WO2002050502A1 - Procede d'etalonnage du champ magnetique d'un thermometre avec dependance au champ magnetique - Google Patents

Procede d'etalonnage du champ magnetique d'un thermometre avec dependance au champ magnetique Download PDF

Info

Publication number
WO2002050502A1
WO2002050502A1 PCT/JP2001/011100 JP0111100W WO0250502A1 WO 2002050502 A1 WO2002050502 A1 WO 2002050502A1 JP 0111100 W JP0111100 W JP 0111100W WO 0250502 A1 WO0250502 A1 WO 0250502A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic field
temperature
thermometer
dependence
specific heat
Prior art date
Application number
PCT/JP2001/011100
Other languages
English (en)
Japanese (ja)
Inventor
Yasumoto Tanaka
Akira Iyo
Naoki Shirakawa
Shinnichi Ikeda
Kazuyasu Tokiwa
Tsuneo Watanabe
Akira Kamimura
John Ellis Mcarthur Iii
Hideo Ihara
Original Assignee
Japan Science And Technology Corporation
National Institute Of Advanced Industrial Science And Technology
Quantum Design Japan Inc.
Ihara, Yoshiko
Ihara, Hideyo
Ihara, Hidetaka
Ihara, Gen-Ei
Ihara, Chiaki
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Science And Technology Corporation, National Institute Of Advanced Industrial Science And Technology, Quantum Design Japan Inc., Ihara, Yoshiko, Ihara, Hideyo, Ihara, Hidetaka, Ihara, Gen-Ei, Ihara, Chiaki filed Critical Japan Science And Technology Corporation
Publication of WO2002050502A1 publication Critical patent/WO2002050502A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/36—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using magnetic elements, e.g. magnets, coils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers

