載工程と、
 を備えることを特徴とする接合部品の製造方法。
The present invention is as follows.
1. An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring or having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring Containing flux,
The flux characterized by the melting point of the aromatic compound under 1 atm being 23 ° C. or higher.
2. The vaporization temperature of the aromatic compound is 100 ° C. or higher under 1 atm. Flux described in
3. An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (1), and
In the above 1., the aromatic compound having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (2). Or 2. Flux described in
Figure JPOXMLDOC01-appb-C000006
Figure JPOXMLDOC01-appb-C000007
[In the general formulas (1) and (2), R represents an alkyl group, and n represents an integer of 0 to 4. ]
4). An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (3) or the following general formula (4), and
In the above 1., the aromatic compound having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (5). Or 2. Flux described in
Figure JPOXMLDOC01-appb-C000008
Figure JPOXMLDOC01-appb-C000009
Figure JPOXMLDOC01-appb-C000010
[In the general formulas (3) to (5), R represents an alkyl group, and n represents an integer of 0 to 4. ]
5). The above-mentioned 1. containing two or more kinds of compounds as the aromatic compound. To 4. The flux according to any one of the above.
The above 1. which is a solid under an atmosphere of 6.1 atm and 23 ° C. To 5. The flux according to any one of the above.
7). Above 1. To 6. A conductive paste comprising the flux according to any one of the above and conductive metal particles.
8). The constituent member and the other constituent members are the above-mentioned 7. Joined parts characterized by being joined using the conductive paste described in 1.
9. A method of manufacturing a joined part in which a constituent member and another constituent member are joined,
A conductive paste application step of applying the conductive paste according to claim 7 to the constituent members;
A component mounting process for mounting other components on the applied conductive paste;
A method for manufacturing a joined part, comprising:
 本発明のフラックスは、芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する、又は芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物を含有するフラックスであって、上記芳香族化合物の1気圧下における融点が、23℃以上であることにより、このフラックスは、還元性を有し、基板等に発生した酸化被膜を除去することができる。また、このフラックスは、接着性を有し、フラックスのみによって部品同士を固定することができる。従って、部品搭載工程及びリフロー工程が複数必要とされる接合部品(電子回路装置等)においても、導電性金属粒子(はんだ等)の溶融を行うことなく電子部品等の部品間の位置決め等を行うことができ、より少ないリフロー回数で接合(はんだ付け等)をすることができる。更に、本発明のフラックスは、前記芳香族化合物を含有することにより、基板に電子部品等の部品を接合した後のフラックスの残渣が抑制され、無洗浄フラックスとすることができる。
 また、前記芳香族化合物の気化温度が、1気圧下で、100℃以上である場合には、よりフラックス残渣が、残存され難いフラックスとすることができる。
 また、本発明の導電性ペーストは、本発明のフラックスを含有することにより、基板に電子部品等を接合した後に生じるフラックス残渣が抑制され、接合後の洗浄工程を不要とすることができる。
 また、本発明の接合部品は、構成部材と他の構成部材とが、本発明の導電性ペーストを用いて接合されていることにより、少ないリフロー回数での接合ができるため、構成部材及び他の構成部材に対する過度の熱ストレスが軽減され、信頼性の高い接合部品を提供することができる。
The flux of the present invention has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring, or two phenolic hydroxyl groups at two positions of one position number of the aromatic ring. A flux containing an aromatic compound having a melting point, and the melting point of the aromatic compound at 1 atm. Is 23 ° C. or higher. Can be removed. Moreover, this flux has adhesiveness and can fix components only with a flux. Therefore, even in a joining component (such as an electronic circuit device) that requires a plurality of component mounting processes and reflow processes, positioning between electronic components is performed without melting conductive metal particles (solder, etc.). And can be joined (soldered or the like) with a smaller number of reflows. Furthermore, the flux of the present invention contains the aromatic compound, so that the residue of the flux after joining components such as electronic components to the substrate is suppressed, and it can be made a non-cleaning flux.
Further, when the vaporization temperature of the aromatic compound is 100 ° C. or higher under 1 atm, a flux residue can be made more difficult to remain.
In addition, the conductive paste of the present invention contains the flux of the present invention, whereby flux residue generated after bonding electronic components or the like to the substrate is suppressed, and a cleaning step after bonding can be made unnecessary.
In addition, since the component parts and the other component members are bonded using the conductive paste of the present invention, the bonded component of the present invention can be bonded with a small number of reflows. Excessive thermal stress on the constituent members is reduced, and a highly reliable joining component can be provided.
本発明に係る接合部品の部分断面図である。It is a fragmentary sectional view of the joined component concerning the present invention. 本発明に係るフラックスを含有する導電性ペーストを用いた接合部品の製造方法を示す部分断面図である。It is a fragmentary sectional view which shows the manufacturing method of the joining components using the electrically conductive paste containing the flux which concerns on this invention.
 1;基板、2a,2b;ランド、3a,3b,13a,13b;導電性ペースト、4;電子部品、5a,5b;外部電極、23a,23b;導電性接合材(はんだ等)。 1; substrate, 2a, 2b; land, 3a, 3b, 13a, 13b; conductive paste, 4; electronic component, 5a, 5b; external electrodes, 23a, 23b; conductive bonding material (solder, etc.).
[1]フラックス
 本発明のフラックスは、芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する、又は芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物(以下、単に「芳香族化合物」という。)を含有するフラックスであって、上記芳香族化合物の1気圧下における融点が、23℃以上であることを特徴とする。
[1] Flux The flux of the present invention has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring or two positions of position numbers of one jump of the aromatic ring. A flux containing an aromatic compound having two phenolic hydroxyl groups (hereinafter simply referred to as “aromatic compound”), wherein the aromatic compound has a melting point of 23 ° C. or more under 1 atm. To do.
 前記芳香族化合物は、芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する、又は芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する。本発明のフラックスはこの芳香族化合物を含有することにより、このはんだ付けされる基板等の金属表面に形成された酸化被膜を還元し、酸化被膜を除去することができる。そして、これにより、所謂はんだの濡れ性が向上される。
 また、本発明のフラックスはこの芳香族化合物を含むことにより、前記還元性を有することに加えて、接着性を有する。接着性を有するため、フラックスのみにより(溶融はんだを利用しなくとも)構成部材同士を接着することができる。
 尚、前記構成部材としては、例えば、部品搭載基板、チップ搭載基板等の各種基板、電子回路モジュール、フリップチップIC、半導体チップ等の各種電子部品等が挙げられる(以下、同様)。
 更に、本発明のフラックスは、この芳香族化合物を含むことにより、前記還元性及び前記接着性に加えて、接合後に残渣として極めて残存され難く、従来必要であったフラックスの洗浄工程を行う必要がない。
The aromatic compound has two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring, or two phenolic hydroxyl groups at two positions of one position number of the aromatic ring. Have When the flux of the present invention contains this aromatic compound, the oxide film formed on the surface of the metal such as the substrate to be soldered can be reduced and the oxide film can be removed. This improves the so-called solder wettability.
Moreover, the flux of this invention has adhesiveness in addition to having said reducing property by including this aromatic compound. Since it has adhesiveness, components can be bonded to each other only by flux (without using molten solder).
Examples of the constituent member include various substrates such as a component mounting substrate and a chip mounting substrate, and various electronic components such as an electronic circuit module, a flip chip IC, and a semiconductor chip (the same applies hereinafter).
Furthermore, since the flux of the present invention contains this aromatic compound, in addition to the reducing property and the adhesive property, it is extremely difficult to remain as a residue after joining, and it is necessary to perform a flux cleaning step that has been conventionally required. Absent.
 前記芳香族化合物の1気圧下における融点は23℃以上である。通常、この融点は250℃以下である。芳香族化合物の融点が23℃以上であることにより、室温でも良好な密着力を保持することができる。この1気圧における融点は25~230℃であることが好ましく、100~200℃であることがより好ましく、120~200℃であることが更に好ましい。 The melting point of the aromatic compound at 1 atm is 23 ° C. or higher. Usually, this melting point is 250 ° C. or lower. When the melting point of the aromatic compound is 23 ° C. or higher, good adhesion can be maintained even at room temperature. The melting point at 1 atm is preferably 25 to 230 ° C., more preferably 100 to 200 ° C., and still more preferably 120 to 200 ° C.
 前記芳香族化合物における芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する場合のその位置番号としては、例えば、1位及び2位、2位及び3位、3位及び4位等が挙げられる。
 また、上記芳香族化合物における芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する場合のその位置番号としては、例えば、1位及び3位、2位及び4位等が挙げられる。
Examples of the position number in the case of having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring in the aromatic compound include 1st position, 2nd position, 2nd position, 3rd position and 3rd position. And 4th position.
