WO2001049023A1 - Procede de compensation en temperature d'un detecteur d'image - Google Patents
Procede de compensation en temperature d'un detecteur d'image Download PDFInfo
- Publication number
- WO2001049023A1 WO2001049023A1 PCT/FR2000/003716 FR0003716W WO0149023A1 WO 2001049023 A1 WO2001049023 A1 WO 2001049023A1 FR 0003716 W FR0003716 W FR 0003716W WO 0149023 A1 WO0149023 A1 WO 0149023A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- photosensitive
- points
- image
- temperature
- detector
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Definitions
- the present invention relates to a temperature compensation method for an image detector which makes it practically insensitive to temperature fluctuations and which in particular guarantees it a substantially constant image dynamic whatever the temperature.
- the acquisition of an image is carried out by one or more photosensitive points each formed by a photodiode and a switch.
- the photosensitive points are produced using thin film deposition techniques of semiconductor materials such as hydrogenated amorphous silicon (aSiH).
- aSiH hydrogenated amorphous silicon
- photosensitive points find a particularly interesting application in the medical field or that of industrial control where they detect radiological images. It is sufficient to cover them with a scintillator and to expose the latter to X-radiation carrying a radiological image.
- the scintillator converts the incident X-radiation into radiation in the wavelength band to which the photosensitive points are sensitive.
- FIG. 1 shows an image detector of the type known in a matrix. It has only nine photosensitive points so as not to overload the figure unnecessarily.
- Each photosensitive point P1 to P9 is formed of a photodiode Dp and of a switch function element De represented in the form of a switching diode. We could have chosen as a switch function element a transistor.
- the photodiode Dp and the switching diode De are interconnected in a head-to-tail arrangement.
- Each photosensitive point P1 to P9 is connected between a row conductor Y1 to Y3 and a column conductor X1 to X3.
- the line conductors Y1 to Y3 are connected to an addressing device 3 known by the Anglo-Saxon name of "driver". There can be several "drivers” 3 if the matrix is large.
- the addressing device 3 generally comprises shift registers, switching circuits, clock circuits.
- the addressing device 3 brings the line conductors Y1 to Y3 to voltages which either isolate the photosensitive points P1 to P3 connected to the same line conductor Y1 from the rest of the matrix, or put them in conduction.
- the addressing device 3 makes it possible to carry out a sequential addressing of the line conductors Y1 to Y3.
- the column conductors X1 to X3 are connected to a reading device CL.
- each charge integrator circuit is produced by an operational amplifier G1 to G3 mounted as an integrator using a reading capacitor C1 to C3. Each capacitor is mounted between the negative input of the operational amplifier G1 to G3 and its output S1 to S3.
- Each column conductor X1 to X3 is connected to the negative input of an operational amplifier G1 to G3.
- the positive input of each of the operational amplifiers G1 to G3 is brought to a constant input reference voltage VR which imposes on each column conductor X1 to X3 this reference voltage.
- Each operational amplifier G1 to G3 comprises a reset switch 11 to 13 mounted in parallel with the capacitor C1 to C3.
- the outputs S1 to S3 of the integrator circuits are connected to a multiplexing device 6 which delivers in series signals corresponding to the charges which have been integrated by the charge integrator circuits. In the reading phase, these signals correspond to the charges accumulated by all the photosensitive points on the same line.
- the signals delivered by the multiplexing device 6 are then digitized in at least one analog-digital converter 7, the signals digitized at the output of the analog-digital converter 7 translate the content of the image to be detected. These digitized signals are transmitted to a management system 8 which can store, process and display them.
- Defects affect the quality of the useful images of such photosensitive devices.
- the semiconductor components of the photosensitive dots exhibit remanence which is linked in particular to their imperfect crystal structure. Charges corresponding to an image taking phase are not read during the associated reading phase and are restored during the reading phase of a subsequent image.
- the semiconductor components of the photosensitive dots are not all exactly identical and the matrix of photosensitive dots locally has altered zones. The components of the CL reading device also bring inhomogeneities.
