WO2005098399A1 - 透明板の欠陥検出方法およびその装置 - Google Patents
透明板の欠陥検出方法およびその装置 Download PDFInfo
- Publication number
- WO2005098399A1 WO2005098399A1 PCT/JP2005/006340 JP2005006340W WO2005098399A1 WO 2005098399 A1 WO2005098399 A1 WO 2005098399A1 JP 2005006340 W JP2005006340 W JP 2005006340W WO 2005098399 A1 WO2005098399 A1 WO 2005098399A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- transparent plate
- light
- defect
- scattering
- detection method
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
- G01N2021/8965—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod using slant illumination, using internally reflected light
Definitions
- the present invention relates to a method and a device for detecting a defect occurring in a transparent plate-like body such as a sheet glass.
- Defects in a transparent plate such as glass include defects existing on the surface such as surface scratches and dirt, and defects such as foreign substances in the plate. Since the plate is transparent, for example, as disclosed in Patent Document 1, optical means for illuminating a transparent plate from a direction nearly perpendicular to a surface of the transparent plate and a direction nearly parallel to the surface and detecting defects with a CCD camera. Has been heavily used.
- Patent Document 1 requires many light sources for illuminating the transparent plate-like body. Furthermore, defects such as scratches on the surface of the transparent plate, foreign matter and bubbles in the transparent plate, and foreign matter such as dirt on the surface of the transparent plate and dust attached to the surface cannot be determined. Inspection was difficult only after the transparent plate was washed. In other words, if the inspection is performed without cleaning, there is a possibility that the transparent plate-like body that is simply soiled may be discarded instead of being made into a product.
- defects that can be removed by washing such as dirt and dust on the surface of the transparent plate
- defects that cannot be eliminated by washing such as scratches and foreign substances.
- the transparent plate was kept clean so that only defects were detected without being affected by dust and dirt.
- Patent Document 2 discloses a method of distinguishing and detecting a defect such as a stain or a foreign substance that can be removed by washing as described above and a defect such as a scratch or a foreign substance.
- a defect such as a stain or a foreign substance that can be removed by washing as described above
- a defect such as a scratch or a foreign substance.
- Patent Document 3 discloses a method for propagating edge force light into a transparent plate-shaped body. In glass with high absorption, light did not reach the center of the transparent plate, and in thin transparent plates, it was difficult for the edge force to enter the light.
- Patent Document 1 Japanese Patent Application Laid-Open No. 11-337504
- Patent Document 2 JP 2002-214158 A
- Patent Document 3 JP 2003-75367 A
- An object of the present invention is to provide a defect detection method capable of easily distinguishing dirt from defects.
- the defect detection method and the detection device thereof provide a method for efficiently detecting only a defect irrespective of glass cleanliness, as a method for detecting a defect among signals input to a light receiving element for detecting a defect. It is intended to provide an inspection method in which a difference in luminance is generated only in the case where no difference in luminance occurs between dust and dirt.
- the light irradiated on the glass is guided into the glass, and the light is totally reflected, so that only the defects existing on the glass surface and inside are illuminated.
- a method is used that reliably detects only defects without being affected by the cleanliness of the glass.
- a scattering means for scattering illumination light is provided on a surface of the transparent plate-like body. Further, there is provided a defect detection method characterized in that a defect of a transparent plate is illuminated with the scattered illumination light which is totally reflected and propagated in the transparent plate.
- FIG. 1 is a schematic side view showing a method of detecting a defect by light that is totally reflected and propagated in a transparent plate.
- FIG. 2 is a schematic view showing illumination light illuminated in a line shape.
- FIG. 3 is a schematic diagram showing Snell's law.
- FIG. 4 is a schematic view showing illumination light scattered by a droplet.
- FIG. 5 is a schematic diagram showing a distance between a position where illumination light is incident and a detection position.
- FIG. 6 is a schematic view showing illumination light scattered by a droplet.
- FIG. 7 is a schematic view showing illumination light scattered by a scattering reflector.
- FIG. 8 is a schematic diagram showing a range where a CCD camera focuses.
- the method and apparatus for detecting a defect of a transparent plate according to the present invention provide a defect which can be removed by washing such as dirt and dust on the surface and a defect which cannot be removed such as a foreign substance in the transparent plate or a scratch on the surface.
- the method for detecting a defect of a transparent plate according to the present invention is not particularly limited.
- the method may be applied to an apparatus for detecting a defect of a transparent plate using an optical system as shown in FIG. Can be done.
- the illuminator 1 desirably illuminates the transparent plate 3 in a line shape as shown in FIG. CCD camera 4 captures a line-shaped area for the band-shaped illumination area.
- the illuminator 1 uses a light source such as a halogen lamp, a xenon lamp, a high-pressure mercury lamp, a sodium lamp, or an LED lamp, and shields the light from the light source or uses a plate-shaped or rod-shaped light guide to form a transparent plate.
