WO2000064629A1 - Procede et dispositif pour la surveillance optique du tranchant d'un outil - Google Patents

Procede et dispositif pour la surveillance optique du tranchant d'un outil Download PDF

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Publication number
WO2000064629A1
WO2000064629A1 PCT/DE2000/001219 DE0001219W WO0064629A1 WO 2000064629 A1 WO2000064629 A1 WO 2000064629A1 DE 0001219 W DE0001219 W DE 0001219W WO 0064629 A1 WO0064629 A1 WO 0064629A1
Authority
WO
WIPO (PCT)
Prior art keywords
tool
cutting edge
radiation
rays
optical
Prior art date
Application number
PCT/DE2000/001219
Other languages
German (de)
English (en)
Inventor
Michael Schulz
Original Assignee
Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt filed Critical Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt
Publication of WO2000064629A1 publication Critical patent/WO2000064629A1/fr

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/09—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2495—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/58—Investigating machinability by cutting tools; Investigating the cutting ability of tools

Definitions

  • the invention relates to a method for optical monitoring 5 of the cutting edge of a tool that can be used for machining and is made of a material that is transparent to optical radiation.
  • the invention further relates to an apparatus for performing the method.
  • the service life of the tool depends on numerous parameters, in particular on the ratio of the hardness of the tool to the hardness of the workpiece to be machined. Precise manufacturing requires that the tool be on its
  • the service life during which a tool with the requirements placed on the machining result can be used can be selected based on experience. However, if you want to avoid a premature tool change, there are numerous other influencing parameters that create the risk that a tool that is no longer perfect will be used at the end of the service life, which in some cases may result in the production of reject parts.
  • Monocrystalline diamond tools are used for machining aluminum, copper, various plastics and electroless nickel in particular for ultra-precision production.
  • the diamond tool becomes regular glued or soldered onto a cutting plate as a carrier.
  • the present invention is therefore based on the problem of being able to monitor the cutting edge of a tool with high accuracy without having to make complex interruptions in the machining.
  • a method of the type mentioned at the outset is characterized in that an observation beam path is coupled into the interior of the tool and directed there at the cutting edge and that radiation directed from the cutting edge into the interior of the tool due to the impinging observation beam path is directed outside the tool of the tool is detected and evaluated.
  • the present invention is based on the main idea of carrying out the monitoring of the cutting edge from inside the tool, that is to say coupling an observation beam path into the interior of the tool and detecting radiation emanating from the cutting edge through the interior of the tool.
  • the monitoring of the cutting edge is not impaired by the workpiece brought up to the cutting edge, by coolants or the like. Accordingly, monitoring is basically also possible during the machining process.
  • the monitoring is carried out using optical means if the tool is transparent to optical radiation, as is the case with a diamond tool.
  • a diamond tool with its high refractive index favors the formation of total reflection on the tool surface, so that rays that are totally reflected from the cutting edge can preferably be used as returning radiation.
  • the detection can be performed with an interferometer for the relative phase shift between the rays guided into the tool and the totally reflected rays, or with a microscope to monitor the shape of the cutting edge.
  • the method according to the invention also enables the monitoring of further parameters of the cutting edge, for example the working temperature of the cutting edge.
  • radiation with a luminescence-exciting wavelength is used as the observation beam path and luminescence radiation is detected and evaluated as returning radiation.
  • the luminescence radiation is temperature-dependent, so that it is possible in this way to keep the cutting edge of a diamond tool at an optimum temperature for processing, which must be greater than 542 ° C if silicon wafers are to be ductile machined, but 600 ° C must not exceed, as above this temperature irreversible graffiti processes in the diamond (black coating) start, which destroy the suitability of the diamond as a tool.
  • a 2-photon transition is excited for the luminescence, for example an N3-N4 transition in the case of the diamond, since in this case the luminescence radiation has defined different wavelengths than the excitation radiation and appropriate filters stray light problems can be completely eliminated.
  • a device for carrying out the method according to the invention is further characterized according to the invention by one on the Tool applied coupling device and by a detector directed over the coupling device onto the cutting edge for the detection of rays emanating from the cutting edge.
  • a prism placed on the tool is very easily suitable as a coupling device.
  • the alignment of the radiation source and detector is expediently such that the rays of the optical radiation source coincide with the returning rays, as is necessary when an interferometer is used as a detector and is expedient when a microscope is used as a detector by coupling the illumination beams accordingly.
  • Figure 1 - a schematic representation of a rotating workpiece holder and a stationary tool holder with an interferometer placed on the tool
  • Figure 2 - a schematic representation of a beam path emanating from the interferometer within the tool for monitoring the cutting edge of the tool
  • Figure 2a - a typical interferogram as recorded by the interferometer
  • Figure 3 - a schematic representation of the observation beam path for a microscope
  • FIG. 1 shows a rotary holder 1, on the end face of which a workpiece 2 is held, so that it is set in rotation with the rotary holder 1.
  • a cutting plate 5 which is designed as a substantially rectangular plate, is held on a base support 3 and by a stable, upright holding plate 4.
  • a cutting tool 6 is attached to a front edge of the cutting plate 5 and protrudes somewhat beyond the front edge of the cutting plate 5.
  • the holder 3, 4 of the cutting plate 5 or the rotary holder 1 is axially adjustable, so that the workpiece 2 can be fed relative to the cutting tool 6.
  • the cutting tool 6 is also directed to an interferometer 7 with a light guide attachment 8.
  • the interferometer 7 is connected via an electrical cable 8 to an evaluation device (not shown).
  • Figure 2 illustrates that the tool 6 in the illustrated embodiment has a rectangular contour and that a front upper edge is designed as a cutting edge 9.
  • the interferometer emits an observation beam 10, which is generated by a laser light source with a sufficient coherence length.
  • the observation beam 10 is coupled into the interior of the tool 6 with the aid of a coupling prism 11 connected to the surface of the tool 6, for example by gluing.
  • the observation beam 10 is directed onto the region of the cutting edge 9 in that the observation beam 10 is totally reflected once on a lower surface of the tool 6.
  • FIG. 3 shows an observation of the cutting edge 9 of the tool 6 with a microscope 13, which is focused on the cutting edge 9 using a total reflection.
  • the required illumination of the cutting edge 9 can take place through a coupled illumination beam path, but can also result from the normal ambient lighting.
  • FIG. 3a shows a typical microscope image for an intact cutting edge 9, a dark stripe 14 representing a streak that is bright in the microscope image, which gets frayed edges when the cutting edge 9 is worn and thus loses contour definition.
  • the coupling prism 11 serves to allow incoming or emerging rays to pass through an essentially vertical interface 11a in order to minimize interface reflections.
  • the contact surface between the coupling prism 11 and the tool 6 can be bridged in the usual way by an optical kit, so that no refractive index jumps occur between the coupling prism 11 and the tool 6.
  • the contour of the tool 6 in plan view is generally designed such that, due to a rounded front edge of the tool 6, the cutting edge 9 only penetrates the workpiece 2 over a short length.
  • the observation beam path 10 is pointed at this point of the cutting edge 9.
  • the rectangular shape in the illustration in FIGS. 2 and 3 in the side view is relevant for the beam path within the tool 6. Of course, it is possible to deviate from this rectangular shape and to adapt the beam path of the beams 10, 12 accordingly.