Moreover, as the position number when there are two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring in the aromatic compound, for example, the 1st position, the 3rd position, the 2nd position and 4th position Rank.
 前記芳香族化合物は、前記特性を有する限り、その構造は特に限定されない。前記芳香族化合物の骨格としては、例えば、ベンゼン、ナフタレン及びアセナフテン等が挙げられる。これらの骨格のうち、ベンゼン及びナフタレンが好ましい。とりわけ、下記一般式(1)~(5)で表される化合物であることが更に好ましい。
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000013
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000015
〔前記一般式(1)~(5)において、Rはアルキル基を表し、nは0~4の整数を表す。〕
As long as the said aromatic compound has the said characteristic, the structure is not specifically limited. Examples of the skeleton of the aromatic compound include benzene, naphthalene, acenaphthene, and the like. Of these skeletons, benzene and naphthalene are preferred. In particular, compounds represented by the following general formulas (1) to (5) are more preferable.
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000013
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000015
[In the general formulas (1) to (5), R represents an alkyl group, and n represents an integer of 0 to 4. ]
 前記一般式(1)~(5)のRにおけるアルキル基の炭素数としては1~10が好ましく、より好ましくは1~8、更に好ましくは1~5である。このアルキル基の構造には特に限定はなく、直鎖状でもよく、側鎖(分枝状)を有していてもよい。このアルキル基としては、例えば、メチル基、エチル基、n-プロピル基、i-プロピル基、n-ブチル基、i-ブチル基、sec-ブチル基、t-ブチル基、ペンチル基、イソペンチル基、ネオペンチル基、ヘキシル基、ヘプチル基、オクチル基、及び2-エチルヘキシル基等が挙げられる。
 また、前記一般式(1)~(5)におけるnは、0~2が好ましく、0又は1がより好ましい。前記一般式(1)~(5)におけるnがn≧2の場合には、各Rは同じであってもよく異なっていてもよい。
The number of carbon atoms of the alkyl group in R in the general formulas (1) to (5) is preferably 1 to 10, more preferably 1 to 8, and still more preferably 1 to 5. The structure of this alkyl group is not particularly limited, and may be linear or have a side chain (branched). Examples of the alkyl group include a methyl group, ethyl group, n-propyl group, i-propyl group, n-butyl group, i-butyl group, sec-butyl group, t-butyl group, pentyl group, isopentyl group, Neopentyl group, hexyl group, heptyl group, octyl group, 2-ethylhexyl group and the like can be mentioned.
In the general formulas (1) to (5), n is preferably 0 to 2, more preferably 0 or 1. When n in the general formulas (1) to (5) is n ≧ 2, each R may be the same or different.
 即ち、好ましい化合物として、前記式(1)の化合物はnが0又は1である下記式(6)の化合物であることが好ましく、前記式(2)の化合物はnが0又は1である下記式(7)の化合物であることが好ましい。
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
〔前記一般式(6)~(7)において、Rは水素原子又はアルキル基を表す。〕
That is, as a preferable compound, the compound of the formula (1) is preferably a compound of the following formula (6) in which n is 0 or 1, and the compound of the formula (2) is in the following of n of 0 or 1 A compound of formula (7) is preferred.
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
[In the general formulas (6) to (7), R represents a hydrogen atom or an alkyl group. ]
 更に、好ましい化合物として、前記式(3)の化合物は、nが0又は1であると共に、前記フェノール性水酸基を有さないベンゼン環に前記Rが結合された下記式(8)の化合物であることが好ましく、前記式(4)の化合物は、nが0又は1であると共に、前記フェノール性水酸基を有さないベンゼン環に前記Rが結合された下記式(9)の化合物であることが好ましく、前記式(5)の化合物は、nが0又は1であると共に、前記フェノール性水酸基を有さないベンゼン環に前記Rが結合された下記式(10)の化合物であることが好ましい。
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000020
〔前記一般式(8)~(10)において、Rは水素原子又はアルキル基を表す。〕
Further, as a preferable compound, the compound of the formula (3) is a compound of the following formula (8) in which n is 0 or 1, and the R is bonded to a benzene ring having no phenolic hydroxyl group. Preferably, the compound of the formula (4) is a compound of the following formula (9) in which n is 0 or 1, and the R is bonded to a benzene ring having no phenolic hydroxyl group. Preferably, the compound of the formula (5) is a compound of the following formula (10) in which n is 0 or 1 and the R is bonded to a benzene ring having no phenolic hydroxyl group.
Figure JPOXMLDOC01-appb-C000018
Figure JPOXMLDOC01-appb-C000019
Figure JPOXMLDOC01-appb-C000020
[In the general formulas (8) to (10), R represents a hydrogen atom or an alkyl group. ]
 このような芳香族化合物としては、具体的には、レゾルシノール、4-メチルカテコール、4-t-ブチルカテコール、3-メチルカテコール、5-メチルレソルシノール、5-t-ブチルレソルシノール、1,2-ジヒドロキシナフタレン、1,3-ジヒドロキシナフタレン、及び2,3-ジヒドロキシナフタレン等が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。これらの芳香族化合物のなかでは、4-メチルカテコール及び4-t-ブチルカテコールが好ましい。これらは他の芳香族化合物に比べて、金属酸化物への還元能が強いことから好ましい。 Specific examples of such aromatic compounds include resorcinol, 4-methylcatechol, 4-t-butylcatechol, 3-methylcatechol, 5-methylresorcinol, 5-t-butylresorcinol, 1,2 -Dihydroxynaphthalene, 1,3-dihydroxynaphthalene, 2,3-dihydroxynaphthalene and the like. These may use only 1 type and may use 2 or more types together. Of these aromatic compounds, 4-methylcatechol and 4-t-butylcatechol are preferred. These are preferable because of their strong ability to reduce to metal oxides compared to other aromatic compounds.
 また、前記芳香族化合物を2種併用する場合、前記芳香族化合物のなかでも、4-メチルカテコールと4-t-ブチルカテコールとを併用することが好ましい。これらを併用した場合には、他の併用に比べて、金属酸化物への還元能が強いことから好ましい。
 更に、併用する場合の配合割合は特に限定されないが、4-メチルカテコールと4-t-ブチルカテコールとの合計を100モル%とした場合に、4-メチルカテコールの割合を30~80モル%とすることが好ましい。この範囲では特に優れた還元性の効果を得ることができる。前記範囲は、更に、40~70モル%であることがより好ましく、50~60モル%であることが特に好ましい。
When two kinds of aromatic compounds are used in combination, it is preferable to use 4-methylcatechol and 4-t-butylcatechol in combination among the aromatic compounds. When these are used in combination, it is preferable because the reducing ability to metal oxide is stronger than other combinations.
Furthermore, the blending ratio when used in combination is not particularly limited, but when the total of 4-methylcatechol and 4-t-butylcatechol is 100 mol%, the ratio of 4-methylcatechol is 30 to 80 mol%. It is preferable to do. In this range, a particularly excellent reducing effect can be obtained. The range is more preferably 40 to 70 mol%, and particularly preferably 50 to 60 mol%.
 また、前記芳香族化合物の気化温度は、1気圧下において、100℃以上であることが好ましい。この温度が100℃以上であることにより、接合(はんだ付け等)する際には、前記芳香族化合物は気化し、残渣が発生せず、無洗浄フラックスとすることができる。この1気圧下における気化温度は、通常、400℃以下であり、より好ましくは150℃以上であり、更に好ましくは200℃以上ある。
 尚、この1気圧下における気化温度とは、1気圧の条件下で、昇温していった場合に重量の減少が観察される温度である。この気化温度は、下記方法により測定される。即ち、示差熱天秤(TG/DTA)を用い、窒素下で系内を昇温していき、フラックスの気化による重量減少(通常、試料全体の5質量%以上)が最初に観察された温度を気化温度とする。
The vaporization temperature of the aromatic compound is preferably 100 ° C. or higher under 1 atm. When the temperature is 100 ° C. or higher, the aromatic compound is vaporized when joining (soldering or the like), no residue is generated, and a non-cleaning flux can be obtained. The vaporization temperature under 1 atm is usually 400 ° C. or lower, more preferably 150 ° C. or higher, and further preferably 200 ° C. or higher.
The vaporization temperature under 1 atm is a temperature at which a decrease in weight is observed when the temperature is raised under the condition of 1 atm. This vaporization temperature is measured by the following method. That is, using a differential thermal balance (TG / DTA), the temperature inside the system was raised under nitrogen, and the temperature at which weight loss due to flux vaporization (usually 5 mass% or more of the entire sample) was first observed was The vaporization temperature.
