WO2004088738A1 - Laminate - Google Patents
Laminate Download PDFInfo
- Publication number
- WO2004088738A1 WO2004088738A1 PCT/JP2004/004396 JP2004004396W WO2004088738A1 WO 2004088738 A1 WO2004088738 A1 WO 2004088738A1 JP 2004004396 W JP2004004396 W JP 2004004396W WO 2004088738 A1 WO2004088738 A1 WO 2004088738A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- insulating layer
- laminate
- function
- copper foil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/611—Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/685—Shapes or dispositions thereof comprising multiple insulating layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
Definitions
- the present invention is designed to mount electronic components such as ICs or LSIs.
- the present invention relates to a copper-clad laminate for a board.
- TAB tape, automated bonding
- LCD liquid crystal display devices
- the flexible printed circuit board (FPC) used for this COF does not have the device holes used in the TAB method, so when measuring the relative position when mounting the chip, it passes through the insulating layer and passes through the driver IC chip. It is necessary to recognize the wiring of.
- a laminate used for such an FPC for COF there is a laminate in which an adhesion film such as a nickel film is sputtered on an insulating film such as a polyimide film and then copper plating is applied.
- the polyimide film is relatively transparent, so alignment is easy when mounting the IC, but the adhesive force between the conductor and the insulator is low. There is a problem that it is inferior.
- a laminate without such problems there are a casting type in which a polyimide film is laminated on a copper foil by a coating method, and a thermocompression bonding type in which an insulated film is thermocompressed on a copper foil through a thermoplastic resin or thermosetting resin.
- a laminate there is a laminate.
- the surface of the insulating layer exposed when the copper foil is removed by etching reflects light irregularly, and penetrates the insulating layer to recognize the wiring of the driver IC chip. There was a problem that could not be done.
- JP-A-2002-73188 discloses a method for polishing an electrolytic deposition surface.
- Japanese Patent Application Laid-Open No. 2002-021394 discloses a method for producing a roughened layer of copper foil.
- Japanese Patent Application Laid-Open No. 09-143785 discloses a low-roughness copper foil having a small Rz by using a mercapto compound.
- Japanese Patent Application Laid-Open No. 2003-23046 discloses an insulator having a prescribed light transmittance.
- the method for specifying the roughness of the copper foil surface is calculated by a stylus-type roughness meter, etc.
- Rz specified in the definition of roughness (Rz) is often used.
- this Rz was incomplete to define the correlation with optical characteristics such as optical scattering, and in some cases it was impossible to actually recognize the wiring of the driver IC chip.
- DISCLOSURE OF THE INVENTION The present invention is capable of recognizing the wiring of a driver IC chip through an insulating layer, has a high adhesive force between a conductor and an insulator, and has an excellent electrification port migration resistance.
- the present invention provides a laminate in which a conductor layer and an insulating layer are laminated, and measures the surface of the conductor layer on the insulating layer side as three-dimensional shape data including height values at respective points, and obtains the following formula (1)
- the power spectrum which is a function of frequency, is calculated by performing the two-dimensional Fourier transform shown in ()), and the intensity of the frequency equivalent to 60 O nm is less than the intensity equivalent to the surface height value of 1.6 m before conversion. It is characterized by being.
- the conductor layer is a copper foil, and the insulation layer is formed by applying a polyimide precursor resin solution, followed by drying and curing.4) The heat of the insulation layer being thermocompressed to the conductor layer. 5) The fact that the insulating layer is formed of a thermosetting resin layer and an insulating film that is thermocompression-bonded to the conductor layer must be formed by a plastic resin layer and an insulating film. This is a preferred embodiment of the present invention.
- the present invention is a COF film carrier tape characterized by using the above-mentioned laminate. Further, the present invention measures the surface of the conductor layer on the insulating layer side as a three-dimensional shape composed of height values at each point, and performs a two-dimensional Fourier transform represented by the above equation (1) to obtain a frequency. Calculate the power spectrum, which is a function of the above, and select a conductor layer whose strength at a specific frequency in the range of 500 to 70'0 ⁇ is less than the strength corresponding to the surface height value of 1.6 Am before conversion. And a method of manufacturing a laminate having a structure in which a conductor layer and an insulation layer are laminated, wherein an insulation layer is laminated on the conductor layer.
- the present invention will be described in detail.
- the laminate of the present invention includes a conductor layer and an insulating layer.
- a copper foil layer is preferable, and the conductor layer may be represented by a copper foil layer in the following description.
- the conductor layer may be provided on only one side of the insulating layer, or may be provided on both sides.
- Examples of the conductive layer constituting the laminate include various conductive metal foils. In the case of a copper foil, a rolled copper foil or an electrolytic copper foil may be used.
- a method of defining the conductor surface shape three-dimensional shape data consisting of height values at each point on the insulating layer side surface of the conductor layer is measured.
- a stylus method a laser microscope, an atomic force microscope (AF ⁇ ), or the like can be used. Of these, the method using AFM is most suitable for this purpose.
- a two-dimensional Fourier transform represented by the equation (1) is performed to calculate a frequency spectrum, which is a function of frequency.
- the power spectrum obtained by this conversion is obtained by decomposing the periodicity of the three-dimensional shape as a sine wave component and obtaining a two-dimensional image showing its wave number and directionality.
- the distance from the center of the image is a sine wave Indicates the wave number, and the direction from the center of the image corresponds to the direction of the sine wave.
- Equation (1) The function ⁇ , y) defined in the xy plane coordinate system, that is, the two-dimensional Fourier transform of the three-dimensional shape data is defined by equation (1).
- u and V indicate the wave numbers in the X and y directions, respectively.
- F (u, V) indicates the spatial frequency component of f (x, y) corresponding to the wave vector (u, V), that is, the Fourier component.
- the two-dimensional Fourier transform can be performed with commercially available software.
- the image is not a continuous function such as ⁇ . Y), but a digital data of NXN pixels (pixels) with finite resolution, and a finite sum is used instead of integration using a continuous function.
- the digital data used in this case can be obtained by a digital camera, CCD camera, scanner, optical microscope, metallographic microscope, laser microscope, scanning electron microscope, atomic force microscope, or the like.
- the center of the image is the origin of the uv coordinate system.
- the intensity at each point in the image corresponds to the magnitude of the Fourier component-components closer to the origin correspond to lower-frequency components, and components farther from the origin correspond to higher-frequency components.
- the wave number h (1 / m) at the corner farthest from the origin is given by the following equation (2).
- N Number of pixels of image before conversion (1)
- the four corner positions are at a wave number of 7.24 ⁇ 106, wavelength 0.14 Hit.
- the intensity of the sinusoidal component from 38 O nm to about 78 O nm corresponding to the wavelength of visible light can be specified, but especially the wavelength included in the light source of the alignment device.
