WO2005029103A1 - Method and device for simulating test sets - Google Patents

Method and device for simulating test sets Download PDF

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Publication number
WO2005029103A1
WO2005029103A1 PCT/CA2004/001681 CA2004001681W WO2005029103A1 WO 2005029103 A1 WO2005029103 A1 WO 2005029103A1 CA 2004001681 W CA2004001681 W CA 2004001681W WO 2005029103 A1 WO2005029103 A1 WO 2005029103A1
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WO
WIPO (PCT)
Prior art keywords
test
signal
unit
under test
configurable
Prior art date
Application number
PCT/CA2004/001681
Other languages
French (fr)
Inventor
Peter Jansen
Michael Scott Cobb
Paul A. Neal
Viral H. Chokshi
Original Assignee
Mindready Solutions Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mindready Solutions Inc. filed Critical Mindready Solutions Inc.
Publication of WO2005029103A1 publication Critical patent/WO2005029103A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks

Definitions

  • ECU Electronic control units
  • electronic control units form an interface to components such as motors, solenoids, lamps, etc.
  • modern cars may include a plurality of different electronic control units controlling several components that may include the engine, the transmission, the ABS brakes, the mirrors, the window motors, the lights, the seat position, etc.; for example, an electronic control unit can be designed to read the position of a car mirror via a position detector or the number of rotations per minutes (RPM) of a motor.
  • RPM rotations per minutes
  • Electronic control units are also found in many other types of equipments such as, in particular but not exclusively, aircraft, trucks, soil- handling equipments, chemical production plant machinery, heavy industrial machinery, knitting machines, potato chip packaging machines, two-wheeled vehicles, etc.
  • test devices Although some rather expensive test devices addressing the market of simulation exist, these devices can only be used for testing a single type of electronic control unit. In most of the cases, these test devices are supplied by sellers who also supply the electronic control unit to be tested by the device.
  • a device for performing a given test on a given unit under test comprising a configurable test signal generating unit for providing a test signal to the unit under test, a test signal measuring unit for measuring a test result signal produced by the unit under test in response to the test signal, and a processing unit for configuring the configurable test signal generating unit in accordance with both the given test and the given unit under test and for receiving the measured test result signal and providing at least a part of the received measured test result signal.
  • the present invention also relates to a configurable test device for testing a plurality of units under test.
  • This configurable test device comprises a plurality of configurable test signal generating units, each structured for providing a test signal to a corresponding one of the units under test in accordance with both a corresponding test to perform and the corresponding one of the units under test.
  • the configurable test device also comprises a plurality of test signal measuring units, each structured for measuring a test result signal produced by a respective one of the units under test in response to the test signal provided to the respective one of the units under test.
  • the present invention is further concerned with a method for performing a given test on a given unit under test, comprising configuring a configurable test signal generating unit in accordance with the specific test and with the given unit under test, configuring a configurable test signal measuring unit in accordance with at least one of the given test and the given unit under test, by means of the configured test signal generating unit providing a test signal to the unit under test, by means of the configured test signal measuring unit measuring a test result signal produced by the unit under test in response to the test signal, and providing the measured test result signal.
  • Fig. 4 is a block diagram of a current measuring unit of the test module of Fig. 2, this current measuring unit comprising a current signal conditioner and an analog-to-digital converter;
  • Fig. 5 is a block diagram of a voltage measuring unit of the test module of Fig. 2, this voltage measuring unit comprising a voltage signal conditioner, an analog-to-digital converter, and a programmable load; and
  • Fig. 6 is a flowchart illustrating an example of operation of thetest module of Fig. 2.
  • Figure 1 illustrates a configurable test device 6 according to a non- restrictive illustrative embodiment of the present invention.
  • This configurable test device 6 is structured to test a unit under test 8.
  • the test device 6 comprises at least one test module 10.
  • the non- restrictive illustrative embodiment of Figure 1 comprises a plurality of test modules 10.
  • Each test module 10 is connected to at least one port 32 of a unit under test 8.
  • each port 32 can be assimilated to an individual unit under test.
  • each test module 10 is used to test a single unit under test port 32.
  • each test module 10 of Figure 1 supplies a test signal 320 to the corresponding unit under test port 32.
  • the unit under test port 32 supplies a test result signal 321 to the corresponding test module 10.
  • the configurable test device 6 comprises a plurality of test modules 10.
  • Each test module 10 is interconnected with at least one other test module 10; in the non-restrictive illustrative embodiment of Figure 1, the plurality of test modules 10 are interconnected through an inter test module communication signal 100.
  • the inter test module communication signal 100 is propagated using at least one of a serial and a parallel communication scheme.
  • the inter test module communication signal 100 can be used to control each of the plurality of test modules 10, for example a setup, a test initiation, a test selection, etc. of the test module 10.
  • one of the test modules 10 may trigger another one of these test modules using the inter test module communication signal 100.
  • Figure 2 is an example of test module 10 of the non-restrictive illustrative embodiment of configurable test unit 6 as illustrated in Figure 1.
  • the test module 10 of Figure 2 comprises a voltage/current generating unit 20, a digital signal generating unit 21 , a voltage measuring unit 22, a processing unit 24, an input/output communication unit 26, a memory 28 and a current measuring unit 30.