 本発明のフラックスに含まれる前記芳香族化合物の量は特に限定されず、フラックスの一部として含有されてもよく、フラックスの全量を構成してもよい。即ち、例えば、フラックス全体を100質量%とした場合、前記芳香族化合物は70~100質量%含有できる。前記芳香族化合物の含有量がこの範囲であれば、還元性及び低残渣性に優れたフラックスとすることができる。この含有量は80~100質量%が好ましく、90~100質量%がより好ましく、95~100質量%が特に好ましい。 The amount of the aromatic compound contained in the flux of the present invention is not particularly limited and may be contained as a part of the flux or may constitute the entire amount of the flux. That is, for example, when the total flux is 100% by mass, the aromatic compound can be contained in an amount of 70 to 100% by mass. If content of the said aromatic compound is this range, it can be set as the flux excellent in reducibility and low residue property. The content is preferably 80 to 100% by mass, more preferably 90 to 100% by mass, and particularly preferably 95 to 100% by mass.
 本発明のフラックスは、本発明の目的が達成される限り、前記芳香族化合物に加えて、他の成分を含有させることができる。他の成分としては、溶剤、活性剤、及びチクソトロピー性付与剤等が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。 The flux of the present invention can contain other components in addition to the aromatic compound as long as the object of the present invention is achieved. Examples of other components include solvents, activators, and thixotropic agents. These may use only 1 type and may use 2 or more types together.
 前記溶剤としては、アルコール類、エステル類、エーテル類及び炭化水素類等が挙げられる。この溶剤としては、例えば、イソプロパノール、ブタノール等の1価アルコール類;エチレングリコール、ジエチレングリコール、トリエチレングリコール、プロピレングリコール、ジプロピレングリコール、トリプロピレングリコール、ブタンジオール、ペンタンジオール、ヘキサンジオール等の2価アルコール類;エチレングリコールモノメチルエーテルアセテート、エチレングリコールモノエチルエーテルアセテート等のエチレングリコールモノアルキルエーテルアセテート類;プロピレングリコールモノメチルエーテル、プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル等のプロピレングリコールモノアルキルエーテル類;プロピレングリコールジメチルエーテル、プロピレングリコールジエチルエーテル、プロピレングリコールジプロピルエーテル、プロピレングリコールジブチルエーテル等のプロピレングリコールジアルキルエーテル類;プロピレングリコールモノメチルエーテルアセテート、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノプロピルエーテルアセテート、プロピレングリコールモノブチルエーテルアセテート等のプロピレングリコールモノアルキルエーテルアセテート類;エチルセロソルブ、ブチルセロソルブ等のセロソルブ類;ブチルカルビトール等のカルビトール類;乳酸メチル、乳酸エチル、乳酸n-プロピル、乳酸イソプロピル等の乳酸エステル類;酢酸エチル、酢酸n-プロピル、酢酸イソプロピル、酢酸n-ブチル、酢酸イソブチル、酢酸n-アミル、酢酸イソアミル、プロピオン酸イソプロピル、プロピオン酸n-ブチル、プロピオン酸イソブチル等の脂肪族カルボン酸エステル類;3-メトキシプロピオン酸メチル、3-メトキシプロピオン酸エチル、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル、ピルビン酸メチル、ピルビン酸エチル等の他のエステル類;トルエン、キシレン等の芳香族炭化水素類;2-ヘプタノン、3-ヘプタノン、4-ヘプタノン、シクロヘキサノン等のケトン類;N-ジメチルホルムアミド、N-メチルアセトアミド、N,N-ジメチルアセトアミド、N-メチルピロリドン等のアミド類;γ-ブチロラクトン等のラクトン類が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。 Examples of the solvent include alcohols, esters, ethers and hydrocarbons. Examples of the solvent include monohydric alcohols such as isopropanol and butanol; dihydric alcohols such as ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, tripropylene glycol, butanediol, pentanediol, and hexanediol. Ethylene glycol monoalkyl ether acetates such as ethylene glycol monomethyl ether acetate and ethylene glycol monoethyl ether acetate; propylene glycol monoalkyl ethers such as propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether and propylene glycol monobutyl ether Alkyl ethers; propylene glycol di Propylene glycol dialkyl ethers such as chill ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, propylene glycol dibutyl ether; propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate Propylene glycol monoalkyl ether acetates such as; cellosolves such as ethyl cellosolve and butyl cellosolve; carbitols such as butyl carbitol; lactic acid esters such as methyl lactate, ethyl lactate, n-propyl lactate and isopropyl lactate; N-propyl acetate, isopropyl acetate, n-butyl acetate, Aliphatic carboxylic acid esters such as isobutyl acid, n-amyl acetate, isoamyl acetate, isopropyl propionate, n-butyl propionate, isobutyl propionate; methyl 3-methoxypropionate, ethyl 3-methoxypropionate, 3-ethoxy Other esters such as methyl propionate, ethyl 3-ethoxypropionate, methyl pyruvate, ethyl pyruvate; aromatic hydrocarbons such as toluene, xylene; 2-heptanone, 3-heptanone, 4-heptanone, cyclohexanone, etc. Ketones; amides such as N-dimethylformamide, N-methylacetamide, N, N-dimethylacetamide, N-methylpyrrolidone; and lactones such as γ-butyrolactone. These may use only 1 type and may use 2 or more types together.
 本発明のフラックスでは溶剤を含有させることができる。この溶剤の配合量は特に限定されないが、芳香族化合物の合計を100質量部とした場合に、0.1~100000質量部を用いることができ、好ましくは1~10000質量部であり、更に好ましくは10~1000質量部である。この溶剤の含有量によりフラックスの粘度を調製できる。即ち、フラックスの塗布方法に応じて適宜の粘度を選択でき、その粘度は上記範囲の溶剤量により調製できる。 The flux of the present invention can contain a solvent. The amount of the solvent is not particularly limited, but when the total amount of aromatic compounds is 100 parts by mass, 0.1 to 100,000 parts by mass can be used, preferably 1 to 10,000 parts by mass, and more preferably Is 10 to 1000 parts by mass. The viscosity of the flux can be adjusted by the content of the solvent. That is, an appropriate viscosity can be selected according to the flux application method, and the viscosity can be adjusted by the amount of solvent in the above range.
 前記活性剤としては、塩化水素酸及び臭化水素酸のアミン塩、並びに、カルボン酸及びそのアミン塩が挙げられる。この活性剤としては、例えば、メチルアミン、エチルアミン、n-プロピルアミン、イソプロピルアミン、n-ブチルアミン等の第1級アミン類;ジメチルアミン、ジエチルアミン、ジ-n-プロピルアミン、ジイソプロピルアミン、ジ-n-ブチルアミン等の第2級アミン類;トリメチルアミン、トリエチルアミン、トリ-n-プロピルアミン、トリイソプロピルアミン等の第3級アミン類;モノエタノールアミン、ジエタノールアミン、トリエタノールアミン等のアルカノールアミン類等の塩化水素酸塩および臭化水素酸塩、ならびに、シュウ酸、マロン酸、コハク酸、アジピン酸、グルタル酸、ジエチルグルタル酸、ピメリン酸、アゼライン酸、セバシン酸、マレイン酸、フマル酸、ジグリコール酸、カプリン酸、ラウリン酸、ミリスチン酸、パルミチン酸、リノール酸、オレイン酸、ステアリン酸、アラキン酸、べへニン酸、リノレン酸等の脂肪族カルボン酸;安息香酸等の芳香族酸;ヒドロキシピバリン酸、ジメチロールプロピオン酸、クエン酸、リンゴ酸、グリセリン酸、乳酸等のヒドロキシ酸、および、これらカルボン酸のアミン塩等が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。 Examples of the activator include amine salts of hydrochloric acid and hydrobromic acid, and carboxylic acids and amine salts thereof. Examples of the activator include primary amines such as methylamine, ethylamine, n-propylamine, isopropylamine, n-butylamine; dimethylamine, diethylamine, di-n-propylamine, diisopropylamine, di-n Secondary amines such as butylamine; Tertiary amines such as trimethylamine, triethylamine, tri-n-propylamine and triisopropylamine; Hydrogen chlorides such as alkanolamines such as monoethanolamine, diethanolamine and triethanolamine Acid salts and hydrobromides, as well as oxalic acid, malonic acid, succinic acid, adipic acid, glutaric acid, diethyl glutaric acid, pimelic acid, azelaic acid, sebacic acid, maleic acid, fumaric acid, diglycolic acid, caprin Acid, lauric acid, myris Acid, palmitic acid, linoleic acid, oleic acid, stearic acid, arachidic acid, behenic acid, linolenic acid and other aliphatic carboxylic acids; benzoic acid and other aromatic acids; hydroxypivalic acid, dimethylolpropionic acid, citric acid Examples thereof include hydroxy acids such as acid, malic acid, glyceric acid and lactic acid, and amine salts of these carboxylic acids. These may use only 1 type and may use 2 or more types together.
