WO2000003301A2 - Exposure device having a planar motor - Google Patents
Exposure device having a planar motor Download PDFInfo
- Publication number
- WO2000003301A2 WO2000003301A2 PCT/US1999/015278 US9915278W WO0003301A2 WO 2000003301 A2 WO2000003301 A2 WO 2000003301A2 US 9915278 W US9915278 W US 9915278W WO 0003301 A2 WO0003301 A2 WO 0003301A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- planar motor
- vacuum chamber
- fluid
- armature coils
- motor device
- Prior art date
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02K—DYNAMO-ELECTRIC MACHINES
- H02K41/00—Propulsion systems in which a rigid body is moved along a path due to dynamo-electric interaction between the body and a magnetic field travelling along the path
- H02K41/02—Linear motors; Sectional motors
- H02K41/03—Synchronous motors; Motors moving step by step; Reluctance motors
- H02K41/031—Synchronous motors; Motors moving step by step; Reluctance motors of the permanent magnet type
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02K—DYNAMO-ELECTRIC MACHINES
- H02K2201/00—Specific aspects not provided for in the other groups of this subclass relating to the magnetic circuits
- H02K2201/18—Machines moving with multiple degrees of freedom
Definitions
- the present invention relates to an exposure device having a planar motor and, more specifically, to a planar motor for driving a movable member including a magnet unit two-dimensionally by electromagnetic force and an exposure device using the planar motor to drive a substrate stage device.
- an exposure device which transfers, by means of a projection optical system, a pattern formed in a mask or reticle (hereinafter generally referred to as "reticle") to a substrate such as a wafer or glass plate to which resist or the like is applied.
- reticle a pattern formed in a mask or reticle
- the wafer In the exposure device, the wafer must be accurately positioned at the exposure position. Accordingly, the wafer is held on a wafer holder by vacuum attraction or the like, and the wafer holder is secured to a wafer table. To perform the positioning of the wafer more quickly without being affected by the accuracy of the mechanical guide surface, etc, and to avoid mechanical friction to attain a longer service life, a stage device has recently been developed in which a table on which the wafer is placed is driven two-dimensionally in a non-contact manner to position the wafer. As the drive source for such a non- contact drive stage device, a planar motor is known in which two axes of variable magnetic resistance drive type linear pulse motors are connected together.
- variable magnetic resistance drive type linear pulse motor comprises a stator, formed, for example, by a plate-like magnetic body having teeth consisting of protrusions and recesses formed longitudinally at equal intervals, and a movable member in which a plurality of armature coils, having protrusions and recesses opposed to the teeth of the stator and having a different phase than that of the teeth, are connected through a permanent magnet.
- the movable member is driven. That is, by adjusting and controlling the current value and phase of the pulse current supplied to each armature coil, the movable member is operated stepwise.
- variable magnetic resistance drive type planar motor in precise positioning to realize high-speed positioning, it is necessary to obtain a large driving force.
- a second object of the present invention is to provide an exposure device capable of high-accuracy exposure while maintaining high throughput.
- heat is mainly transmitted by heat transfer, heat conduction and heat radiation, all of which vary by the difference in temperature between the objects.
- Heat transfer is transmission of heat due to molecular oscillation caused by heat or movement of electrons having energy
- heat conduction is transmission of heat due to convection between solid surface and fluid.
- a medium for heat is necessary, and they can hardly occur in vacuum.
- heat radiation is transmission of heat due to electromagnetic waves emitted from an object, so that it can occur in vacuum in which no medium for heat exists.
- the quantity of heat transmitted is relatively small as compared with heat transfer and heat conduction.
- a first planar motor device comprises: a magnet unit (52, 53) having at least one magnet (54a to 54d) and adapted to move two- dimensionally along a predetermined movement surface (21a); a base (21 ) having the movement surface on the side opposite to the magnet unit and including a vacuum chamber (41 ) capable of maintaining a vacuum state in its interior; and a plurality of armature coils (38) arranged two-dimensionally in the vacuum chamber along the movement surface so as to define a predetermined gap between them and a first wall (36) on the side of the movement surface forming the vacuum chamber.
- the magnet unit when electric current is supplied to the armature coils opposite to the magnet of the magnet unit, the magnet unit is driven along the movement surface by electromagnetic force.
- electric current is supplied to the armature coils opposite to the magnet for each movement position of the magnet unit, whereby each armature coil supplied with electric current generates heat.
- the armature coils are accommodated in the vacuum chamber in the base, and arranged two-dimensionally along the movement surface in the vacuum chamber so as to define a predetermined gap between them and the first wall on the side of the movement surface forming the vacuum chamber.
- a deformation preventing member (39) for preventing deformation of the base due to the vacuum state between the first wall (36) forming the vacuum chamber (41 ) and a second wall (43) opposite to the first wall (36).
- the heat generated by the armature coils is transmitted through the second wall and the deformation preventing member to the first wall side, that is, the movement surface side.
- the base (21 ) further have on the side opposite to the movement surface of the vacuum chamber (41 ) a fluid passage (65a, 66, 42, 66, 65b) which is in contact with the vacuum chamber via the second wall (43).
- a fluid passage (65a, 66, 42, 66, 65b) which is in contact with the vacuum chamber via the second wall (43).
- heat exchange is effected between the fluid in the fluid passage and the second wall, and the armature coils are cooled starting from the second wall side (the side opposite to the movement surface).