  • test module 10 is used for testing a unit under test port 32.
  • the voltage/current generating unit 20 generates a voltage/current signal 200 supplied to the unit under test port 32, when this voltage/current signal 200 is required to perform a given test on the unit under test port 32.
  • the voltage/current signal 200 is generated in response to and as a function of a voltage/current to generate signal 240 from the processing unit 24, in order to perform the given test on the unit under test port 32. More specifically, the voltage/current signal 200 is designed as a function of the voltage/current to generate signal 240 to perform that given, specific test on the unit under test port 32.
  • the digital signal generating unit 21 generates a digital signal 210 supplied to the unit under test port 32, when this digital signal 210 is required to perform the given test on the unit under test port 32.
  • the digital signal 210 is generated in response to and as a function of a digital signal to generate signal 241 from the processing unit 24, in order to perform the given test on the unit under test port 32. More specifically, the digital signal 210 is designed as a function of the digital signal to generate signal 241 to perform that given, specific test on the unit under test port 32.
  • the digital signal 210 is generated by and supplied from directly the processing unit 241.
  • the unit under test port 32 will supply a test result signal 321 including a voltage signal component 322 and a current signal component 323.
  • test result signal 3221 Those of ordinary skill in the art will appreciate that, depending on the intended application, only one or both the voltage and current measurements can be performed on the test result signal 321.
  • the test module 10 comprises a configurable test signal measuring unit 18 including a voltage measuring unit 22 and a current measuring unit 30.
  • the voltage measuring unit 22 receives the voltage signal component 322 of the test result signal 321 from the unit under test port 32; this voltage signal component 322 is used in the case where it is desirable to measure the voltage component of the test result signal 321. In response to the voltage signal component 322, the voltage measuring unit 22 produces a measured voltage signal 220 supplied to the processing unit 24.
  • the current measuring unit 30 receives the current signal component 323 of the test result signal 321 from the unit under test port 32; this current signal component 323 is used in the case where it is desirable to measure the current component of the test result signal 321. In response to the current signal component, the current measuring unit 30 produces a measured current signal 300 supplied to the processing unit 24.
  • the processing unit 24 may process, as required to perform the given test, at least one of the received measured voltage signal 220 and received measured current signal 300 through at least one of the following operations: filtering, decimating, averaging, RMS level, FFT transform, etc.
  • the memory 28, connected to the processing unit 24, can also be used to store at least one test set to perform on the unit under test port 32.
  • the at least one test set is not stored in the memory 28 but is supplied to the processing unit 24 through the input/output communication unit 26.
  • the voltage/current generating unit 20 of Fig. 3 comprises a voltage source 34, a current source 36, an arbitrary waveform generator 38, a switching unit 39, a digital-to-analog converter 40, a voltage source amplifier 42, a current source amplifier 44, and a signal amplifier 46.
  • the arbitrary waveform generator 38 generates an arbitrary waveform signal 380.
  • the arbitrary waveform signal 380 can be a digital-type signal.
  • the switching unit 39 is used to select one of the arbitrary waveform signal 380 generated by the arbitrary waveform generator 38 and the digital signal to generate signal 241 from the processing unit 24. Although this is not shown in the appended drawings, the switching unit 39 can be controlled by the processing unit 24 and operated in relation to the test to be performed to select as digital signal 390 the most suitable signal between the arbitrary waveform signal 380 and the digital signal to generate signal 241. The selected digital signal 390 is subsequently supplied to the analog-to-digital converter 40.
  • the analog-to-digital converter 40 converts the digital signal 390 into an analog signal 400 supplied to the signal amplifier 46.
  • the voltage source 34 In response to the amplified generated signal 460, the voltage source 34 produces a voltage signal 340.
  • the voltage signal 340 is then amplified by the voltage source amplifier 42 to produce a voltage signal 420 amplified to an amplitude suitable for conducting the test on the unit under test port 32.
  • the current measuring unit 30 comprises a current signal conditioner 50 and an analog-to-digital converter 52.
  • the current, signal conditioner 50 receives the current signal 440 from the current source amplifier 44, and the current signal component 323 produced by the unit under test port 32 in response to the test performed. More specifically, the current signal conditioner 50 conditions at least one of the signals 440 and 323 through, for example, selectable gain stages, attenuation stages and filtering to produce a conditioned current signal 501 suitable for processing by, for example, unit 24.
  • the conditioned current signal 501 from the current signal conditioner 50 is supplied to the analog-to-digital converter 52.
  • the analog-to-digital converter 52 converts the conditioned current signal 501 into a digital measured current signal 300 supplied to the processing unit 24.
  • the voltage measuring unit 22 comprises a voltage signal conditioner 60, an analog-to-digital converter 62, and a programmable load 64.
  • the voltage signal conditioner 60 receives one of the voltage signal 420 from the voltage source amplifier 42, and the voltage signal component 322 produced by the unit under test port 32 in response to the test being performed.
  • the programmable load 64 also receives the voltage signal component 322.
  • the load 64 is used to simulate a specific input impedance and is programmed, for example by the processing unit 20, in relation to the test . being performed.
  • the specific input impedance can be a resistance while, according to alternatives, this impedance can be at least one of a resistance, a capacitance and an inductance.
