WO2000063728A1 - Filtre d'interference a bande de transmission double - Google Patents
Filtre d'interference a bande de transmission double Download PDFInfo
- Publication number
- WO2000063728A1 WO2000063728A1 PCT/US2000/010072 US0010072W WO0063728A1 WO 2000063728 A1 WO2000063728 A1 WO 2000063728A1 US 0010072 W US0010072 W US 0010072W WO 0063728 A1 WO0063728 A1 WO 0063728A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- dielectric layers
- wavelength
- refractive index
- optical filter
- accordance
- Prior art date
Links
- 230000005540 biological transmission Effects 0.000 title abstract description 46
- 230000009977 dual effect Effects 0.000 title description 5
- 230000003287 optical effect Effects 0.000 claims abstract description 51
- 239000000463 material Substances 0.000 claims description 24
- 238000000411 transmission spectrum Methods 0.000 claims description 17
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 16
- 125000006850 spacer group Chemical group 0.000 claims description 10
- 229910052681 coesite Inorganic materials 0.000 claims description 8
- 229910052906 cristobalite Inorganic materials 0.000 claims description 8
- 239000000377 silicon dioxide Substances 0.000 claims description 8
- 229910052682 stishovite Inorganic materials 0.000 claims description 8
- 229910052905 tridymite Inorganic materials 0.000 claims description 8
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 4
- 238000004891 communication Methods 0.000 abstract description 4
- 238000000151 deposition Methods 0.000 description 6
- 239000002131 composite material Substances 0.000 description 4
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 229910052691 Erbium Inorganic materials 0.000 description 3
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 3
- 239000000835 fiber Substances 0.000 description 3
- 238000001914 filtration Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052863 mullite Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/281—Interference filters designed for the infrared light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
- G02B5/288—Interference filters comprising deposited thin solid films comprising at least one thin film resonant cavity, e.g. in bandpass filters
Definitions
- the present invention relates generally to optical interference filters and more particularly to a dual band optical interference filter capable of transmitting optical channels within a first and second passbands.
- Optical interference filters rely on principles of interference that modify the intensities of the reflected light incident on a surface.
- a familiar example of interference is the colors created when light reflects from a thin layer of oil floating on water.
- reflectivity of the substance can be significantly altered. This principle is used in the fabrication of optical interference filters. These filters can be used as one of, or as the main filtering element in optical add/drop multiplexers employed in optical communication systems to select one or more channels from a transmission signal.
- an optical interference filter includes a cavity which is comprised of two partial reflectors (or mirrors) separated by a spacer. The number of spacers determines the number of cavities of the filter.
- Each partial reflector also referred to as a quarter-wave stack, is typically constructed by depositing alternating layers of high and low refractive index dielectric materials upon a substrate where each layer has an optical thickness (defined as: physical thickness x refractive index) of a quarter wave ( ⁇ /4) (or odd multiple of a quarter wave) at the desired wavelength ⁇ 0 of the
- Exemplary high and low refractive index dielectric materials are TiO 2 , Ta 2 O 5 and SiO 2 , respectively.
- the spacer is typically a half-wave (or multiple half-wave) layer of low refractive index material (e.g., SiO 2 ).
- An interference filter has an associated transmission characteristic which is a function of the reflectance of the layers of high and low index materials associated with the stack.
- optical interference filters are constructed using multiple cavities. Typically, cavities are deposited on top of other cavities, with a quarter-wave layer of low index material therebetween.
- Multicavity filters produce transmission spectra that are preferred in optical communication systems where steep slopes and square passbands are needed to select one or more optical channels. The larger the number of cavities employed, the steeper the slope of the transmission bandwidth associated with a particular filter. The transmission bandwidth of a multicavity filter is wider as compared with the transmission bandwidth associated with a single cavity filter.
- FIG. 1 illustrates an exemplary transmission spectrum for a mirror comprising a plurality of high/low refractive index dielectric layers. The mirror exhibits high
- FIG. 2 is an exemplary transmission spectrum for a single cavity optical interference filter utilizing a pair of stacks each having the transmission spectrum shown in Fig. 1. As can be seen in FIG.2 the transmission response is acceptable at wavelength
- the single cavity interference filter produces high transmittance at wavelengths referenced at points A and B, but also produces relatively low transmittance
- transmission at a first wavelength ⁇ 0 may be reliable while
- FIG. 2 demonstrates that interference filters typically provide a single reliable transmission band.
