WO2008155843A1 - 雑音測定装置及び試験装置 - Google Patents

雑音測定装置及び試験装置 Download PDF

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Publication number
WO2008155843A1
WO2008155843A1 PCT/JP2007/062443 JP2007062443W WO2008155843A1 WO 2008155843 A1 WO2008155843 A1 WO 2008155843A1 JP 2007062443 W JP2007062443 W JP 2007062443W WO 2008155843 A1 WO2008155843 A1 WO 2008155843A1
Authority
WO
WIPO (PCT)
Prior art keywords
noise
oscillation signal
measurement device
measured point
transmission line
Prior art date
Application number
PCT/JP2007/062443
Other languages
English (en)
French (fr)
Inventor
Toshiyuki Okayasu
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to KR1020097024093A priority Critical patent/KR101102015B1/ko
Priority to JP2009520197A priority patent/JP5161878B2/ja
Priority to DE112007003552T priority patent/DE112007003552T5/de
Priority to PCT/JP2007/062443 priority patent/WO2008155843A1/ja
Publication of WO2008155843A1 publication Critical patent/WO2008155843A1/ja
Priority to US12/642,676 priority patent/US8390268B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)

Abstract

　被測定箇所における雑音を測定する雑音測定装置であって、被測定箇所に設けられ、各サイクルにおける被測定箇所の雑音が順次蓄積された発振信号を出力する自励発振器と、自励発振器が出力する発振信号を伝送する伝送路と、伝送路が伝送した発振信号に印加された雑音を測定する測定器とを備える雑音測定装置を提供する。測定器は、伝送路が伝送した発振信号に印加された雑音を微分して、被測定箇所における雑音を測定してよい。
PCT/JP2007/062443 2007-06-20 2007-06-20 雑音測定装置及び試験装置 WO2008155843A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020097024093A KR101102015B1 (ko) 2007-06-20 2007-06-20 잡음 측정 장치 및 시험 장치
JP2009520197A JP5161878B2 (ja) 2007-06-20 2007-06-20 雑音測定装置及び試験装置
DE112007003552T DE112007003552T5 (de) 2007-06-20 2007-06-20 Störungsmessgerät und Prüfgerät
PCT/JP2007/062443 WO2008155843A1 (ja) 2007-06-20 2007-06-20 雑音測定装置及び試験装置
US12/642,676 US8390268B2 (en) 2007-06-20 2009-12-18 Noise measurement apparatus and test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/062443 WO2008155843A1 (ja) 2007-06-20 2007-06-20 雑音測定装置及び試験装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/642,676 Continuation US8390268B2 (en) 2007-06-20 2009-12-18 Noise measurement apparatus and test apparatus

Publications (1)

Publication Number Publication Date
WO2008155843A1 true WO2008155843A1 (ja) 2008-12-24

Family

ID=40156009

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/062443 WO2008155843A1 (ja) 2007-06-20 2007-06-20 雑音測定装置及び試験装置

Country Status (5)

Country Link
US (1) US8390268B2 (ja)
JP (1) JP5161878B2 (ja)
KR (1) KR101102015B1 (ja)
DE (1) DE112007003552T5 (ja)
WO (1) WO2008155843A1 (ja)

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ITBO20120713A1 (it) * 2011-12-30 2013-07-01 Selex Sistemi Integrati Spa Metodo e sistema di stima del rumore di uno stato entangled a due fotoni
CN104764923B (zh) * 2015-03-18 2018-07-06 广东顺德中山大学卡内基梅隆大学国际联合研究院 一种测量交流干扰幅度的方法
US10295583B2 (en) * 2015-04-16 2019-05-21 Taiwan Semiconductor Manufacturing Company, Ltd. Circuit for measuring flicker noise and method of using the same
US9667219B2 (en) * 2015-04-22 2017-05-30 The Regents Of The University Of California Phase noise measurement and filtering circuit
US9743206B2 (en) 2015-06-22 2017-08-22 Audyssey Laboratories, Inc. Background noise measurement from a repeated stimulus measurement system
US10680585B2 (en) * 2018-04-09 2020-06-09 Ciena Corporation Techniques and circuits for time-interleaved injection locked voltage controlled oscillators with jitter accumulation reset
TWI801878B (zh) * 2020-05-28 2023-05-11 台灣積體電路製造股份有限公司 阻抗測量裝置以及決定待測裝置的阻抗之系統和方法
US11740272B2 (en) * 2020-05-28 2023-08-29 Taiwan Semiconductor Manufacturing Company, Ltd. Integrated impedance measurement device and impedance measurement method thereof
KR20220005333A (ko) 2020-07-06 2022-01-13 에스케이하이닉스 주식회사 메모리 장치의 인터피어런스 측정 방법
US11874312B1 (en) * 2022-11-22 2024-01-16 Rohde & Schwarz Gmbh & Co. Kg Phase noise measurement method and measurement system

Citations (2)

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JPH06303157A (ja) * 1993-02-26 1994-10-28 Nokia Technol Gmbh 雑音検出器信号生成装置
WO2005020324A1 (ja) * 2003-08-22 2005-03-03 The New Industry Reserch Organization 半導体集積回路の雑音検出及び測定回路

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US2700133A (en) * 1951-04-25 1955-01-18 Bell Telephone Labor Inc Measurement of relative delay of wave envelopes
US5434509A (en) * 1992-07-30 1995-07-18 Blades; Frederick K. Method and apparatus for detecting arcing in alternating-current power systems by monitoring high-frequency noise
US5434385A (en) * 1992-11-02 1995-07-18 International Business Machines Corporation Dual channel D.C. low noise measurement system and test methodology
US5970429A (en) * 1997-08-08 1999-10-19 Lucent Technologies, Inc. Method and apparatus for measuring electrical noise in devices
JPH11344510A (ja) 1998-06-02 1999-12-14 Advantest Corp プローブカード、プローブ及び半導体試験装置
JP4694681B2 (ja) * 1999-11-26 2011-06-08 セイコーインスツル株式会社 超音波モータ及び超音波モータ付き電子機器
US7035324B2 (en) * 2001-08-01 2006-04-25 Agilent Technologies, Inc. Phase-noise measurement with compensation for phase noise contributed by spectrum analyzer
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JP3925160B2 (ja) * 2001-10-31 2007-06-06 セイコーエプソン株式会社 ノイズ検出装置および半導体集積回路
KR20030044105A (ko) * 2001-11-28 2003-06-09 엘지이노텍 주식회사 위상 잡음 측정장치
JP4070725B2 (ja) * 2004-01-21 2008-04-02 ファナック株式会社 ノイズ検出機能を備える電子機器
US7724103B2 (en) * 2007-02-13 2010-05-25 California Institute Of Technology Ultra-high frequency self-sustaining oscillators, coupled oscillators, voltage-controlled oscillators, and oscillator arrays based on vibrating nanoelectromechanical resonators

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06303157A (ja) * 1993-02-26 1994-10-28 Nokia Technol Gmbh 雑音検出器信号生成装置
WO2005020324A1 (ja) * 2003-08-22 2005-03-03 The New Industry Reserch Organization 半導体集積回路の雑音検出及び測定回路

Also Published As

Publication number Publication date
KR101102015B1 (ko) 2012-01-04
DE112007003552T5 (de) 2010-06-10
JPWO2008155843A1 (ja) 2010-08-26
JP5161878B2 (ja) 2013-03-13
US8390268B2 (en) 2013-03-05
US20100148751A1 (en) 2010-06-17
KR20100005135A (ko) 2010-01-13

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