  • the voltage measuring unit enables, for example, the processing unit 24 to determine the output impedance of the unit under test port 32; for that purpose, the voltage signal conditioner 60 receives a programmable load voltage signal 640 supplied from the programmable load 64.
  • the an impedance formed of at least one of a resistance, a capacitance and an inductance would improve the versatility of the test device 6 in performing tests on the unit under test port 32.
  • the voltage signal conditioner 60 conditions at least one of the voltage signal 420, the voltage signal component 322 and the programmable load voltage signal 640 through, for example, selectable gain stages, attenuation stages and/or filtering to produce a conditioned voltage signal 601 suitable for processing by, for example, unit 24.
  • a conditioned voltage signal 600 is then supplied to the analog-to- digital converter 62.
  • the analog-to-digital converter 62 converts the conditioned voltage signal 600 into a digital measured voltage signal 220 supplied to the processing unit 24.
  • Fig. 6 illustrates a flow chart showing how the test module 10 operates in the non-restrictive illustrative embodiment of the present invention.
  • test module 10 To configure the test module 10 in accordance with a test to perform, the following operations are conducted.
  • Operation 70 consists of selecting a test to perform using test selection data.
  • the test to perform can be selected by the processing unit 24 in the memory 28.
  • the test to perform can be selected via the input/output communication unit 26.
  • the test to perform can be selected by a user via a graphics user interface (GUI) displayed on the display of a computer device (not shown) connected to the test module 10 via the input/output communication unit 26.
  • GUI graphics user interface
  • the user may create a test program comprising a plurality of functions, each function being adapted to perform a particular test.
  • the test selection data may comprise data enabling selection of a configurable test signal generating unit 16 ( Figure 2) and a configurable test signal measuring unit 18 ( Figure 2).
  • the test selection data may further comprise data indicative of the test to perform.
  • the data indicative of a test to perform may be provided in a compressed form or in an uncompressed form.
  • the configurable test signal generating unit 16 may comprise at least one of a voltage source and a current source.
  • the configurable test signal generating unit 16 comprises the voltage/current generating unit 20.
  • the configurable test signal measuring unit 18 may comprise at least one of a voltage measuring unit and a current measuring unit.
  • the configurable test signal measuring unit 18 comprises the voltage measuring unit 22 and the current measuring unit 30.
  • Operation 72 configures the configurable test signal generating unit 16 in relation to at least a part of the test selection data.
  • a voltage source may be used while for another test, a current source may be used.
  • various parameters of the configurable test signal generating unit 16 may be configured such as the amplitude, shape, frequency, duration of the signal etc.
  • Operation 74 configures the configurable test signal measuring unit 18 in relation to at least a part of the test selection data.
  • Those of ordinary skill in the art will appreciate that for a given test, it may be desirable to measure a voltage signal while for another test it may be desirable to measure a current signal. Alternatively, it may be desirable to receive only a digital signal.
  • various parameters of the configurable test signal measuring unit 18 may be configured such as the type of signal to collect, a filtering to apply, an input impedance to simulate, an expected level to measure or the like. Alternatively, the configurable test signal measuring unit 18 may automatically adjusts its signal range to the signal to collect.
  • at least one of the voltage signal conditioner 60, the programmable load 64 and the analog-to- digital converter 62 could be configured.
  • Operation 76 provides a test signal (such as 200 in Fig. 2) to the unit under test port 32.
  • a test signal such as 200 in Fig. 2
  • the configured test signal generating unit 16 adapts the test signal both to the test to be performed and the nature of the unit under test port 32.
  • a test result signal (such as signal 321 in Figure 2) is supplied by the unit under test port 32 and measured by the configured test signal measuring unit 18.
  • the measured test result signal is supplied by the configured test signal measuring unit 18.
  • the measured test result signal is supplied to the processing unit 24 by the configured test signal measuring unit 18.
  • the measured test result signal is supplied to another component, remote or not, via the processing unit 24 and the input/output communication unit 26.
  • the measured test result signal can also be stored in the memory 28 for subsequent processing.
  • test architecture also referred to as a system per pin architecture (e.g., each circuit is connected to a unit under test (UUT) pin (port)) is of great advantage.
  • each test module 10 circuit can be individually programmed in order to perform any required test. This brings a high flexibility which is of great advantage as it practically eliminates any expensive external signal switching (multiplexing) requirements.
  • the system may also be configured with a limited number of test modules such as 10 complemented by integrated switching in order to provide an access to a very large numbers of unit under test ports such as 32.
  • Such system architecture could be used in reliability testing of many ECUs over an extended period of time.

Abstract

A method and device for testing a unit under test comprise a configurable test signal generating unit, a test signal measuring unit and a processing unit, wherein the configurable test signal generating unit and the test signal measuring unit are configured in accordance with a test to perform and the unit under test.

Description

METHOD AND DEVICE FOR SIMULATING TEST SETS
FIELD OF THE INVENTION
[0001] The present invention relates to the field of electronics. More specifically, the present invention pertains to the field of testing an electronic component.
BACKGROUND OF THE INVENTION
[0002] Electronic control units (ECU) are commercialized under many forms ranging from a small printed circuit board to complex electronic devices packaged in hardened enclosures.