- low absorption of high polymers such as polyimide relatively long wavelength that is difficult to disperse, and good sensitivity of CCD camera. It has been found that practical transparency can be defined by defining the intensity of the periodic component corresponding to 7700 nm, preferably 60 O nm.
- the intensity of the periodic component equivalent to 600 nm corresponds to the surface height value before conversion of 1.6 / m Strength Not more than. Further, it is more preferably 1.5 or less.
- the intensity equivalent to a surface height value of 1.6 before conversion is 80% of the intensity after conversion and 80% of the intensity after conversion when the two-dimensional shape data before conversion is measured at a full scale of 2 m. When the scale is measured at 4 zm, the converted intensity is 40%, and when the full scale is measured at 6m, the converted intensity is 27%.
- the insulating layer constituting the laminate is formed by applying a polyimide precursor resin solution and then drying and curing, a thermoplastic resin layer and an insulating film, and a thermosetting resin layer. Any of those formed by using an insulating film may be used.
- insulating layers constituting these laminates those formed by applying a polyimide precursor resin solution, followed by drying and curing are most suitable, but the present invention is not limited thereto.
- the polyimide precursor resin solution can be produced by polymerizing a known diamine and an acid anhydride in the presence of a solvent.
- diamines used include 4,4'-diaminodiphenyl ether, 2'-methoxy4,4'-diaminobenzanilide, 1,4-bis (4-aminophenoxy) benzene, 1,3-bis (4-aminophenoxy) benzene, 2,2'-bis [4- (4-aminophenoxy) phenyl] propane, 2,2'-dimethyl-4,4'-diaminobiphenyl, 3,3 '-Dihydroxy-4,4, -diaminobiphenyl, 4,4' diaminobenzanilide and the like.
- acid anhydride examples include pyromellitic anhydride, 3,3 ', 4,4'-biphenyltetracarboxylic dianhydride, 3,3', 4,4'-diphenylsulfonetetracarboxylic acid Acid dianhydride; 4,4'-oxydiphthalic anhydride;
- Each of diamine and acid anhydride may be used alone or in combination of two or more.
- the solvent examples include dimethylacetamide, n-methylpyrrolidinone, 2-butanone, diglyme, xylene and the like, and one or more of them can be used in combination.
- the polyimide-based resin layer is preferably formed by directly applying it on the copper foil layer in a precursor state, and the viscosity of the polymerized resin is preferably in the range of 500 cps to 35,000 O cps. I like it.
- the applied resin solution is heat-treated, but heat-treated at 100 to 15 Ot for 2 to 4 minutes in the air, and then vacuum-heated to room temperature-340 ° C-room temperature treatment for about 9 hours It is better to do it.
- the polyimide resin layer may be formed of only a single layer, or may be formed of a plurality of layers. When a plurality of polyimide-based resin layers are used, they can be formed by sequentially applying another polyimide resin on a polyimide-based resin layer composed of different components. When the polyimide resin layer is composed of three or more layers, the same configuration of the polyimide resin may be used twice or more.
- a copper-clad laminate which is a typical example of the laminate of the present invention, can be manufactured by applying a polyimide resin on a copper foil as described above. It can also be manufactured by lamination.
- the copper-clad laminate thus manufactured may be a single-sided copper-clad laminate having a copper foil layer on only one side, or a double-sided copper-clad laminate having a copper foil layer on both sides.
- a double-sided copper-clad laminate is formed by forming a single-sided copper-clad laminate and then pressing the copper foil layer by hot pressing. A method in which a film is sandwiched and pressure-bonded by a hot press may be used.
- Copper foil 1 Electrolytic copper foil, Rz 1. O m
- Copper foil 2 Electrolytic copper foil, RzO.
- Copper foil 3 Rolled copper foil, Rz2. O im
- Copper foil 4 Copper foil 3 immersed in 5% hydrochloric acid aqueous solution for 1 minute, Rz2. O m Synthesis example 1
- n-methylpyrrolidinone in a thermocouple, stirrer, or reaction vessel into which nitrogen can be introduced.
- PMDA pyromellitic anhydride
- MABA 2, -methoxy Introduced 4,4'-diaminobenzanilide
- DSDA 3,3'4,4'-diphenylsulfonetetracarboxylic dianhydride
- PMM 3,3'4,4'-diphenylsulfonetetracarboxylic dianhydride
- TPE-I 1,3- Bis (4-aminophenoxy) benzene
- Copper foil 1 was used as the copper foil.
- the surface of this copper foil was shape-measured with an atomic force microscope (NanoScope, a scanning probe microscope manufactured by Digital Instruments) in a range of 50 / im square at a full scale of 4 mm and 256 gradations. One gradation corresponds to 0.0156 m.
- the obtained image was subjected to two-dimensional Fourier transform using commercially available general-purpose image processing software to obtain a power spectrum. From this power spectrum, the intensity F (U.V) at a position corresponding to a wavelength of 600 nm was measured. Out of 256 gradations, which corresponded to 93 gradations, and the intensity was 36%. This is equivalent to 1.45 xm because the full scale of the shape data before conversion is 4 mm.
- the polyamic acid solution of Synthesis Examples 1 to 3 was applied and dried repeatedly on the electrolytic copper foil to obtain a laminate in which a polyimide precursor resin layer was formed on the copper foil layer.
- Heat treatment was performed for 8 hours to obtain a single-sided copper foil laminate having a polyimide thickness of 40 / zm.
- This laminate has a polyimide layer 3 m generated from the polyamic acid of Synthesis Example 1, a polyimide layer 34 generated from the polyamic acid of Synthesis Example 2, and a polyimide layer generated from the polyamic acid of Synthesis Example 2 on the electrolytic copper foil.
- the laminate was etched with an aqueous ferric chloride solution to obtain a 40 m insulating film.
- This film was held on the driver IC chip prepared for the test while maintaining a distance of lOO ⁇ m.
- the film was mounted on the ponder machine using a commercially available ponder machine (Shinkawa ILT-110). When a 200 m inspection pattern on the IC chip was observed through the film using a CCD camera for alignment, a good image was obtained.
- Example 2 Using this electrolytic copper foil, a laminate was manufactured in the same manner as in Example 1, and an insulating layer film was obtained by etching. When the IC chip was observed through this film, no image could be recognized.
- the intensity corresponding to a wavelength of 600 nm was equivalent to 119 out of 256 gradations, and the intensity was 46%. It was hot. This is equivalent to 1.86 m because the full scale of the shape data before conversion is 4 m.
- Example 2 Using this electrolytic copper foil, a laminate was manufactured in the same manner as in Example 1, and an insulating layer film was obtained by etching. When the IC chip was observed through this film, no image could be recognized.
- the copper foil 4 was used as the copper foil, and the surface shape was measured in the same manner as in Example 1.
- the intensity corresponding to the wavelength of 600 im was equivalent to 90 of 256 gradations, and the intensity was 35%. there were. Also, this corresponds to 1.41, ⁇ since the full scale of the shape data before conversion is 4. "m.
