WO2005089999A1 - Lead-free solder ball - Google Patents

Lead-free solder ball Download PDF

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Publication number
WO2005089999A1
WO2005089999A1 PCT/JP2005/004427 JP2005004427W WO2005089999A1 WO 2005089999 A1 WO2005089999 A1 WO 2005089999A1 JP 2005004427 W JP2005004427 W JP 2005004427W WO 2005089999 A1 WO2005089999 A1 WO 2005089999A1
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WO
WIPO (PCT)
Prior art keywords
lead
solder
mass
free solder
solder ball
Prior art date
Application number
PCT/JP2005/004427
Other languages
French (fr)
Japanese (ja)
Inventor
Daisuke Souma
Takahiro Roppongi
Hiromi Kawamata
Hiroshi Okada
Original Assignee
Senju Metal Industry Co., Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Senju Metal Industry Co., Ltd filed Critical Senju Metal Industry Co., Ltd
Priority to JP2006511176A priority Critical patent/JP4392020B2/en
Publication of WO2005089999A1 publication Critical patent/WO2005089999A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • B23K35/24Selection of soldering or welding materials proper
    • B23K35/26Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
    • B23K35/262Sn as the principal constituent
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • H05K3/3436Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3463Solder compositions in relation to features of the printed circuit board or the mounting process

Definitions

  • the present invention relates to a solder ball used for soldering a surface mount component, particularly to a lead-free solder ball containing no Pb.
  • a surface mount component is a device in which electronic components are directly soldered and mounted on lands formed on the surface of a printed circuit board, and generally includes QFP, PLCC, SOP, SOJ, and the like.
  • QFP Quality of Service
  • PLCC Landing Component
  • SOP Synchronization Protocol
  • SOJ SOJ
  • a surface mount component is a device in which electronic components are directly soldered and mounted on lands formed on the surface of a printed circuit board, and generally includes QFP, PLCC, SOP, SOJ, and the like.
  • a solder paste is applied to the land of the printed circuit board, the surface-mounted components are mounted on the applied portion, and then the solder paste is melted in a reflow furnace.
  • the surface mount components were soldered to the printed circuit board.
  • solder bumps are formed on the electrodes of the BGA in advance, and the solder bumps are soldered to the printed circuit board.
  • a method of forming a solder bump on a BGA electrode will be briefly described.
  • an adhesive flux and solder paste are applied to the BGA electrodes, and solder balls are mounted on the applied portions by a mounting device.
  • the BGA on which the solder balls are mounted is heated in a reflow furnace to melt the solder balls, thereby forming solder bumps on the electrodes of the BGA. Since the reflow temperature at this time is at least 30 ° C higher than the melting temperature of the solder ball, the surface of the molten solder ball becomes easily oxidized.
  • the solder ball used for BGA has been Sn-Pb solder.
  • the eutectic composition (63Sn-Pb) of the Sn-Pb solder has been widely used because it has excellent solderability and has few defects.
  • electronic devices that used solder balls containing lead while being used became old and became inconvenient or broke down, they were discarded without purging up or repairing.
  • plastics and metals that make up the electronic equipment could be reused.
  • the printed circuit board could not be completely separated because the land and solder adhered metallically. Even if collected, they could not be reused, so they had to be disposed of in landfills.
  • Lead-free solder includes Sn-Ag based, Sn-Cu based, Sn-Ag-Cu based, Sn-Sb based, Sn-Bi based, Sn-Zn based based on Sn and the like. It is obtained by further adding other elementary kashimi elements. As described above, various types of lead-free solder have certain strengths and weaknesses, and they are used differently depending on the application.
  • Sn-Bi-based lead-free solder has a low melting point of 139 ° C for Sn-58Bi. Although it has the feature of little heat influence, its use is limited because it is very brittle. In the Sn-Zn system, Sn-9Zn has a melting point of 199 ° C and has a melting point close to that of conventional 63Sn-Pb eutectic solder. The force Zn, which has a large tendency to ionize, has a problem of insufficient corrosion resistance.
  • Sn-3.0-4.0Ag Sn-0.5-1.0Cu, Sn-1.0-4.0Ag-0.5Cu, more preferably Sn-3.0-4.0Ag-0.5Cu (melting point: 221-227 ° C)
  • Sn- Sn-based lead-free solders such as 3.0-5.0Sb have a slightly higher melting point than eutectic solders, but because of their high mechanical strength, they are suitable for soldering electronic devices, especially for forming BGA bumps in the form of solder balls. Many are used.
  • Patent Literature 1-16 describes a lead-free solder to which Cr is added.
  • Patent Document 1 JP-A-2-179386
  • Patent Document 2 JP-A-2000-15476
  • Patent Document 3 JP 2001-205476 A
  • Patent Document 4 Japanese Patent Application Laid-Open No. 2002-18589
  • Patent Document 5 JP-A-2002-248596
  • Patent Document 6 JP-A-2003-94195
  • solder bumps on the BGA is a force that mounts the solder balls on the electrodes of the BGA and also melts the solder balls in a reflow furnace.
  • the present inventors have conducted intensive studies on the cause of the yellowing of the surface of a solder bump when a solder bump is formed on a BGA electrode and the cause of solder corrosion in a corrosive atmosphere.
  • the solder bumps turn yellow because the surface is oxidized when the solder balls are melted.
  • the solder is always melted at the time of soldering.
