WO2001025821A3 - Procedes d'identification et de verification - Google Patents
Procedes d'identification et de verification Download PDFInfo
- Publication number
- WO2001025821A3 WO2001025821A3 PCT/US2000/027624 US0027624W WO0125821A3 WO 2001025821 A3 WO2001025821 A3 WO 2001025821A3 US 0027624 W US0027624 W US 0027624W WO 0125821 A3 WO0125821 A3 WO 0125821A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- article
- verification
- taggants
- taggant
- identification
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00986190A EP1257815A2 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
AU22472/01A AU2247201A (en) | 1999-10-04 | 2000-10-04 | Methods for identification and verification |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15757399P | 1999-10-04 | 1999-10-04 | |
US60/157,573 | 1999-10-04 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001025821A2 WO2001025821A2 (fr) | 2001-04-12 |
WO2001025821A3 true WO2001025821A3 (fr) | 2001-06-07 |
Family
ID=22564335
Family Applications (10)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/026415 WO2001025820A2 (fr) | 1999-10-04 | 2000-09-26 | Procedes d'identification et de verification |
PCT/US2000/026461 WO2001025763A1 (fr) | 1999-10-04 | 2000-09-27 | Procede d'identification et de verification |
PCT/US2000/026784 WO2001025764A1 (fr) | 1999-10-04 | 2000-09-28 | Procedes d'identification et de verification |
PCT/US2000/027151 WO2001025765A1 (fr) | 1999-10-04 | 2000-10-03 | Procedes d'identification et de verification |
PCT/US2000/027491 WO2001025767A1 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027418 WO2001025747A2 (fr) | 1999-10-04 | 2000-10-04 | Procede d'identification et de verification |
PCT/US2000/027624 WO2001025821A2 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027423 WO2001025748A2 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027492 WO2001025768A1 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027420 WO2001025766A1 (fr) | 1999-10-04 | 2000-10-04 | Procede d'identification et de verification |
Family Applications Before (6)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/026415 WO2001025820A2 (fr) | 1999-10-04 | 2000-09-26 | Procedes d'identification et de verification |
PCT/US2000/026461 WO2001025763A1 (fr) | 1999-10-04 | 2000-09-27 | Procede d'identification et de verification |
PCT/US2000/026784 WO2001025764A1 (fr) | 1999-10-04 | 2000-09-28 | Procedes d'identification et de verification |
PCT/US2000/027151 WO2001025765A1 (fr) | 1999-10-04 | 2000-10-03 | Procedes d'identification et de verification |
PCT/US2000/027491 WO2001025767A1 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027418 WO2001025747A2 (fr) | 1999-10-04 | 2000-10-04 | Procede d'identification et de verification |
Family Applications After (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/027423 WO2001025748A2 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027492 WO2001025768A1 (fr) | 1999-10-04 | 2000-10-04 | Procedes d'identification et de verification |
PCT/US2000/027420 WO2001025766A1 (fr) | 1999-10-04 | 2000-10-04 | Procede d'identification et de verification |
Country Status (14)
Country | Link |
---|---|
EP (5) | EP1137930A1 (fr) |
JP (1) | JP2003511667A (fr) |
KR (1) | KR20010090856A (fr) |
AU (10) | AU2246801A (fr) |
BR (1) | BR0007567A (fr) |
CA (5) | CA2352357A1 (fr) |
DE (1) | DE10083295T1 (fr) |
DK (1) | DK200100797A (fr) |
ES (1) | ES2184652B1 (fr) |
IL (1) | IL143350A0 (fr) |
MX (2) | MXPA01005575A (fr) |
NO (1) | NO20012656L (fr) |
SE (1) | SE0101893L (fr) |
WO (10) | WO2001025820A2 (fr) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002068945A1 (fr) * | 2001-01-16 | 2002-09-06 | Keymaster Technologies, Inc. | Procedes d'identification et de verification |
US6909770B2 (en) | 2001-12-05 | 2005-06-21 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Methods for identification and verification using vacuum XRF system |
US6850592B2 (en) | 2002-04-12 | 2005-02-01 | Keymaster Technologies, Inc. | Methods for identification and verification using digital equivalent data system |
US7023955B2 (en) * | 2003-08-12 | 2006-04-04 | X-Ray Optical System, Inc. | X-ray fluorescence system with apertured mask for analyzing patterned surfaces |