- the laminated body was manufactured and etched to obtain an insulated layer film.When the IC chip was observed through this film, a good image was obtained.
- Copper foil 1 Copper foil 2 Copper foil 3 Copper foil 4
- the wiring of the driver IC chip can be recognized through the insulating layer, and the adhesion between the conductor and the insulator is high, and a laminate having excellent electromigration resistance can be manufactured.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
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- Wire Bonding (AREA)
Abstract
Description
技 術 分 野 本発明は、 I Cあるいは L S Iなど明の電子部品を実装一 Technical Field The present invention is designed to mount electronic components such as ICs or LSIs.
板用の銅張り積層板に関するものである。田 背 景 技 術 テープキャリアにドライバ I Cを実装する TA B方式 (テープ ·オートメイティッ ド ·ボンディング) は、 液晶表示素子 (L C D) を使用する電子産業において、 従来 から用いられてきた。 The present invention relates to a copper-clad laminate for a board. TABE Kei Technology The TAB method (tape, automated bonding) in which a driver IC is mounted on a tape carrier has been used in the electronics industry using liquid crystal display devices (LCD).
また. - より小さいスペースで、 より高密度の実装を行う実装方法として、 裸の I C チップをフィルムキャリアテープ上に直接搭載する C O F (チップ ·オン ·フィル ム) が開発された。 -Also, as a mounting method for higher density mounting in a smaller space, a chip-on-film (COF) in which a bare IC chip is directly mounted on a film carrier tape has been developed.
この C O Fに用いられるフレキシブルプリント基板 ( F P C) は、 TA B方式にて 用いられてきたデバイスホールを有しないため、 チップ実装時の相対位置の測定の際 に、 絶縁層を透過してドライバ I Cチップの配線を認識する必要がある。 The flexible printed circuit board (FPC) used for this COF does not have the device holes used in the TAB method, so when measuring the relative position when mounting the chip, it passes through the insulating layer and passes through the driver IC chip. It is necessary to recognize the wiring of.
このような C O F用 F P Cに用いられる積層体としては、 ポリイミドフィルムなど の絶縁フィルムに二ッケルなどの密着強化層をスパッ夕した後、 銅メツキを施した積 層体がある。 このような銅メツキ積層体では、 ポリイミドフィルムが比較的透明であ るので、 I C搭載の際の位置合わせが容易であるが、 導体と絶縁体の間の接着力が低 レ 耐エレクト口マイグレーション性に劣るという問題がある。 このような問題のない積層体としては、 銅箔にポリイミドフィルムを塗布法により 積層したキャスティングタイプや、 銅箔に熱可塑性樹脂や熱硬化性樹脂などを介し絶 緣フィルムを熱圧着した熱圧着タイプの積層体がある。 As a laminate used for such an FPC for COF, there is a laminate in which an adhesion film such as a nickel film is sputtered on an insulating film such as a polyimide film and then copper plating is applied. In such a copper plating laminate, the polyimide film is relatively transparent, so alignment is easy when mounting the IC, but the adhesive force between the conductor and the insulator is low. There is a problem that it is inferior. As a laminate without such problems, there are a casting type in which a polyimide film is laminated on a copper foil by a coating method, and a thermocompression bonding type in which an insulated film is thermocompressed on a copper foil through a thermoplastic resin or thermosetting resin. There is a laminate.
しかしながら、 キャスティングタイプや熱圧着タイプの積層体は、 銅箔をエツチン グで除去した際に露出する絶縁層表面が光を乱反射してしまい、 絶縁層を透過してド ライバ I Cチップの配線を認識できないという問題があった。 However, in the case of the casting type or thermo-compression type laminate, the surface of the insulating layer exposed when the copper foil is removed by etching reflects light irregularly, and penetrates the insulating layer to recognize the wiring of the driver IC chip. There was a problem that could not be done.
このような背景から、 粗度の小さな銅箔の製造方法が提案されている。 特開 200 2— 73188号公報では、 電解析出面を研磨する方法が開示されている。 特開 20 02-161394号公報 (USP 6495022B) では、 銅箔の粗化層の製造方 法が開示されている。 特開平 09— 143785号公報 (EP851944) には、 メルカプト化合物により R zの小さな低粗度銅箔が開示されている。 特開 2003— 23046号公報には、 光線透過率の規定された絶縁体が開示されている。 Against this background, a method for producing a copper foil having a small roughness has been proposed. JP-A-2002-73188 discloses a method for polishing an electrolytic deposition surface. Japanese Patent Application Laid-Open No. 2002-021394 (USP 6495022B) discloses a method for producing a roughened layer of copper foil. Japanese Patent Application Laid-Open No. 09-143785 (EP851944) discloses a low-roughness copper foil having a small Rz by using a mercapto compound. Japanese Patent Application Laid-Open No. 2003-23046 discloses an insulator having a prescribed light transmittance.
これらの技術では、 銅箔表面の粗度の規定方法としては、 触針式の粗度計等から算 出される、 J I S B 0601 _ 1994 (表面粗さの定義と表示) の 5. 1十点 平均荒さ (Rz) の定義に規定された Rzを使用する場合が多い。 しかしながら、 こ の Rzは、 光学散乱などの光学的特性との相関を規定するには不完全であり、 実際に はドライバ I Cチップの配線の認識が不可能である塲合も見られた。 このため、 低粗 度銅箔において、光学的特性から規定された導体表面形状を有する積層体の開発が望 まれていた。 発 明 の 開 示 本発明は、絶縁層を透過してドライバ I Cチップの配線を認識することが可能であ り、 導体と絶縁体の間の接着力が高く、 耐エレクト口マイグレーション性に優れた、 積層体を提供することを目的とする。 本発明者等は上記問題点を解決するために、 検討した結果、 積層体を構成する銅箔 等の導体層に特定の特性を有するものを使用することで上記課題を解決し得ること を見出し、 本発明を完成した。 In these technologies, the method for specifying the roughness of the copper foil surface is calculated by a stylus-type roughness meter, etc. Rz specified in the definition of roughness (Rz) is often used. However, this Rz was incomplete to define the correlation with optical characteristics such as optical scattering, and in some cases it was impossible to actually recognize the wiring of the driver IC chip. For this reason, there has been a demand for the development of a laminate having a conductor surface shape defined by optical characteristics in a low-roughness copper foil. DISCLOSURE OF THE INVENTION The present invention is capable of recognizing the wiring of a driver IC chip through an insulating layer, has a high adhesive force between a conductor and an insulator, and has an excellent electrification port migration resistance. It is intended to provide a laminate. The present inventors have studied to solve the above problems, and as a result, have found that the above problems can be solved by using a conductor layer such as a copper foil constituting a laminate having specific characteristics. The present invention has been completed.
