WO2005117418A1 - Low noise sample and hold circuit - Google Patents

Low noise sample and hold circuit Download PDF

Info

Publication number
WO2005117418A1
WO2005117418A1 PCT/US2005/014451 US2005014451W WO2005117418A1 WO 2005117418 A1 WO2005117418 A1 WO 2005117418A1 US 2005014451 W US2005014451 W US 2005014451W WO 2005117418 A1 WO2005117418 A1 WO 2005117418A1
Authority
WO
WIPO (PCT)
Prior art keywords
noise
image
signal
reset level
dark reference
Prior art date
Application number
PCT/US2005/014451
Other languages
French (fr)
Inventor
Weize Xu
Original Assignee
Eastman Kodak Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Company filed Critical Eastman Kodak Company
Priority to JP2007510932A priority Critical patent/JP4682191B2/en
Priority to EP05740906A priority patent/EP1741287A1/en
Priority to KR1020067022518A priority patent/KR101143094B1/en
Publication of WO2005117418A1 publication Critical patent/WO2005117418A1/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers

Definitions

  • the invention relates generally to the field of image sensors and, more particularly, to a method and apparatus for eliminating the unwanted noise generated from image sensors.
  • the present invention is directed to overcoming one or more of the problems set forth above.
  • the invention resides in an image sensor comprising (a) a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level; (b) a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image and reset level; and (c) a sample and hold circuit that reads out the image signal and cancels or substantially cancels out the noise from the image signal and reset level by canceling the noise from image and reset level with the noise generated from the dark reference pixels.
  • Fig. 1 is a top, view of an image sensor and its associated sample and hold circuit of the present invention
  • Fig. 2 is a detailed drawing of a pixel and its connections to the sample and hold circuit
  • Fig. 3 is a perspective view of a camera for illustrating a typical commercial embodiment for the image sensor of the present invention.
  • FIG. 1 there is shown an image sensor 10 having a plurality of pixels 20 arranged in a predetermined array.
  • a plurality of sample and hold circuits 30 is respectively connected to a row of pixels 20 of the image sensor 10 (one sample and hold circuit 30 for each column of pixels) for reading out the values sampled from the pixels 20.
  • the sample and hold circuit 30 also includes dark reference pixels 40 as will be discussed in detail hereinbelow.
  • An operational amplifier 50 is connected to the sample and hold circuits 30 for converting and amplifying the signals from the sample and hold circuits 30.
  • FIG. 2 there is shown a detailed drawing of a pixel 20 and its mated sample and hold circuit 30 of the present invention.
  • Each pixel 20 includes a photosensitive area, such as photodiode 60, that receives incident light (represented by the arrows) that is converted to charge packets.
  • a transfer gate 70 is selectively activated for transferring charge from photodiode 60 to a floating diffusion capacitor 80 that converts the charge to a voltage signal.
  • a reset gate 90 functions to drain the charge from the floating diffusion capacitor 80 for resetting the floating diffusion 80 to a predetermined charge level.
  • a source follower 100 transistor is connected to the floating diffusion capacitor 80 and functions to amplify the signal from the floating diffusion capacitor 80.
  • the row select switch 110 is activated for permitting the voltage signal representing the reset level of the floating diffusion capacitor 80 to be passed to the sample and hold circuit capacitor 120.
  • switches Si and S 3 are closed for charging the capacitor 120 to a level corresponding to the reset voltage level. Switches Si and S 3 are then closed.
  • the capacitors 120 and 130 store their signal as a charge as is well known in the art. The stored charge of the capacitor 120 will be readout to the operational amplifier 50 (see Fig. 1) as described hereinbelow.
  • undesirable noise is generated from the power supply 140, ground 150 and the bias voltage 160, and this undesirable noise is present at the node Ni of the row select transistor 110. As may be apparent, this noise is mixed with both the actual image signal and reset image signal. As a consequence, the present invention cancels this noise during readout as described hereinbelow.
  • a dark reference pixel 40 is used to generate a reference voltage which includes the same amount of noise or substantially the same amount of noise as the noise generated from the power supply 140, ground 150 and bias voltage 160.
  • the power supply 170, ground 180 and bias voltage 190 of the dark reference pixel 40 replicate or substantially replicate the noise of the pixel.
  • This noise of the dark reference pixel 40 cancels the noise generated during both reset and image readout. As may be apparent, this is accomplished because the voltage on the two capacitors 120 and 130 are charged with both the voltage from the dark reference pixel and the pixel both of which contain the same or substantially the same amount of noise and are correlated in time so that the noise is canceled or substantially canceled on the capacitors 120 and 130.
  • switches S2 and S4 are closed for charging capacitor 130 to a level corresponding to the sensed voltage from the floating diffusion 80 that represents the sensed signal from the photodiode 60.
  • Switches S2 and S4 are then opened.
  • Switches S5, S6 , S7 and S8 are closed for reading out the charge from the capacitors 120 and 130 respectively.
  • the signal on capacitor 120 represents the reset level
  • the signal on capacitor 130 represents the actual signal for the image.
  • An operational amplifier 50 (see Fig.
  • PARTS LIST image sensor pixels sample and hold circuits dark reference pixels operational amplifier photodiode transfer gate floating diffusion capacitor reset gate source follower row select transistor/switch sample and hold circuit capacitor image signal capacitor power supply ground bias voltage power supply ground bias voltage camera

