WO2002064497A1 - Gyroscope and fabrication method thereof - Google Patents
Gyroscope and fabrication method thereof Download PDFInfo
- Publication number
- WO2002064497A1 WO2002064497A1 PCT/KR2002/000135 KR0200135W WO02064497A1 WO 2002064497 A1 WO2002064497 A1 WO 2002064497A1 KR 0200135 W KR0200135 W KR 0200135W WO 02064497 A1 WO02064497 A1 WO 02064497A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gyroscope
- electrode
- sensing
- driving
- displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/02—Rotary gyroscopes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0064—Constitution or structural means for improving or controlling the physical properties of a device
- B81B3/0067—Mechanical properties
- B81B3/0078—Constitution or structural means for improving mechanical properties not provided for in B81B3/007 - B81B3/0075
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0062—Devices moving in two or more dimensions, i.e. having special features which allow movement in more than one dimension
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
- G01C19/5733—Structural details or topology
- G01C19/5755—Structural details or topology the devices having a single sensing mass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0228—Inertial sensors
- B81B2201/0242—Gyroscopes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0136—Comb structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/04—Electrodes
Definitions
- the present invention relates to a micromachined gyroscope and a
- Micro inertial sensors are one application among various aspects
- inertial sensors made of silicon are inexpensive, mass-producible, and can
- micromachined gyroscopes have not been commercialized yet. For their
- the element can operate at a low Q value, and thereby two
- a gyroscope comprises: a
- driving fixed electrode being fixed; a driving displacement electrode being fixed
- sensing displacement electrode being connected to the inertial mass
- the driving displacement electrode is supported by a folded spring
- the driving displacement electrode and the inertial mass can be any driving displacement electrode and the inertial mass.
- inertial mass can be movable in the first direction and are connected by a folded spring having no fixture shaft.
- Two sensing displacement electrodes are provided on two sides of
- the gyroscope further comprises an edge gimbal for connecting the two sensing displacement electrodes.
- a cavity is provided in the center of the inertial mass, and the gyroscope further comprises a displacement limit shaft provided to the
- the gyroscope further comprises tuning electrodes, each
- a gyroscope comprises: (a) performing anodic bonding on a silicon
- gyroscope structure to connect it to an external circuit.
- the method further comprises dicing the silicon substrate and the
- the metallic layer formed in (c) is a double layer of Cr and Au, and
- the glass substrate is etched using an HF solution in (e).
- the depth for etching the glass substrate using the HF solution is
- the silicon substrate is etched using a KOH aqueous solution of
- FIG. 1 shows a perspective view of a gyroscope according to a
- FIG. 2 shows a floor plan of a gyroscope according to a preferred
- FIG. 3 shows a magnified portion of FIG. 1 ;
- FIG. 4 shows a partial SEM (scanning Electron Microscope)
- FIG. 5 shows a magnified view of a driving or sensing spring of a
- FIG. 6 shows an SEM photograph of a driving or sensing spring of
- FIG. 7 shows a concept view of a driving or sensing connection
- FIG. 8 shows a graph of resonance driving and sensing
- FIGs. 9(a) to 9(h) show a process for fabricating a gyroscope
- the invention is capable of modification in
- FIG. 1 shows a perspective view of a gyroscope according to a
- FIG. 2 shows a floor plan of
- FIG. 3 shows a magnified portion of FIG. 1
- FIG. 4 shows a partial
- present invention comprises a glass substrate 10 and a silicon structure
- the silicon structure comprises a driver, sensor, a plurality of
- the sensor comprises a sensing fixing electrode 25, a sensing displacement electrode 22, and an edge gimbal 21.
- springs comprise driving springs 28 and 29 for supporting and allowing
- sensing connection spring 32 for connecting the sensing
- the driving fixing electrode 26 of the driver is fixed by the
- the driving displacement electrode 24 is supported by the external
- inertial mass 23 is vibrated together with the driving displacement electrode
- the sensing displacement electrode 22 is supported by the
- the sensing displacement electrode 22 is connected to the
- sensing connection spring 32 delivers the south to north directional
- the edge gimbal 21 totally surrounds the driver and the sensor
- Each tuning electrode 34 of a total of four, is formed on the east
- spaced toothed portion is formed on the tuning electrode's surface facing
- displacement electrodes 22 face those of the tuning electrode 34.
- the displacement limit shaft 33 formed in the center of a cavity
- driving displacement electrode 24 is electrostatically driven according to the
- the inertial mass 23 is also vibrated
- the tuning electrode 34 functions as an electric spring, and it varies the resonance frequency of the sensing
- shaft 33 limits driving displacement of the inertial mass 23 within a uniform
- FIG. 5 shows a magnified view of a driving or sensing spring of a
- FIG. 6 shows an SEM photograph of a driving or sensing spring of a
- the driving or sensing spring comprises a fixture shaft 1 , a
- connector 2 connects the internal plate 3 with the external plate 4.
