WO2009031180A1 - 発光分析装置 - Google Patents

発光分析装置 Download PDF

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Publication number
WO2009031180A1
WO2009031180A1 PCT/JP2007/000953 JP2007000953W WO2009031180A1 WO 2009031180 A1 WO2009031180 A1 WO 2009031180A1 JP 2007000953 W JP2007000953 W JP 2007000953W WO 2009031180 A1 WO2009031180 A1 WO 2009031180A1
Authority
WO
WIPO (PCT)
Prior art keywords
coil
switch
circuit
closing
spark
Prior art date
Application number
PCT/JP2007/000953
Other languages
English (en)
French (fr)
Inventor
Haruki Osa
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to JP2009531023A priority Critical patent/JP4883182B2/ja
Priority to PCT/JP2007/000953 priority patent/WO2009031180A1/ja
Priority to CN2007800532872A priority patent/CN101680841B/zh
Priority to US12/676,096 priority patent/US8502973B2/en
Publication of WO2009031180A1 publication Critical patent/WO2009031180A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

　アーク発生回路５を閉回路状態と開回路状態に切り換える閉回路用スイッチ（５６）とこのスイッチ（５６）にスパーク電流が流れ込むことを防止する逆阻止ダイオード（５５）を設ける。放電電極（３１）と試料（３２）の間にスパーク放電を開始させる前に閉回路用スイッチ（５６）をオンし、コイル（５３）の励磁を開始する。これにより、インダクタンスの小さなコイルを用いたり、スイッチ素子５２のスイッチング周波数を高くしたりしなくても、スパーク放電の持続時間内にコイル（５３）の励磁電流を目標値に到達させることができる。
PCT/JP2007/000953 2007-09-04 2007-09-04 発光分析装置 WO2009031180A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009531023A JP4883182B2 (ja) 2007-09-04 2007-09-04 発光分析装置
PCT/JP2007/000953 WO2009031180A1 (ja) 2007-09-04 2007-09-04 発光分析装置
CN2007800532872A CN101680841B (zh) 2007-09-04 2007-09-04 发光分析装置
US12/676,096 US8502973B2 (en) 2007-09-04 2007-09-04 Optical emission analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000953 WO2009031180A1 (ja) 2007-09-04 2007-09-04 発光分析装置

Publications (1)

Publication Number Publication Date
WO2009031180A1 true WO2009031180A1 (ja) 2009-03-12

Family

ID=40428504

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000953 WO2009031180A1 (ja) 2007-09-04 2007-09-04 発光分析装置

Country Status (4)

Country Link
US (1) US8502973B2 (ja)
JP (1) JP4883182B2 (ja)
CN (1) CN101680841B (ja)
WO (1) WO2009031180A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110235033A1 (en) * 2010-03-25 2011-09-29 Shimadzu Corporation Emission spectrophotometer
US20130207545A1 (en) * 2010-06-25 2013-08-15 Universite De Lorraine Device for the Controlled Generation of Electric Arcs

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004333323A (ja) * 2003-05-08 2004-11-25 Shimadzu Corp 発光分光分析装置
JP2005069816A (ja) * 2003-08-22 2005-03-17 Shimadzu Corp 発光分析装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE789436A (fr) * 1972-09-29 1973-01-15 Belge Lampes Mat Electr Mble Generateur d'arc pour un appareil de spectrometrie d'emission.
JP4453599B2 (ja) * 2005-04-19 2010-04-21 株式会社島津製作所 発光分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004333323A (ja) * 2003-05-08 2004-11-25 Shimadzu Corp 発光分光分析装置
JP2005069816A (ja) * 2003-08-22 2005-03-17 Shimadzu Corp 発光分析装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110235033A1 (en) * 2010-03-25 2011-09-29 Shimadzu Corporation Emission spectrophotometer
US8643838B2 (en) * 2010-03-25 2014-02-04 Shimadzu Corporation Emission spectrophotometer
US20130207545A1 (en) * 2010-06-25 2013-08-15 Universite De Lorraine Device for the Controlled Generation of Electric Arcs

Also Published As

Publication number Publication date
JP4883182B2 (ja) 2012-02-22
JPWO2009031180A1 (ja) 2010-12-09
US8502973B2 (en) 2013-08-06
US20100208255A1 (en) 2010-08-19
CN101680841B (zh) 2011-08-24
CN101680841A (zh) 2010-03-24

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