WO2009157648A3 - 고속 정전류모드 이온전도현미경 - Google Patents

고속 정전류모드 이온전도현미경 Download PDF

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Publication number
WO2009157648A3
WO2009157648A3 PCT/KR2009/002537 KR2009002537W WO2009157648A3 WO 2009157648 A3 WO2009157648 A3 WO 2009157648A3 KR 2009002537 W KR2009002537 W KR 2009002537W WO 2009157648 A3 WO2009157648 A3 WO 2009157648A3
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WO
WIPO (PCT)
Prior art keywords
pipette
ion conductance
distance
constant current
scanning
Prior art date
Application number
PCT/KR2009/002537
Other languages
English (en)
French (fr)
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WO2009157648A2 (ko
Inventor
김달현
Original Assignee
한국표준과학연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 한국표준과학연구원 filed Critical 한국표준과학연구원
Publication of WO2009157648A2 publication Critical patent/WO2009157648A2/ko
Publication of WO2009157648A3 publication Critical patent/WO2009157648A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/44—SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

본 발명은 이온전도현미경에 관한 것으로 특히, 정전류를 피펫 전극에 인가하여 피펫구멍과 시편표면 사이의 거리에 반비례하는 이온전도저항의 크기에 비례하는 신호를 피드백신호로 사용함으로써 기존의 거리진동모드현미경의 단점인 저속성을 극복하여 고속으로 주사가 가능하고 아울러 기존의 정전압모드의 낮은 감도를 극복하여 거리진동모드에 준하는 고감도 특성을 갖는 고속 정전류모드 이온전도현미경에 관한 것이다. 이러한 본 발명에 따른 고속 정전류 이온전도현미경은 정전압이 인가된 피펫 전극을 구비한 피펫의 피펫구멍을 통해 흐르는 이온전류의 값의 변화를 감지하여 이를 이미지화하는 피펫을 구비한 기존의 정전압모드 이온전도현미경과는 달리, 피펫전극에 정전류를 인가하여, 시편표면-피펫구멍과의 거리가 가까워지면 이온전도저항이 대략 (1/거리)로 가파르게 증가하고 거리에 매우 민감하게 변하게 되는데 이 이온전도저항과 비례하는 신호를 피드백신호로 사용함으로써 고속 고감도 고분해능 이미징이 가능한 장점이 있다.
PCT/KR2009/002537 2008-06-26 2009-05-13 고속 정전류모드 이온전도현미경 WO2009157648A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0060660 2008-06-26
KR1020080060660A KR20100019580A (ko) 2008-06-26 2008-06-26 고속 정전류모드 이온전도현미경

Publications (2)

Publication Number Publication Date
WO2009157648A2 WO2009157648A2 (ko) 2009-12-30
WO2009157648A3 true WO2009157648A3 (ko) 2010-03-11

Family

ID=41445064

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/002537 WO2009157648A2 (ko) 2008-06-26 2009-05-13 고속 정전류모드 이온전도현미경

Country Status (2)

Country Link
KR (1) KR20100019580A (ko)
WO (1) WO2009157648A2 (ko)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4924091A (en) * 1989-02-01 1990-05-08 The Regents Of The University Of California Scanning ion conductance microscope
JPH08278315A (ja) * 1995-04-04 1996-10-22 Mitsubishi Electric Corp 走査プローブ顕微鏡の使用方法
US20040140427A1 (en) * 2001-03-22 2004-07-22 Korchev Yuri Evgenievich Patch-clamping and its use in analysing subcellular features
KR20080057079A (ko) * 2006-12-19 2008-06-24 한국표준과학연구원 고속 주사탐침현미경의 제어 방법

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4924091A (en) * 1989-02-01 1990-05-08 The Regents Of The University Of California Scanning ion conductance microscope
JPH08278315A (ja) * 1995-04-04 1996-10-22 Mitsubishi Electric Corp 走査プローブ顕微鏡の使用方法
US20040140427A1 (en) * 2001-03-22 2004-07-22 Korchev Yuri Evgenievich Patch-clamping and its use in analysing subcellular features
KR20080057079A (ko) * 2006-12-19 2008-06-24 한국표준과학연구원 고속 주사탐침현미경의 제어 방법

Also Published As

Publication number Publication date
KR20100019580A (ko) 2010-02-19
WO2009157648A2 (ko) 2009-12-30

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