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Picture Signal Circuits (AREA)

Abstract

An image sensor includes a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level; a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image and reset level; and a sample and hold circuit that reads out the image signal and cancels or substantially cancels out the noise from the image signal and reset level by canceling the noise from image and reset level with the noise generated from the dark reference pixels.

Description

LOW NOISE SAMPLE AND HOLD CIRCUIT
FIELD OF THE INVENTION The invention relates generally to the field of image sensors and, more particularly, to a method and apparatus for eliminating the unwanted noise generated from image sensors.
BACKGROUND OF THE INVENTION As is well known in the art, digital cameras include image sensors for capturing electronic representations of a scene. As with most electronic devices, unwanted noise is generated in image sensors that degrade the quality of the image. Obviously, it is desirable to eliminate this noise for improving image quality. Consequently a need exists for a method and apparatus for eliminating this unwanted noise.
SUMMARY OF THE INVENTION The present invention is directed to overcoming one or more of the problems set forth above. Briefly summarized, according to one aspect of the present invention, the invention resides in an image sensor comprising (a) a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level; (b) a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image and reset level; and (c) a sample and hold circuit that reads out the image signal and cancels or substantially cancels out the noise from the image signal and reset level by canceling the noise from image and reset level with the noise generated from the dark reference pixels. These and other aspects, objects, features and advantages of the present invention will be more clearly understood and appreciated from a review of the following detailed description of the preferred embodiments and appended claims, and by reference to the accompanying drawings. Advantageous Effect Of The Invention The present invention has the advantage of canceling unwanted noise generated in the pixels of image sensors. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a top, view of an image sensor and its associated sample and hold circuit of the present invention; Fig. 2 is a detailed drawing of a pixel and its connections to the sample and hold circuit; and Fig. 3 is a perspective view of a camera for illustrating a typical commercial embodiment for the image sensor of the present invention.
DETAILED DESCRIPTION OF THE INVENTION Referring to Fig. 1, there is shown an image sensor 10 having a plurality of pixels 20 arranged in a predetermined array. A plurality of sample and hold circuits 30 is respectively connected to a row of pixels 20 of the image sensor 10 (one sample and hold circuit 30 for each column of pixels) for reading out the values sampled from the pixels 20. The sample and hold circuit 30 also includes dark reference pixels 40 as will be discussed in detail hereinbelow. An operational amplifier 50 is connected to the sample and hold circuits 30 for converting and amplifying the signals from the sample and hold circuits 30. Referring to Fig. 2, there is shown a detailed drawing of a pixel 20 and its mated sample and hold circuit 30 of the present invention. Each pixel 20 includes a photosensitive area, such as photodiode 60, that receives incident light (represented by the arrows) that is converted to charge packets. A transfer gate 70 is selectively activated for transferring charge from photodiode 60 to a floating diffusion capacitor 80 that converts the charge to a voltage signal. A reset gate 90 functions to drain the charge from the floating diffusion capacitor 80 for resetting the floating diffusion 80 to a predetermined charge level. A source follower 100 transistor is connected to the floating diffusion capacitor 80 and functions to amplify the signal from the floating diffusion capacitor 80. In order to readout both the reset signal and the actual image signal, the row select switch 110 is activated for permitting the voltage signal representing the reset level of the floating diffusion capacitor 80 to be passed to the sample and hold circuit capacitor 120. In this regard, for passing the signal to the capacitor 120, switches Si and S3 are closed for charging the capacitor 120 to a level corresponding to the reset voltage level. Switches Si and S3 are then closed. It is noted for clarity that the capacitors 120 and 130 store their signal as a charge as is well known in the art. The stored charge of the capacitor 120 will be readout to the operational amplifier 50 (see Fig. 1) as described hereinbelow. It is further noted for clarity that undesirable noise is generated from the power supply 140, ground 150 and the bias voltage 160, and this undesirable noise is present at the node Ni of the row select transistor 110. As may be apparent, this noise is mixed with both the actual image signal and reset image signal. As a consequence, the present invention cancels this noise during readout as described hereinbelow. In this regard, a dark reference pixel 40 is used to generate a reference voltage which includes the same amount of noise or substantially the same amount of noise as the noise generated from the power supply 140, ground 150 and bias voltage 160. In other words, the power supply 170, ground 180 and bias voltage 190 of the dark reference pixel 40 replicate or substantially replicate the noise of the pixel. This noise of the dark reference pixel 40 cancels the noise generated during both reset and image readout. As may be apparent, this is accomplished because the voltage on the two capacitors 120 and 130 are charged with both the voltage from the dark reference pixel and the pixel both of which contain the same or substantially the same amount of noise and are correlated in time so that the noise is canceled or substantially canceled on the capacitors 120 and 130. In order to sample the actual image signal, switches S2 and S4 are closed for charging capacitor 130 to a level corresponding to the sensed voltage from the floating diffusion 80 that represents the sensed signal from the photodiode 60. Switches S2 and S4 are then opened. Switches S5, S6 , S7 and S8 are closed for reading out the charge from the capacitors 120 and 130 respectively. It is noted that the signal on capacitor 120 represents the reset level, and the signal on capacitor 130 represents the actual signal for the image. As noted above, the noise of the power supply 140, ground 150 and bias voltage 160 that is mixed with the image signal and reset signal is canceled by the corresponding noise of the dark reference pixel 40. An operational amplifier 50 (see Fig. 1) is connected to the outputs of the switches S5, S6, S7, and S8 for converting the sensed charges from capacitors 120 and 130 representing the rest signal and actual image signal to an amplified voltage signal. Referring to Fig. 3, there is shown a perspective view of a camera
200 for illustrating a typical commercial embodiment for the image sensor 10 and sample and hold circuit 30 of the present invention to which the ordinary consumer is accustomed.
PARTS LIST image sensor pixels sample and hold circuits dark reference pixels operational amplifier photodiode transfer gate floating diffusion capacitor reset gate source follower row select transistor/switch sample and hold circuit capacitor image signal capacitor power supply ground bias voltage power supply ground bias voltage camera