- a temperature control device (79) for controlling the temperature of the fluid flowing through the fluid passage. It is only necessary for this temperature control device to control the temperature of the fluid to a temperature at least lower than the temperature of the second wall when the armature coils generate heat.
- the fluid may be controlled to a temperature lower than the ambient temperature of the base. In this case, it is possible to efficiently cool the armature coils starting from the side opposite to the movement surface.
- a second planar motor device comprises a magnet unit (52, 53) having at least one magnet (54a to 54d) and adapted to move two-dimensionally along a predetermined movement surface (21a); a base (21 ) having the movement surface on the side opposite to the magnet unit and including a vacuum chamber (41 ) capable of maintaining a vacuum state in its interior and a fluid passage situated on the movement surface side of the vacuum chamber; and a plurality of armature coils (38) arranged two- dimensionally in the vacuum chamber at predetermined intervals along the movement surface.
- the magnet unit is driven along the movement surface by electromagnetic force.
- the magnet unit When the magnet unit is continued to be driven in a certain direction, electric current is supplied to the armature coils for each movement position of the magnet unit, whereby each armature coil supplied with electric current generates heat.
- the armature coils are arranged in the vacuum chamber in the base, and a fluid passage is provided on the side of the movement surface forming the vacuum chamber.
- transmission of heat from the armature coils is almost solely by heat radiation, and the heat transmitted to the movement surface side in the vacuum chamber is removed through heat exchange with the fluid in the fluid passage.
- an exposure device for transferring a predetermined pattern to a substrate characterized in that either the first or the second planar motor device of the present invention is used in the substrate stage device for driving the substrate.
- planar motor device of the present invention is used in the substrate stage, it is possible to two-dimensionally drive the substrate in a non- contact state by electromagnetic force. Further, since it is possible to effectively reduce the influence of heat on the substrate due to the heat generation of the armature coils, it is possible to restrain air fluctuation, etc. of the interferometer beam for measuring the substrate position. Thus, it is possible to control the position of the substrate at high speed and with high accuracy, with the result that it is possible to effect exposure at high exposure accuracy while improving the throughput.
- FIG. 1 is a schematic diagram showing the construction of an exposure device according to a first embodiment
- Fig. 2 is a plan view showing the substrate stage device shown in Fig. 1 ;
- Fig. 3 is a sectional view taken along line A-A of Fig. 2;
- Fig. 4(A) is a perspective view showing the movable member of the planar motor constituting the substrate stage device of Fig. 1 ;
- Fig. 4(B) is an exploded perspective view of the movable member shown in Fig. 4(A);
- Fig. 5 is a base main body sectional view illustrating a modification of the column constituting the base main body
- Fig. 6 is a base main body sectional view illustrating another modification of the column constituting the base main body
- Fig. 7 is a base main body sectional view illustrating another modification of the base main body
- Fig. 8(A) is a sectional view of the base main body of the second embodiment
- Fig. 8(B) is a diagram showing the flow of liquid refrigerant in a refrigerant passage on the vacuum chamber upper portion side.
- FIG. 1 is a schematic diagram showing the general construction of an exposure device according to an embodiment.
- This exposure device 100 is a scanning type exposure device of the so-called step- and-scan exposure system.
- the exposure device 100 comprises an illumination system 10, a reticle stage RST for holding a reticle (mask) R, a projection optical system PL, a substrate stage device 30 for driving a wafer W serving as the substrate two- dimensionally in the X- and Y-directions, and a control system for these components.
- the illumination system 10 comprises a light source unit, a shutter, a secondary light source forming optical system, a beam splitter, a condenser lens, a reticle blind, and an image formation lens system (none of which is shown), and emits an exposure illumination light having a substantially uniform luminance distribution toward mirror M of Fig. 1.
- the optical path of the illumination light is bent by the mirror M to become vertical, and the light illuminates a rectangular (or arcuate) illumination area IAR on the reticle R with a uniform luminance.
- the reticle R is secured to the reticle stage RST by, for example, vacuum attraction.
- the reticle stage RST can be driven on a reticle base (not shown) by a reticle drive section (not shown) formed by a linear motor or the like in a predetermined scanning direction (in this example, in the Y-axis direction) at a predetermined scanning speed.
- a movement mirror 15 reflecting a laser beam from a reticle laser interferometer (hereinafter referred to as "reticle interferometer") 16 is secured to the reticle stage RST, and the position of the reticle stage RST in the movement surface is constantly detected by the reticle interferometer 16 with a resolution, for example, of approximately 0.5 to 1 nm.
- Positional information of the reticle stage RST from the reticle interferometer 16 is transmitted to a stage control system 19 and to a main control device 20 through it.
- the stage control system 19 drives the reticle stage RST through a reticle drive section (not shown) in response to a command from the main control device 20 and on the basis of the positional information of the reticle stage RST.
- the projection optical system PL is arranged below the reticle stage RST in Fig. 1 , and its optical axis AX (which coincides with the optical axis IX of the illumination optical system) is in the Z-direction.
- a refractive optical system is used which is composed of a plurality of lens elements arranged at predetermined intervals along the optical axis AX so as to realize a both-side telecentric optical arrangement.
- This projection optical system PL is a reduction optical system having a predetermined projection scaling of, for example, 1/5 (or 1/4).
- a reduced image (partial inverted image) of the circuit pattern in the illumination area IAR of the reticle R is formed through the projection optical system PL in the exposure area IA conjugate with respect to the illumination area IAR on the wafer W to the surface of which photoresist is applied.
