WO2005059618A2 - Microlithography projection objective with crystal lens - Google Patents
Microlithography projection objective with crystal lens Download PDFInfo
- Publication number
- WO2005059618A2 WO2005059618A2 PCT/EP2004/014290 EP2004014290W WO2005059618A2 WO 2005059618 A2 WO2005059618 A2 WO 2005059618A2 EP 2004014290 W EP2004014290 W EP 2004014290W WO 2005059618 A2 WO2005059618 A2 WO 2005059618A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- projection objective
- microlithography projection
- lens
- lenses
- microlithography
- Prior art date
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- 238000001393 microlithography Methods 0.000 title claims abstract description 22
- 239000013078 crystal Substances 0.000 title claims description 29
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 claims abstract description 50
- 239000011780 sodium chloride Substances 0.000 claims abstract description 25
- 238000007654 immersion Methods 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims description 43
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 38
- 239000000395 magnesium oxide Substances 0.000 claims description 21
- 238000000576 coating method Methods 0.000 claims description 4
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 3
- 239000002178 crystalline material Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 abstract description 15
- 210000000695 crystalline len Anatomy 0.000 abstract 3
- WCUXLLCKKVVCTQ-UHFFFAOYSA-M Potassium chloride Chemical compound [Cl-].[K+] WCUXLLCKKVVCTQ-UHFFFAOYSA-M 0.000 description 22
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 238000002834 transmittance Methods 0.000 description 12
- 239000001103 potassium chloride Substances 0.000 description 11
- 235000011164 potassium chloride Nutrition 0.000 description 11
- 238000010521 absorption reaction Methods 0.000 description 8
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 8
- 229910001634 calcium fluoride Inorganic materials 0.000 description 8
- 239000012530 fluid Substances 0.000 description 7
- 238000001459 lithography Methods 0.000 description 7
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical compound [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 description 7
- 229910052681 coesite Inorganic materials 0.000 description 6
- 229910052906 cristobalite Inorganic materials 0.000 description 6
- 229910052682 stishovite Inorganic materials 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 229910052905 tridymite Inorganic materials 0.000 description 6
- 239000003513 alkali Substances 0.000 description 5
- 230000001012 protector Effects 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 150000004694 iodide salts Chemical class 0.000 description 3
- 229910052596 spinel Inorganic materials 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000000671 immersion lithography Methods 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000011029 spinel Substances 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- 229910026161 MgAl2O4 Inorganic materials 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- PSNPEOOEWZZFPJ-UHFFFAOYSA-N alumane;yttrium Chemical compound [AlH3].[Y] PSNPEOOEWZZFPJ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 229910001632 barium fluoride Inorganic materials 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001805 chlorine compounds Chemical class 0.000 description 1
- 238000005056 compaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000010431 corundum Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 150000002222 fluorine compounds Chemical class 0.000 description 1
- 239000010436 fluorite Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- QZQVBEXLDFYHSR-UHFFFAOYSA-N gallium(III) oxide Inorganic materials O=[Ga]O[Ga]=O QZQVBEXLDFYHSR-UHFFFAOYSA-N 0.000 description 1
- 229910000449 hafnium oxide Inorganic materials 0.000 description 1
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical compound I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000010421 standard material Substances 0.000 description 1
- 229910001637 strontium fluoride Inorganic materials 0.000 description 1
- FVRNDBHWWSPNOM-UHFFFAOYSA-L strontium fluoride Chemical compound [F-].[F-].[Sr+2] FVRNDBHWWSPNOM-UHFFFAOYSA-L 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/02—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of crystals, e.g. rock-salt, semi-conductors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/7035—Proximity or contact printers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
Definitions
- the invention relates to a microlithography projection objective with at least one crystal lens, wherein the objective is designed in particular for a high numerical aperture and with immersion or optical near field.
- Suitable immersion liquids are inter alia described in US 60/568,006 or DE 10 2004 051 730.4.
- Crystal lenses consisting in particular of calcium fluoride (fluorspar) or other fluorides have been used until now as a means to achieve a sufficient transmittance at wavelengths below 200 nm and down to, e.g., 126 nm, and also to achieve a chromatic compensation by using fluoride lenses particularly in combination with lens elements of quartz glass.
- fluoride lenses particularly in combination with lens elements of quartz glass.
