WO2010017729A1 - 高能双能ct系统的图像重建方法 - Google Patents

高能双能ct系统的图像重建方法 Download PDF

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WO2010017729A1
WO2010017729A1 PCT/CN2009/072664 CN2009072664W WO2010017729A1 WO 2010017729 A1 WO2010017729 A1 WO 2010017729A1 CN 2009072664 W CN2009072664 W CN 2009072664W WO 2010017729 A1 WO2010017729 A1 WO 2010017729A1
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energy
image
dual
image reconstruction
base material
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PCT/CN2009/072664
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French (fr)
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张丽
陈志强
康克军
胡海峰
邢宇翔
段新辉
李元景
刘以农
黄清萍
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清华大学
同方威视技术股份有限公司
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Publication of WO2010017729A1 publication Critical patent/WO2010017729A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Definitions

  • the invention relates to radiation imaging, in particular to a high energy X-ray dual energy CT image reconstruction method. Background technique
  • Computed tomography is widely used in medical diagnostics and industrial nondestructive testing.
  • XCT X-ray imaging-based CT imaging systems
  • These XCT systems can be divided into single-energy and dual-energy CTs depending on the imaging technique used.
  • the multi-energy X-ray imaging technology has developed to some extent, in practical applications, single- and dual-energy XCT are mainly used, and the technology is relatively mature.
  • the single-energy XCT obtains the structural and physical information inside the material by reconstructing the attenuation coefficient image of the object fault, but it is impossible to accurately distinguish which substance.
  • Dual-energy XCT can not only obtain information on the internal attenuation coefficient of the material, but also obtain information on the composition of the substance.
  • a typical result is the effective atomic number and equivalent characteristic density of the substance. This allows for accurate material identification and an efficient means of inspection for the public safety field.
  • Dual-energy XCT technology has been widely used in the field of medical imaging and security inspection of small objects, and its technology has been relatively mature.
  • low-energy X-rays are used for imaging, typically below 200KeV.
  • the reason for choosing such energy is as follows: Low-energy X-rays can be easily produced by X-ray tubes, and their radiation protection is relatively simple, and the attenuation coefficient of substances in this energy segment is quite different, so the image of matter is differentiated. Sex is also better; in addition, since the scanned objects tend to be small in size and the objects have less attenuation of X-rays, low-energy X-ray dual-energy technology is widely used in these fields.
  • the object of the present invention is to propose a dual energy CT reconstruction method based on high energy X-rays (greater than 1 MeV) in order to solve the problem of dual energy XCT inspection of large cargo.
  • atomic number and feature density tomographic images can be obtained accurately and efficiently for material identification, and an efficient means for safety inspection of large goods is provided.
  • the CT dual-energy system of the present invention uses a ray source and detector that can acquire dual-energy information, and can obtain projection data using standard CT circular orbits or other data acquisition methods, and use the data to reconstruct a tomographic image.
  • an image reconstruction method in a high energy dual energy CT system comprising the steps of: scanning an object with a high energy dual energy ray to obtain a dual energy projection value; according to a pre-created lookup table or By analyzing the method of solving the equations, the projection value of the base material coefficient corresponding to the dual energy projection value is calculated; and based on the projection value of the base material, the distribution image of the base material coefficient is obtained.
  • the energy of the high energy dual energy ray is greater than 1 MeV.
  • the lookup table is created by: selecting two kinds of base materials; calculating a projection value of the dual energy rays through different thickness combinations of the two materials, according to the relationship between the high and low energy projection values and the different thickness combinations, Get the lookup table.
  • the method for analyzing the system of equations comprises: obtaining the corresponding thickness combination by using the high-energy dual-energy projection values obtained by the actual high-low-projection equations under the decomposition of the base material.
  • the atomic number and the characteristic density are equivalent physical quantities.
  • the image reconstruction method further comprises: calculating an atomic number image of the object to be inspected based on the basis material coefficient distribution image.
  • the image reconstruction method further comprises: calculating a feature density image of the object to be inspected based on the base material coefficient distribution image.
  • the image reconstruction method further comprises the step of: calculating an attenuation coefficient image of the object to be inspected based on the basis material coefficient distribution image.