[0003] Also, electronic control units normally comprise a central microprocessor with a serial or parallel bus. More specifically, electronic control units may either comprise their own processor or form part of a larger processor board depending on the specific application.
[0004] As well known to those of ordinary skill in the art, electronic control units include parameters that widely vary from one electronic control unit to another. Such parameters may comprise, for example, current, voltage, power requirements per port (pin), etc.
[0005] In many instances electronic control units form an interface to components such as motors, solenoids, lamps, etc. As an example, modern cars may include a plurality of different electronic control units controlling several components that may include the engine, the transmission, the ABS brakes, the mirrors, the window motors, the lights, the seat position, etc.; for example, an electronic control unit can be designed to read the position of a car mirror via a position detector or the number of rotations per minutes (RPM) of a motor. [0006] Electronic control units are also found in many other types of equipments such as, in particular but not exclusively, aircraft, trucks, soil- handling equipments, chemical production plant machinery, heavy industrial machinery, knitting machines, potato chip packaging machines, two-wheeled vehicles, etc.
[0007] No test device capable of addressing the testing of such a wide variety of electronic control units is available on the market. And electronic control units cannot be readily tested through presently commercialized conventional testers.
[0008] Although some rather expensive test devices addressing the market of simulation exist, these devices can only be used for testing a single type of electronic control unit. In most of the cases, these test devices are supplied by sellers who also supply the electronic control unit to be tested by the device.
[0009] Therefore, there is a need for a test method and device capable of overcoming the above-discussed drawbacks.
SUMMARY OF THE INVENTION
[0010] More specifically, according to the present invention, there is provided A device for performing a given test on a given unit under test, comprising a configurable test signal generating unit for providing a test signal to the unit under test, a test signal measuring unit for measuring a test result signal produced by the unit under test in response to the test signal, and a processing unit for configuring the configurable test signal generating unit in accordance with both the given test and the given unit under test and for receiving the measured test result signal and providing at least a part of the received measured test result signal.
[0011] The present invention also relates to a configurable test device for testing a plurality of units under test. This configurable test device comprises a plurality of configurable test signal generating units, each structured for providing a test signal to a corresponding one of the units under test in accordance with both a corresponding test to perform and the corresponding one of the units under test. The configurable test device also comprises a plurality of test signal measuring units, each structured for measuring a test result signal produced by a respective one of the units under test in response to the test signal provided to the respective one of the units under test. The configurable test device further comprises a plurality of processing units each structured for configuring the test signal generating unit corresponding to a given one of the units under test, receiving the measured test result signal from the test signal measuring unit corresponding to the given one of the units under test, and providing at least a part of the received measured test result signal.
[0012] The present invention is further concerned with a method for performing a given test on a given unit under test, comprising configuring a configurable test signal generating unit in accordance with the specific test and with the given unit under test, configuring a configurable test signal measuring unit in accordance with at least one of the given test and the given unit under test, by means of the configured test signal generating unit providing a test signal to the unit under test, by means of the configured test signal measuring unit measuring a test result signal produced by the unit under test in response to the test signal, and providing the measured test result signal.
[0013] The foregoing and other objects, advantages and features of the present invention will become more apparent upon reading of the following non restrictive description of an illustrative embodiment thereof, given by way of example only with reference to the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0014] In the appended drawings: [0015] Fig. 1 is a block diagram of a non restrictive illustrative embodiment of a configurable test device according to the present invention, comprising a plurality of test modules and used in order to test a unit under test comprising a plurality of unit under test ports;
[0016] Fig. 2 is a block diagram of a test module of the test device of Fig. 1 , which comprises a voltage/current generating unit, a digital signal generating unit, a processing unit, a voltage measuring unit, a current measuring unit, a memory and an input/output communication unit;
[0017] Fig. 3 is a block diagram of a voltage/current generating unit of the test module of Fig. 2;
[0018] Fig. 4 is a block diagram of a current measuring unit of the test module of Fig. 2, this current measuring unit comprising a current signal conditioner and an analog-to-digital converter;
[0019] Fig. 5 is a block diagram of a voltage measuring unit of the test module of Fig. 2, this voltage measuring unit comprising a voltage signal conditioner, an analog-to-digital converter, and a programmable load; and
[0020] Fig. 6 is a flowchart illustrating an example of operation of thetest module of Fig. 2.
[0021] In the appended drawings, like features are identified by like reference numerals.
DETAILED DESCRIPTION OF THE ILLUSTRATIVE EMBODIMENT
[0022] Figure 1 illustrates a configurable test device 6 according to a non- restrictive illustrative embodiment of the present invention. This configurable test device 6 is structured to test a unit under test 8. [0023] The test device 6 comprises at least one test module 10. The non- restrictive illustrative embodiment of Figure 1 comprises a plurality of test modules 10. Each test module 10 is connected to at least one port 32 of a unit under test 8. Although the non-restrictive illustrative embodiment will be described with reference to testing of ports 32 forming part of a unit under test 8, each port 32 can be assimilated to an individual unit under test. In the non- restrictive illustrative embodiment of Figure 1 , each test module 10 is used to test a single unit under test port 32. Alternatively, a plurality of test modules 10 could be used to test a single unit under test port 32. According to another alternative, a single test module 10 could be used to test a plurality of unit under test ports 32 through, for example, an adequate switching unit (not shown).