- the substrate stage device 30 comprises a base 21 , a substrate table 18 float-supported above the upper surface of the base via a clearance of approximately several ⁇ m by an air slider described below, and a driving device 50 for driving the substrate table 18 two-dimensionally in the XY-plane.
- a planar motor is used which comprises a stator 60 provided (embedded) in the upper portion of the base 21 and a movable member 51 secured to the bottom portion (the side opposite to the base).
- a planar motor device is formed by the movable member 51 , the base 21 , and the driving device 50.
- the driving device will be referred to as the planar motor 50 for the sake of convenience.
- the wafer W is secured to the substrate table 18 by, for example, vacuum attraction. Further, a movement mirror 27 reflecting a laser beam from a wafer laser interferometer (hereinafter referred to as "wafer interferometer") 31 is secured to the substrate table 18, and the position of the substrate table 18 in the XY-plane is constantly detected with a resolution of, for example, approximately 0.5 to 1 nm by the wafer interferometer 31 arranged outside. In reality, as shown in Fig.
- a movement mirror 27Y having a reflection surface perpendicular to the Y-axis direction which is the scanning direction
- a movement mirror 27X having a reflection surface perpendicular to the X-axis direction which is the non-scanning direction
- the wafer interferometer 31 has one axis in the scanning direction and two axes in the non-scanning direction. In Fig. 1 , they are simply shown as the movement mirror 27 and the wafer interferometer 31.
- Positional information (or velocity information) of the substrate table 18 is transmitted to a stage control system 19, and, through this to a main control device 20.
- the stage control system 19 controls the movement of the substrate table 18 in the XY-plane through the planar motor 50 in response to a command from the main control device 20 and on the basis of the positional information (or velocity information).
- Fig. 2 is a plan view of the substrate stage device 30, and Fig. 3 is a partially omitted enlarged sectional view taken along the line A-A of Fig. 2.
- the substrate table 18 is supported by the upper surface (the surface on the opposite side of the surface opposed to the base 21 ) of the movable member 51 at three different points by support mechanisms 32a, 32b and 32c including a voice coil motor, making it possible to effect inclination with respect to the XY-surface and driving in the Z-axis direction.
- support mechanisms 32a through 32c are actually independently driven and controlled by the stage control system 19 of Fig. 1 through a drive mechanism (not shown).
- the movable member 51 comprises an air slider 57 serving as a kind of air static pressure bearing device which is in the form of four squares in plan view, a flat magnetism generator 53 a part of which is engaged from above with the air slider 57 into an integral unit, and a magnetic member 52 engaged from above with the flat magnetism generator 53.
- the magnetic member 52 and the flat magnetism generator 53 constitute the magnet unit.
- the substrate table 18 is provided on the upper surface of the magnetic member 52 via the support mechanisms 32a through 32c. In the interior of the air slider 57, there are formed a supply passage for pressurized air, a passage for vacuum, etc.
- the supply passage for pressurized air is connected to an air pump 59 (See Fig. 1 ) through a tube 33, and the passage for vacuum is connected to a vacuum pump (not shown) through a tube 34.
- a vacuum pump not shown
- the thickness of the air layer is maintained at a desired value by balancing between a downward force corresponding to the sum total of the weight of the movable member 51 , the substrate table 18, etc., the magnetic attraction force of the flat magnetism generator 53 and a stator yoke 43 described below forming the magnet unit, and the vacuum attraction force (pressurizing force) by the vacuum pump (not shown), and an upward force due to the pressure of the pressurized air supplied from the air pump 59 and blown upward toward the upper surface of the base 21 through the air pad, that is, the static pressure of the air layer between the bottom surface of the movable member 51 and the upper surface of the base 21 (that is, the in-gap pressure).
- the air slider 57 constitutes a kind of vacuum pressurizing type air static pressure bearing, and, by this air slider 57, the movable member 51 , the substrate table 18, etc. are float-supported above the upper surface of the base 21 via a clearance of, for example, approximately 5 ⁇ m (See Figs. 1 and 3).
- the air slider 57 is provided with a supply passage for pressurized air and a passage for vacuum, and an air pad and an air pocket respectively connected to them.
- a supply passage for pressurized air and a passage for vacuum and an air pad and an air pocket respectively connected to them.
- the flat magnetism generator 53 are formed by four thrust generating magnets 54a, 54b, 54c and 54d arranged in a 2-row by 2- column matrix in order that the polarities of adjacent pole faces may be different, and interpolation magnets 55a, 55b, 55c and 55d arranged in the magnetic flux paths formed on the magnetic member 52 side by adjacent thrust generating magnets (54a, 54b), (54b, 54c), (54c, 54d), and (54d, 54a).
- the thrust generating magnets 54a through 54d consist of permanent magnets of the same thickness and the same configuration and have a square pole face. These thrust generating magnets 54a through 54d are arranged in the same plane in a 2-row by 2-column matrix such that the gaps between the thrust generating magnets adjacent in the X- and Y-directions are predetermined widths. In the thrust generating magnets 54a and 54b and the thrust generating magnets 54c and 54d, which are adjacent in the X-direction, the polarities of the adjacent pole faces are opposite to each other. In the thrust generating magnets 54a and 54d and the thrust generating magnets 54b and 54c, which are adjacent in the Y-direction, the polarities of the adjacent pole faces are opposite to each other.
