WO2000073856A3 - Article et procede hybride de modification d'une surface - Google Patents
Article et procede hybride de modification d'une surface Download PDFInfo
- Publication number
- WO2000073856A3 WO2000073856A3 PCT/US2000/014797 US0014797W WO0073856A3 WO 2000073856 A3 WO2000073856 A3 WO 2000073856A3 US 0014797 W US0014797 W US 0014797W WO 0073856 A3 WO0073856 A3 WO 0073856A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- machining
- chemical
- electrical discharge
- discharge machining
- grooves
- Prior art date
Links
- 238000003754 machining Methods 0.000 title abstract 9
- 239000000126 substance Substances 0.000 title abstract 7
- 238000009760 electrical discharge machining Methods 0.000 title abstract 5
- 238000000034 method Methods 0.000 title abstract 2
- 230000001815 facial effect Effects 0.000 abstract 1
- 239000012467 final product Substances 0.000 abstract 1
- 238000009396 hybridization Methods 0.000 abstract 1
- 238000000059 patterning Methods 0.000 abstract 1
- 238000001259 photo etching Methods 0.000 abstract 1
- 239000000047 product Substances 0.000 abstract 1
- 238000007670 refining Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H3/00—Electrochemical machining, i.e. removing metal by passing current between an electrode and a workpiece in the presence of an electrolyte
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H9/00—Machining specially adapted for treating particular metal objects or for obtaining special effects or results on metal objects
- B23H9/008—Surface roughening or texturing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electrochemistry (AREA)
- Thermal Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- ing And Chemical Polishing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00939399A EP1145083A2 (fr) | 1999-06-01 | 2000-05-30 | Article et procede hybride de modification d'une surface |
KR1020017001315A KR20020010562A (ko) | 1999-06-01 | 2000-05-30 | 혼성 표면 변성방법과 제조품 |
JP2001500912A JP2003501687A (ja) | 1999-06-01 | 2000-05-30 | 複合表面変性法及び製品 |
CA002338346A CA2338346A1 (fr) | 1999-06-01 | 2000-05-30 | Article et procede hybride de modification d'une surface |
MXPA01000994A MXPA01000994A (es) | 1999-06-01 | 2000-05-30 | Proceso de modificaciones de superficie hibrida y articulo. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US32397999A | 1999-06-01 | 1999-06-01 | |
US09/323,979 | 1999-06-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000073856A2 WO2000073856A2 (fr) | 2000-12-07 |
WO2000073856A3 true WO2000073856A3 (fr) | 2001-07-19 |
Family
ID=23261550
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/014797 WO2000073856A2 (fr) | 1999-06-01 | 2000-05-30 | Article et procede hybride de modification d'une surface |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1145083A2 (fr) |
JP (1) | JP2003501687A (fr) |
KR (1) | KR20020010562A (fr) |
CA (1) | CA2338346A1 (fr) |
MX (1) | MXPA01000994A (fr) |
WO (1) | WO2000073856A2 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102012213787A1 (de) * | 2012-08-03 | 2014-02-06 | Robert Bosch Gmbh | Oberflächenstrukturierung für zellbiologische und/oder medizinische Anwendungen |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4436584A (en) * | 1983-03-21 | 1984-03-13 | Sperry Corporation | Anisotropic plasma etching of semiconductors |
US4599243A (en) * | 1982-12-23 | 1986-07-08 | International Business Machines Corporation | Use of plasma polymerized organosilicon films in fabrication of lift-off masks |
US5342481A (en) * | 1991-02-15 | 1994-08-30 | Sony Corporation | Dry etching method |
WO1998051506A1 (fr) * | 1997-05-14 | 1998-11-19 | Seiko Epson Corporation | Procede de formation d'ajutage pour injecteurs et procede de fabrication d'une tete a jet d'encre |
US5866482A (en) * | 1996-09-27 | 1999-02-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for masking conducting layers to abate charge damage during plasma etching |
-
2000
- 2000-05-30 KR KR1020017001315A patent/KR20020010562A/ko not_active Application Discontinuation
- 2000-05-30 WO PCT/US2000/014797 patent/WO2000073856A2/fr not_active Application Discontinuation
- 2000-05-30 MX MXPA01000994A patent/MXPA01000994A/es unknown
- 2000-05-30 CA CA002338346A patent/CA2338346A1/fr not_active Abandoned
- 2000-05-30 EP EP00939399A patent/EP1145083A2/fr not_active Withdrawn
- 2000-05-30 JP JP2001500912A patent/JP2003501687A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4599243A (en) * | 1982-12-23 | 1986-07-08 | International Business Machines Corporation | Use of plasma polymerized organosilicon films in fabrication of lift-off masks |
US4436584A (en) * | 1983-03-21 | 1984-03-13 | Sperry Corporation | Anisotropic plasma etching of semiconductors |
US5342481A (en) * | 1991-02-15 | 1994-08-30 | Sony Corporation | Dry etching method |
US5866482A (en) * | 1996-09-27 | 1999-02-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for masking conducting layers to abate charge damage during plasma etching |
WO1998051506A1 (fr) * | 1997-05-14 | 1998-11-19 | Seiko Epson Corporation | Procede de formation d'ajutage pour injecteurs et procede de fabrication d'une tete a jet d'encre |
Non-Patent Citations (1)
Title |
---|
OKUYAMA ET AL.: "Micromachining with SR and FEL", NUCLEAR INSTRUMENTS AND MEHODS IN PHYSICS RESEARCH B, vol. 144, 1998, pages 58 - 65, XP004142324 * |
Also Published As
Publication number | Publication date |
---|---|
JP2003501687A (ja) | 2003-01-14 |
MXPA01000994A (es) | 2002-06-04 |
KR20020010562A (ko) | 2002-02-04 |
CA2338346A1 (fr) | 2000-12-07 |
WO2000073856A2 (fr) | 2000-12-07 |
EP1145083A2 (fr) | 2001-10-17 |
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