WO2001053944A3 - Redundanter datenspeicher - Google Patents
Redundanter datenspeicher Download PDFInfo
- Publication number
- WO2001053944A3 WO2001053944A3 PCT/EP2001/000075 EP0100075W WO0153944A3 WO 2001053944 A3 WO2001053944 A3 WO 2001053944A3 EP 0100075 W EP0100075 W EP 0100075W WO 0153944 A3 WO0153944 A3 WO 0153944A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- data memory
- redundant
- redundant data
- main
- units
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
- G11C29/789—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using non-volatile cells or latches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
- G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/181,589 US6785170B2 (en) | 2000-01-19 | 2001-01-05 | Data memory with short memory access time |
EP01900126A EP1248978A2 (de) | 2000-01-19 | 2001-01-05 | Redundanter datenspeicher |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10002139.5 | 2000-01-19 | ||
DE10002139A DE10002139A1 (de) | 2000-01-19 | 2000-01-19 | Datenspeicher |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001053944A2 WO2001053944A2 (de) | 2001-07-26 |
WO2001053944A3 true WO2001053944A3 (de) | 2002-02-14 |
Family
ID=7628020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2001/000075 WO2001053944A2 (de) | 2000-01-19 | 2001-01-05 | Redundanter datenspeicher |
Country Status (5)
Country | Link |
---|---|
US (1) | US6785170B2 (de) |
EP (1) | EP1248978A2 (de) |
DE (1) | DE10002139A1 (de) |
TW (1) | TW487921B (de) |
WO (1) | WO2001053944A2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10338022A1 (de) | 2003-08-19 | 2005-03-31 | Infineon Technologies Ag | Verfahren zum Adressieren eines regulären und eines redundanten Speicherbereiches in einer Speicherschaltung sowie eine Adressdecodierschaltung hierfür |
EP1536431A1 (de) | 2003-11-26 | 2005-06-01 | Infineon Technologies AG | Anordnung mit einem Speicher zum Speichern von Daten |
JP2006012234A (ja) * | 2004-06-23 | 2006-01-12 | Toshiba Corp | メモリテスト回路およびメモリテスト方法 |
US7519875B2 (en) * | 2004-08-20 | 2009-04-14 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method and apparatus for enabling a user to determine whether a defective location in a memory device has been remapped to a redundant memory portion |
JP2006107590A (ja) * | 2004-10-04 | 2006-04-20 | Nec Electronics Corp | 半導体集積回路装置及びそのテスト方法 |
US7672150B2 (en) * | 2007-09-27 | 2010-03-02 | Infineon Technologies Ag | Apparatus, embedded memory, address decoder, method of reading out data and method of configuring a memory |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0554053A2 (de) * | 1992-01-31 | 1993-08-04 | STMicroelectronics, Inc. | Halbleiterspeicher mit einem Multiplexer zur Auswahl eines Ausgangs zu einem redundanten Speicherszugriff |
EP0637034A1 (de) * | 1993-07-26 | 1995-02-01 | STMicroelectronics S.r.l. | Verfahren zur Erkennung fehlerhafter Elemente eines redundanten Halbleiterspeichers |
US5438546A (en) * | 1994-06-02 | 1995-08-01 | Intel Corporation | Programmable redundancy scheme suitable for single-bit state and multibit state nonvolatile memories |
US5579265A (en) * | 1994-02-28 | 1996-11-26 | Sgs-Thomson Microelectronics S.A. | Memory redundancy circuit |
US5793683A (en) * | 1997-01-17 | 1998-08-11 | International Business Machines Corporation | Wordline and bitline redundancy with no performance penalty |
