WO2004109527B1 - A network analyzing method and a network analyzing apparatus - Google Patents

A network analyzing method and a network analyzing apparatus

Info

Publication number
WO2004109527B1
WO2004109527B1 PCT/US2004/017461 US2004017461W WO2004109527B1 WO 2004109527 B1 WO2004109527 B1 WO 2004109527B1 US 2004017461 W US2004017461 W US 2004017461W WO 2004109527 B1 WO2004109527 B1 WO 2004109527B1
Authority
WO
WIPO (PCT)
Prior art keywords
under test
device under
signals
output signals
properties
Prior art date
Application number
PCT/US2004/017461
Other languages
French (fr)
Other versions
WO2004109527A1 (en
Inventor
Koji Harada
Original Assignee
Agilent Technologies Inc
Koji Harada
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc, Koji Harada filed Critical Agilent Technologies Inc
Priority to EP04754136A priority Critical patent/EP1629388A4/en
Priority to US10/553,276 priority patent/US20060212555A1/en
Publication of WO2004109527A1 publication Critical patent/WO2004109527A1/en
Publication of WO2004109527B1 publication Critical patent/WO2004109527B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0202—Channel estimation
    • H04L25/0212—Channel estimation of impulse response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
    • H04L25/0202—Channel estimation
    • H04L25/0238—Channel estimation using blind estimation

Abstract

A network analyzing apparatus (100) and method for analyzing the network properties of a device under test (20) to which modulated signals are applied including modulating data contained in output signals (10) of the device under test (20), generating modulated signals (140) based on demodulated data and setting data supplied in advance, outputting the modulated signals as reference signals, and analyzing (150) the network properties of the device under test (20) by comparing or referencing the output signals of the device under test and these reference signals.

Claims

AMENDED CLAMS [received by the International Bureau on 14 December 2004 (14.12.04); original claims 1 and 8 amended, remaining claims unchanged (3 pages)]
1. A network analyzing device which analyzes network properties of a device under test to which modulated signals are applied, said device comprising: a demodulator which demodulates data contained in output signals from said device under test; a reference-signal generator which generates said modulated signals based on data that has been demodulated by said demodulator and outputs said modulated signals as reference signals; and an analyzer which analyzes said network properties of said device under test by comparing or referencing the output signals of said device under test and said reference signals.
2. The apparatus according to claim 1, wherein said analyzer analyzes the frequency properties of said device under test by: modeling said device under test with a filter; fixing the pulse response of said filter from said output signals of said device under test and said reference signals; and performing a Fourier transform of said pulse response.
3. The apparatus according to claim 1, wherein said analyzer analyzes the electrical power properties of said device under test by: detecting the amplitude ratio of said output signals of said device under test and said reference signals; and analyzing the correlation between the amplitude of said output signals of said device under test and said amplitude ratio.
4. The apparatus according to claim 1, wherein said analyzer analyzes the electrical power properties of said device under test by: detecting the phase difference between said output signals of said device under test and said reference signals; and analyzing the correlation between the amplitude of said output signals of said device under test and said phase difference.
5. The apparatus according to claim 1, wherein said analyzer analyzes the amplitude noise properties of said device under test by: detecting the amplitude difference
28 between said output signals of said device under test and said reference signals; and performing a Fourier transform of said amplitude difference.
6. The apparatus according to claim 1 , wherein said analyzer analyzes the phase noise properties of said device under test by detecting the phase difference between said output signals of said device under test and said reference signals; and performing a Fourier transform of said phase difference.
7. The apparatus according to claim 1, wherein said modulated signals are digital modulated signals, and said data is digital data.
8. A network analyzing method for analyzing network properties of a device under test to which modulated signals are applied, said method comprising: modulating data contained in output signals of said device under test to produce demodulated data; generating modulated signals based on said demodulated data; outputting said modulated signals as reference signals; and analyzing said network properties of said device under test by comparing or referencing said output signals of said device under test and said reference signals.
9. The method according to claim 8, wherein said network properties analyzed are the frequency properties of said device under test and wherein said analyzing comprises: modeling said device under test with a filter; fixing the pulse response of said filter from the output signals of said device under test and said reference signals; and performing a Fourier transform of said pulse response.
10. The method according to claim 8, wherein said network properties analyzed are the electrical properties of said device under test and wherein said analyzing comprises: detecting the amplitude ratio of said output signals of said device under test and said reference signals; and analyzing the correlation between the amplitude of said output signals of said device under test and said amplitude ratio.
1 1. The method according to claim 8, wherein said network properties analyzed are the electrical properties of said device under test and wherein said analyzing comprises: detecting the phase difference between said output signals of said device under test and said reference signals; and analyzing the correlation between the amplitude of the output signals of said device under test and said phase difference.
12. The method according to claim 8, wherein said network properties analyzed are the amplitude noise properties of said device under test and wherein said analyzing comprises: detecting the amplitude difference between said output signals of said device under test and said reference signals; and performing a Fourier transform of said amplitude difference.
13. The method according to claim 8, wherein said network properties analyzed are the phase noise properties of said device under test and wherein said analyzing comprises: detecting the phase difference between said output signals of said device under test and said reference signals; and performing a Fourier transform of said phase difference.
14. The method according to claim 8, wherein said modulated signals are digital modulated signals, and said data are digital data.
PCT/US2004/017461 2003-06-03 2004-06-03 A network analyzing method and a network analyzing apparatus WO2004109527A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP04754136A EP1629388A4 (en) 2003-06-03 2004-06-03 A network analyzing method and a network analyzing apparatus
US10/553,276 US20060212555A1 (en) 2003-06-03 2004-06-03 Network analyzing method and a network analyzing apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003-158091 2003-06-03
JP2003158091A JP2004361170A (en) 2003-06-03 2003-06-03 Apparatus, method, and program for analyzing network property