  • the oxidized Sn and Pb of the Sn-Pb solder covers the surface. Since the Sn and Pb oxides contain Pb, they become almost white, and this white does not cause an error in the image recognition device.
  • lead-free solder containing Sn as a main component Sn as the main component oxidizes during melting, and the oxidized tin becomes yellow, causing an error in an image recognition device.
  • the portion soldered with a Sn-based lead-free solder ball corrodes in a corrosive atmosphere because a large amount of Sn is contained in the lead-free solder ball. This is because the resistance is lower than that of Pb.
  • the present inventors have found that if the solder surface is in a state in which it is difficult to oxidize when the solder ball is melted, the solder surface does not turn yellow, or after soldering, an inert atmosphere is formed on the solder surface.
  • the aim was to make it difficult to corrode even if a large amount of Sn was contained if there was a barrier to block.
  • the present inventors have searched for an element that has the effect of preventing oxidation and have a barrier effect, and have found that adding a trace amount of Cr to a lead-free solder containing Sn as a main component has the effect of preventing oxidation and having a barrier effect.
  • the present invention has been completed.
  • the present invention relates to a lead-free solder ball containing 80% by mass or more of Sn, wherein 0.0001 to 0.003% by mass of Cr is added to the solder ball. is there.
  • the lead-free solder ball of the present invention does not yellow when a solder bump is formed on a BGA, so that no error occurs when image processing is performed by an image recognition device.
  • the lead-free solder ball of the present invention does not corrode even when exposed to a corrosive atmosphere for a long period of time, it does not crack or peel off, and can exhibit the bonding strength of the solder itself. It is excellent.
  • the lead-free solder ball according to the present invention includes Sn-Ag, Sn-Cu, Sn-Ag-Cu,
  • the “system” here is the alloy itself or the alloy obtained by adding a small amount of another element to the alloy.
  • Sn-Ag-based is a binary alloy of Sn-Ag as it is, and a multi-element alloy in which one or more selected from In, Bi, Sb, Ni, P, Ge, and Ga are added to Sn-Ag alloy. It is.
  • Sn-Cu system, Sn-Ag-Cu system, and Sn-Sb system are also powerful.
  • the yellowing of lead-free solder occurs when a large amount of Sn is added. That is, if the added amount of Sn is 80% by mass or more, the oxidized color of Sn becomes yellow during melting, which causes an error in the image recognition device. Therefore, in the present invention, an object is to prevent yellowing in a lead-free solder containing 80% by mass or more of Sn.
  • the amount of the Sn main component of force Cr is obtained by 0.0001 to 0.003 mass 0/0 added Caro the Cr to lead-free solder is less than 0.0001 wt%, and anti-yellowing The effect of preventing corrosion does not appear, but if added in excess of 0.003% by mass, the oxide film becomes too thick and impairs the solderability.
  • JISZ 3198-3 solder spread rate is used as a guide for the wettability of lead-free solder S. If the solder spread rate is less than 75% for lead-free solder, good solderability with poor wettability cannot be performed.
  • the preferred amount of Cr added is 0.0005 to 0.001% by mass, and within this range, yellowing can be prevented and solderability is good.
  • the lead-free solder ball of the present invention is a ball having a diameter at which the bonding strength is extremely weakened by the effect of corrosion, that is, a lead-free solder ball having a fine diameter, approximately 0.05-0.6 mm. It has excellent effects.
  • solderability Table 1 shows the results of the spread ratio on a conventional copper plate using a solder ball with a diameter of 0.5 mm. JISZ3198-3 (Lead-free solder test method) Method Part 3 Spreading test method).
  • the solder ball of the example had good yellowing and good solder spreading.
  • the amount of Cr added was 0.0005-0.001% by mass.
  • the comparative solder ball satisfies both the yellowing and spreading properties. Things were powerful. Industrial applicability
  • the lead-free solder ball of the present invention is suitable for forming bumps other than force BGA, such as forming bumps on top of head pins or forming bumps on connector electrodes, which are suitable for forming BGA bumps. It goes without saying that it can be applied to things.

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

[PROBLEMS] When Sn-Ag type, Sn-Cu type, Sn-Ag-Cu type and Sn-Sb type lead-free solder balls having a Sn content of 80 mass % or more were used for forming bumps on electrodes of BGA, the yellowing of the surface and/or the corrosion of the soldered portion in the case of exposure to a corrosive atmosphere were observed in some cases. The yellowing of the surface of a bump may cause an error in the inspection of the presence or absence of a bump by the use of an image recognition device, and thus interferes with the proper inspection, and the corrosion of a soldered portion weakens the bonding strength of a bump. [MEANS FOR SOLVING PROBLEMS] A lead-free solder ball containing Sn in a content of 80 mass % or more, which further comprises 0.0001 to 0.003 mass % of Cr.

Description

明 細 書  Specification
鉛フリーはんだボール  Lead-free solder balls
技術分野  Technical field
[0001] 本発明は、表面実装部品のはんだ付けに用いるはんだボール、特に Pbを含まない 鉛フリーはんだボールに関する。  The present invention relates to a solder ball used for soldering a surface mount component, particularly to a lead-free solder ball containing no Pb.
