WO2002070792A1 - Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier - Google Patents
Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier Download PDFInfo
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- WO2002070792A1 WO2002070792A1 PCT/FR2002/000706 FR0200706W WO02070792A1 WO 2002070792 A1 WO2002070792 A1 WO 2002070792A1 FR 0200706 W FR0200706 W FR 0200706W WO 02070792 A1 WO02070792 A1 WO 02070792A1
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- WIPO (PCT)
- Prior art keywords
- electrode
- substrate
- etched
- etching
- solution
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 120
- 238000005530 etching Methods 0.000 title claims abstract description 72
- 238000000034 method Methods 0.000 title claims abstract description 49
- 239000011521 glass Substances 0.000 title claims description 8
- 229910044991 metal oxide Inorganic materials 0.000 claims abstract description 12
- 150000004706 metal oxides Chemical class 0.000 claims abstract description 10
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 10
- 230000003247 decreasing effect Effects 0.000 claims description 5
- 238000006073 displacement reaction Methods 0.000 claims description 5
- 229910052731 fluorine Inorganic materials 0.000 claims description 5
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 4
- 239000011737 fluorine Substances 0.000 claims description 4
- 239000001257 hydrogen Substances 0.000 claims description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims description 4
- 238000007654 immersion Methods 0.000 claims description 4
- 239000001301 oxygen Substances 0.000 claims description 4
- 229910052760 oxygen Inorganic materials 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 238000005056 compaction Methods 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims description 2
- 229910001887 tin oxide Inorganic materials 0.000 claims description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 2
- 230000003100 immobilizing effect Effects 0.000 claims 1
- 239000000243 solution Substances 0.000 description 56
- 229910006404 SnO 2 Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 3
- -1 tin metal oxide Chemical class 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 238000003486 chemical etching Methods 0.000 description 2
- 239000005329 float glass Substances 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 238000002604 ultrasonography Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000003487 electrochemical reaction Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hcl hcl Chemical compound Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3063—Electrolytic etching
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F3/00—Electrolytic etching or polishing
- C25F3/02—Etching
- C25F3/14—Etching locally
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2217/00—Gas-filled discharge tubes
- H01J2217/38—Cold-cathode tubes
- H01J2217/49—Display panels, e.g. not making use of alternating current
- H01J2217/492—Details
- H01J2217/49207—Electrodes
Definitions
- the invention relates to a process for etching layers, deposited on transparent substrates of the glass substrate type and more particularly layers at least slightly electrically conductive in order to obtain electrodes, conductive elements.
- the invention is particularly interested in layers based on metal oxide of SnO 2 type doped with fluorine which are generally used as electrodes for emissive screens of the flat screen type, for example plasma screens.
- a technique for the chemical etching of conductive metal oxide layers such as SnO 2 consisting first of all of depositing on the etching layer a continuous layer based on a resin called "photoresist" »Which must be exposed through a plate, developed and then rinsed so as to obtain a mask with the desired pattern. Then is deposited on the layer provided with the mask of the zinc powder which is dried, and is then operated, a chemical attack of the zones of the layer not covered by the resin by immersing the substrate in a bath of strong acid of the HCI type. .
- Chemical etching is well suited for TITO but is not very effective for Sn0 2 or even SnO 2 doped with fluorine (Sn0 2 : F) which are more resistant.
- French patent application FR 2 325 084 discloses another process, by electrochemical means. This involves electrolytically reducing the metal oxide layer Sn0 2 by immersing, in a bath of a hydrochloric acid or sulfuric acid solution, the substrate provided with the layer to be etched and a copper electrode. , the substrate and the electrode being connected to a power supply to respectively constitute the cathode and the anode of the system.
- the electrode has dimensions in height and in width equivalent to that of the substrate which is slowly immersed at constant speed, for example at around 1 cm / min for a layer thickness of 0.5 ⁇ m.
- the principle of electrochemical etching is advantageous, however, the method described above with such an electrode can cause an over-etching problem.
- Figure 2 illustrates the phenomenon of overprinting.
- the substrate is immersed at constant speed, etching therefore takes place as the substrate progresses.
- the areas already etched remain in contact with the electrolytic solution and facing the electrode so that etching continues on these areas while passing under the mask.
- This part of the layer under the mask which is therefore removed is called over-etching which, if it is inhomogeneous, then renders the substrate unusable since the distance between the electrodes of the etched substrate is no longer constant.
