WO2008111390A1 - 走査プローブ顕微鏡およびこれを用いた試料の観察方法 - Google Patents
走査プローブ顕微鏡およびこれを用いた試料の観察方法 Download PDFInfo
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- WO2008111390A1 WO2008111390A1 PCT/JP2008/053268 JP2008053268W WO2008111390A1 WO 2008111390 A1 WO2008111390 A1 WO 2008111390A1 JP 2008053268 W JP2008053268 W JP 2008053268W WO 2008111390 A1 WO2008111390 A1 WO 2008111390A1
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- probe
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
開口プローブを用いた近接場走査顕微鏡では実用上数十nmの開口形成が限界であり、また散乱プローブを用いた近接場走査顕微鏡では外部照明光が背景雑音となり、数十ナノメートルが分解能の限界であった。またプローブの損傷や磨耗により測定再現性が著しく低かった。ナノメートルオーダの円筒形構造とナノメートルオーダの微小粒子を組み合わせて、ナノメートルオーダの光学分機能を有するプラズモン増強近接場プローブを構成し、試料上の各測定点で低接触力での接近・退避を繰り返すことにより、プローブと試料の双方にダメージを与えることなく、ナノメートルオーダの分解能でかつ高い再現性で、試料表面の光学情報及び凹凸情報を測定する。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/523,369 US8272068B2 (en) | 2007-03-12 | 2008-02-26 | Scanning probe microscope and sample observing method using the same |
US13/586,754 US8695110B2 (en) | 2007-03-12 | 2012-08-15 | Scanning probe microscope and sample observing method using the same |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007061201 | 2007-03-12 | ||
JP2007-061201 | 2007-03-12 | ||
JP2007-322722 | 2007-12-14 | ||
JP2007322722A JP5033609B2 (ja) | 2007-03-12 | 2007-12-14 | 走査プローブ顕微鏡およびこれを用いた試料の観察方法 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/523,369 A-371-Of-International US8272068B2 (en) | 2007-03-12 | 2008-02-26 | Scanning probe microscope and sample observing method using the same |
US13/586,754 Division US8695110B2 (en) | 2007-03-12 | 2012-08-15 | Scanning probe microscope and sample observing method using the same |
Publications (1)
Publication Number | Publication Date |
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WO2008111390A1 true WO2008111390A1 (ja) | 2008-09-18 |
Family
ID=39759332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/053268 WO2008111390A1 (ja) | 2007-03-12 | 2008-02-26 | 走査プローブ顕微鏡およびこれを用いた試料の観察方法 |
Country Status (1)
Country | Link |
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WO (1) | WO2008111390A1 (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10325840A (ja) * | 1997-05-23 | 1998-12-08 | Seiko Instr Inc | 偏光を利用した走査型近視野顕微鏡 |
JP2002267590A (ja) * | 2001-03-14 | 2002-09-18 | Ricoh Co Ltd | 近接場光用のプローブ及びその作製方法、並びに近接場光学顕微鏡、光メモリの情報記録再生方式 |
JP2005249588A (ja) * | 2004-03-04 | 2005-09-15 | Toyota Motor Corp | 近接場分光分析装置 |
WO2006113192A2 (en) * | 2005-04-06 | 2006-10-26 | Drexel University | Functional nanoparticle filled carbon nanotubes and methods of their production |
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2008
- 2008-02-26 WO PCT/JP2008/053268 patent/WO2008111390A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10325840A (ja) * | 1997-05-23 | 1998-12-08 | Seiko Instr Inc | 偏光を利用した走査型近視野顕微鏡 |
JP2002267590A (ja) * | 2001-03-14 | 2002-09-18 | Ricoh Co Ltd | 近接場光用のプローブ及びその作製方法、並びに近接場光学顕微鏡、光メモリの情報記録再生方式 |
JP2005249588A (ja) * | 2004-03-04 | 2005-09-15 | Toyota Motor Corp | 近接場分光分析装置 |
WO2006113192A2 (en) * | 2005-04-06 | 2006-10-26 | Drexel University | Functional nanoparticle filled carbon nanotubes and methods of their production |
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