- the interpolation magnets 55a through 55d consist of rectangular permanent magnets of the same thickness and are arranged such that, in plan view, they fill the gaps between the adjacent thrust generating magnets (54a, 54b), (54b, 54c), (54c, 54d) and (54d, 54a) and that, in side view, they are in the imaginary plane formed by the upper surfaces of the thrust generating magnets 54a through 54d.
- These interpolation magnets 55a through 55d have pole faces perpendicular to the pole faces of the thrust generating magnets 54a through 54d, and these pole faces have a polarity opposite to that of the pole faces of the thrust generating magnets 54a through 54d adjacent thereto in plan view.
- the base 21 comprises a base main body 22 that is square in plan view and a pair of joint mounting members 23A and 23B mounted to the ends in the Y-direction of the base main body 22.
- the base main body 22 comprises a box-like thin, hollow container 35 whose upper side is open, a flat stator yoke 43 which is engaged from above with a first step portion 35a formed on the inner side of the peripheral wall of the container 35 and arranged parallel to the bottom wall of the container 35 with a predetermined gap (for example, approximately 2 mm) and which is formed of a magnetic material having a high heat conductivity (specifically, 30 [W/m-K] or more), and a ceramic plate 36 which is engaged from above with a second step portion 35b formed on the inner side of the upper end (open end) of the peripheral wall of the container 35 and which closes the opening.
- a predetermined gap for example, approximately 2 mm
- a ceramic plate 36 which is engaged from above with a second step portion 35b formed on the inner side of the upper end (open end) of the peripheral wall of the container 35 and which closes the opening.
- a movement surface 21a of the movable member 51 is formed on the surface of the ceramic plate 36 opposed to the movable member 51 (the upper surface).
- the inner space of the base 21 formed by the container 35 and the ceramic plate 36 is divided into upper and lower portions by the stator yoke 43.
- a first chamber 41 serving as the vacuum chamber is formed, and, in the lower portion, a second chamber 42 is formed.
- the stator yoke 43 and the movement surface 21a are parallel to each other. As shown in Fig.
- the first wall defining the first chamber 41 as the vacuum chamber accommodating a plurality of armature coils 38 is formed by the ceramic plate 36
- the second wall defining the second chamber 42 is formed by the stator yoke 43.
- hollow square coils are used as the armature coils 38.
- the stator 60 of the planar motor 50 is formed by the stator yoke 43, the armature coils 38, and the ceramic plate 36.
- a large number of (145, in the example shown) protrusions 36a having a round cross-sectional configuration are formed at predetermined intervals.
- columns 39 formed of a heat insulating material and serving as deformation preventing members.
- the ceramic plate 36 may be formed as a completely flat plate, and it is possible to provide column-like deformation preventing members 39 partially including heat insulating material 40 between the flat plate 36 and the stator yoke 43.
- the base 21 is connected to a vacuum pump 62 through a suction tube 61.
- the suction tube 61 is connected to a vacuum attraction port 63 provided on one side in the X-direction (+X side) of the base 21 shown in Fig. 2, and this vacuum attraction port 63 communicates with the first chamber 41.
- the vacuum pump 62 consists of a turbo molecular pump. This turbo molecular pump has a vacuum creating capacity of creating a high vacuum state of, for example, 1 x 10-6 [Torr] or less in the firsts chamber 41.
- the above-mentioned pair of joint mounting members 23A and 23B are integrally mounted to the base main body 22 by welding or the like.
- joint mounting members 23A and 23B have in their longitudinal centers screw holes 64a and 64b having a predetermined depth whose axial direction is in the Y- direction.
- a groove 65a is formed whose one end communicates with the screw hole 64a, whose sectional configuration is a right-angled triangle, and whose size in the height direction (Z- direction) linearly diminishes from one side in the Y-direction to the other side.
- a rectangular through-hole 66 is formed which has the same height and the same X-direction width as the second chamber 42 and whose section is thin and long, and the groove 65a communicates with the second chamber 42 through this through-hole 66.
- the container 35 is symmetrical, and another through-hole 66 (not shown) is formed in reality in the side wall on the other side in the Y-direction of the container 35.
- the plan section of the groove 65a is an isosceles triangle whose width in the X-direction linearly increases from one side in the Y-direction to the other side. That is, the sectional area of the XZ section of the groove 65a is constant independently of the position in the Y-direction.
- one end of a refrigerant feeding joint (not shown) having a male screw in the outer periphery thereof is mounted to the screw hole 64a, and the other end of this refrigerant feeding joint is connected to a refrigerant feeder provided inside the cooling device 79 serving as the temperature control device through the refrigerant feeding tube 92 shown in Fig. 1.
- a restricter having a constant sectional area is formed which squeezes liquid refrigerant as the fluid entering the inlet side (the screw hole 64a side) due to the groove 65a into a film-like shape and supplies it to the second chamber 42 through the through-hole 66.
- the refrigerant inlet is formed by the screw hole 64a formed in the joint mounting member 23A (more precisely, the inner passage of the joint for feeding refrigerant (not shown)is threadedly engaged with the screw hole 64a).
- the other joint mounting member 23B has a groove 65b and a screw hole 64b so as to be symmetrical with the joint mounting member 23A, and the second chamber 42 communicates with the groove 65b through the through-hole formed in the side wall on the other side in the Y-direction of the container 35.
- Mounted to the screw hole 64b is one end of a refrigerant discharge joint (not shown) having a male screw in the outer periphery, and the other end of this refrigerant discharge joint is connected to a refrigerator provided in the cooling device 79 through the refrigerant discharge tube of Fig. 1.