- optical systems can utilize one or more interference filters to select particular channels from a transmission signal.
- a first filter may be used to select a pay-load channel associated with voice and/or data transmission in the 1.5 ⁇ m range and a second filter is used to select a service channel in the 1.3 ⁇ m or 1.6 ⁇ m range which carries system level and/or network monitoring information.
- the use of two separate filters has several disadvantages. First, it increases overall system cost since it requires the manufacture and installation of two individual components. Secondly, optical networks typically have a predetermined loss budget, if exceeded, can compromise signal integrity. Each component, in this case an optical filter, contributes some loss to the overall network.
- each filter negatively impacts a network's loss budget.
- a filtering element used with optical communication systems capable of selecting a first and a second optical passbands.
- Fig. 1 illustrates a transmission spectrum of a conventional mirror including a plurality of dielectric layers
- Fig. 2 illustrates a transmission spectrum of a single cavity filter including conventional mirrors
- Fig. 3(a) illustrates a single-cavity interference filter consistent with the present invention
- Fig. 3(b) illustrates a dual-cavity interference filter consistent with the present invention
- Fig. 3(c) illustrates a three cavity interference filter consistent with the present invention
- Fig. 4 illustrates a transmission characteristic of an exemplary triple cavity interference filter having a narrow transmission band at a wavelength around 1550 nm and a broad transmission band at a wavelength around 1310 nm;
- Fig. 5 illustrates schematically a mirror having q dielectric layers of alternating high and low refractive indices
- Fig. 6 illustrates a transmission characteristic associated with the mirror shown in
- Fig. 7 illustrates the refractive index of each of the layers of an exemplary mirror utilizing the structure described in Fig. 5;
- Fig. 8 illustrates a transmission characteristic of a three cavity filter consistent with the present invention
- Fig. 9 a composite dielectric layer consistent with an aspect of the present invention
- Figs. 10(a) and 10(b) illustrate a transmission characteristic and structure, respectively, of a two-material mirror consistent with an aspect of the present invention
- Fig. 11 illustrates a transmission characteristic of a three-cavity filter using the mirror shown in Fig. 10(b).
- the interference filter in accordance with the present invention transmits a narrow
- n H ( ⁇ and n L ( ⁇ i) are high and low refractive indices at ⁇ i; r is the absolute value
- Equations (1) and (2) are the magnitude Fresnel reflection coefficient for the boundary between the high and low index layers; and q is the number of layers in the stack or mirror. Equations (1) and (2)
- Fig. 3(a) schematically describes a single- cavity interference filter in accordance with the present invention comprising a spacer 30 interposed between a first and second mirrors 25 and 26.
- Fig. 3(b) illustrates a dual cavity interference filter 40 having a coupling layer 70 interposed between a first cavity 45 and a second cavity 75.
- Coupling layer 70 can be, for example, a low index material having a quarter wave optical thickness.
- First cavity 45 includes mirrors 50 and 60 separated by spacer 55.
- Second cavity 75 includes mirrors 80 and 90 separated by spacer 85.
- Fig. 3(b) schematically describes a single- cavity interference filter in accordance with the present invention comprising a spacer 30 interposed between a first and second mirrors 25 and 26.
- Fig. 3(b) illustrates a dual cavity interference filter 40 having a coupling layer 70 interposed between a first cavity 45 and a second cavity 75.
- Coupling layer 70 can be, for example, a low index material having a quarter
- FIG. 3(c) illustrates a triple cavity interference filter 100 having a first cavity 105, a second cavity 110 and a third cavity 115.
- First coupling layer 106 is positioned between first cavity 105 and second cavity 110.
- Second coupling layer 117 is positioned between second cavity 110 and third cavity 115.
- First cavity 105 comprises mirrors 102 and 103 separated by spacer 104.