 前記チクソトロピー性付与剤としては、例えば、カスターワックス(硬化ひまし油)等のポリオレフィン系ワックス;m-キシリレンビスステアリン酸アミド等の脂肪酸アミド;N-ブチル-N’-ステアリル尿素等の置換尿素ワックス;ポリエチレングリコール、ポリエチレンオキサイド、メチルセルロース、エチルセルロース、ヒドロキシエチルセルロース等の高分子化合物;シリカ粒子、カオリン粒子等の無機粒子が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。 Examples of the thixotropic property-imparting agent include polyolefin waxes such as castor wax (hardened castor oil); fatty acid amides such as m-xylylene bis stearamide; substituted urea waxes such as N-butyl-N′-stearyl urea; Examples thereof include polymer compounds such as polyethylene glycol, polyethylene oxide, methyl cellulose, ethyl cellulose, and hydroxyethyl cellulose; inorganic particles such as silica particles and kaolin particles. These may use only 1 type and may use 2 or more types together.
 本発明のフラックスではチクソトロピー性付与剤を含有させることができる。このチクソトロピー性付与剤の配合量は特に限定されないが、芳香族化合物の合計を100質量部とした場合に、0.1~30質量部を用いることができ、好ましくは0.1~20質量部であり、更に好ましくは0.1~10質量部である。このチクソトロピー性付与剤の含有量により構成部材同士の接着力を調製できる。 In the flux of the present invention, a thixotropic agent can be contained. The amount of the thixotropy-imparting agent is not particularly limited. When the total amount of aromatic compounds is 100 parts by mass, 0.1 to 30 parts by mass can be used, preferably 0.1 to 20 parts by mass. More preferably, it is 0.1 to 10 parts by mass. The adhesive force between the constituent members can be adjusted by the content of the thixotropic agent.
 また、本発明のフラックスの性状は特に限定されず、即ち、例えば、固体であってもよく、液体(ペーストを含む、以下同様。)であってよい。このうち固体とは、1気圧且つ23℃の雰囲気下で外力の負荷の有無に係わらず流動されない状態を意味する。
 また、液体とは、1気圧且つ23℃の雰囲気下で外力を加えることなく流動される状態を意味する。液体状のフラックスの場合は、例えば、1気圧且つ温度23℃おける粘度を0.001~1000Pa・Sとすることができる。この粘度は更に0.01~800Pa・Sとすることができ、0.1~700Pa・Sとすることができる。
Further, the properties of the flux of the present invention are not particularly limited, that is, for example, it may be a solid or a liquid (including a paste, the same shall apply hereinafter). Among these, the solid means a state in which it does not flow in an atmosphere of 1 atm and 23 ° C. regardless of whether or not an external force is applied.
Further, the liquid means a state in which it flows without applying an external force in an atmosphere of 1 atm and 23 ° C. In the case of a liquid flux, for example, the viscosity at 1 atmosphere and a temperature of 23 ° C. can be 0.001 to 1000 Pa · S. This viscosity can be further set to 0.01 to 800 Pa · S, and can be set to 0.1 to 700 Pa · S.
 本発明のフラックスは、前記状態のいずれであってもよく、使用状況に応じて適宜選択できる。例えば、固体状のフラックスは、細片化して目的とする部位に載置して用いることができる。また、液体状のフラックスは、スクリーン印刷などにより、目的とする部位に付着させることができ、更に、塗布により、目的とする部位に付着させることができる。 The flux of the present invention may be in any of the above states, and can be appropriately selected depending on the usage situation. For example, the solid flux can be used after being cut into pieces and placed on a target site. Further, the liquid flux can be attached to the target site by screen printing or the like, and can be further attached to the target site by coating.
 尚、本発明のフラックスは、前記芳香族化合物を含有することにより、前述のように接着性を発揮できる。この接着性は、通常、金属と金属との間に本フラックスを介在させることで生じるが、液体状のフラックスでは、より短時間で接着性が発揮される傾向にある。一方、固体状のフラックスでは、液体状のフラックスに比べるとより十分な接着性が得られるまでの時間が長い傾向にある。このため、固体状のフラックスを用いる場合には、加熱を行うことが好ましい。この加熱を行う場合の温度は前記気化温度以下で行うことが好ましく、特に気化温度よりも20~100℃低い温度であって、且つ、融点よりも10~50℃高い温度で行うことが好ましい。 In addition, the flux of this invention can exhibit adhesiveness as mentioned above by containing the said aromatic compound. This adhesion usually occurs when this flux is interposed between metals, but with a liquid flux, the adhesion tends to be exhibited in a shorter time. On the other hand, the solid flux tends to have a longer time until sufficient adhesiveness is obtained compared to the liquid flux. For this reason, when using a solid-state flux, it is preferable to heat. The heating temperature is preferably not higher than the vaporization temperature, and particularly preferably 20 to 100 ° C. lower than the vaporization temperature and 10 to 50 ° C. higher than the melting point.
 [2]導電性ペースト
 本発明の導電性ペーストは、本発明における前記フラックスと、導電性金属粒子と、を含有する。
[2] Conductive paste The conductive paste of the present invention contains the flux in the present invention and conductive metal particles.
 前記フラックスは、前述の本発明のフラックスをそのまま適用できる。本発明の導電性ペーストに含有される前記フラックスの量は特に限定されないが、前記フラックスの含有量は、前記導電性ペーストを100質量%とした場合、好ましくは0.1~30質量%であり、より好ましくは1~20質量%であり、更に好ましくは5~10質量%である。前記フラックスの含有量が、上記範囲にあると、基板濡れ性に優れる導電性ペーストとすることができる。 The flux of the present invention described above can be applied as it is. The amount of the flux contained in the conductive paste of the present invention is not particularly limited, but the content of the flux is preferably 0.1 to 30% by mass when the conductive paste is 100% by mass. More preferably, the content is 1 to 20% by mass, and still more preferably 5 to 10% by mass. When the content of the flux is in the above range, a conductive paste having excellent substrate wettability can be obtained.
 前記導電性金属粒子は、金属同士の接合化、又は電子回路等において各部材(電子部品等)の基板への固定化等に使われる導電性の金属粒子であれば、特に限定されず、公知のはんだ粉や金、銀、銅、アルミニウム及びこれら金属を含む合金などからなる金属粉等を使用することができる。これらの中でも、低温での金属同士の接合に用いる場合は、はんだ粉が好ましい。 The conductive metal particles are not particularly limited as long as they are conductive metal particles used for bonding between metals, or fixing each member (electronic component, etc.) to a substrate in an electronic circuit or the like. A solder powder, a metal powder made of gold, silver, copper, aluminum, an alloy containing these metals, or the like can be used. Among these, solder powder is preferable when used for joining metals at low temperatures.
 このはんだ粉としては、例えば、Sn-Pb、Sn-Pb-Ag、Sn-Pb-Bi、Sn-Pb-In、Sn-Pb-Sb等のみならず、無鉛系のSn-Sb系合金、Sn-Bi系合金、Sn-Ag系合金、Sn-Zn系合金(Ag、Cu、Bi、In、Ni、P等が添加されていてもよい)等が挙げられる。これらは1種のみを用いてもよく2種以上を併用してもよい。 Examples of the solder powder include Sn—Pb, Sn—Pb—Ag, Sn—Pb—Bi, Sn—Pb—In, Sn—Pb—Sb, etc., as well as lead-free Sn—Sb alloys, Sn -Bi alloy, Sn-Ag alloy, Sn-Zn alloy (Ag, Cu, Bi, In, Ni, P, etc. may be added) and the like. These may use only 1 type and may use 2 or more types together.
 前記導電性金属粒子の形状は、球形、不定形、いずれでも良い。また、導電性金属粒子の粒径は、通常のものであればよく、球形の場合、直径5~200μmが好ましく、より好ましくは5~100μmであり、更に好ましくは5~50μmである。 The shape of the conductive metal particles may be either spherical or irregular. The particle diameter of the conductive metal particles may be a normal one. In the case of a spherical shape, the diameter is preferably 5 to 200 μm, more preferably 5 to 100 μm, and further preferably 5 to 50 μm.
