WO2008139507A1 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
WO2008139507A1
WO2008139507A1 PCT/JP2007/000493 JP2007000493W WO2008139507A1 WO 2008139507 A1 WO2008139507 A1 WO 2008139507A1 JP 2007000493 W JP2007000493 W JP 2007000493W WO 2008139507 A1 WO2008139507 A1 WO 2008139507A1
Authority
WO
WIPO (PCT)
Prior art keywords
time convergence
optical element
ion
free flight
flight space
Prior art date
Application number
PCT/JP2007/000493
Other languages
English (en)
French (fr)
Inventor
Masaru Nishiguchi
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to CN2007800529051A priority Critical patent/CN101669188B/zh
Priority to US12/599,074 priority patent/US8013292B2/en
Priority to PCT/JP2007/000493 priority patent/WO2008139507A1/ja
Priority to JP2009513853A priority patent/JP4883177B2/ja
Publication of WO2008139507A1 publication Critical patent/WO2008139507A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

　１周の周回軌道は同一の２つの時間収束単位構造（Ｔ１、Ｔ２）により形成される。時間収束単位構造（Ｔ１及びＴ２）は入射側に時間収束点（Ｐ１）、出射側に時間収束点（Ｐ２）を有し、イオンを略円弧形状に飛行させる基本イオン光学要素（１０）の前に長さＬ１の入射側自由飛行空間（１１）、後に長さＬ２の出射側自由飛行空間（１２）を持つ。外部から周回軌道にイオンを導入するために、同一構成の基本イオン光学要素（３０）をその出射端と基本イオン光学要素（１０）の入射端との距離がＬ１’となるように入射側自由空間（１１）中に挿入する。そして、基本イオン光学要素（３０）にイオンを入射する自由飛行空間の長さＬ０を、Ｌ０＝２（Ｌ１＋Ｌ２）－（Ｌ１’＋Ｌ２）で求まる値に設定する。これにより、出発点（Ｐｓ）から出射したイオンは時間収束点（Ｐ２）に達したときに時間収束性が担保される。
PCT/JP2007/000493 2007-05-09 2007-05-09 質量分析装置 WO2008139507A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2007800529051A CN101669188B (zh) 2007-05-09 2007-05-09 质谱分析装置
US12/599,074 US8013292B2 (en) 2007-05-09 2007-05-09 Mass spectrometer
PCT/JP2007/000493 WO2008139507A1 (ja) 2007-05-09 2007-05-09 質量分析装置
JP2009513853A JP4883177B2 (ja) 2007-05-09 2007-05-09 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/000493 WO2008139507A1 (ja) 2007-05-09 2007-05-09 質量分析装置

Publications (1)

Publication Number Publication Date
WO2008139507A1 true WO2008139507A1 (ja) 2008-11-20

Family

ID=40001745

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/000493 WO2008139507A1 (ja) 2007-05-09 2007-05-09 質量分析装置

Country Status (4)

Country Link
US (1) US8013292B2 (ja)
JP (1) JP4883177B2 (ja)
CN (1) CN101669188B (ja)
WO (1) WO2008139507A1 (ja)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4980583B2 (ja) * 2004-05-21 2012-07-18 日本電子株式会社 飛行時間型質量分析方法及び装置
US8026480B2 (en) * 2007-05-22 2011-09-27 Shimadzu Corporation Mass spectrometer
WO2009066354A1 (ja) * 2007-11-21 2009-05-28 Shimadzu Corporation 質量分析装置
WO2010041296A1 (ja) * 2008-10-09 2010-04-15 株式会社島津製作所 質量分析装置
CN102446693B (zh) * 2011-11-29 2016-04-06 邱永红 一种带电粒子的加速方法及其应用
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
US9761431B2 (en) * 2015-09-21 2017-09-12 NOAA Technology Partnerships Office System and methodology for expressing ion path in a time-of-flight mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ACCELERATOR FOR MASS SPECTROMETERS WITH MULTIPASSES
EP3662501A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion mirror for multi-reflecting mass spectrometers
CN111164731B (zh) 2017-08-06 2022-11-18 英国质谱公司 进入多通道质谱分析仪的离子注入
WO2019030473A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov FIELDS FOR SMART REFLECTIVE TOF SM
WO2019030475A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov MASS SPECTROMETER WITH MULTIPASSAGE
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006228435A (ja) * 2005-02-15 2006-08-31 Shimadzu Corp 飛行時間型質量分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8512253D0 (en) * 1985-05-15 1985-06-19 Vg Instr Group Double focussing mass spectrometers
JP4151926B2 (ja) 1997-10-28 2008-09-17 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JPH11135060A (ja) * 1997-10-31 1999-05-21 Jeol Ltd 飛行時間型質量分析計
JP4569349B2 (ja) * 2005-03-29 2010-10-27 株式会社島津製作所 飛行時間型質量分析装置
JP4939138B2 (ja) * 2006-07-20 2012-05-23 株式会社島津製作所 質量分析装置用イオン光学系の設計方法
US8026480B2 (en) * 2007-05-22 2011-09-27 Shimadzu Corporation Mass spectrometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006228435A (ja) * 2005-02-15 2006-08-31 Shimadzu Corp 飛行時間型質量分析装置

Also Published As

Publication number Publication date
JP4883177B2 (ja) 2012-02-22
CN101669188B (zh) 2011-09-07
CN101669188A (zh) 2010-03-10
US20100140469A1 (en) 2010-06-10
JPWO2008139507A1 (ja) 2010-07-29
US8013292B2 (en) 2011-09-06

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