WO2005004188A3 - Perfectionnements a l'imagerie en champ lointain - Google Patents
Perfectionnements a l'imagerie en champ lointain Download PDFInfo
- Publication number
- WO2005004188A3 WO2005004188A3 PCT/GB2004/002699 GB2004002699W WO2005004188A3 WO 2005004188 A3 WO2005004188 A3 WO 2005004188A3 GB 2004002699 W GB2004002699 W GB 2004002699W WO 2005004188 A3 WO2005004188 A3 WO 2005004188A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- far
- aperture
- field imaging
- electron microscopy
- wave function
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/295—Electron or ion diffraction tubes
- H01J37/2955—Electron or ion diffraction tubes using scanning ray
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2614—Holography or phase contrast, phase related imaging in general, e.g. phase plates
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0315245.1 | 2003-06-30 | ||
GB0315245A GB2403616A (en) | 2003-06-30 | 2003-06-30 | Diffraction pattern imaging using moving aperture. |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005004188A2 WO2005004188A2 (fr) | 2005-01-13 |
WO2005004188A3 true WO2005004188A3 (fr) | 2005-08-18 |
Family
ID=27676337
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2004/002699 WO2005004188A2 (fr) | 2003-06-30 | 2004-06-23 | Perfectionnements a l'imagerie en champ lointain |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB2403616A (fr) |
WO (1) | WO2005004188A2 (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0409572D0 (en) | 2004-04-29 | 2004-06-02 | Univ Sheffield | High resolution imaging |
GB0709796D0 (en) | 2007-05-22 | 2007-06-27 | Phase Focus Ltd | Three dimensional imaging |
GB2481589B (en) | 2010-06-28 | 2014-06-11 | Phase Focus Ltd | Calibration of a probe in ptychography |
GB201020516D0 (en) | 2010-12-03 | 2011-01-19 | Univ Sheffield | Improvements in providing image data |
GB201107053D0 (en) | 2011-04-27 | 2011-06-08 | Univ Sheffield | Improvements in providing image data |
GB201201140D0 (en) | 2012-01-24 | 2012-03-07 | Phase Focus Ltd | Method and apparatus for determining object characteristics |
GB201207800D0 (en) | 2012-05-03 | 2012-06-13 | Phase Focus Ltd | Improvements in providing image data |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4758723A (en) * | 1986-05-19 | 1988-07-19 | Vg Instruments Group Limited | Electron spectrometer |
EP0630040A1 (fr) * | 1993-06-21 | 1994-12-21 | Hitachi, Ltd. | Microscope électronique pour l'analyse de la composition et des contraintes d'un échantillon et méthode d'observation |
US5866905A (en) * | 1991-05-15 | 1999-02-02 | Hitachi, Ltd. | Electron microscope |
-
2003
- 2003-06-30 GB GB0315245A patent/GB2403616A/en not_active Withdrawn
-
2004
- 2004-06-23 WO PCT/GB2004/002699 patent/WO2005004188A2/fr active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4758723A (en) * | 1986-05-19 | 1988-07-19 | Vg Instruments Group Limited | Electron spectrometer |
US5866905A (en) * | 1991-05-15 | 1999-02-02 | Hitachi, Ltd. | Electron microscope |
EP0630040A1 (fr) * | 1993-06-21 | 1994-12-21 | Hitachi, Ltd. | Microscope électronique pour l'analyse de la composition et des contraintes d'un échantillon et méthode d'observation |
Also Published As
Publication number | Publication date |
---|---|
GB2403616A (en) | 2005-01-05 |
WO2005004188A2 (fr) | 2005-01-13 |
GB0315245D0 (en) | 2003-08-06 |
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