- Second cavity 110 includes mirrors 111 and 113 separated by spacer 112.
- Third cavity 115 includes mirrors 118 and 120 separated by spacer 119.
- Fig. 4 illustrates a transmission characteristic of an exemplary triple cavity
- the interference filter described above has the properties which allow it to
- this embodiment transmits the bands for a
- Fig. 1 can be broadened by collapsing the adjacent transmission peaks A and B and eliminating low transmission point C. This is achieved by depositing a dielectric
- Fig 5 illustrates a mirror having q dielectric layers of alternating high (H) and low (L) refractive indices.
- the third layer and the q-2 layer have
- FIG. 6 illustrates a transmission characteristic associated with this mirror structure resulting in a broader transmission
- Layers 3 and 15 may be deposited either by a properly ratioed co-deposition of high and low index materials, or by depositing materials having a refractive index of 1.58 (e.g., mullite, which is a mixture of 76-80% of Al 2 O 3 and 20-24% of SiO 2 ).
- FIG. 8 A three cavity interference filter having the structure described with reference to Fig. 3(c) where each mirror (102, 103, 111, 113, 118 and 120) is formed using the structure described in Figs. 5-7.
- a transmission characteristic associated with this three cavity filter is shown in Fig. 8. As can be seen, the 1 lOnm broad transmission band
- the interference filter described above calls for the deposition of a third material having an intermediate refractive index value in the range of 1.55-1.58 with respect to the high and low refractive index materials forming each mirror.
- the introduction of this third material into the deposition process is less desirable from a manufacturing perspective.
- the third material having an intermediate refractive index used to form layers 3 and q-2 (e.g. layers 3 and 15 referenced in Fig. 7) of an exemplary mirror can be formed by a symmetrical composite consisting of a layer of high index material
- clad by a pair of low index material layers e.g., SiO 2 , ⁇ ⁇ 1.444
- This composite material has an optical thickness of one
- the optical thicknesses 5 L of the low index material can be calculated as follows:
- the resulting structure has an optical thickness of one quarter wave at ⁇ 0 and allows the
- Figs. 10(a) and 10(b) show a transmission characteristic and the structure, respectively, of the two-material mirror with essentially identical characteristics to a three
- Fig. 11 illustrates a transmission characteristic of a three cavity filter using the two-material mirror structure described above.
- the third layer shown in Fig. 10b can be eliminated and the optical thickness of both the second and fourth layers can be increased to have an optical thickness of 1.5 times a quarter wavelength to form a single continuous layer having an optical thickness of % a quarter wavelength.
- the q-2 layer can be eliminated and the optical thickness of the q-1 and q-3 layers can be increased to have an optical thickness of 1.5 times a quarter wavelength to form a single continuous layer also having an optical thickness of 3 ⁇ a quarter wavelength.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Optical Filters (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00926004A EP1088248A1 (fr) | 1999-04-20 | 2000-04-17 | Filtre d'interference a bande de transmission double |
CA002337223A CA2337223A1 (fr) | 1999-04-20 | 2000-04-17 | Filtre d'interference a bande de transmission double |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13021299P | 1999-04-20 | 1999-04-20 | |
US60/130,212 | 1999-04-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000063728A1 true WO2000063728A1 (fr) | 2000-10-26 |
