WO2008019729A8 - Mikroskop mit interferometeranordnung zur durchlichtuntersuchung transparenter objekte mittels interferenzkontrast und polarisationskontrast - Google Patents

Mikroskop mit interferometeranordnung zur durchlichtuntersuchung transparenter objekte mittels interferenzkontrast und polarisationskontrast

Info

Publication number
WO2008019729A8
WO2008019729A8 PCT/EP2007/005720 EP2007005720W WO2008019729A8 WO 2008019729 A8 WO2008019729 A8 WO 2008019729A8 EP 2007005720 W EP2007005720 W EP 2007005720W WO 2008019729 A8 WO2008019729 A8 WO 2008019729A8
Authority
WO
WIPO (PCT)
Prior art keywords
contrast
interferometer
transmitted light
microscope
polarization
Prior art date
Application number
PCT/EP2007/005720
Other languages
English (en)
French (fr)
Other versions
WO2008019729A1 (de
Inventor
Daniel Martin Mahlmann
Original Assignee
Rwth Aachen
Daniel Martin Mahlmann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rwth Aachen, Daniel Martin Mahlmann filed Critical Rwth Aachen
Publication of WO2008019729A1 publication Critical patent/WO2008019729A1/de
Publication of WO2008019729A8 publication Critical patent/WO2008019729A8/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Abstract

Die Erfindung betrifft ein Mikroskop zur Durchlichtuntersuchung von Objekten mit einem Strahlengang zwischen einer Beleuchtungsvorrichtung und einer Vorrichtung zur Betrachtung/Erfassung eines Objektbildes, insbesondere einer Kamera, bei dem im Strahlengang ein Interferometer angeordnet ist, welches Mittel zur Veränderung der Polarisation (4) und davon unabhängige Mittel zur Veränderung der relativen Phase (6) in wenigstens einem der Teilstrahlen (II) des Interferometers aufweist. Die Erfindung betrifft weiterhin ein Verfahren zur Durchlichtmikroskopie von Objekten (8, 9), bei dem der Strahlengang zwischen einer Beleuchtungsvorrichtung (1 ) und einer Vorrichtung (15) zur Betrachtung/Erfassung eines Objektbildes durch ein Interferometer (II, III) führt, wobei wenigstens ein Abbild eines Objektes (8, 9), insbesondere eine Serie von Abbildern mittels einer Kamera (15) aufgenommen wird, insbesondere in Abhängigkeit von einer Lage der Polarisation und/oder der Phase des Lichtes in wenigstens einem der Teilstrahlen (II, III) des Interferometers.
PCT/EP2007/005720 2006-08-17 2007-06-28 Mikroskop mit interferometeranordnung zur durchlichtuntersuchung transparenter objekte mittels interferenzkontrast und polarisationskontrast WO2008019729A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006038633.7 2006-08-17
DE200610038633 DE102006038633A1 (de) 2006-08-17 2006-08-17 Mikroskop und Verfahren zur Durchlichtuntersuchung von Objekten

Publications (2)

Publication Number Publication Date
WO2008019729A1 WO2008019729A1 (de) 2008-02-21
WO2008019729A8 true WO2008019729A8 (de) 2008-05-29

Family

ID=38521437

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2007/005720 WO2008019729A1 (de) 2006-08-17 2007-06-28 Mikroskop mit interferometeranordnung zur durchlichtuntersuchung transparenter objekte mittels interferenzkontrast und polarisationskontrast

Country Status (2)

Country Link
DE (1) DE102006038633A1 (de)
WO (1) WO2008019729A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102914256A (zh) * 2012-09-29 2013-02-06 哈尔滨工程大学 基于正交双光栅的同步移相干涉检测装置及检测方法
CN102914258A (zh) * 2012-09-29 2013-02-06 哈尔滨工程大学 基于正交双光栅的同步移相干涉显微检测装置及检测方法
CN102914257A (zh) * 2012-09-29 2013-02-06 哈尔滨工程大学 分光同步移相干涉显微检测装置及检测方法
DE102016219011A1 (de) * 2016-09-30 2018-04-05 Siemens Aktiengesellschaft Formbestimmung aus Polarisationsinformation

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB645464A (en) * 1948-06-07 1950-11-01 John St Leger Philpot Improvements in or relating to interference microscope
DD53890A1 (de) * 1964-08-04 1967-02-05 Hermann Beyer Einrichtung fur phasenmessungen an mikroskopischen objekten
DE1447212B2 (de) * 1964-08-08 1972-02-24 Jenoptik Jena GmbH, χ 6900 Jena Interferenzmikroskop zur messung von gangunterschieden an mikroskopischen objekten
PL68411A6 (de) * 1969-05-26 1973-02-28
US20020195548A1 (en) * 2001-06-06 2002-12-26 Dowski Edward Raymond Wavefront coding interference contrast imaging systems

Also Published As

Publication number Publication date
DE102006038633A1 (de) 2008-02-21
WO2008019729A1 (de) 2008-02-21

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