- the body 3 is illuminated in a line as shown in FIG. It is desirable to use light with low scattering for the light incident on the transparent plate-shaped body 3. And scattered light.
- a rod-shaped fluorescent lamp can be used as a light source.
- Totally reflected light 6 is light that propagates through the transparent plate at an angle equal to or greater than the critical angle ⁇ .
- Figure 3 shows Snell's law.
- the incident light 20 is refracted at the interface between the transparent plate 3 and the air to become refracted light 21.
- the transparent plate is a soda-lime glass such as a float glass
- FIG. 4 shows a case where a droplet 8 is used as a scattering means of the illumination light on the surface of the transparent plate-shaped body on the same side as the illuminator 1.
- the droplets 8 are formed by spraying mist-like droplets onto the transparent plate 3 using a spraying device (not shown) so that the transparent plate 3 is illuminated with the illumination light 2.
- the angle of incidence of the illumination light 2 on the transparent plate-shaped body 3 does not have to be always vertical, and it is sufficient to illuminate at an angle that is easy to illuminate.
- the droplets adhered to the surface of the transparent plate have a curved shape due to surface tension, so that the illuminating light is scattered in the transparent plate.
- a part of the illumination light scattered in the transparent plate is scattered at an angle equal to or greater than the critical angle ⁇ ⁇ ⁇ ⁇ with respect to the normal of the transparent plate, and is totally reflected and propagates through the transparent plate. .
- the droplets adhered to the surface of the transparent plate have as small a particle size as possible for water droplets.
- the generated mist is sprayed on the surface of the transparent plate using an electric sprayer or sprayer, and water droplets adhere to the surface of the transparent plate.
- Totally reflected light 6 propagates through transparent plate 3 without being substantially affected by dirt, dust, dust and the like adhering to the surface of transparent plate 3, and enters inside transparent plate 3. Scattered by existing defects 7 and surface scratches.
- a CCD camera may be a normal camera, it is preferable to process data of an image with uniform brightness, and it is preferable to use a line camera that captures only one scanning line. .
- the position a where the illumination light 2 is incident on the transparent plate 3 the position b where the detector 4 detects the position b, and the position shown in FIG.
- the thickness of the transparent plate 3 is t with respect to the distance d between a and position b, as shown in FIG.
- the interval d is equal to or more than 2t X tan ⁇ .
- the interval d is set to t X tan 0 or more. Is preferred.
- the droplets attached to the surface of the transparent plate are moved to the detection position of the detector so as not to disturb the detection. It is desirable to arrange the detector and the illuminator in order in the direction of movement of the body.
- FIG. 7 shows a case where light-scattering particles 9 are formed by dispersing particles that scatter light in elastic resin, and the light-scattering members 9 are used as a means for scattering illumination light. It is.
- FIG. 6 shows a configuration in which the light scatterer 9 formed into a cylinder is formed into a roller shape and is brought into contact with the surface of the transparent plate 3, and the light scatterer 9 is rotated in accordance with the movement of the transparent plate 3. It was made.
- the light scatterer 9 is desirably formed in a roller shape so as to be rotatable, but may be used in a sheet shape.
- the resin for forming the light scatterer 9 is desirably one having elasticity. In addition, one having transparency or milky white is more preferred. Certain rubbery resins can be used. Note that an opaque resin may be used as the resin.
- the particles to be mixed with the resin it is preferable that the refractive index of polycarbonate, polystyrene, or the like is relatively large, and the resin is used as a powder.
- the detector 1 be surrounded by a light shielding plate 5 and shielded so that light other than the light scattered by the defect does not enter the detector.
- FIG. 1 shows an optical system of the present embodiment.
- the defect detection method of the present invention was used for a float glass 3 having a thickness of 5 mm which is continuously produced on a float glass production line. In the inspection, the place where the power of the cooling room came out was enclosed with a dark curtain , And there was no light except for illuminator 1.
- detector 4 and illuminator 1 were installed in that order in the direction of float glass movement, and as shown in Fig. 5, the position b where detector 4 detects and the illuminating light 2 are transparent plate 3
- the distance d from the position a at which light is incident on the surface is set to 7 mm, which is approximately 1.5 times 4.5 mm.
- a CCD camera 10 was used as the detector 4. The focus of the CCD camera was adjusted to the area on the line 11 shown in FIG. 8 near the surface of the transparent plate 3.
- the light that is totally reflected and propagated in the scattered illumination light 6 is scattered by a foreign substance in the transparent plate-like body or a scratch on the surface, and was detected as a defect. In addition, it has been impossible to detect dirt or dust on the surface of the transparent plate as a defect.
- Polystyrene resin powder was mixed with transparent silicone resin, molded into a cylindrical shape, and used as a scattering reflector 9 shown in FIG.