- these arrangements involved the use of several crystal lenses in the objective, with diameters exceeding 10 cm and with a combined thickness of the order of 10 cm, where the lenses had to be arranged at different places in the objective, including in particular locations close to the pupil and close to the object.
- the same material is also known to be suitable for lenses close to a field plane because of its higher radiation resistance associated with a lower degree of compaction compared to quartz glass.
- the first approach that always comes to mind is to use shorter wavelengths.
- the shorter the wavelength the more difficult it becomes to find suitable immersion materials and lens materials with a high refractive index. Attempts have therefore been made to stay with longer wavelengths but find materials that have an even higher refractive index to compensate for the disadvantage of the longer wavelength.
- the aperture has to be larger by a factor of 1.285.
- a resolution of 50 nm would require a refractive index of at least 1.49 if a value of 0.3 has been selected for ki.
- quartz glass fused silica, Si0 2
- Si0 2 has a refractive index of 1.506235 at a wavelength of 248 nm
- the next node at 45 nm is not attainable without a change of material.
- lens materials with a particularly high refractive index for_.l_ens_es-.-in_.the .area. near.-.the_ image plane of-.ar-- objective of the kind described in generic terms in the introductory paragraph, including suitable protector plates or other elements.
- the refractive index is higher than for quartz glass, it is also possible to use materials whose other properties are less ideal, such as calcium fluoride, for individual elements with a thickness of a few millimeters to centimeters .
- a material has been found which has a higher refractive index and can meet all other requirements for lithography applications.
- the material needs to be sufficiently isotropic.
- an intrinsic birefringence in the deep ultraviolet range near the absorption edge has to be tolerated.
- the further away the absorption edge the smaller are the values of the intrinsic birefringence.
- a particularly advantageous selection is achieved if the intrinsic birefringence crosses the zero level at the wavelength being used for the lithography application.
- sodium chloride (NaCl) was found to be suitable, which at this wavelength has a refractive index of 1.657766.
- Figures 1 to 8 schematically illustrate sections through the lenses near the image plane of a projection objective according to the invention, including the immersion area and the wafer or another object being exposed to the projection.
- Figure 1 schematically illustrates the last lenses on the image side of a microlithography projection objective according to the invention with an immersion fluid I, for example 25% D 3 P0 4 in D 2 0 (n248 « 1.66), a monocrystalline last lens of NaCl, with a plane-parallel thin protector plate P or a protective layer placed in between.
- an immersion fluid I for example 25% D 3 P0 4 in D 2 0 (n248 « 1.66)
- a monocrystalline last lens of NaCl with a plane-parallel thin protector plate P or a protective layer placed in between.
- Monocrystalline NaCl is not hygroscopic in air, in contrast to commercially available kitchen salt which contains impurities of MgCl and therefore attracts water. It should be clear that the work operations on NaCl in the production process have to be free of water, because NaCl dissolves in liquid water. However, the appropriate working techniques have been known for decades . Otherwise, the lenses can be coated with vapor-deposited layers and worked on with ion beams. Inside the objective, which is normally flushed with helium or nitrogen, moisture is in any event of no concern.
- potassium iodide is water-soluble but advantageously isotropic.
- Other representatives of the alkali group in the form of iodides are likewise suitable, including Nal, Rbl, Csl. Since the primary use of iodides is in the infrared range, no raw materials of extreme purity have so far been used to grow crystals for the far ultraviolet range.
- the transmittance edge for Csl a material of the highest refractive index, is reported as 227 nm, so that the transmittance values obtained for Nal, Ki, Rbl tend to be ev.en_mor.e_.favorable .
- the highest index of refraction is obtained with Cs as it has the highest atomic weight in the alkali group.
- Figure 2 shows the end portion of a refractive or catadioptric objective with an aperture of more than 2.0.
- the wafer W is for example in the optical near field, with a distance of 20 nm.
- a fluid from the group of highly refractive substances that are also known as immersion fluids is arranged between the last two lenses on the image side of the objective.
- magnesium oxide MgO has to be produced in crystalline form with the requisite purity. In the form of a thin element, it is sufficiently transparent.
- the crystalline oxide material is isotropic and has a coefficient of linear thermal expansion of 14xlO ⁇ 6 /K, while Csl for example has a linear expansion coefficient of 54.9xlO "6 /K.
- MgO is of course also possible to use MgO itself for the one or more last elements if a crystal material of suitable transmittance and homogeneity is used.