- the offset image is produced in the absence of any lighting and the charges read, at a photosensitive point, during the phase of corresponding reading come from the following three categories.
- the first represents the training loads, the value of which is given by:
- the second category of charges corresponds to the charges resulting from the leakage current of the photodiode Dp of the photosensitive point read, this current being established between the application of two successive read or polarization pulses.
- the third category of charges corresponds to the charges resulting from the leakage current coming from all the photosensitive points connected to the same column conductor as that which is read, and this only during the reading phase.
- the first category of charges was relatively stable in temperature, it is not the same for the other two categories of charges.
- the offset image varies with temperature. This variation can be very significant, for example at 25 ° C, the electric charge, accumulated at a photosensitive point of the offset image and converted into voltage by the charge integrator circuit 5, can be 0 .5 Volt when it can reach 2 Volts at 50 ° C. This phenomenon is annoying but it can be combated in an exacting manner, by often taking offset images and by correcting the useful image with these offset images, with a sufficiently large frequency with respect to the thermal time constants of the photosensitive device. .
- the analog / digital converter 7 has a fixed coding range for digitizing the values of the voltages delivered by the multiplexing device 6 for each of the photosensitive points.
- a typical value of the coding range is between 0 Volt and 5 Volts. If at 40 ° C, the level of the offset of a photosensitive point is 1.8 Volts, there are only 3.2 volts left to code the level of this photosensitive point in the useful image.
- the present invention aims to overcome the problems mentioned above and related to variations in ambient temperature and provides a temperature compensation method of an image detector making it practically insensitive to inevitable fluctuations in ambient temperature.
- the method according to the invention is a temperature compensation method of an image detector comprising photosensitive dots, sensitive to ambient temperature, each connected to a row conductor and a column conductor, each of photosensitive points being connected by one of its conductors to a reading circuit.
- the photosensitive points are divided into detector photosensitive points intended to be exposed to light information translating the image to be detected, the reading circuits associated with these photosensitive points each delivering a measurement voltage representative of the image to be detected and in blind photosensitive points protected from light information, the reading circuits associated with these blind photosensitive points each delivering a dark voltage serving for temperature compensation.
- the method consists, upon detection of an image, in collecting the dark voltages, then in developing an average correction value from the dark voltages originating from one or more detected images and in using the value of average correction to generate a correction voltage from the average correction value to be applied, when a subsequent image is detected, to the reading circuits associated with the photosensitive detector points so that they deliver a measurement voltage made substantially independent of temperature.
- the measurement and dark point voltages photosensitive consists in converting in an analog-digital converter the measurement and dark point voltages photosensitive, to develop the average correction value from the digitized dark voltages, this average correction value used to drive a digital-analog converter which delivers the correction voltage to be applied to the reading circuits associated with the photosensitive detector points.
- the averaging will be compatible with the thermal time constant of the image detector, for this the average correction value is developed from darkness voltages coming from one or more detected images, l time interval separating the detection of the oldest image and the detection of the most recent image used in the averaging, being less than the thermal time constant of the detector.
- the present invention also relates to a temperature compensated image detector comprising photosensitive points each connected to a row conductor and a column conductor, each photosensitive point being connected by one of its conductors to a reading circuit.
- the photosensitive points are divided into detector photosensitive points intended to be exposed to light information translating the image to be detected, the reading circuits associated with these photosensitive points each delivering a measurement voltage representative of the image to be detected and in blind photosensitive points protected from light information, the reading circuits associated with these blind photosensitive points each delivering a dark voltage serving for temperature compensation.
- It includes means for collecting the dark voltages during the detection of an image and for developing an average correction value from the dark voltages collected, coming from one or more detected images and means for generating, from the average correction value, a correction voltage intended to be applied to the reading circuits associated with the points photosensitive detectors, upon detection of a subsequent image, so that the photosensitive detector points deliver a measurement voltage made substantially independent of temperature.
- the means for collecting the dark voltages and for developing the average correction value receive the dark voltages in digital form from at least one analog-digital converter placed between the read circuits and the means for developing the average value of correction.