- sensing displacement electrode which is determined according to a
- the spring of this structure is referred to
- the thin layer provided on the silicon structure As a folded spring. Referring to FIG. 5, the thin layer provided on the silicon structure
- This metallic layer is a metallic layer. This metallic layer is formed to perform flip chip bonding
- FIGs. 1 to 4 omit this illustration.
- the structure are used for injecting etchant when etching the glass
- the cavities are formed on all portions of the structure except for
- connection spring 31 or 32 applied to the preferred embodiment of the
- FIG. 7 shows a concept view of a driving or sensing connection
- connection spring comprises a connector 2, an internal plate 3,
- the connector 2 connects
- connection spring or a sensing connection spring
- FIG. 8 shows a graph of resonance driving and sensing
- the present gyroscope provides a problem in that the output performance is very sensitive to external noise (the degrees of vacuum or variations of frequency). To overcome this problem, the present gyroscope provides a
- the driving displacement is uniformly maintained in the
- the gyroscope can be operated in the sensing resonance frequency
- FIGs. 9(a) to 9(h) show a process for fabricating a gyroscope
- resistive silicon wafer 20 and a glass substrate 10 such as Pyrex #7740 for
- the silicon wafer 20 is etched using a KOH
- the thickness of the silicon wafer 20 After the etching, the thickness of the silicon wafer 20
- CMP chemical mechanical polishing
- the etchant is a 36wt.% KOH aqueous solution, used at
- KOH etching, hillocks and pit holes are formed on the silicon surface.
- the surface of the silicon wafer 20 is
- an oxidized layer (not illustrated) is deposited on the
- the photoresist pattern includes a pattern for
- the oxidized layer is etched using the
- photoresist pattern 50 as an etching mask, and reactive ion etching (RIE) is
- the glass substrate 10 is etched in a 49% HF
- the silicon structure 20 can float
- layer 40 is flip-chip-bonded on an electrode structure for wiring on a printed
- PCB circuit board
- the photoresist and the oxidized layer are used as
- the gyroscope is fabricated based on very simple processes, and
- the fabricated gyroscope has only one
- gyroscope is connected to a circuit.
- the driver and the sensor of the gyroscope structure adopt a
- the Q value of the structure may be predicted based on the
- the structure are designed to be greater than 5kHz in order to remove
- the driving and sensing frequencies are predicted
- a displacement limiter that artificially limits the displacement
- the gyroscope structure has a form basically identical with a two-
- the number of combed electrode structures in the structure is maximized in order to maximize the driving and sensing sensitivities
- edge gimbals are adopted in order to minimize mechanical interference.
- the size of the gyroscope structure is 8 x 8 mm 2 , and the whole size,
- the thickness of the structure is designed to be 50 ⁇ m. Also, the thickness of the structure is designed to be 50 ⁇ m.
- gyroscope structure is floated above the glass substrate by 50 ⁇ m so as to
- a damping value is to be calculated in order to
- the driver has 426 combed electrode structures and 6 folded
- the spring coefficient is calculated to be 2,684 and the driving
- the driving voltage is set to be
- the detector has 692 combed electrode structures and 6 folded
- the Q factor of the detector is calculated to
- the oxidized layer used as a deep RIE etching mask undergoes an
- deep RIE is fabricated to be narrower than the conventional one by about
- the thickness of the fabricated structure is 44 ⁇ m, and the deep RIE is
- the gap between the substrate and the structure is measured to be 37 ⁇ m.