Definitions

  • the present invention relates to a magnetic field calibration method for a thermometer having magnetic field dependence.
  • thermometers are commonly used in the technical field of precise temperature measurement at extremely low temperatures and in strong magnetic fields, for example, in the field of research and development of superconductors and their manufacturing fields.
  • Resistance thermometers measure the temperature by using the temperature dependence of the thin-film resistance value.However, because of their small shape, they can be installed locally and in narrow places in difficult devices. It is an indispensable thermometer in the above technical field because of its quick response to the dagger.
  • this resistance thermometer for example, zirconium nitride
  • the resistance value of a resistance thermometer varies not only with temperature but also with the applied magnetic field due to the magnetoresistance effect. Need.
  • the magnetic field calibration value attached to a commercially available resistance thermometer is only a calibration value at a limited temperature and a limited magnetic field strength, and is not useful depending on the purpose of use. Also, if the magnetic field strength used is extremely large, the calibration value at such a strong magnetic field is not known. In such a case, in the required strong magnetic field, the thermometer and the resistance thermometer, which do not have magnetic field dependence, are kept at the same temperature, and the temperature and resistance indicated by the thermometer do not have magnetic field dependence. The difference from the indicated temperature of the thermometer can be obtained as the magnetic field calibration value.However, it can cover a wide range from extremely low temperature to room temperature, has no magnetic field dependence, and has sufficient accuracy. There is no thermometer to have.
  • thermometer that does not have magnetic field dependence
  • a capacitance thermometer that uses the temperature dependence of capacitance is known. With a certain force, this thermometer is vulnerable to thermal stress and cannot measure with high accuracy while covering a wide range from room temperature to cryogenic temperature.
  • the present invention has been made in view of the above circumstances, and has as its object to provide a method for easily and highly accurately correcting a magnetic field of a thermometer having magnetic field dependence.
  • a magnetic field calibration method for a thermometer having a magnetic field dependency comprises: measuring a temperature-dependent property of a material having a physical property value having no magnetic field dependency; At each temperature, the material having the above physical properties and the thermometer having the magnetic field dependence to be calibrated for the magnetic field are kept at the same temperature, and the indicated temperature of the thermometer having the magnetic field dependence is obtained.
  • the physical property value is measured by a measuring method, a temperature is obtained from the physical property value and the temperature-dependent characteristic of the physical property value, and the temperature and the temperature indicated by a thermometer having magnetic field dependency are measured in a magnetic field. It is characterized in that a magnetic field calibration value of a thermometer having a magnetic field dependence at each temperature is obtained.
  • the substance having a property value that does not have the above-mentioned magnetic field-dependent reproduction is preferably a solid substance composed of a non-magnetic substance and a non-superconductor substance, and has the magnetic field dependence.
  • Shin L the property value is the specific heat of this substance.
  • thermometer having the magnetic field dependence is preferably a resistance thermometer.
  • measurement method having no magnetic field dependence is preferably a specific heat measurement method by a thermal relaxation time method.
  • the temperature can be determined from the specific heat by obtaining the temperature characteristics of the specific heat.
  • the specific heat of a solid made of non-magnetic material and non-superconducting material does not change with the magnetic field, but the temperature can be known if the specific heat force can be measured even in a magnetic field.
  • the resistance thermometer with the magnetic field dependence and the solid are kept at the same temperature, the indicated temperature of the resistance thermometer is determined, and the specific heat can be measured without being affected by the magnetic field.
  • the temperature can be determined from the specific heat, and the magnetic field calibration value at each temperature in the applied magnetic field can be obtained from this temperature and the indicated temperature of the resistance thermometer corresponding to this temperature. That is, according to the present invention, the magnetic field calibrating force of the resistance thermometer having the magnetic field dependence can be easily and highly accurately measured, and the temperature can be measured in a very low temperature and strong magnetic field.
  • FIG. 1 is a graph showing the temperature dependence of the specific heat of a solid.
  • FIG. 2 is a conceptual diagram of a specific heat measuring device by a thermal relaxation time method.
  • FIG. 3 is a graph illustrating the accuracy of the specific heat obtained from the time constant.
  • FIG. 4 is a diagram illustrating a procedure of a magnetic field calibration method for a resistance thermometer having a magnetic field dependency according to the present embodiment.
  • FIG. 5 is a graph showing the results of a magnetic field calibration of a resistance thermometer obtained by the magnetic field calibration method of a thermometer having magnetic field dependence of the present invention.
  • Figure 1 shows the temperature dependence of the specific heat of a solid.
  • the specific heat C v of a solid consists of the sum of the lattice specific heat and the electron specific heat, but the lattice specific heat is dominant.
  • the lattice specific heat has a remarkable temperature-dependent characteristic at a temperature equal to or lower than room temperature, as shown in FIG. 1, since the quantum oscillations of lattice vibration, that is, phonons follow B 0 se-Einstein statistics.
  • the solid material is not a magnetic material, the temperature dependence of the lattice specific heat is constant without depending on the magnetic field.
  • the temperature dependence of the specific heat of the electron is If the substance constituting the solid is a magnetic substance and a superconductor, it is constant independently of the magnetic field. That is, the substance for specific heat measurement used in the present embodiment is a solid made of a non-magnetic substance and a non-superconducting substance.
  • FIG. 2 is a diagram of a specific heat measuring device by a thermal relaxation time method.
  • the solid 1 for non-magnetic material and non-superconducting material for specific heat measurement has a predetermined heat capacity C s (joule Z g 'K) while maintaining good thermal contact with the solid 1. It is mounted on the sample table 2 that has The sample stage 2 has a thermometer 4 and a heater 15, and is arranged on both sides of the sample stage 2 via a plurality of wires 3 having a predetermined heat conductance (joule / sec ⁇ K). Hanged in bath 6. Each heat bath 6 has a thermometer 7 and is in thermal contact with a heat source 8.
  • the vacuum vessel 9 is formed of a non-magnetic material together with the sample table 2, the wire 3, and the heat bath 6.
  • the power supply to the light source 5 and the output of the signal of the thermometer 4 are performed via the wire 3.
  • the heater 1 and the thermometers 4 and 7 are connected to an external power supply and measuring instruments, respectively.
  • the heat source 8 When performing specific heat measurement by the thermal relaxation time method using this specific heat measurement device, the heat source 8 is cooled to a predetermined temperature, and then the heater 15 of the sample stage 2 is energized with a predetermined power for a predetermined time. The temperature of the solid 1 and the sample stage 2 is increased.