 また、この導電性金属粒子の含有量は、導電性ペースト全体を100質量%とした場合、好ましくは70~99.9質量%であり、より好ましくは80~99質量%であり、更に好ましくは90~95質量%である。前記導電性金属粒子の含有量が、前記範囲にあると、基板濡れ性に優れる導電性ペーストとすることができる。 Further, the content of the conductive metal particles is preferably 70 to 99.9% by mass, more preferably 80 to 99% by mass, and still more preferably when the entire conductive paste is 100% by mass. 90 to 95% by mass. When the content of the conductive metal particles is in the above range, a conductive paste having excellent substrate wettability can be obtained.
 また、本発明の導電性ペーストにおいて、本発明の目的が達成される限り、前記芳香族化合物を含有するフラックスと、導電性金属粒子とに加えて、その他の添加剤を含有させることができる。 In addition, in the conductive paste of the present invention, as long as the object of the present invention is achieved, other additives can be contained in addition to the flux containing the aromatic compound and the conductive metal particles.
 本発明の導電性ペーストの製造方法は、前記フラックス、及び前記はんだ粉、並びに必要に応じて添加される添加物を常法により、混練する方法が挙げられる。混練する機械としては、例えば、真空撹拌装置、混練装置、プラネタリ-ミキサー等が挙げられる。配合時の温度及び条件等は特に限定されないが、通常、5~25℃での混練が好ましい。 Examples of the method for producing the conductive paste of the present invention include a method of kneading the flux, the solder powder, and an additive added as necessary by a conventional method. Examples of the kneading machine include a vacuum stirring device, a kneading device, and a planetary mixer. The temperature and conditions at the time of blending are not particularly limited, but kneading at 5 to 25 ° C. is usually preferable.
 [3]接合部品
 本発明の接合部品は、構成部材と他の構成部材とが、本発明における前記導電性ペーストを用いて接合されている。
[3] Joined component In the joined component of the present invention, a component member and another component member are bonded using the conductive paste of the present invention.
 上記構成部材及び他の構成部材は、接合により接着される部材である限り、特に限定されない。この部材(構成部材及び他の構成部材)としては、例えば、部品搭載基板、チップ搭載基板等の各種基板、電子回路モジュール、フリップチップIC、半導体チップ等の各種電子部品等が挙げられる。 The above-mentioned constituent members and other constituent members are not particularly limited as long as they are members bonded by bonding. Examples of the members (constituent members and other constituent members) include various substrates such as a component mounting substrate and a chip mounting substrate, and various electronic components such as an electronic circuit module, a flip chip IC, and a semiconductor chip.
 本発明の接合部品は、上記構成部材どうしが、本発明の導電性ペーストに由来する導電性金属を介して接合されている。
 本発明の接合部品としては、例えば、図1に示される表面実装型電子基板(以下、「実装体」という。)が挙げられる。この実装体を例として、以下に説明する。
 図1に示すように、この実装体においては、部品搭載用の基板1の部品接続用導体(以下、「ランド」という。)2a,2b上に、積層セラミックコンデンサ4の外部電極5a,5bが、本発明の導電性ペーストに由来する導電性接合材(はんだ等)23a、23bを介して接合されている。
In the joining component of the present invention, the constituent members are joined together via a conductive metal derived from the conductive paste of the present invention.
As the joining component of the present invention, for example, a surface mounting type electronic substrate (hereinafter referred to as “mounting body”) shown in FIG. This mounting body will be described below as an example.
As shown in FIG. 1, in this mounting body, external electrodes 5a and 5b of a multilayer ceramic capacitor 4 are provided on component connection conductors (hereinafter referred to as “lands”) 2a and 2b of a substrate 1 for component mounting. These are bonded via conductive bonding materials (solder or the like) 23a, 23b derived from the conductive paste of the present invention.
 前記接合部品の製造方法(本発明の導電性ペーストを使用した場合の接合方法)は、本発明の導電性ペーストを用いて、前記構成部材が接合される製造方法であれば、特に限定されない。例えば、導電性ペースト塗布工程、及び、部品搭載工程を、この順序で備える通常の製造方法が挙げられる。即ち、本発明の接合部品の製造方法は、構成部材と他の構成部材とが接合された接合部品を製造する方法であって、構成部材に本発明の導電性ペーストを塗布する導電性ペースト塗布工程と、塗布された導電性ペースト上に、他の構成部材を搭載する部品搭載工程と、を備えることを特徴とする。
 本発明の接合部品の製造方法は、通常、前記部品搭載工程の後に、更に、リフロー工程を備える。また、好ましい製造方法としては、部品搭載工程とリフロー工程との間に、予備加熱工程を備える製造方法が挙げられる。
The manufacturing method of the said joining component (joining method at the time of using the electrically conductive paste of this invention) will not be specifically limited if it is a manufacturing method to which the said structural member is joined using the electrically conductive paste of this invention. For example, a normal manufacturing method including a conductive paste application process and a component mounting process in this order can be given. That is, the method for manufacturing a bonded part of the present invention is a method for manufacturing a bonded part in which a component member and another component member are bonded, and the conductive paste application for applying the conductive paste of the present invention to the component member. And a component mounting step of mounting other constituent members on the applied conductive paste.
The method for manufacturing a joined component of the present invention usually further includes a reflow step after the component mounting step. Moreover, as a preferable manufacturing method, a manufacturing method including a preheating step between the component mounting step and the reflow step can be cited.
 即ち、構成部材と他の構成部材とが接合された接合部品を製造する方法であって、構成部材に本発明の導電性ペーストを塗布する導電性ペースト塗布工程と、塗布された導電性ペースト上に、他の構成部材を搭載する部品搭載工程と、前記他の構成部材が搭載された構成部材を、導電性金属粒子の溶融を行うことなく予備加熱する予備加熱工程と、を備えることを特徴とする。更に、必要に応じて、導電性金属粒子が溶融可能な粒子(例えば、はんだ粉等)の場合、前記導電性ペーストに含有される導電性金属粒子を溶融させるリフロー工程を備えることができる。 That is, a method for manufacturing a joined part in which a constituent member and another constituent member are joined, the conductive paste applying step of applying the conductive paste of the present invention to the constituent member, and the applied conductive paste A component mounting step for mounting other constituent members, and a preheating step for preheating the constituent members mounted with the other constituent members without melting the conductive metal particles. And Furthermore, in the case of particles (for example, solder powder) in which the conductive metal particles can be melted, a reflow step of melting the conductive metal particles contained in the conductive paste can be provided as necessary.
 前記本発明の接合部材製造方法を、例として以下に説明する。
 (1)導電性ペースト塗布工程;図2(a)に示される部品接続用導体(以下、「ランド」という。)2a、2bを有する基板1(構成部材)に、ランド2a、2b上に導電性ペースト3a、3bを印刷又は塗布する〔図2(b)参照〕。
 (2)部品搭載工程;前記(1)の工程の後、導電性ペースト3a、3b上に、外部電極5a、5bを備えた電子部品4(他の構成部材)を搭載する〔図2(c)参照〕。
 (3)予備加熱工程;前記(2)の工程の後、基板1(構成部材)上に、導電性ペースト3a、3bが印刷又は塗布され、電子部品4(他の構成部材)が搭載されたものを、予備加熱する。この予備加熱により、導電性ペースト13a、13bは、粘液状となり、接着力がより発現される〔図2(d)参照〕。その接着力を有する導電性ペースト13a、13bにより基板1と電子部品4とが接着状態となり、電子部品4は、導電性ペースト13a、13b上に保持される。そして、別途、前記以外の電子部品を前記基板1上に搭載をする場合は、新たに、導電性ペーストを塗布又は印刷し、その上に電子部品を搭載する。前記予備加熱前に搭載された電子部品は、前記予備加熱により、接着力が発現された導電性ペースト上に搭載されていることから、基板と電子部品とが導電性ペーストを介して接着されており、位置のずれが生じることなく、新たな電子部品を搭載することができる。更に、導電性ペースト13a、13bは、接着力を有することから、導電性金属粒子の溶融を行うことなく、基板1に搭載される部品間の位置決め等を容易に行うことができる。
 (4)リフロー工程;導電性金属粒子が溶融可能な粒子の場合、前記予備加熱の後、リフロー炉等を通炉させる等により、加熱し、導電性ペースト13a、13bに含有される導電性粒子を溶融させ、接合を行う。即ち、構成部材と他の構成部材とを導電性金属により接合する。
The joining member manufacturing method of the present invention will be described below as an example.
(1) Conductive paste application process: Conducted on the lands 2a and 2b on the substrate 1 (component) having the component connecting conductors (hereinafter referred to as “lands”) 2a and 2b shown in FIG. Printing paste 3a, 3b is printed or applied [see FIG. 2 (b)].
