WO2002039077A3 - Verfahren zur auswertung von echelle-spektren - Google Patents

Verfahren zur auswertung von echelle-spektren Download PDF

Info

Publication number
WO2002039077A3
WO2002039077A3 PCT/EP2001/012750 EP0112750W WO0239077A3 WO 2002039077 A3 WO2002039077 A3 WO 2002039077A3 EP 0112750 W EP0112750 W EP 0112750W WO 0239077 A3 WO0239077 A3 WO 0239077A3
Authority
WO
WIPO (PCT)
Prior art keywords
wavelength
lines
order
determination
wavelengths
Prior art date
Application number
PCT/EP2001/012750
Other languages
English (en)
French (fr)
Other versions
WO2002039077A2 (de
Inventor
Stefan Florek
Michael Okruss
Helmut Becker-Ross
Original Assignee
Ges Zur Foerderung Angewandter Optik Optoelektronik Quantenelektronik & Spektroskopie Ev
Ges Foerderung Spektrochemie
Stefan Florek
Michael Okruss
Helmut Becker-Ross
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ges Zur Foerderung Angewandter Optik Optoelektronik Quantenelektronik & Spektroskopie Ev, Ges Foerderung Spektrochemie, Stefan Florek, Michael Okruss, Helmut Becker-Ross filed Critical Ges Zur Foerderung Angewandter Optik Optoelektronik Quantenelektronik & Spektroskopie Ev
Priority to DE50115274T priority Critical patent/DE50115274D1/de
Priority to AT01993819T priority patent/ATE453104T1/de
Priority to AU2002220680A priority patent/AU2002220680A1/en
Priority to EP01993819A priority patent/EP1336084B1/de
Priority to US10/416,566 priority patent/US7319519B2/en
Publication of WO2002039077A2 publication Critical patent/WO2002039077A2/de
Publication of WO2002039077A3 publication Critical patent/WO2002039077A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1809—Echelle gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Semiconductor Lasers (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Processing Of Color Television Signals (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

Ein Verfahren zur Wellenlängenkalibrierung von Echellespektren, bei denen sich die Wellenlängen auf eine Mehrzahl von Ordnungen verteilen, ist gekennzeichnet durch die Schritte: Aufnehmen eines linienreichen Referenzspektrums mit bekannten Wellenlängen für eine Vielzahl der Linien, Bestimmen der Lage einer Vielzahl von Peaks des Referenzspektrums in dem aufgenommenen Spektrum, Auswählen von wenigstens zwei ersten Linien mit bekannter Ordnung, Lage und Wellenlänge. Bestimmen einer Wellenlängenskala für die Ordnung, in welcher die bekannten Linien liegen, durch eine Fitfunktion μm (x), Bestimmen einer vorläufigen Wellenlängenskala μm±1(x) für wenigstens eine benachbarte Ordnung m±1 durch Addition/Subtraktion einer Wellenlängendifferenz ΔμFSR, die einem freien Spektralbereich entspricht nach μm±1(x) = μm (x) ± ΔμFSR, mit ΔμFSR=μm(x)/m. Bestimmen der Wellenlängen von Linien in dieser benachbarten Ordnung m±1 mittels der vorläufigen Wellenlängenskala μm±1(x), Ersetzen der vorläufigen Wellenlänge von wenigstens zwei Linien durch die nach Schritt (a) vorgegebene Refernzwellenlänge diser Linien, und Wiederholen der Schritte (d) bis (g) für wenigstens eine weitere benachbarte Ordnung.
PCT/EP2001/012750 2000-11-13 2001-11-03 Verfahren zur auswertung von echelle-spektren WO2002039077A2 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE50115274T DE50115274D1 (de) 2000-11-13 2001-11-03 Verfahren zur auswertung von echelle-spektren
AT01993819T ATE453104T1 (de) 2000-11-13 2001-11-03 Verfahren zur auswertung von echelle-spektren
AU2002220680A AU2002220680A1 (en) 2000-11-13 2001-11-03 Method for the analysis of echelle spectra
EP01993819A EP1336084B1 (de) 2000-11-13 2001-11-03 Verfahren zur auswertung von echelle-spektren
US10/416,566 US7319519B2 (en) 2000-11-13 2001-11-03 Method for the analysis of echelle spectra

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10055905.0 2000-11-13
DE10055905A DE10055905B4 (de) 2000-11-13 2000-11-13 Verfahren zur Auswertung von Echelle-Spektren

Publications (2)

