WO2004001764A3 - Verfahren und vorrichtung zur erfassung von optischen nahfeldwechselwirkungssignalen - Google Patents
Verfahren und vorrichtung zur erfassung von optischen nahfeldwechselwirkungssignalen Download PDFInfo
- Publication number
- WO2004001764A3 WO2004001764A3 PCT/EP2003/006587 EP0306587W WO2004001764A3 WO 2004001764 A3 WO2004001764 A3 WO 2004001764A3 EP 0306587 W EP0306587 W EP 0306587W WO 2004001764 A3 WO2004001764 A3 WO 2004001764A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- objects
- near field
- infra
- interaction signals
- field interaction
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1463—Record carriers for recording or reproduction involving the use of microscopic probe means
- G11B9/149—Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the memorising material or structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/02—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using ferroelectric record carriers; Record carriers therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Recording Or Reproduction (AREA)
- Optical Record Carriers And Manufacture Thereof (AREA)
Abstract
Es werden Verfahren zur Erfassung von optischen Nahfeldwechselwirkungssignalen im infraroten Spektralbereich beschrieben, mit den Schritten: Beleuchtung einer Objekt-Kombination aus mindestens zwei Objekten (1, 2) mit Infrarotstrahlung, so dass eine Infrarot-Nahfeldkopplung zwischen den Objekten (1, 2) erzeugt wird, und Erfassung des von der Objekt-Kombination gestreuten Streulichts, das einen Anteils (s) enthält, der durch die Nahfeldkopplung modifiziert ist, wobei mindestens eines der Objekte (1, 2) ein polares Material umfasst, das zumindest teilweise eine polare Festkörperstruktur besitzt, und bei der Beleuchtung in dem mindestens einen der Objekte (1, 2) mit dem polaren Material mindestens eine Phononresonanz angeregt wird, mit der der modifizierte Anteil (s) des Streulichts verstärkt wird. Es werden auch Anwendungen des Verfahrens in der Messtechnik, Datenspeichertechnik und in der optischen Signalverarbeitung beschrieben.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/519,349 US20050259252A1 (en) | 2002-06-24 | 2003-06-23 | Method and device for recording optical near field interaction signals |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10228123A DE10228123B4 (de) | 2002-06-24 | 2002-06-24 | Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen |
DE10228123.8 | 2002-06-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004001764A2 WO2004001764A2 (de) | 2003-12-31 |
WO2004001764A3 true WO2004001764A3 (de) | 2005-02-10 |
Family
ID=29761341
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2003/006587 WO2004001764A2 (de) | 2002-06-24 | 2003-06-23 | Verfahren und vorrichtung zur erfassung von optischen nahfeldwechselwirkungssignalen |
Country Status (3)
Country | Link |
---|---|
US (1) | US20050259252A1 (de) |
DE (1) | DE10228123B4 (de) |
WO (1) | WO2004001764A2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005029823B4 (de) * | 2005-06-27 | 2014-10-09 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Vorrichtung zur tiefenaufgelösten Nahfeldmikroskopie |
ATE407430T1 (de) * | 2005-09-30 | 2008-09-15 | Max Planck Gesellschaft | Optische vorrichtung zur messung von modulierten lichtsignalen |
US8001830B2 (en) * | 2007-05-15 | 2011-08-23 | Anasys Instruments, Inc. | High frequency deflection measurement of IR absorption |
FR2922677B1 (fr) * | 2007-10-23 | 2012-04-13 | Inst Nat Sciences Appliq | Pointe destinee a un capteur pour microscope a champ proche et procede de fabrication associe |
US7977636B2 (en) * | 2008-08-12 | 2011-07-12 | Anasys Instruments, Inc. | Infrared imaging using thermal radiation from a scanning probe tip |
KR102452942B1 (ko) | 2014-09-30 | 2022-10-11 | 삼성전자주식회사 | 광자 쌍 생성기 및 이를 채용한 양자 암호 시스템 |
FR3061289B1 (fr) | 2016-12-23 | 2020-10-09 | Centre Nat Rech Scient | Dispositif de detection infrarouge. |
CN111610345B (zh) * | 2020-06-04 | 2022-04-19 | 中国科学技术大学 | 一种远红外探测器及近场显微镜 |
CN112240754A (zh) * | 2020-11-17 | 2021-01-19 | 中国科学院上海微系统与信息技术研究所 | 一种微小空间三维形貌测量装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6408123B1 (en) * | 1999-11-11 | 2002-06-18 | Canon Kabushiki Kaisha | Near-field optical probe having surface plasmon polariton waveguide and method of preparing the same as well as microscope, recording/regeneration apparatus and micro-fabrication apparatus using the same |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4947034A (en) * | 1989-04-28 | 1990-08-07 | International Business Machines Corporation | Apertureless near field optical microscope |
US5602820A (en) * | 1995-08-24 | 1997-02-11 | International Business Machines Corporation | Method and apparatus for mass data storage |
DE10035134B4 (de) * | 2000-07-19 | 2006-06-01 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Vorrichtung zur optischen Nahfeldmikroskopie |
-
2002
- 2002-06-24 DE DE10228123A patent/DE10228123B4/de not_active Expired - Lifetime
-
2003
- 2003-06-23 WO PCT/EP2003/006587 patent/WO2004001764A2/de active Application Filing
- 2003-06-23 US US10/519,349 patent/US20050259252A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6408123B1 (en) * | 1999-11-11 | 2002-06-18 | Canon Kabushiki Kaisha | Near-field optical probe having surface plasmon polariton waveguide and method of preparing the same as well as microscope, recording/regeneration apparatus and micro-fabrication apparatus using the same |
Non-Patent Citations (3)
Title |
---|
KNOLL B ET AL: "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy", OPTICS COMMUNICATIONS, NORTH-HOLLAND PUBLISHING CO. AMSTERDAM, NL, vol. 182, no. 4-6, 15 August 2000 (2000-08-15), pages 321 - 328, XP004215621, ISSN: 0030-4018 * |
KNOLL B ET AL: "Infrared conductivity mapping for nanoelectronics", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 77, no. 24, 11 December 2000 (2000-12-11), pages 3980 - 3982, XP012026893, ISSN: 0003-6951 * |
KNOLL B ET AL: "NEAR-FIELD PROBING OF VIBRATIONAL ABSORPTION FOR CHEMICAL MICROSCOPY", NATURE, MACMILLAN JOURNALS LTD. LONDON, GB, vol. 399, 13 May 1999 (1999-05-13), pages 134 - 137, XP002971356, ISSN: 0028-0836 * |
Also Published As
Publication number | Publication date |
---|---|
US20050259252A1 (en) | 2005-11-24 |
DE10228123A1 (de) | 2004-01-22 |
DE10228123B4 (de) | 2011-09-15 |
WO2004001764A2 (de) | 2003-12-31 |
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