  • the specific heat of the solid 1 and the sample stage 2 is defined as C v and C s, and the solid 1 and the sample stage 2 each have a unit mass, that is, lg (gram). If it descends, release it to the solid 1 and the sample table 2 The amount of heat energy released is
  • T AE xp (-t / ⁇ ) + Tb (4)
  • A is a constant
  • the time constant is obtained from the slope of the thermal relaxation curve with respect to the time of temperature T, and by comparing with the equation (5), and since the C s and Kw forces are known, the specific heat CV of the solid 1 can be obtained. it can.
  • FIG. 3 is a diagram for explaining the accuracy of the specific heat obtained from the time constant.
  • curves A and B show thermal relaxation curves after the heater 5 of the sample stage 2 is energized with a predetermined power for a predetermined period of time and the temperatures of the solid 1 and the sample stage 2 are increased.
  • A shows a true thermal relaxation curve
  • B shows a thermal relaxation curve measured by a thermometer 4 having magnetic field dependence.
  • the vertical axis indicates temperature
  • the horizontal axis indicates time.
  • thermometer 4 for measuring the temperature T of the sample stage 2 has a magnetic field dependency, and does not show a true temperature in a magnetic field.
  • Thermometer 4 for example, the true temperature T ⁇ in a magnetic field H, relative to ⁇ 2, ⁇ ⁇ + ⁇ , if instructing ⁇ 2 + ⁇ ⁇ 2, obtained thermal relaxation curve f of Figure 3 beta.
  • Gradient of thermal relaxation curve ⁇ or time of FIG. 3, at t, K ⁇ ( ⁇ 2 + ⁇ 5 ⁇ 2) one ( ⁇ ⁇ + (5 ⁇ ) ⁇ / ( "- t)!
  • thermometer 4 ⁇ 2 - ⁇ + ⁇ 2- ⁇ 5 ⁇ / (t 2 -t!) (6) where the error of the indicated temperature of the thermometer 4 due to the magnetic field, ⁇ 51 ⁇ , (T 2 is
  • 6 ⁇ 2- contributes ⁇ 5 ⁇ to the gradient ⁇ . Temperature ⁇ ⁇ , ⁇ ⁇ 2 if close enough , (T ⁇ , ⁇ ⁇ 2 are sufficiently close to each other, and ST 2- (5 ⁇ is / j). That is, use a thermometer that is sufficiently sensitive to temperature changes, Since the time constant is obtained from the gradient in the range and the specific heat is obtained from this time constant, the specific heat can be obtained with sufficient accuracy, and the temperature can be obtained with sufficient accuracy from this specific heat.
  • the specific heat is measured by the thermal relaxation time method that can determine the specific heat without being affected by the magnetic field, the temperature is determined from the specific heat, and using this temperature,
  • the feature is to calibrate the magnetic field of a thermometer that has magnetic field dependence.
  • FIG. 4 is a diagram illustrating a procedure of a magnetic field calibration method for a resistance thermometer having a magnetic field dependency according to the present embodiment.
  • step 1 the specific heat of a substance having a specific heat that does not depend on the magnetic field is measured at each temperature from 0 K in absolute temperature to around room temperature in the absence of a magnetic field, and the temperature-dependent characteristic curve of the specific heat of this substance is obtained.
  • step 2 the substance having a specific heat that is independent of the magnetic field is attached to the sample stage of the specific heat measurement device using the thermal relaxation time method, and a resistance thermometer to be subjected to magnetic field calibration is placed in the heat bath of this specific heat meter. Install with good thermal contact.
  • step 3 the heat source of the specific heat measuring device by the above-mentioned thermal relaxation time method is set to each temperature from 0 K to around room temperature, and at each temperature, the magnetic field H is applied to the specific heat measuring device, The specific heat is determined by the relaxation time method, and at the same time, the indicated temperature of the resistance thermometer to be calibrated for the magnetic field is determined.
  • step 4 by comparing the specific heat obtained by the thermal relaxation time method obtained in step 3 with the temperature-dependent characteristic curve of the specific heat obtained in step 1, the true temperature corresponding to the specific heat is specified. From the difference from the indicated temperature of the resistance thermometer obtained simultaneously in step 3, calculate the magnetic field calibration value of the resistance thermometer in the magnetic field strength H.
  • the temperature-dependent characteristic of the specific heat which is independent of the magnetic field, is measured in the absence of a magnetic field, so that the temperature-dependent characteristic curve of the specific heat can be easily obtained.
  • Using the sex curve gives the exact temperature from the specific heat.
  • the specific heat is measured by the thermal relaxation time method, an accurate specific heat can be obtained even in a magnetic field. Then, since the exact specific heat is known, the accurate temperature is known, and the magnetic field calibration value of the indicated temperature in the magnetic field of the resistance thermometer can be obtained. If this magnetic field calibration value is used, an accurate temperature can be measured with a resistance thermometer even in a magnetic field.
  • FIG. 5 is a diagram showing a result of a magnetic field calibration of a resistance thermometer obtained by the method of calibrating a magnetic field of a thermometer having magnetic field dependence of the present invention.
  • a commercially available resistance thermometer composed of a zirconium nitride oxide thin film resistor was subjected to magnetic field calibration.
  • Alumina a non-magnetic and non-superconductor material, was used as a solid having specific heat that does not depend on the magnetic field.
  • the applied magnetic field is 14 T (tesla).
  • the horizontal axis is the indicated temperature of the resistance thermometer.
  • the vertical axis represents a calibration value at a magnetic field intensity of 14 T (tesla), obtained by the magnetic field calibration method of the thermometer having the magnetic field dependence of the present invention. That is, the true temperature can be obtained by adding the calibration value indicated by the vertical axis to the indicated temperature (horizontal axis) of the thermometer.
  • ⁇ is a calibration value obtained by the method of the present invention.
  • (2) conducts a magnetic field calibration of a resistance thermometer formed of the same thin-film zirconium oxide thin film resistor by another method (using a capacitance thermometer as a thermometer having no magnetic field dependence).
  • the vertical bar of the literature value in the figure indicates the degree of variation.
  • the calibration values obtained by the method of the present invention and the comparative values of the literature have good agreement, and the calibration values obtained by the method of the present invention have a finer temperature than the literature values. It is composed of notches. This is because, as mentioned above, the capacitance thermometer is not susceptible to thermal stress and cannot swing the temperature over a wide range. Further, in the conventional calibration method using a capacitance thermometer, in order to avoid thermal stress, it is necessary to change the magnetic field under a constant temperature and change the temperature under a constant magnetic field. When the magnetic field calibration is performed at dense temperature intervals, much longer time is required as compared with the method of the present invention.
  • the temperature dependence of the specific heat was used as the temperature dependence of the physical property value having no magnetic field dependence, but the physical property value is not limited to the specific heat, and has no magnetic field dependence. It is clear that the same method can be used to calibrate the magnetic field of a thermometer that has magnetic field dependence with the same physical property values.
  • thermometer having magnetic field dependence can be subjected to magnetic field calibration with high accuracy and ease.
  • the resistance thermometer can be used as a thermometer that can measure local and narrow temperature even in a magnetic field and that can measure rapid temperature changes. Become like Thus, it is extremely useful if the method of the present invention is used in a technical field that requires temperature measurement at a very low temperature and in a strong magnetic field.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