- the invention therefore aims to use electrochemical etching to propose a new type of process greatly limiting, and even avoiding, the phenomenon of over-etching.
- - immerse an electrode in the solution and place it opposite and at a distance (d) from the area, - apply an electrical voltage between the electrode and the layer to be etched, is characterized in that it uses at least one electrode and the electrode has an oblong shape so that the etching is carried out on several zones of the layer along a width /.
- An oblong shape of the electrode that is to say having a section of dimensions much smaller than its length, allows the substrate to be facing the electrode only over a limited area and not over its entire surface and so next to already engraved areas.
- the risk of over-etching is then greatly limited.
- the method of the invention provides that the electrode or the substrate is moved relative to one another so that the electrode is positioned successively opposite the areas to be etched simultaneously and that , according to a first embodiment, the zones already etched are physically isolated from the electrically conductive solution, or according to a second embodiment, the etching speed is reduced as zones are etched and remain in contact with the electrically conductive solution.
- the electrode is held fixed in the conductive solution which is brought into contact with only the areas to be etched temporarily temporarily, the time of etching.
- the conductive solution is in a fixed position while the substrate is moved at a constant speed relative to the solution, or else, the substrate is in a fixed position while the solution is moved at a constant speed relative to the substrate.
- the conductive solution is contained in a tank adjusted to the dimensions of the electrode and disposed under the substrate.
- the substrate is immersed in the conductive solution for etching and immersed after etching in a second non-conductive solution on which the conductive solution is suspended.
- the substrate is completely immersed in a fixed manner in the solution, the face provided with the layer being parallel and facing the surface of the solution, and the electrode is moved at constant speed in look at the areas to be etched and is associated with covering means which cover the electrode and the areas to be etched to isolate them from the etched areas.
- the electrode is fixed in the conductive solution while the substrate is gradually immersed in the solution as the etching takes place, the etching speed being reduced by decreasing the speed of displacement of the substrate.
- the speed of movement of the substrate is a decreasing exponential function.
- the electrode is arranged transversely to the bands.
- the layer disposed on the substrate is tin metal oxide or tin metal oxide doped with fluorine.
- the electrode is preferably made of platinum and has a section of between 0.2 and 5 mm 2 .
- the substrate is provided with an electrical contact for applying the electrical voltage, the contact being arranged at one end of the substrate, and the etching is carried out from the end free of any electrical contact to opposite edge provided with electrical contact.
- the electrical voltage is at least equal to the reduction potential of the conductive material constituting the layer.
- the application of the voltage between the electrode and the layer is carried out by an electrical contact obtained by immersing an electrode in an electrically conductive solution brought into contact with at least one non-etched area.
- means are provided for detaching oxygen and hydrogen bubbles which appear during etching near and / or on the electrode.
- the invention also relates to a transparent substrate comprising a layer with electrical conduction properties etched by the method explained above.
- This type of substrate may in particular be used in display screens of the plasma screen type.
- the substrate may advantageously consist of a glass composition having a Strain Point (lower annealing temperature) greater than 540 ° C, the compaction value of the substrate being less than 60 ppm, and its thermal performance DT being greater than 130 ° vs.
- Strain Point lower annealing temperature
- FIG. 3 is a top view of the substrate provided with the mask, part of the layer is etched;
- FIGS. 4 to 7 are schematic sectional views of variants of the embodiment of the invention
- - Figure 8 is a side view of the electrode associated with a support as for the variant of Figure 4
- the figures are not drawn to scale to simplify understanding. It should be taken as an example in the following description a transparent substrate 10 of glass type which is illustrated in Figures 1a and 1b, respectively, before and after having undergone the etching process of the invention.
- the substrate 10 is made of float glass about 2.8 mm thick and here by way of example, of dimensions 60 cm ⁇ 100 cm, it is intended to constitute a front or rear face of an emissive screen of the type plasma screen.
- the substrate 10 includes a layer 11 of fluorine-doped tin oxide (SnO2: F) 300 nm thick, for example deposited in a prior step and not described here in detail, because known to those skilled in the art. art, either by a technique of the gas phase pyrolysis type (also called Chemical Vapor Deposition) directly continuously on the float glass ribbon or in recovery on the cut glasses, or by a vacuum technique generally in recovery on the cut glasses.
- a technique of the gas phase pyrolysis type also called Chemical Vapor Deposition
- the goal is to obtain a high resolution etching of the layer to provide electrodes 11 'in the form of parallel strips 100 cm long, dimension corresponding to the length of the substrate, and 250 ⁇ m wide.
