GB0315245D0 - Improvements to far-field imaging - Google Patents

Improvements to far-field imaging

Info

Publication number
GB0315245D0
GB0315245D0 GB0315245A GB0315245A GB0315245D0 GB 0315245 D0 GB0315245 D0 GB 0315245D0 GB 0315245 A GB0315245 A GB 0315245A GB 0315245 A GB0315245 A GB 0315245A GB 0315245 D0 GB0315245 D0 GB 0315245D0
Authority
GB
United Kingdom
Prior art keywords
far
field imaging
imaging
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0315245A
Other versions
GB2403616A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Sheffield
Sheffield Hallam University
Original Assignee
University of Sheffield
Sheffield Hallam University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Sheffield, Sheffield Hallam University filed Critical University of Sheffield
Priority to GB0315245A priority Critical patent/GB2403616A/en
Publication of GB0315245D0 publication Critical patent/GB0315245D0/en
Priority to PCT/GB2004/002699 priority patent/WO2005004188A2/en
Publication of GB2403616A publication Critical patent/GB2403616A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes
    • H01J37/2955—Electron or ion diffraction tubes using scanning ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2614—Holography or phase contrast, phase related imaging in general, e.g. phase plates
GB0315245A 2003-06-30 2003-06-30 Diffraction pattern imaging using moving aperture. Withdrawn GB2403616A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0315245A GB2403616A (en) 2003-06-30 2003-06-30 Diffraction pattern imaging using moving aperture.
PCT/GB2004/002699 WO2005004188A2 (en) 2003-06-30 2004-06-23 Far-field imaging in electron microscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0315245A GB2403616A (en) 2003-06-30 2003-06-30 Diffraction pattern imaging using moving aperture.

Publications (2)

Publication Number Publication Date
GB0315245D0 true GB0315245D0 (en) 2003-08-06
GB2403616A GB2403616A (en) 2005-01-05

Family

ID=27676337

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0315245A Withdrawn GB2403616A (en) 2003-06-30 2003-06-30 Diffraction pattern imaging using moving aperture.

Country Status (2)

Country Link
GB (1) GB2403616A (en)
WO (1) WO2005004188A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0409572D0 (en) 2004-04-29 2004-06-02 Univ Sheffield High resolution imaging
GB0709796D0 (en) * 2007-05-22 2007-06-27 Phase Focus Ltd Three dimensional imaging
GB2481589B (en) * 2010-06-28 2014-06-11 Phase Focus Ltd Calibration of a probe in ptychography
GB201020516D0 (en) 2010-12-03 2011-01-19 Univ Sheffield Improvements in providing image data
GB201107053D0 (en) 2011-04-27 2011-06-08 Univ Sheffield Improvements in providing image data
GB201201140D0 (en) 2012-01-24 2012-03-07 Phase Focus Ltd Method and apparatus for determining object characteristics
GB201207800D0 (en) 2012-05-03 2012-06-13 Phase Focus Ltd Improvements in providing image data

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8612099D0 (en) * 1986-05-19 1986-06-25 Vg Instr Group Spectrometer
US5866905A (en) * 1991-05-15 1999-02-02 Hitachi, Ltd. Electron microscope
JP3422045B2 (en) * 1993-06-21 2003-06-30 株式会社日立製作所 Electron microscope for measuring composition and lattice strain and its observation method

Also Published As

Publication number Publication date
WO2005004188A3 (en) 2005-08-18
GB2403616A (en) 2005-01-05
WO2005004188A2 (en) 2005-01-13

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)