Cette invention se rapporte à un procédé qui est capable de réaliser aisément l'étalonnage du champ magnétique d'un thermomètre avec dépendance au champ magnétique. A cet effet, la dépendance thermique d'une quantité physique d'une substance ayant une quantité physique indépendante d'un champ magnétique est mesurée (étape 1), cette substance et le thermomètre avec dépendance au champ magnétique et devant être soumis à un étalonnage du champ magnétique sont maintenus à la même température pour chacune des températures dans le champ magnétique (étape 2), la température indiquée par le thermomètre est obtenue, et la quantité physique est mesurée par une technique de mesure sans dépendance au champ magnétique (étape 3), la température est déterminée à partir de la quantité physique et de la dépendance thermique de cette quantité physique, et la valeur d'étalonnage du champ magnétique du thermomètre avec dépendance au champ magnétique est obtenue à partir de cette température et de la température indiquée à chaque température dans le champ magnétique (étape 4). Dans ces étapes, dès lors que la dépendance thermique de la chaleur spécifique sans dépendance au champ magnétique est mesurée sans champ magnétique externe, la courbe de caractéristique de dépendance thermique de cette chaleur spécifique peut être facilement obtenue, et la température correcte peut être obtenue à partir de cette chaleur spécifique, en utilisant la courbe de caractéristique de dépendance thermique. Ce procédé est très utile lorsqu'il est appliqué à un domaine technique nécessitant une mesure de température à une température très basse et dans un champ magnétique élevé.
PCT/JP2001/011100 2000-12-19 2001-12-18 Procede d'etalonnage du champ magnetique d'un thermometre avec dependance au champ magnetique WO2002050502A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000386049A JP3416685B2 (ja) 2000-12-19 2000-12-19 磁場依存性を有する温度計の磁場校正方法
JP2000-386049 2000-12-19