すなわち、 本発明は、 導体層と絶縁層が積層された積層体であって、 導体層の絶縁 層側表面を各点における高さの値からなる 3次元形状データとして測定し、 下記式 ( 1 )に示される二次元フーリエ変換を行って周波数の関数であるパワースぺクトル を算出し、 6 0 O nmに相当する周波数の強度が変換前の表面高さ値 1 . 6 mに相当 する強度以下であることを特徴とする。 That is, the present invention provides a laminate in which a conductor layer and an insulating layer are laminated, and measures the surface of the conductor layer on the insulating layer side as three-dimensional shape data including height values at respective points, and obtains the following formula (1) The power spectrum, which is a function of frequency, is calculated by performing the two-dimensional Fourier transform shown in ()), and the intensity of the frequency equivalent to 60 O nm is less than the intensity equivalent to the surface height value of 1.6 m before conversion. It is characterized by being.
oo oo oo oo
F (U, V) F (U, V)
但し、 However,
F (u, v) :変換によって得られた関数 (パワースペクトル) F (u, v): Function (power spectrum) obtained by conversion
u, V: X , y方向の波数 u, V: wave numbers in X and y directions
ί (X, y):変換対象の関数 ( 3次元形状データ) ί (X, y): Function to be converted (3D shape data)
(X, y):平面座標 (X, y): plane coordinates
ここで、 1)原子間力顕微鏡にて 3次元形状データを測定した積層体であること、 2) 3次元形状デ一夕をフルスケール 3〜 6 mにて測定した積層体であること、 3)導体 層が銅箔であり、 絶縁層がポリイミド前駆体樹脂溶液を塗布した後、 乾燥 ·硬化する ことにより形成されたものであること、 4) 絶縁層が、 導体層に熱圧着された熱可塑 性樹脂層及び絶縁フィルムにより形成されたものであること、 又は、 5) 絶縁層が、 導体層に熱圧着された熱硬化性樹脂層及び絶縁フィルムにより形成されたものであ ることは本発明の好ましい態様である。 Here, 1) a laminate whose three-dimensional shape data was measured with an atomic force microscope, 2) a laminate whose three-dimensional shape data was measured at a full scale of 3 to 6 m, 3 ) The conductor layer is a copper foil, and the insulation layer is formed by applying a polyimide precursor resin solution, followed by drying and curing.4) The heat of the insulation layer being thermocompressed to the conductor layer. 5) The fact that the insulating layer is formed of a thermosetting resin layer and an insulating film that is thermocompression-bonded to the conductor layer must be formed by a plastic resin layer and an insulating film. This is a preferred embodiment of the present invention.
また、 本発明は上記の積層体を用いたことを特徴とする C O Fフィルムキャリアテ ープである。 更に、 本発明は、 導体層の絶縁層側表面を各点における高さの値からなる 3次元形 状デ一夕として測定し、 上記式 (1 ) に示される二次元フーリエ変換を行って周波数 の関数であるパワースぺクトルを算出し、 500〜70'0ηπιの範囲にある特定の周波数の強 度が変換前の表面高さ値 1 . 6 Amに相当する強度以下である導体層を選定すること、 この導体層上に絶縁層を積層することを特徴とする導体層と絶縁層が積層された構 造の積層体の製造方法である。 以下、 本発明を詳細に説明する。 Further, the present invention is a COF film carrier tape characterized by using the above-mentioned laminate. Further, the present invention measures the surface of the conductor layer on the insulating layer side as a three-dimensional shape composed of height values at each point, and performs a two-dimensional Fourier transform represented by the above equation (1) to obtain a frequency. Calculate the power spectrum, which is a function of the above, and select a conductor layer whose strength at a specific frequency in the range of 500 to 70'0ηπι is less than the strength corresponding to the surface height value of 1.6 Am before conversion. And a method of manufacturing a laminate having a structure in which a conductor layer and an insulation layer are laminated, wherein an insulation layer is laminated on the conductor layer. Hereinafter, the present invention will be described in detail.
本発明の積層体は、 導体層と絶縁層とから構成される。 導体層としては、 銅箔層が 好ましいので、 以下の説明において導体層を銅箔層で代表することがある。 導体層は 絶縁層の片面のみに設けられていてもよく、 また両面に設けられていてもよい。 積層体を構成する導体層としては、 導電性の各種金属箔等があるが、 銅箔の場合 は、 圧延銅箔を使用してもよく、 電解銅箔を使用してもよい。 The laminate of the present invention includes a conductor layer and an insulating layer. As the conductor layer, a copper foil layer is preferable, and the conductor layer may be represented by a copper foil layer in the following description. The conductor layer may be provided on only one side of the insulating layer, or may be provided on both sides. Examples of the conductive layer constituting the laminate include various conductive metal foils. In the case of a copper foil, a rolled copper foil or an electrolytic copper foil may be used.
導体表面形状を規定する方法として、 導体層の絶縁層側表面を各点における高さの 値からなる 3次元形状データを測定する。 測定方法としては、 触針式、 レーザー顕微 鏡、 原子間力顕微鏡(A F Μ)などを用いることができる。 このうち、 A F Mを用いる 方法が最も本目的に適する。 As a method of defining the conductor surface shape, three-dimensional shape data consisting of height values at each point on the insulating layer side surface of the conductor layer is measured. As a measuring method, a stylus method, a laser microscope, an atomic force microscope (AFΜ), or the like can be used. Of these, the method using AFM is most suitable for this purpose.
測定時のフルスケールは、 6 を超えると表面形状の詳細を計測することができ ない。 また、 3 m未満ではフルスケールを超える凹凸が多くなり、 不適切である。 このため、 フルスケールを 3 z mから 6 mに設定することで、 後の処理に適した三 次元形状データが得られる。 If the full scale during measurement exceeds 6, it is not possible to measure the details of the surface shape. On the other hand, if it is less than 3 m, irregularities exceeding the full scale will increase, which is inappropriate. Therefore, by setting the full scale from 3 m to 6 m, 3D shape data suitable for subsequent processing can be obtained.
3次元形状データは、 式 (1 ) に示される二次元フーリエ変換を行って周波数の関 数であるパヮ一スぺクトルを算出する。 この変換により得られるパワースぺクトル は、 三次元形状の持つ周期性を、 正弦波成分として分解し、 その波数と方向性を示す 2次元画像として得られる。 この 2次元画像では、 画像の中心からの距離が正弦波の 波数を示し、 画像の中心からの方向が正弦波の方向性に対応する。 With respect to the three-dimensional shape data, a two-dimensional Fourier transform represented by the equation (1) is performed to calculate a frequency spectrum, which is a function of frequency. The power spectrum obtained by this conversion is obtained by decomposing the periodicity of the three-dimensional shape as a sine wave component and obtaining a two-dimensional image showing its wave number and directionality. In this 2D image, the distance from the center of the image is a sine wave Indicates the wave number, and the direction from the center of the image corresponds to the direction of the sine wave.
xy平面座標系で定義された関数 Πχ, y)、 すなわち 3次元形状データの二次元フー リエ変換は、 式 (1) で定義される。 ここに、 u, Vはそれぞれ、 X, y方向の波数を 示す。 F(u, V)は波数ベクトル (u, V)に対応した f (x, y)の空間周波数成分、 すなわち フーリエ成分を示す。 The function Πχ, y) defined in the xy plane coordinate system, that is, the two-dimensional Fourier transform of the three-dimensional shape data is defined by equation (1). Here, u and V indicate the wave numbers in the X and y directions, respectively. F (u, V) indicates the spatial frequency component of f (x, y) corresponding to the wave vector (u, V), that is, the Fourier component.