- a refrigerant outlet is formed by the screw hole 64b formed in the joint mounting member 23B (more precisely, an inner passage of a refrigerant discharge joint (not shown) is threadedly engaged with the screw hole 64b).
- liquid refrigerant supplied to the base 21 (the second chamber 42) through the refrigerant feeding joint, cools the interior of the base 21 , and is then returned to the cooling device 79 through the refrigerant discharge joint, to be cooled and supplied to the base 21 again.
- the liquid refrigerant is, for example, water or fluorinert (manufactured by Sumitomo 3M Ltd., a fluorine-type inactive liquid).
- This liquid refrigerant is supplied to the base 21 in a state in which its temperature is controlled to be lower than the base ambient temperature.
- the sectional area of the refrigerant passage (65a, 66, 42, 66, 65b) in the base 21 from the refrigerant feeding joint to the refrigerant discharge joint is constant throughout the entire passage.
- the wall surface (lower surface) on the second chamber 42 side of the stator yoke 43 is formed rough. This is for the purpose of positively disturbing the flow of the liquid refrigerant which flows along the lower surface of the stator yoke 43 to make the flow of the liquid refrigerant in the second chamber 42 (especially the boundary layer on the lower surface of the stator yoke 43) a turbulent flow whose Reynolds number is larger than critical Reynolds number.
- reticle loading and wafer loading are effected by a reticle loader and wafer loader (not shown). Further, preparatory operations, such as reticle alignment and base line measurement are conducted according to predetermined procedures using a reticle microscope (not shown), a reference mark plate (not shown) on the substrate table 18, and an alignment detection system (not shown).
- the main control device 20 performs alignment measurements such as EGA (enhanced global alignment) using an alignment detection system (not shown).
- EGA enhanced global alignment
- the main control device 20 controls at least either the value or direction of the current supplied to the armature coils 38 opposed to the thrust generating magnets 54a through 54d through the stage control system 19, whereby the substrate table 18 holding the wafer W integrally with the movable member 51 is moved in a desired direction.
- a step-and-scan type exposure operation is performed as follows.
- the substrate table 18 is moved such that the XY position of the wafer W is the scanning start position for the exposure of the first shot area on the wafer W.
- the reticle stage 18 is moved such that the XY position of the reticle R is the scanning start position.
- the stage control system 19 moves the reticle R and the wafer W in synchronism through a reticle drive section (not shown) and the planar motor 50 on the basis of information on the XY position of the reticle R measured by the reticle interferometer 16 and information on the XY position of the wafer W measured by the wafer interferometer 31 , whereby scanning exposure is effected.
- This movement of the wafer W is effected by controlling at least either the value or direction of the current supplied to the armature coils 38 opposed to the thrust generating magnets 54a through 54d through the stage control system by the main control device 20.
- the interior of the first chamber 41 in the base 21 accommodating a plurality of armature coils 38 is evacuated by a vacuum pump 62 to create a high vacuum state.
- a gap in a high vacuum state exists between the ceramic plate 36 on the movement surface 21a side forming the first chamber 41 and the armature coils 38 arranged on the stator yoke 43, so that the heat transmission from the armature coils 38 to the movement surface 21a side is effected practically by radiation alone. That is, the gap above the armature coils 38 functions as a kind of heat insulating layer to effectively restrain the heat transmission to the movement surface side.
- the heat transmission restraining effect is very high.
- each column 39 is formed of a heat insulating material, so that it is possible to substantially prevent heat conduction through the columns 39.
- stator yoke 43 in contact with the armature coils 38 is formed of a magnetic material having a high heat conductivity, the stator yoke 43 not only functions as a magnetic circuit forming member but efficiently transmits the heat generated by the armature coils 38 to the surface of the base main body 22 on the opposite side movement surface 21a.
- a second chamber 42 in contact with the vacuum chamber 41 through the intermediation of the stator yoke 43, and the interior of this second chamber 42 communicates with a refrigerant supply joint connected to one side in the Y-direction of the base 21 and a refrigerant discharge joint connected to the other side in the Y-direction of the base 21 , a liquid refrigerant (fluid) whose temperature is controlled to be lower than that of the base atmosphere being supplied to the second chamber 42 through the refrigerant supply joint by the cooling device 79.
- heat exchange is effected between the stator yoke 43 and the liquid refrigerant, and it is possible to efficiently cool the armature coils 38 from the lower side, whereby it is possible to restrain the temperature rise of each armature coil 38.
- the base 21 there is provided in the base 21 a refrigerant passage of a fixed cross-sectional area for discharging liquid refrigerant supplied from one side in the Y-direction through the refrigerant supply joint through the refrigerant discharge joint on the other side in the Y-axis direction, so that the liquid refrigerant entering the base through the refrigerant supply joint is spread in a film-like state to uniformly find its way below the armature coils, with the result that the plurality of armature coils developed in a plane uniformly undergo heat removal.
- the wall surface (lower surface) of the stator yoke 43 on the second chamber 42 side is formed as a rough surface and has surface irregularities, so that the Reynolds number of the flow of the liquid refrigerant flowing along the lower surface of the stator yoke 43 is larger than critical Reynolds number, and the flow becomes a turbulent flow.
- the solid-liquid heat transfer coefficient is (ten to several tens of times) larger than that in the case of a laminar flow. Further, it is a flow grown fast both fluidally and thermally, so that the heat removal of the armature coils 38 is effected quickly and uniformly.