Publications (1)

Publication Number Publication Date
WO2002050502A1 true WO2002050502A1 (fr) 2002-06-27

Family

ID=18853214

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/011100 WO2002050502A1 (fr) 2000-12-19 2001-12-18 Procede d'etalonnage du champ magnetique d'un thermometre avec dependance au champ magnetique

Country Status (2)

Country Link
JP (1) JP3416685B2 (fr)
WO (1) WO2002050502A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006234574A (ja) * 2005-02-24 2006-09-07 National Institute Of Advanced Industrial & Technology キャパシタンス温度計
JP4686759B2 (ja) * 2005-10-25 2011-05-25 独立行政法人産業技術総合研究所 キャパシタンス温度計
CN102564637B (zh) * 2010-12-15 2015-09-09 新科实业有限公司 磁隧道结中偏流/偏压引起的升温的测量方法
CN104568209B (zh) * 2015-01-07 2017-02-22 大连理工大学 一种基于热重变化的磁性材料居里温度测量方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07260594A (ja) * 1994-03-18 1995-10-13 Agency Of Ind Science & Technol 温度センサ
JPH08136361A (ja) * 1994-11-11 1996-05-31 Tanaka Kikinzoku Kogyo Kk 測温抵抗体比較校正装置の均熱ブロック及び測温抵抗体の比較校正方法
JPH08152365A (ja) * 1994-11-29 1996-06-11 Tanaka Kikinzoku Kogyo Kk 測温抵抗体の校正方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07260594A (ja) * 1994-03-18 1995-10-13 Agency Of Ind Science & Technol 温度センサ
JPH08136361A (ja) * 1994-11-11 1996-05-31 Tanaka Kikinzoku Kogyo Kk 測温抵抗体比較校正装置の均熱ブロック及び測温抵抗体の比較校正方法
JPH08152365A (ja) * 1994-11-29 1996-06-11 Tanaka Kikinzoku Kogyo Kk 測温抵抗体の校正方法

Also Published As

Publication number Publication date
JP2002188967A (ja) 2002-07-05
JP3416685B2 (ja) 2003-06-16

Similar Documents

Publication Publication Date Title
Lashley et al. Critical examination of heat capacity measurements made on a Quantum Design physical property measurement system
Zawilski et al. Description of the parallel thermal conductance technique for the measurement of the thermal conductivity of small diameter samples
KR102630649B1 (ko) 비-침습적 열 조사를 위한 장치, 시스템들 및 방법들
Yeager et al. A review of cryogenic thermometry and common temperature sensors
Mun et al. Experimental setup for the measurement of the thermoelectric power in zero and applied magnetic field
Marcos et al. A high-sensitivity differential scanning calorimeter with magnetic field for magnetostructural transitions
Meschke et al. Electron thermalization in metallic islands probed by coulomb blockade thermometry
US3232113A (en) Thermal parameter indicator
Lebioda et al. Dynamic properties of cryogenic temperature sensors
US3575053A (en) Cryogenic linear temperature sensor
Heine et al. Magnetoresistance of the new ceramic “Cernox” thermometer from 4.2 K to 300 K in magnetic fields up to 13 T
Kolouch et al. Thermal Conductivities of Polyethylene and Nylon from 1.2 to 20 K
WO2002050502A1 (fr) Procede d'etalonnage du champ magnetique d'un thermometre avec dependance au champ magnetique
Bentley Handbook of Temperature Measurement.: Volume 1, Temperature and Humidity Measurement
Afridi et al. Microhotplate temperature sensor calibration and BIST
Wang et al. Thin Film Heat Flux Sensor With Sandwich Structure for Extreme Temperature Environment
Edler et al. Reference material for Seebeck coefficients
WO1996018871A1 (fr) Systeme de sonde de temperature utilisant un film mince de semi-conducteur microcristallin
Kuepferling et al. An isothermal Peltier cell calorimeter for measuring the magnetocaloric effect
Sarajlić et al. Thin-film four-resistor temperature sensor for measurements in air
Dudarev et al. New bridge temperature sensor for superconducting magnets and other cryogenic applications
CN106556469B (zh) 一种基于负温度系数热敏电阻的温度链传感器
Immonen A heat flux sensor test setup
RU2819824C1 (ru) Самокалибрующийся сенсор температуры на ферритовых элементах
Van Dorth et al. Thick film heat flux sensor

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): US

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WA Withdrawal of international application