- MgO has very good chemical and mechanical properties and is a most highly refractive material with a refractive index over 2.0, it is suitable for the wavelength of 248 nm, if the crystal quality is appropriately optimized. Instructive comments on this may be found in the paper by John H. Burnett et al . "High Index Materials for 193 nm and 157 nm Immersion Lithography", Intl. Symp. On Immersion + 157 nm Lithography, Vancouver, 2 Aug 2004.
- Figure 3 represents an example of a refractive or catadioptric projection objective in which the system aperture stop or the conjugate plane of the system aperture stop that is closest to the image plane is followed by a lens group in which the last lens and in this case also the next to last lens on the image side of the objective are lenses of monocrystalline magnesium oxide .
- MgO has a unique position.
- the oxides of the first group i.e., of the alkali group
- the oxides of the second group the alkaline earth gx.ou.p-, the—oxide—o-f—-the—i] g-h-t ⁇ s-t—eie-men-t-—ts—BeQ-r- Wfe ⁇ e- the latter has a good transmittance, it has a wurzite structure and is therefore birefringent .
- the further oxides MgO, CaO, SrO, BaO have the crystal structure of NaCl and are optically isotropic.
- Magnesium oxide has the further advantage of an excellent chemical stability in contact with many immersion fluids I, which necessarily should likewise have a very high index of refraction at 248 nm. With a system that works in the optical near field, it is important to pay attention to the need for frequent cleaning. Using MgO in the last optical element of the system is advantageous also because of its exceptional hardness and ease of cleaning. With no immediate need to pusn up the refractive index at the 45 nm node, it also makes sense to protect an NaCl lens with a thin MgO plate.
- MgO crystal In order to prevent the MgO element from heating up, it is important that the MgO crystal be produced from base material components of the highest purity. A certain amount of absorption can be tolerated as long as MgO serves only as a protector plate that is overlaid on another optical material, because with a small thickness of for example 1.0 mm, the absorption volume, and consequently the heat generation, will remain small. If entire lenses are made of MgO, one should aim for a crystal of high purity.
- the 193 nm wavelength while not yet representing the majority of applications, is an established working wavelength and therefore, as a natural consequence, attractive for a further reduction of the structure widths through the use of very large NA values .
- n 1.501436 for CaF 2 at 193.304 nm
- n 1.560289 for Si0 2 at 193.304 nm
- Chromatic compensation materials with a higher refractive index and a higher dispersion than CaF 2 are known, e.g., from U.S. Patent 6,683,729 Bl (inventor Schuster) and from the aforementioned paper by Burnett et al . , including among others the following:
- an objective with a large refractive lens element of BaF 2 in the end position stands up better to radiation than amorphous Si0 2 , but the refractive index is not significantly increased in comparison to Si0 2 .
- Potassium chloride KCl has a very good transmittance at 193 nm and more than satisfies the requirement of a refractive index of 1.685. In fact, the refractive index of KCl is 1.756255 at 193 nm. Given that the resists already reach indices up to 1.75, there is a possible application for a system where the light passes from the last lens to the resist on a wafer by means of the optical near field without immersion.
- Figure 4 schematically illustrates the part of a projection objective that extends from the aperture stop plane AS (system aperture plane or a conjugate plane of the system aperture plane) closest to the image field, equipped with KCl lenses according to the invention in near-field distance from a resist / wafer W.
- AS system aperture plane or a conjugate plane of the system aperture plane
- Sodium chloride NaCl has a refractive index of 1.829085 at a wavelength of 193 nm.
- the k x -factor for 193 nm and for the 22 nm node can be raised again to
- Figure 5 shows an end group of a projection objective configured in this manner with a lens member made of two wrung-together KCl lens elements and as the closing member on the image side two wrung-together monocrystalline NaCl lens elements.
- the crystallographic orientations of the lens elements are in each case rotated relative to each .o ⁇ Ler—Jox—-the—c-ompen-sa-t-i-on—of—bi-re-f-r-ing-e-ne-e—
- FIG. 6 Another example is illustrated in Figure 6, where an individual KCl crystal lens is arranged in combination with an NaCl lens member of two wrung-together elements.
- NaCl should be used as the last optical element of positive refractive power.
- the KCl lens combines a greater refractive power with smaller intrinsic birefringence and favorable transmittance, so that the intrinsic birefringence can be compensated better and the heating of the last double lens can be kept smaller due to the reduced overall amount of absorption.