背景技術  Background art
[0002] 表面実装部品とは、プリント基板の表面に形成されたランドに直接電子部品をはん だで接合して実装するものであり、一般には QFP、 PLCC、 SOP、 SOJ等がある。これら の表面実装部品をプリント基板に実装する場合は、プリント基板のランドにソルダぺ 一ストを塗布し、該塗布部に表面実装部品を搭載してからリフロー炉でソルダペース トを溶融することにより、表面実装部品とプリント基板とをはんだ付けしていたものであ る。  [0002] A surface mount component is a device in which electronic components are directly soldered and mounted on lands formed on the surface of a printed circuit board, and generally includes QFP, PLCC, SOP, SOJ, and the like. When mounting these surface-mounted components on a printed circuit board, a solder paste is applied to the land of the printed circuit board, the surface-mounted components are mounted on the applied portion, and then the solder paste is melted in a reflow furnace. The surface mount components were soldered to the printed circuit board.
[0003] 上記表面実装部品は、或る程度多機能化されたものである力 近時の電子機器の 小型化、多機能化力 表面実装部品もさらに小型で高機能が必要となり、現在では BuA (Ball urid Arrey)、 C¾P (し hip Size Package) ^ TAB(Tape Automated Bonding) ^ MCM(Multi Chip Module)等の多機能化された表面実装部品 (以下、代表して BGAと V、う)が多く使用されるようになってきた。  [0003] The above-mentioned surface-mounted components have been multifunctional to a certain degree. In recent years, electronic devices have become smaller and more multifunctional. Surface-mounted components also need to be smaller and have higher functions. (Ball urid Arrey), C¾P (Hip Size Package) ^ TAB (Tape Automated Bonding) ^ Multifunctionalized surface mount components such as MCM (Multi Chip Module) (hereinafter BGA and V) It has been increasingly used.
[0004] BGAをプリント基板に実装する場合は、予め BGAの電極にはんだバンプを形成して おき、該はんだバンプでプリント基板にはんだ付けを行う。ここで BGAの電極にはん だバンプを形成する方法にっ 、て簡単に説明する。先ず BGAの電極に粘着性のフ ラックス及びソルダペーストを塗布し、該塗布部にはんだボールを搭載装置で搭載す る。その後、はんだボールが搭載された BGAをリフロー炉で加熱してはんだボールを 溶融させることにより、 BGAの電極にはんだバンプを形成する。このときのリフロー温 度は、はんだボールの溶融温度よりも少なくとも 30°C以上も高くするため、溶融したは んだボールの表面は、表面が酸化しやすくなつて!、る。  When mounting a BGA on a printed circuit board, solder bumps are formed on the electrodes of the BGA in advance, and the solder bumps are soldered to the printed circuit board. Here, a method of forming a solder bump on a BGA electrode will be briefly described. First, an adhesive flux and solder paste are applied to the BGA electrodes, and solder balls are mounted on the applied portions by a mounting device. After that, the BGA on which the solder balls are mounted is heated in a reflow furnace to melt the solder balls, thereby forming solder bumps on the electrodes of the BGA. Since the reflow temperature at this time is at least 30 ° C higher than the melting temperature of the solder ball, the surface of the molten solder ball becomes easily oxidized.
[0005] このようにしてはんだバンプが形成された BGAをプリント基板に実装するときは、プリ ント基板のランドにソルダペーストを塗布し、該塗布部に BGAのはんだバンプを合わ せて搭載する。そして BGAを再度リフロー炉で加熱し、ソルダペーストとはんだバンプ を溶融させて BGAとプリント基板とをはんだ付けするものである。 [0005] When mounting the BGA on which the solder bumps are formed in this way on a printed circuit board, apply a solder paste to the land of the printed circuit board, and attach the solder bumps of the BGA to the applied portions. And mount it. Then, the BGA is heated again in a reflow furnace to melt the solder paste and the solder bumps and solder the BGA to the printed circuit board.
[0006] 従来の BGAでは、 30 X 30mmの BGA基板に 150— 250個の電極が形成されたもので あり、隣接した電極間のピッチは 1.0— 1.2mmであるため、該 BGAに使用するはんだ ボールは 0.76mmという比較的大きな直径のものが使用できた。しかしながら近時の BGAは電子機器のさらなる小型化にともない、より小型化されてきており、この小型化 された BGAに使用するはんだボールも小さいものとなってきている。例えば、 10 X 10 ( mm)の BGAには 400個の電極が形成されており、隣接した電極間のピッチが 0.5mm以 下という狭ピッチになっている。このような狭ピッチの BGAに使用するはんだボールは 直径が 0.3mm以下と 、う非常に微小なサイズとなって!/、る。  [0006] In a conventional BGA, 150 to 250 electrodes are formed on a 30 x 30 mm BGA substrate, and the pitch between adjacent electrodes is 1.0 to 1.2 mm. The ball could have a relatively large diameter of 0.76mm. However, in recent years, the size of BGA has been further reduced with the further miniaturization of electronic devices, and the solder balls used for the reduced BGA have also become smaller. For example, 400 electrodes are formed on a 10 × 10 (mm) BGA, and the pitch between adjacent electrodes is as narrow as 0.5 mm or less. The solder ball used for such a narrow pitch BGA has a very small size of less than 0.3mm in diameter! /