Publications (2)

Publication Number Publication Date
WO2004109527A1 WO2004109527A1 (en) 2004-12-16
WO2004109527B1 true WO2004109527B1 (en) 2005-03-17

Family

ID=33508416

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/017461 WO2004109527A1 (en) 2003-06-03 2004-06-03 A network analyzing method and a network analyzing apparatus

Country Status (5)

Country Link
EP (1) EP1629388A4 (en)
JP (1) JP2004361170A (en)
KR (1) KR20060017530A (en)
CN (1) CN1799033A (en)
WO (1) WO2004109527A1 (en)

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JP2004354094A (en) * 2003-05-27 2004-12-16 Agilent Technol Inc Network analyzer
CN100375451C (en) * 2005-03-21 2008-03-12 中兴通讯股份有限公司 Automatic test method for network protection system of optical SDH
US7298464B1 (en) * 2005-04-27 2007-11-20 Northrop Grumman Corporation System and method for measuring the phase noise of very long fiber optic links
JP5128057B2 (en) * 2005-06-29 2013-01-23 アジレント・テクノロジーズ・インク Method and apparatus for analyzing network characteristics
US8711992B2 (en) * 2012-05-31 2014-04-29 Agilent Technologies, Inc. Phase noise extraction apparatus and technique
US9535140B2 (en) * 2013-06-28 2017-01-03 Infineon Technologies Ag System and method for a transformer and a phase-shift network
KR101505048B1 (en) * 2013-08-08 2015-03-25 주식회사 에이텍 Card test device using network analyzer and method thereof
CN103592547B (en) * 2013-11-22 2016-04-27 中国电子科技集团公司第四十一研究所 A kind of wideband vector network analyzer
US9632122B2 (en) * 2014-06-23 2017-04-25 Keysight Technologies, Inc. Determining operating characteristics of signal generator using measuring device
CN108880719A (en) * 2017-05-12 2018-11-23 上海数字电视国家工程研究中心有限公司 Frequency modulation broadcasting method of real-time
CN108880718B (en) * 2017-05-12 2020-06-09 上海数字电视国家工程研究中心有限公司 Frequency modulation broadcast real-time monitoring system, receiver and frequency modulation broadcast real-time monitoring method
CN108880705A (en) * 2017-05-12 2018-11-23 上海数字电视国家工程研究中心有限公司 Frequency modulation broadcasting real-time monitoring system
CN109412726A (en) * 2017-08-17 2019-03-01 上海数字电视国家工程研究中心有限公司 Receiver
CN108614172A (en) * 2018-05-23 2018-10-02 中国电子科技集团公司第四十研究所 A kind of miniaturization Network Analyzer of multiple communication interface
CN108614207A (en) * 2018-05-23 2018-10-02 中国电子科技集团公司第四十研究所 A kind of the signal source switching device and method of vector network analyzer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2262690A (en) * 1991-12-20 1993-06-23 British Aerospace Space And Co Demodulator with frequency error correction
JP3222562B2 (en) * 1992-08-25 2001-10-29 株式会社東芝 Optical network analyzer
EP0905940A3 (en) * 1997-09-30 2001-05-16 Lucent Technologies Inc. Loopback testing using error vector analysis
TW435020B (en) * 1998-12-28 2001-05-16 Nat Science Council A vector network analyzer architecture based on sliding correlator techniques
US6313934B1 (en) * 1999-01-08 2001-11-06 Agilent Technologies, Inc. Chromatic dispersion measurement scheme for optical systems having remote access points

Also Published As

Publication number Publication date
WO2004109527A1 (en) 2004-12-16
EP1629388A4 (en) 2008-04-16
KR20060017530A (en) 2006-02-23
JP2004361170A (en) 2004-12-24
EP1629388A1 (en) 2006-03-01
CN1799033A (en) 2006-07-05

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