US7767457B2 (en) * | 2004-01-20 | 2010-08-03 | Inki Mun | Method of use of taggants |
CN100433039C (zh) * | 2005-08-03 | 2008-11-12 | 正品科技(北京)有限公司 | 利用化学元素标记方法和设备及化学元素标记 |
JP2007078521A (ja) * | 2005-09-14 | 2007-03-29 | Takiron Co Ltd | 塩化ビニル樹脂成形体の識別方法及びこれに使用する塩化ビニル樹脂成形体 |
WO2007035581A2 (fr) * | 2005-09-17 | 2007-03-29 | Champion Thread Company | Procédé d’application de marqueur de textile et textile ainsi produit |
US20080255098A1 (en) | 2007-04-13 | 2008-10-16 | Robert Dunn | Compositions and Methods for Treatment of Psychiatric Disorders |
DE102008060675B4 (de) | 2008-12-08 | 2012-11-08 | Polysecure Gmbh | Verfahren zur eindeutigen Identifizierung und Authentifizierung von Produkten zum Schutz vor Plagiaten |
JP5349249B2 (ja) * | 2009-10-21 | 2013-11-20 | 株式会社森清化工 | ゴム製品の識別方法、ゴム製品、ゴム製品識別装置 |
GB201004024D0 (en) * | 2010-03-11 | 2010-04-28 | Durham Scient Crystals Ltd | Method and system for the identification and authentication of objects |
US9080987B2 (en) | 2011-05-26 | 2015-07-14 | Altria Client Services, Inc. | Oil soluble taggants |
US9244017B2 (en) | 2011-05-26 | 2016-01-26 | Altria Client Services Llc | Oil detection process and apparatus |
US10900897B2 (en) | 2012-05-29 | 2021-01-26 | Altria Client Services Llc | Oil detection process |
US9073091B2 (en) | 2013-03-15 | 2015-07-07 | Altria Client Services Inc. | On-line oil and foreign matter detection system and method |
US9097668B2 (en) | 2013-03-15 | 2015-08-04 | Altria Client Services Inc. | Menthol detection on tobacco |
CN104101697A (zh) * | 2013-04-10 | 2014-10-15 | 苏州华觉智能科技有限公司 | 检测装置 |
US10650630B2 (en) | 2014-10-31 | 2020-05-12 | Honeywell International Inc. | Authentication systems, authentication devices, and methods for authenticating a value article |
WO2016077471A1 (fr) | 2014-11-11 | 2016-05-19 | Altria Client Services Inc. | Procédé de détection d'huile sur des produits du tabac et emballages |
WO2016157185A1 (fr) * | 2015-04-02 | 2016-10-06 | Soreq Nuclear Research Center | Système et procédé permettant de lire un marquage de fluorescence aux rayons x |
CN105680936B (zh) * | 2016-03-03 | 2018-10-02 | 西安工程大学 | 一种非直视紫外光通信单次散射过程路径损耗计算方法 |
KR102204124B1 (ko) * | 2016-04-04 | 2021-01-19 | 소레크 뉴클리어 리서치 센터 | 전자 시스템의 xrf 마킹 및 xrf 마크 판독 방법 및 시스템 |
US11029267B2 (en) | 2016-04-04 | 2021-06-08 | Security Matters Ltd. | Method and a system for XRF marking and reading XRF marks of electronic systems |
EP4282925A1 (fr) | 2022-05-23 | 2023-11-29 | Kronos International, Inc. | Pigment de dioxyde de titane post-traité avec au moins un élément de sécurité |
US11879883B1 (en) * | 2022-08-25 | 2024-01-23 | Samuel Landis | Precious metal source verification by trace elements |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4251726A (en) * | 1979-02-26 | 1981-02-17 | Alvarez Luis W | Deuterium tagged articles such as explosives and method for detection thereof |
US4363965A (en) * | 1980-10-03 | 1982-12-14 | The Franklin Institute | Detection and identification method employing mossbauer isotopes |
US4476382A (en) * | 1980-10-21 | 1984-10-09 | Intex Inc. | Encoding scheme for articles |
US4767205A (en) * | 1986-01-28 | 1988-08-30 | Flow Cytometry Standards Corporation | Composition and method for hidden identification |
US5185773A (en) * | 1991-07-19 | 1993-02-09 | General Motors Corporation | Method and apparatus for nondestructive selective determination of a metal |
US5527707A (en) * | 1993-12-21 | 1996-06-18 | Kabushiki Kaisha Toshiba | Method of analyzing impurities in the surface of a semiconductor wafer |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4136778A (en) * | 1975-08-12 | 1979-01-30 | Burlington Industries, Inc. | Linen sorter |
US4445225A (en) * | 1980-10-21 | 1984-04-24 | Intex Inc. | Encoding scheme for articles |
US4485308A (en) * | 1982-04-26 | 1984-11-27 | General Electric Company | Photo detection system |
EP0139617B1 (fr) * | 1983-09-27 | 1990-09-05 | Ciba-Geigy Ag | Procédé et appareil pour apporter et fixer simultanément une substance de traitement sur une matière textile |