- the scattering reflector 9 was supported in a rotatable manner so as to be rotatable, and was brought into contact with the transparent plate-shaped body 3.
- the light that is totally reflected and propagated in the scattered illumination light 6 is scattered by a foreign substance in the transparent plate-like body or a scratch on the surface, and becomes a defect.
- a defect could be detected.
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004114674A JP4324504B2 (ja) | 2004-04-08 | 2004-04-08 | 透明板の欠陥検出方法およびその装置 |
JP2004-114674 | 2004-04-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005098399A1 true WO2005098399A1 (ja) | 2005-10-20 |
Family
ID=35125192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/006340 WO2005098399A1 (ja) | 2004-04-08 | 2005-03-31 | 透明板の欠陥検出方法およびその装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP4324504B2 (ja) |
WO (1) | WO2005098399A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4989452B2 (ja) * | 2006-12-25 | 2012-08-01 | パナソニック株式会社 | 光透過性フィルムの欠陥検出装置 |
JPWO2009031420A1 (ja) * | 2007-09-04 | 2010-12-09 | 旭硝子株式会社 | 透明板体内部の微小異物を検出する方法及びその装置 |
JP6121758B2 (ja) * | 2013-03-13 | 2017-04-26 | 倉敷紡績株式会社 | クラック及び外観検査装置並びにクラック及び外観検査方法 |
JP5877171B2 (ja) * | 2013-03-22 | 2016-03-02 | 富士フイルム株式会社 | エッジ位置検出装置及びエッジ位置検出方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1062354A (ja) * | 1996-08-20 | 1998-03-06 | Nachi Fujikoshi Corp | 透明板の欠陥検査装置及び欠陥検査方法 |
JPH11337496A (ja) * | 1998-03-24 | 1999-12-10 | Ngk Insulators Ltd | 透明体の欠陥検出方法及び透明体の製造方法 |
-
2004
- 2004-04-08 JP JP2004114674A patent/JP4324504B2/ja not_active Expired - Fee Related
-
2005
- 2005-03-31 WO PCT/JP2005/006340 patent/WO2005098399A1/ja active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1062354A (ja) * | 1996-08-20 | 1998-03-06 | Nachi Fujikoshi Corp | 透明板の欠陥検査装置及び欠陥検査方法 |
JPH11337496A (ja) * | 1998-03-24 | 1999-12-10 | Ngk Insulators Ltd | 透明体の欠陥検出方法及び透明体の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP4324504B2 (ja) | 2009-09-02 |
JP2005300275A (ja) | 2005-10-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5521377B2 (ja) | ガラス板の欠陥識別方法および装置 | |
US8396281B2 (en) | Apparatus and method for inspecting substrate internal defects | |
JPWO2003005007A1 (ja) | シート状透明体の欠点を検査する方法および装置 | |
JP2007078581A (ja) | 外観検査用照明装置 | |
JP4154523B2 (ja) | 容器内異物検出装置 | |
JP2015040835A (ja) | 透明板状体の欠点検査装置及び欠点検査方法 | |
EP2538393B1 (en) | Reverse vending machine and method of detecting dirt in a reverse vending machine | |
JP4575202B2 (ja) | 透明板状体の欠点検査方法及び欠点検査装置 | |
KR101123638B1 (ko) | 스크래치 검사장치 및 방법 | |
WO2005098399A1 (ja) | 透明板の欠陥検出方法およびその装置 | |
JP2007333563A (ja) | 光透過性シートの検査装置および検査方法 | |
JP2006071284A (ja) | ガラス基板欠陥の表裏識別方法 | |
JP3677133B2 (ja) | 透明体検査装置 | |
CN107917918B (zh) | 一种基于镜面反射的鉴别超薄透明板表面瑕疵的检测方法 | |
JPH11316195A (ja) | 透明板の表面欠陥検出装置 | |
JP4877355B2 (ja) | 透明板の欠陥検出方法およびその装置 | |
KR102162693B1 (ko) | 결함 검출 시스템 및 방법 | |
JPS63165738A (ja) | 透明基板用欠陥検査装置 | |
JP2013246059A (ja) | 欠陥検査装置および欠陥検査方法 | |
KR20200089416A (ko) | 디스플레이 패널의 커버 글래스 검사 시스템 | |
TW200702658A (en) | Illumination device for visual inspection based on reflected light and transmitted light | |
JP2006017685A (ja) | 表面欠陥検査装置 | |
JP2002039953A (ja) | 記憶媒体用ガラス基板及びガラス容器の欠点検出方法並びに装置 | |
JP2003202300A (ja) | 壜底異物検査装置 | |
JP5471157B2 (ja) | ガラス板面の付着物の検出方法および装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWW | Wipo information: withdrawn in national office |
Country of ref document: DE |
|
122 | Ep: pct application non-entry in european phase |