  • FIG. 1 is a schematic diagram showing the structure of a CT scanning system to which the present invention is applied.
  • the system uses a fan beam circular orbit scanning mode.
  • connection line represents the result from the previous step, which is used as input data for the next process.
  • 3A and 3B show the atomic number map and the characteristic density map obtained by simulation reconstruction using a single graphite model
  • Figures 3C and 3D show the atomic number plot and the characteristic density map of the reconstruction compared to the theoretical values. detailed description
  • reconstruction The process of obtaining a two-dimensional distribution from a projection is called reconstruction. This is the mathematical principle of CT.
  • the X-ray machine and the detector rotate around the object one turn, and then the projection of the line attenuation coefficient of a certain slice of the object is measured in various directions, so that the attenuation coefficient of the object slice can be reconstructed according to the CT principle. distributed.
  • Theoretical analysis and experimental results of the material attenuation coefficient can be obtained.
  • the line attenuation coefficient of each material can be uniquely determined by the two coefficients a2 and a3, so two basic materials, such as carbon and aluminum, can be selected, and the linear combination of the line attenuation coefficients of the base material is used to indicate other
  • the linear attenuation coefficient of all materials namely:
  • ⁇ is the line attenuation coefficient of any material
  • / 2 is the linear attenuation coefficient of the base material
  • b, b 2 is the base material coefficient . This is the core expression of the base material decomposition method.
  • ⁇ is the atomic number of matter, and is the atomic mass of matter.
  • the X-rays generated from the X-ray tube or the accelerator are continuum.
  • the source spectrum and the detector spectrum can be combined into D(E) for easy calculation, which satisfies the normalization.
  • P is the projection of two energies of high energy and low energy
  • A, D 2 are the energy spectrum of the X-ray system under high energy and low energy
  • & is the thickness of the base material, defined as:
  • the projection coefficient of the base material is obtained by a general filtered back projection reconstruction algorithm to obtain b t , b 2 :
  • the atomic number Z eff and the characteristic density p e are obtained by the formula (2), and the line attenuation coefficient image at any energy can be obtained by the formula (1).
  • FIG. 1 is a schematic diagram of a dual energy CT system in accordance with an embodiment of the present invention.
  • the ray source 100 generates dual-energy X-rays of continuously distributed energy in accordance with a predetermined sequence under the control of the controller.
  • the object to be inspected 200 is placed on the carrier mechanism 300.
  • the carrier mechanism 300 can be rotated at a constant speed under the control of the controller 500, and can also be raised and lowered.
  • the detector array 400 is disposed at a position opposite to the radiation source 100, and receives the transmitted radiation transmitted through the object to be inspected 200 under the control of the controller to obtain a detection signal for the first energy and a detection signal for the second energy.
  • the signals detected by detector array 400 are converted to digital signals and stored in a computer for subsequent reconstruction operations.
  • the X-ray source 100 employs a high-energy dual-energy accelerator source that can rapidly alternately generate two types of X-rays under high pressure. Due to the large size of large cargo, an accelerator source is used to generate high power rays for a clearer reconstructed image.
  • the carrier mechanism is, for example, a stationary platform.
  • the line array detector 400 array is placed horizontally perpendicular to the axis of the X-ray source 100 and the center of the carrier mechanism 300.
  • Electromechanical control, data transmission, and image reconstruction of the entire CT system are performed by computer workstations.
  • the workstation reconstructs the tomographic image and displays it in a two- or three-dimensional manner on the display.
  • the CT system accurately measures or calibrates the following system parameters: X-ray source point-to-detector distance ⁇ X-ray source to turret rotation axis distance?, X-ray source is mapped on the detector Position c, the pixel size d of the detector, and the exact geometric position of all detector elements Xi, the angle of rotation of the turntable
  • the scanning method of the system adopts the standard fan beam circular orbit scanning mode, that is, the radiation source and the detector are fixed at a certain height, and the object rotates with the stage for one week to obtain dual-energy CT projection data.
  • the image reconstruction process adopts the above method. From the dual-energy CT projection data, the atomic number and the feature density image of the scanned tomographic material are obtained by computer, which can provide basis for subsequent material identification and determination.