- These bands can be grouped into “pairs” of bands spaced from each other by 400 ⁇ m, with a distance between two bands of the same pair of 80 ⁇ m.
- the mask 12 has a pattern which constitutes the strip shape of the electrodes 11 'to be obtained. Also, the etching of the layer 11 is carried out on the areas 13 exposed and devoid of mask which, as a whole, also constitute parallel bands.
- the etching method of the invention consists in contacting the areas 13 to be etched with a conductive solution, or electrolyte, to immerse a electrode in the same solution, placing it opposite each zone 13 and applying an electrical voltage between the electrode and the layer 11.
- the electrode is oblong in shape so as to extend preferably over the entire width of the substrate and transversely to the bands to be etched, which makes it possible to cover several zones 13 which can thus be etched simultaneously (FIG.
- the etching is carried out on a surface of width /, of approximately 1 cm for example, and perpendicular to the axis of the electrode.
- the etching operation is repeated by moving either the electrode or the substrate, transversely to the strips to be etched and along the entire length of the substrate. If the electrode cannot be as large as the width of the substrate, the etching operation is carried out over a length corresponding to the length of the electrode and the operation must then be repeated to etch the substrate over its entire width. Or to save time, it is possible to envisage using several electrodes which each etch a portion of the width of the substrate.
- the etching is produced by an electrochemical reaction: the ions in the solution transport the electrons which attack the layer of SnO 2 to reduce it to the metallic state (Sn) and generate oxygen and hydrogen under the appearance bubbles 51 around the area 13 ( Figures 4 to 7). Removal means 50 of these bubbles (FIG. 4), such as ultrasound, can be used in order to prevent a bubble from becoming fixed on the layer Sn0 2 : F to prevent or minimize the etching which would otherwise cause a short circuit.
- the method of the invention therefore consists in that the electrode or the substrate is moved relative to one another so that the electrode is positioned successively opposite the zones to be etched simultaneously and that, according to a first embodiment, the areas already etched are physically isolated from the electrically conductive solution, or according to a second embodiment, the etching speed is reduced as areas are etched and remain in contact with the electrically conductive solution .
- Figures 4 to 6a and 6b illustrate variants of the device for implementing the method according to the first embodiment, while Figure 7 illustrates the implementation device according to the second embodiment. Common elements are identified by identical references.
- the conductive solution 20 consists of a bath which may or may not contain the entire substrate, at least the zone to be etched having to be in contact with the solution.
- hydrochloric acid HCl
- the concentration of which is 0.1 to 5 M, preferably about 1 M.
- the electrode is therefore oblong in shape, that is to say that its section, whatever its shape, is smaller in size than its length.
- the electrode may for example be an electrically conductive wire, advantageously made of platinum, the diameter of which corresponds to the section s facing the zones 13.
- it may be a flat parallelepipedal conductive element, such as a rigid metal sheet whose thickness corresponds substantially to the section s facing the zones 13.
- the diameter of the section s of the electrode is for example equal to 0.5 mm but could be larger or smaller.
- the size is to be adapted according to the type of electrode chosen, for example for a wire, it is a function of the length of the wire and of its material to ensure a certain rigidity.
- the section will advantageously be between 0.2 and 5 mm 2 .
- the distance d which separates the electrode from the layer to be etched is defined as being the smallest quantity separating the electrode from the layer, that is to say perpendicular to the plane of the substrate. It can vary from 0.1 mm to 3 cm for the type of substrate taken here as an example, it is however imposed, in particular, according to the desired width and depth of the area to be etched and according to the section s of the electrode.
- An electrical contact 14 is provided connected to the layer 11 and fixedly at one of the ends of the substrate, it is connected to the negative potential of a voltage generator 40 while the electrode 30 is connected to the positive potential.
- the etching is carried out transversely to the parallel strips of the layer 11 to be etched, in addition, it advantageously begins from the end of the substrate free of any electrical contact to finish at the end provided with the contact 14 of so as to ensure a constant electrical connection of the areas remaining to be etched, only a displacement of the electrode relative to the substrate or vice versa is necessary.
- a contact made by capillary action with the conductive solution as described below with reference to FIG. 6b.
- the electric voltage U supplied by the generator 40 and applied between the electrode 30 and the layer 11 must be at least equal to the reduction potential of the metal or the metal oxide of the layer; for Sn ⁇ 2 , the minimum voltage is 2V.