Publication Number Publication Date
WO2002039077A2 WO2002039077A2 (de) 2002-05-16
WO2002039077A3 true WO2002039077A3 (de) 2002-10-17

Family

ID=7662923

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2001/012750 WO2002039077A2 (de) 2000-11-13 2001-11-03 Verfahren zur auswertung von echelle-spektren

Country Status (6)

Country Link
US (2) US7319519B2 (de)
EP (3) EP1783468B1 (de)
AT (2) ATE453105T1 (de)
AU (1) AU2002220680A1 (de)
DE (3) DE10055905B4 (de)
WO (1) WO2002039077A2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100365400C (zh) * 2004-09-09 2008-01-30 中国科学院上海技术物理研究所 成像光谱仪的像面检校装置
US7495761B2 (en) * 2006-02-03 2009-02-24 Foster-Miller, Inc. Array detector coupled spectroanalytical system and graded blaze angle grating
US9146155B2 (en) * 2007-03-15 2015-09-29 Oto Photonics, Inc. Optical system and manufacturing method thereof
TWI345050B (en) * 2007-08-03 2011-07-11 Oto Photonics Inc Optical system and method of manufacturing the same
EP2304400A1 (de) * 2008-06-25 2011-04-06 Bioptigen, Inc. Volumenphasengitterspektrometer sowie entsprechende verfahren und systeme
US8422013B2 (en) * 2008-11-11 2013-04-16 Bae Systems Information And Electronic Systems Integration Inc. Optical multiplexer/demultiplexer
DE102009003413B4 (de) * 2009-01-30 2022-01-20 Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. Echelle-Spektrometeranordnung mit interner Vordispersion
US9429652B2 (en) * 2011-10-21 2016-08-30 Lg Electronics Inc. Apparatus for measuring distance
JP2014532873A (ja) 2011-11-03 2014-12-08 ベリフード リミテッド エンドユーザ食品分析のための低費用分光分析システム
FR2984490B1 (fr) * 2011-12-14 2014-05-16 IFP Energies Nouvelles Methode d'analyse chimique comportant un lissage de diagramme par filtre localement auto adaptatif
DE102012101019B4 (de) 2012-02-08 2015-03-12 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Spektrometer-Anordnung für UV-VIS
JP5448224B1 (ja) * 2013-03-12 2014-03-19 日本分光株式会社 クロマトグラフィーシステム、信号処理装置、クロマトグラフィー・データ処理端末およびプログラム
GB2529070B (en) 2013-08-02 2017-07-12 Verifood Ltd Spectrometer comprising a plurality of isolated optical paths
GB2517706B (en) * 2013-08-28 2016-03-09 Thermo Electron Mfg Ltd Background correction in emission spectra
JP2017505901A (ja) 2014-01-03 2017-02-23 ベリフード， リミテッドＶｅｒｉｆｏｏｄ， Ｌｔｄ． 分光システム、方法、および用途
EP3209983A4 (de) 2014-10-23 2018-06-27 Verifood Ltd. Zubehörgeräte für handhaltbares spektrometer
WO2016125165A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system with visible aiming beam
WO2016125164A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system applications
DE102015105239A1 (de) 2015-04-07 2016-10-13 Analytik Jena Ag Verfahren zur Korrektur von Untergrundsignalen in einem Spektrum
WO2016162865A1 (en) 2015-04-07 2016-10-13 Verifood, Ltd. Detector for spectrometry system
DE102015107942A1 (de) 2015-05-20 2016-11-24 Sick Ag Spektrometer und Gasanalysator
US10066990B2 (en) 2015-07-09 2018-09-04 Verifood, Ltd. Spatially variable filter systems and methods
US11953427B2 (en) * 2015-08-03 2024-04-09 Endress+Hauser Optical Analysis, Inc. Reconstruction of frequency registration for quantitative spectroscopy
US10203246B2 (en) 2015-11-20 2019-02-12 Verifood, Ltd. Systems and methods for calibration of a handheld spectrometer
CN105628649B (zh) * 2015-12-24 2018-03-16 山东省科学院激光研究所 气体现场监测特征吸收峰提取方法
US10254215B2 (en) 2016-04-07 2019-04-09 Verifood, Ltd. Spectrometry system applications
TWI715599B (zh) 2016-07-12 2021-01-11 台灣超微光學股份有限公司 光譜儀模組及其製作方法
WO2018015951A1 (en) 2016-07-20 2018-01-25 Verifood, Ltd. Accessories for handheld spectrometer
US10791933B2 (en) 2016-07-27 2020-10-06 Verifood, Ltd. Spectrometry systems, methods, and applications
DE102017213419A1 (de) * 2017-08-02 2019-02-07 Deere & Company Spektrometeranordnung
GB2586046B (en) * 2019-07-31 2021-12-22 Thermo Fisher Scient Bremen Gmbh Peak determination in two-dimensional optical spectra
GB2589884B (en) * 2019-12-11 2022-08-03 Thermo Fisher Scient Bremen Gmbh Processing optical spectra
GB2601182B (en) 2020-11-23 2022-12-28 Thermo Fisher Scient Bremen Gmbh Diagnostic testing method for a spectrometer