- protrusions may be provided at predetermined intervals on the lower surface of the stator yoke 43. Due to the above arrangement, it is possible to effectively restrain the transmission of the heat emitted from the entire surface of the armature coils 38 to the movement surface side, and it is possible to restrain as much as possible the thermal influence on the environment. Further, in this embodiment, liquid refrigerant is supplied from the cooling device 79 to the base 21 through the refrigerant supply tube 90 and the refrigerant supply joint, and this liquid refrigerant passes through the refrigerant passage in the base 21 to cool the armature coils 38 from the down surface side.
- the liquid refrigerant returns to the cooling device 79 through the refrigerant discharge joint and the refrigerant discharge tube 93, and it is cooled there before it is supplied to the base 21 again to cool the armature coils 38. Since the liquid refrigerant is used in circulation in this way, it is possible to always cool the armature coils 38 by using a substantially fixed amount of liquid refrigerant, which is advantageous from the economical point of view.
- the positional control of the wafer W can be effected accurately and quickly by the substrate stage device 30 equipped with the planar motor 50 of electromagnetic drive type, and it is possible to effect exposure with high exposure accuracy while improving throughput.
- the construction of the base 21 in the above-described embodiment is only represented as an example, and the present invention is not restricted thereto.
- columns 39 entirely or partially formed of a heat insulating material are provided between the ceramic plate 43 and the stator yoke 43
- the first wall forming the first chamber 41 is formed by the ceramic plate 36 having the movement surface 21 a on the surface thereof facing the movable member 51
- the first wall and the movement surface forming member may be separate members. In this case, it is necessary to form both the first wall and the movement surface forming member of a non-magnetic material such as ceramic.
- the second chamber 42 constituting the refrigerant passage as the fluid passage is provided below the stator yoke 43, this should not be construed restrictively. That is, it is only necessary for a predetermined gap to exist between the armature coils 38 and the ceramic plate 36, the interior of the first chamber 41 being evacuated by the vacuum pump 62. It is not absolutely necessary to provide the base 21 with a joint mounting member, etc. for supplying refrigerant to the second chamber 42.
- the second wall of the container 35 (base 21 ) with which the armature coils 38 are contact in contact and on which they are arranged is formed of a magnetic material such as iron, whereby the second wall functions as a magnetic circuit forming member, and heat exchange is effected between the second wall and the external air to thereby cool the lower surface of the armature coils 38.
- the second wall it is desirable for the second wall to be formed of a magnetic material having high heat conductivity.
- the second embodiment slightly differs from the first embodiment in the internal construction of the base main body 22. Apart from this, its construction is the same as that of the first embodiment, so a description of the components which are common to these embodiments will be abridged or omitted, and the same or equivalent components are indicated by the same reference numerals.
- Fig. 8(A) is a partially omitted sectional view of the base main body 22 of the second embodiment.
- the armature coils 38 are arranged in the vacuum chamber 41 of the base main body 22 two-dimensionally at predetermined intervals along the movement surface 21a and in contact with the stator yoke 43, as in the above-described first embodiment.
- the movement surface 21a side of the vacuum chamber 41 is defined by a thin plate 82 formed of a non-magnetic material and arranged so as to be in contact with the movement surface side of the armature coils 38, and a refrigerant passage 99 as a fluid passage is provided on the movement surface 21a side of the vacuum chamber 41.
- Liquid refrigerant from the cooling device 79 of Fig. 1 is supplied in circulation to this refrigerant passage 99.
- the construction of the embodiment is the same as that of the first embodiment.
- the same effect as that of the above-described first embodiment can be obtained. That is, since the armature coils 38 are arranged in the vacuum chamber 41 in the base, and the refrigerant passage 99 is provided on the side of the movement 21a forming the vacuum chamber 41 , the heat transmission from the armature coils 38 is effected practically by radiation alone in the vacuum portion in the vacuum chamber (more specifically, between the hollow portions of the armature coils 38 and the columns 80, and between the central gap between adjacent armature coils 38 and the columns 80), and the heat transmitted to the movement surface 21a side in the vacuum chamber 41 is removed by heat exchange with the liquid refrigerant flowing through the refrigerant passage 99 and controlled to be at a temperature lower than the base ambient temperature. Thus, it is possible to effectively restrain the thermal influence on the environment.
- Fig. 8B is a cross-sectional diagram illustrating the properties of coolant flow through the refrigerant passage 99.
- a cool fluid flowing in a direction from left to right through the refrigerant channel 99 between a warm surface, in this case thin plate 82, and a cool surface, ceramic plate 36 creates a thermal boundary as seen in Fig. 8B.
- the thin plate 82 is heated due to the armature coils 38 of Fig. 8A.
- the thermal boundary layer extends from the thin plate 82 into the passage 99 toward the ceramic plate 36.
- the boundary layer thickness gradually increases with distance along the flow direction from the entrance of the passage, from left to right in the illustrated figure. If the boundary layer were to continue to grow until fully developed, it would extend completely across passage 99.
- the boundary layer has not completely extended across the passage 99, minimal heat is transferred across the passage 99, and the temperature of the ceramic plate 36 remains near its original upstream temperature, which is significantly lower than the temperature of the thin plate 82. In this fashion, the heat transferred from the thin plate 82 into the passage 99 to create the thermal boundary layer is removed at the outlet end (not shown) of the passage 99 by the coolant flowing through the passage.