  • step S U the object is scanned by the dual energy ray to obtain a dual energy projection value
  • step S12 the base material coefficient projection value corresponding to the dual energy projection value is calculated according to the previously created lookup table or by the method of solving the equations.
  • the method of creating a lookup table is to select two kinds of base materials, calculate the projection values of the dual energy rays through the different thickness combinations of the two materials, and obtain a lookup table according to the relationship between the high and low energy projection values and the different thickness combinations.
  • the method of analysing the solution method group uses the high and low energy projection values obtained by the actual method to obtain the corresponding thickness combination by solving the high and low energy projection equations under the decomposition of the base material. This method has high precision, but the calculation speed is slow, in practice.
  • the method of using lookup tables first is preferred in the application.
  • step S14 an atomic number, a feature density image of the object to be inspected, and an attenuation coefficient image of the object to be inspected at an arbitrary energy are obtained from the coefficient distribution map of the base material.
  • This step is implemented in the hardware system.
  • the invention establishes a dual energy CT reconstruction method for base material decomposition under high energy X-ray, and can accurately obtain the atomic number and feature density image of the fault from the dual energy projection. For compounds and mixtures Unfortunately, the atomic number and characteristic density obtained are equivalent physical quantities.
  • FIGS. 3A to 3D show partial experimental results, which are simulation experiment results using a single material graphite model, in which Figs. 3C and 3D respectively show a horizontal cross-sectional view of an atomic number image and a feature density image, and a broken line indicates a reconstructed value. , the solid line indicates the theoretical value.