二次元フーリエ変換は、 市販のソフトウェアで実行することが可能である。 その際 には、 画像は Πχ. y)といった連続した関数ではなく、 有限な分解能を持つ NXN個 の画素(ピクセル)のディジタルデ一夕を取り扱い、連続関数を用いた積分ではなく、 有限和を用いた式を用いる。 この際に用いるディジタルデ一夕は、 ディジタルカメ ラ、 CCDカメラ、 スキャナ、 光学顕微鏡、 金属顕微鏡、 レーザー顕微鏡、 走査型電 子顕微鏡、 原子間力顕微鏡等により得ることができる。 The two-dimensional Fourier transform can be performed with commercially available software. In this case, the image is not a continuous function such as Πχ. Y), but a digital data of NXN pixels (pixels) with finite resolution, and a finite sum is used instead of integration using a continuous function. Use the formula used. The digital data used in this case can be obtained by a digital camera, CCD camera, scanner, optical microscope, metallographic microscope, laser microscope, scanning electron microscope, atomic force microscope, or the like.
二次元フーリエ変換によって得られるパワースぺク卜ルは、 画像の中心が uv座標 系の原点としている。 画像の各点における強度はフーリェ成分の大きさに対応し-, 原 点より近い領域の成分は低周波数成分に対応し、 原点より遠い領域の成分は高周波数 成分に対応する。 原点から最も遠い隅の位置の波数 h (1/m) は下記式 (2) で示さ れる。 In the power spectrum obtained by the two-dimensional Fourier transform, the center of the image is the origin of the uv coordinate system. The intensity at each point in the image corresponds to the magnitude of the Fourier component-components closer to the origin correspond to lower-frequency components, and components farther from the origin correspond to higher-frequency components. The wave number h (1 / m) at the corner farthest from the origin is given by the following equation (2).
h=N /( V~2X Y) ( 2 ) h = N / (V ~ 2X Y) (2)
但し、 However,
h:波数 (1/m) h: wave number (1 / m)
N:変換前の画像の画素数 (一) N: Number of pixels of image before conversion (1)
Y:変換前の画像の実視野幅 (m) Y: Actual field of view of image before conversion (m)
例えば、 50 /imX 50 imの範囲を 512ピクセル X 512ピクセルで撮像し、 二次元フーリェ変換して得られる 51 2ピクセル X 51 2ピクセルのパワースぺク トルにおいて、 4隅の位置は波数 7. 24X 106、 すなわち波長 0. 14 当する。 この二次元画像において、可視光波長に対応する 3 8 O nm〜約 7 8 O nmの正弦波成 分の強度にて規定することができるが、 特に、 位置合わせ装置の光源に含まれる波長 であり、 ポリイミド等の高分子の吸収が少なく、 分散されにくい比較的長波長で、 か っ巿販 C C Dカメラの感度が良好である 5 0 O nn!〜 7 0 0 nm、 好ましくは 6 0 O nm に相当する周期性成分の強度をもって規定することで、実用的な透明性を規定できる ことを見出した。 For example, in a 512 × 512 pixel power spectrum obtained by imaging a range of 50 / imX 50 im with 512 pixels × 512 pixels and obtaining a two-dimensional Fourier transform, the four corner positions are at a wave number of 7.24 × 106, wavelength 0.14 Hit. In this two-dimensional image, the intensity of the sinusoidal component from 38 O nm to about 78 O nm corresponding to the wavelength of visible light can be specified, but especially the wavelength included in the light source of the alignment device. Yes, low absorption of high polymers such as polyimide, relatively long wavelength that is difficult to disperse, and good sensitivity of CCD camera. It has been found that practical transparency can be defined by defining the intensity of the periodic component corresponding to 7700 nm, preferably 60 O nm.
絶縁層を透過してドライバ I Cチップの配線を認識することが可能な積層体は、 6 0 O nmに相当する周期性成分の強度が変換前の表面高さ値 1 . 6 / mに相当する強度 以下である。 また、 1 . 5 以下が更に好ましい。 ここでいう、 変換前の表面高さ 値 1 . 6 に相当する強度とは、 変換前のミ次元形状データをフルスケール 2 m で計測した場合には、 変換後の強度で 8 0 %、 フルスケールを 4 z mで計測した場合 には、 変換後の強度で 4 0 %、 フルスケールを 6 mで計測した場合には、 変換後の 強度で 2 7 %を示す。 積層体を構成する絶縁層には、 ポリイミド前駆体樹脂溶液を塗布した後、 乾燥 '硬 化することにより形成されたもの、 熱可塑性樹脂層及び絶緣フィルムにより形成され たもの、 熱硬化性樹脂層及び絶縁フィルムにより形成されたもののいずれを用いても よい。 In the laminate that allows the wiring of the driver IC chip to be recognized through the insulating layer, the intensity of the periodic component equivalent to 600 nm corresponds to the surface height value before conversion of 1.6 / m Strength Not more than. Further, it is more preferably 1.5 or less. Here, the intensity equivalent to a surface height value of 1.6 before conversion is 80% of the intensity after conversion and 80% of the intensity after conversion when the two-dimensional shape data before conversion is measured at a full scale of 2 m. When the scale is measured at 4 zm, the converted intensity is 40%, and when the full scale is measured at 6m, the converted intensity is 27%. The insulating layer constituting the laminate is formed by applying a polyimide precursor resin solution and then drying and curing, a thermoplastic resin layer and an insulating film, and a thermosetting resin layer. Any of those formed by using an insulating film may be used.
これらの積層体を構成する絶縁層うち、 ポリイミド前駆体樹脂溶液を塗布した後、 乾燥 ·硬化することにより形成されたものが最も適するが、 本発明はこれに限定され るものではない。 Of the insulating layers constituting these laminates, those formed by applying a polyimide precursor resin solution, followed by drying and curing are most suitable, but the present invention is not limited thereto.
ポリイミド前駆体樹脂溶液は、 公知のジァミンと酸無水物とを溶媒の存在下で重合 して製造することができる。 The polyimide precursor resin solution can be produced by polymerizing a known diamine and an acid anhydride in the presence of a solvent.