Landscapes

  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Abstract

L'invention concerne un procédé pour la surveillance optique du tranchant (9) d'un outil (6) utilisé pour l'usinage par enlèvement de copeaux et constitué d'un matériau transparent au rayonnement optique. L'invention vise à permettre la surveillance également pendant l'usinage. A cet effet, une trajectoire de rayons d'observation (10, 12) est injectée dans l'intérieur de l'outil (6) et y est dirigée sur le tranchant (9), puis le rayonnement partant du tranchant (9) en raison de la trajectoire de rayons d'observation incidente et dirigé vers l'intérieur de l'outil (6) est détecté et évalué à l'extérieur de l'outil (6).
PCT/DE2000/001219 1999-04-24 2000-04-18 Procede et dispositif pour la surveillance optique du tranchant d'un outil WO2000064629A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19918771.1 1999-04-24
DE1999118771 DE19918771A1 (de) 1999-04-24 1999-04-24 Verfahren und Vorrichtung zur optischen Überwachung der Schneidkante eines Werkzeugs

Publications (1)

Publication Number Publication Date
WO2000064629A1 true WO2000064629A1 (fr) 2000-11-02

Family

ID=7905813

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2000/001219 WO2000064629A1 (fr) 1999-04-24 2000-04-18 Procede et dispositif pour la surveillance optique du tranchant d'un outil

Country Status (2)