- the means for generating the correction voltage comprise a digital-analog converter placed between the means for collecting the dark voltages and for developing the mean correction value and the circuits for reading the photosensitive detector points.
- the read circuit associated with a photosensitive detector point is a charge integrator circuit comprising a capacitor of which an armature receives charges from the photosensitive detector point via the charge conductor and the other armature of which is brought to the correction voltage.
- the reading circuit associated with a blind photosensitive point is a charge integrator circuit comprising a capacitor, one armature of which receives charges from the blind photosensitive point via the conductor, the other armature of which is brought to a fixed reference voltage.
- the blind photosensitive points are connected to an extreme portion of a line conductor.
- the blind photosensitive dots will be covered with a material opaque to light information to which the detector photosensitive dots are exposed, such as black paint.
- the detector photosensitive dots are covered with a scintillating material which transforms X-radiation into light information
- the blind photosensitive dots are covered with an material opaque to X-radiation such as lead, the opaque material when it is present is between the lead and the blind photosensitive points.
- FIG. 2a a top view of an example of an image detector according to the invention
- Figure 2b a section of the image detector of Figure 2a.
- the photosensitive points 01 to 06 and R1 to R9 are represented in the same way as in FIG. 1 with a photodiode Dp and an element with switch function De represented in the form of a switching diode. This switching diode could have been replaced by a transistor.
- the photodiode Dp and the switching diode De are interconnected in a head-to-tail arrangement. Each photosensitive point is connected between a row conductor Y1 to Y3 and a column conductor W1, W2 and Z1 to Z3.
- the photosensitive points 01 to 06 and R1 to R9 are arranged in a matrix according to lines and columns. Compared to the example in FIG.
- the image detector has more photosensitive dots and more column conductors but the same number of line conductors.
- the line conductors are connected to an addressing device 3 comparable to that described in FIG. 1.
- the photosensitive points are divided into two categories, photosensitive points detectors R1 R9 intended to be exposed to luminous information carrying the image to be detected and blind photosensitive points 01 to 06 used for temperature compensation. These blind photosensitive points 01 to 06 are masked from the light information carrying the image to be detected. When detecting an image, whether it is a useful image or an offset image, the blind photosensitive points receive nothing. These blind photosensitive points 01 to 06 will be read as the photosensitive detector points R1 to R9.
- the blind photosensitive points 01 to 06 are connected to extreme portions 20 of the line conductors Y1 to Y3. In the example described they are located at the start of the line, they could be located at the end of the line. The number of blind photosensitive points is not critical. Ten per line seems reasonable if a line has around 2000 detector photosensitive points. These photosensitive points O1 to 06, R1 to R9 are installed on an insulating support referenced 21.
- black paint for example is very suitable.
- the photosensitive detector points R1 to R9 are covered with a scintillator material SC which transforms an X-ray radiation into a radiation in the length band wave to which the photosensitive detector points R1 to R9 are sensitive.
- the blind photosensitive points 01 to 06 they are not covered with the scintillator material SC but with a material PB opaque to X-radiation, a layer of lead for example.
- the material PN opaque to the light information is optional, but if it is used, it is placed between the blind photosensitive points 01 to 06 and the material PB opaque to X-radiation.
- the entire surface of the image detector on the side from which the X-ray radiation originates is covered with a protective material PP based for example on carbon fibers.
- the reading device CL comprises as many reading circuits 30a, 30b as there are column conductors W1, W2 and Z1 to Z3 and these reading circuits are of the charge integrator circuits type.
- the circuits 30a are connected to the conductors W1 and W2 and the circuits 30b to the conductors Z1 to Z3. They receive charges via these conductors.
- Each integrator circuit 30a, 30b also receives as input a fixed input reference voltage VR.
- Each charge integrator circuit 30a, 30b comprises an integration capacitor 31a, 31b of which an armature receives the charges via the conductor W1 to W2, Z1 to Z3 to which the integrator circuit 30a, 30b is connected. These charges come from essentially from the photosensitive point that is being read.