用いられるジァミンとしては、 例えば、 4, 4'-ジアミノジフエ二ルエーテル、 2' -メ トキシ 4, 4' -ジァミノベンズァニリド、 1, 4-ビス (4 -アミノフエノキシ) ベンゼン、 1, 3-ビス (4 -アミノフエノキシ) ベンゼン、 2, 2'-ビス [4- (4 -アミノフエノキシ)フエ ニル]プロパン、 2, 2'-ジメチル- 4, 4'-ジアミノビフエニル、 3, 3' -ジヒドロキシ- 4, 4,- ジアミノビフエニル、 4, 4'ジァミノべンズァニリド等が挙げられる。 Examples of diamines used include 4,4'-diaminodiphenyl ether, 2'-methoxy4,4'-diaminobenzanilide, 1,4-bis (4-aminophenoxy) benzene, 1,3-bis (4-aminophenoxy) benzene, 2,2'-bis [4- (4-aminophenoxy) phenyl] propane, 2,2'-dimethyl-4,4'-diaminobiphenyl, 3,3 '-Dihydroxy-4,4, -diaminobiphenyl, 4,4' diaminobenzanilide and the like.
また、 酸無水物としては、 例えば、 無水ピロメリット酸、 3, 3', 4, 4'-ビフエ二ルテ トラカルボン酸二無水物、 3, 3', 4, 4'-ジフエニルスルフォンテトラカルボン酸二無水 物、 4, 4' -ォキシジフタル酸無水物が挙げられる。 Examples of the acid anhydride include pyromellitic anhydride, 3,3 ', 4,4'-biphenyltetracarboxylic dianhydride, 3,3', 4,4'-diphenylsulfonetetracarboxylic acid Acid dianhydride; 4,4'-oxydiphthalic anhydride;
ジァミン、 酸無水物はそれぞれ、 その 1種のみを使用してもよく 2種以上を併用し て使用することもできる。 Each of diamine and acid anhydride may be used alone or in combination of two or more.
溶媒は、 ジメチルァセトアミド、 n _メチルピロリジノン、 2 -ブ夕ノン、 ジグライ ム、 キシレン等が挙げられ、 1種若しくは 2種以上併用して使用することもできる。 ポリイミド系樹脂層は、 前駆体状態で銅箔層上に直接塗布して形成することが好ま しく、 重合された樹脂粘度を 5 0 0 cps〜3 5 , 0 0 O cpsの範囲とすることが好まし い。 塗布された樹脂液は熱処理されるが、 熱処理は 1 0 0 〜 1 5 O tで 2分〜 4分 大気中で熱処理し、 その後、 真空加熱で室温- 340°C-室温処理を 9時間ほど行なうこ とがよい。 ポリイミド樹脂層は、 単層のみから形成されるものでも、 複数層からなる ものでもよい。 ポリイミド系樹脂層を複数層とする場合、 異なる構成成分からなるポ リイミド系樹脂層の上に他のポリイミド樹脂を順次塗布して形成することができ る。 ポリイミド樹脂層が 3層以上からなる場合、 同一の構成のポリイミド樹脂を 2回 以上使用してもよい。 Examples of the solvent include dimethylacetamide, n-methylpyrrolidinone, 2-butanone, diglyme, xylene and the like, and one or more of them can be used in combination. The polyimide-based resin layer is preferably formed by directly applying it on the copper foil layer in a precursor state, and the viscosity of the polymerized resin is preferably in the range of 500 cps to 35,000 O cps. I like it. The applied resin solution is heat-treated, but heat-treated at 100 to 15 Ot for 2 to 4 minutes in the air, and then vacuum-heated to room temperature-340 ° C-room temperature treatment for about 9 hours It is better to do it. The polyimide resin layer may be formed of only a single layer, or may be formed of a plurality of layers. When a plurality of polyimide-based resin layers are used, they can be formed by sequentially applying another polyimide resin on a polyimide-based resin layer composed of different components. When the polyimide resin layer is composed of three or more layers, the same configuration of the polyimide resin may be used twice or more.
本発明の積層板の代表例である銅張り積層板は、 上記したように銅箔上にポリイミ ド樹脂を塗布することにより製造することができるが、 1層以上のポリイミドフィル ムを銅箔にラミネートして製造することもできる。 このように製造された銅張り積層 板は銅箔層を片面のみに有する片面銅張り積層板としてもよく、 また、 銅箔層を両面 に有する両面銅張り積層板とすることもできる。 両面銅張り積層体は、 片面銅張り積 層板を形成後、 銅箔層を熱プレスにより圧着する方法、 2枚の銅箔層間にポリイミド フィルムを挟み熱プレスにより圧着する方法等が挙げられる。 発明を実施するための最良の形態 以下、 本発明を実施例により更に詳細に説明する。 A copper-clad laminate, which is a typical example of the laminate of the present invention, can be manufactured by applying a polyimide resin on a copper foil as described above. It can also be manufactured by lamination. The copper-clad laminate thus manufactured may be a single-sided copper-clad laminate having a copper foil layer on only one side, or a double-sided copper-clad laminate having a copper foil layer on both sides. A double-sided copper-clad laminate is formed by forming a single-sided copper-clad laminate and then pressing the copper foil layer by hot pressing. A method in which a film is sandwiched and pressure-bonded by a hot press may be used. BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in more detail with reference to examples.
積層体の作成にあたり、 下記 4種類の銅箔を準備した。 In making the laminate, the following four types of copper foil were prepared.
1) 銅箔 1 :電解銅箔、 Rz 1. O m 1) Copper foil 1: Electrolytic copper foil, Rz 1. O m
2) 銅箔 2 :電解銅箔、 RzO. 2) Copper foil 2: Electrolytic copper foil, RzO.