[0024] More specifically, each test module 10 of Figure 1 supplies a test signal 320 to the corresponding unit under test port 32. In response to the test signal 320, the unit under test port 32 supplies a test result signal 321 to the corresponding test module 10.
[0025] Therefore, according to the non-restrictive illustrative embodiment of Figure 1 , the configurable test device 6 comprises a plurality of test modules 10. Each test module 10 is interconnected with at least one other test module 10; in the non-restrictive illustrative embodiment of Figure 1, the plurality of test modules 10 are interconnected through an inter test module communication signal 100. The inter test module communication signal 100 is propagated using at least one of a serial and a parallel communication scheme. In fact, the inter test module communication signal 100 can be used to control each of the plurality of test modules 10, for example a setup, a test initiation, a test selection, etc. of the test module 10. Those of ordinary skill in the art will appreciate that one of the test modules 10 may trigger another one of these test modules using the inter test module communication signal 100.
[0026] Figure 2 is an example of test module 10 of the non-restrictive illustrative embodiment of configurable test unit 6 as illustrated in Figure 1. [0027] According to the non-restrictive illustrative embodiment, the test module 10 of Figure 2 comprises a voltage/current generating unit 20, a digital signal generating unit 21 , a voltage measuring unit 22, a processing unit 24, an input/output communication unit 26, a memory 28 and a current measuring unit 30.
[0028] As indicated in the foregoing description, the test module 10 is used for testing a unit under test port 32.
[0029] As illustrated in Figure 2, the test module 10 comprises a configurable test signal generating unit 16 formed by the voltage/current generating unit 20 and the digital signal generating unit 21.
[0030] The voltage/current generating unit 20 generates a voltage/current signal 200 supplied to the unit under test port 32, when this voltage/current signal 200 is required to perform a given test on the unit under test port 32. The voltage/current signal 200 is generated in response to and as a function of a voltage/current to generate signal 240 from the processing unit 24, in order to perform the given test on the unit under test port 32. More specifically, the voltage/current signal 200 is designed as a function of the voltage/current to generate signal 240 to perform that given, specific test on the unit under test port 32.
[0031] The digital signal generating unit 21 generates a digital signal 210 supplied to the unit under test port 32, when this digital signal 210 is required to perform the given test on the unit under test port 32. The digital signal 210 is generated in response to and as a function of a digital signal to generate signal 241 from the processing unit 24, in order to perform the given test on the unit under test port 32. More specifically, the digital signal 210 is designed as a function of the digital signal to generate signal 241 to perform that given, specific test on the unit under test port 32.
[0032] In accordance with a possible alternative, the digital signal 210 is generated by and supplied from directly the processing unit 241. [0033] In response to the test, more specifically in response to the voltage/current signal 200 and/or digital signal 210, the unit under test port 32 will supply a test result signal 321 including a voltage signal component 322 and a current signal component 323.
[0034] Those of ordinary skill in the art will appreciate that, depending on the intended application, only one or both the voltage and current measurements can be performed on the test result signal 321.
[0035] For that purpose, as illustrated in Figure 2, the test module 10 comprises a configurable test signal measuring unit 18 including a voltage measuring unit 22 and a current measuring unit 30.
[0036] Still referring to Figure 2, the voltage measuring unit 22 receives the voltage signal component 322 of the test result signal 321 from the unit under test port 32; this voltage signal component 322 is used in the case where it is desirable to measure the voltage component of the test result signal 321. In response to the voltage signal component 322, the voltage measuring unit 22 produces a measured voltage signal 220 supplied to the processing unit 24.
[0037] In the same manner, the current measuring unit 30 receives the current signal component 323 of the test result signal 321 from the unit under test port 32; this current signal component 323 is used in the case where it is desirable to measure the current component of the test result signal 321. In response to the current signal component, the current measuring unit 30 produces a measured current signal 300 supplied to the processing unit 24.
[0038] To perform a given test on the unit under test port 32, the processing unit 24 configures the voltage/current generating unit 20, the digital signal generating unit 21 , the voltage measuring unit 22 and the current measuring unit 30 in accordance with the given, particular test to be performed and further in accordance with the structure of the unit under test port 32. Those of ordinary skill in the art will appreciate that the structure of the test module 10 of Figure 2 is capable of performing a wide variety of tests on a wide variety of unit under test ports 32.
[0039] The processing unit 24 may process, as required to perform the given test, at least one of the received measured voltage signal 220 and received measured current signal 300 through at least one of the following operations: filtering, decimating, averaging, RMS level, FFT transform, etc.
[0040] Alternatively, the processing unit 24 may not process the said at least one of the received measured voltage signal 220 and the received measured current signal 300. The memory 28 can then be used to store at least a part of at least one of the received measured voltage signal 220 and the received measured current signal 300 for subsequent transmission and/or analysis.
[0041] The memory 28, connected to the processing unit 24, can also be used to store at least one test set to perform on the unit under test port 32. Alternatively, the at least one test set is not stored in the memory 28 but is supplied to the processing unit 24 through the input/output communication unit 26.
[0042] Fig. 3 illustrates an example of voltage/current generating unit 20.