- the other armature of the capacitor 31 a, 31 b is brought to a potential which will be explained. If it is a read circuit 30a connected to a conductor W1, W2 leading to a blind photosensitive point 01 to O6, this voltage is an absolute reference voltage VDRO. If it is a read circuit 30b connected to a conductor Z1 to Z3 leading to a photosensitive detector point R1 to R9, this voltage is a correction voltage VDR subject to temperature.
- Vs2 VDR- Q / C
- the voltage present at output 32a of a read circuit 30a is obtained in a similar manner.
- Each integrator circuit 30a, 30b comprises a reset switch la, Ib respectively mounted in parallel with the corresponding integrator capacitor 31a, 31b.
- the outputs 32a, 32b of the read circuits are connected to a multiplexing device 60 which delivers in series signals corresponding to the charges which have been integrated by the charge integrator circuits. In the reading phase, these signals correspond to the charges accumulated by all the photosensitive points on the same line.
- the signals delivered by the multiplexing device 60 are then digitized in at least one analog-digital converter (ADC) 70.
- ADC analog-digital converter
- the digitized signals are transmitted to a management device 80 which can collect them, that is to say store them, process them. and possibly display them.
- the reading circuits 30b associated with the photosensitive detector points R1 to R9 each deliver a measurement voltage reflecting the exposure received by the photosensitive detector point while the reading circuits 30a associated with the blind photosensitive points O1 to O6 each deliver a dark voltage used to perform the temperature compensation of the image detector since the blind photosensitive points are not exposed.
- the dark voltages are collected, they are delivered, in digital form at the output of the analog-digital converter 70, to the management device 80. Then, a value of average correction from dark voltages from one or more detected images.
- the management device 80 produced with one or more memories and a calculation device is shown separate from a display device 80. 1 which makes it possible to display the detected images. One could consider that the two devices are confused.
- These means 90 for generating the correction voltage VDR have their input connected to the management device 80 and their output to the reading circuits 30b connected to a conductor leading to photosensitive detector points. They are represented in the form of a digital-analog converter (DAC) 90. Given this correction voltage VDR, the measurement voltages at the output 32b of the read circuits 30b remain substantially independent of the temperature.
- DAC digital-analog converter
- the average correction value by averaging over a large number of images. It is possible to perform simple averaging, that is to say that all the images used for averaging are assigned the same weight. The efficiency is further improved if a sliding averaging is carried out, that is to say that the oldest images used in the average are affected by a lesser weight than that of the most recent images.
- the average correction value is developed from darkness voltages coming from one or more detected images, the time interval separating the detection of the most old and the detection of the most recent image used in the averaging being lower than the thermal time constant of the detector.
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU30296/01A AU3029601A (en) | 1999-12-28 | 2000-12-28 | Method for temperature compensation in an image sensor |
US10/149,451 US6737654B2 (en) | 1999-12-28 | 2000-12-28 | Method for temperature compensation of an image detector |
CA002395566A CA2395566C (fr) | 1999-12-28 | 2000-12-28 | Procede de compensation en temperature d'un detecteur d'image |
