WO2005057668A1 - Abtastkopf für optische positionsmesssysteme - Google Patents
Abtastkopf für optische positionsmesssysteme Download PDFInfo
- Publication number
- WO2005057668A1 WO2005057668A1 PCT/EP2004/008483 EP2004008483W WO2005057668A1 WO 2005057668 A1 WO2005057668 A1 WO 2005057668A1 EP 2004008483 W EP2004008483 W EP 2004008483W WO 2005057668 A1 WO2005057668 A1 WO 2005057668A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- scanning head
- head according
- grating
- doped
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 12
- 239000004065 semiconductor Substances 0.000 claims abstract description 22
- 230000005540 biological transmission Effects 0.000 claims description 23
- 239000000758 substrate Substances 0.000 claims description 10
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 6
- 239000004020 conductor Substances 0.000 description 12
- 238000000034 method Methods 0.000 description 8
- 238000005530 etching Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 5
- 230000007547 defect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
- G01D5/34707—Scales; Discs, e.g. fixation, fabrication, compensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
- H01L31/1055—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type the devices comprising amorphous materials of Group IV of the Periodic Table
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
Definitions
- the technologically well controllable amorphous silicon (a-Si) is particularly suitable, the use of which for converting light into electrical current e.g. is known from the field of solar cells.
- the object of the invention is to provide a scanning head for an optical position measuring device which is simplified compared to the prior art and which delivers the best possible signals for position determination.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optical Transform (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04763589A EP1695391B1 (de) | 2003-12-10 | 2004-07-29 | Abtastkopf für optische positionsmesssysteme |
US10/582,661 US7719075B2 (en) | 2003-12-10 | 2004-07-29 | Scanning head for optical position-measuring systems |
JP2006543373A JP4546485B2 (ja) | 2003-12-10 | 2004-07-29 | 光学位置測定システム用の走査ヘッド |
KR1020067010835A KR101077682B1 (ko) | 2003-12-10 | 2004-07-29 | 광위치측정장치용 스캐닝헤드 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10357654A DE10357654A1 (de) | 2003-12-10 | 2003-12-10 | Abtastkopf für optische Positionsmeßsysteme |
DE10357654.1 | 2003-12-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005057668A1 true WO2005057668A1 (de) | 2005-06-23 |
Family
ID=34672537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2004/008483 WO2005057668A1 (de) | 2003-12-10 | 2004-07-29 | Abtastkopf für optische positionsmesssysteme |
Country Status (7)
Country | Link |
---|---|
US (1) | US7719075B2 (de) |
EP (1) | EP1695391B1 (de) |
JP (1) | JP4546485B2 (de) |
KR (1) | KR101077682B1 (de) |
CN (1) | CN100474638C (de) |
DE (1) | DE10357654A1 (de) |
WO (1) | WO2005057668A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2005480A2 (de) * | 2006-03-21 | 2008-12-24 | Shimon Maimon | Fotodetektor mit verringertem dunkelstrom |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010002902A1 (de) * | 2010-03-16 | 2011-09-22 | Dr. Johannes Heidenhain Gmbh | Abtasteinheit für eine optische Positionsmesseinrichtung |
DE102010003904A1 (de) | 2010-04-13 | 2011-10-13 | Dr. Johannes Heidenhain Gmbh | Abtastbaueinheit einer Positionsmesseinrichtung |
WO2012022001A2 (de) * | 2010-08-19 | 2012-02-23 | Elesta Relays Gmbh | Positionsmessvorrichtung und verfahren zur ermittlung einer absoluten position |
CH703647A1 (de) * | 2010-08-19 | 2012-02-29 | Elesta Relays Gmbh | Positionsmessvorrichtung und Verfahren zu deren Herstellung. |
DE102012221566A1 (de) | 2012-11-26 | 2014-05-28 | Dr. Johannes Heidenhain Gmbh | Optische Positionsmesseinrichtung |
US9562793B2 (en) | 2014-11-17 | 2017-02-07 | Mitutoyo Corporation | Illumination portion for an optical encoder |
US9689715B2 (en) | 2015-05-19 | 2017-06-27 | Mitutoyo Corporation | Light source array used in an illumination portion of an optical encoder |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1269634A (en) * | 1968-06-12 | 1972-04-06 | Nat Res Dev | Improvements in or relating to radiation detectors |
DE19961250A1 (de) * | 1998-12-23 | 2000-08-31 | Cis Inst Fuer Mikrosensorik Gg | Fotoelektrisches Weg- und Winkelmeßsystem |