WO2000063728A9 WO2000063728A9 (fr) | 2002-06-13 |
Family
ID=22443600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/010072 WO2000063728A1 (fr) | 1999-04-20 | 2000-04-17 | Filtre d'interference a bande de transmission double |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1088248A1 (fr) |
CA (1) | CA2337223A1 (fr) |
WO (1) | WO2000063728A1 (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002059658A2 (fr) * | 2001-01-26 | 2002-08-01 | Ciena Corporation | Filtre optique a canaux multiples |
US6618199B2 (en) | 2001-06-05 | 2003-09-09 | Axsun Technologies, Inc. | Dual-band fabry-perot mirror coating |
EP3407104A1 (fr) * | 2017-05-22 | 2018-11-28 | Viavi Solutions Inc. | Filtre multispectral |
US10277352B2 (en) | 2016-05-24 | 2019-04-30 | Ciena Corporation | Noise suppression and amplification systems and methods for colorless optical add/drop devices |
EP3605166A3 (fr) * | 2018-07-30 | 2020-04-15 | Viavi Solutions Inc. | Filtre multispectral |
CN115226045A (zh) * | 2022-09-19 | 2022-10-21 | 四川创智联恒科技有限公司 | 一种在6g网路中区分ris信号的方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4373782A (en) * | 1980-06-03 | 1983-02-15 | Optical Coating Laboratory, Inc. | Non-polarizing thin film edge filter |
US4747666A (en) * | 1985-06-25 | 1988-05-31 | Horiba, Ltd. | Multi-layer interference filter |
US4958892A (en) * | 1988-10-18 | 1990-09-25 | Physical Optics Corporation | Diffraction coherence filter |
FR2658619A1 (fr) * | 1990-02-19 | 1991-08-23 | Megademini Taoufik | Miroirs interferentiels multifractals de dimensions fractales entre 0 et 1. |
US5410431A (en) * | 1993-06-01 | 1995-04-25 | Rockwell International Corporation | Multi-line narrowband-pass filters |
US5719989A (en) * | 1995-06-28 | 1998-02-17 | Jds Fitel Inc. | Multilayer thin film bandpass filter |
US6011652A (en) * | 1997-12-23 | 2000-01-04 | Cushing; David Henry | Multilayer thin film dielectric bandpass filter |
-
2000
- 2000-04-17 EP EP00926004A patent/EP1088248A1/fr not_active Withdrawn
- 2000-04-17 CA CA002337223A patent/CA2337223A1/fr not_active Abandoned
- 2000-04-17 WO PCT/US2000/010072 patent/WO2000063728A1/fr not_active Application Discontinuation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4373782A (en) * | 1980-06-03 | 1983-02-15 | Optical Coating Laboratory, Inc. | Non-polarizing thin film edge filter |
US4747666A (en) * | 1985-06-25 | 1988-05-31 | Horiba, Ltd. | Multi-layer interference filter |
US4958892A (en) * | 1988-10-18 | 1990-09-25 | Physical Optics Corporation | Diffraction coherence filter |
FR2658619A1 (fr) * | 1990-02-19 | 1991-08-23 | Megademini Taoufik | Miroirs interferentiels multifractals de dimensions fractales entre 0 et 1. |
US5410431A (en) * | 1993-06-01 | 1995-04-25 | Rockwell International Corporation | Multi-line narrowband-pass filters |
US5719989A (en) * | 1995-06-28 | 1998-02-17 | Jds Fitel Inc. | Multilayer thin film bandpass filter |
US6011652A (en) * | 1997-12-23 | 2000-01-04 | Cushing; David Henry | Multilayer thin film dielectric bandpass filter |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002059658A3 (fr) * | 2001-01-26 | 2004-02-26 | Ciena Corp | Filtre optique a canaux multiples |
US6844977B2 (en) | 2001-01-26 | 2005-01-18 | Ciena Corporation | Multi-channel optical filter |
US7184215B2 (en) | 2001-01-26 | 2007-02-27 | Ciena Corporation | Multi-channel optical filter |
WO2002059658A2 (fr) * | 2001-01-26 | 2002-08-01 | Ciena Corporation | Filtre optique a canaux multiples |
US6618199B2 (en) | 2001-06-05 | 2003-09-09 | Axsun Technologies, Inc. | Dual-band fabry-perot mirror coating |
US10277352B2 (en) | 2016-05-24 | 2019-04-30 | Ciena Corporation | Noise suppression and amplification systems and methods for colorless optical add/drop devices |