EP00990831A EP1243131A1 (fr) | 1999-12-28 | 2000-12-28 | Procede de compensation en temperature d'un detecteur d'image |
JP2001549008A JP2003529972A (ja) | 1999-12-28 | 2000-12-28 | 画像検出器の温度補償方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR99/16591 | 1999-12-28 | ||
FR9916591A FR2803081B1 (fr) | 1999-12-28 | 1999-12-28 | Procede de compensation en temperature d'un detecteur d'image |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/130,355 Continuation-In-Part US6830584B1 (en) | 1999-11-17 | 2000-11-15 | Device for replacing a cardiac valve by percutaneous route |
PCT/FR2001/003258 A-371-Of-International WO2002036048A1 (fr) | 1999-11-17 | 2001-10-19 | Support tubulaire de mise en place, par voie percutanee, d'une valve cardiaque de remplacement |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001049023A1 true WO2001049023A1 (fr) | 2001-07-05 |
Family
ID=9553924
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2000/003716 WO2001049023A1 (fr) | 1999-12-28 | 2000-12-28 | Procede de compensation en temperature d'un detecteur d'image |
Country Status (7)
Country | Link |
---|---|
US (1) | US6737654B2 (fr) |
EP (1) | EP1243131A1 (fr) |
JP (1) | JP2003529972A (fr) |
AU (1) | AU3029601A (fr) |
CA (1) | CA2395566C (fr) |
FR (1) | FR2803081B1 (fr) |
WO (1) | WO2001049023A1 (fr) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2796239B1 (fr) * | 1999-07-06 | 2001-10-05 | Trixell Sas | Procede de commande d'un dispositif photosensible apte a produire des images de bonne qualite |
US7317480B1 (en) * | 2000-10-30 | 2008-01-08 | Micron Technology, Inc. | Imaging apparatus providing black level compensation of a successive approximation A/D converter |
FR2817106B1 (fr) * | 2000-11-17 | 2003-03-07 | Trixell Sas | Dispositif photosensible et procede de commande du dispositif photosensible |
EP1699422A4 (fr) * | 2003-12-31 | 2009-04-29 | Univ South Carolina | Capteurs optiques poreux a couche fine pour gaz et autres fluides |
US20070201136A1 (en) * | 2004-09-13 | 2007-08-30 | University Of South Carolina | Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control |
US7634152B2 (en) * | 2005-03-07 | 2009-12-15 | Hewlett-Packard Development Company, L.P. | System and method for correcting image vignetting |
US20070166245A1 (en) * | 2005-11-28 | 2007-07-19 | Leonard Mackles | Propellant free foamable toothpaste composition |
WO2007061436A1 (fr) * | 2005-11-28 | 2007-05-31 | University Of South Carolina | Procédés d'étalonnage automatique pour système d'analyse optique |
EP1969326B1 (fr) | 2005-11-28 | 2020-06-10 | Ometric Corporation | Systeme d'analyse optique et procede de calcul optique multivariant en temps reel |
EP1974201A1 (fr) * | 2005-11-28 | 2008-10-01 | University of South Carolina | Système d'analyse optique permettant d'effectuer en temps réel une détection et une mesure dynamiques |
US9170154B2 (en) | 2006-06-26 | 2015-10-27 | Halliburton Energy Services, Inc. | Data validation and classification in optical analysis systems |
EP2078187A2 (fr) * | 2006-11-02 | 2009-07-15 | University of South Carolina | Systme informatique optique a analytes multiples |
WO2008057913A2 (fr) * | 2006-11-02 | 2008-05-15 | University Of South Carolina | Traitement de signal amélioré destiné à un système informatique |
WO2008121715A1 (fr) * | 2007-03-30 | 2008-10-09 | Ometric Corporation | Systèmes et procédés de mesure de traitement en ligne |
US8184295B2 (en) * | 2007-03-30 | 2012-05-22 | Halliburton Energy Services, Inc. | Tablet analysis and measurement system |
US8213006B2 (en) * | 2007-03-30 | 2012-07-03 | Halliburton Energy Services, Inc. | Multi-analyte optical computing system |
US8283633B2 (en) * | 2007-11-30 | 2012-10-09 | Halliburton Energy Services, Inc. | Tuning D* with modified thermal detectors |