- the gyroscope according to the present invention has 426 driving
- the gyroscope has a displacement limiter provided in the
- * represents a calculated displacement with applied voltage
- V(t) 15 + 3cos ⁇ dn [V] (bi-directional), and ** shows a measured
- the driver the operation of the sensor, or the operation of the driver and the
- the resonance frequencies range between 5,500 and 6,500Hz
- the driving voltage is artificially increased to check the
- the present invention provides an electrostatically driven and
- a gyroscope operable in atmospheric pressure is provided;
- etching cavities on its front side is provided through a single
- the fabricated gyroscope structure can be directly integrated into
- the present gyroscope can solve
- the structure is designed so that it may have as many driving and
- sensing electrodes as possible and as large an inertial mass as possible so
- the gyroscope structure has the
- limiting driving displacement is mechanically added so as to provide a
- the fabricated gyroscope is operable in atmospheric pressure
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Gyroscopes (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/257,532 US6845668B2 (en) | 2001-02-12 | 2002-01-30 | Gyroscope |
| DE60229919T DE60229919D1 (https=) | 2001-02-12 | 2002-01-30 | |
| EP02711501A EP1360144B1 (en) | 2001-02-12 | 2002-01-30 | Gyroscope and fabrication method thereof |
| JP2002564435A JP3713019B2 (ja) | 2001-02-12 | 2002-01-30 | ジャイロスコープ及びその製造方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2001-0006695A KR100418624B1 (ko) | 2001-02-12 | 2001-02-12 | 자이로스코프 및 그 제조 방법 |
| KR2001/6695 | 2001-02-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2002064497A1 true WO2002064497A1 (en) | 2002-08-22 |
Family
ID=19705617
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2002/000135 Ceased WO2002064497A1 (en) | 2001-02-12 | 2002-01-30 | Gyroscope and fabrication method thereof |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6845668B2 (https=) |
| EP (1) | EP1360144B1 (https=) |
| JP (1) | JP3713019B2 (https=) |
| KR (1) | KR100418624B1 (https=) |
| CN (1) | CN1242913C (https=) |
| AT (1) | ATE414674T1 (https=) |
| DE (1) | DE60229919D1 (https=) |
| WO (1) | WO2002064497A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004101428A1 (en) * | 2003-05-07 | 2004-11-25 | Honeywell International Inc. | Methods and apparatus for attaching mems devices to housing |
| US7037805B2 (en) | 2003-05-07 | 2006-05-02 | Honeywell International Inc. | Methods and apparatus for attaching a die to a substrate |
| US7491567B2 (en) | 2005-11-22 | 2009-02-17 | Honeywell International Inc. | MEMS device packaging methods |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SG112898A1 (en) * | 2003-12-11 | 2005-07-28 | Singapore Tech Dynamics Pte | Sensing apparatus, system and method |
| JP2005326620A (ja) * | 2004-05-14 | 2005-11-24 | Fujitsu Ltd | マイクロミラー素子 |
| CN100338470C (zh) * | 2005-03-25 | 2007-09-19 | 中北大学 | 单片双惯性参数加速度计陀螺仪 |
| JP5070778B2 (ja) * | 2006-09-20 | 2012-11-14 | 株式会社デンソー | 力学量センサ |
| US8061201B2 (en) * | 2007-07-13 | 2011-11-22 | Georgia Tech Research Corporation | Readout method and electronic bandwidth control for a silicon in-plane tuning fork gyroscope |
| US8748206B2 (en) | 2010-11-23 | 2014-06-10 | Honeywell International Inc. | Systems and methods for a four-layer chip-scale MEMS device |
| US9493344B2 (en) | 2010-11-23 | 2016-11-15 | Honeywell International Inc. | MEMS vertical comb structure with linear drive/pickoff |
| US9171964B2 (en) | 2010-11-23 | 2015-10-27 | Honeywell International Inc. | Systems and methods for a three-layer chip-scale MEMS device |
| US8776601B2 (en) | 2010-11-23 | 2014-07-15 | Honeywell International Inc. | MEMS sensor using multi-layer movable combs |
| CN102507981B (zh) * | 2011-11-02 | 2013-06-05 | 重庆理工大学 | 一种带耦合梁结构的单敏感质量元硅微二维加速度传感器 |
| CN102633227B (zh) * | 2012-03-16 | 2014-07-23 | 中北大学 | 一种mems惯性传感器结构压膜阻尼可调装置 |
| US9581447B2 (en) * | 2014-07-08 | 2017-02-28 | Honeywell International Inc. | MEMS gyro motor loop filter |
| US9903718B2 (en) * | 2015-05-28 | 2018-02-27 | Invensense, Inc. | MEMS device mechanical amplitude control |
| US10514259B2 (en) | 2016-08-31 | 2019-12-24 | Analog Devices, Inc. | Quad proof mass MEMS gyroscope with outer couplers and related methods |