- the surface of the thin plate 82 be finished with satisfactory flatness so that the boundary layer of the flow of the liquid refrigerant flowing along the thin plate 82 may be a laminar flow (not more than critical Reynolds number).
- This prevents mass transfer of warm fluid from the armature coils 38 into the flow through the refrigerant passage 99 and the corresponding fast boundary layer growth of turbulent flows. Accordingly, this makes the flow between the thin plate 82 and the ceramic plate 36 a flow having a boundary between high temperature and low temperature portions as described above and shown in Fig. 8(B), whereby it is possible to reliably prevent the heat of the armature coils 38 from being transmitted to the ceramic plate 36.
- the liquid refrigerant as the fluid is used in circulation, this should not be construed restrictively. That is, instead of a liquid, a gas may be used as the fluid. When, for example, air or the like is used as the fluid, it is not absolutely necessary to use it in circulation.
- the stage device of the present invention is applied to a substrate stage device, the stage device is also naturally applicable to a reticle stage, RST.
- the positional control of the substrate can be effected accurately and quickly, and the components of the device are connected and assembled electrically, mechanically or optically so that exposure can be effected with high exposure accuracy while improving throughput.
- planar motor device of the present invention is applied to the substrate stage device of a scanning type DUV exposure device, this should not be construed restrictively. It is also naturally applicable to static exposure devices such as steppers. Further, it is also applicable to charged particle beam exposure devices such as electron beam exposure devices and EUVL exposure devices using light having a wavelength in a soft X-rays range of 5 to 15 nm as the exposure light, and to devices other than exposure devices, such as inspection devices and substrate conveying devices. Further, the technical idea of the present invention, according to which armature coils are arranged in a vacuum chamber, is also applicable to a linear motor.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Electromagnetism (AREA)
- Combustion & Propulsion (AREA)
- Chemical & Material Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Power Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Linear Motors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Motor Or Generator Cooling System (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU49720/99A AU4972099A (en) | 1998-07-09 | 1999-07-07 | Exposure device having a planar motor |
EP99933725A EP1064713A4 (en) | 1998-07-09 | 1999-07-07 | Exposure device having a planar motor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10/193878 | 1998-07-09 | ||
JP19387898A JP4088728B2 (en) | 1998-07-09 | 1998-07-09 | Planar motor device, driving device and exposure device |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2000003301A2 true WO2000003301A2 (en) | 2000-01-20 |
WO2000003301A3 WO2000003301A3 (en) | 2000-03-16 |
WO2000003301A9 WO2000003301A9 (en) | 2000-05-25 |
Family
ID=16315253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/015278 WO2000003301A2 (en) | 1998-07-09 | 1999-07-07 | Exposure device having a planar motor |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1064713A4 (en) |
JP (1) | JP4088728B2 (en) |
AU (1) | AU4972099A (en) |
WO (1) | WO2000003301A2 (en) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1124161A2 (en) * | 2000-02-10 | 2001-08-16 | Asm Lithography B.V. | Lithographic projection apparatus having a temperature controlled heat shield |
KR20010089158A (en) * | 2000-02-10 | 2001-09-29 | 에이에스엠 리소그라피 비.브이. | Cooling of voice coil motors in lithographic projection apparatus |
US6351041B1 (en) | 1999-07-29 | 2002-02-26 | Nikon Corporation | Stage apparatus and inspection apparatus having stage apparatus |
US6879063B2 (en) | 1999-09-02 | 2005-04-12 | Asml Netherlands B.V. | Displacement device |
EP1580604A2 (en) * | 2004-03-24 | 2005-09-28 | Canon Kabushiki Kaisha | Stage device and exposure apparatus |
WO2006077511A1 (en) | 2005-01-18 | 2006-07-27 | Koninklijke Philips Electronics N.V. | Coil assembly for use with an electric motor |
DE102007035793A1 (en) | 2007-07-04 | 2009-01-08 | Institut für Mikroelektronik- und Mechatronik-Systeme gGmbH | Precision planar positioning arrangement for workpiece, has discharging unit for discharging waste heat, so that sandwich structure of stator plate, rotor and auxiliary stator is provided, and measuring device for determining rotor position |
US20100156198A1 (en) * | 2008-12-22 | 2010-06-24 | Alexander Cooper | Shield layer plus refrigerated backside cooling for planar motors |
US8605251B2 (en) | 2009-04-01 | 2013-12-10 | Canon Kabushiki Kaisha | Linear motor, and stage apparatus, exposure apparatus, and method for manufacturing device using the same |
RU2563967C1 (en) * | 2014-07-01 | 2015-09-27 | Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" | Linear pulse motor of executive mechanism of nuclear reactor control and protection |