(2) Component mounting step: After the step (1), the electronic component 4 (other components) including the external electrodes 5a and 5b is mounted on the conductive pastes 3a and 3b [FIG. )reference〕.
(3) Preheating step: After the step (2), the conductive pastes 3a and 3b are printed or applied on the substrate 1 (component), and the electronic component 4 (other component) is mounted. Things are preheated. By this preliminary heating, the conductive pastes 13a and 13b become viscous and exhibit more adhesive force (see FIG. 2D). The substrate 1 and the electronic component 4 are bonded by the conductive pastes 13a and 13b having the adhesive force, and the electronic component 4 is held on the conductive pastes 13a and 13b. And when mounting electronic components other than the above separately on the board | substrate 1, a conductive paste is newly apply | coated or printed and an electronic component is mounted on it. Since the electronic component mounted before the preheating is mounted on the conductive paste that has developed an adhesive force by the preheating, the substrate and the electronic component are bonded via the conductive paste. Therefore, a new electronic component can be mounted without causing a positional shift. Further, since the conductive pastes 13a and 13b have adhesive strength, positioning between components mounted on the substrate 1 can be easily performed without melting the conductive metal particles.
(4) Reflow step: in the case where the conductive metal particles are meltable particles, the conductive particles contained in the conductive pastes 13a and 13b are heated by passing through a reflow furnace or the like after the preliminary heating. Are melted and bonded. In other words, the constituent member and the other constituent member are joined by the conductive metal.
 前記予備加熱工程における加熱温度は、導電性金属粒子の種類により適宜選択することができるが、好ましくは80~200℃であり、より好ましくは100~180℃である。この予備加熱工程における加熱温度が上記範囲内にあると、前記導電性ペーストは接着力が発現され、基板と電子部品とを接着することができる。また、予備加熱工程は、通常のリフロー炉等により行うことができる。 The heating temperature in the preheating step can be appropriately selected depending on the type of conductive metal particles, but is preferably 80 to 200 ° C, more preferably 100 to 180 ° C. When the heating temperature in the preheating step is within the above range, the conductive paste exhibits an adhesive force, and can bond the substrate and the electronic component. Further, the preheating step can be performed by a normal reflow furnace or the like.
 前記リフロー工程における加熱温度は、導電性金属粒子の種類により適宜選択することができるが、好ましくは200~350℃であり、より好ましくは250~300℃である。このリフロー工程における加熱温度が上記範囲内にあると、前記導電性ペーストに含有されるフラックス等は揮発し、フラックス残渣は残存され難い。また、前記導電性ペーストに含有される導電性金属粒子は溶融し、基板と電子部品とを接合することができる。 The heating temperature in the reflow step can be appropriately selected depending on the type of conductive metal particles, but is preferably 200 to 350 ° C., more preferably 250 to 300 ° C. When the heating temperature in this reflow step is within the above range, the flux and the like contained in the conductive paste are volatilized and the flux residue hardly remains. Moreover, the conductive metal particles contained in the conductive paste can be melted to join the substrate and the electronic component.
 本発明の導電性ペーストは、接着力を有することから、導電性金属粒子を溶融させなくとも、基板と電子部品とを接着することができ、接合部品の製造に係るリフロー回数を少なくすることができる。即ち、例えば、電子部品が接合(はんだ付け等)されたモジュール基板(他の構成部材)を、マザー回路基板(構成部材)に接合する場合等には、まずモジュール基板に電子部品を接合した後、その接合されたモジュール基板(他の構成部材)をマザー回路基板(構成部材)に接合する必要がある。この場合、マザー回路基板に接合されるモジュール基板は、マザー回路基板へ、接合される時にも、再度リフロー炉へ通炉されることとなり、モジュール基板としては、2回目のリフローとなる。 Since the conductive paste of the present invention has an adhesive force, the substrate and the electronic component can be bonded without melting the conductive metal particles, and the number of reflows related to the manufacture of the bonded component can be reduced. it can. That is, for example, when a module board (other constituent member) to which an electronic component is joined (soldered or the like) is joined to a mother circuit board (constituent member), the electronic component is first joined to the module substrate. It is necessary to join the joined module board (other constituent member) to the mother circuit board (constituent member). In this case, the module substrate bonded to the mother circuit board is passed through the reflow furnace again when being bonded to the mother circuit board, and the module substrate is reflowed for the second time.
 しかし、本発明の導電性ペーストを用いた場合、まず、モジュール基板に電子部品を接着する。次に、その電子部品が接着されたモジュール基板をマザー回路基板に接着する。そして、モジュール基板が接着されたマザー回路基板をリフローへ通路させることにより、モジュール基板及びマザー基板の全ての接合を行うことができる。これにより、接合部品の製造に係るリフローは1回のみとすることができる。
 即ち、この接合部品の製造方法は、本発明の導電性ペーストを用いて、構成部材と他の構成部材とが接合された接合部品を製造する方法であって、第1の構成部材に導電性ペーストを塗布する導電性第1ペースト塗布工程と、塗布された導電性ペースト上に、第2の構成部材を搭載する第1部品搭載工程と、前記第2の構成部材が搭載された第1の構成部材を、導電性金属粒子の溶融を行うことなく予備加熱して、前記第2の構成部材と前記第1の構成部材とを接着する第1予備加熱工程と、第3の構成部材に導電性ペーストを塗布する導電性第2ペースト塗布工程と、必要に応じて、塗布された導電性ペースト上に、第2の構成部材が接着された第1の構成部材を搭載する第2部品搭載工程と、前記第1の構成部材が搭載された第3の構成部材を、導電性金属粒子の溶融を行うことなく予備加熱して、前記第1の構成部材と前記第3の構成部材とを接着する第2予備加熱工程と、必要に応じて、導電性金属粒子が溶融可能な粒子の場合、前記導電性ペーストに含有される導電性金属粒子を溶融させるリフロー工程と、を備えることができる。
However, when the conductive paste of the present invention is used, first, an electronic component is bonded to the module substrate. Next, the module substrate to which the electronic component is bonded is bonded to the mother circuit substrate. Then, by passing the mother circuit board to which the module board is bonded to the reflow, all of the module board and the mother board can be joined. Thereby, the reflow which concerns on manufacture of joining components can be made only once.
That is, this method for manufacturing a joined part is a method for producing a joined part in which a constituent member and another constituent member are joined using the conductive paste of the present invention, and the first constituent member is electrically conductive. Conductive first paste applying step of applying paste, first component mounting step of mounting a second component on the applied conductive paste, and first of mounting the second component A first preheating step of preheating the component member without melting the conductive metal particles to bond the second component member and the first component member; and conducting to the third component member Conductive second paste application step of applying a conductive paste, and, if necessary, a second component mounting step of mounting a first component member having a second component member bonded onto the applied conductive paste And a third configuration in which the first component is mounted A second preheating step of preheating the material without melting the conductive metal particles to bond the first component and the third component; and, if necessary, a conductive metal In the case where the particles are meltable particles, a reflow step of melting the conductive metal particles contained in the conductive paste can be provided.
 電子基板等の接合部品への過度の熱ストレスは、基板に接合された導電性金属粒子溶融や、熱膨張等による基板や接合部へのクラック等を生じさせる恐れがある。導電性金属粒子の溶融やクラックは、ショート不良、基板と電子部品と接合強度の低下等の不具合を発生させる恐れがある。
 従って、本発明の導電性ペーストを用いた場合には、過度の熱ストレスを与えることなく、接合を行うことができ、信頼性の高い接合部品を提供することができる。
Excessive thermal stress on a joining component such as an electronic substrate may cause melting of conductive metal particles joined to the substrate, cracking of the substrate or joint due to thermal expansion, or the like. Melting or cracking of the conductive metal particles may cause problems such as short-circuit failure and reduction in bonding strength between the substrate and the electronic component.
Therefore, when the conductive paste of the present invention is used, bonding can be performed without applying excessive thermal stress, and a highly reliable bonded component can be provided.
 本発明の接合部品は、本発明の導電性ペーストを用いて接合されていることから、接合後にフラックス残渣が残存され難く、接合後の接合部品を洗浄する必要がない。更に、接合において、過度の熱ストレスを軽減させることができるので、接合信頼性の高い接合部品とすることができる。 Since the joined part of the present invention is joined using the conductive paste of the present invention, the flux residue is hardly left after joining, and it is not necessary to clean the joined part after joining. Furthermore, since excessive thermal stress can be reduced in the joining, a joining component with high joining reliability can be obtained.