GB9722475D0 (en) * | 1997-10-25 | 1997-12-24 | Wahoo Trust The | Article identification means |
-
2000
- 2000-09-26 WO PCT/US2000/026415 patent/WO2001025820A2/fr active Application Filing
- 2000-09-26 AU AU22468/01A patent/AU2246801A/en not_active Abandoned
- 2000-09-27 AU AU25726/01A patent/AU2572601A/en not_active Abandoned
- 2000-09-27 WO PCT/US2000/026461 patent/WO2001025763A1/fr active Application Filing
- 2000-09-28 WO PCT/US2000/026784 patent/WO2001025764A1/fr active Application Filing
- 2000-09-28 AU AU27237/01A patent/AU2723701A/en not_active Abandoned
- 2000-10-03 EP EP00989186A patent/EP1137930A1/fr not_active Withdrawn
- 2000-10-03 WO PCT/US2000/027151 patent/WO2001025765A1/fr not_active Application Discontinuation
- 2000-10-03 MX MXPA01005575A patent/MXPA01005575A/es unknown
- 2000-10-03 JP JP2001528679A patent/JP2003511667A/ja not_active Withdrawn
- 2000-10-03 IL IL14335000A patent/IL143350A0/xx unknown
- 2000-10-03 CA CA002352357A patent/CA2352357A1/fr not_active Abandoned
- 2000-10-03 BR BR0007567-1A patent/BR0007567A/pt not_active Application Discontinuation
- 2000-10-03 AU AU25727/01A patent/AU2572701A/en not_active Abandoned
- 2000-10-03 KR KR1020017006884A patent/KR20010090856A/ko not_active Application Discontinuation
- 2000-10-03 DE DE10083295T patent/DE10083295T1/de not_active Withdrawn
- 2000-10-03 ES ES200150050A patent/ES2184652B1/es not_active Expired - Lifetime
- 2000-10-04 MX MXPA02003424A patent/MXPA02003424A/es unknown
- 2000-10-04 CA CA002386454A patent/CA2386454A1/fr not_active Abandoned
- 2000-10-04 EP EP00987963A patent/EP1218731A1/fr not_active Withdrawn
- 2000-10-04 CA CA002386402A patent/CA2386402A1/fr not_active Abandoned
- 2000-10-04 WO PCT/US2000/027491 patent/WO2001025767A1/fr active Application Filing
- 2000-10-04 WO PCT/US2000/027418 patent/WO2001025747A2/fr not_active Application Discontinuation
- 2000-10-04 AU AU24229/01A patent/AU2422901A/en not_active Abandoned
- 2000-10-04 AU AU24228/01A patent/AU2422801A/en not_active Abandoned
- 2000-10-04 EP EP00986190A patent/EP1257815A2/fr not_active Withdrawn
- 2000-10-04 CA CA002386400A patent/CA2386400A1/fr not_active Abandoned
- 2000-10-04 AU AU24227/01A patent/AU2422701A/en not_active Abandoned
- 2000-10-04 CA CA002386391A patent/CA2386391A1/fr not_active Abandoned
- 2000-10-04 EP EP00986188A patent/EP1218730A2/fr not_active Withdrawn
- 2000-10-04 AU AU22470/01A patent/AU2247001A/en not_active Abandoned
- 2000-10-04 WO PCT/US2000/027624 patent/WO2001025821A2/fr not_active Application Discontinuation
- 2000-10-04 AU AU22471/01A patent/AU2247101A/en not_active Abandoned
- 2000-10-04 AU AU22472/01A patent/AU2247201A/en not_active Abandoned
- 2000-10-04 EP EP00986189A patent/EP1224459A2/fr not_active Withdrawn
- 2000-10-04 WO PCT/US2000/027423 patent/WO2001025748A2/fr not_active Application Discontinuation
- 2000-10-04 WO PCT/US2000/027492 patent/WO2001025768A1/fr active Search and Examination
- 2000-10-04 WO PCT/US2000/027420 patent/WO2001025766A1/fr active Application Filing
-
2001
- 2001-05-18 DK DK200100797A patent/DK200100797A/da not_active Application Discontinuation
- 2001-05-30 NO NO20012656A patent/NO20012656L/no not_active Application Discontinuation
- 2001-05-30 SE SE0101893A patent/SE0101893L/ not_active Application Discontinuation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4251726A (en) * | 1979-02-26 | 1981-02-17 | Alvarez Luis W | Deuterium tagged articles such as explosives and method for detection thereof |
US4363965A (en) * | 1980-10-03 | 1982-12-14 | The Franklin Institute | Detection and identification method employing mossbauer isotopes |
US4476382A (en) * | 1980-10-21 | 1984-10-09 | Intex Inc. | Encoding scheme for articles |
US4767205A (en) * | 1986-01-28 | 1988-08-30 | Flow Cytometry Standards Corporation | Composition and method for hidden identification |
US5185773A (en) * | 1991-07-19 | 1993-02-09 | General Motors Corporation | Method and apparatus for nondestructive selective determination of a metal |
US5527707A (en) * | 1993-12-21 | 1996-06-18 | Kabushiki Kaisha Toshiba | Method of analyzing impurities in the surface of a semiconductor wafer |
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