WO2001084083A1 (de) * | 2000-04-28 | 2001-11-08 | Dr. Johannes Heidenhain Gmbh | Abtasteinheit für eine optische positionsmesseinrichtung |
US20020018220A1 (en) * | 2000-08-07 | 2002-02-14 | Mitutoyo Corporation | Optical displacement-measuring apparatus |
US20020021450A1 (en) * | 2000-07-10 | 2002-02-21 | Mitutoyo Corporation | Light spot position sensor and displacement measuring device |
EP1182705A1 (de) * | 1999-10-18 | 2002-02-27 | Nippon Sheet Glass Co., Ltd. | Lichtaufnahmeelement-matrix und lichtaufnahmeelementmatrix-chip |
DE10118796A1 (de) * | 2001-04-05 | 2002-10-17 | Heidenhain Gmbh Dr Johannes | Optoelektronischer Strahlungsempfänger für eine Abtasteinheit eines fotoelektrischen Positionsmeßsystems |
JP2003227735A (ja) * | 2002-01-31 | 2003-08-15 | Olympus Optical Co Ltd | 光学式エンコーダーおよびそのセンサーヘッド |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4885622A (en) * | 1984-03-23 | 1989-12-05 | Oki Electric Industry Co., Ltd. | Pin photodiode and method of fabrication of the same |
JPS61229370A (ja) * | 1985-04-03 | 1986-10-13 | Oki Electric Ind Co Ltd | 光センサ素子の製造方法 |
JPH0513803A (ja) * | 1991-06-28 | 1993-01-22 | Canon Inc | 光電変換装置 |
DE4323712C2 (de) | 1993-07-15 | 1997-12-11 | Heidenhain Gmbh Dr Johannes | Lichtelektrische Längen- oder Winkelmeßeinrichtung |
DE19527287C2 (de) | 1995-07-26 | 2000-06-29 | Heidenhain Gmbh Dr Johannes | Fotoelektrisches Weg- und Winkelmeßsystem zum Messen der Verschiebung zweier Objekte zueinander |
DE19859670A1 (de) | 1998-12-23 | 2000-06-29 | Heidenhain Gmbh Dr Johannes | Abtastkopf und Verfahren zu dessen Herstellung |
JP4350220B2 (ja) | 1999-08-06 | 2009-10-21 | 株式会社ミツトヨ | 変位測定装置 |
JP2002009328A (ja) | 2000-06-21 | 2002-01-11 | Mitsutoyo Corp | 受光素子アレイ及びその製造方法 |
JP4244125B2 (ja) * | 2001-09-13 | 2009-03-25 | 株式会社ミツトヨ | 光電式エンコーダ |
-
2003
- 2003-12-10 DE DE10357654A patent/DE10357654A1/de not_active Withdrawn
-
2004
- 2004-07-29 JP JP2006543373A patent/JP4546485B2/ja not_active Expired - Fee Related
- 2004-07-29 WO PCT/EP2004/008483 patent/WO2005057668A1/de active Application Filing
- 2004-07-29 KR KR1020067010835A patent/KR101077682B1/ko active IP Right Grant
- 2004-07-29 EP EP04763589A patent/EP1695391B1/de not_active Not-in-force
- 2004-07-29 CN CNB2004800366525A patent/CN100474638C/zh not_active Expired - Fee Related
- 2004-07-29 US US10/582,661 patent/US7719075B2/en not_active Expired - Fee Related
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1269634A (en) * | 1968-06-12 | 1972-04-06 | Nat Res Dev | Improvements in or relating to radiation detectors |
DE19961250A1 (de) * | 1998-12-23 | 2000-08-31 | Cis Inst Fuer Mikrosensorik Gg | Fotoelektrisches Weg- und Winkelmeßsystem |
EP1182705A1 (de) * | 1999-10-18 | 2002-02-27 | Nippon Sheet Glass Co., Ltd. | Lichtaufnahmeelement-matrix und lichtaufnahmeelementmatrix-chip |
WO2001084083A1 (de) * | 2000-04-28 | 2001-11-08 | Dr. Johannes Heidenhain Gmbh | Abtasteinheit für eine optische positionsmesseinrichtung |
US20020021450A1 (en) * | 2000-07-10 | 2002-02-21 | Mitutoyo Corporation | Light spot position sensor and displacement measuring device |
US20020018220A1 (en) * | 2000-08-07 | 2002-02-14 | Mitutoyo Corporation | Optical displacement-measuring apparatus |
DE10118796A1 (de) * | 2001-04-05 | 2002-10-17 | Heidenhain Gmbh Dr Johannes | Optoelektronischer Strahlungsempfänger für eine Abtasteinheit eines fotoelektrischen Positionsmeßsystems |
JP2003227735A (ja) * | 2002-01-31 | 2003-08-15 | Olympus Optical Co Ltd | 光学式エンコーダーおよびそのセンサーヘッド |
US20040036017A1 (en) * | 2002-01-31 | 2004-02-26 | Olympus Optical Co., Ltd. | Optical encoder and sensor head of the same |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 2003, no. 12 5 December 2003 (2003-12-05) * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2005480A2 (de) * | 2006-03-21 | 2008-12-24 | Shimon Maimon | Fotodetektor mit verringertem dunkelstrom |
EP2005480A4 (de) * | 2006-03-21 | 2013-01-09 | Shimon Maimon | Fotodetektor mit verringertem dunkelstrom |
Also Published As
Publication number | Publication date |
---|---|
US7719075B2 (en) | 2010-05-18 |
JP4546485B2 (ja) | 2010-09-15 |
CN100474638C (zh) | 2009-04-01 |
DE10357654A1 (de) | 2005-07-14 |
EP1695391B1 (de) | 2012-11-14 |
JP2007514151A (ja) | 2007-05-31 |
EP1695391A1 (de) | 2006-08-30 |
US20070278486A1 (en) | 2007-12-06 |
KR20060129207A (ko) | 2006-12-15 |
CN1890819A (zh) | 2007-01-03 |
KR101077682B1 (ko) | 2011-10-27 |
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