Country Link
DE (1) DE19918771A1 (fr)
WO (1) WO2000064629A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105738239A (zh) * 2016-02-29 2016-07-06 上海交通大学 一种用于cfrp单向层合板加工缺陷分析的试验方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009031973B4 (de) 2009-07-02 2022-10-20 Dr. Ing. H.C. F. Porsche Aktiengesellschaft Schaltsaugrohr eines Verbrennungsmotors mit einer Vorrichtung zur Einstellung der einem Verbrennungsmotor zuzuführenden Verbrennungsluft
US11484984B2 (en) * 2018-12-12 2022-11-01 Agathon AG, Maschinenfabrik Tool device and method for measuring a condition of a machining tool

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2747487A1 (de) * 1977-10-22 1979-04-26 Heyligenstaedt & Co Verfahren zur ueberwachung der werkzeugschneide sowie nc-gesteuerte drehmaschine zur durchfuehrung des verfahrens
DD270142A1 (de) * 1988-03-11 1989-07-19 Komb Pumpen Und Verdichter Veb Verfahren und vorrichtung zur kontinuierlichen erfassung des momentanverschleisses an spanwerkzeugen
DE4233035C1 (en) * 1992-10-01 1993-07-22 Daimler-Benz Aktiengesellschaft, 7000 Stuttgart, De Temperature measurement appts. for cutting tool - contains channel for thermal radiation in cutting tool, diamond covered opening, thermal camera
EP0596619A1 (fr) * 1992-11-03 1994-05-11 Crystallume Article revêtu de diamant et muni d'un indicateur d'usure
US5361308A (en) * 1992-01-10 1994-11-01 General Motors Corporation 3-D measurement of cutting tool wear
JPH10277877A (ja) * 1997-03-31 1998-10-20 Toa Medical Electronics Co Ltd 自動加工機
EP0905492A2 (fr) * 1997-09-30 1999-03-31 Sumitomo Electric Industries, Ltd. Dispositif pour mesurer sans contact la distribution d'une température

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3731171A1 (de) * 1987-09-17 1989-03-30 Gerd Prof Selbach Schartigkeitsmessgeraet

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2747487A1 (de) * 1977-10-22 1979-04-26 Heyligenstaedt & Co Verfahren zur ueberwachung der werkzeugschneide sowie nc-gesteuerte drehmaschine zur durchfuehrung des verfahrens
DD270142A1 (de) * 1988-03-11 1989-07-19 Komb Pumpen Und Verdichter Veb Verfahren und vorrichtung zur kontinuierlichen erfassung des momentanverschleisses an spanwerkzeugen
US5361308A (en) * 1992-01-10 1994-11-01 General Motors Corporation 3-D measurement of cutting tool wear
DE4233035C1 (en) * 1992-10-01 1993-07-22 Daimler-Benz Aktiengesellschaft, 7000 Stuttgart, De Temperature measurement appts. for cutting tool - contains channel for thermal radiation in cutting tool, diamond covered opening, thermal camera
EP0596619A1 (fr) * 1992-11-03 1994-05-11 Crystallume Article revêtu de diamant et muni d'un indicateur d'usure
JPH10277877A (ja) * 1997-03-31 1998-10-20 Toa Medical Electronics Co Ltd 自動加工機
EP0905492A2 (fr) * 1997-09-30 1999-03-31 Sumitomo Electric Industries, Ltd. Dispositif pour mesurer sans contact la distribution d'une température

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KHANOV V A: "USE OF LASER INTERFEROMETERS AS GAGING TRANSDUCERS IN MACHINE TOOLS", SOVIET ENGINEERING RESEARCH. (STANKI I INSTRUMENTY & VESTNIK MASHINOSTROENIA MASHINOSTROCNIE),US,ALLERTON PRESS, NEW YORK, vol. 10, no. 1, 1990, pages 120 - 123, XP000204631 *
PATENT ABSTRACTS OF JAPAN vol. 1999, no. 01 29 January 1999 (1999-01-29) *
WRIGHT P K: "TRANSPARENT SAPPHIRE TOOLS", JOURNAL OF MANUFACTURING SYSTEMS,US,SOCIETY OF MANUFACTURING ENGINEERS, DEARBORN, MI, vol. 9, no. 4, 1990, pages 292 - 302, XP000170846, ISSN: 0278-6125 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105738239A (zh) * 2016-02-29 2016-07-06 上海交通大学 一种用于cfrp单向层合板加工缺陷分析的试验方法
CN105738239B (zh) * 2016-02-29 2018-09-14 上海交通大学 一种用于cfrp单向层合板加工缺陷分析的试验方法

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Publication number Publication date
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