| US10415968B2 (en) | 2016-12-19 | 2019-09-17 | Analog Devices, Inc. | Synchronized mass gyroscope |
| US10697774B2 (en) | 2016-12-19 | 2020-06-30 | Analog Devices, Inc. | Balanced runners synchronizing motion of masses in micromachined devices |
| US10627235B2 (en) | 2016-12-19 | 2020-04-21 | Analog Devices, Inc. | Flexural couplers for microelectromechanical systems (MEMS) devices |
| FR3065800B1 (fr) * | 2017-04-27 | 2019-08-02 | Safran | Resonateur configure pour etre integre a un capteur angulaire inertiel |
| US10948294B2 (en) | 2018-04-05 | 2021-03-16 | Analog Devices, Inc. | MEMS gyroscopes with in-line springs and related systems and methods |
| US11193771B1 (en) | 2020-06-05 | 2021-12-07 | Analog Devices, Inc. | 3-axis gyroscope with rotational vibration rejection |
| US11686581B2 (en) | 2020-06-08 | 2023-06-27 | Analog Devices, Inc. | Stress-relief MEMS gyroscope |
| CN116075728A (zh) | 2020-06-08 | 2023-05-05 | 美国亚德诺半导体公司 | 驱动和感测应力释放装置 |
| CN111609844A (zh) * | 2020-06-18 | 2020-09-01 | 中汽研汽车检验中心(天津)有限公司 | 一种陀螺仪安装固定装置及应用结构 |
| US11698257B2 (en) | 2020-08-24 | 2023-07-11 | Analog Devices, Inc. | Isotropic attenuated motion gyroscope |
| CN113135548B (zh) * | 2021-04-20 | 2024-06-11 | 广州蜂鸟传感科技有限公司 | 一种压电微机械执行器 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10001361A1 (de) * | 1999-01-15 | 2000-07-20 | Samsung Electro Mech | Verfahren zum Herstellen eines Mikroträgheitssensors |
| WO2000068640A2 (en) * | 1999-04-21 | 2000-11-16 | The Regents Of The University Of California | Micro-machined angle-measuring gyroscope |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19530007C2 (de) * | 1995-08-16 | 1998-11-26 | Bosch Gmbh Robert | Drehratensensor |
| US5945599A (en) * | 1996-12-13 | 1999-08-31 | Kabushiki Kaisha Toyota Chuo Kenkyusho | Resonance type angular velocity sensor |
| US5914521A (en) * | 1997-07-30 | 1999-06-22 | Motorola, Inc. | Sensor devices having a movable structure |
| US6122961A (en) * | 1997-09-02 | 2000-09-26 | Analog Devices, Inc. | Micromachined gyros |
| KR100231715B1 (ko) | 1997-11-25 | 1999-11-15 | 정선종 | 평면 진동형 마이크로 자이로스코프 |
-
2001
- 2001-02-12 KR KR10-2001-0006695A patent/KR100418624B1/ko not_active Expired - Lifetime
-
2002
- 2002-01-30 JP JP2002564435A patent/JP3713019B2/ja not_active Expired - Fee Related
- 2002-01-30 EP EP02711501A patent/EP1360144B1/en not_active Expired - Lifetime
- 2002-01-30 DE DE60229919T patent/DE60229919D1/de not_active Expired - Fee Related
- 2002-01-30 CN CNB028002954A patent/CN1242913C/zh not_active Expired - Fee Related
- 2002-01-30 US US10/257,532 patent/US6845668B2/en not_active Expired - Fee Related
- 2002-01-30 AT AT02711501T patent/ATE414674T1/de not_active IP Right Cessation
- 2002-01-30 WO PCT/KR2002/000135 patent/WO2002064497A1/en not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10001361A1 (de) * | 1999-01-15 | 2000-07-20 | Samsung Electro Mech | Verfahren zum Herstellen eines Mikroträgheitssensors |
| WO2000068640A2 (en) * | 1999-04-21 | 2000-11-16 | The Regents Of The University Of California | Micro-machined angle-measuring gyroscope |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004101428A1 (en) * | 2003-05-07 | 2004-11-25 | Honeywell International Inc. | Methods and apparatus for attaching mems devices to housing |
| US6927098B2 (en) * | 2003-05-07 | 2005-08-09 | Honeywell International Inc. | Methods and apparatus for attaching MEMS devices to housing |
| US7037805B2 (en) | 2003-05-07 | 2006-05-02 | Honeywell International Inc. | Methods and apparatus for attaching a die to a substrate |
| US7491567B2 (en) | 2005-11-22 | 2009-02-17 | Honeywell International Inc. | MEMS device packaging methods |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20020066486A (ko) | 2002-08-19 |
| JP3713019B2 (ja) | 2005-11-02 |
| CN1242913C (zh) | 2006-02-22 |
| JP2004518964A (ja) | 2004-06-24 |
| US20030159509A1 (en) | 2003-08-28 |
| US6845668B2 (en) | 2005-01-25 |
| ATE414674T1 (de) | 2008-12-15 |
| DE60229919D1 (https=) | 2009-01-02 |
| EP1360144A1 (en) | 2003-11-12 |
| KR100418624B1 (ko) | 2004-02-11 |
| EP1360144B1 (en) | 2008-11-19 |
| CN1457319A (zh) | 2003-11-19 |
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