3) 銅箔 3 :圧延銅箔、 Rz2. O im 3) Copper foil 3: Rolled copper foil, Rz2. O im
4) 銅箔 4 :銅箔 3を 5%塩酸水溶液に 1分浸漬した銅箔、 Rz2. O m 合成例 1 4) Copper foil 4: Copper foil 3 immersed in 5% hydrochloric acid aqueous solution for 1 minute, Rz2. O m Synthesis example 1
熱電対、 攪拌機、 窒素導入可能な反応容器に、 n-メチルピロリジノンを入れる。 この反応容器を容器に入った氷水に寖けた後、 反応容器に無水ピロメリット酸 (PMDA) を投入し、 その後., 4, 4'-ジアミノジフエニルエーテル、 (匿) と 2, -メト キシ 4, 4'-ジァミノべンズァニリド (MABA)を投入した。 モノマーの投入総量が 15wt% で、 各ジァミンのモル比率は、 MABA:DAPE=60: 40となり、 酸無水物とジァミンのモ ル比が 0.98 : 1.0となるよう投入した。 その後、 更に攪拌を続け、 反応容器内の温度 が、 室温から ±5°Cの範囲となった時に反応容器を氷水から外し、 更に室温のまま 3 時間攪拌を続けた。 得られたポリアミック酸の溶液粘度は、 15, OOOcpsであった。 合成例 2 Put n-methylpyrrolidinone in a thermocouple, stirrer, or reaction vessel into which nitrogen can be introduced. After pouring the reaction vessel into the ice water contained therein, pyromellitic anhydride (PMDA) is charged into the reaction vessel, and then, 4,4'-diaminodiphenyl ether, (anhydro) and 2, -methoxy Introduced 4,4'-diaminobenzanilide (MABA). The total amount of monomer was 15 wt%, the molar ratio of each diamine was MABA: DAPE = 60: 40, and the molar ratio of acid anhydride to diamine was 0.98: 1.0. Thereafter, stirring was further continued, and when the temperature in the reaction vessel became within a range of ± 5 ° C from room temperature, the reaction vessel was removed from ice water, and stirring was continued at room temperature for 3 hours. The solution viscosity of the obtained polyamic acid was 15, OOOcps. Synthesis example 2
n-メチルピロリジノンを入れた反応容器を氷水に浸けた後、 反応容器に PMDA/3, 3', 4, 4' -ビフエニルテトラカルボン酸二無水物 (BTDA)を投入し、その後、 4, 4' - ジァミノジフエ二ルェ一テル (DAPE)を投入した。モノマ一の投入総量が 15wt%で、 各 酸無水物のモル比率は、 BTDA:PMDA=70 : 30 となり、 酸無水物とジァミンのモル比が 1. 03: 1. 0となるよう投入した。 その後、 更に攪拌を続け、 反応容器内の温度が、 室 温から ±5°Cの範囲となった時に反応容器を氷水から外し、 更に室温のまま 3時間攪 拌を続けた。 得られたポリアミック酸の溶液粘度は、 3, 200cpsであった。 合成例 3 After immersing the reaction vessel containing n-methylpyrrolidinone in ice water, PMDA / 3, 3 ', 4, 4'-biphenyltetracarboxylic dianhydride (BTDA) was charged into the reaction vessel, and then 4,4 4 '-Diamino diphenyl ether (DAPE) was introduced. The total amount of monomer input is 15 wt%, The molar ratio of the acid anhydride was BTDA: PMDA = 70: 30, and the molar ratio between the acid anhydride and diamine was 1.03: 1.0. Thereafter, stirring was further continued. When the temperature in the reaction vessel became within ± 5 ° C from room temperature, the reaction vessel was removed from ice water, and stirring was continued at room temperature for 3 hours. The solution viscosity of the obtained polyamic acid was 3,200 cps. Synthesis example 3
n-メチルピロリジノンを入れた反応容器を氷水に浸けた後、 反応容器に 3, 3'4, 4'- ジフエニルスルフォンテトラカルボン酸二無水物 (DSDA)、 PMMを投入しその後 1, 3 - ビス (4 -アミノフエノキシ)ベンゼン (TPE一 R)を投入した。モノマーの投入総量が 15wt %で、 各酸無水物のモル比率は、 DSDA: DA=90: 10となり、 酸無水物とジァミンのモ ル比が 1. 03 : 1. 0となるよう投入した。 その後、 更に攪拌を続け、 反応容器内の温度 が、 室温から土 5°Cの範囲となった時に反応容器を氷水から外し、 更に室温のまま 3 時間攪拌を続けた。 得られたポリアミック酸の溶液粘度は 3J00cpsであった。 実施例 1 After immersing the reaction vessel containing n-methylpyrrolidinone in ice water, add 3,3'4,4'-diphenylsulfonetetracarboxylic dianhydride (DSDA) and PMM to the reaction vessel and then 1,3- Bis (4-aminophenoxy) benzene (TPE-I) was introduced. The total amount of the monomer was 15 wt%, the molar ratio of each acid anhydride was DSDA: DA = 90: 10, and the molar ratio of the acid anhydride to diamine was 1.03: 1.0. Thereafter, stirring was further continued, and when the temperature in the reaction vessel was in the range of from room temperature to 5 ° C in soil, the reaction vessel was removed from the ice water, and stirring was continued at room temperature for 3 hours. The solution viscosity of the obtained polyamic acid was 3J00 cps. Example 1
(I) 銅箔として、 銅箔 1を使用した。 この銅箔の表面を原子間力顕微鏡 (デジタル インスツルメンッ製走査型プローブ顕微鏡 NanoScope)を用い、 50 /im方形の範囲を、 フルスケール 4 ΠΙ、 256階調にて形状計測した。 一階調は 0. 0156 mに相当する。 得られた画像を市販の汎用画像処理ソフトウェアにて二次元フーリエ変換しパヮ —スぺクトルを得 このパワースぺクトルより、波長 600nmに相当する位置の強度、 F (U. V) を測定したところ、 256階調中、 93階調に相当し、 強度は 36%であった。 ま たこれは、 変換前の形状データのフルスケールが 4 ΠΙであることから、 1. 45 xmに相 当する。 (I) Copper foil 1 was used as the copper foil. The surface of this copper foil was shape-measured with an atomic force microscope (NanoScope, a scanning probe microscope manufactured by Digital Instruments) in a range of 50 / im square at a full scale of 4 mm and 256 gradations. One gradation corresponds to 0.0156 m. The obtained image was subjected to two-dimensional Fourier transform using commercially available general-purpose image processing software to obtain a power spectrum. From this power spectrum, the intensity F (U.V) at a position corresponding to a wavelength of 600 nm was measured. Out of 256 gradations, which corresponded to 93 gradations, and the intensity was 36%. This is equivalent to 1.45 xm because the full scale of the shape data before conversion is 4 mm.
この電解銅箔上に合成例 1から 3のポリアミック酸溶液を塗布、乾燥を繰り返し銅 箔層上にポリイミド前駆体樹脂層が形成された積層体を得た。この積層体を 340°Cで、 8時間かけて熱処理し、 ポリイミド厚み 40 /zmの片面銅箔の積層体を得た。 この積層 体は、電解銅箔上に合成例 1のポリアミック酸から生じるポリイミド層 3 m、合成例 2のポリアミック酸から生じるポリイミド層 34 ΠΙ、 合成例 2のポリアミック酸から 生じるポリイミド層 を有する。 The polyamic acid solution of Synthesis Examples 1 to 3 was applied and dried repeatedly on the electrolytic copper foil to obtain a laminate in which a polyimide precursor resin layer was formed on the copper foil layer. At 340 ° C, Heat treatment was performed for 8 hours to obtain a single-sided copper foil laminate having a polyimide thickness of 40 / zm. This laminate has a polyimide layer 3 m generated from the polyamic acid of Synthesis Example 1, a polyimide layer 34 generated from the polyamic acid of Synthesis Example 2, and a polyimide layer generated from the polyamic acid of Synthesis Example 2 on the electrolytic copper foil.