 以下、本発明について、実施例を挙げて具体的に説明する。尚、本発明は、これらの実施例に何ら制約されるものではない。また、実施例中の「部」は、特に断らない限り質量基準である。また、実施例及び比較例における粘度(Pa・s)の測定は、下記方法により行った。
[粘度]
 東機産業社製 E型粘度計 RE-105Hで測定した。
Hereinafter, the present invention will be specifically described with reference to examples. In addition, this invention is not restrict | limited at all by these Examples. Further, “parts” in the examples are based on mass unless otherwise specified. Moreover, the measurement of the viscosity (Pa * s) in an Example and a comparative example was performed by the following method.
[viscosity]
It was measured with an E-type viscometer RE-105H manufactured by Toki Sangyo Co., Ltd.
 [1]固体状のフラックスの調製
 <実施例1~4>
 表1において実施例1~4に示す芳香族化合物を固体状のフラックスとして用いた。
[1] Preparation of solid flux <Examples 1 to 4>
In Table 1, the aromatic compounds shown in Examples 1 to 4 were used as solid flux.
Figure JPOXMLDOC01-appb-T000021
Figure JPOXMLDOC01-appb-T000021
 [2]液体状フラックスの調製
 <実施例5及び6>
 表1において実施例5及び6に示す芳香族化合物を混合して、その混合物を100℃に加熱し、液状になるまで攪拌することにより、液体状フラックスを得た。尚、この液体状フラックスは、大気圧雰囲気下の室温において液状であり、5℃に冷却した場合でも再結晶化することはなかった。また、この液体状フラックスにおける、1気圧、23℃の雰囲気下での粘度(Pa・s)を表1に併記する。
[2] Preparation of liquid flux <Examples 5 and 6>
In Table 1, the aromatic compounds shown in Examples 5 and 6 were mixed, and the mixture was heated to 100 ° C. and stirred until it became liquid, thereby obtaining a liquid flux. The liquid flux was liquid at room temperature under atmospheric pressure and was not recrystallized even when cooled to 5 ° C. Table 1 also shows the viscosity (Pa · s) of this liquid flux under an atmosphere of 1 atm and 23 ° C.
 <比較例1>
 表1において比較例1に示す化合物と溶剤とを混合して、その混合物を100℃に加熱し、液状になるまで攪拌することにより、液体状フラックスを得た。尚、この液体状フラックスは、大気圧雰囲気下の室温において液状であり、5℃に冷却した場合でも再結晶化することはなかった。また、この液体状フラックスにおける、1気圧、23℃の雰囲気下での粘度(Pa・s)を表1に併記する。
<Comparative Example 1>
In Table 1, the compound shown in Comparative Example 1 and the solvent were mixed, and the mixture was heated to 100 ° C. and stirred until it became liquid, thereby obtaining a liquid flux. The liquid flux was liquid at room temperature under atmospheric pressure and was not recrystallized even when cooled to 5 ° C. Table 1 also shows the viscosity (Pa · s) of this liquid flux under an atmosphere of 1 atm and 23 ° C.
 [3]フラックスの評価
 実施例1~6及び比較例1により得られたフラックスについて、下記評価を行った。結果を表2に示す。
 (酸化膜(酸化銅)基板の作製)
 シリコンウエハ(厚さ1mm、直径20cm)に、銅を10μmの厚さで蒸着した銅基板を作成した。その後、その銅基板を、1気圧、空気下で200℃、6時間ホットプレートに置いて加熱し、片面が完全に酸化した酸化膜(酸化銅)基板を得た。
 (酸化膜(酸化スズ)基板の作製)
 シリコンウエハ(厚さ1mm、直径20cm)に、スズを10μmの厚さで蒸着したスズ基板を作成した。その後、そのスズ基板を、1気圧、空気下で200℃、6時間ホットプレートに置いて加熱し、片面が完全に酸化した酸化膜(酸化スズ)基板を得た。
[3] Evaluation of Flux The following evaluations were performed on the fluxes obtained in Examples 1 to 6 and Comparative Example 1. The results are shown in Table 2.
(Production of oxide film (copper oxide) substrate)
A copper substrate was prepared by depositing copper in a thickness of 10 μm on a silicon wafer (thickness 1 mm, diameter 20 cm). Thereafter, the copper substrate was placed on a hot plate at 200 ° C. for 6 hours under air at 1 atm and heated to obtain an oxide film (copper oxide) substrate in which one side was completely oxidized.
(Production of oxide film (tin oxide) substrate)
A tin substrate was prepared by depositing tin with a thickness of 10 μm on a silicon wafer (thickness 1 mm, diameter 20 cm). Thereafter, the tin substrate was placed on a hot plate at 1 ° C. under air at 200 ° C. for 6 hours and heated to obtain an oxide film (tin oxide) substrate having one surface completely oxidized.
(1)酸化膜(酸化銅)基板による固体状のフラックス(実施例1~4)の接着性評価
 固形状のフラックスを0.5g採取し、前記酸化膜(酸化銅)基板の上(酸化膜形成面)に均等に散布し、固形状のフラックスが液状になるまでホットプレート上で加熱した。そして、基板上に散布したフラックスが溶融した後、もう一枚の同じ種類の酸化膜基板を酸化膜形成面が、溶融状態のフラックスに接触するようにして重ね合わせ、2枚の酸化膜基板の酸化膜形成面を、溶融されたフラックスを介して隙間なく付着させた。付着後の2枚の酸化膜基板を、室温まで冷却し、酸化膜(酸化銅)基板が、強固に接着しているかどうか、目視にて評価した。強固に接着している場合を「○」、強固に接着していない場合を「×」として評価した。
(1) Evaluation of Adhesiveness of Solid Flux (Examples 1 to 4) by Oxide Film (Copper Oxide) Substrate 0.5 g of solid flux was sampled and placed on the oxide film (copper oxide) substrate (oxide film) (Formation surface) was sprayed evenly and heated on a hot plate until the solid flux became liquid. Then, after the flux spread on the substrate is melted, another oxide film substrate of the same type is overlapped so that the oxide film forming surface is in contact with the molten flux, and the two oxide film substrates are stacked. The oxide film forming surface was adhered without a gap through the melted flux. The two oxide film substrates after adhesion were cooled to room temperature, and whether or not the oxide film (copper oxide) substrate was firmly adhered was visually evaluated. The case where it was firmly bonded was evaluated as “◯”, and the case where it was not firmly bonded was evaluated as “x”.
(2)酸化膜(酸化スズ)基板による固体状のフラックス(実施例1~4)の接着性評価
 固形状のフラックスを0.5g採取し、酸化膜(酸化スズ)基板の上(酸化膜形成面)に均等に散布し、固形状のフラックスが液状になるまでホットプレート上で加熱した。そして、基板上に散布したフラックスが溶融した後、もう一枚の同じ種類の酸化膜基板を酸化膜形成面が、溶融状態のフラックスに接触するようにして重ね合わせ、2枚の酸化膜基板の酸化膜形成面を、溶融されたフラックスを介して隙間なく付着させた。付着後の2枚の酸化膜基板を、室温まで冷却し、酸化膜(酸化スズ)基板が、強固に接着しているかどうか、目視にて評価した。強固に接着している場合を「○」、強固に接着していない場合を「×」として評価した。
(2) Evaluation of Adhesiveness of Solid Flux (Examples 1 to 4) by Oxide Film (Tin Oxide) Substrate 0.5 g of solid flux was sampled and formed on the oxide film (tin oxide) substrate (oxide film formation) And uniformly heated on a hot plate until the solid flux becomes liquid. Then, after the flux spread on the substrate is melted, another oxide film substrate of the same type is overlapped so that the oxide film forming surface is in contact with the molten flux, and the two oxide film substrates are stacked. The oxide film forming surface was adhered without a gap through the melted flux. The two oxide film substrates after adhesion were cooled to room temperature, and whether or not the oxide film (tin oxide) substrate was firmly adhered was visually evaluated. The case where it was firmly bonded was evaluated as “◯”, and the case where it was not firmly bonded was evaluated as “x”.
(3)酸化膜(酸化銅)基板による液体状のフラックス(実施例5,6及び比較例1)の接着性評価
 液体状のフラックスを、前記酸化膜(酸化銅)基板の上(酸化膜形成面)に均等に塗布し、もう一枚の同じ種類の酸化膜基板を酸化膜形成面が、液体状のフラックスに接触するようにして重ね合わせ、2枚の酸化膜基板の酸化膜形成面を、液体状のフラックスを介して隙間なく付着させた。24時間経過後、酸化膜(酸化銅)基板が、強固に接着しているかどうか、目視にて評価した。強固に接着している場合を「○」、強固に接着していない場合を「×」として評価した。
(3) Evaluation of Adhesiveness of Liquid Flux (Examples 5 and 6 and Comparative Example 1) by Oxide Film (Copper Oxide) Substrate Liquid Flux is Applied on the Oxide Film (Copper Oxide) Substrate (Oxide Film Formation) And the other oxide film substrate of the same type is overlapped so that the oxide film formation surface is in contact with the liquid flux, and the oxide film formation surfaces of the two oxide film substrates are stacked. It was made to adhere without a gap through a liquid flux. After 24 hours, it was visually evaluated whether or not the oxide film (copper oxide) substrate was firmly adhered. The case where it was firmly bonded was evaluated as “◯”, and the case where it was not firmly bonded was evaluated as “x”.