[0007] ところで従来、 BGAに使用されて!、たはんだボールは、 Sn-Pbはんだであった。この Sn-Pbはんだは、共晶組成 (63Sn-Pb)のものが、はんだ付け性に優れ、また不良も少 な!、ことから多く使用されてきたものである。し力しながら鉛を含むはんだボールを使 用した電子機器が古くなつて使い勝手が悪くなつたり故障したりしたときには、パージ ヨンアップや修理をせずに廃棄されていた。電子機器の廃棄時、電子機器を構成す るプラスチックや金属のうち再使用できるものは回収していた力 プリント基板はランド とはんだが金属的に付着していて、これらを完全に分離できず、回収しても再使用で きないことから、やむなく埋め立て処分されていた。このように埋め立て処分された Pb 含有のプリント基板に酸性雨が接触すると、はんだ中の Pb成分が溶出して酸性雨とと もに地下水に混入する。この Pb成分が含まれた地下水を人間や家畜が長年月にわ たって飲用すると、 Pb成分が体内に蓄積されて鉛中毒を起こすとされている。そのた め世界規模で Pbの使用が規制されるようになってきており、 Pbを含まない鉛フリーは んだが使用されるようになってきた。  [0007] By the way, conventionally, the solder ball used for BGA has been Sn-Pb solder. The eutectic composition (63Sn-Pb) of the Sn-Pb solder has been widely used because it has excellent solderability and has few defects. When electronic devices that used solder balls containing lead while being used became old and became inconvenient or broke down, they were discarded without purging up or repairing. At the time of disposal of electronic equipment, plastics and metals that make up the electronic equipment could be reused.The printed circuit board could not be completely separated because the land and solder adhered metallically. Even if collected, they could not be reused, so they had to be disposed of in landfills. When acid rain comes in contact with the Pb-containing printed circuit board disposed in this way, the Pb component in the solder elutes and enters the groundwater together with the acid rain. If humans and livestock drink the groundwater containing this Pb component for many months, the Pb component will accumulate in the body and lead to lead poisoning. As a result, the use of Pb has become regulated on a global scale, and lead-free solders that do not contain Pb have been used.
[0008] 鉛フリーはんだとは、 Snを主成分とした Sn-Ag系、 Sn-Cu系、 Sn-Ag-Cu系、 Sn-Sb系 、 Sn-Bi系、 Sn-Zn系、およびこれらにさらに他の添カ卩元素を適宜添カ卩したものである 。このように鉛フリーはんだとしては各種の合金系のものがある力 それぞれ一長一 短があり、用途によって使い分けている。  [0008] Lead-free solder includes Sn-Ag based, Sn-Cu based, Sn-Ag-Cu based, Sn-Sb based, Sn-Bi based, Sn-Zn based based on Sn and the like. It is obtained by further adding other elementary kashimi elements. As described above, various types of lead-free solder have certain strengths and weaknesses, and they are used differently depending on the application.
[0009] Sn-Bi系の鉛フリーはんだは、 Sn-58Biが融点 139°Cと低いため、電子部品に対する 熱影響が少ないという特長を有しているが、非常に脆いため用途が限られている。ま た Sn-Zn系は、 Sn-9Znが融点 199°Cであり、従来の 63Sn-Pbの共晶はんだに近い融 点を有して 、るため温度的には使 、やす 、鉛フリーはんだである力 Znはイオンィ匕 傾向が大きいため耐腐食性が充分でないという問題がある。 Sn-3.0-4.0Ag, Sn-0.5 一 1.0Cu、 Sn-l.0-4.0Ag-0.5Cu,より好ましくは Sn- 3.0— 4.0Ag- 0.5Cu (融点: 221— 227°C)、 Sn-3.0— 5.0Sb等の Sn主成分の鉛フリーはんだは、融点が共晶はんだよりも 少し高いが、機械的強度に強いため、電子機器のはんだ付け、特にはんだボールの 形状で BGAのバンプ形成に多く使用されている。 [0009] Sn-Bi-based lead-free solder has a low melting point of 139 ° C for Sn-58Bi. Although it has the feature of little heat influence, its use is limited because it is very brittle. In the Sn-Zn system, Sn-9Zn has a melting point of 199 ° C and has a melting point close to that of conventional 63Sn-Pb eutectic solder. The force Zn, which has a large tendency to ionize, has a problem of insufficient corrosion resistance. Sn-3.0-4.0Ag, Sn-0.5-1.0Cu, Sn-1.0-4.0Ag-0.5Cu, more preferably Sn-3.0-4.0Ag-0.5Cu (melting point: 221-227 ° C), Sn- Sn-based lead-free solders such as 3.0-5.0Sb have a slightly higher melting point than eutectic solders, but because of their high mechanical strength, they are suitable for soldering electronic devices, especially for forming BGA bumps in the form of solder balls. Many are used.
[0010] 鉛フリーはんだの添加元素としては、融点降下のために Inや Biを添加したり、酸ィ匕 防止のために P、 Ge、 Gaを添カ卩したり、機械的強度向上のために Ni、 Cr、 Mo、 Feを添 カロしたりすることがある。このうち Crを添加した鉛フリーはんだとしては、特許文献 1一 6がある。 [0010] As an additive element of the lead-free solder, In or Bi is added to lower the melting point, P, Ge, or Ga is added to prevent oxidation, or to improve mechanical strength. And Ni, Cr, Mo, and Fe. Among them, Patent Literature 1-16 describes a lead-free solder to which Cr is added.