この積層体を塩化第二鉄水溶液にてェツチングし、 40 mの絶縁層フィルムを得た。 試験用に準備したドライバ I Cチップ上に、 このフィルムを lOO ^mの距離を保った 状態で保持し、 市販ポンダー機 (新川 (株) 製 ILT—110) を用いて、 ポンダー機に装 備された位置合わせ用の C C Dカメラを用いて、 フィルムを通して I Cチップ上の 200 mの大きさの検査パターンを観察したところ、 良好な画像が得られた。 The laminate was etched with an aqueous ferric chloride solution to obtain a 40 m insulating film. This film was held on the driver IC chip prepared for the test while maintaining a distance of lOO ^ m. The film was mounted on the ponder machine using a commercially available ponder machine (Shinkawa ILT-110). When a 200 m inspection pattern on the IC chip was observed through the film using a CCD camera for alignment, a good image was obtained.
(I I) 銅箔として、 銅箔 1を使用した。 対象波長を 300ηιηとする以外は、 上記 (I) と同様に表面形状を測定したところ、 波長 300nmに相当する強度は、 256階調中、 85 階調に相当し、強度としては 33%であった。 またこれは、 変換前の形状デ一夕のフル スケールが であることから、 1. 32 mに相当する。 比較例 1 (II) Copper foil 1 was used as the copper foil. The surface shape was measured in the same manner as in (I) above, except that the target wavelength was set to 300ηιη. The intensity corresponding to the wavelength of 300nm was equivalent to 85 of 256 gradations, and the intensity was 33%. Was. This is equivalent to 1.32 m because the full scale of the shape before conversion is. Comparative Example 1
(I) 銅箔として、 銅箔 2を使用した。 実施例 1と同様に表面形状を測定したとこ ろ、 波長 600MIに相当する強度は、 256階調中、 108階調に相当し、 強度としては 42 %であった。 またこれは、 変換前の形状データのフルスケールが 4 , inであることか ら、 1. 68 ΠΙに相当する。 (I) Copper foil 2 was used as the copper foil. When the surface shape was measured in the same manner as in Example 1, the intensity corresponding to the wavelength of 600MI was equivalent to 108 of 256 gradations, and the intensity was 42%. This is equivalent to 1.68% since the full scale of the shape data before conversion is 4, in.
この電解銅箔を使用して、 実施例 1と同様にして積層体を製造し、 エッチングして 絶縁層フィルムを得た。 このフィルムを透過して I Cチップを観察したところ、 画像 は認識できなかった。 Using this electrolytic copper foil, a laminate was manufactured in the same manner as in Example 1, and an insulating layer film was obtained by etching. When the IC chip was observed through this film, no image could be recognized.
(I I) 銅箔として、銅箔 2を使用し、上記(I)と同様に表面形状を測定したところ、 波長 300nmに相当する強度は、 256階調中、 85階調に相当し、強度としては 33 %であ つた。またこれは、 変換前の形状データのフルスケールが 4 ΠΙであることから、 1. 32 fflに相当する < (II) When copper foil 2 was used as the copper foil and the surface shape was measured in the same manner as in (I) above, the intensity corresponding to a wavelength of 300 nm was equivalent to 85 out of 256 tones, and the intensity was Was 33%. Also, since the full scale of the shape data before conversion is 4 mm, 1.32 ffl equivalent <
比較例 2 Comparative Example 2
銅箔として、 銅箔 3を使用し、 実施例 1と同様に表面形状を測定したところ、 波長 600nmに相当する強度は、 256階調中、 119階調に相当し、 強度としては 46%であつ た。 またこれは、 変換前の形状データのフルスケールが 4 mであることから、 1.86 mに相当する。 When the surface shape was measured in the same manner as in Example 1 using copper foil 3 as the copper foil, the intensity corresponding to a wavelength of 600 nm was equivalent to 119 out of 256 gradations, and the intensity was 46%. It was hot. This is equivalent to 1.86 m because the full scale of the shape data before conversion is 4 m.
この電解銅箔を使用して、 実施例 1と同様にして積層体を製造し、 エッチングして 絶縁層フィルムを得た。 このフィルムを透過して I Cチップを観察したところ、 画像 は認識できなかった。 Using this electrolytic copper foil, a laminate was manufactured in the same manner as in Example 1, and an insulating layer film was obtained by etching. When the IC chip was observed through this film, no image could be recognized.
実施例 2 Example 2
銅箔として、 銅箔 4を使用し、 実施例 1と同様に表面形状を測定したところ、 波長 600imに相当する強度は、 256階調中、 90階調に相当し、強度としては 35%であった。 またこれは、 変換前の形状デー夕のフルスケールが 4."mであることから、 1.41, ηι に相当する。 この酸洗済み圧延銅箔 4を使用して、 実施例 1と同様にして積層体を製造し、 エツ チングして絶緣層フィルムを得た。 このフィルムを透過して I Cチップを観察したと ころ、 良好な画像が得られた。 The copper foil 4 was used as the copper foil, and the surface shape was measured in the same manner as in Example 1. The intensity corresponding to the wavelength of 600 im was equivalent to 90 of 256 gradations, and the intensity was 35%. there were. Also, this corresponds to 1.41, ηι since the full scale of the shape data before conversion is 4. "m. Using this pickled rolled copper foil 4, The laminated body was manufactured and etched to obtain an insulated layer film.When the IC chip was observed through this film, a good image was obtained.
結果をまとめて表 1に示す。 (表 1) The results are summarized in Table 1. (table 1)
銅箔 1 銅箔 2 銅箔 3 銅箔 4Copper foil 1 Copper foil 2 Copper foil 3 Copper foil 4
Rz (^ m) 1.0 0.8 2.0 2.0Rz (^ m) 1.0 0.8 2.0 2.0
600nm Λ。ワースへ"クトル 36 42 46 35 周期性 強度 (%) 93/256 108/256 119/256 90/256 相当高さ * ( im) 1. 45 1. 69 1. 86 1. 41600 nm Λ. Worth "36 36 46 35 Periodicity (%) 93/256 108/256 119/256 90/256 Equivalent height * (im) 1.45 1.69 1.86 1.41
300ηηι ハ。ワースへ。クトル 33 33 300ηηι c. To Worth. Khutor 33 33
周期性 強度 (%) 85/256 85/256 Periodicity (%) 85/256 85/256
相当高さ * ( m) 1. 33 1. 33 Equivalent height * (m) 1.33 1.33
ICチップ配線認識性 〇 X X 〇 IC chip wiring recognition 〇 X X 〇
*フルスケールは 4 ΠΙ * 4 4 for full scale
産業上の利用の可能性 Industrial potential
絶縁層を透過してドライバ I Cチップの配線を認識することが可能となり、 導体と 絶縁体の間の接着力が高ぐ 耐エレクトロマイグレーション性に優れた積層体の製造 を可能とする。 The wiring of the driver IC chip can be recognized through the insulating layer, and the adhesion between the conductor and the insulator is high, and a laminate having excellent electromigration resistance can be manufactured.
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