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3326868A1 (de) * 1982-10-01 1984-04-05 Jenoptik Jena Gmbh, Ddr 6900 Jena Anordnung zur auswahl von spektrenabschnitten aus einem gesamtspektrum
US4856898A (en) * 1987-05-04 1989-08-15 Jenoptik Jena Gmbh Adjustable echelle spectrometer arrangement and method for its adjustment
JPH0254130A (ja) * 1988-08-17 1990-02-23 Anritsu Corp 分光器
DE4017317A1 (de) * 1990-05-30 1991-12-05 Bodenseewerk Perkin Elmer Co Anodnung zur verbesserung der aufloesung eines spektrometers
DE4128506A1 (de) * 1991-08-28 1993-03-04 Zeiss Carl Fa Verfahren zum betreiben eines spektrometers
US5253183A (en) * 1988-01-06 1993-10-12 Hitachi, Ltd. Obtaining a spectrogram from a single scanning of interference fringes
US5596407A (en) * 1995-06-07 1997-01-21 Varian Associates, Inc Optical detector for echelle spectrometer
DE19708462A1 (de) * 1997-02-17 1998-08-27 Lla Umwelttechnische Analytik Verfahren und Vorrichtung zur zeitaufgelösten optischen Spektralanalyse von laserinduzierten Mikroplasmen

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE256060C (de)
US3658424A (en) * 1971-01-14 1972-04-25 Spectra Metrics Inc Method of focusing the horizontal and vertical components from an echelle grating
DD256060A3 (de) * 1984-08-20 1988-04-27 Zeiss Jena Veb Carl Echelle-spektrometer
ES2029823T3 (es) * 1987-12-18 1992-10-01 Hewlett-Packard Gmbh Espectrometro de formacion o agrupacion regular de fotodiodos.
US4995721A (en) * 1990-03-05 1991-02-26 Imo Industries, Inc. Two-dimensional spectrometer
GB9320261D0 (en) * 1993-10-01 1993-11-17 Unicam Ltd Spectrophotometer
DE4413096B4 (de) * 1994-04-15 2004-09-09 Berthold Gmbh & Co. Kg Multielement-Atomabsorptionsspektrometer sowie Meßverfahren unter Nutzung eines solchen Atomabsorptionsspektrometers
US5672869A (en) * 1996-04-03 1997-09-30 Eastman Kodak Company Noise and background reduction method for component detection in chromatography/spectrometry
US5739905A (en) * 1997-02-26 1998-04-14 Lucid Technologies, Inc. Spectrophotometer with electronic temperature stabilization
US6529531B1 (en) * 1997-07-22 2003-03-04 Cymer, Inc. Fast wavelength correction technique for a laser

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3326868A1 (de) * 1982-10-01 1984-04-05 Jenoptik Jena Gmbh, Ddr 6900 Jena Anordnung zur auswahl von spektrenabschnitten aus einem gesamtspektrum
US4856898A (en) * 1987-05-04 1989-08-15 Jenoptik Jena Gmbh Adjustable echelle spectrometer arrangement and method for its adjustment
US5253183A (en) * 1988-01-06 1993-10-12 Hitachi, Ltd. Obtaining a spectrogram from a single scanning of interference fringes
JPH0254130A (ja) * 1988-08-17 1990-02-23 Anritsu Corp 分光器
DE4017317A1 (de) * 1990-05-30 1991-12-05 Bodenseewerk Perkin Elmer Co Anodnung zur verbesserung der aufloesung eines spektrometers
DE4128506A1 (de) * 1991-08-28 1993-03-04 Zeiss Carl Fa Verfahren zum betreiben eines spektrometers
US5596407A (en) * 1995-06-07 1997-01-21 Varian Associates, Inc Optical detector for echelle spectrometer
DE19708462A1 (de) * 1997-02-17 1998-08-27 Lla Umwelttechnische Analytik Verfahren und Vorrichtung zur zeitaufgelösten optischen Spektralanalyse von laserinduzierten Mikroplasmen