特許文献 1:特開平 2-179386号公報  Patent Document 1: JP-A-2-179386
特許文献 2:特開 2000-15476号公報  Patent Document 2: JP-A-2000-15476
特許文献 3:特開 2001-205476号公報  Patent Document 3: JP 2001-205476 A
特許文献 4:特開 2002-18589号公報  Patent Document 4: Japanese Patent Application Laid-Open No. 2002-18589
特許文献 5:特開 2002-248596号公報  Patent Document 5: JP-A-2002-248596
特許文献 6:特開 2003-94195号公報  Patent Document 6: JP-A-2003-94195
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0011] ところで上記 Sn主成分の鉛フリーはんだボールを用いて BGAの電極にはんだバン プを形成したときに、バンプ表面が黄色に変色 (黄変)することがあった。つまり BGAへ のはんだバンプ形成は、はんだボールを BGAの電極上に搭載してカもリフロー炉で 該はんだボールを溶融させる力 この溶融時に黄変するものである。 BGAでは、はん だバンプ形成後に画像認識装置ではんだバンプの有無の確認をする力 このときは んだバンプが黄変していると画像認識装置でエラーを生じることがある。  [0011] By the way, when a solder bump is formed on a BGA electrode using the lead-free solder ball containing Sn as a main component, the bump surface sometimes changes color to yellow (yellowing). In other words, the formation of solder bumps on the BGA is a force that mounts the solder balls on the electrodes of the BGA and also melts the solder balls in a reflow furnace. With BGA, the ability to confirm the presence or absence of solder bumps with an image recognition device after the formation of solder bumps. If the solder bumps turn yellow, an error may occur in the image recognition device.
[0012] また Sn主成分の鉛フリーはんだボールを用いて作られた電子機器が過酷な条件、 例えば排気ガスの多い町中を走り回る自動車では、電気制御装置に排気ガスが入り 込むことがあり、また海に近い家屋で使用する電子機器や電気製品では内部に海水 の塩分を含む空気が入り込むことがある。このように鉛フリーはんだボールではんだ 付けした部分が排気ガスや塩分等の腐食雰囲気に曝されると、はんだが腐食し、長 年月の間にクラックや剥離が起こって接合強度が弱くなることがある。 [0012] In addition, when electronic devices made using Sn-based lead-free solder balls are subjected to severe conditions, for example, in an automobile running around a town with a large amount of exhaust gas, the exhaust gas enters the electric control device. In the case of electronic equipment and appliances used in houses near the sea, air containing salt from seawater may enter the inside. If the parts soldered with lead-free solder balls are exposed to corrosive atmospheres such as exhaust gas and salt, the solder will corrode, cracking and peeling will occur over many years, and the bonding strength will decrease. There is.
[0013] 接合強度向上のために Sn主成分の鉛フリーはんだに Crを添加することは前述のよ うに行われてきた力 従来の Cr添加鉛フリーはんだは、濡れ性が悪ぐはんだ付け不 良を起こすものであった。本発明は、はんだバンプを形成したときにバンプ表面が黄 変せず、し力も腐食雰囲気に曝されても腐食しにくいば力りでなぐはんだ付け不良 も起こさないという鉛フリーはんだボールを提供することにある。  [0013] Addition of Cr to lead-free solder containing Sn as a main component to improve bonding strength has been performed as described above. Conventional Cr-containing lead-free solder has poor solderability due to poor wettability. Was to cause. The present invention provides a lead-free solder ball that does not cause yellowing of the bump surface when a solder bump is formed, and does not cause soldering failure with force if it is hard to corrode even when exposed to a corrosive atmosphere. It is in.
課題を解決するための手段  Means for solving the problem
[0014] 本発明者らは、 BGA電極にはんだバンプを形成したときにはんだバンプの表面が 黄変する原因、および腐食雰囲気においてはんだが腐食する原因について鋭意研 究を重ねた。その結果、はんだバンプが黄変するのは、はんだボールを溶融したとき に表面が酸ィ匕するためである。つまりはんだは、はんだ付け時に必ず溶融させるもの であるが、この溶融時、 Sn-Pbはんだでは Snと Pbの酸化したものが表面を覆う。この Sn と Pbが酸ィ匕したものは Pbを含んでいるため、略白色となり、この白色は画像認識装置 に対してエラーを生じさせない。しかしながら Sn主成分の鉛フリーはんだでは、溶融 時に主成分の Snが酸化し、この酸ィ匕したものが黄色となるため画像認識装置でエラ 一を生じさせてしまうものである。  [0014] The present inventors have conducted intensive studies on the cause of the yellowing of the surface of a solder bump when a solder bump is formed on a BGA electrode and the cause of solder corrosion in a corrosive atmosphere. As a result, the solder bumps turn yellow because the surface is oxidized when the solder balls are melted. In other words, the solder is always melted at the time of soldering. At this time, the oxidized Sn and Pb of the Sn-Pb solder covers the surface. Since the Sn and Pb oxides contain Pb, they become almost white, and this white does not cause an error in the image recognition device. However, in the case of lead-free solder containing Sn as a main component, Sn as the main component oxidizes during melting, and the oxidized tin becomes yellow, causing an error in an image recognition device.
[0015] また Sn主成分の鉛フリーはんだボールではんだ付けした部分が腐食雰囲気で腐食 するのは、鉛フリーはんだボール中に Snが大量に含まれることによって、腐食雰囲気 に対して従来の 63Sn-Pbに比べて耐性が低下する為である。  [0015] In addition, the portion soldered with a Sn-based lead-free solder ball corrodes in a corrosive atmosphere because a large amount of Sn is contained in the lead-free solder ball. This is because the resistance is lower than that of Pb.
