AU2002220680A1 - Method for the analysis of echelle spectra - Google Patents

Method for the analysis of echelle spectra

Info

Publication number
AU2002220680A1
AU2002220680A1 AU2002220680A AU2068002A AU2002220680A1 AU 2002220680 A1 AU2002220680 A1 AU 2002220680A1 AU 2002220680 A AU2002220680 A AU 2002220680A AU 2068002 A AU2068002 A AU 2068002A AU 2002220680 A1 AU2002220680 A1 AU 2002220680A1
Authority
AU
Australia
Prior art keywords
echelle
spectrometer
spectra
setting
wavelength calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002220680A
Inventor
Helmut Becker-Ross
Stefan Florek
Michael Okruss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Angewandter Optik Optoelektronik Quantenelektronik und Spektroskopie Ev Gesell zur Forderung
Der Spektrochemie und Angewandten Spektroskopie Ev Gesell zur Forderung
Original Assignee
FORDERUNG ANGEWANDTER OPTIK OP
GES FOERDERUNG SPEKTROCHEMIE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FORDERUNG ANGEWANDTER OPTIK OP, GES FOERDERUNG SPEKTROCHEMIE filed Critical FORDERUNG ANGEWANDTER OPTIK OP
Publication of AU2002220680A1 publication Critical patent/AU2002220680A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1809—Echelle gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan

Abstract

The echelle spectrometer (10) has a setting device for setting the positions of the optical components of the spectrometer, for position adjustment of the spectral lines within the output plane (72), containing a surface detector with a 2-dimensional array of image elements, e.g. a CCD detector, for wavelength calibration of the echelle spectra. The setting device can be computer controlled and includes at least one piezoelement supplied with a regulated setting voltage. Also included are Independent claims for the following: (a) a compensation method for shifts in the echelle spectrum in an echelle spectrometer; (b) a method for determining the binning-regions of a surface detector for an echelle spectrometer; (c) a wavelength calibration method for echelle spectra; (d) a method for background detection and wideband background correction.
AU2002220680A 2000-11-13 2001-11-03 Method for the analysis of echelle spectra Abandoned AU2002220680A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10055905.0 2000-11-13
DE10055905A DE10055905B4 (en) 2000-11-13 2000-11-13 Method for evaluating Echelle spectra
PCT/EP2001/012750 WO2002039077A2 (en) 2000-11-13 2001-11-03 Method for the analysis of echelle spectra

Publications (1)

Publication Number Publication Date
AU2002220680A1 true AU2002220680A1 (en) 2002-05-21

Family

ID=7662923

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002220680A Abandoned AU2002220680A1 (en) 2000-11-13 2001-11-03 Method for the analysis of echelle spectra

Country Status (6)

Country Link
US (2) US7319519B2 (en)
EP (3) EP2068134B1 (en)
AT (2) ATE453105T1 (en)
AU (1) AU2002220680A1 (en)
DE (3) DE10055905B4 (en)
WO (1) WO2002039077A2 (en)