US5841711A (en) * | 1996-08-30 | 1998-11-24 | Nec Corporation | Semiconductor memory device with redundancy switching method |
EP0881571A1 (de) * | 1997-05-30 | 1998-12-02 | Fujitsu Limited | Halbleiterspeicheranordnung mit Redundanz |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0675440B1 (de) * | 1994-03-29 | 1998-08-05 | STMicroelectronics S.r.l. | Redundanzschaltung für eine Halbleiter-Speicheranordnung |
US5841710A (en) * | 1997-02-14 | 1998-11-24 | Micron Electronics, Inc. | Dynamic address remapping decoder |
JP3225938B2 (ja) * | 1998-12-17 | 2001-11-05 | 日本電気株式会社 | 半導体装置およびその故障救済方法 |
JP2003022693A (ja) * | 2001-07-09 | 2003-01-24 | Mitsubishi Electric Corp | 半導体メモリ |
-
2000
- 2000-01-19 DE DE10002139A patent/DE10002139A1/de not_active Withdrawn
-
2001
- 2001-01-05 EP EP01900126A patent/EP1248978A2/de not_active Withdrawn
- 2001-01-05 US US10/181,589 patent/US6785170B2/en not_active Expired - Lifetime
- 2001-01-05 WO PCT/EP2001/000075 patent/WO2001053944A2/de not_active Application Discontinuation
- 2001-01-18 TW TW090101113A patent/TW487921B/zh not_active IP Right Cessation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0554053A2 (de) * | 1992-01-31 | 1993-08-04 | STMicroelectronics, Inc. | Halbleiterspeicher mit einem Multiplexer zur Auswahl eines Ausgangs zu einem redundanten Speicherszugriff |
EP0637034A1 (de) * | 1993-07-26 | 1995-02-01 | STMicroelectronics S.r.l. | Verfahren zur Erkennung fehlerhafter Elemente eines redundanten Halbleiterspeichers |
US5579265A (en) * | 1994-02-28 | 1996-11-26 | Sgs-Thomson Microelectronics S.A. | Memory redundancy circuit |
US5438546A (en) * | 1994-06-02 | 1995-08-01 | Intel Corporation | Programmable redundancy scheme suitable for single-bit state and multibit state nonvolatile memories |
US5841711A (en) * | 1996-08-30 | 1998-11-24 | Nec Corporation | Semiconductor memory device with redundancy switching method |
US5793683A (en) * | 1997-01-17 | 1998-08-11 | International Business Machines Corporation | Wordline and bitline redundancy with no performance penalty |
EP0881571A1 (de) * | 1997-05-30 | 1998-12-02 | Fujitsu Limited | Halbleiterspeicheranordnung mit Redundanz |
Non-Patent Citations (3)
Title |
---|
CHEN T ET AL: "A SELF-TESTING AND SELF-REPAIRING STRUCTURE FOR ULTRA-LARGE CAPACITY MEMORIES", PROCEEDINGS OF THE INTERNATIONAL TEST CONFERENCE. BALTIMORE, SEPT. 20 - 24, 1992, NEW YORK, IEEE, US, vol. CONF. 23, 20 September 1992 (1992-09-20), pages 623 - 631, XP000348800, ISBN: 0-7803-0760-7 * |
KAZUHIRO SAWADA ET AL: "BUILT-IN SELF-REPAIR CIRCUIT FOR HIGH-DENSITY ASMIC", PROCEEDINGS OF THE CUSTOM INTEGRATED CIRCUITS CONFERENCE. SAN DIEGO, 15 - 18 MAY, 1989, NEW YORK, IEEE, US, vol. CONF. 11, 15 May 1989 (1989-05-15), pages 2611 - 2614, XP000075598 * |
TAKEDA E ET AL: "VLSI RELIABILITY CHALLENGES: FROM DEVICE PHYSICS TO WAFER SCALE SYSTEMS", PROCEEDINGS OF THE IEEE,IEEE. NEW YORK,US, vol. 81, no. 5, 1 May 1993 (1993-05-01), pages 653 - 673, XP000325288, ISSN: 0018-9219 * |
Also Published As
Publication number | Publication date |
---|---|
EP1248978A2 (de) | 2002-10-16 |
DE10002139A1 (de) | 2001-08-02 |
WO2001053944A2 (de) | 2001-07-26 |
TW487921B (en) | 2002-05-21 |
US20030076716A1 (en) | 2003-04-24 |
US6785170B2 (en) | 2004-08-31 |
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