WO2008084600A1 - 波長特定方法および分析装置 - Google Patents

波長特定方法および分析装置 Download PDF

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Publication number
WO2008084600A1
WO2008084600A1 PCT/JP2007/072667 JP2007072667W WO2008084600A1 WO 2008084600 A1 WO2008084600 A1 WO 2008084600A1 JP 2007072667 W JP2007072667 W JP 2007072667W WO 2008084600 A1 WO2008084600 A1 WO 2008084600A1
Authority
WO
WIPO (PCT)
Prior art keywords
slope
identifying
wavelength
absorbance
photometer
Prior art date
Application number
PCT/JP2007/072667
Other languages
English (en)
French (fr)
Inventor
Osamu Okabayashi
Original Assignee
Olympus Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corporation filed Critical Olympus Corporation
Priority to EP07832396.1A priority Critical patent/EP2103922A4/en
Priority to CN2007800497811A priority patent/CN101583862B/zh
Publication of WO2008084600A1 publication Critical patent/WO2008084600A1/ja
Priority to US12/500,908 priority patent/US7961324B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/12—Condition responsive control

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　この発明にかかる分析装置１は、特定対象である波長を含む波長域に単調な傾斜をもった吸光度特性を有し、２種以上の濃度を持つ特定用試料に対して各吸光度を測定する測光部１９と、測光部１９によって測定された特定用試料の濃度と吸光度との関係を示す直線の傾きを求め、一つ以上の波長に対して予め求められた特定用試料の濃度と吸光度との関係を示す直線の傾きである基準傾きと演算した傾きとの一致度をもとに測光部１９が実際に測定する光の波長を特定する特定部３４とを備える。
PCT/JP2007/072667 2007-01-12 2007-11-22 波長特定方法および分析装置 WO2008084600A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP07832396.1A EP2103922A4 (en) 2007-01-12 2007-11-22 Method for identifying wavelength and analytical apparatus
CN2007800497811A CN101583862B (zh) 2007-01-12 2007-11-22 波长确定方法以及分析装置
US12/500,908 US7961324B2 (en) 2007-01-12 2009-07-10 Wavelength identification method and analyzer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-004896 2007-01-12
JP2007004896A JP4884239B2 (ja) 2007-01-12 2007-01-12 波長特定方法および分析装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/500,908 Continuation US7961324B2 (en) 2007-01-12 2009-07-10 Wavelength identification method and analyzer

Publications (1)

Publication Number Publication Date
WO2008084600A1 true WO2008084600A1 (ja) 2008-07-17

Family

ID=39608498

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/072667 WO2008084600A1 (ja) 2007-01-12 2007-11-22 波長特定方法および分析装置

Country Status (5)

Country Link
US (1) US7961324B2 (ja)
EP (1) EP2103922A4 (ja)
JP (1) JP4884239B2 (ja)
CN (1) CN101583862B (ja)
WO (1) WO2008084600A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008170340A (ja) * 2007-01-12 2008-07-24 Olympus Corp 波長特定方法および分析装置
JP6038445B2 (ja) * 2010-12-03 2016-12-07 東芝メディカルシステムズ株式会社 自動分析装置
KR20170093336A (ko) * 2016-02-05 2017-08-16 삼성전자주식회사 검사장치 및 그 제어 방법
CN109270022B (zh) * 2018-09-14 2020-03-10 山东大学 一种近红外光谱模型的波段选择方法及模型构建方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0674823A (ja) 1992-08-27 1994-03-18 Kubota Corp 分光分析計の波長校正方法
JP2002518670A (ja) * 1998-06-12 2002-06-25 ラジオメーター・メディカル・アクティーゼルスカブ 分光光度計の品質制御法
JP2004132706A (ja) * 2002-10-08 2004-04-30 Arkray Inc 分析方法、分析装置およびこれの製造方法
JP2006162355A (ja) 2004-12-03 2006-06-22 Olympus Corp 装置組込み型光度計の波長確認方法及び自動分析装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG43422A1 (en) * 1995-10-10 1997-10-17 Air Liquide Method for stabilizing the wavelength in a laser spectrometer system
US6651015B2 (en) * 1999-11-23 2003-11-18 James Samsoondar Method for calibrating spectrophotometric apparatus
US6711516B2 (en) * 1999-11-23 2004-03-23 Spectromedical Inc. Method for calibrating spectrophotometric apparatus
US7122299B2 (en) * 2002-11-06 2006-10-17 Fuji Photo Film Co., Ltd. Silver halide photographic light-sensitive material
JP2009002864A (ja) * 2007-06-22 2009-01-08 Olympus Corp 分析装置および分析方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0674823A (ja) 1992-08-27 1994-03-18 Kubota Corp 分光分析計の波長校正方法
JP2002518670A (ja) * 1998-06-12 2002-06-25 ラジオメーター・メディカル・アクティーゼルスカブ 分光光度計の品質制御法
JP2004132706A (ja) * 2002-10-08 2004-04-30 Arkray Inc 分析方法、分析装置およびこれの製造方法
JP2006162355A (ja) 2004-12-03 2006-06-22 Olympus Corp 装置組込み型光度計の波長確認方法及び自動分析装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2103922A4 *

Also Published As

Publication number Publication date
EP2103922A4 (en) 2017-09-20
EP2103922A1 (en) 2009-09-23
CN101583862A (zh) 2009-11-18
US7961324B2 (en) 2011-06-14
US20100007886A1 (en) 2010-01-14
JP4884239B2 (ja) 2012-02-29
JP2008170339A (ja) 2008-07-24
CN101583862B (zh) 2011-04-06

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