- the current supplied by this same generator can for example be 3A.
- the etching time during which the electrode 30 remains in position facing the area 13 to be etched and the voltage applied can vary from a few seconds to a few minutes for the type of substrate taken here as an example. Again, the time depends on the various parameters involved in the process and mentioned above, and in particular the distance d and the thickness of the area to be etched, that is to say the thickness of the layer 11
- the various parameters involved in the process for etching an area of given width and thickness which are the concentration of the solution, the current, the distance d, the section s of the electrode, and the etching time. depend on each other and must therefore be adjusted in relation to each other. In the first variant of the first embodiment visible in the figure
- the substrate 10 is completely immersed horizontally in the solution 20 and kept fixed, the face provided with the layer 11 and the mask 12 being turned towards the surface of the solution.
- the etching is carried out by moving the electrode 30 in a translational movement F at constant speed.
- the layer 11 is connected by one end of the substrate via the electrical contact 14 to the negative pole of the generator 40 while the positive pole of the latter is connected to the electrode 30.
- the electrode 30 consists of a wire platinum is arranged transversely to the bands to be engraved and the wire is positioned vertically in the area 13 to be engraved.
- support 31 not visible in FIG. 2 but illustrated in FIG. 8. It is a frame in the shape of a jumper, insulating and able to resist chemically to the conductive solution 20, for example PVC, around which the platinum wire is tightened.
- the legs 31a of the rider are supported on the substrate, and the wire 30 is kept at distance d from the substrate by its engagement in two notches 31b arranged face to face on the legs 31a of the rider, the height h of the notches corresponding to the distance d.
- Several notches 31b can be provided, so as to provide different possible distances d.
- the area being etched is physically isolated by surrounding the electrode and the area by covering means 32 such as a flexible skirt.
- the skirt is designed to surround the electrode 30, its sides 32a flush with the layer 11 without scratching it and falling on each side of the zones 13 during etching.
- the electrode 30 remains in a fixed position in the electrically conductive solution 20 while the substrate 10 is immersed vertically according to the displacement F and at constant speed in the solution by displacement means 53 such as a clamp manipulated by a mechanical arm.
- the electrically conductive solution 20 is suspended in suspension on a non-conductive solution 23.
- the height of the solution 20 corresponds at least to the width / of the etching (FIG. 2) of a strip 13 to be etched and the height of the non-conductive solution.
- -conductive 23 is substantially equal to the size of the substrate.
- a tank 52 receives the solution container 20 and 23 in order to receive the overflow of the solution 20 during the immersion of the substrate.
- the electrode 30 is kept fixed in the conductive solution 20 which is brought into contact with only the areas 13 to be etched temporarily temporarily, the time of the etching. To achieve this, the electrode 30 remains immersed in a tank 21 which contains the solution 20 and is adapted just to the size of the electrode. The areas to be etched on the substrate are then brought into capillary contact with the solution, the electrode being opposite these areas.
- Successive contacting of the areas to be etched is carried out either by moving the substrate with respect to the tray 21 remaining in a fixed position, the substrate being able to travel at constant speed above the tray 21 by suitable drive means 54 , or by moving the container 21 with respect to the substrate remaining in the fixed position, the container 21 moving at constant speed by suitable drive means 55 and below the substrate held in position by suspension means. So that the solution 20 is always in contact with the substrate, one of the two elements being continuously moving, overpressure means not illustrated are provided to obtain a state of mini-boiling or of permanent overflow of the solution 20.
- the conductive solution 20 containing the electrode 30 is in contact with the areas 13 to be engraved simultaneously only for etching, and once the areas are etched, these are no longer in contact with the solution necessarily avoiding the phenomenon of over-etching.
- the etched surface of the substrate can then be rinsed of all residues of the conductive solution by bringing the etched areas of the substrate into contact with another tank 22 filled with water.
- This tank is fixed if the substrate moves or is mobile if the substrate remains fixed.
- a type of electrode not a wire, but for example a metallized support, the support being structurally integrated into the tank 21 and forming a channel in which is housed metal look of the substrate.
- the electrical contact 14 is fixed to one of the ends of the substrate, the etching operation being carried out as already explained above from the free end of the substrate towards that which is electrically connected.
- an electrical contact 14 physically independent of the substrate is preferred, which consists of an electrode 33 immersed in an electrically conductive solution 24 contained in a tank 25, the solution 24 being brought into contact with at least one area not yet etched. of the substrate.