  • the invention is a universal high-energy dual-energy image reconstruction method, and has universal applicability in a dual-energy CT system with high-energy X-ray as a radiation source, and has wide application prospects.

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Description

高能双能 CT系统的图象重建方法 技术领域
本发明涉及辐射成像， 具体涉及一种高能 X射线双能 CT图像重建方法。 背景技术
计算机断层成像技术（CT)在医疗诊断和工业无损检测领域应用广泛。 随着 社会的发展， 它在公共安全和社会保障的需求也逐渐增加， 其中包括了大量以 X 射线成像为基础的 CT成像系统， 简称 XCT。 这些 XCT系统按使用的成像技术 可以分为单能和双能 CT。 虽然多能 X射线成像技术已经有了一定的发展， 但是 在实际的应用中还是以单、 双能 XCT为主， 而且技术相对成熟。 单能 XCT通过 重建物体断层的衰减系数图像， 得到物质内部的结构和物理信息， 但是无法准确 分辨是何种物质。 双能 XCT 不仅能够得到物质内部衰减系数的信息， 也可以通 过重建得到物质组成的信息， 一种典型的结果就是物质的有效原子序数和等效特 征密度。 这样就可以进行准确的物质识别， 为公共安全领域提供一种高效的检查 手段。
双能 XCT技术已经在医学成像和小型物件的安全检查领域得到了大量的应 用， 其技术已经相对比较成熟。 但是我们看到， 在大部分的双能系统中， 都采用 的低能 X射线进行成像， 一般在 200KeV以下。 选择这样的能量， 其原因冇以下 几条： 低能 X射线能较为容易通过 X光管产生， 其辐射防护也相对较为简便， 而且物质在这个能段的衰减系数差异较大， 所以物质的图像区分性也比较好； 另 外由于扫描的物体往往体积较小， 物体对 X射线的衰减较少， 所以低能 X射线 双能技术在这些领域广泛应用。
但是在大型货物的安全检査领域，这样能量范围的 X射线的穿透力是远远不 够， 无法得到清晰有效的投影数据用于图像重建。对于大型货物的 X射线透视成 像， 一般需要 MeV量级的 X射线， 能量范围一般是 l~10MeV。 在这个能量范围 内， 用于传统低能双能重建方法不再适用， 其根本原因在于这些方法都是基于一 个事实， 即 X射线与物质的作用只有两种效应： 光电效应和康普顿散射， 而不包 含电子对效应。但是在高能双能领域， 由于 X射线的能量往往大于电子对效应发 生的最低能量 1.02MeV， 所以在两种效应基础上提出的原有方法都无法继续使 用， 而必须开发新的技术来满足这样的要求。 发明内容
本发明的目的是提出一种基于高能 X射线 （大于 lMeV ) 的双能 CT重建方 法， 以便解决大型货物双能 XCT检查的问题。 根据本发明实施例的方法， 能够 准确有效地得到原子序数和特征密度断层图像从而进行材料识别， 为大型货物的 安全检查提供了一种高效的手段。
本发明的 CT双能系统使用可以获取双能信息的射线源和探测器，可以采用 标准的 CT圆轨道或者其他数据采集方式得到投影数据， 并利用这些数据重建断 层图像。
在本发明的一个方面， 提供了一种在高能双能 CT系统中的图像重建方法， 包括步骤： 利用高能双能射线扫描物体， 以获得髙能双能投影值； 根据预先创建 的查找表或者通过解析求解方程组的方法， 计算双能投影值对应的基材料系数投 影值； 基于基材料的投影值， 得到基材料系数的分布图像。
优选地， 所述高能双能射线的能量大于 lMeV。
优选地， 所述查找表是通过以下方法创建的： 选定两种基材料； 计算双能射 线通过这两种材料不同厚度组合下的投影值， 按照高低能投影值和不同厚度组合 的关系， 得到査找表。
优选地， 解析方程组的方法包括： 利用实际得到的高能双能投影值， 通过求 解基材料分解下的高低能投影方程组， 得到相应的厚度组合。
优选地， 对于物体包含混合物或化合物的情况， 所述原子序数和特征密度是 等效物理量。
优选地， 所述的图像重建方法还包括歩骤： 基于基材料系数分布图像计算 被检物体的原子序数图像。
优选地， 所述的图像重建方法还包括歩骤： 基于基材料系数分布图像计算 被检物体的特征密度图像。
优选地， 所述的图像重建方法还包括步骤： 基于基材料系数分布图像计算 被检物体的衰减系数图像。
根据上述方法， 解决了高能双能情况下重建的问题， 提供了更为有效的物 质识别和违禁品检查手段， 大大提高了安全检查的精度和效率。 附图说明
从下面结合附图的详细描述中， 本发明的上述特征和优点将更明显， 其中： 图 1可应用本发明的 CT扫描系统结构示意图， 图中系统采用扇束圆轨道扫 描方'式。
图 2是本发明重建方法的计算流程图。其中连接线上的数据表示从上一步得 到的结果， 其作为下一歩流程的输入数据。