US8212213B2 (en) * | 2008-04-07 | 2012-07-03 | Halliburton Energy Services, Inc. | Chemically-selective detector and methods relating thereto |
KR101415725B1 (ko) * | 2008-05-21 | 2014-07-21 | 서울대학교산학협력단 | 표시 장치와 그 구동 방법 |
FR2938705B1 (fr) * | 2008-11-14 | 2011-02-25 | Trixell | Detecteur de rayonnement x a l'etat solide |
JP2012083307A (ja) * | 2010-10-14 | 2012-04-26 | Fujifilm Corp | 放射線検出装置、放射線画像撮影システム、放射線検出プログラム、及び放射線検出方法 |
FR3012934B1 (fr) | 2013-11-04 | 2017-02-24 | Trixell | Detecteur numerique possedant un generateur de lumiere permettant un effacement optique |
CN112599059B (zh) * | 2020-12-28 | 2024-04-19 | 厦门天马微电子有限公司 | 一种显示装置的电性暗点检测方法及装置 |
Citations (3)
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JPH0416087A (ja) * | 1990-05-10 | 1992-01-21 | Canon Inc | 画像読取装置 |
EP0710011A1 (fr) * | 1994-10-31 | 1996-05-01 | Eastman Kodak Company | Circuit digital de verrouillage du niveau de noir |
US5654755A (en) * | 1996-01-05 | 1997-08-05 | Xerox Corporation | System for determining a video offset from dark photosensors in an image sensor array |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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FR2636800A1 (fr) * | 1988-09-16 | 1990-03-23 | Thomson Csf | Procede de lecture de cellules photosensibles du type comportant deux diodes montees en serie avec des sens de conduction opposes |
JPH041687A (ja) | 1990-04-18 | 1992-01-07 | Fuji Photo Film Co Ltd | 湿式電子写真装置 |
FR2731569B1 (fr) * | 1995-03-07 | 1997-04-25 | Thomson Tubes Electroniques | Dispositif de recopie de tension a grande linearite |
FR2758039B1 (fr) * | 1996-12-27 | 1999-03-26 | Thomson Tubes Electroniques | Detecteur d'image a contraste ameliore |
FR2759509B1 (fr) * | 1997-02-07 | 1999-04-30 | Thomson Tubes Electroniques | Circuit integrateur a linearite amelioree |
FR2771513B1 (fr) * | 1997-11-25 | 2000-05-26 | Trixell Sas | Dispositif photosensible equipe d'un dispositif de mesure d'eclairement |
US6661929B1 (en) * | 1999-07-14 | 2003-12-09 | Hewlett-Packard Development Company, L.P. | Controlling an imaging array not having black cells using an array controller that is adapted to imaging arrays having black cells |
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1999
- 1999-12-28 FR FR9916591A patent/FR2803081B1/fr not_active Expired - Fee Related
-
2000
- 2000-12-28 WO PCT/FR2000/003716 patent/WO2001049023A1/fr active Application Filing
- 2000-12-28 JP JP2001549008A patent/JP2003529972A/ja active Pending
- 2000-12-28 US US10/149,451 patent/US6737654B2/en not_active Expired - Fee Related
- 2000-12-28 EP EP00990831A patent/EP1243131A1/fr not_active Ceased
- 2000-12-28 AU AU30296/01A patent/AU3029601A/en not_active Abandoned
- 2000-12-28 CA CA002395566A patent/CA2395566C/fr not_active Expired - Fee Related
Patent Citations (3)
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JPH0416087A (ja) * | 1990-05-10 | 1992-01-21 | Canon Inc | 画像読取装置 |
EP0710011A1 (fr) * | 1994-10-31 | 1996-05-01 | Eastman Kodak Company | Circuit digital de verrouillage du niveau de noir |
US5654755A (en) * | 1996-01-05 | 1997-08-05 | Xerox Corporation | System for determining a video offset from dark photosensors in an image sensor array |
Non-Patent Citations (1)
Title |
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PATENT ABSTRACTS OF JAPAN vol. 016, no. 170 (E - 1194) 23 April 1992 (1992-04-23) * |
Also Published As
Publication number | Publication date |
---|---|
FR2803081A1 (fr) | 2001-06-29 |
US20020190216A1 (en) | 2002-12-19 |
JP2003529972A (ja) | 2003-10-07 |
AU3029601A (en) | 2001-07-09 |
EP1243131A1 (fr) | 2002-09-25 |
CA2395566C (fr) | 2008-11-18 |
US6737654B2 (en) | 2004-05-18 |
CA2395566A1 (fr) | 2001-07-05 |
FR2803081B1 (fr) | 2002-12-06 |
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