[0016] そこで本発明者らは、はんだボールを溶融したときにはんだ表面が酸ィ匕しにくい状 態であれば黄変とならず、またはんだ付けした後に、はんだの表面に不活性雰囲気 と遮断するノ リヤーがあれば Snが大量に含有されていても腐食しにくくなることに着 目したものである。本発明者らが、この酸化防止やバリヤ一効果のある元素を探索し たところ Crを Sn主成分の鉛フリーはんだに極微量添加すると酸ィ匕防止とバリヤ一効 果のあることを見い出して本発明を完成させた。 [0017] 本発明者らの知見によれば、はんだ合金中に Crが存在すると、はんだの溶融時、 Crの酸化皮膜が溶融はんだの表面を覆って、空気や腐食雰囲気との接触を妨げる 結果、溶融はんだの表面は酸ィ匕せず、また腐食も起こらなくなる。また、凝固後にお いてもはんだ表面に存在する微量 Crが優先的に酸ィ匕することで主な母材である Snの 酸ィ匕を防ぐ働きをする。はんだの黄変は主に Snの酸ィ匕色であり、 Sn酸化膜が成長す ることで発生する。 Crの効果はその Sn酸ィ匕膜の成長を低減するものである。 Crの添 加は、 0.0001— 0.003質量%添加と極めて少なくして耐黄変効果があることである。よ り好ましくは 0.0005— 0.001質量%の添カ卩が効果的である。 Therefore, the present inventors have found that if the solder surface is in a state in which it is difficult to oxidize when the solder ball is melted, the solder surface does not turn yellow, or after soldering, an inert atmosphere is formed on the solder surface. The aim was to make it difficult to corrode even if a large amount of Sn was contained if there was a barrier to block. The present inventors have searched for an element that has the effect of preventing oxidation and have a barrier effect, and have found that adding a trace amount of Cr to a lead-free solder containing Sn as a main component has the effect of preventing oxidation and having a barrier effect. The present invention has been completed. According to the findings of the present inventors, when Cr is present in a solder alloy, when the solder is melted, an oxide film of Cr covers the surface of the molten solder and prevents contact with air or a corrosive atmosphere. On the other hand, the surface of the molten solder is not oxidized and no corrosion occurs. In addition, even after solidification, the trace amount of Cr present on the solder surface is preferentially oxidized, thereby serving to prevent oxidization of Sn, which is the main base material. The yellowing of the solder is mainly the tinting of Sn, and is caused by the growth of the Sn oxide film. The effect of Cr is to reduce the growth of the Sn oxide film. The addition of Cr is as small as 0.0001-0.003% by mass and has a yellowing resistance effect. More preferably, 0.0005-0.001% by mass of soybean curd is effective.
[0018] 本発明は、 Snを 80質量%以上含有する鉛フリーはんだのはんだボールにおいて、 該はんだボール中に Crが 0.0001— 0.003質量%添加されていることを特徴とする鉛フ リーはんだボールである。  [0018] The present invention relates to a lead-free solder ball containing 80% by mass or more of Sn, wherein 0.0001 to 0.003% by mass of Cr is added to the solder ball. is there.
発明の効果  The invention's effect
[0019] 本発明の鉛フリーはんだボールは、 BGAでのはんだバンプ形成時に黄変しな 、た め、画像認識装置で画像処理したときに、エラーが発生しない。また本発明の鉛フリ 一はんだボールは、腐食雰囲気に長期間曝されても腐食しないため、クラックや剥離 が起こらず、はんだ自体が有する接合強度を充分に発揮できると 、う検査性と信頼 性に優れたものである。  The lead-free solder ball of the present invention does not yellow when a solder bump is formed on a BGA, so that no error occurs when image processing is performed by an image recognition device. In addition, since the lead-free solder ball of the present invention does not corrode even when exposed to a corrosive atmosphere for a long period of time, it does not crack or peel off, and can exhibit the bonding strength of the solder itself. It is excellent.
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0020] 本発明における鉛フリーはんだボールは、 Sn-Ag系、 Sn-Cu系、 Sn-Ag-Cu系、 [0020] The lead-free solder ball according to the present invention includes Sn-Ag, Sn-Cu, Sn-Ag-Cu,
Sn-Sb系の何れかにおいて優れた効果を奏するものである力 ここにおける「系」とは 、その合金そのもの、またはその合金に他の元素を少量添加したものである。例えば 、 Sn-Ag系とは、 Sn-Agそのままの二元合金と、 Sn-Ag合金に In、 Bi、 Sb、 Ni、 P、 Ge、 Gaから選ばれた 1種以上が添加された多元合金である。 Sn-Cu系も、 Sn-Ag-Cu系も 、そして Sn-Sb系もし力りである。 Force that exerts an excellent effect in any of the Sn-Sb system The "system" here is the alloy itself or the alloy obtained by adding a small amount of another element to the alloy. For example, Sn-Ag-based is a binary alloy of Sn-Ag as it is, and a multi-element alloy in which one or more selected from In, Bi, Sb, Ni, P, Ge, and Ga are added to Sn-Ag alloy. It is. Sn-Cu system, Sn-Ag-Cu system, and Sn-Sb system are also powerful.