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 014, no. 226 (P - 1047) 14 May 1990 (1990-05-14) *
PELLETIER M J: "RAMAN SPECTROSCOPY USING AN ECHELLE SPECTROGRAPH WITH CCD DETECTION", APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, vol. 44, no. 10, 1 December 1990 (1990-12-01), pages 1699 - 1705, XP000169324, ISSN: 0003-7028 *
SCHEELINE A ET AL: "DESIGN AND CHARACTERIZATION OF AN ECHELLE SPECTROMETER FOR FUNDAMENTAL AND APPLIED EMISSION SPECTROCHEMICAL ANALYSIS", APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, vol. 45, no. 3, 1 March 1991 (1991-03-01), pages 334 - 346, XP000200998, ISSN: 0003-7028 *

Also Published As

Publication number Publication date
ATE453105T1 (de) 2010-01-15
US7876435B2 (en) 2011-01-25
DE10055905B4 (de) 2004-05-13
EP1783468A3 (de) 2008-10-01
DE50115274D1 (de) 2010-02-04
EP1336084A2 (de) 2003-08-20
US7319519B2 (en) 2008-01-15
DE50115281D1 (de) 2010-02-04
US20080106735A1 (en) 2008-05-08
WO2002039077A2 (de) 2002-05-16
ATE453104T1 (de) 2010-01-15
EP1783468B1 (de) 2009-12-23
EP2068134B1 (de) 2013-03-20
US20040114139A1 (en) 2004-06-17
EP1783468A2 (de) 2007-05-09
EP2068134A2 (de) 2009-06-10
AU2002220680A1 (en) 2002-05-21
EP1336084B1 (de) 2009-12-23
DE10055905A1 (de) 2002-05-23
EP2068134A3 (de) 2009-07-15

Similar Documents

Publication Publication Date Title
WO2002039077A3 (de) Verfahren zur auswertung von echelle-spektren
CN101441165B (zh) 光谱仪的波长校准方法
US7123844B2 (en) Optical computational system
CA2279765A1 (en) Wavelength stabilized planar waveguide optical devices incorporating a dispersive element
WO2005104659A3 (en) Method and system for approximating the spectrum of a plurality of color samples
EP0744599A3 (de) Optisches Spektrometer zur Erfassung von Spektren in unterschiedlichen Bereichen
WO2002088901A3 (en) A method for analyzing drug adverse effects employing multivariate statistical analysis
AU5914199A (en) Spectral bio-imaging data for cell classification using internal reference
WO2006010367A3 (en) On-chip spectroscopy
WO2003081190A3 (en) Spectrally tunable detector
WO2006023712A3 (en) Multi-channel, multi-spectrum imaging spectrometer
WO2003030524A3 (en) A method of predicting reflectance functions
WO2005083355A3 (en) Fiber optic gyroscope using a narrowband fbg filter as a wavelength reference
WO2005029016A3 (en) Material identification employing a grating spectrometer
EP1684274A3 (de) Diffraktionselement und optische Lesekopfvorrichtung damit
EP0915584A3 (de) Optischer Wellenlängenmultiplexer hoher Kapazität
EP0838677A1 (de) Verfahren zur Beobachtung und Überwachung einer Produktionsanlage und/oder eines NIR-Spektrometers mittels mindestens einem Qualitätskriterium der Gesamtheit der Spektren
NO984391L (no) Statistisk fremgangsmÕte for klassifisering av hendelse knyttet til de fysiske egenskaper ved et komplekst medium, slik som undergrunnen
EP1120637A3 (de) Vorrichtung und Verfahren zum Kalibrieren eines Gittermonochromators
WO2004070782A3 (en) Programmable diffraction grating sensor
WO2003025630A3 (en) Free-space optical systems for wavelength switching and spectral monitoring applications
WO2004072770A3 (en) Method and apparatus for testing network data signals in a wavelength division multiplexed optical network
DE50100398D1 (de) Verwendung eines Beugungsgitters mit hohem Aspektverhältnis
CA2305081A1 (en) Monochromator and spectrometric method
AU2001243709A1 (en) Holographic grating spectrum analyzer

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

AK Designated states

Kind code of ref document: A3

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2001993819

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2001993819

Country of ref document: EP

REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

WWE Wipo information: entry into national phase

Ref document number: 10416566

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP