WO2009019943A1 - 測定装置およびプログラム - Google Patents

測定装置およびプログラム Download PDF

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Publication number
WO2009019943A1
WO2009019943A1 PCT/JP2008/062000 JP2008062000W WO2009019943A1 WO 2009019943 A1 WO2009019943 A1 WO 2009019943A1 JP 2008062000 W JP2008062000 W JP 2008062000W WO 2009019943 A1 WO2009019943 A1 WO 2009019943A1
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
transmission device
modulation signal
ofdm modulation
power
Prior art date
Application number
PCT/JP2008/062000
Other languages
English (en)
French (fr)
Inventor
Taro Osumi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009526369A priority Critical patent/JP5087623B2/ja
Priority to DE112008001994T priority patent/DE112008001994T5/de
Publication of WO2009019943A1 publication Critical patent/WO2009019943A1/ja
Priority to US12/700,701 priority patent/US8243838B2/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
    • H04B17/102—Power radiated at antenna
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/26—Systems using multi-frequency codes
    • H04L27/2601—Multicarrier modulation systems

Abstract

　送信デバイスから出力されるＯＦＤＭ変調信号の電力を測定する測定装置であって、繰返し期間毎に所定波形を繰り返すＯＦＤＭ変調信号を送信デバイスから出力させる出力制御部と、送信デバイスにより出力されたＯＦＤＭ変調信号の、繰返し期間の整数倍に対応する測定期間の電力を測定する電力測定部とを備える測定装置を提供する。出力制御部は、パイロット信号のサブキャリア方向およびＯＦＤＭシンボル方向の配置が同一となる期間を、繰返し期間としたＯＦＤＭ変調信号を、送信デバイスから出力させてよい。
PCT/JP2008/062000 2007-08-08 2008-07-02 測定装置およびプログラム WO2009019943A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009526369A JP5087623B2 (ja) 2007-08-08 2008-07-02 測定装置およびプログラム
DE112008001994T DE112008001994T5 (de) 2007-08-08 2008-07-02 Messgerät und Programm
US12/700,701 US8243838B2 (en) 2007-08-08 2010-02-04 Test apparatus and program

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007207066 2007-08-08
JP2007-207066 2007-08-08

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/700,701 Continuation US8243838B2 (en) 2007-08-08 2010-02-04 Test apparatus and program

Publications (1)

Publication Number Publication Date
WO2009019943A1 true WO2009019943A1 (ja) 2009-02-12

Family

ID=40341179

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/062000 WO2009019943A1 (ja) 2007-08-08 2008-07-02 測定装置およびプログラム

Country Status (4)

Country Link
US (1) US8243838B2 (ja)
JP (1) JP5087623B2 (ja)
DE (1) DE112008001994T5 (ja)
WO (1) WO2009019943A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8983395B2 (en) * 2011-12-12 2015-03-17 Apple Inc. Methods and apparatus for testing radio-frequency power amplifier performance
US9448280B2 (en) 2012-02-29 2016-09-20 International Business Machines Corporation Circuit test system and method using a wideband multi-tone test signal
EP3132550B1 (en) * 2014-04-17 2022-06-08 CommScope Technologies LLC Detecting traffic load for a telecommunications system using narrowband signal monitoring

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005136740A (ja) * 2003-10-30 2005-05-26 Tektronix Japan Ltd デジタル変調信号伝送回路の測定方法
JP2005217963A (ja) * 2004-01-30 2005-08-11 Anritsu Corp Ｏｆｄｍ変調信号のシンボルレート誤差測定装置
WO2006001184A1 (ja) * 2004-06-23 2006-01-05 Nec Corporation 確率密度関数で重み付けした積分処理を用いた線形性評価方法と、それを用いた回路シミュレータ、評価装置、通信回路、およびプログラム
WO2007072653A1 (ja) * 2005-12-21 2007-06-28 Advantest Corporation 測定装置、測定方法、測定プログラムおよび記録媒体
WO2007077686A1 (ja) * 2005-12-28 2007-07-12 Advantest Corporation 測定装置、測定方法、及び試験装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000206160A (ja) 1998-11-11 2000-07-28 Advantest Corp 電力測定装置、電力測定結果表示装置、方法および電力測定プログラム、電力測定結果表示プログラムを記録した記録媒体
JP2002206160A (ja) 2001-01-09 2002-07-26 Sumitomo Electric Ind Ltd 薄膜製造装置、薄膜形成方法および薄膜製造装置用部材
US7218948B2 (en) * 2003-02-24 2007-05-15 Qualcomm Incorporated Method of transmitting pilot tones in a multi-sector cell, including null pilot tones, for generating channel quality indicators
JP2007529160A (ja) * 2003-10-15 2007-10-18 松下電器産業株式会社 ダイバーシティ受信装置およびそれを用いた無線受信装置
US7412618B2 (en) * 2005-02-11 2008-08-12 International Business Machines Corporation Combined alignment scrambler function for elastic interface
JP2007207066A (ja) 2006-02-03 2007-08-16 Sharp Corp コンテンツ送受信システムおよびコンテンツ送受信方法
JP4649353B2 (ja) * 2006-03-17 2011-03-09 株式会社東芝 Ｏｆｄｍ信号の送信方法、ｏｆｄｍ送信機及びｏｆｄｍ受信機
EP2012453A4 (en) 2006-04-27 2011-01-05 Mitsubishi Electric Corp METHOD FOR COMPOSING A PREAMBLE

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005136740A (ja) * 2003-10-30 2005-05-26 Tektronix Japan Ltd デジタル変調信号伝送回路の測定方法
JP2005217963A (ja) * 2004-01-30 2005-08-11 Anritsu Corp Ｏｆｄｍ変調信号のシンボルレート誤差測定装置
WO2006001184A1 (ja) * 2004-06-23 2006-01-05 Nec Corporation 確率密度関数で重み付けした積分処理を用いた線形性評価方法と、それを用いた回路シミュレータ、評価装置、通信回路、およびプログラム
WO2007072653A1 (ja) * 2005-12-21 2007-06-28 Advantest Corporation 測定装置、測定方法、測定プログラムおよび記録媒体
WO2007077686A1 (ja) * 2005-12-28 2007-07-12 Advantest Corporation 測定装置、測定方法、及び試験装置

Also Published As

Publication number Publication date
JP5087623B2 (ja) 2012-12-05
DE112008001994T5 (de) 2010-06-10
US8243838B2 (en) 2012-08-14
JPWO2009019943A1 (ja) 2010-10-28
US20100215089A1 (en) 2010-08-26

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