- the tray 25 is spaced by a constant distance from the tray 21 equivalent and proportional to at least a separation distance of two parallel strips of the layer 11.
- the electrode 30 remains in a fixed position while the substrate 10 is immersed, vertically or at an angle, gradually in the solution 20 according to a movement of translation F for etching the zones 13.
- the electrode 30 formed by the platinum wire is integral with a float 34 which is capable of sliding in a guide parallel to the translational movement of the substrate.
- the float keeps the electrode / substrate distance constant due to the increase in the level of the solution with the gradual introduction of the substrate.
- the float is a means taken by way of example to keep the electrode / substrate distance fixed.
- the substrate 10 keeps a fixed position during the etching time, the areas 13 to be etched being placed opposite the wire 30.
- the substrate is moved by means of mobile support means not visible in the figure.
- the two edges of the substrate lateral to the bands to be etched are associated with the support means which are capable of sliding in guide rails extending in the direction of translation of the substrate.
- the electrical contact 14 of the substrate is located at the upper end of the substrate leaving the solution 20 so that the electrical connection is permanent during etching.
- the etching speed is increased during immersion.
- the immersion speed of the substrate is reduced preferably according to a function of the decreasing exponential type.
- etching process described above is particularly suitable for etching Sn0 2 , but of course, it can be applied to all types of metals or metal oxides such as TITO, conductive or poorly conductive.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Gas-Filled Discharge Tubes (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002569493A JP2004531641A (ja) | 2001-03-07 | 2002-02-27 | ガラス基材タイプの透明基材上に堆積させた層をエッチングする方法 |
EP02708421A EP1366220A1 (fr) | 2001-03-07 | 2002-02-27 | Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier |
US10/469,830 US7507324B2 (en) | 2001-03-07 | 2002-02-27 | Method for etching layers deposited on transparent substrates such as glass substrate |
CA002437886A CA2437886A1 (fr) | 2001-03-07 | 2002-02-27 | Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier |
KR1020037011490A KR100888244B1 (ko) | 2001-03-07 | 2002-02-27 | 유리 기판과 같은 투명 기판 상에 증착된 층의 에칭 방법, 상기 방법으로 에칭된 투명 기판, 상기 기판을 병합한 디스플레이 스크린 및 에칭 디바이스 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR01/03092 | 2001-03-07 | ||
FR0103092A FR2821862B1 (fr) | 2001-03-07 | 2001-03-07 | Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002070792A1 true WO2002070792A1 (fr) | 2002-09-12 |
Family
ID=8860835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2002/000706 WO2002070792A1 (fr) | 2001-03-07 | 2002-02-27 | Procede de gravure de couches deposees sur des substrats transparents du type substrat verrier |
Country Status (11)
Country | Link |
---|---|
US (1) | US7507324B2 (fr) |
EP (1) | EP1366220A1 (fr) |
JP (1) | JP2004531641A (fr) |
KR (1) | KR100888244B1 (fr) |
CN (1) | CN1279219C (fr) |
CA (1) | CA2437886A1 (fr) |
CZ (1) | CZ20032409A3 (fr) |
FR (1) | FR2821862B1 (fr) |
PL (1) | PL369225A1 (fr) |
RU (1) | RU2285067C2 (fr) |
WO (1) | WO2002070792A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003038852A1 (fr) * | 2001-10-29 | 2003-05-08 | Thomson Licensing S.A. | Procede et dispositif pour decaper une couche mince conductrice deposee sur une plaque isolante, de maniere a y former un reseau d'electrodes. |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101308505B1 (ko) * | 2005-08-01 | 2013-09-17 | 히다치 조센 가부시키가이샤 | 도전성 금속산화물 박막 제거방법 및 장치 |
JP4824365B2 (ja) * | 2005-08-25 | 2011-11-30 | 日立造船株式会社 | 導電性金属酸化物除去方法及び装置 |