(4)酸化膜(酸化スズ)基板による液体状のフラックス(実施例5,6及び比較例1)の接着性評価
 液体状のフラックスを、前記酸化膜(酸化スズ)基板の上(酸化膜形成面)に均等に塗布し、もう一枚の同じ種類の酸化膜基板を酸化膜形成面が、液体状のフラックスに接触するようにして重ね合わせ、2枚の酸化膜基板の酸化膜形成面を、液体状のフラックスを介して隙間なく付着させた。24時間経過後、酸化膜(酸化スズ)基板が、強固に接着しているかどうか、目視にて評価した。強固に接着している場合を「○」、強固に接着していない場合を「×」として評価した。
(4) Adhesive Evaluation of Liquid Flux (Examples 5 and 6 and Comparative Example 1) by Oxide Film (Tin Oxide) Substrate Liquid Form Flux on Oxide Film (Tin Oxide) Substrate (Oxide Film Formation) And the other oxide film substrate of the same type is overlapped so that the oxide film formation surface is in contact with the liquid flux, and the oxide film formation surfaces of the two oxide film substrates are stacked. It was made to adhere without a gap through a liquid flux. After 24 hours, whether or not the oxide film (tin oxide) substrate was firmly adhered was visually evaluated. The case where it was firmly bonded was evaluated as “◯”, and the case where it was not firmly bonded was evaluated as “x”.
(5)フラックスの酸化膜の還元性評価
 前記接着性評価後の各基板を、ホットプレート上で加熱した。この基板は、固体状フラックス又は液体状フラックスを介して付着され、重ね合わされた2枚の酸化膜基板を有するものである。そして、還元作用が発現される温度を測定した。この還元作用が発現する温度は、酸化膜が酸化銅の場合は、その酸化膜の色が黒から赤金色に変色した温度とした。また、酸化膜が酸化スズの場合は、その酸化膜の色が紫黒から白色に変色した温度とした。
(5) Reducibility evaluation of flux oxide film Each substrate after the adhesion evaluation was heated on a hot plate. This substrate has two oxide film substrates that are attached and stacked via a solid flux or a liquid flux. And the temperature at which a reducing action was expressed was measured. When the oxide film is copper oxide, the temperature at which this reduction action appears was the temperature at which the color of the oxide film changed from black to red gold. When the oxide film was tin oxide, the temperature was such that the color of the oxide film changed from purple black to white.
(6)フラックスの残渣評価
 前記接着性評価後の各基板を、窒素雰囲気下のホットプレート上に置き、はんだ溶融温度に相等する250℃で120分加熱した。この基板は、固体状フラックス又は液体状フラックスを介して付着され、重ね合わされた2枚の酸化膜基板を有するものである。そして、加熱後の酸化膜基板表面における残渣の有無について評価した。残渣の評価は、前記加熱後の酸化膜基板を目視により観察し、全くシミや焦げが観察されなかった場合を、残渣がないとして「○」と評価した。また、シミや焦げが観察された場合を、残渣があるとして「×」と評価した。
(6) Flux residue evaluation Each substrate after the adhesion evaluation was placed on a hot plate in a nitrogen atmosphere and heated at 250 ° C., which is equivalent to the solder melting temperature, for 120 minutes. This substrate has two oxide film substrates that are attached and stacked via a solid flux or a liquid flux. And the presence or absence of the residue in the oxide film substrate surface after a heating was evaluated. Evaluation of the residue was made by visually observing the heated oxide film substrate, and when no stain or burn was observed, it was evaluated as “◯” as no residue. Moreover, the case where a spot and a burn were observed was evaluated as "x" as there was a residue.
Figure JPOXMLDOC01-appb-T000022
Figure JPOXMLDOC01-appb-T000022
 表2の結果より、本発明のフラックス組成物は、金属酸化物への還元能に優れるだけではなく、基板接着性に優れ且つ、配線の絶縁性に悪影響を与える残渣をまったく発生しないため、従来のフラックス組成物にはない優れた特性を有するものである。 From the results shown in Table 2, the flux composition of the present invention is not only excellent in reducing ability to metal oxides, but also excellent in substrate adhesion and does not generate any residue that adversely affects wiring insulation. It has excellent characteristics not found in the flux composition.

Claims (9)

  1.  芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する、又は芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物を含有するフラックスであって、
     上記芳香族化合物の1気圧下における融点が、23℃以上であることを特徴とするフラックス。
    An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring or having two phenolic hydroxyl groups at two positions of the position number of one jump of the aromatic ring Containing flux,
    The flux characterized by the melting point of the aromatic compound under 1 atm being 23 ° C. or higher.
  2.  前記芳香族化合物の気化温度が、1気圧下で、100℃以上である請求項1に記載のフラックス。 The flux according to claim 1, wherein the vaporization temperature of the aromatic compound is 100 ° C or higher under 1 atm.
  3.  前記芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(1)で表される化合物であり、且つ、
     前記芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(2)で表される化合物である請求項1又は2に記載のフラックス。
    Figure JPOXMLDOC01-appb-C000001
    Figure JPOXMLDOC01-appb-C000002
    〔前記一般式(1)及び(2)において、Rはアルキル基を表し、nは0~4の整数を表す。〕
    An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (1), and
    The aromatic compound which has two phenolic hydroxyl groups in two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (2). flux.
    Figure JPOXMLDOC01-appb-C000001
    Figure JPOXMLDOC01-appb-C000002
    [In the general formulas (1) and (2), R represents an alkyl group, and n represents an integer of 0 to 4. ]
  4.  前記芳香族環の隣接する位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(3)又は下記一般式(4)で表される化合物であり、且つ、
     前記芳香族環の1つ飛びの位置番号の2つの位置に、2つのフェノール性水酸基を有する芳香族化合物が、下記一般式(5)で表される化合物である請求項1又は2に記載のフラックス。
    Figure JPOXMLDOC01-appb-C000003
    Figure JPOXMLDOC01-appb-C000005
    〔前記一般式(3)~(5)において、Rはアルキル基を表し、nは0~4の整数を表す。〕
    An aromatic compound having two phenolic hydroxyl groups at two positions of adjacent position numbers of the aromatic ring is a compound represented by the following general formula (3) or the following general formula (4), and
    The aromatic compound which has two phenolic hydroxyl groups in two positions of the position number of one jump of the aromatic ring is a compound represented by the following general formula (5). flux.
    Figure JPOXMLDOC01-appb-C000003
    Figure JPOXMLDOC01-appb-C000005
    [In the general formulas (3) to (5), R represents an alkyl group, and n represents an integer of 0 to 4. ]
  5.  前記芳香族化合物として、2種類以上の化合物を含有する請求項1乃至4のいずれかに記載のフラックス。 The flux according to any one of claims 1 to 4, wherein the aromatic compound contains two or more kinds of compounds.
  6.  1気圧、23℃の雰囲気下で、固体である請求項1乃至5のいずれかに記載のフラックス。 The flux according to any one of claims 1 to 5, which is solid under an atmosphere of 1 atm and 23 ° C.
  7.  請求項1乃至6のいずれかに記載のフラックスと、導電性金属粒子と、を含有することを特徴とする導電性ペースト。 7. A conductive paste comprising the flux according to any one of claims 1 to 6 and conductive metal particles.
  8.  構成部材と他の構成部材とが、請求項7に記載の導電性ペーストを用いて接合されていることを特徴とする接合部品。 A joining component, wherein the constituent member and another constituent member are joined using the conductive paste according to claim 7.
  9.  構成部材と他の構成部材とが接合された接合部品を製造する方法であって、
     構成部材に請求項7に記載の導電性ペーストを塗布する導電性ペースト塗布工程と、
     塗布された導電性ペースト上に、他の構成部材を搭載する部品搭載工程と、
     を備えることを特徴とする接合部品の製造方法。
    A method of manufacturing a joined part in which a constituent member and another constituent member are joined,
    A conductive paste application step of applying the conductive paste according to claim 7 to the constituent members;
    A component mounting process for mounting other components on the applied conductive paste;
    A method for manufacturing a joined part, comprising:
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