WO2006081519A3 - Procedes et appareil permettant d'ameliorer le fonctionnement de manipulateurs de supports de substrats - Google Patents
Procedes et appareil permettant d'ameliorer le fonctionnement de manipulateurs de supports de substrats Download PDFInfo
- Publication number
- WO2006081519A3 WO2006081519A3 PCT/US2006/003130 US2006003130W WO2006081519A3 WO 2006081519 A3 WO2006081519 A3 WO 2006081519A3 US 2006003130 W US2006003130 W US 2006003130W WO 2006081519 A3 WO2006081519 A3 WO 2006081519A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- tool
- methods
- substrate carrier
- carrier handlers
- specific carrier
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67769—Storage means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- General Factory Administration (AREA)
Abstract
Cette invention concerne des systèmes, des outils et des procédés selon lesquels un premier signal est envoyé d'un outil à un équipement de fabrication (Fab), lequel signal indique que tous les substrats à traiter ont été retirés d'un support spécifique et que le support spécifique peut être temporairement déchargé d'un port de chargement de l'outil. Un deuxième signal est envoyé de l'outil à l'équipement de fabrication, lequel deuxième signal indique que le support spécifique peut être renvoyé à l'outil. Tandis que le support est déchargé de l'outil, d'autres supports peuvent être chargés sur le port de chargement libéré. Cette invention porte également sur un grand nombre d'autres caractéristiques et aspects.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020067022889A KR101079487B1 (ko) | 2005-01-28 | 2006-01-27 | 기판 캐리어 핸들러의 향상된 동작을 위한 방법 및 장치 |
CN2006800002053A CN101273312B (zh) | 2005-01-28 | 2006-01-27 | 增强衬底载具搬运器操作的方法和装置 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US64883805P | 2005-01-28 | 2005-01-28 | |
US60/648,838 | 2005-01-28 | ||
US11/067,302 | 2005-02-25 | ||
US11/067,302 US20050209721A1 (en) | 2003-11-06 | 2005-02-25 | Methods and apparatus for enhanced operation of substrate carrier handlers |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006081519A2 WO2006081519A2 (fr) | 2006-08-03 |
WO2006081519A3 true WO2006081519A3 (fr) | 2007-02-01 |
Family
ID=36657280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/003130 WO2006081519A2 (fr) | 2005-01-28 | 2006-01-27 | Procedes et appareil permettant d'ameliorer le fonctionnement de manipulateurs de supports de substrats |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR101079487B1 (fr) |
CN (1) | CN101273312B (fr) |
TW (1) | TWI350812B (fr) |
WO (1) | WO2006081519A2 (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7720557B2 (en) | 2003-11-06 | 2010-05-18 | Applied Materials, Inc. | Methods and apparatus for enhanced operation of substrate carrier handlers |
JP2010115723A (ja) * | 2008-11-11 | 2010-05-27 | Seiko Epson Corp | ロボット及びロボットシステム |
JP5440518B2 (ja) | 2011-01-20 | 2014-03-12 | パナソニック株式会社 | 部品実装装置および部品実装装置における機種切替え方法 |
US9576834B2 (en) * | 2015-03-16 | 2017-02-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Stocker and method for dispatching wafer carrier in stocker |
CN106909129B (zh) * | 2017-02-23 | 2019-10-18 | 惠科股份有限公司 | 一种搬运管理的方法及系统 |
TWI695805B (zh) * | 2019-08-14 | 2020-06-11 | 力晶積成電子製造股份有限公司 | 貨物搬運系統及貨物搬運方法 |
CN115332128A (zh) * | 2022-10-14 | 2022-11-11 | 西安奕斯伟材料科技有限公司 | 晶圆载具管理系统及方法 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63234511A (ja) * | 1987-03-24 | 1988-09-29 | Nec Kyushu Ltd | 半導体基板処理装置 |
US5183378A (en) * | 1990-03-20 | 1993-02-02 | Tokyo Electron Sagami Limited | Wafer counter having device for aligning wafers |
JPH06132696A (ja) * | 1992-10-20 | 1994-05-13 | Tokico Ltd | 基板搬送装置 |
EP0850720A1 (fr) * | 1996-12-24 | 1998-07-01 | Datalogic S.P.A. | Procédé de fabrication d'un article |
WO1999028952A2 (fr) * | 1997-11-28 | 1999-06-10 | Fortrend Engineering Corporation | Interface de port de chargement a localisation de plaquettes |
US20020114684A1 (en) * | 2001-02-22 | 2002-08-22 | Gyu-Chan Jeong | Load port of a semiconductor manufacturing apparatus having integrated kinematic coupling pins and sensors, and method of loading wafers using the same |
US20030202866A1 (en) * | 2002-04-25 | 2003-10-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for identifying a wafer cassette |
US20040187342A1 (en) * | 2003-03-25 | 2004-09-30 | Dainippon Screen Mfg. Co., Ltd. | Substrate treating method and apparatus |
WO2005006408A1 (fr) * | 2003-07-11 | 2005-01-20 | Tec-Sem Ag | Dispositif de livraison pour des postes d'usinage de plaquettes |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100278600B1 (ko) * | 1998-01-14 | 2001-01-15 | 윤종용 | 반도체 제조설비 관리시스템의 설비유닛의 상태 관리방법 |
US7337019B2 (en) * | 2001-07-16 | 2008-02-26 | Applied Materials, Inc. | Integration of fault detection with run-to-run control |
JP3911624B2 (ja) * | 2001-11-30 | 2007-05-09 | 東京エレクトロン株式会社 | 処理システム |
-
2006
- 2006-01-27 WO PCT/US2006/003130 patent/WO2006081519A2/fr active Application Filing