3A和 3B示出了模拟重建得到的原子序数图和特征密度图，采用单一的石墨 模型； 以及
图 3C和 3D示出了重建的原子序数图和特征密度图与理论值的比较。 具体实施方式
下面， 参考附图详细说明本发明的优选实施方式。 在附图中， 虽然示于不同 的附图中， 但相同的附图标记用于表示相同的或相似的组件。 为了清楚和简明， 包含在这里的已知的功能和结构的详细描述将被省略， 以防止它们使本发明的主 题不清楚。
• CT数学原理
将二维分布 W(x, 沿着某个方向 求线积分，便得到一维的函数 )(/)， 该函数 称为 ·, 在 角度的投影。 如果能够得到各个方向的投影/^ /)， 那么可以根据 Radon变换精确计算得到二维分布 。 从投影得到二维分布的过程称为重建。 这便是 CT的数学原理。
实际应用中， X光机和探测器围绕物体旋转一圈， 便测量得到物体的某个切 片的线衰减系数分布在各个方向的投影， 从而可以根据 CT原理重建得到物体切 片的衰减系数二维分布。
• 基材料分解模型
物质对 X射线的线衰减系数， 可以通过三种基本效应的线衰减系数的和来 表示：
μ 二 μρ c + e = a p (E) + a KN (E) + a e (E) 其中/ 表示物质对 X射线的线性衰减系数， /p， ， /· ^分别表示光电、 康普顿、 电子对效应所对应的线性衰减系数， 而每一项又可以近似的表示成为两项的乘 积， 其中系数 α与物质的原子序数和密度相关， 而 (i?)则与 X射线的能量相关。
由物质衰减系数的理论分析和实验结果可以得到， 在高能情况下， 光电效 应的贡献 相比其他两项非常小， 在计算时是可以忽略的。 由此得到： ώ于每种材料的线衰减系数都可以被两个系数 a2和 a3唯一确定， 因此可 以选取两种基材料， 比如碳和铝， 用基材料的线衰减系数的线性组合表示其它所 有材料的线性衰减系数， 也就是：
= ,.+ με = μχ + Β2μ2 (1) 其中 μ为任意一种材料的线衰减系数， / /2为基材料的线性衰减系数，而 b、, b2 是基材料系数。 这也就是基材料分解方法的核心表达式。
按照下式定义《2, 3:
Figure imgf000006_0001
其中 为物质的密度， Ζ为物质的原子序数， 为物质的原子质量数。
则可以得到通过基材料分解方法计算有效原子序数和特征密度的公式： eff — blPeA +b2pe2
Figure imgf000006_0002
• 基材料投影模型
从 X光管或者加速器中产生的 X射线都是连续谱的，在 X射线投影过程中， 可以将射线源能谱和探测器能谱合并为 D(E)， 便于计算， 其满足归一化条件：
^mD{E)dE = \ 那么 此， 对于投影方程， 也可以改写成连续谱的形式： p = -In— = -In D(E) exp (- ^μ{Ε, 5 y)dl)dE 将基材料分解模型带入上式， 则双能的投影也可以表示成 ρλ (B},B2) p2 (β"β2)
Figure imgf000007_0001
其中 P 为高能和低能两个能量下的投影， A, D2为高能和低能下的 X射线系 统能谱， 而 ,&为基材料厚度， 定义为：
Bx 二 ^(f)dl
Figure imgf000007_0002
利用査找表的方式，或者直接求解方程组 (3)的方法，得到基材料投影系数 采用通用的滤波反投影重建算法得到 bt, b2:
Figure imgf000007_0003
b2 = f/0 J M2 (t)S(x cos » + ^ sin Θ - t)dt
0
其中 (ρ,θ 表示为投影值的径向和角向坐标。
利用公式 (2)得到原子序数 Zeff和特征密度 pe， 利用公式 (1)可以得到任意能 量下的线衰减系数图像。
图 1是根据本发明实施例的双能 CT系统的示意图。如图 1所示，射线源 100 在控制器的控制下按照预定的吋序产生能量连续分布的双能 X 射线。 被检物体 200放在承载机构 300上。 承载机构 300在控制器 500的控制下可以匀速旋转， 也可以上升和下降。 探测器阵列 400设置在与射线源 100相对的位置， 在控制器 的控制下接收透射过被检物体 200的透射射线， 得到针对第一能量的探测信号和 针对第二能量的探测信号。 由探测器阵列 400检测的信号被转换成数字信号， 存 储在计算机中， 用于后续的重建操作。
如图 1所示， 根据本发明的实施例： ( 1 ) X射线源 100采用高能双能加速器射线源， 其可以快速交替产生两种高压 下的 X射线。 由于大型货物的体积较大， 使用加速器射线源以产生高功率 的射线， 以获得更清晰重建图像。
( 2 ) 承载机构例如是转动平稳的载物平台。
( 3 ) 线阵探测器 400阵列垂直于 X射线源 100和承载机构 300中心的轴线，水 平放置。
(4) 整个 CT系统的机电控制、 数据传输、 图像重建都由计算机工作站完成。
工作站进行断层图像的重建， 在显示器上以二维或三维的方式显示。
