WO2008107959A1 - トレイ交換方法 - Google Patents
トレイ交換方法 Download PDFInfo
- Publication number
- WO2008107959A1 WO2008107959A1 PCT/JP2007/054063 JP2007054063W WO2008107959A1 WO 2008107959 A1 WO2008107959 A1 WO 2008107959A1 JP 2007054063 W JP2007054063 W JP 2007054063W WO 2008107959 A1 WO2008107959 A1 WO 2008107959A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- tray
- stocker
- set plate
- transportation unit
- replacement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/054063 WO2008107959A1 (ja) | 2007-03-02 | 2007-03-02 | トレイ交換方法 |
TW097103674A TW200843020A (en) | 2007-03-02 | 2008-01-31 | Method for replacing tray |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/054063 WO2008107959A1 (ja) | 2007-03-02 | 2007-03-02 | トレイ交換方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008107959A1 true WO2008107959A1 (ja) | 2008-09-12 |
Family
ID=39737864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/054063 WO2008107959A1 (ja) | 2007-03-02 | 2007-03-02 | トレイ交換方法 |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200843020A (zh) |
WO (1) | WO2008107959A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11009860B2 (en) * | 2018-03-30 | 2021-05-18 | Panasonic Intellectual Property Management Co., Ltd. | Preparation schedule creating method and preparation schedule creating apparatus |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI800330B (zh) * | 2022-03-25 | 2023-04-21 | 鴻勁精密股份有限公司 | 置盤裝置及作業機 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297791A (ja) * | 1998-04-14 | 1999-10-29 | Advantest Corp | トレイ移送アーム及びこれを用いたトレイの移載装置、ic試験装置並びにトレイの取り廻し方法 |
JP2001356144A (ja) * | 2000-06-13 | 2001-12-26 | Advantest Corp | 電子部品試験装置 |
-
2007
- 2007-03-02 WO PCT/JP2007/054063 patent/WO2008107959A1/ja active Application Filing
-
2008
- 2008-01-31 TW TW097103674A patent/TW200843020A/zh unknown
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11297791A (ja) * | 1998-04-14 | 1999-10-29 | Advantest Corp | トレイ移送アーム及びこれを用いたトレイの移載装置、ic試験装置並びにトレイの取り廻し方法 |
JP2001356144A (ja) * | 2000-06-13 | 2001-12-26 | Advantest Corp | 電子部品試験装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11009860B2 (en) * | 2018-03-30 | 2021-05-18 | Panasonic Intellectual Property Management Co., Ltd. | Preparation schedule creating method and preparation schedule creating apparatus |
Also Published As
Publication number | Publication date |
---|---|
TW200843020A (en) | 2008-11-01 |
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