[0021] 鉛フリーはんだにおいて黄変が発生するのは、 Snが大量に添加されているもので 起こる。つまり Snの添加量が 80質量%以上であると、溶融時に Snの酸化した色が黄 色くなり、画像認識装置でエラーとなる。そこで本発明では、 Snが 80質量%以上の鉛 フリーはんだにおいて黄変防止を目的とした。 [0022] 本発明では、上記 Sn主成分の鉛フリーはんだに Crを 0.0001— 0.003質量0 /0添カロし たものである力 Crの添加量が 0.0001質量%よりも少ないと、黄変防止と腐食防止の 効果が表れず、しかるに 0.003質量%を超えて添加されると酸ィ匕膜が厚くなりすぎて はんだ付け性を害するようになる。鉛フリーはんだのぬれ性の目安に JISZ 3198-3の はんだ広がり率が用いられる力 S、鉛フリーはんだでははんだ広がり率が 75%未満では 、ぬれ性が悪ぐ良好なはんだ付けが行えない。本発明において、好適な Crの添カロ 量は 0.0005— 0.001質量%であり、この範囲であれば黄変が防止でき、はんだ付け性 も良い。 [0021] The yellowing of lead-free solder occurs when a large amount of Sn is added. That is, if the added amount of Sn is 80% by mass or more, the oxidized color of Sn becomes yellow during melting, which causes an error in the image recognition device. Therefore, in the present invention, an object is to prevent yellowing in a lead-free solder containing 80% by mass or more of Sn. [0022] In the present invention, the amount of the Sn main component of force Cr is obtained by 0.0001 to 0.003 mass 0/0 added Caro the Cr to lead-free solder is less than 0.0001 wt%, and anti-yellowing The effect of preventing corrosion does not appear, but if added in excess of 0.003% by mass, the oxide film becomes too thick and impairs the solderability. JISZ 3198-3 solder spread rate is used as a guide for the wettability of lead-free solder S. If the solder spread rate is less than 75% for lead-free solder, good solderability with poor wettability cannot be performed. In the present invention, the preferred amount of Cr added is 0.0005 to 0.001% by mass, and within this range, yellowing can be prevented and solderability is good.
[0023] 本発明の鉛フリーはんだボールは、腐食の影響で接合強度が極端に弱くなる直径 のもの、即ち直径が微細な鉛フリーはんだボール、概略 0.05— 0.6mmの鉛フリーはん だボールで優れた効果を奏する。  The lead-free solder ball of the present invention is a ball having a diameter at which the bonding strength is extremely weakened by the effect of corrosion, that is, a lead-free solder ball having a fine diameter, approximately 0.05-0.6 mm. It has excellent effects.
[0024] 以下、実施例と比較例を表 1に示す。  Hereinafter, examples and comparative examples are shown in Table 1.
[0025] [表 1]  [Table 1]
Figure imgf000007_0001
Figure imgf000007_0001
[0026] 表 1の説明  [0026] Description of Table 1
黄変:直径 0.3mmのはんだボールを 150°Cの高温槽に l.Og (約一万個)投入し、 48時 間放置後、目視で表面の色を観察する。はんだボールの表面が黄変している数を力 ゥントし、その割合をパーセンテージで表した結果を表 1に示す。  Yellowing: Pour l.Og (approximately 10,000 pieces) into a high-temperature bath at 150 ° C with solder balls having a diameter of 0.3 mm. After standing for 48 hours, observe the surface color visually. Table 1 shows the results obtained by counting the number of yellowing of the solder ball surface and expressing the ratio as a percentage.
はんだ付け性:直径 0.5mmのはんだボールを用い、慣用の銅板上での広がり率の結 果を表 1に示す。広がり率の試験方法、計算式は JISZ3198-3(鉛フリーはんだ試験方 法 第 3部 広がり試験方法)に従い行った。実施例のはんだボールは、黄変および はんだ広がりも良好であった力 Crの添カ卩量が 0.0005— 0.001質量%力 外れる比 較例のはんだボールは黄変または広がり率の両方の特性を満たすものはな力つた。 産業上の利用可能性 Solderability: Table 1 shows the results of the spread ratio on a conventional copper plate using a solder ball with a diameter of 0.5 mm. JISZ3198-3 (Lead-free solder test method) Method Part 3 Spreading test method). The solder ball of the example had good yellowing and good solder spreading. The amount of Cr added was 0.0005-0.001% by mass. The comparative solder ball satisfies both the yellowing and spreading properties. Things were powerful. Industrial applicability
本発明の鉛フリーはんだボールは、 BGAのバンプ形成に適したものである力 BGA 以外のバンプ形成、例えばヘッドピンの上部にバンプを形成したり、コネクターの電 極にバンプを形成したりするようなものにも適用できることはいうまでもない。  The lead-free solder ball of the present invention is suitable for forming bumps other than force BGA, such as forming bumps on top of head pins or forming bumps on connector electrodes, which are suitable for forming BGA bumps. It goes without saying that it can be applied to things.

Claims

請求の範囲 The scope of the claims
[1] Snを 80質量%以上含有する鉛フリーはんだのはんだボールにぉ 、て、該はんだボー ル中に Crが 0.0001— 0.003質量%添加されていることを特徴とする鉛フリーはんだボ 一ノレ。  [1] A lead-free solder ball containing 80% by mass or more of Sn, wherein 0.0001-0.003% by mass of Cr is added to the solder ball. .
[2] 請求項 1の Crは、好ましくは 0.0005— 0.001質量%の範囲である鉛フリーはんだ。  [2] The lead-free solder according to claim 1, wherein Cr is preferably in the range of 0.0005 to 0.001% by mass.