WO2019233698A1 (en) * | 2018-06-05 | 2019-12-12 | Asml Netherlands B.V. | Assembly comprising a cryostat and layer of superconducting coils and motor system provided with such an assembly |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4510419B2 (en) * | 2003-10-01 | 2010-07-21 | キヤノン株式会社 | Stage apparatus, exposure apparatus, and device manufacturing method |
JP4474151B2 (en) | 2003-11-28 | 2010-06-02 | キヤノン株式会社 | Motor, exposure apparatus using the same, and device manufacturing method |
JP2006287014A (en) | 2005-04-01 | 2006-10-19 | Canon Inc | Positioning apparatus and linear motor |
JP4673117B2 (en) * | 2005-04-08 | 2011-04-20 | キヤノン株式会社 | Stage apparatus and exposure apparatus |
JP4936368B2 (en) * | 2006-11-21 | 2012-05-23 | 株式会社リコー | Vacuum chamber and electron beam drawing apparatus |
WO2011108170A1 (en) * | 2010-03-04 | 2011-09-09 | 株式会社安川電機 | Stage device |
JP5632736B2 (en) * | 2010-12-27 | 2014-11-26 | キヤノンアネルバ株式会社 | Substrate transfer apparatus and vacuum processing apparatus |
CN115668719A (en) * | 2020-05-20 | 2023-01-31 | Asml荷兰有限公司 | Magnet assembly, coil assembly, planar motor, positioning device and lithographic apparatus |
Citations (2)
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US5179304A (en) * | 1990-07-26 | 1993-01-12 | Nsk Ltd. | Linear motor system |
US5196745A (en) * | 1991-08-16 | 1993-03-23 | Massachusetts Institute Of Technology | Magnetic positioning device |
Family Cites Families (4)
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JPS61189637A (en) * | 1985-02-19 | 1986-08-23 | Canon Inc | Exposure device |
JPH05198490A (en) * | 1992-01-22 | 1993-08-06 | Fujitsu Ltd | Charged-particle beam exposure system |
JP3475973B2 (en) * | 1994-12-14 | 2003-12-10 | 株式会社ニコン | Linear motor, stage device, and exposure device |
JPH08293449A (en) * | 1995-04-24 | 1996-11-05 | Nikon Corp | Aligner |
-
1998
- 1998-07-09 JP JP19387898A patent/JP4088728B2/en not_active Expired - Fee Related
-
1999
- 1999-07-07 AU AU49720/99A patent/AU4972099A/en not_active Abandoned
- 1999-07-07 EP EP99933725A patent/EP1064713A4/en not_active Withdrawn
- 1999-07-07 WO PCT/US1999/015278 patent/WO2000003301A2/en not_active Application Discontinuation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5179304A (en) * | 1990-07-26 | 1993-01-12 | Nsk Ltd. | Linear motor system |
US5196745A (en) * | 1991-08-16 | 1993-03-23 | Massachusetts Institute Of Technology | Magnetic positioning device |
Non-Patent Citations (1)
Title |
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See also references of EP1064713A2 * |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6351041B1 (en) | 1999-07-29 | 2002-02-26 | Nikon Corporation | Stage apparatus and inspection apparatus having stage apparatus |
US6879063B2 (en) | 1999-09-02 | 2005-04-12 | Asml Netherlands B.V. | Displacement device |
KR20010089158A (en) * | 2000-02-10 | 2001-09-29 | 에이에스엠 리소그라피 비.브이. | Cooling of voice coil motors in lithographic projection apparatus |
EP1124161A3 (en) * | 2000-02-10 | 2004-01-07 | ASML Netherlands B.V. | Lithographic projection apparatus having a temperature controlled heat shield |
EP1124161A2 (en) * | 2000-02-10 | 2001-08-16 | Asm Lithography B.V. | Lithographic projection apparatus having a temperature controlled heat shield |
EP1580604A3 (en) * | 2004-03-24 | 2009-10-28 | Canon Kabushiki Kaisha | Stage device and exposure apparatus |
EP1580604A2 (en) * | 2004-03-24 | 2005-09-28 | Canon Kabushiki Kaisha | Stage device and exposure apparatus |
WO2006077511A1 (en) | 2005-01-18 | 2006-07-27 | Koninklijke Philips Electronics N.V. | Coil assembly for use with an electric motor |
DE102007035793A1 (en) | 2007-07-04 | 2009-01-08 | Institut für Mikroelektronik- und Mechatronik-Systeme gGmbH | Precision planar positioning arrangement for workpiece, has discharging unit for discharging waste heat, so that sandwich structure of stator plate, rotor and auxiliary stator is provided, and measuring device for determining rotor position |
US20100156198A1 (en) * | 2008-12-22 | 2010-06-24 | Alexander Cooper | Shield layer plus refrigerated backside cooling for planar motors |
US8605251B2 (en) | 2009-04-01 | 2013-12-10 | Canon Kabushiki Kaisha | Linear motor, and stage apparatus, exposure apparatus, and method for manufacturing device using the same |
RU2563967C1 (en) * | 2014-07-01 | 2015-09-27 | Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" | Linear pulse motor of executive mechanism of nuclear reactor control and protection |
WO2019233698A1 (en) * | 2018-06-05 | 2019-12-12 | Asml Netherlands B.V. | Assembly comprising a cryostat and layer of superconducting coils and motor system provided with such an assembly |
US11592756B2 (en) | 2018-06-05 | 2023-02-28 | Asml Netherlands B.V. | Assembly comprising a cryostat and layer of superconducting coils and motor system provided with such an assembly |
US11860553B2 (en) | 2018-06-05 | 2024-01-02 | Asml Netherlands B.V. | Assembly comprising a cryostat and layer of superconducting coils and motor system provided with such an assembly |
Also Published As
Publication number | Publication date |
---|---|
EP1064713A4 (en) | 2005-07-20 |
JP2000032733A (en) | 2000-01-28 |
WO2000003301A9 (en) | 2000-05-25 |
EP1064713A2 (en) | 2001-01-03 |
WO2000003301A3 (en) | 2000-03-16 |
JP4088728B2 (en) | 2008-05-21 |
AU4972099A (en) | 2000-02-01 |
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