KR20180127931A (ko) * | 2017-05-22 | 2018-11-30 | 비아비 솔루션즈 아이엔씨. | 다중스펙트럼 필터 |
KR102602452B1 (ko) * | 2017-05-22 | 2023-11-15 | 비아비 솔루션즈 아이엔씨. | 다중스펙트럼 필터 |
EP3407104A1 (fr) * | 2017-05-22 | 2018-11-28 | Viavi Solutions Inc. | Filtre multispectral |
US10782460B2 (en) | 2017-05-22 | 2020-09-22 | Viavi Solutions Inc. | Multispectral filter |
KR102299519B1 (ko) * | 2017-05-22 | 2021-09-07 | 비아비 솔루션즈 아이엔씨. | 다중스펙트럼 필터 |
KR20210111222A (ko) * | 2017-05-22 | 2021-09-10 | 비아비 솔루션즈 아이엔씨. | 다중스펙트럼 필터 |
US11880054B2 (en) | 2017-05-22 | 2024-01-23 | Viavi Solutions Inc. | Multispectral filter |
TWI744528B (zh) | 2017-05-22 | 2021-11-01 | 美商菲爾薇解析公司 | 多頻譜濾光片 |
CN114137646A (zh) * | 2017-05-22 | 2022-03-04 | 唯亚威通讯技术有限公司 | 多光谱滤光器 |
EP3605166A3 (fr) * | 2018-07-30 | 2020-04-15 | Viavi Solutions Inc. | Filtre multispectral |
US11143803B2 (en) | 2018-07-30 | 2021-10-12 | Viavi Solutions Inc. | Multispectral filter |
CN115226045B (zh) * | 2022-09-19 | 2022-12-02 | 四川创智联恒科技有限公司 | 一种在6g网路中区分ris信号的方法 |
CN115226045A (zh) * | 2022-09-19 | 2022-10-21 | 四川创智联恒科技有限公司 | 一种在6g网路中区分ris信号的方法 |
Also Published As
Publication number | Publication date |
---|---|
CA2337223A1 (fr) | 2000-10-26 |
WO2000063728A9 (fr) | 2002-06-13 |
EP1088248A1 (fr) | 2001-04-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6407863B1 (en) | Dual transmission band interference filter | |
EP0966696B1 (fr) | Filtre optique interférentiel | |
US7006292B2 (en) | Multi-cavity optical filter | |
CA2220291C (fr) | Filtre passe-bande dielectrique a mince film multicouche | |
CA2254679C (fr) | Filtre passe-bande dielectrique a couches minces multiples | |
JP3844886B2 (ja) | 光フィルタの製造方法 | |
US7019906B2 (en) | Indium-tin oxide thin film filter for dense wavelength division multiplexing | |
US6768590B2 (en) | Method of fabricating optical filters | |
EP1258745A2 (fr) | Filtre optique | |
US7333266B2 (en) | CWDM filter | |
US6600604B2 (en) | Athermal thin film filter | |
EP1088248A1 (fr) | Filtre d'interference a bande de transmission double | |
US7355792B2 (en) | CWDM filter for eliminating noise | |
US7315420B2 (en) | CWDM filter with four channels | |
US6844977B2 (en) | Multi-channel optical filter | |
WO2003042730A1 (fr) | Filtres d'interference optiques en film mince independants de la polarisation | |
US7580188B2 (en) | CWDM filter | |
JP4071996B2 (ja) | 光学薄膜フィルタ | |
US20060147212A1 (en) | Optical filter, an optical interleaver and associated methods of manufacture | |
JP2005114812A (ja) | 複合誘電体多層膜フィルタ | |
JP2005266039A (ja) | 光学バンドパスフィルタ | |
AU2004256148A1 (en) | An optical filter, an optical interleaver and associated methods of manufacture | |
JP2001305338A (ja) | 光分散補償素子 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): CA JP MX |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
ENP | Entry into the national phase |
Ref document number: 2337223 Country of ref document: CA |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2000926004 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 2000926004 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 09937262 Country of ref document: US |
|
AK | Designated states |
Kind code of ref document: C2 Designated state(s): CA JP MX |
|
AL | Designated countries for regional patents |
Kind code of ref document: C2 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE |
|
COP | Corrected version of pamphlet |
Free format text: PAGES 1/9-9/9, DRAWINGS, REPLACED BY NEW PAGES 1/9-9/9; DUE TO LATE TRANSMITTAL BY THE RECEIVING OFFICE |
|
NENP | Non-entry into the national phase |
Ref country code: JP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 2000926004 Country of ref document: EP |