- the invention is also directed to the use of the proposed materials in 248 nm or 193 nm lithography applications; to the use of the optical near field or immersion simultaneously with the proposed materials; to the compensation of the intrinsic birefringence in NaCl at 193 nm; to the compensation of the intrinsic birefringence associated with KCl lenses; to mixed combinations in which KCl and NaCl lens elements are wrung together; to refractive indices larger than 1.75 or larger than 1.82 in lenses; to the use of chlorine compounds as a crystal material for the wavelength of 193 nm; to the location where the materials are used within the objective, i.e., .ailt-er_the— pje tu e—-top—o-3 ⁇ ---te-—a—G-o-nj-ug-a-fee—oea-fe-io-n— ⁇ -f the aperture stop and before the image plane; to an angle of incidence on the lens surface of at least 60° and preferably
- lens refers to a refractive optical element of only one material, also often referred to as lens component.
- this optical element can still be coated, in particular with anti-reflex coatings and protective coatings against chemical and physical factors such as being attacked by aggressive chemicals, being dissolved by water or other solvents (moisture protection coating) , or against scratching.
- a further crystal material that has been found suitable for the lens elements of a lithography objective is YAG (yttrium aluminum granate) . Its chemical formula is
- the refractive index of YAG is higher than in MgO.
- YAG has a good transmittance.
- YAG has been used for many years as a material to grow high-quality crystals for lasers, and with the need to continuously improve these lasers, YAG has in the meantime been developed much farther than for example MgO or spinel MgAl 2 0 4 .
- YAG is another material that is still sufficiently transmissive at 193 nm.
- YAG Based on the higher index of refraction one can estimate that an absorption edge in YAG lies at about 175 nm. This makes YAG suitable as a material for lithographic projection systems for wavelengths of 248 n and 193 nm.
- YAG is basically isotropic but exhibits intrinsic birefringence at 248 nm and in particular at 193 nm, as is also known to occur in CaF 2 and has been described above for chloride crystals.
- FIG 8 illustrates the foregoing concept schematically in an example.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/596,626 US7755839B2 (en) | 2003-12-19 | 2004-12-15 | Microlithography projection objective with crystal lens |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US53062303P | 2003-12-19 | 2003-12-19 | |
US60/530,623 | 2003-12-19 | ||
US56800604P | 2004-05-04 | 2004-05-04 | |
US60/568,006 | 2004-05-04 |
Publications (2)
Publication Number | Publication Date |
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WO2005059618A2 true WO2005059618A2 (en) | 2005-06-30 |
WO2005059618A3 WO2005059618A3 (en) | 2006-01-19 |
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Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/014100 WO2005059645A2 (en) | 2003-12-19 | 2004-12-10 | Microlithography projection objective with crystal elements |
PCT/EP2004/014290 WO2005059618A2 (en) | 2003-12-19 | 2004-12-15 | Microlithography projection objective with crystal lens |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/EP2004/014100 WO2005059645A2 (en) | 2003-12-19 | 2004-12-10 | Microlithography projection objective with crystal elements |
Country Status (3)
Country | Link |
---|---|
US (1) | US7755839B2 (en) |
JP (1) | JP5102492B2 (en) |
WO (2) | WO2005059645A2 (en) |
Cited By (129)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006047127A1 (en) * | 2004-10-21 | 2006-05-04 | Saint-Gobain Ceramics & Plastics, Inc. | Optical lens elements, semiconductor lithographic patterning apparatus, and methods for processing semiconductor devices |
DE102005010655A1 (en) * | 2005-03-08 | 2006-09-14 | Schott Ag | Method to produce optical parts for microlithography, associated lens systems and its application uses optical garnets, cubic spinels, cubic perovskites, and cubic M (II) - M (Iv) oxides |
WO2007034838A1 (en) | 2005-09-21 | 2007-03-29 | Nikon Corporation | Exposure device, exposure method, and device fabrication method |
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Also Published As
Publication number | Publication date |
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WO2005059645A9 (en) | 2006-06-08 |
WO2005059645A3 (en) | 2005-10-20 |
US7755839B2 (en) | 2010-07-13 |
WO2005059618A3 (en) | 2006-01-19 |
JP2007529762A (en) | 2007-10-25 |
JP5102492B2 (en) | 2012-12-19 |
US20070091451A1 (en) | 2007-04-26 |
WO2005059645A2 (en) | 2005-06-30 |
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