WO2009028256A1 - 化学機械研磨用水系分散体調製用セットおよび化学機械研磨用水系分散体の調製方法 - Google Patents
化学機械研磨用水系分散体調製用セットおよび化学機械研磨用水系分散体の調製方法 Download PDFInfo
- Publication number
- WO2009028256A1 WO2009028256A1 PCT/JP2008/061428 JP2008061428W WO2009028256A1 WO 2009028256 A1 WO2009028256 A1 WO 2009028256A1 JP 2008061428 W JP2008061428 W JP 2008061428W WO 2009028256 A1 WO2009028256 A1 WO 2009028256A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- aqueous dispersion
- mechanical polishing
- chemical mechanical
- preparation
- composition containing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
本発明に係る化学機械研磨用水系分散体調製用セットは、コロイダルシリカおよび塩基性化合物を含み、pHが8以上10以下である、第1の組成物と、ポリ(メタ)アクリル酸塩および塩基性化合物を含み、pHが11以上13.5以下である、第2の組成物と、を備えている。さらに、酸化剤を含む、第3の組成物を備えることもできる。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009530015A JPWO2009028256A1 (ja) | 2007-08-31 | 2008-06-24 | 化学機械研磨用水系分散体調製用セットおよび化学機械研磨用水系分散体の調製方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007225415 | 2007-08-31 | ||
| JP2007-225415 | 2007-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2009028256A1 true WO2009028256A1 (ja) | 2009-03-05 |
Family
ID=40386985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/061428 Ceased WO2009028256A1 (ja) | 2007-08-31 | 2008-06-24 | 化学機械研磨用水系分散体調製用セットおよび化学機械研磨用水系分散体の調製方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2009028256A1 (ja) |
| TW (1) | TW200919568A (ja) |
| WO (1) | WO2009028256A1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101906346A (zh) * | 2009-06-02 | 2010-12-08 | 日信化学工业株式会社 | 水性切削液和浆 |
| JP2020132479A (ja) * | 2019-02-21 | 2020-08-31 | 三菱ケミカル株式会社 | シリカ粒子、シリカゾル、研磨組成物、研磨方法、半導体ウェハの製造方法及び半導体デバイスの製造方法 |
| CN114667593A (zh) * | 2019-11-15 | 2022-06-24 | Jsr株式会社 | 化学机械研磨用组合物以及化学机械研磨方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006287207A (ja) * | 2005-03-09 | 2006-10-19 | Jsr Corp | 化学機械研磨用水系分散体および化学機械研磨方法、ならびに化学機械研磨用水系分散体を調製するためのキット |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2007060869A1 (ja) * | 2005-11-24 | 2009-05-07 | Jsr株式会社 | 化学機械研磨用水系分散体および化学機械研磨方法 |
| US8157877B2 (en) * | 2005-12-16 | 2012-04-17 | Jsr Corporation | Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method, and kit for preparing chemical mechanical polishing aqueous dispersion |
-
2008
- 2008-06-24 JP JP2009530015A patent/JPWO2009028256A1/ja active Pending
- 2008-06-24 WO PCT/JP2008/061428 patent/WO2009028256A1/ja not_active Ceased
- 2008-07-21 TW TW097127579A patent/TW200919568A/zh unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006287207A (ja) * | 2005-03-09 | 2006-10-19 | Jsr Corp | 化学機械研磨用水系分散体および化学機械研磨方法、ならびに化学機械研磨用水系分散体を調製するためのキット |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101906346A (zh) * | 2009-06-02 | 2010-12-08 | 日信化学工业株式会社 | 水性切削液和浆 |
| JP2011012249A (ja) * | 2009-06-02 | 2011-01-20 | Nisshin Chem Ind Co Ltd | 水性切削液及び水性切削剤 |
| JP2020132479A (ja) * | 2019-02-21 | 2020-08-31 | 三菱ケミカル株式会社 | シリカ粒子、シリカゾル、研磨組成物、研磨方法、半導体ウェハの製造方法及び半導体デバイスの製造方法 |
| CN114667593A (zh) * | 2019-11-15 | 2022-06-24 | Jsr株式会社 | 化学机械研磨用组合物以及化学机械研磨方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200919568A (en) | 2009-05-01 |
| JPWO2009028256A1 (ja) | 2010-11-25 |
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