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WO2007122752A1 (fr) * | 2006-04-12 | 2007-11-01 | Hitachi Zosen Corporation | Procédé et appareil de retrait d'un film mince d'oxyde métallique conducteur |
FR2957941B1 (fr) * | 2010-03-26 | 2012-06-08 | Commissariat Energie Atomique | Procede pour graver une couche d'oxyde metallique conducteur utilisant une microelectrode |
US8557099B2 (en) * | 2010-10-25 | 2013-10-15 | Ppg Industries Ohio, Inc. | Electrocurtain coating process for coating solar mirrors |
JP2014105366A (ja) * | 2012-11-28 | 2014-06-09 | Mitsubishi Electric Corp | 金属成分の回収方法および回収装置 |
KR101498654B1 (ko) * | 2013-05-29 | 2015-03-05 | (주)솔라세라믹 | 고헤이즈를 위한 불소가 도핑된 산화 주석 박막 식각 방법 |
CN103435266B (zh) * | 2013-08-22 | 2015-08-26 | 大连七色光太阳能科技开发有限公司 | 一种fto导电薄膜的刻蚀方法 |
RU2572099C1 (ru) * | 2014-07-15 | 2015-12-27 | Федеральное государственное бюджетное учреждение науки Физический институт им. П.Н. Лебедева Российской академии наук | Способ локального удаления электропроводного оксидного слоя с диэлектрической подложки |
KR101614835B1 (ko) | 2015-08-12 | 2016-04-25 | 서울과학기술대학교 산학협력단 | 전기화학적 에칭을 이용한 투명 전극의 표면 개질방법 |
KR20180093798A (ko) * | 2017-02-13 | 2018-08-22 | 램 리써치 코포레이션 | 에어 갭들을 생성하는 방법 |
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US5567304A (en) * | 1995-01-03 | 1996-10-22 | Ibm Corporation | Elimination of island formation and contact resistance problems during electroetching of blanket or patterned thin metallic layers on insulating substrate |
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US6544391B1 (en) * | 2000-10-17 | 2003-04-08 | Semitool, Inc. | Reactor for electrochemically processing a microelectronic workpiece including improved electrode assembly |
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2001
- 2001-03-07 FR FR0103092A patent/FR2821862B1/fr not_active Expired - Fee Related
-
2002
- 2002-02-27 KR KR1020037011490A patent/KR100888244B1/ko not_active IP Right Cessation
- 2002-02-27 CA CA002437886A patent/CA2437886A1/fr not_active Abandoned
- 2002-02-27 CZ CZ20032409A patent/CZ20032409A3/cs unknown
- 2002-02-27 EP EP02708421A patent/EP1366220A1/fr not_active Withdrawn
- 2002-02-27 JP JP2002569493A patent/JP2004531641A/ja active Pending
- 2002-02-27 CN CNB028060393A patent/CN1279219C/zh not_active Expired - Fee Related
- 2002-02-27 PL PL02369225A patent/PL369225A1/xx not_active Application Discontinuation
- 2002-02-27 US US10/469,830 patent/US7507324B2/en not_active Expired - Fee Related
- 2002-02-27 RU RU2003129657/02A patent/RU2285067C2/ru not_active IP Right Cessation
- 2002-02-27 WO PCT/FR2002/000706 patent/WO2002070792A1/fr active Application Filing
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FR2325084A1 (fr) * | 1975-09-18 | 1977-04-15 | Siemens Ag | Procede d'elimination du bioxyde d'etain ou du bioxyde d'indium |
US5567304A (en) * | 1995-01-03 | 1996-10-22 | Ibm Corporation | Elimination of island formation and contact resistance problems during electroetching of blanket or patterned thin metallic layers on insulating substrate |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2003038852A1 (fr) * | 2001-10-29 | 2003-05-08 | Thomson Licensing S.A. | Procede et dispositif pour decaper une couche mince conductrice deposee sur une plaque isolante, de maniere a y former un reseau d'electrodes. |
Also Published As
Publication number | Publication date |
---|---|
CZ20032409A3 (cs) | 2004-02-18 |
RU2285067C2 (ru) | 2006-10-10 |
FR2821862A1 (fr) | 2002-09-13 |
PL369225A1 (en) | 2005-04-18 |
CN1279219C (zh) | 2006-10-11 |
CA2437886A1 (fr) | 2002-09-12 |
JP2004531641A (ja) | 2004-10-14 |
KR100888244B1 (ko) | 2009-03-11 |
US20040140227A1 (en) | 2004-07-22 |
CN1500158A (zh) | 2004-05-26 |
EP1366220A1 (fr) | 2003-12-03 |
KR20030087631A (ko) | 2003-11-14 |
RU2003129657A (ru) | 2005-02-10 |
US7507324B2 (en) | 2009-03-24 |
FR2821862B1 (fr) | 2003-11-14 |
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