[3] 前記鉛フリーはんだボールは、 Sn-Ag系、 Sn-Cu系、 Sn-Ag-Cu系、 Sn-Sb系の何れか であることを特徴とする請求項 1、 2何れか記載の鉛フリーはんだボール。  [3] The lead-free solder ball according to any one of claims 1 and 2, wherein the lead-free solder ball is any of Sn-Ag, Sn-Cu, Sn-Ag-Cu, and Sn-Sb. Lead-free solder balls.
[4] 3— 4質量%Ag、 0.0001— 0.003質量%Cr、残部 Snからなることを特徴とする鉛フリ 一はんだボーノレ。 [4] A lead-free solder paste comprising 3-4 mass% Ag, 0.0001-0.003 mass% Cr and the balance Sn.
[5] 0.5— 1.0質量%Cu、 0.0001— 0.003質量%Cr、残部 Sn力 なることを特徴とする鉛フ リーはんだボーノレ。  [5] 0.5% to 1.0% by mass of Cu, 0.0001% to 0.003% by mass of Cr, with the balance being Sn force.
[6] 3— 5質量%Sb、 0.0001— 0.003質量%Cr、残部 Snからなることを特徴とする鉛フリ 一はんだボーノレ。  [6] A lead-free solder paste comprising 3-5 mass% Sb, 0.0001-0.003 mass% Cr and the balance Sn.
[7] 1一 4質量%Ag、 0.5— 1.0質量%Cu、 0.0001— 0.003質量%Cr、残部 Snからなること を特徴とする鉛フリーはんだボール。  [7] A lead-free solder ball consisting of 1-4 mass% Ag, 0.5-1.0 mass% Cu, 0.0001-0.003 mass% Cr, and the balance Sn.
[8] 3— 4質量%Ag、 0.5— 1.0質量%Cu、 0.0001— 0.003質量%Cr、残部 Snからなること を特徴とする鉛フリーはんだボール。 [8] A lead-free solder ball comprising 3-4 mass% Ag, 0.5-1.0 mass% Cu, 0.0001-0.003 mass% Cr, and the balance Sn.
[9] 前記鉛フリーはんだボールの直径は、 0.05— 0.6mmであることを特徴とする請求項 1 一 8に記載の鉛フリ一はんだボール。 [9] The lead-free solder ball according to claim 18, wherein the lead-free solder ball has a diameter of 0.05 to 0.6mm.
[10] Snを 80質量%以上含有する鉛フリーはんだのはんだボールにぉ 、て、該はんだボ ール中に Crを 0.0001— 0.003質量0 /0添カ卩することによってはんだボール表面の黄変 を防止する方法。 [10] per cent lead-free solder of the solder balls containing more than 80 wt% of Sn Te, 0.0001 to 0.003 mass Cr in said solder ball Lumpur 0/0 添Ka卩yellowing of the solder ball surface by How to prevent.
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009248156A (en) * 2008-04-08 2009-10-29 Hitachi Metals Ltd Solder ball, solder layer, solder bump, and method for forming the same
JP2011031253A (en) * 2009-07-30 2011-02-17 Eishin Kogyo Kk Lead-free solder alloy
TWI469845B (en) * 2012-08-08 2015-01-21 Senju Metal Industry Co High temperature lead free solder alloy
EP3112080A4 (en) * 2014-02-24 2017-11-29 Koki Company Limited Lead-free solder alloy, solder material, and joined structure
JP2020075280A (en) * 2018-11-09 2020-05-21 千住金属工業株式会社 Solder ball, solder joint and joining method
CN115464299A (en) * 2021-10-21 2022-12-13 上海华庆焊材技术股份有限公司 Preformed lead-free soldering lug capable of reducing soldering cavity and preparation method and application thereof

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101283580B1 (en) 2011-12-14 2013-07-05 엠케이전자 주식회사 Tin-based solder ball and semiconductor package including the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11216591A (en) * 1998-01-28 1999-08-10 Murata Mfg Co Ltd Soldering product
JP2001058286A (en) * 1999-08-20 2001-03-06 Senju Metal Ind Co Ltd Solder paste for joining chip part

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11216591A (en) * 1998-01-28 1999-08-10 Murata Mfg Co Ltd Soldering product
JP2001058286A (en) * 1999-08-20 2001-03-06 Senju Metal Ind Co Ltd Solder paste for joining chip part

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009248156A (en) * 2008-04-08 2009-10-29 Hitachi Metals Ltd Solder ball, solder layer, solder bump, and method for forming the same
JP2011031253A (en) * 2009-07-30 2011-02-17 Eishin Kogyo Kk Lead-free solder alloy
TWI469845B (en) * 2012-08-08 2015-01-21 Senju Metal Industry Co High temperature lead free solder alloy
EP3112080A4 (en) * 2014-02-24 2017-11-29 Koki Company Limited Lead-free solder alloy, solder material, and joined structure
JP2020075280A (en) * 2018-11-09 2020-05-21 千住金属工業株式会社 Solder ball, solder joint and joining method
US10780531B2 (en) 2018-11-09 2020-09-22 Senju Metal Industry Co., Ltd. Solder ball, solder joint, and joining method
CN115464299A (en) * 2021-10-21 2022-12-13 上海华庆焊材技术股份有限公司 Preformed lead-free soldering lug capable of reducing soldering cavity and preparation method and application thereof

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