WO2008114789A1 - 測定装置 - Google Patents

測定装置 Download PDF

Info

Publication number
WO2008114789A1
WO2008114789A1 PCT/JP2008/054960 JP2008054960W WO2008114789A1 WO 2008114789 A1 WO2008114789 A1 WO 2008114789A1 JP 2008054960 W JP2008054960 W JP 2008054960W WO 2008114789 A1 WO2008114789 A1 WO 2008114789A1
Authority
WO
WIPO (PCT)
Prior art keywords
channel
solution
liquid
measuring apparatus
supplied
Prior art date
Application number
PCT/JP2008/054960
Other languages
English (en)
French (fr)
Inventor
Yasunobu Sakaguchi
Original Assignee
Fujifilm Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corporation filed Critical Fujifilm Corporation
Priority to US12/531,663 priority Critical patent/US20100107781A1/en
Priority to EP08722354A priority patent/EP2133685A1/en
Publication of WO2008114789A1 publication Critical patent/WO2008114789A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/05—Flow-through cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/11—Filling or emptying of cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Optical Measuring Cells (AREA)

Abstract

　少ない液量で流路内の溶液を入れ替えることができる測定装置を提供する。 　液体が流通可能に流路が形成されると共に、流路内の壁面に測定対象とする検体物質が付着された流路部材の流路内の溶液を入れ替える場合に、流路に対して溶液を、第１速度で流路の容量に相当する所定量供給した後、流路内の壁面近傍の溶液が当該液体流路の断面の中央部へ拡散するのに応じた所定期間供給を停止し、その後、第３速度で供給する。
PCT/JP2008/054960 2007-03-19 2008-03-18 測定装置 WO2008114789A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/531,663 US20100107781A1 (en) 2007-03-19 2008-03-18 Measurement apparatus
EP08722354A EP2133685A1 (en) 2007-03-19 2008-03-18 Measuring apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007071024A JP2008232743A (ja) 2007-03-19 2007-03-19 測定装置
JP2007-071024 2007-03-19

Publications (1)

Publication Number Publication Date
WO2008114789A1 true WO2008114789A1 (ja) 2008-09-25

Family

ID=39765896

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054960 WO2008114789A1 (ja) 2007-03-19 2008-03-18 測定装置

Country Status (4)

Country Link
US (1) US20100107781A1 (ja)
EP (1) EP2133685A1 (ja)
JP (1) JP2008232743A (ja)
WO (1) WO2008114789A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9782855B2 (en) * 2013-06-11 2017-10-10 Fundació Institut De Ciències Fotòniques Protective structure for tables and optical table comprising said protective structure

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003114229A (ja) * 2001-10-03 2003-04-18 Mitsubishi Chemicals Corp マイクロチャネルチップ，マイクロチャネルチップを使用した測定装置及び測定方法
JP2005134372A (ja) * 2003-10-06 2005-05-26 Matsushita Electric Ind Co Ltd 被検物質測定装置
JP2006098369A (ja) 2004-09-30 2006-04-13 Fuji Photo Film Co Ltd 全反射減衰を利用した測定方法および測定装置
JP2007040746A (ja) * 2005-08-01 2007-02-15 Fujifilm Corp 全反射減衰を利用した分析における反応速度係数の測定方法
JP2007064942A (ja) * 2005-09-02 2007-03-15 Fujifilm Holdings Corp 分注装置
JP2007071024A (ja) 2005-09-02 2007-03-22 Mitsubishi Motors Corp 内燃機関の排気浄化装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003114229A (ja) * 2001-10-03 2003-04-18 Mitsubishi Chemicals Corp マイクロチャネルチップ，マイクロチャネルチップを使用した測定装置及び測定方法
JP2005134372A (ja) * 2003-10-06 2005-05-26 Matsushita Electric Ind Co Ltd 被検物質測定装置
JP2006098369A (ja) 2004-09-30 2006-04-13 Fuji Photo Film Co Ltd 全反射減衰を利用した測定方法および測定装置
JP2007040746A (ja) * 2005-08-01 2007-02-15 Fujifilm Corp 全反射減衰を利用した分析における反応速度係数の測定方法
JP2007064942A (ja) * 2005-09-02 2007-03-15 Fujifilm Holdings Corp 分注装置
JP2007071024A (ja) 2005-09-02 2007-03-22 Mitsubishi Motors Corp 内燃機関の排気浄化装置

Also Published As

Publication number Publication date
US20100107781A1 (en) 2010-05-06
EP2133685A1 (en) 2009-12-16
JP2008232743A (ja) 2008-10-02

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