Claims

CLAIMS: 1. An image sensor comprising: (a) a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level signal; (b) a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image signal and reset level signal; and (c) a sample and hold circuit that reads out the image signal and reset level signal and cancels or substantially cancels out the noise from the image signal and reset level signal by canceling or substantially canceling the noise from image signal and reset level signal with the noise generated from the dark reference pixels.
2. The image sensor as in claim 1 , wherein the dark reference pixels include noise generated individually or in combination from a power supply, ground and/or a bias voltage.
3. The image sensor as in claim 1, wherein the dark reference pixels are disposed in the sample and hold circuit.
4. A camera comprising: an image sensor comprising: (a) a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level signal; (b) a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image signal and reset level signal; and (c) a sample and hold circuit that reads out the image signal and reset level signal and cancels or substantially cancels out the noise from the image signal and reset level signal by canceling or substantially canceling the noise from image signal and reset level signal with the noise generated from the dark reference pixels.
5. The camera as in claim 4, wherein the dark reference pixels include noise generated individually or in combination from a power supply, ground and/or a bias voltage.
6. The camera as in claim 4, wherein the dark reference pixels are disposed in the sample and hold circuit.
PCT/US2005/014451 2004-04-30 2005-04-27 Low noise sample and hold circuit WO2005117418A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007510932A JP4682191B2 (en) 2004-04-30 2005-04-27 Image sensor and camera
EP05740906A EP1741287A1 (en) 2004-04-30 2005-04-27 Low noise sample and hold circuit
KR1020067022518A KR101143094B1 (en) 2004-04-30 2005-04-27 Low noise sample and hold circuit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/836,884 2004-04-30
US10/836,884 US7385636B2 (en) 2004-04-30 2004-04-30 Low noise sample and hold circuit for image sensors

Publications (1)

Publication Number Publication Date
WO2005117418A1 true WO2005117418A1 (en) 2005-12-08

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/014451 WO2005117418A1 (en) 2004-04-30 2005-04-27 Low noise sample and hold circuit

Country Status (7)

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US (1) US7385636B2 (en)
EP (1) EP1741287A1 (en)
JP (1) JP4682191B2 (en)
KR (1) KR101143094B1 (en)
CN (2) CN101494728B (en)
TW (1) TWI363561B (en)
WO (1) WO2005117418A1 (en)

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EP3598739A4 (en) * 2018-04-13 2020-06-10 Shenzhen Goodix Technology Co., Ltd. Image sensing circuit and control method thereof

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Also Published As

Publication number Publication date
CN101494728B (en) 2011-04-06
CN100479498C (en) 2009-04-15
US20050243194A1 (en) 2005-11-03
TWI363561B (en) 2012-05-01
TW200605651A (en) 2006-02-01
CN1951104A (en) 2007-04-18
KR20070007860A (en) 2007-01-16
EP1741287A1 (en) 2007-01-10
KR101143094B1 (en) 2012-05-10
CN101494728A (en) 2009-07-29
JP4682191B2 (en) 2011-05-11
JP2007535871A (en) 2007-12-06
US7385636B2 (en) 2008-06-10

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