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US7495761B2 (en) * 2006-02-03 2009-02-24 Foster-Miller, Inc. Array detector coupled spectroanalytical system and graded blaze angle grating
US9146155B2 (en) * 2007-03-15 2015-09-29 Oto Photonics, Inc. Optical system and manufacturing method thereof
TWI345050B (en) * 2007-08-03 2011-07-11 Oto Photonics Inc Optical system and method of manufacturing the same
US8189192B2 (en) * 2008-06-25 2012-05-29 Bioptigen, Inc. Volume phase grating spectrometers and related methods and systems
US8422013B2 (en) * 2008-11-11 2013-04-16 Bae Systems Information And Electronic Systems Integration Inc. Optical multiplexer/demultiplexer
DE102009003413B4 (en) 2009-01-30 2022-01-20 Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. Echelle spectrometer arrangement with internal pre-dispersion
KR101556866B1 (en) * 2011-10-21 2015-10-01 엘지전자 주식회사 Distance measuring device
JP2014532873A (en) 2011-11-03 2014-12-08 ベリフード リミテッド Low-cost spectroscopic analysis system for end-user food analysis
FR2984490B1 (en) * 2011-12-14 2014-05-16 IFP Energies Nouvelles CHEMICAL ANALYSIS METHOD WITH LOCALLY AUTO ADAPTIVE FILTER DIAGRAM SMOOTHING
DE102012101019B4 (en) 2012-02-08 2015-03-12 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Spectrometer arrangement for UV-VIS
JP5448224B1 (en) * 2013-03-12 2014-03-19 日本分光株式会社 Chromatography system, signal processing apparatus, chromatography data processing terminal and program
CN105593651B (en) 2013-08-02 2019-06-07 威利食品有限公司 Spectrometric system and method, spectroscopy equipment and system
GB2517706B (en) * 2013-08-28 2016-03-09 Thermo Electron Mfg Ltd Background correction in emission spectra
EP3090239A4 (en) 2014-01-03 2018-01-10 Verifood Ltd. Spectrometry systems, methods, and applications
EP3209983A4 (en) 2014-10-23 2018-06-27 Verifood Ltd. Accessories for handheld spectrometer
WO2016125165A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system with visible aiming beam
WO2016125164A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system applications
DE102015105239A1 (en) 2015-04-07 2016-10-13 Analytik Jena Ag Method for correcting background signals in a spectrum
WO2016162865A1 (en) 2015-04-07 2016-10-13 Verifood, Ltd. Detector for spectrometry system
DE102015107942A1 (en) 2015-05-20 2016-11-24 Sick Ag Spectrometer and gas analyzer
US10066990B2 (en) 2015-07-09 2018-09-04 Verifood, Ltd. Spatially variable filter systems and methods
US11953427B2 (en) * 2015-08-03 2024-04-09 Endress+Hauser Optical Analysis, Inc. Reconstruction of frequency registration for quantitative spectroscopy
US10203246B2 (en) 2015-11-20 2019-02-12 Verifood, Ltd. Systems and methods for calibration of a handheld spectrometer
CN105628649B (en) * 2015-12-24 2018-03-16 山东省科学院激光研究所 Gas field monitoring characteristic absorption peak extracting method
US10254215B2 (en) 2016-04-07 2019-04-09 Verifood, Ltd. Spectrometry system applications
TWI715599B (en) 2016-07-12 2021-01-11 台灣超微光學股份有限公司 Spectrometer and manufacturing method thereof
EP3488204A4 (en) 2016-07-20 2020-07-22 Verifood Ltd. Accessories for handheld spectrometer
US10791933B2 (en) 2016-07-27 2020-10-06 Verifood, Ltd. Spectrometry systems, methods, and applications
DE102017213419A1 (en) * 2017-08-02 2019-02-07 Deere & Company spectrometer arrangement
GB2586046B (en) * 2019-07-31 2021-12-22 Thermo Fisher Scient Bremen Gmbh Peak determination in two-dimensional optical spectra
GB2589884B (en) * 2019-12-11 2022-08-03 Thermo Fisher Scient Bremen Gmbh Processing optical spectra
GB2601182B (en) 2020-11-23 2022-12-28 Thermo Fisher Scient Bremen Gmbh Diagnostic testing method for a spectrometer

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DE256060C (en)
US3658424A (en) * 1971-01-14 1972-04-25 Spectra Metrics Inc Method of focusing the horizontal and vertical components from an echelle grating
DD210753A1 (en) * 1982-10-01 1984-06-20 Zeiss Jena Veb Carl ARRANGEMENT FOR SELECTION OF SPECTRUM CIRCUITS FROM A GENERAL SPECTRUM
DD256060A3 (en) * 1984-08-20 1988-04-27 Zeiss Jena Veb Carl Echelle spectrometer
DD260326B5 (en) * 1987-05-04 1993-11-25 Zeiss Carl Jena Gmbh ADJUSTABLE ECHELLE SPECTROMETER ARRANGEMENT AND METHOD FOR ITS ADJUSTMENT
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US5253183A (en) * 1988-01-06 1993-10-12 Hitachi, Ltd. Obtaining a spectrogram from a single scanning of interference fringes
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Also Published As

Publication number Publication date
EP1783468A3 (en) 2008-10-01
US20040114139A1 (en) 2004-06-17
EP1783468B1 (en) 2009-12-23
EP2068134A2 (en) 2009-06-10
WO2002039077A3 (en) 2002-10-17
US7876435B2 (en) 2011-01-25
EP2068134A3 (en) 2009-07-15
EP1783468A2 (en) 2007-05-09
ATE453104T1 (en) 2010-01-15
EP1336084B1 (en) 2009-12-23
DE10055905A1 (en) 2002-05-23
US7319519B2 (en) 2008-01-15
EP2068134B1 (en) 2013-03-20
US20080106735A1 (en) 2008-05-08
WO2002039077A2 (en) 2002-05-16
EP1336084A2 (en) 2003-08-20
DE10055905B4 (en) 2004-05-13
ATE453105T1 (en) 2010-01-15
DE50115274D1 (en) 2010-02-04
DE50115281D1 (en) 2010-02-04

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