[0043] The voltage/current generating unit 20 of Fig. 3 comprises a voltage source 34, a current source 36, an arbitrary waveform generator 38, a switching unit 39, a digital-to-analog converter 40, a voltage source amplifier 42, a current source amplifier 44, and a signal amplifier 46.
[0044] The arbitrary waveform generator 38 generates an arbitrary waveform signal 380. For example, the arbitrary waveform signal 380 can be a digital-type signal.
[0045] The switching unit 39 is used to select one of the arbitrary waveform signal 380 generated by the arbitrary waveform generator 38 and the digital signal to generate signal 241 from the processing unit 24. Although this is not shown in the appended drawings, the switching unit 39 can be controlled by the processing unit 24 and operated in relation to the test to be performed to select as digital signal 390 the most suitable signal between the arbitrary waveform signal 380 and the digital signal to generate signal 241. The selected digital signal 390 is subsequently supplied to the analog-to-digital converter 40.
[0046] The analog-to-digital converter 40 converts the digital signal 390 into an analog signal 400 supplied to the signal amplifier 46.
[0047] The signal amplifier 46 amplifies the analog signal 400 to produce an amplified generated signal 460 supplied to at least one of the voltage source 34 and current source 36. The function of the amplifier 46 is to produce an amplified generated signal 460 having a level acceptable by the voltage 34 and current 36 sources.
[0048] In response to the amplified generated signal 460, the voltage source 34 produces a voltage signal 340. The voltage signal 340 is then amplified by the voltage source amplifier 42 to produce a voltage signal 420 amplified to an amplitude suitable for conducting the test on the unit under test port 32.
[0049] In the same manner, in response to the amplified generated signal 460, the current source 36 produces a current signal 360. The current signal 360 is then amplified by the current source amplifier 44 to produce a current signal 440 amplified to an amplitude suitable for conducting the test on the unit under test port 32.
[0050] Those of ordinary skill in the art will appreciate that a control switch (not shown) is used in order to supply the amplified generated signal 460 to either one of the current source 36 and the voltage source 34.
[0051] A non-limitative example of current measuring unit 30 will now be described with reference to Fig. 4.
[0052] The current measuring unit 30 comprises a current signal conditioner 50 and an analog-to-digital converter 52. [0053] The current, signal conditioner 50 receives the current signal 440 from the current source amplifier 44, and the current signal component 323 produced by the unit under test port 32 in response to the test performed. More specifically, the current signal conditioner 50 conditions at least one of the signals 440 and 323 through, for example, selectable gain stages, attenuation stages and filtering to produce a conditioned current signal 501 suitable for processing by, for example, unit 24.
[0054] The conditioned current signal 501 from the current signal conditioner 50 is supplied to the analog-to-digital converter 52. The analog-to-digital converter 52 converts the conditioned current signal 501 into a digital measured current signal 300 supplied to the processing unit 24.
[0055] Fig. 5 is a block diagram of a non-limitative example of voltage measuring unit 22.
[0056] The voltage measuring unit 22 comprises a voltage signal conditioner 60, an analog-to-digital converter 62, and a programmable load 64.
[0057] The voltage signal conditioner 60 receives one of the voltage signal 420 from the voltage source amplifier 42, and the voltage signal component 322 produced by the unit under test port 32 in response to the test being performed.
[0058] The programmable load 64 also receives the voltage signal component 322. The load 64 is used to simulate a specific input impedance and is programmed, for example by the processing unit 20, in relation to the test . being performed. For example, the specific input impedance can be a resistance while, according to alternatives, this impedance can be at least one of a resistance, a capacitance and an inductance. By measuring the voltage signal component both directly and through the programmable load, the voltage measuring unit enables, for example, the processing unit 24 to determine the output impedance of the unit under test port 32; for that purpose, the voltage signal conditioner 60 receives a programmable load voltage signal 640 supplied from the programmable load 64. Those of ordinary skill in the art will appreciate that the an impedance formed of at least one of a resistance, a capacitance and an inductance would improve the versatility of the test device 6 in performing tests on the unit under test port 32.
[0059] The voltage signal conditioner 60 conditions at least one of the voltage signal 420, the voltage signal component 322 and the programmable load voltage signal 640 through, for example, selectable gain stages, attenuation stages and/or filtering to produce a conditioned voltage signal 601 suitable for processing by, for example, unit 24.
[0060] A conditioned voltage signal 600 is then supplied to the analog-to- digital converter 62. The analog-to-digital converter 62 converts the conditioned voltage signal 600 into a digital measured voltage signal 220 supplied to the processing unit 24.
[0061] Fig. 6 illustrates a flow chart showing how the test module 10 operates in the non-restrictive illustrative embodiment of the present invention.
[0062] To configure the test module 10 in accordance with a test to perform, the following operations are conducted.
[0063] Operation 70 consists of selecting a test to perform using test selection data. For example, the test to perform can be selected by the processing unit 24 in the memory 28. Alternatively, the test to perform can be selected via the input/output communication unit 26. For example, the test to perform can be selected by a user via a graphics user interface (GUI) displayed on the display of a computer device (not shown) connected to the test module 10 via the input/output communication unit 26. According to another alternative, the user may create a test program comprising a plurality of functions, each function being adapted to perform a particular test.
[0064] The test selection data may comprise data enabling selection of a configurable test signal generating unit 16 (Figure 2) and a configurable test signal measuring unit 18 (Figure 2). The test selection data may further comprise data indicative of the test to perform. Those of ordinary skill in the art will appreciate that the data indicative of a test to perform may be provided in a compressed form or in an uncompressed form.
[0065] Those of ordinary skill in the art will further appreciate that the configurable test signal generating unit 16 may comprise at least one of a voltage source and a current source. In the non-restrictive illustrative embodiment, the configurable test signal generating unit 16 comprises the voltage/current generating unit 20.
[0066] Those of ordinary skill in the art will further appreciate that the configurable test signal measuring unit 18 may comprise at least one of a voltage measuring unit and a current measuring unit. In the non-restrictive illustrative embodiment, the configurable test signal measuring unit 18 comprises the voltage measuring unit 22 and the current measuring unit 30.
[0067] Operation 72 configures the configurable test signal generating unit 16 in relation to at least a part of the test selection data. Those of ordinary skill in the art will appreciate that for a given test to be performed, a voltage source may be used while for another test, a current source may be used. Also, various parameters of the configurable test signal generating unit 16 may be configured such as the amplitude, shape, frequency, duration of the signal etc.
[0068] Operation 74 configures the configurable test signal measuring unit 18 in relation to at least a part of the test selection data. Those of ordinary skill in the art will appreciate that for a given test, it may be desirable to measure a voltage signal while for another test it may be desirable to measure a current signal. Alternatively, it may be desirable to receive only a digital signal. Furthermore, various parameters of the configurable test signal measuring unit 18 may be configured such as the type of signal to collect, a filtering to apply, an input impedance to simulate, an expected level to measure or the like. Alternatively, the configurable test signal measuring unit 18 may automatically adjusts its signal range to the signal to collect. [0069] In the case of the voltage measuring unit 22, at least one of the voltage signal conditioner 60, the programmable load 64 and the analog-to- digital converter 62 could be configured.
[0070] In the case of the current measuring unit 22, at least one of the current signal conditioner 50 and the analog to digital converter 52 could be configured.
[0071] Execution of the test can be performed through the following operations.
[0072] Operation 76 provides a test signal (such as 200 in Fig. 2) to the unit under test port 32. Obviously, the configured test signal generating unit 16 adapts the test signal both to the test to be performed and the nature of the unit under test port 32.
[0073] In operation 78, a test result signal (such as signal 321 in Figure 2) is supplied by the unit under test port 32 and measured by the configured test signal measuring unit 18.
[0074] According to operation 80, the measured test result signal is supplied by the configured test signal measuring unit 18. According to one alternative, the measured test result signal is supplied to the processing unit 24 by the configured test signal measuring unit 18. According to another alternative, the measured test result signal is supplied to another component, remote or not, via the processing unit 24 and the input/output communication unit 26. The measured test result signal can also be stored in the memory 28 for subsequent processing. Those of ordinary skill in the art will appreciate that in some cases, it may be desirable to process the measured test result signal in the test module 10 while in other cases, it may be desirable to process and store the measured test result signal outside the test module 10.
[0075] Those of ordinary skill in the art will appreciate that the above disclosed test architecture, also referred to as a system per pin architecture (e.g., each circuit is connected to a unit under test (UUT) pin (port)) is of great advantage. In fact, each test module 10 circuit can be individually programmed in order to perform any required test. This brings a high flexibility which is of great advantage as it practically eliminates any expensive external signal switching (multiplexing) requirements. Moreover, the system may also be configured with a limited number of test modules such as 10 complemented by integrated switching in order to provide an access to a very large numbers of unit under test ports such as 32. Such system architecture could be used in reliability testing of many ECUs over an extended period of time.
[0076] Although the present invention has been disclosed in the foregoing description in relation to an illustrative embodiment thereof, this embodiment can be modified at will, within the scope of the appended claims without departing from the spirit and nature of the subject invention.

Claims

WHAT IS CLAIMED IS:
1. A device for performing a given test on a given unit under test, comprising: a configurable test signal generating unit for providing a test signal to the unit under test; a test signal measuring unit for measuring a test result signal produced by the unit under test in response to the test signal; and a processing unit for configuring the configurable test signal generating unit in accordance with both the given test and the given unit under test, and for receiving the measured test result signal and providing at least a part of the received measured test result signal signal.
2. A device as defined in claim 1 , wherein the given unit under test is a unit under test port.
3. A device for performing a given test on a given unit under test, comprising: a configurable test signal generator for providing a test signal to the unit under test; a test signal detector for measuring a test result signal produced by the unit under test in response to the test signal; and a processor for configuring the configurable test signal generator in accordance with both the given test and the given unit under test, and for receiving the measured test result signal and providing at least a part of the received measured signal.
4. A device as defined in claim 3, wherein the given unit under test is a unit under test port.
5. A device as defined in claim 3, further comprising an input/output communication unit for receiving said at least a part of the received measured signal.
6. A device as defined in claim 3, wherein the test signal detector is a configurable test signal detector, and wherein the processor comprises means for configuring the test signal detector in accordance with the given test and the given unit under test.
7. A device as defined in claim 3, wherein the configurable test signal generator comprises at least one of a current source for providing a current signal, and a voltage source for providing a voltage signal.
8. A device as defined in claim 7, wherein the configurable test signal generator further comprises an arbitrary waveform generator for providing an arbitrary waveform signal, and a digital signal source for providing a digital signal, wherein said test signal is generated using at least one of said current source, said voltage source, said arbitrary waveform generator and said digital signal source.
9. A device as defined in claim 3, wherein said test signal detector comprises at least one of a voltage measuring unit and a current measuring unit.
10. A device as defined in claim 9, wherein the voltage measuring unit comprises a programmable impedance for receiving a voltage signal component of the test result signal and for providing a programmable impedance signal in response to said voltage signal component.
11. A device as defined in claim 10, wherein the programmable impedance comprises at least one of a programmable resistance, a programmable capacitance and a programmable inductance.
12. The apparatus as claimed in claim 6, further comprising a memory for providing data for configuring the configurable test signal generator and the configurable test signal detector.
13. A configurable test device for testing a plurality of units under test, said configurable test device comprising: a plurality of configurable test signal generating units, each structured for providing a test signal to a corresponding one of said units under test in accordance with both a corresponding test to perform and said corresponding one of said units under test; a plurality of test signal measuring units, each structured for measuring a test result signal produced by a respective one of said units under test in response to the test signal provided to said respective one of said units under test; and a plurality of processing units each structured for configuring the test signal generating unit corresponding to a given one of said units under test, receiving the measured test result signal from the test signal measuring unit corresponding to said given one of the units under test, and providing at least a part of said received measured test result signal.
14. A device as defined in claim 13, wherein the units under test comprises unit under test ports.
15. A configurable test device for testing a plurality of units under test, said configurable test device comprising: a plurality of configurable test signal generators, each structured for providing a test signal to a corresponding one of said units under test in accordance with both a corresponding test to perform and said corresponding one of said units under test; a plurality of test signal detectors, each structured for measuring a test result signal produced by a respective one of said units under test in response to the test signal provided to said respective one of said units under test; and a plurality of processors each structured for configuring the test signal generator corresponding to a given one of said units under test, receiving the measured test result signal from the test signal detector corresponding to said given one of the units under test, and providing at least a part of said received measured test result signal.
16. A device as defined in claim 15, wherein the units under test comprises unit under test ports.
17. A device as defined in claim 15, further comprising an input/output communication unit for receiving said at least a part of the received measured test result signal.
18. A device as defined in claim 15, wherein at least one of said plurality of test signal detectors is a configurable test signal detector, wherein the configurable test signal detector is configured by one of the processors in accordance with a given test to be performed and a corresponding unit under test.
19. A device as defined in claim 15, wherein at least one of said plurality of configurable test signal generators comprises at least one of a current source providing a current signal, and a voltage source providing a voltage signal.
20. A device as defined in claim 19, wherein said at least one configurable test signal generator comprises an arbitrary waveform generator providing an arbitrary waveform signal and a digital signal source providing a digital signal, wherein the test signal is generated using at least one of the current source, the voltage source, the arbitrary waveform generator and the digital signal source.
21. A device as defined in claim 15, wherein at least one of said plurality of test signal detectors comprises at least one of a voltage measuring unit and a current measuring unit.
22. A device as defined in claim 21 , wherein the voltage measuring unit comprises a programmable impedance for receiving a voltage signal component of the test result signal and for providing a programmable impedance signal in response to said voltage signal component.
23. A device as defined in claim 22, wherein the programmable impedance comprises at least one of a programmable resistance, a programmable capacitance and a programmable inductance.
24. A device as defined in claim 18, comprising a memory for providing data for configuring the configurable test signal generator and the configurable test signal detector.
25. . A method for performing a given test on a given unit under test, comprising: configuring a configurable test signal generating unit in accordance with the specific test and with the given unit under test; configuring a configurable test signal measuring unit in accordance with at least one of the given test and the given unit under test; by means of the configured test signal generating unit, providing a test signal to the unit under test; by means of the configured test signal measuring unit, measuring a test result signal produced by the unit under test in response to the test signal; and providing the measured test result signal.
26. A method as defined in claim 25, wherein the given unit under test is a unit under test port.
27. The method as claimed in claim 24, wherein providing the measured test result signal comprises processing the result test signal to provide a processed test result signal.
28. The method as claimed in claim 27, wherein processing the test result signal comprises at least one processing selected from the group consisting of sampling, filtering, decimation, averaging, RMS measurement, and FFT calculation.
9. The method as claimed in claim 25, wherein providing the test signal to the unit under test comprises accessing a memory storing the test signal.
PCT/CA2004/001681 2003-09-25 2004-09-24 Method and device for simulating test sets WO2005029103A1 (en)

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Patent Citations (1)

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Publication number Priority date Publication date Assignee Title
US6557128B1 (en) * 1999-11-12 2003-04-29 Advantest Corp. Semiconductor test system supporting multiple virtual logic testers

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* Cited by examiner, † Cited by third party
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EP2990817A1 (en) * 2014-09-01 2016-03-02 Siemens Aktiengesellschaft Compact test assembly for circuit boards

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