- 2006-01-27 KR KR1020067022889A patent/KR101079487B1/ko not_active IP Right Cessation
- 2006-01-27 CN CN2006800002053A patent/CN101273312B/zh not_active Expired - Fee Related
- 2006-02-03 TW TW095103794A patent/TWI350812B/zh not_active IP Right Cessation
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63234511A (ja) * | 1987-03-24 | 1988-09-29 | Nec Kyushu Ltd | 半導体基板処理装置 |
US5183378A (en) * | 1990-03-20 | 1993-02-02 | Tokyo Electron Sagami Limited | Wafer counter having device for aligning wafers |
JPH06132696A (ja) * | 1992-10-20 | 1994-05-13 | Tokico Ltd | 基板搬送装置 |
EP0850720A1 (fr) * | 1996-12-24 | 1998-07-01 | Datalogic S.P.A. | Procédé de fabrication d'un article |
WO1999028952A2 (fr) * | 1997-11-28 | 1999-06-10 | Fortrend Engineering Corporation | Interface de port de chargement a localisation de plaquettes |
US20020114684A1 (en) * | 2001-02-22 | 2002-08-22 | Gyu-Chan Jeong | Load port of a semiconductor manufacturing apparatus having integrated kinematic coupling pins and sensors, and method of loading wafers using the same |
US20030202866A1 (en) * | 2002-04-25 | 2003-10-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for identifying a wafer cassette |
US20040187342A1 (en) * | 2003-03-25 | 2004-09-30 | Dainippon Screen Mfg. Co., Ltd. | Substrate treating method and apparatus |
WO2005006408A1 (fr) * | 2003-07-11 | 2005-01-20 | Tec-Sem Ag | Dispositif de livraison pour des postes d'usinage de plaquettes |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 013, no. 034 (E - 708) 25 January 1989 (1989-01-25) * |
PATENT ABSTRACTS OF JAPAN vol. 018, no. 425 (E - 1590) 9 August 1994 (1994-08-09) * |
Also Published As
Publication number | Publication date |
---|---|
KR20070097299A (ko) | 2007-10-04 |
TWI350812B (en) | 2011-10-21 |
KR101079487B1 (ko) | 2011-11-03 |
CN101273312A (zh) | 2008-09-24 |
CN101273312B (zh) | 2012-07-04 |
TW200635840A (en) | 2006-10-16 |
WO2006081519A2 (fr) | 2006-08-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2006081519A3 (fr) | Procedes et appareil permettant d'ameliorer le fonctionnement de manipulateurs de supports de substrats | |
WO2004051708A3 (fr) | Procede et dispositif d'usinage d'une tranche et tranche comprenant une couche de separation et un substrat | |
HK1144235A1 (en) | Method for picking up semiconductor chips from a wafer table and mounting the removed semiconductor chips on a substrate | |
WO2006023873A3 (fr) | Systeme de stockage temporaire et de chargement d'outils a elevateur | |
WO2010111632A3 (fr) | Procédé de singularisation par laser de boîtiers à puce sur des substrats de verre | |
WO2003090278A3 (fr) | Systeme double face d'evacuation de la chaleur | |
TW200629025A (en) | A method and system for intelligent automated reticle management | |
TW200729390A (en) | Method for making semiconductor wafer | |
WO2008008817A3 (fr) | inspection des bords et métrologie | |
TW200802823A (en) | Method for forming bit line contacts and bit lines during the formation of a semiconductor device, and devices and systems including the bit lines and bit line contacts | |
EP1469509A4 (fr) | Dispositif et procede pour traiter un substrat, et appareil de production de dispositifs a semiconducteurs | |
WO2007027436A3 (fr) | Traitement de tranches fines | |
WO2009102502A3 (fr) | Appareil et procédé pour une caractérisation de matériau sans contact de lot | |
TW200731380A (en) | Semiconductor wafer manufacturing method, semiconductor wafer double-sided grinding method, and semiconductor wafer double-sided grinding apparatus | |
WO2008014136A3 (fr) | Chambre de transfert octogonale | |
WO2008063337A3 (fr) | Dispositifs à semi-conducteur sur diamant et procédés associés | |
TW200729372A (en) | Apparatus and method for mounting electronic component | |
TW200735293A (en) | Semiconductor device, substrate and manufacturing method thereof | |
EP1429375A4 (fr) | Systeme et procede permettant d'effectuer un traitement semi-conducteur sur un substrat en cours de traitement | |
WO2009128786A3 (fr) | Système et procédé de découpage en dés de circuits intégrés | |
WO2008066885A3 (fr) | Procédé et système permettant de détecter l'existence d'une particule indésirable au cours de la fabrication d'un semi-conducteur | |
AU2003212469A1 (en) | Method for processing multiple semiconductor devices for test | |
WO2007024714A3 (fr) | Procede de modification de materiaux dielectriques | |
WO2003051581A3 (fr) | Procede et appareil de presentation de conteneurs, manipulateurs de conteneurs et equipement de manipulation de conteneurs | |
TW200701383A (en) | Systems and methods for tool monitoring |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 1020067022889 Country of ref document: KR Ref document number: 200680000205.3 Country of ref document: CN |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 06734024 Country of ref document: EP Kind code of ref document: A2 |