( 5 ) 为了能够精确的重建图像， CT 系统精确地测量或标定以下系统参数： X 射线源点到探测器的距离 Ζ X射线源到转台旋转轴的距离 ?， X射线源 在探测器上映射位置 c， 探测器的像素尺寸 d, 以及所有探测器单元的准 确几何位置 Xi， 转台旋转角度
( 6 ) 系统的扫描方式， 采用标准的扇束圆轨道扫描方式， 即射线源和探测器固 定在某一高度， 物体随载物台旋转一周， 得到双能的 CT投影数据。
( 7 ) 图像重建过程采用上述的方法， 从双能的 CT投影数据中， 通过计算机实 现， 得到扫描断层物质的原子序数和特征密度图像， 从而可以为后续的物 质识别和判定提供依据。
下面结合附图 2描述本发明实施例的图像重建方法的详细过程。
在步骤 S U , 利用双能射线扫描物体， 以获得双能投影值；
在步骤 S12, 根据预先创建的查找表或者通过解析求解方程组的方法， 计算 双能投影值对应的基材料系数投影值。 创建查找表的方法是， 选定两种基材料， 计算双能射线通过这两种材料不同厚度组合下的投影值， 按照高低能投影值和不 同厚度组合的关系， 得到查找表。 而解析求解方法组的方法， 则利用实际得到的 高低能投影值， 通过求解基材料分解下的高低能投影方程组， 得到相应的厚度组 合， 这种方法精度高， 但是计算速度慢， 在实际应用中优先使用查找表的方法。
在步骤 S 13山基材料的投影值， 就可以得到基材料系数的分布图像。
在步骤 S 14, 从基材料的系数分布图得到被检物体的原子序数、 特征密度图 像， 和任意能量下被检物体衰减系数图像。 这一步骤在硬件系统得以实施。 本发 明建立了高能 X射线下的基材料分解双能 CT重建方法， 可以较为准确的从双能 投影中， 得到断层的原子序数和特征密度图像。 对于物质中包含化合物和混合物 的惜况， 得到的原子序数和特征密度都是等效物理量。
图 3A到 3D示出了部分实验结果， 它是利用单一物质石墨模型进行的模拟 实验结果， 其中图 3C和 3D分别表示原子序数图像和特征密度图像的水平方向 的剖线图， 虚线表示重建值， 实线表示理论值。
本发明作为一种通用的高能双能图像重建方法， 在一般的以高能 X射线为 射线源的双能 CT系统中， 都有其适用性， 具有广泛的应用前景。
上面的描述仅用于实现本发明的实施方式， 本领域的技术人员应该理解， 在 不脱离本发明的范围的任何修改或局部替换， 均应该属于本发明的权利要求来限 定的范围， 因此， 本发明的保护范围应该以权利要求书的保护范围为准。

Claims

权利要求
1、 一种在高能双能 CT系统中的图像重建方法， 包括步骤：
利用高能双能射线扫描物体， 以获得高能双能投影值；
根据预先创建的查找表或者通过解析求解方程组的方法， 计算双能投影值对 应的基材料系数投影值；
基于基材料的投影值， 得到基材料系数的分布图像。
2、 如权利要求 1 所述的图像重建方法， 其中所述高能双能射线的能量大于 lMeV。
3、 如权利要求 1 所述的图像重建方法， 其中所述査找表是通过以下方法创 建的：
选定两种基材料；
计算双能射线通过这两种材料不同厚度组合下的投影值， 按照高低能投影值 和不同厚度组合的关系， 得到查找表。
4、 如权利要求 1所述的图像重建方法， 其中求解方程组的方法包括： 利用实际得到的高能双能投影值， 通过求解基材料分解下的高低能投影方程 组， 得到相应的厚度组合
5、 如权利要求 1 所述的图像重建方法， 其中对于物体包含混合物或化合物 的情况， 所述原子序数和特征密度是等效物理量。
6、 如权利要求 1所述的图像重建方法， 还包括步骤：
基于基材料系数分布图像计算被检物体的原子序数图像。
7、 如权利要求 1所述的图像重建方法， 还包括步骤：
基于基材料系数分布图像计算被检物体的特征密度图像。
8、 如权利要求 1所述的图像重建方法， 还包括步骤- 基于基材料系数分布图像计算被检物体的线衰减系数图像。
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CN105223214B (zh) * 2015-10-22 2019-01-11 同方威视技术股份有限公司 用于物质分辨的标定装置、标定方法和标定系统

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CN101647706B (zh) 2012-05-30
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CN101647706A (zh) 2010-02-17
US8306180B2 (en) 2012-11-06
GB2462529A (en) 2010-02-17
GB2462529B (en) 2011-03-16
DE102009028104B4 (de) 2015-07-16
RU2413207C1 (ru) 2011-02-27
FR2935049A1 (fr) 2010-02-19
US20100040192A1 (en) 2010-02-18

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